INFORMATION IN THIS DOCUMENT IS PROVIDED IN CONNECTION WITH INTEL® PRODUCTS. NO LICENSE, EXPRESS OR IMPLIED,
BY ESTOPPEL OR OTHERWISE, TO ANY INTELLECTUAL PROPERTY RIGHTS IS GRANTED BY THIS DOCUMENT. EXCEPT AS
PROVIDED IN INTEL'S TERMS AND CONDITIONS OF SALE FOR SUCH PRODUCTS, INTEL ASSUMES NO LIABILITY WHATSOEVER,
AND INTEL DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY, RELATING TO SALE AND/OR USE OF INTEL PRODUCTS INCLUDING
LIABILITY OR WARRANTIES RELATING TO FITNESS FOR A PARTICULAR PURPOSE, MERCHANTABILITY, OR INFRINGEMENT OF ANY
PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY RIGHT. Intel products are not intended for use in medical, life saving, or
life sustaining applications.
Intel may make changes to specifications and product descriptions at any time, without notice.
Designers must not rely on the absence or characteristics of any features or instructions marked “reserved” or “undefined.” Intel
reserves these for future definition and shall have no responsibility whatsoever for conflicts or incompatibilities arising from future
changes to them.
The Intel® Xeon® processor 5500 series, 5600 series and LGA1366 socket may contain design defects or errors known as errata
which may cause the product to deviate from published specifications. Current characterized errata are available on request.
Contact your local Intel sales office or your distributor to obtain the latest specifications and before placing your product order.
Intel processor numbers are not a measure of performance. Processor numbers differentiate features within each processor family,
not across different processor families. See http://www.intel.com/products/processor_number for details. Over time processor
numbers will increment based on changes in clock, speed, cache, FSB, or other features, and increments are not intended to
represent proportional or quantitative increases in any particular feature. Current roadmap processor number progression is not
necessarily representative of future roadmaps. See www.intel.com/products/processor_number for details.
Intel® Turbo Boost Technology requires a PC with a processor with Intel Turbo Boost Technology capability. Intel Turbo Boost
Technology performance varies depending on hardware, software and overall system configuration. Check with your PC
manufacturer on whether your system delivers Intel Turbo Boost Technology. For more information, see www.intel.com.
• Table 5-5: added Tcontrol Guidance for Intel® Xeon® Processor 5600 Series
• Section 5.7: added Thermal Excursion for Intel® Xeon® Processor 5600 Series
• Table 6-1: added reference to Table 5-2 for Intel® Xeon® Processor 5600 Series
• Appendix A: added heatsink info for Intel® Xeon® Processor 5600 Series
• Table A-4, A-5: updated supplier info
• Appendix B: Added Figures B-27 to B-32 for 25.5mm heatsink
• Table E-1: updated PSIca for 60W
• Table E-2: added Boundary Conditions and Performance Targets for Intel®
Xeon® Processor 5600 Series
Revision
Date
March 2010
§
Thermal/Mechanical Design Guide7
8Thermal/Mechanical Design Guide
Introduction
1Introduction
This document provides guidelines for the design of thermal and mechanical solutions
for 2-socket server and 2-socket Workstation processors listed in the Intel® Xeon®
Processor 5500 Series Datasheet, Volume 1 and in the Intel® Xeon® Processor 5600
Series Datasheet, Volume 1. The components described in this document include:
• The processor thermal solution (heatsink) and associated retention hardware.
• The LGA1366 socket and the Independent Loading Mechanism (ILM) and back
plate.
Processors in 1-socket Workstation platforms are covered in the Intel® Core™ i7-900
Desktop Processor Extreme Edition Series and Intel® Core™ i7-900 Desktop Processor
Series, Intel® Xeon® Processor 3500 Series and LGA1366 Socket Thermal / Mechanical
Design Guide.
• To assist board and system thermal mechanical designers.
• To assist designers and suppliers of processor heatsinks.
Thermal profiles and other processor specifications are provided in the Datasheet.
Thermal/Mechanical Design Guide9
1.1References
Material and concepts available in the following documents may be beneficial when
reading this document.
Table 1-1.Reference Documents
DocumentLocationNotes
European Blue Angel Recycling Standards2
Intel® Xeon® Processor 5500 Series Datasheet, Volume 13213211
Intel® Xeon® Processor 5600 Series Datasheet, Volume 13233691
Intel® Xeon® Processor 5500 Series Mechanical Model3213261
Intel® Xeon® Processor 5500 Series Thermal Model3213271
Entry-level Electronics Bay Specification3
Notes:
1.Document numbers indicated in Location column are subject to change. See the appropriate Electronic
Design Kit (EDK) for the most up-to-date Document number.
2.Available at http://www.blauer-engel.de
3.Available at http://ssiforum.org/
1.2Definition of Terms
Introduction
Table 1-2.Terms and Descriptions (Sheet 1 of 2)
TermDescription
BypassBypass is the area between a passive heatsink and any object that can act to form a
DTSDigital Thermal Sensor reports a relative die temperature as an offset from TCC
FSCFan Speed Control
IHSIntegrated Heat Spreader: a component of the processor package used to enhance the
ILMIndependent Loading Mechanism provides the force needed to seat the 1366-LGA land
LGA1366 socketThe processor mates with the system board through this surface mount, 1366-contact
PECIThe Platform Environment Control Interface (PECI) is a one-wire interface that provides
CA
CS
SA
T
CASE
T
CASE_MAX
duct. For this example, it can be expressed as a dimension away from the outside
dimension of the fins to the nearest surface.
activation temperature.
thermal performance of the package. Component thermal solutions interface with the
processor at the IHS surface.
package onto the socket contacts.
socket.
a communication channel between Intel processor and chipset components to external
monitoring devices.
Case-to-ambient thermal characterization parameter (psi). A measure of thermal
solution performance using total package power. Defined as (T
Package Power. Heat source should always be specified for measurements.
Case-to-sink thermal characterization parameter. A measure of thermal interface
material performance using total package power. Defined as (T
Package Power.
Sink-to-ambient thermal characterization parameter. A measure of heatsink thermal
performance using total package power. Defined as (TS – TLA) / Total Package Power.
The case temperature of the processor measured at the geometric center of the topside
of the IHS.
The maximum case temperature as specified in a component specification.
– TLA) / Total
CASE
– TS) / Total
CASE
10Thermal/Mechanical Design Guide
Introduction
Table 1-2.Terms and Descriptions (Sheet 2 of 2)
TermDescription
TCCThermal Control Circuit: Thermal monitor uses the TCC to reduce the die temperature
T
CONTROL
TDPThermal Design Power: Thermal solution should be designed to dissipate this target
Thermal MonitorA power reduction feature designed to decrease temperature after the processor has
Thermal ProfileLine that defines case temperature specification of a processor at a given power level.
TIMThermal Interface Material: The thermally conductive compound between the heatsink
T
LA
T
SA
UA unit of measure used to define server rack spacing height. 1U is equal to 1.75 in, 2U
by using clock modulation and/or operating frequency and input voltage adjustment
when the die temperature is very near its operating limits.
T
control.
power level. TDP is not the maximum power that the processor can dissipate.
reached its maximum operating temperature.
and the processor case. This material fills the air gaps and voids, and enhances the
transfer of the heat from the processor case to the heatsink.
The measured ambient temperature locally surrounding the processor. The ambient
temperature should be measured just upstream of a passive heatsink or at the fan inlet
for an active heatsink.
The system ambient air temperature external to a system chassis. This temperature is
usually measured at the chassis air inlets.
equals 3.50 in, etc.
is a static value below TCC activation used as a trigger point for fan speed
CONTROL
§
Thermal/Mechanical Design Guide11
Introduction
12Thermal/Mechanical Design Guide
LGA1366 Socket
2LGA1366 Socket
This chapter describes a surface mount, LGA (Land Grid Array) socket intended for
processors in the Intel® Xeon® 5500 Platform. The socket provides I/O, power and
ground contacts. The socket contains 1366 contacts arrayed about a cavity in the
center of the socket with lead-free solder balls for surface mounting on the
motherboard.
The socket has 1366 contacts with 1.016 mm X 1.016 mm pitch (X by Y) in a
43x41 grid array with 21x17 grid depopulation in the center of the array and selective
depopulation elsewhere.
The socket must be compatible with the package (processor) and the Independent
Loading Mechanism (ILM). The design includes a back plate which is integral to having
a uniform load on the socket solder joints. Socket loading specifications are listed in
Chapter 4.
Figure 2-1.LGA1366 Socket with Pick and Place Cover Removed
packagesocket
package
cavity
cavity
socket
Thermal/Mechanical Design Guide13
Figure 2-2. LGA1366 Socket Contact Numbering (Top View of Socket)
LGA1366 Socket
14Thermal/Mechanical Design Guide
LGA1366 Socket
15
131417
192321
2731293033
353937
43
2.1Board Layout
The land pattern for the LGA1366 socket is 40 mils X 40 mils (X by Y), and the pad size
is 18 mils. Note that there is no round-off (conversion) error between socket pitch
(1.016 mm) and board pitch (40 mil) as these values are equivalent.
Figure 2-3.LGA1366 Socket Land Pattern (Top View of Board)
A C E GJL NR U W AA AC AE AG AJ AL AN AR AU AW BA
B D FHK M PT VY AB AD AF AH AK AM AP AT AV AY
32
32
31
31
30
30
29
29
28
28
27
27
26
26
25
25
24
24
23
23
22
22
21
21
20
20
19
19
18
18
17
17
16
16
15
15
14
14
13
13
12
12
11
11
10
10
9
9
8
8
7
7
6
6
5
5
4
4
3
3
2
2
1
1
A C E GJL NR U W AA AC AE AG AJ AL AN AR AU AW BA
B D FHK M PT VY AB AD AF AH AK AM AP AT AV AY
42
41
40
38
36
34
32
28
26
25
24
22
20
18
16
12
Thermal/Mechanical Design Guide15
2.2Attachment to Motherboard
The socket is attached to the motherboard by 1366 solder balls. There are no additional
external methods (that is, screw, extra solder, adhesive, and so on) to attach the
socket.
As indicated in Figure 2-4, the Independent Loading Mechanism (ILM) is not present
during the attach (reflow) process.
Figure 2-4.Attachment to Motherboard
LGA1366 Socket
2.3Socket Components
The socket has two main components, the socket body and Pick and Place (PnP) cover,
and is delivered as a single integral assembly. Refer to Appendix C for detailed
drawings.
2.3.1Socket Body Housing
The housing material is thermoplastic or equivalent with UL 94 V-0 flame rating capable
of withstanding 260 °C for 40 seconds (typical reflow/rework). The socket coefficient of
thermal expansion (in the XY plane), and creep properties, must be such that the
integrity of the socket is maintained for the conditions listed in the LGA1366 Socket
Validation Reports.
The color of the housing will be dark as compared to the solder balls to provide the
contrast needed for pick and place vision systems.
2.3.2Solder Balls
A total of 1366 solder balls corresponding to the contacts are on the bottom of the
socket for surface mounting with the motherboard.
The socket has the following solder ball material:
• Lead free SAC (SnAgCu) solder alloy with a silver (Ag) content between 3% and
4% and a melting temperature of approximately 217 °C. The alloy must be
16Thermal/Mechanical Design Guide
LGA1366 Socket
compatible with immersion silver (ImAg) motherboard surface finish and a SAC
alloy solder paste.
The co-planarity (profile) and true position requirements are defined in Appendix C.
2.3.3Contacts
Base material for the contacts is high strength copper alloy.
For the area on socket contacts where processor lands will mate, there is a 0.381 m
[15 inches] minimum gold plating over 1.27 m [50 inches] minimum nickel
underplate.
No contamination by solder in the contact area is allowed during solder reflow.
2.3.4Pick and Place Cover
The cover provides a planar surface for vacuum pick up used to place components in
the Surface Mount Technology (SMT) manufacturing line. The cover remains on the
socket during reflow to help prevent contamination during reflow. The cover can
withstand 260 °C for 40 seconds (typical reflow/rework profile) and the conditions
listed in the LGA1366 Socket Validation Reports without degrading.
As indicated in Figure 2-5, the cover remains on the socket during ILM installation, and
should remain on whenever possible to help prevent damage to the socket contacts.
Cover retention must be sufficient to support the socket weight during lifting,
translation, and placement (board manufacturing), and during board and system
shipping and handling.
The covers are designed to be interchangeable between socket suppliers. As indicated
in Figure 2-5, a Pin1 indicator on the cover provides a visual reference for proper
orientation with the socket.
See LGA1366_Socket_Pick_and_Place_Removal_Tool_rev2.0 for a drawing of a tool
designed to provide mechanical assistance during cover installation and removal.
Figure 2-5.Pick and Place Cover
Thermal/Mechanical Design Guide17
2.4Package Installation / Removal
As indicated in Figure 2-6, access is provided to facilitate manual installation and
removal of the package.
To assist in package orientation and alignment with the socket:
• The package Pin1 triangle and the socket Pin1 chamfer provide visual reference for
proper orientation.
• The package substrate has orientation notches along two opposing edges of the
package, offset from the centerline. The socket has two corresponding orientation
posts to physically prevent mis-orientation of the package. These orientation
features also provide initial rough alignment of package to socket.
• The socket has alignment walls at the four corners to provide final alignment of the
package.
See Appendix F for information regarding a tool designed to provide mechanical
.
Figure 2-6.Package Installation / Removal Features
assistance during processor installation and removal.
LGA1366 Socket
orientation
orientation
notch
notch
alignment
Pin1triangle
Pin1 triangle
access
access
orientation
orientation
post
post
Pin1 chamfer
Pin1 chamfer
alignment
walls
walls
2.4.1Socket Standoffs and Package Seating Plane
Standoffs on the bottom of the socket base establish the minimum socket height after
solder reflow and are specified in Appendix C.
Similarly, a seating plane on the topside of the socket establishes the minimum
package height. See Section 4.2 for the calculated IHS height above the motherboard.
18Thermal/Mechanical Design Guide
LGA1366 Socket
2.5Durability
The socket must withstand 30 cycles of processor insertion and removal. The max
chain contact resistance from Table 4-4 must be met when mated in the 1st and 30th
cycles.
The socket Pick and Place cover must withstand 15 cycles of insertion and removal.
2.6Markings
There are three markings on the socket:
• LGA1366: Font type is Helvetica Bold - minimum 6 point (2.125 mm).
• Manufacturer's insignia (font size at supplier's discretion).
• Lot identification code (allows traceability of manufacturing date and location).
All markings must withstand 260°C for 40 seconds (typical reflow/rework profile)
without degrading, and must be visible after the socket is mounted on the
motherboard.
LGA1366 and the manufacturer's insignia are molded or laser marked on the side wall.
2.7Component Insertion Forces
Any actuation must meet or exceed SEMI S8-95 Safety Guidelines for Ergonomics/
Human Factors Engineering of Semiconductor Manufacturing Equipment, example Table
R2-7 (Maximum Grip Forces). The socket must be designed so that it requires no force
to insert the package into the socket.
2.8Socket Size
Socket information needed for motherboard design is given in Appendix C.
This information should be used in conjunction with the reference motherboard keep-
out drawings provided in Appendix B to ensure compatibility with the reference thermal
mechanical components.
Thermal/Mechanical Design Guide19
2.9LGA1366 Socket NCTF Solder Joints
15
131417
1923212225
2731293033
353937
43
Intel has defined selected solder joints of the socket as non-critical to function (NCTF)
for post environmental testing. The processor signals at NCTF locations are typically
redundant ground or non-critical reserved, so the loss of the solder joint continuity at
end of life conditions will not affect the overall product functionality. Figure 2-7
.
Figure 2-7.LGA1366 NCTF Solder Joints
identifies the NCTF solder joints.
A C EGJLNRU W AA AC AE AG AJ AL AN AR AU AW BA
BD FHK M PTV Y AB AD AF AH AK AM AP AT AV AY
32
32
31
31
30
30
29
29
28
28
27
27
26
26
25
25
24
24
23
23
22
22
21
21
20
20
19
19
18
18
17
17
16
16
15
15
14
14
13
13
12
12
11
11
10
10
9
9
8
8
7
7
6
6
5
5
4
4
3
3
2
2
1
1
A C EGJLNRU W AA AC AE AG AJ AL AN AR AU AW BA
B D FHK M PTVY AB AD AF AH AK AM AP AT AV AY
LGA1366 Socket
42
41
40
38
36
34
32
28
26
24
20
18
16
12
Note:For platforms supporting the DP processor land C3 is CTF.
§
20Thermal/Mechanical Design Guide
Independent Loading Mechanism (ILM)
3Independent Loading
Mechanism (ILM)
The Independent Loading Mechanism (ILM) provides the force needed to seat the
1366-LGA land package onto the socket contacts. The ILM is physically separate from
the socket body. The assembly of the ILM to the board is expected to occur after wave
solder. The exact assembly location is dependent on manufacturing preference and test
flow.
Note:The ILM has two critical functions: deliver the force to seat the processor onto the
socket contacts and distribute the resulting compressive load evenly through the socket
solder joints.
Note:The mechanical design of the ILM is integral to the overall functionality of the LGA1366
socket. Intel performs detailed studies on integration of processor package, socket and
ILM as a system. These studies directly impact the design of the ILM. The Intel
reference ILM will be “build to print” from Intel controlled drawings. Intel recommends
using the Intel Reference ILM. Custom non-Intel ILM designs do not benefit from Intel's
detailed studies and may not incorporate critical design parameters.
3.1Design Concept
The ILM consists of two assemblies that will be procured as a set from the enabled
vendors. These two components are ILM cover assembly and back plate.
3.1.1ILM Cover Assembly Design Overview
The ILM Cover assembly consists of four major pieces: load lever, load plate, frame and
the captive fasteners.
The load lever and load plate are stainless steel. The frame is high carbon steel with
appropriate plating. The fasteners are fabricated from a low carbon steel. The frame
provides the hinge locations for the load lever and load plate.
The cover assembly design ensures that once assembled to the back plate and the load
lever is closed, the only features touching the board are the captive fasteners. The
nominal gap of the frame to the board is ~1 mm when the load plate is closed on the
empty socket or when closed on the processor package.
When closed, the load plate applies two point loads onto the IHS at the “dimpled”
features shown in Figure 3-1. The reaction force from closing the load plate is
transmitted to the frame and through the captive fasteners to the back plate. Some of
the load is passed through the socket body to the board inducing a slight compression
on the solder joints.
Thermal/Mechanical Design Guide21
Figure 3-1.ILM Cover Assembly
Independent Loading Mechanism (ILM)
3.1.2ILM Back Plate Design Overview
The unified back plate for 2-socket server and 2-socket Workstation products consists
of a flat steel back plate with threaded studs for ILM attach, and internally threaded
nuts for heatsink attach. The threaded studs have a smooth surface feature that
provides alignment for the back plate to the motherboard for proper assembly of the
ILM around the socket. A clearance hole is located at the center of the plate to allow
access to test points and backside capacitors. An additional cut-out on two sides
provides clearance for backside voltage regulator components. An insulator is preapplied.
Back plates for processors in 1-socket Workstation platforms are covered in the Intel
Core™ i7-900 Desktop Processor Extreme Edition Series and Intel® Core™ i7-900
Desktop Processor Series, Intel® Xeon® Processor 3500 Series and LGA1366 Socket
Thermal / Mechanical Design Guide.
®
22Thermal/Mechanical Design Guide
Independent Loading Mechanism (ILM)
Figure 3-2.Back Plate
3.2Assembly of ILM to a Motherboard
The ILM design allows a bottoms up assembly of the components to the board. In
step 1, (see Figure 3-3), the back plate is placed in a fixture. Holes in the motherboard
provide alignment to the threaded studs. In step 2, the ILM cover assembly is placed
over the socket and threaded studs. Using a T20 Torx* driver fasten the ILM cover
assembly to the back plate with the four captive fasteners. Torque to 9 ± 1 inchpounds. The length of the threaded studs accommodate board thicknesses from
0.062” to 0.100”.
Thermal/Mechanical Design Guide23
.
Figure 3-3.ILM Assembly
Independent Loading Mechanism (ILM)
24Thermal/Mechanical Design Guide
Independent Loading Mechanism (ILM)
As indicated in Figure 3-4, socket protrusion and ILM key features prevent 180-degree
rotation of ILM cover assembly with respect to the socket. The result is a specific Pin 1
orientation with respect to the ILM lever.
Figure 3-4. Pin1 and ILM Lever
§
Thermal/Mechanical Design Guide25
Independent Loading Mechanism (ILM)
26Thermal/Mechanical Design Guide
LGA1366 Socket and ILM Electrical, Mechanical, and Environmental Specifications
4LGA1366 Socket and ILM
Electrical, Mechanical, and
Environmental Specifications
This chapter describes the electrical, mechanical, and environmental specifications for
the LGA1366 socket and the Independent Loading Mechanism.
4.1Component Mass
Table 4-1.Socket Component Mass
ComponentMass
Socket Body, Contacts and PnP Cover15 gm
ILM Cover43 gm
ILM Back Plate for dual processor server products100 gm
4.2Package/Socket Stackup Height
Table 4-2 provides the stackup height of a processor in the 1366-land LGA package and
LGA1366 socket with the ILM closed and the processor fully seated in the socket.
Table 4-2.1366-land Package and LGA1366 Socket Stackup Height
Integrated Stackup Height (mm)
From Top of Board to Top of IHS
Notes:
1.This data is provided for information only, and should be derived from: (a) the height of the socket seating
plane above the motherboard after reflow, given in Appendix C, (b) the height of the package, from the
package seating plane to the top of the IHS, and accounting for its nominal variation and tolerances that
are given in the corresponding processor EMTS.
2.This value is a RSS calculation.
7.729 ± 0.282 mm
4.3Socket Maximum Temperature
The power dissipated within the socket is a function of the current at the pin level and
the effective pin resistance. To ensure socket long term reliability, Intel defines socket
maximum temperature using a via on the underside of the motherboard. Exceeding the
temperature guidance may result in socket body deformation, or increases in thermal
and electrical resistance which can cause a thermal runaway and eventual electrical
failure. The guidance for socket maximum temperature is listed below:
• Via temperature under socket < 96 °C
Thermal/Mechanical Design Guide27
LGA1366 Socket and ILM Electrical, Mechanical, and Environmental Specifications
4.4Loading Specifications
The socket will be tested against the conditions listed in the LGA1366 Socket Validation
Reports with heatsink and the ILM attached, under the loading conditions outlined in
this chapter.
Table 4-3 provides load specifications for the LGA1366 socket with the ILM installed.
The maximum limits should not be exceeded during heatsink assembly, shipping
conditions, or standard use condition. Exceeding these limits during test may result in
component failure. The socket body should not be used as a mechanical reference or
load-bearing surface for thermal solutions.
Table 4-3.Socket and ILM Mechanical Specifications
ParameterMinMaxNotes
Static compressive load from ILM cover to
processor IHS
Heatsink Static Compressive Load0 N [0 lbf]266 N [60 lbf]1, 2, 3
Total Static Compressive Load
(ILM plus Heatsink)
Dynamic Compressive Load
(with heatsink installed)
Target Pick and Place Cover allowable removal
force
Load Lever actuation forceN/A38.3 N [8.6 lbf] in the
445 N [100 lbf]623 N [140 lbf]3, 4
445 N (100 lbf)890 N (200 lbf)3, 4
N/A890 N [200 lbf] 1, 3, 5, 6
N/A4.45 - 6.68 N [1.0 -
1.5 lbf]
vertical direction
10.2 N [2.3 lbf] in the
lateral direction.
Notes:
1.These specifications apply to uniform compressive loading in a direction perpendicular to the IHS top
surface.
2.This is the minimum and maximum static force that can be applied by the heatsink and it’s retention
solution to maintain the heatsink to IHS interface. This does not imply the Intel reference TIM is validated
to these limits.
3.Loading limits are for the LGA1366 socket.
4.This minimum limit defines the compressive force required to electrically seat the processor onto the socket
contacts.
5.Dynamic loading is defined as an 11 ms duration average load superimposed on the static load
requirement.
6.Test condition used a heatsink mass of 550 gm [1.21 lb] with 50 g acceleration measured at heatsink mass.
The dynamic portion of this specification in the product application can have flexibility in specific values, but
the ultimate product of mass times acceleration should not exceed this dynamic load.
4.5Electrical Requirements
LGA1366 socket electrical requirements are measured from the socket-seating plane of
the processor to the component side of the socket PCB to which it is attached. All
specifications are maximum values (unless otherwise stated) for a single socket
contact, but includes effects of adjacent contacts where indicated.
28Thermal/Mechanical Design Guide
LGA1366 Socket and ILM Electrical, Mechanical, and Environmental Specifications
Table 4-4.Electrical Requirements for LGA1366 Socket
ParameterValueComment
Mated loop inductance, Loop
Mated partial mutual inductance, L
Maximum mutual capacitance, C.
Socket Average Contact Resistance
(EOL)
Max Individual Contact Resistance
(EOL)
Bulk Resistance Increase
Dielectric Withstand Voltage
Insulation Resistance
<3.9nH
NA
<1 pF
15.2 m
100 m
3 m
360 Volts RMS
800 M
The inductance calculated for two contacts,
considering one forward conductor and one return
conductor. These values must be satisfied at the
worst-case height of the socket.
The inductance on a contact due to any single
neighboring contact.
The capacitance between two contacts
The socket average contact resistance target is
derived from average of every chain contact
resistance for each part used in testing, with a
chain contact resistance defined as the resistance
of each chain minus resistance of shorting bars
divided by number of lands in the daisy chain.
The specification listed is at room temperature
and has to be satisfied at all time.
Socket Contact Resistance: The resistance of
the socket contact, solderball, and interface
resistance to the interposer land.
The specification listed is at room temperature
and has to be satisfied at all time.
Socket Contact Resistance: The resistance of
the socket contact, solderball, and interface
resistance to the interposer land; gaps included.
The bulk resistance increase per contact from
24 °C to 107 °C
4.6Environmental Requirements
Design, including materials, shall be consistent with the manufacture of units that meet
the following environmental reference points.
The reliability targets in this chapter are based on the expected field use environment
for these products. The test sequence for new sockets will be developed using the
knowledge-based reliability evaluation methodology, which is acceleration factor
dependent. A simplified process flow of this methodology can be seen in Figure 4-1.
Thermal/Mechanical Design Guide29
LGA1366 Socket and ILM Electrical, Mechanical, and Environmental Specifications
Figure 4-1.Flow Chart of Knowledge-Based Reliability Evaluation Methodology
Establish the
market/expected use
environment for the
technology
Develop Speculative
stress conditions based on
historical data, content
experts, and literature
search
Freeze stressing
requirements and perform
additional data turns
Perform stressing to
validate accelerated
stressing assumptions and
determine acceleration
factors
A detailed description of this methodology can be found at:
This section describes a 1U reference heatsink, design targets for 2U and Tower
heatsinks, performance expectations for a 25.5 mm tall heatsink, and thermal design
guidelines for processors in the Intel® Xeon® 5500 Platform.
5.1Performance Targets
Values for boundary conditions and performance targets are used to generate
processor thermal specifications and to provide guidance for heatsink design.
Table 5-1.Boundary Conditions and Performance Targets for Intel® Xeon® Processor
5500 Series
ParameterValue
Altitude, system
ambient temp
TDP60W80W95W, Profile B95W, Profile A130W, WS
1
T
LA
2
CA
3
Airflow
System height
(form factor)
Heatsink
volumetric
Heatsink
technology
49oC49oC49oC55oC40oC
0.335oC/W0.336oC/W0.337oC/W0.201oC/W0.201oC/W
9.7 CFM @
0.20” dP
1U (EEB)1U (EEB)1U (EEB)
4
8
9.7 CFM @
0.20” dP
90 x 90 x 27mm (1U)
Cu base, Al finsCu/Al base, Al fins with heatpipes
Sea level, 35oC
9.7 CFM @
0.20” dP
5
6
9
30 CFM @
0.173” dP
2U (EEB)Pedestal (EEB)
90 x 90 x 64mm
6,7
(2U)
30 CFM @
0.173” dP
90 x 90 x 99mm
6
(Tower)
Table 5-2.Boundary Conditions and Performance Targets for Intel Xeon processor 5600
1. Local ambient temperature of the air entering the heatsink.
2. Max target (mean + 3 sigma + offset) for thermal characterization parameter (Section 5.5.1).
Thermal/Mechanical Design Guide31
4
90 x 90 x 27mm (1U)
8
49oC55oC53oC
9.7 CFM @ 0.20” dP30 CFM @
1U (EEB)2U (EEB)
Cu base, Al finsCu/Al base, Al fins with
Sea level, 35oC
6
0.173” dP
90 x 90 x 64mm (2U)
heatpipes
35 CFM @
0.214” dP
6,7
3. Airflow through the heatsink fins with zero bypass. Max target for pressure drop (dP) measured in inches H2O.
4. Reference system configuration. Processor is downstream from memory in EEB (Entry-Level Electronics Bay).
Ducting is utilized to direct airflow.
5. The 1U heatsink can also meet Profile B for the 95W processor in TEB (Thin Electronics Bay) under the
following conditions: TLA = 40ºC, CA = 0.275ºC/W, airflow = 16 CFM @ 0.344” dP (these TEB values are
not used to generate processor thermal specifications). Processor is not downstream from memory in TEB.
Ducting is utilized to direct airflow.
6. Dimensions of heatsink do not include socket or processor.
7. The 2U heatsink height (64mm) + socket/processor height (7.729 mm, Table 4-2) complies with 76.2 mm
max height for EEB monoplanar boards (http://ssiforum.org/).
Table 5-1 and Table 5-2 specify CA and pressure drop targets for specific airflows. To
determine CA and pressure drop targets for other airflows, use Best-fit equations in
Figure 5-1. Heatsink detailed drawings are in Appendix B.
Figure 5-1.Best-fit Equations
Thermal Solutions
5.1.125.5 mm Tall Heatsink
For the 25.5 mm tall heatsink, Table 5-3 provides guidance regarding performance
expectations. These values are not used to generate processor thermal specifications.
Table 5-3.Performance Expectations for Intel Xeon Processor 5500 Series with 25.5 mm
Tall Heatsink
ParameterValue
Altitude, system
ambient temp
TDP95W, Profile B
1
T
LA
2
CA
3
Airflow
System height
(form factor)
Heatsink
volumetric
Heatsink
technology
Notes:
1. Local ambient temperature of the air entering the heatsink.
2. Max target (mean + 3 sigma + offset) for thermal characterization parameter (Section 5.5.1).
3. Airflow through the heatsink fins with zero bypass. Max target for pressure drop (dP) measured in inches H
4. Reference system configuration. Processor is downstream from memory in SSI blade and EEB (Entry-Level
Electronics Bay), not in TEB (Thin Electronics Bay). Ducting is utilized to direct airflow.
5. Dimensions of heatsink do not include socket or processor. The 25.5 mm heatsink height + socket/processor
height (7.729 mm, Table 4-2) complies with 33.5mm max height for SSI blade boards
(http://ssiforum.o
Figure 5-2 shows the orientation and position of the TTV die. The TTV die is sized and
positioned similarly to the processor die.
Figure 5-2.TTV Die Size and Orientation
Figure1-SideViewsofPackagewith IHS(nottoscale)
CacheCacheCacheCache
Cache
Die CL
45
Package CL
1.0
Core
19.3
NOT TO SCALE
All Dimensions in mm
Thermal/Mechanical Design Guide33
5.3Assembly
Figure 5-3.1U Reference Heatsink Assembly
Thermal Solutions
The assembly process for the 1U reference heatsink begins with application of
Honeywell PCM45F thermal interface material to improve conduction from the IHS.
Tape and roll format is recommended. Pad size is 35 x 35mm, thickness is 0.25mm.
Next, position the heatsink such that the heatsink fins are parallel to system airflow.
While lowering the heatsink onto the IHS, align the four captive screws of the heatsink
to the four threaded nuts of the back plate.
Using a #2 Phillips driver, torque the four captive screws to 8 inch-pounds. Fastener
sequencing (starting threads on all four screws before torquing) may mitigate against
cross threading.
This assembly process is designed to produce a static load of 39 - 51 lbf, for 0.062" -
0.100" board thickness respectively. Honeywell PCM45F is expected to meet the
performance targets in Table 5-1 from 30 - 60 lbf. From Table 4-3, the Heatsink Static
Compressive Load of 0 - 60 lbf allows for designs that vary from the 1U reference
heatsink. Example: A customer’s unique heatsink with very little static load (as little as
0 lbf) is acceptable from a socket loading perspective as long as the T
specification
CASE
is met.
Compliance to Board Keepout Zones in Appendix B is assumed for this assembly
process.
34Thermal/Mechanical Design Guide
Thermal Solutions
5.3.1Thermal Interface Material (TIM)
TIM should be verified to be within its recommended shelf life before use.
Surfaces should be free of foreign materials prior to application of TIM.
Use isopropyl alcohol and a lint free cloth to remove old TIM before applying new TIM.
5.4Structural Considerations
Mass of the 1U reference heatsink and the target mass for 2U and Tower heatsinks
does not exceed 500 gm.
From Table 4-3, the Dynamic Compressive Load of 200 lbf max allows for designs that
exceed 500 gm as long as the mathematical product does not exceed 200 lbf. Example:
A heatsink of 2-lb mass (908 gm) x 50 g (acceleration) x 2.0 Dynamic Amplification
Factor = 200 lbf. The Total Static Compressive Load (Table 4-3) should also be
considered in dynamic assessments.
The heatsink limit of 500 gm and use of back plate have eliminated the need for Direct
Chassis Attach retention (as used previously with the Intel® Xeon® processor 5000
sequence). Direct contact between back plate and chassis pan will help minimize board
deflection during shock.
Placement of board-to-chassis mounting holes also impacts board deflection and
resultant socket solder ball stress. Customers need to assess shock for their designs as
their heatsink retention (back plate), heatsink mass and chassis mounting holes may
vary.
5.5Thermal Design
5.5.1Thermal Characterization Parameter
The case-to-local ambient Thermal Characterization Parameter (CA) is defined by:
Equation 5-1.CA = (T
Where:
T
CASE
T
LA
TDP=TDP (W) assumes all power dissipates through the integrated heat
Equation 5-2.
CA
=
Where:
CS
SA
- TLA) / TDP
CASE
=Processor case temperature (°C). For T
appropriate datasheet.
=Local ambient temperature in chassis at processor (°C).
spreader. This inexact assumption is convenient for heatsink design.
TTVs are often used to dissipate TDP. Correction offsets account for
differences in temperature distribution between processor and TTV.
+
CS
SA
=Thermal characterization parameter of the TIM (°C/W) is dependent
on the thermal conductivity and thickness of the TIM.
=Thermal characterization parameter from heatsink-to-local ambient
(°C/W) is dependent on the thermal conductivity and geometry of the
heatsink and dependent on the air velocity through the heatsink fins.
specification see the
CASE
Figure 5-4 illustrates the thermal characterization parameters.
Processors that offer dual thermal profile are specified in the appropriate datasheet.
Dual thermal profile helps mitigate limitations in volumetrically constrained form
factors and allows trade-offs between heatsink cost and TCC activation risk. For
heatsinks that comply to Profile B, yet do not comply to Profile A (1U heatsink in
Figure 5-5), the processor has an increased probability of TCC activation and an
associated measurable performance loss. Measurable performance loss is defined to be
any degradation in processor performance greater than 1.5%. 1.5% is chosen as the
baseline since run-to-run variation in a performance benchmark is typically between 1
and 2%.
36Thermal/Mechanical Design Guide
Thermal Solutions
Figure 5-5.Dual Thermal Profile
Compliance to Profile A ensures that no measurable performance loss will occur due to
TCC activation. It is expected that TCC would only be activated for very brief periods of
time when running a worst-case real world application in a worst-case thermal
condition. A worst-case real world application is a commercially available, useful
application which dissipates power above TDP for a thermally relevant timeframe. One
example of a worst-case thermal condition is when the processor local ambient
temperature is above the y-axis intercept for Profile A.
5.6Thermal Features
More information regarding processor thermal features is contained in the appropriate
datasheet.
5.6.1Fan Speed Control
There are many ways to implement fan speed control. Using processor ambient
temperature (in addition to Digital Thermal Sensor) to scale fan speed can improve
acoustics when DTS > T
Table 5-4.Fan Speed Control, T
ConditionFSC Scheme
DTS T
CONTROL
DTS T
CONTROL
CONTROL
CONTROL
FSC can adjust fan speed to maintain DTS T
FSC should adjust fan speed to keep T
specification (increased acoustic region).
.
and DTS Relationship
CASE
(low acoustic region).
CONTROL
at or below the Thermal Profile
Thermal/Mechanical Design Guide37
Thermal Solutions
5.6.1.1T
Table 5-5.T
CONTROL
Factory configured T
Guidance
CONTROL
values are available in the appropriate Dear Customer
Letter or may be extracted by issuing a Mailbox or an RDMSR instruction. See the
appropriate datasheet for more information.
Due to increased thermal headroom based on thermal characterization on the latest
processors, customers have the option to reduce T
CONTROL
to values lower than the
factory configured values.
In some situations, use of reduced T
CONTROL
Guidance can reduce average fan power
and improve acoustics. There are no plans to change Intel's specification or the factory
configured T
CONTROL
To implement this guidance, customers must re-write code to set T
values on individual processors.
CONTROL
to the
reduced values provided in the table below. Implementation is optional. Alternately, the
factory configured T
CONTROL
configured and Guidance. Regardless of T
values can still be used, or some value between factory
CONTROL
values used, BIOS needs to identify
the processor type.
CONTROL
TDP
130WSee Note 1Intel® Xeon® Processor 5500 Series
95W-10Intel® Xeon® Processor 5500 Series with 2.93 GHz Max Core Frequency
95W-1Intel® Xeon® Processor 5500 Series frequencies lower than 2.93 GHz
80W-1Intel® Xeon® Processor 5500 Series 2.53 GHz or lower, except Embedded (NEBS)
60W-1Intel® Xeon® Processor 5500 Series 2.26 GHz or lower, except Embedded (NEBS)
130WSee Note 1Intel Xeon processor 5600 series (6 core and 4 core)
95W-1Intel Xeon processor 5600 series (6 core) 2.93 GHz or lower
95W-1Intel Xeon processor 5600 series (4 core) 3.06 GHz or lower
80W-1Intel Xeon processor 5600 series (4 core) 2.66 GHz or lower, except Embedded
60W-1Intel Xeon processor 5600 series (6 core) 2.26 GHz or lower, except Embedded
40W-1Intel Xeon processor 5600 series (4 core) 2.13 GHz or lower, except Embedded
Guidance
T
CONTROL
Guidance
Comment
Notes:
1.Use factory configured T
Implementation of T
CONTROL
(based on modeling of the Intel Reference Design). Implementation of T
values.
CONTROL
Guidance above maintains Intel standards of reliability
CONTROL
of -1
may increase risk of throttling (Thermal Control Circuit activation). Increased TCC
activation may or may not result in measurable performance loss.
Thermal Profile still applies. If PECI >= T
CONTROL
Guidance, then the case temperature
must meet the Thermal Profile.
5.6.2PECI Averaging and Catastrophic Thermal Management
By averaging DTS over PECI, thermal solution failure can be detected and a soft
shutdown can be initiated to help prevent loss of data.
Thermal data is averaged over a rolling window of 256 mS by default (X=8):
AVGN = AVG
38Thermal/Mechanical Design Guide
* (1 – 1/2X) + Temperature * 1/2
N-1
X
Thermal Solutions
Using a smaller averaging constant could cause premature detection of failure.
The Critical Temperature threshold generally triggers somewhere between PECI of
-0.75 and -0.50. To avoid false shutdowns, initiate soft shutdown at -0.25.
Since customer designs, boundary conditions, and failure scenarios differ, above
guidance should be tested in the customer’s system to prevent loss of data during
shutdown.
5.6.3Intel® Turbo Boost Technology
Intel® Turbo Boost Technology (Intel® TBT) is a new feature available on certain
processor SKUs that opportunistically, and automatically, allows the processor to run
faster than the marked frequency if the part is operating below its power, temperature
and current limits.
Heatsink performance (lower CA as described in Section 5.5.1) is one of several
factors that can impact the amount of Intel TBT frequency benefit. Intel TBT
performance is also constrained by ICC, and VCC limits.
Increased IMON accuracy may provide more Intel TBT benefit on TDP limited
applications, as compared to lower CA, as temperature is not typically the limiter for
these workloads.
With Intel TBT enabled, the processor may run more consistently at higher power levels
(but still within TDP), and be more likely to operate above T
when Intel TBT is disabled. This may result in higher acoustics.
With Intel TBT enabled, processors with dual thermal profiles (described in
Section 5.5.2, have greater potential for performance delta between Profile A and
Profile B platforms, as compared to previous platforms.
CONTROL
, as compared to
5.7Thermal Guidance
5.7.1Thermal Excursion Power for Processors with Dual
Thermal Profile
Under fan failure or other anomalous thermal excursions, Tcase may exceed Thermal
Profile B for a duration totaling less than 360 hours per year without affecting long term
reliability (life) of the processor. For more typical thermal excursions, Thermal Monitor
is expected to control the processor power level as long as conditions do not allow the
Tcase to exceed the temperature at which Thermal Control Circuit (TCC) activation
initially occurred. Under more severe anomalous thermal excursions when the
processor temperature cannot be controlled at or below this Tcase level by TCC
activation, then data integrity is not assured. At some higher threshold, THERMTRIP#
will enable a shut down in an attempt to prevent permanent damage to the processor.
Thermal Test Vehicle (TTV) may be used to check anomalous thermal excursion
compliance by ensuring that the processor Tcase value, as measured on the TTV, does
not exceed Tcase_max_B at the anomalous power level for the environmental condition
of interest. This anomalous power level is equal to 75% of the TDP limit.
This guidance can be applied to 95W Intel Xeon processor 5500 series and 95W Intel
Xeon processor 5600 series.
Thermal/Mechanical Design Guide39
Thermal Solutions
5.7.2Thermal Excursion Power for Processors with Single
Thermal Profile
Under fan failure or other anomalous thermal excursions, Tcase may exceed the
thermal profile for a duration totaling less than 360 hours per year without affecting
long term reliability (life) of the processor. For more typical thermal excursions,
Thermal Monitor is expected to control the processor power level as long as conditions
do not allow the Tcase to exceed the temperature at which Thermal Control Circuit
(TCC) activation initially occurred. Under more severe anomalous thermal excursions
when the processor temperature cannot be controlled at or below this Tcase level by
TCC activation, then data integrity is not assured. At some higher threshold,
THERMTRIP# will enable a shut down in an attempt to prevent permanent damage to
the processor. Thermal Test Vehicle (TTV) may be used to check anomalous thermal
excursion compliance by ensuring that the processor Tcase value, as measured on the
TTV, does not exceed Tcase_max at the anomalous power level for the environmental
condition of interest. This anomalous power level is equal to 75% of the TDP limit.
This guidance can be applied to 80 W Intel Xeon processor 5500 series, 80W Intel Xeon
processor 5600 series and 130 W Intel Xeon processor 5600 series.
5.7.3Absolute Processor Temperature
Intel does not test any third party software that reports absolute processor
temperature. As such, Intel cannot recommend the use of software that claims this
capability. Since there is part-to-part variation in the TCC (thermal control circuit)
activation temperature, use of software that reports absolute temperature can be
misleading.
See the appropriate datasheet for details regarding use of
IA32_TEMPERATURE_TARGET register to determine the minimum absolute
temperature at which the TCC will be activated and PROCHOT# will be asserted.
§
40Thermal/Mechanical Design Guide
Quality and Reliability Requirements
6Quality and Reliability
Requirements
6.1Test Conditions
The Test Conditions provided in Table 6-1 address processor heatsink failure
mechanisms only. Test Conditions, Qualification and Visual Criteria vary by customer;
Table 6-1 applies to Intel requirements.
Socket Test Conditions are provided in the LGA1366 Socket Validation Reports available
from socket suppliers listed in Appendix A.
Table 6-1.Heatsink Test Conditions and Qualification Criteria (Sheet 1 of 2)
AssessmentTest ConditionQualification Criteria
1) HumidityNon-operating, 500 hours, +85°C and 85%
2) Board-Level
UnPackaged Shock
3) Board-Level
UnPackaged Vibration
4) First Article
Inspection
5) Shipping Media:
Packaged Shock
6) Shipping Media:
Packaged Vibration
7) Gravitational
Evaluation
R.H.
50G+/-10%; 170+/-10% in/sec; 3 drops
per face, 6 faces.
20 Hz to 500 Hz @ 0.02 g2/Hz (flat).
Input acceleration is 3.13 g RMS.
10 minutes/axis for all 3 axes on all
samples.
Random control limit tolerance is ±3 dB.
Not ApplicableMeet all dimensions on 5 samples.
Drop height determined by weight and may
vary by customer; Intel requirement in
General Supplier Packaging Spec.
10 drops (6 sides, 3 edges, 1 corner)
0.015 g2/Hz @ 10-40 Hz, sloping to 0.0015
g2/Hz @ 500 Hz, 1.03 gRMS, 1 hour/axis
for 3 axes
Required for heatpipe designs.
3 orientations (0°, +90°, -90°)
No visual defects.
As verified in wind tunnel:
• Mean CA + 3s + offset not to exceed
value in Table 5-1 and Table 5-2.
• Pressure drop not to exceed value in
Table 5-1 and Table 5-2.
No damage to heatsink base or pipe.
No visual defects.
As verified in wind tunnel:
• Mean CA + 2.54s + offset not to
exceed value in Table 5-1 and
Table 5-2.
• Pressure drop not to exceed value in
Table 5-1 and Table 5-2.
No damage to heatsink base or pipe.
No visual defects.
As verified in wind tunnel:
• Mean CA + 2.54s + offset not to
exceed value in Table 5-1 and
Table 5-2
• Pressure drop not to exceed value in
Table 5-1 and Table 5-2
Meet all CTF dimensions on 32 additional
samples with 1.33 Cpk (mean + 4s).
If samples are soft-tooled, a hard tool plan
must be defined.
No visual defects1 box
No visual defects1 box
As verified in wind tunnel, mean CA + 3s
+ offset not to exceed value in Table 5-1
and Table 5-2
Min
Sample
Size
15
15
15
37
15
Thermal/Mechanical Design Guide41
Quality and Reliability Requirements
Table 6-1.Heatsink Test Conditions and Qualification Criteria (Sheet 2 of 2)
AssessmentTest ConditionQualification Criteria
8a) Thermal
Performance for
Intel® Xeon®
Processor 5500 Series
Using 1U heatsink and 1U airflow from
Table 5-1:
1) TTV @ 95W (Profile B), Note 1.
Using 2U heatsink and 2U airflow from
Table 5-1:
2) TTV @ 95W (Profile A), Note 1.
3) TTV @ 80W.
As verified in wind tunnel:
1) mean CA+ 3s + offset not to exceed
Table 5-1 value for 95W in 1U.
2-4) mean
Table 5-1 value for 2U.
5-8) mean
Table 5-1 value for Tower.
+ 3s + offset not to exceed
CA
+ 3s + offset not to exceed
CA
4) TTV @ 60W.
Using Tower heatsink and Tower airflow
from Table 5-1:
Min
Sample
Size
5 heatsinks
X 8 tests by
supplier.
Note 1: 30
heatsinks X
3 tests by
Intel.
5) TTV @ 130W, Note 1.
6) TTV @ 95W (Profile A).
7) TTV @ 80W.
8) TTV @ 60W.
8b) Thermal
Performance for
Intel® Xeon®
Processor 5600 Series
Using 1U heatsink and 1U airflow from
Table 5-2:
1) TTV @ 95W (Profile B), Note 1.
Using 2U heatsink and 2U airflow from
Table 5-2:
2) TTV @ 130W, Note 1.
3) TTV @ 95W (Profile A).
4) TTV @ 80W.
As verified in wind tunnel:
1) mean CA+ 3s + offset not to exceed
Table 5-2 value for 95W in 1U.
2-5) mean CA + 3s + offset not to exceed
Table 5-2 value for 2U.
Thermal
Test data
re-assessed
from Intel®
Xeon®
Processor
5500 Series
Qualification
5) TTV @ 60W.
9) Thermal CyclingRequired for heatpipe designs.
Temperature range at pipe in heatsink
assembly: -25C to +100C for 500 cycles.
Cycle time is 30 minutes per full cycle,
divided into half cycle in hot zone and half
in cold zone, with minimum 1min soak at
each temperature extreme for each cycle.
As verified in wind tunnel:
• Mean CA + 3s + offset not to exceed
value in Table 5-1 and Table 5-2.
• Pressure drop not to exceed value in
Table 5-1 and Table 5-2.
15
See Figure 6-1 for example profile.
10) Heat Pipe BurstContinuously raise oven temperature and
record the burst/leak temperatures of fully
assembled heatsinks
No samples < 30 lbf on 0.062" board.
5 highest load samples (from 0.062" test)
< 60 lbf on 0.100" board
30
42Thermal/Mechanical Design Guide
Quality and Reliability Requirements
Figure 6-1.Example Thermal Cycle - Actual profile will vary
6.2Intel Reference Component Validation
Intel tests reference components both individually and as an assembly on mechanical
test boards, and assesses performance to the envelopes specified in previous sections
by varying boundary conditions.
While component validation shows that a reference design is tenable for a limited range
of conditions, customers need to assess their specific boundary conditions and perform
reliability testing based on their use conditions.
Intel reference components are also used in board functional tests to assess
performance for specific conditions.
6.2.1Board Functional Test Sequence
Each test sequence should start with components (baseboard, heatsink assembly, and
so on) that have not been previously submitted to any reliability testing.
The test sequence should always start with a visual inspection after assembly and
BIOS/Processor/memory test. The stress test should be then followed by a visual
inspection and then BIOS/Processor/memory test.
6.2.2Post-Test Pass Criteria
The post-test pass criteria are:
1. No significant physical damage to the heatsink and retention hardware.
Thermal/Mechanical Design Guide43
Quality and Reliability Requirements
2. Heatsink remains seated and its bottom remains mated flat against the IHS
surface. No visible gap between the heatsink base and processor IHS. No visible tilt
of the heatsink with respect to the retention hardware.
3. No signs of physical damage on baseboard surface due to impact of heatsink.
4. No visible physical damage to the processor package.
5. Successful BIOS/Processor/memory test.
6. Thermal compliance testing to demonstrate that the case temperature specification
can be met.
6.2.3Recommended BIOS/Processor/Memory Test Procedures
This test is to ensure proper operation of the product before and after environmental
stresses, with the thermal mechanical enabling components assembled. The test shall
be conducted on a fully operational baseboard that has not been exposed to any
battery of tests prior to the test being considered.
The testing setup should include the following components, properly assembled and/or
connected:
• Appropriate system baseboard.
• Processor and memory.
• All enabling components, including socket and thermal solution parts.
The pass criterion is that the system under test shall successfully complete the
checking of BIOS, basic processor functions and memory, without any errors.
6.3Material and Recycling Requirements
Material shall be resistant to fungal growth. Examples of non-resistant materials
include cellulose materials, animal and vegetable based adhesives, grease, oils, and
many hydrocarbons. Synthetic materials such as PVC formulations, certain
polyurethane compositions (for example, polyester and some polyethers), plastics
which contain organic fillers of laminating materials, paints, and varnishes also are
susceptible to fungal growth. If materials are not fungal growth resistant, then MILSTD-810E, Method 508.4 must be performed to determine material performance.
Any plastic component exceeding 25 gm should be recyclable per the European Blue
Angel recycling standards.
The following definitions apply to the use of the terms lead-free, Pb-free, and RoHS
compliant.
Lead-free and Pb-free: Lead has not been intentionally added, but lead may still
exist as an impurity below 1000 ppm.
RoHS compliant: Lead and other materials banned in RoHS Directive are either
(1) below all applicable substance thresholds as proposed by the EU or (2) an
approved/pending exemption applies.
Note:RoHS implementation details are not fully defined and may change.
§
44Thermal/Mechanical Design Guide
Component Suppliers
AComponent Suppliers
Various suppliers have developed support components for processors in the Intel®
Xeon® 5500 Platform. These suppliers and components are listed as a convenience to
customers. Intel does not guarantee quality, reliability, functionality or compatibility of
these components. The supplier list and/or the components may be subject to change
without notice. Customers are responsible for the system thermal, mechanical, and
environmental verification of the components with the supplier.
A.1Intel Enabled Supplier Information
Performance targets for heatsinks are described in Section 5.1. Mechanical drawings
are provided in Appendix B. Mechanical models are listed in Table 1-1. Heatsinks
assemble to server back plate Table A-4.
A.1.1Intel Reference Thermal Solution
The Intel reference thermal solutions have been verified to meet the criteria outlined in
Table 6-1. Customers can purchase the Intel reference thermal solutions from the
suppliers listed in Table A-1.
Table A-1. Suppliers for the Intel Reference Thermal Solution
AssemblyComponentDescriptionSupplier PNSupplier Contact Info
Assembly, Heat
Sink, 1U
1U URS Intel
Reference
Heatsink p/n
E32409-001
1U URS SSI Blade
Reference
Heatsink p/n
E39069-001 refers
to E22056 Rev 02 +
Snap Cover
27 mm 1U Aluminum Fin,
Copper Base, includes
TIM, 95W capable
25.5mm 1U Aluminum
Fin, Copper Base,
includes TIM and Snap
Cover, 95W capable.
Andrew S.K. Ho (APAC)
andrew.ho@honeywell.com
(852) 9095-4593
Andy Delano (Technical)
Andrew.Delano@Honeywell.co
m 509-252-2224
A.1.2Intel Collaboration Thermal Solution
The Intel collaboration thermal solutions have been verified to meet the criteria
outlined in Table 6-1. Customers can purchase the Intel collaboration thermal solutions
from the suppliers listed in Table A-2.
Thermal/Mechanical Design Guide45
Component Suppliers
Table A-2. Suppliers for the Intel Collaboration Thermal Solution
AssemblyComponentDescriptionSupplier PNSupplier Contact Info
Assembly,
Heatsink,
Intel® Xeon®
Processor 5500
Series and
Intel® Xeon®
Processor 5600
Series, 2U
Assembly,
Heatsink,
Intel® Xeon®
Processor 5500
Series and
Intel® Xeon®
Processor 5600
Series, Pedestal
2U URS Heatsink
Intel Collaboration
Heatsink p/n
E32410-001
Tower URS Heatsink
Intel Collaboration
Heatsink p/n
E32412-001
Supplier Designed
Solution with
Intel-specified
retention, includes
TIM, 130W
capable
Supplier Designed
Solution with
Intel-specified
retention, includes
TIM, 130W
capable
Foxconn
pn 1A016500
Chaun-Choung
Technology Corp
(CCI)
pn 0007029401
Foxconn
Ray Wang
ray.wang@foxconn.com
(512) 670-2638 ext 273
The alternative thermal solutions are preliminary and are not verified by Intel to meet
the criteria outlined in Table 6-1. Customers can purchase the alternative thermal
solutions from the suppliers listed in Table A-3.
Table A-3. Suppliers for the Alternative Thermal Solution (Sheet 1 of 2)
AssemblyComponentDescriptionSupplier PN
Assembly,
Heat Sink, 1U
Assembly
Heatsink, 1U
1U SSI Blade
Alternative
URS Heatsink
1U Alternative
URS Heatsink
StandardTaiSol Corporation
1A1-9031000960-A
www.Taisol.com
StandardThermaltake
CL-P0484
www.Thermaltake.com
StandardCoolerMaster
StandardAavid Thermalloy
PerformanceAavid Thermalloy
Standard
Performance
Performance
S1N-PJFCS-07-GP
www.CoolerMaster.com
050073
www.AavidThermalloy.com
050231
www.AavidThermalloy.com
CoolJag
JYC0B39CTA
www.CoolJag.com
Taiwan Microloops
99-520040-M03
www.Microloops.com
Vapro, Inc.
MS109AH-Cu
www.VaproInc.com
Intel® Xeon®
Processor
5500 Series
95W capable95W capable
95W capable95W capable
95W capable95W capable
95W capable95W capable
95W capable95W capable
95W capable95W capable
95W capable95W capable
95W capable95W capable
Intel® Xeon®
Processor
5600 Series
46Thermal/Mechanical Design Guide
Component Suppliers
Table A-3. Suppliers for the Alternative Thermal Solution (Sheet 2 of 2)
AssemblyComponentDescriptionSupplier PN
Assembly,
Heatsink, 2U
Assembly,
Heatsink,
Tower
Assembly,
Heatsink
2U Alternative
URS Heatsink
Tower
Alternative
URS Heatsink
Pedestal/2U
Active
Heatsink
StandardAsia Vital Components
StandardThermaltake
www.Thermaltake.com
StandardCoolerMaster
www.CoolerMaster.com
StandardTaiSol Corporation
Low CostDynatron Corporation
www.Dynatron-Corp.com
Low Cost
StandardTaiSol Corporation
StandardThermaltake
www.Thermaltake.com
Active
Dynatron Corporation*
www.Dynatron-Corp.com
(AVC)
SR40400001
www.AVC.com.tw
CL-P0486
S2N-PJMHS-07-GP
1A0-9041000960-A
www.Taisol.com
(Top Motor/Dynaeon)
G520
CoolJag
JAC0B40A
www.CoolJag.com
1A0-9051000960-A
www.Taisol.com
CL-P0485
(Top Motor/Dynaeon)
G555
Intel® Xeon®
Processor
5500 Series
95W capable130W capable
95W capable95W capable
95W capable80W capable
95W capable130W capable
80W capable80W capable
80W capable80W capable
130W capable130W capable
130W capable130W capable
80W capable80W capable
Intel® Xeon®
Processor
5600 Series
Notes:
1) Standard - Design and technology similar to Intel Reference or Collaboration designs, however, may not meet thermal
requirements for all processor SKUs.
2) Performance - 1U Heatsink designed with premium materials or technology expected to provide optimum thermal performance
for all processor SKUs.
3) Low Cost - 2U Cost-Optimized Heatsink, expected to meet thermal targets for lower power processor SKUs.
A.1.4Socket and ILM Components
The LGA1366 Socket and ILM Components are described in Chapter 2 and Chapter 3,
respectively. Socket mechanical drawings are provided in Appendix C. Mechanical
models are listed in Table 1-1.
Table A-4. LGA1366 Socket and ILM Components
ItemIntel PNFoxconnTycoMolex
ILM Cover AssemblyD92428-003PT44L13-41011554105-1475939000
Server Back Plate D92433-002PT44P12-41011981467-1475937000
LGA1366 SocketD86205-002PE136627-4371-01F1939737-1475940001
§
Thermal/Mechanical Design Guide47
Component Suppliers
48Thermal/Mechanical Design Guide
Mechanical Drawings
BMechanical Drawings
Table B-1. Mechanical Drawing List
DescriptionFigure
Board Keepin / Keepout Zones (Sheet 1 of 4)Figure B-1
Board Keepin / Keepout Zones (Sheet 2 of 4)Figure B-2
Board Keepin / Keepout Zones (Sheet 3 of 4)Figure B-3
Board Keepin / Keepout Zones (Sheet 4 of 4)Figure B-4
1U Reference Heatsink Assembly (Sheet 1 of 2)Figure B-5
1U Reference Heatsink Assembly (Sheet 2 of 2)Figure B-6
1U Reference Heatsink Fin and Base (Sheet 1 of 2)Figure B-7
1U Reference Heatsink Fin and Base (Sheet 2 of 2)Figure B-8
Heatsink Shoulder Screw (1U, 2U and Tower)Figure B-9
Heatsink Compression Spring (1U, 2U and Tower)Figure B-10
Heatsink Retaining Ring (1U, 2U and Tower)Figure B-11
Heatsink Load Cup (1U, 2U and Tower)Figure B-12
2U Collaborative Heatsink Assembly (Sheet 1 of 2)Figure B-13
2U Collaborative Heatsink Assembly (Sheet 2 of 2)Figure B-14
2U Collaborative Heatsink Volumetric (Sheet 1 of 2)Figure B-15
2U Collaborative Heatsink Volumetric (Sheet 2 of 2)Figure B-16
Tower Collaborative Heatsink Assembly (Sheet 1 of 2)Figure B-17
Tower Collaborative Heatsink Assembly (Sheet 2 of 2)Figure B-18
Tower Collaborative Heatsink Volumetric (Sheet 1 of 2)Figure B-19
Tower Collaborative Heatsink Volumetric (Sheet 2 of 2)Figure B-20
1U Reference Heatsink Assembly with TIM (Sheet 1 of 2)Figure B-21
1U Reference Heatsink Assembly with TIM (Sheet 2 of 2)Figure B-22
2U Reference Heatsink Assembly with TIM (Sheet 1 of 2)Figure B-23
2U Reference Heatsink Assembly with TIM (Sheet 2 of 2)Figure B-24
Tower Reference Heatsink Assembly with TIM (Sheet 1 of 2)Figure B-25
Tower Reference Heatsink Assembly with TIM (Sheet 2 of 2)Figure B-26
25.5mm Reference Heatsink Assembly (Sheet 1 of 2)Figure B-27
25.5mm Reference Heatsink Assembly (Sheet 2 of 2)Figure B-28
25.5mm Reference Heatsink Fin and Base (Sheet 1 of 2)Figure B-29
25.5mm Reference Heatsink Fin and Base (Sheet 2 of 2)Figure B-30
25.5mm Reference Heatsink Assembly with TIM (Sheet 1 of 2)Figure B-31
25.5mm Reference Heatsink Assembly with TIM (Sheet 2 of 2)Figure B-32
Thermal/Mechanical Design Guide49
Figure B-1. Board Keepin / Keepout Zones (Sheet 1 of 4)
Mechanical Drawings
50Thermal/Mechanical Design Guide
Mechanical Drawings
Figure B-2. Board Keepin / Keepout Zones (Sheet 2 of 4)
Thermal/Mechanical Design Guide51
Figure B-3. Board Keepin / Keepout Zones (Sheet 3 of 4)
Mechanical Drawings
52Thermal/Mechanical Design Guide
Mechanical Drawings
Figure B-4. Board Keepin / Keepout Zones (Sheet 4 of 4)
Thermal/Mechanical Design Guide53
Figure B-5. 1U Reference Heatsink Assembly (Sheet 1 of 2)
Mechanical Drawings
54Thermal/Mechanical Design Guide
Mechanical Drawings
Figure B-6. 1U Reference Heatsink Assembly (Sheet 2 of 2)
Thermal/Mechanical Design Guide55
Figure B-7. 1U Reference Heatsink Fin and Base (Sheet 1 of 2)
Mechanical Drawings
56Thermal/Mechanical Design Guide
Mechanical Drawings
Figure B-8. 1U Reference Heatsink Fin and Base (Sheet 2 of 2)
Thermal/Mechanical Design Guide57
Figure B-9. Heatsink Shoulder Screw (1U, 2U and Tower)
Mechanical Drawings
58Thermal/Mechanical Design Guide
Mechanical Drawings
Figure B-10. Heatsink Compression Spring (1U, 2U and Tower)
Thermal/Mechanical Design Guide59
Figure B-11. Heatsink Retaining Ring (1U, 2U and Tower)
Mechanical Drawings
60Thermal/Mechanical Design Guide
Mechanical Drawings
Figure B-12. Heatsink Load Cup (1U, 2U and Tower)
Thermal/Mechanical Design Guide61
Figure B-13. 2U Collaborative Heatsink Assembly (Sheet 1 of 2)
Mechanical Drawings
62Thermal/Mechanical Design Guide
Mechanical Drawings
Figure B-14. 2U Collaborative Heatsink Assembly (Sheet 2 of 2)
Thermal/Mechanical Design Guide63
Figure B-15. 2U Collaborative Heatsink Volumetric (Sheet 1 of 2)
Mechanical Drawings
64Thermal/Mechanical Design Guide
Mechanical Drawings
Figure B-16. 2U Collaborative Heatsink Volumetric (Sheet 2 of 2)
Thermal/Mechanical Design Guide65
Figure B-17. Tower Collaborative Heatsink Assembly (Sheet 1 of 2)
Mechanical Drawings
66Thermal/Mechanical Design Guide
Mechanical Drawings
Figure B-18. Tower Collaborative Heatsink Assembly (Sheet 2 of 2)
Thermal/Mechanical Design Guide67
Figure B-19. Tower Collaborative Heatsink Volumetric (Sheet 1 of 2)
Mechanical Drawings
68Thermal/Mechanical Design Guide
Mechanical Drawings
Figure B-20. Tower Collaborative Heatsink Volumetric (Sheet 2 of 2)
Thermal/Mechanical Design Guide69
Figure B-21. 1U Reference Heatsink Assembly with TIM (Sheet 1 of 2)
Mechanical Drawings
70Thermal/Mechanical Design Guide
Mechanical Drawings
Figure B-22. 1U Reference Heatsink Assembly with TIM (Sheet 2 of 2)
Thermal/Mechanical Design Guide71
Figure B-23. 2U Reference Heatsink Assembly with TIM (Sheet 1 of 2)
Mechanical Drawings
72Thermal/Mechanical Design Guide
Mechanical Drawings
Figure B-24. 2U Reference Heatsink Assembly with TIM (Sheet 2 of 2)
Thermal/Mechanical Design Guide73
Figure B-25. Tower Reference Heatsink Assembly with TIM (Sheet 1 of 2)
Mechanical Drawings
74Thermal/Mechanical Design Guide
Mechanical Drawings
Figure B-26. Tower Reference Heatsink Assembly with TIM (Sheet 2 of 2)
Thermal/Mechanical Design Guide75
Figure B-27. 25.5mm Reference Heatsink Assembly (Sheet 1 of 2)
Mechanical Drawings
76Thermal/Mechanical Design Guide
Mechanical Drawings
Figure B-28. 25.5mm Reference Heatsink Assembly (Sheet 2 of 2)
Thermal/Mechanical Design Guide77
Figure B-29. 25.5mm Reference Heatsink Fin and Base (Sheet 1 of 2)
Mechanical Drawings
78Thermal/Mechanical Design Guide
Mechanical Drawings
Figure B-30. 25.5mm Reference Heatsink Fin and Base (Sheet 2 of 2)
Thermal/Mechanical Design Guide79
Figure B-31. 25.5mm Reference Heatsink Assembly with TIM (Sheet 1 of 2)
Mechanical Drawings
80Thermal/Mechanical Design Guide
Mechanical Drawings
Figure B-32. 25.5mm Reference Heatsink Assembly with TIM (Sheet 2 of 2)
Thermal/Mechanical Design Guide81
Mechanical Drawings
§
82Thermal/Mechanical Design Guide
Socket Mechanical Drawings
CSocket Mechanical Drawings
Table C-1 lists the mechanical drawings included in this appendix.
Table C-1. Mechanical Drawing List
Drawing DescriptionFigure Number
“Socket Mechanical Drawing (Sheet 1 of 4)”Figure C-1
“Socket Mechanical Drawing (Sheet 2 of 4)”Figure C-2
“Socket Mechanical Drawing (Sheet 3 of 4)”Figure C-3
“Socket Mechanical Drawing (Sheet 4 of 4)”Figure C-4
Thermal/Mechanical Design Guide83
Figure C-1. Socket Mechanical Drawing (Sheet 1 of 4)
Socket Mechanical Drawings
84Thermal/Mechanical Design Guide
Socket Mechanical Drawings
Figure C-2. Socket Mechanical Drawing (Sheet 2 of 4)
Thermal/Mechanical Design Guide85
Figure C-3. Socket Mechanical Drawing (Sheet 3 of 4)
Socket Mechanical Drawings
86Thermal/Mechanical Design Guide
Socket Mechanical Drawings
Figure C-4. Socket Mechanical Drawing (Sheet 4 of 4)
§
Thermal/Mechanical Design Guide87
Socket Mechanical Drawings
88Thermal/Mechanical Design Guide
Heatsink Load Metrology
DHeatsink Load Metrology
To ensure compliance to max socket loading value listed in Table 4-3, and to meet the
performance targets for Thermal Interface Material in Table 5.3, the Heatsink Static
Compressive Load can be assessed using the items listed below:
• HP34970A DAQ
• Omegadyne load cell, 100 lbf max (LCKD-100)
• Test board (0.062") with ILM & back plate installed
Figure D-1. Intel Xeon Processor 5500 Series Load Cell Fixture
Heatsink Load Metrology
§
90Thermal/Mechanical Design Guide
Embedded Thermal Solutions
EEmbedded Thermal Solutions
This section describes the LV processors and Embedded reference heatsinks for NEBS
(Network Equipment Building Systems) compliant ATCA (Advanced Telecommunications
Computing Architecture) systems. These LV processors are good for any form factor
that needs to meet NEBS requirements.
E.1Performance Targets
Table E-1 and Table E-2 provide boundary conditions and performance targets for 1U
and ATCA heatsinks. These values are used to generate processor thermal
specifications and to provide guidance for heatsink design.
Table E-1. Boundary Conditions and Performance Targets for Intel® Xeon® Processor
5500 Series
ParameterValueValue
Altitude, system ambient temp
Nominal/Short-term
TDP60 W38 W
1,4
T
LA
2
CA
System height (form factor)31U (EEB) or ATCAATCA
Heatsink volumetric
Heatsink technology
5
Sea level, 40oC/55CSea level, 40oC/55C
51.9/66.9oC50/65oC
0.336oC/W0.532oC/W
1U (90 x 90 x 27) or Custom
ATCA (90 x 90 x 13mm + heat
exchanger)
Cu base, Cu fins
ATCA (90 x 90 x 13 mm)
Table E-2. Boundary Conditions and Performance Targets for Intel® Xeon® Processor
5600 Series
ParameterValueValue
Altitude, system ambient temp
Nominal/Short-term
TDP60 W40W
1,4
T
LA
2
CA
System height (form factor)31U (EEB) or ATCAATCA
Heatsink volumetric
Heatsink technology
5
Sea level, 40oC/55CSea level, 40oC/55C
51.7/66.7oC50/65oC
0.306oC/W0.548oC/W
1U (90 x 90 x 27) or Custom
ATCA (90 x 90 x 13mm + heat
exchanger)
Cu base, Cu fins
ATCA (90 x 90 x 13 mm)
NOTES:
1. Local ambient temperature of the air entering the heatsink.
2. Max target (mean + 3 sigma + offset) for thermal characterization parameter (Section 5.5.1).
3. Reference system configuration. In a single wide ATCA blade the 60 W processor should be used in single
Thermal/Mechanical Design Guide91
socket only and the 38 W processor can be used in dual socket.
4. Local Ambient Temperature written 50/65o C means 50oC under Nominal conditions but 65oC is allowed for
Short-Term NEBS excursions.
5. Passive heatsinks with TIM.
6. See Section 5.1 for standard 1U solutions that do not need to meet NEBS.
Detailed drawings for the ATCA reference heatsink can be found in Section E.3.
Table E-1 and Table E-2 above specify CA targets. Figure E-1 below shows CA and
pressure drop for the ATCA heatsink versus the airflow provided. Best-fit equations are
provided to prevent errors associated with reading the graph.
Figure E-1. ATCA Heatsink Performance Curves
Embedded Thermal Solutions
2.5
P = 1.3e-04CFM2 +1.1e-02CFM
2
1.5
1
0.5
Mean ca= 0.337 + 1.625 CFM
0
05101520253035
CFM Through Fins
Other LGA1366 compatible thermal solutions may work with the same retention.
E.2Thermal Design Guidelines
2
1.6
1.2
0.8
0.4
-0.939
0
E.2.1NEBS Thermal Profile
Processors that offer a NEBS compliant thermal profile are specified in the appropriate
Datasheet.
NEBS thermal profiles help relieve thermal constraints for Short-Term NEBS conditions.
To help reliability, processors must meet the nominal thermal profile under standard
operating conditions and can only rise up to the Short-Term spec for NEBS excursions
(see Figure E-2). The definition of Short-Term time is clearly defined for NEBS Level 3
conditions but the key is that it cannot be longer than 360 hours per year.
92Thermal/Mechanical Design Guide
Embedded Thermal Solutions
Figure E-2. NEBS Thermal Profile
\
90
Short-term Thermal Profile may only be used for short term
excursions to higher ambient temperatures, not to exceed 360
80
hours per year
Thermal Profile
70
Short-Term Thermal Profile
Tc = 0.302 * P + 66.9
60
50
40
051015202530354045505560
Power [W]
NOTES:
1.) The thermal specifications shown in this graph are for reference only. See the appropriate Datasheet for the
Thermal Profile specifications. In case of conflict, the data in the datasheet supersedes any data in this figure.
2.) The Nominal Thermal Profile must be used for all normal operating conditions, or for products that do not
require NEBS Level 3 compliance.
3.) The Short-Term Thermal Profile may only be used for short-term excursions to higher ambient operating
temperatures, not to exceed 360 hours per year as compliant with NEBS Level 3.
4.) Implementation of either thermal profile should result in virtually no TCC activation.
5.) Utilization of a thermal solution that exceeds the Short-Term Thermal Profile, or which operates at the ShortTerm Thermal Profile for a duration longer than the limits specified in Note 3 above, do not meet the processor
thermal specifications and may result in permanent damage to the processor.
E.2.2Custom Heat Sinks For UP ATCA
The Embedded specific 60W SKU is targeted for NEBS compliant 1U+ systems and UP
ATCA configurations with custom thermal solutions. In order to cool this part in a single
wide ATCA slot, a custom thermal solution will be required. Since solutions like this will
be very configuration specific, this heat sink was not fully designed with retention and
keep-out definitions.
Nominal Thermal Profile
Tc = 0.302* P + 51.9
In order to cool the additional power of a 60W processor in ATCA, the heat sink volume
was increased. The assumption was that the heat sink could not grow wider because of
VR and Memory placement, so a Remote Heat Exchanger (RHE) was used. The RHE is
attached to the main heat sink with a heat pipe. The RHE gives additional convective
surface area and gives the thermal solution access to more air. Samples of the
following design were ordered and tested for thermal performance only.
Flotherm analysis shows that the following design can cool an LGA1366 TTV in an ATCA
blade at 30CFM. The heat sink ca would be 0.50C/W at 55C ambient which falls below
the thermal profile for the 60W processor.
Thermal/Mechanical Design Guide93
Figure E-3. UP ATCA Thermal Solution
Embedded Thermal Solutions
NOTES:Thermal sample only, retention not production ready.
Figure E-4. UP ATCA System Layout
NOTES:Heat sink should be optimized for the layout.
94Thermal/Mechanical Design Guide
Embedded Thermal Solutions
Figure E-5. UP ATCA Heat Sink Drawing
§
Thermal/Mechanical Design Guide95
Embedded Thermal Solutions
E.3Mechanical Drawings and Supplier Information
See Appendix B for retention and keep out drawings.
The part number below represent Intel reference designs for a DP ATCA heatsink.
Customer implementation of these components may be unique and require validation
by the customer. Customers can obtain these components directly from the supplier
below.
Table E-3. Embedded Heatsink Component Suppliers
AssemblyComponentDescriptionSupplier PNSupplier Contact Info
Fujikura America
Ash Ooe
a_ooe@fujikura.com
408-748-6991
Fujikura Taiwan Branch
Yao-Hsien Huang
yeohsien@fujikuratw.com
.tw
886(2)8788-4959
Assembly,
Heat Sink,
Nehalem-EP,
ATCA
ATCA
Reference
heatsink
Intel P/N
E65918-001
ATCA Copper
Fin, Copper
Base
Fujikura
HSA-7901
Table E-4. Mechanical Drawings List
ParameterValue
ATCA Reference Heat Sink Assembly (Sheet 1 of 2)Figure E-6
ATCA Reference Heat Sink Assembly (Sheet 2 of 2)Figure E-7
ATCA Reference Heatsink Fin and Base (Sheet 1 of 2)Figure E-8
ATCA Reference Heatsink Fin and Base (Sheet 2 of 2)Figure E-9