Intel SSDSC2BB800G601 User Manual

Page 1
Intel® Solid State Drive DC S3510 Series
Product Specification
Capacity:
1.2TB, 1.6TB
Components:
16nm NAND Flash Memory
Standard Endurance Technology (SET)
Multi-Level Cell (MLC)
Form Factor: 2.5–inch Read and Write IOPS
1,2
(Full LBA Range, IOMeter* Queue Depth 32)
Random 4KB
Random 4KB Writes: Up to 20,000 IOPS
Random 8KB
Random 8KB Writes: Up to 10,000 IOPS
Bandwidth Performance
Sustained Sequential Read: Up to 500 MB/s
Sustained Sequential Write: Up to 460 MB/s
Endurance: 0.3 drive writes per day
80GB: 45 TBW 120GB: 70 TBW
240GB: 140 TBW 480GB: 275 TBW
800GB: 450 TBW 1.2TB: 660 TBW
1.6TB: 880 TBW
Latency (average sequential)
Read: 55 µs (TYP)
Write: 66 µs (TYP)
Quality of Service
Read/Write: 500 µs / <5 ms (99.9%)
Performance Consistency
Read/Write: Up to 95%/95% (99.9%)
AES 256-bit Encryption
Altitude
Operating: -1,000 to 10,000 ft
Operating
Non-operating: -1,000 to 40,000 ft
Product Ecological Compliance
RoHS*
Compliance
SATA Revision 3.0; compatible with SATA 6Gb/s, 3Gb/s
and 1.5Gb/s interface rates
ATA/ATAPI Command Set – 2 (ACS-2 Rev 7);
includes SCT (Smart Command Transport) and device statistics log support
Enhanced SMART ATA feature set
− Native Command Queuing (NCQ) command set
− Data set management Trim command
1. Performance values vary by capacity
2. Performance s pecificatio ns apply to both compre ssible and incompressi ble data
3. 4KB = 4,096 bytes; 8KB = 8,192 bytes.
4.
MB/s = 1,000,000 bytes/second
5. Based on JESD218 standard.
6. Based on Random 4KB QD=1 workload, measured as the time taken for 99.9
7. Measurement taken once the workload has reached steady state but including all background activities required for normal operation and data reliability
8. Based on Random 4KB QD=32 workload, measured as the (IOPS in the 99.9
9. Altitude pressure is simulated in a test chamber; excludes soft error
10. Extended operation at a higher altitude might impact reliability.
11. If both 12V and 5V power supplies are present, defaults to 5V+ 12V power supplies. Does not s upport 12 volt only.
12. Based on 5Vpower supply
13. Please contact your Intel representative for details on the non-operating temperature range
Order Number: 332211-004US
3
Reads: Up to 68,000 IOPS
3
Reads: Up to 46,000 IOPS
6,7
9
10
: 10,000 to 15,000 ft
1
7,8
4
5
for 5 years
percentile of commands to finish the round-trip from host to drive and back to hos t
th
percentile slowest 1-second interval)/(average IOPS during the test)
Power Management
5V or 5V+12V SATA Supply Rail
11
− SATA Interface Power Management
OS-aware hot plug/removal
Enhanced power-loss data protection feature
Power
12
Active: Up to 5.6 W
7
(TYP)
Idle: 600 mW
Weight:
80GB, 120GB, 240GB: 63 grams ± 2 grams
480GB, 800GB: 68 grams ± 2 grams
1.2TB, 1.6TB: 71 grams ± 2 grams
Temperature
Operating: 0°
Non-Operating
C to 70° C
13
: -55° C to 95° C
− Temperature monitoring and logging
Thermal throttling when approaching
maximum operating temperature
Shock (operating and non-operating):
1,000 G/0.5 ms
Vibration
Operating: 2.17 G
Non-Operating: 3.13 G
Reliability
(5-700 Hz)
RMS
RMS
(5-800 Hz)
Uncorrectable Bit Error Rate (UBER):
^17
1 sector per 10
bits read
Mean Time Between Failures (MTBF): 2 million hours
End-to-End data protection
Certifications and Declarations
UL*, CE*, RMC Mark*, BSMI*, KCC*, Microsoft* WHCK,
VCCI*, SATA-IO*
Compatibility
Windows 7*, Windows 8*, Windows 8.1* and Windows 10*
− Windows Server 2012* R2
Windows Server 2012*
Windows Server 2008* Enterprise 32/64bit SP2
Windows Server 2008* R2 SP1
Windows Server 2003* Enterprise R2 64bit SP2
− VMWare* 5.1, 5.5
− Red Hat* Enterprise Linux* 5.5, 5.6, 6.1, 6.3, 7.0
SUSE* Linux* Enterprise Server 10, 11 SP1
CentOS* 64bit 5.7, 6.3
Intel® SSD Toolbox with Intel® SSD Optimizer
Page 2
Revision
Description
Date

Revision History

Intel® Solid State Drive DC S3610 Series
001
002
003
004
Initial release.
• Table 15, SMART Attributes:
- SMART Attribute EAh - added bytes description
- Added new SMART Attribute F3h description and status flags
Section 5.4.2: Updated SMART Attribute E2h decimal precision
points from 3 to 2
• Updated Electrical Characteristics table and power value
Updated weight measurements with more precise values
• Updated Agency approval data
• Removed reference to M.2 as not applicable to the S3510
May 2015
July 2015
October 2015
February 2016
Product Specification February 2016 2 332211-004US
Page 3
Intel® Solid State Drive DC S3510 Series

Ordering Information

Contact your local Intel sales representative for ordering information.
Intel may make changes to specifications and product descriptions at any time, without notice. Designers must not rely on the absence or characteristics of any features or instructions marked "reserved" or "undefined." Intel reserves these for future definition and shall have no responsibility whatsoever for conflicts or incompatibilities arising from future changes to them. The information here is subject to change without notice. Do not finalize a design with this information.
Tests document performance of components on a particular test, in specific systems. Differences in hardware, software, or configuration will affect actual performance. Consult other sources of information to evaluate performance as you consider your purchase.
System Configuration for all performance testing: Intel® Core™ i7-3960x on Intel® DX79SI desktop motherboard, BIOS Version 0537 – SIX7910J.86A.0537.2012.0723.1217 8GB DDR3 LSI 9265-8i, FW 3.190.25-1776, Intel® SSD DC S3510 FW G2010130
All documented endurance test results are obtained in compliance with JESD218 Standards; refer to individual sub-sections within this document for specific methodologies. See www.jedec.org
The products described in this document may contain design defects or errors known as errata which may cause the product to deviate from published specifications. Current characterized errata are available on request.
Contact your local Intel sales office or your distributor to obtain the latest specifications and before placing your product order.
Copies of documents which have an order number and are referenced in this document, or other Intel literature, may be obtained by calling 1-800-548-4725, or go to: http://www.intel.com/design/literature.htm
Intel and the Intel logo are trademarks of Intel Corporation in the U.S. and other countries.
*Other names and brands may be claimed as the property of others.
Copyright © 2016 Intel Corporation. All rights reserved.
for detailed definitions of JESD218 Standards.
.
February 2016 Product Specification 332211-004US 3
Page 4
Intel® Solid State Drive DC S3510 Series
Contents
Revision History ......................................................................................................................................................................................... 2
Ordering Information .............................................................................................................................................................................. 3
Terminology ................................................................................................................................................................................................ 6
1 Overview ....................................................................................................................................................................... 7
2 Product Specifications .............................................................................................................................................. 8
2.1 Capacity ......................................................................................................................................................................................... 8
2.2 Performance ................................................................................................................................................................................ 8
2.3 Electrical Characteristics .................................................................................................................................................... 10
2.4 Environmental Conditions ................................................................................................................................................. 13
2.5 Product Regulatory Compliance ..................................................................................................................................... 13
2.6 Reliability ................................................................................................................................................................................... 14
2.7 Temperature Sensor ............................................................................................................................................................ 15
2.8 Power Loss Capacitor Test ................................................................................................................................................ 15
2.9 Hot Plug Support ................................................................................................................................................................... 15
3 Mechanical Information ......................................................................................................................................... 16
4 Pin and Signal Descriptions .................................................................................................................................. 17
4.1 2.5-inch Form Factor Pin Locations .............................................................................................................................. 17
4.2 Connector Pin Signal Definitions .................................................................................................................................... 17
4.3 Power Pin Signal Definitions............................................................................................................................................. 18
5 Supported Command Sets .................................................................................................................................... 19
5.1 ATA General Feature Command Set ............................................................................................................................. 19
5.2 Power Management Command Set............................................................................................................................... 19
5.3 Security Mode Feature Set ................................................................................................................................................ 19
5.4 SMART Command Set ......................................................................................................................................................... 20
5.5 Device Statistics ...................................................................................................................................................................... 25
5.6 SMART Command Transport (SCT) ............................................................................................................................... 27
5.7 Data Set Management Command Set .......................................................................................................................... 27
5.8 Host Protected Area Command Set .............................................................................................................................. 27
5.9 48-Bit Address Command Set ......................................................................................................................................... 28
5.10 General Purpose Log Command Set............................................................................................................................. 28
5.11 Native Command Queuing ................................................................................................................................................ 28
5.12 Software Settings Preservation ....................................................................................................................................... 28
6 Certifications and Declarations ............................................................................................................................ 29
7 References ................................................................................................................................................................ 30
Appendix A: IDENTIFY DEVICE Command Data ............................................................................................................... 31
Product Specification February 2016 4 332211-004US
Page 5
Intel® Solid State Drive DC S3510 Series
Figures
Figure 1: Intel® SSD DC S3510 Series 2.5-inch Dimensions ............................................................................................................... 16
Figure 2: Layout of 2.5-inch Form Factor Signal and Power Segment Pins ................................................................................ 17
Tables
Table 1: User-Addressable Sectors .................................................................................................................................................................. 8
Table 2: Random Read/Write Input/Output Operations Per Second (IOPS)1 .............................................................................. 8
Table 3: Random Read/Write IOPS Consistency1 ...................................................................................................................................... 9
Table 4: Sequential Read and Write Bandwidth1 ...................................................................................................................................... 9
Table 5: Latency ........................................................................................................................................................................................................ 9
Table 6: Quality of Service................................................................................................................................................................................. 10
Table 7: Operating Voltage ............................................................................................................................................................................... 10
Table 8: Power Consumption (5V Supply) ................................................................................................................................................. 11
Table 9: Power Consumption (5V + 12V Supply) ................................................................................................................................... 12
Table 10: Temperature, Shock, Vibration ..................................................................................................................................................... 13
Table 11: Product Regulatory Compliance Specifications .................................................................................................................... 13
Table 12: Reliability Specifications .................................................................................................................................................................. 14
Table 13: Serial ATA Connector Pin Signal Definitions—2.5-inch Form Factor ......................................................................... 17
Table 14: Serial ATA Power Pin Definitions—2.5-inch Form Factors .............................................................................................. 18
Table 15: SMART Attributes ................................................................................................................................................................................ 20
Table 16: SMART Attribute Status Flags ....................................................................................................................................................... 23
Table 17: Serial ATA Power Pin Definitions—2.5-inch Form Factors .............................................................................................. 26
Table 18: Device Certifications and Declarations ...................................................................................................................................... 29
Table 19: Standards References ....................................................................................................................................................................... 30
Table 20: Returned Sector Data ........................................................................................................................................................................ 31
February 2016 Product Specification 332211-004US 5
Page 6

Terminology

ATA
Advanced Technology Attachment
CRC
Cyclic Redundancy Check
DAS
Device Activity Signal
DMA
Direct Memory Access
ECC
Error Correction Code
EXT
Extended
FPDMA
First Party Direct Memory Access
because a small portion of the capacity is used for NAND flash management and maintenance purposes.
Gb
Gigabit
HDD
Hard Disk Drive
HET
High Endurance Technology
KB
Kilobyte
I/O
Input/Output
IOPS
Input/Output Operations Per Second
ISO
International Standards Organization
LBA
Logical Block Address
MB
Megabyte (1,000,000 bytes)
MLC
Multi-level Cell
MTBF
Mean Time Between Failures
NCQ
Native Command Queuing
NOP
No Operation
PB
Petabyte
PCB
Printed Circuit Board
PIO
Programmed Input/Output
RMS
Root Mean Square
SATA
Serial Advanced Technology Attachment
SCT
SMART Command Transport
and software systems that automatically monitors the health of a drive and reports potential problems.
SSD
Solid State Drive
TB
Terabyte
TYP
Typical
Term Definition
Intel® Solid State Drive DC S3510 Series
GB
RDT Reliability Demonstration Test
Gigabyte. Note: The total usable capacity of the SSD may be less than the total physical capacity
SMART
UBER Uncorrectable Bit Error Rate
Self-Monitoring, Analysis and Reporting Technology. This is an open standard for developing hard drives
Product Specification February 2016 6 332211-004US
Page 7
Intel® Solid State Drive DC S3510 Series

1 Overview

This document describes the specifications and capabilities of the Intel® SSD DC S3510 Series.
The Intel SSD DC S3510 Series delivers excellent performance and Quality of Service combined with high reliability for Serial Advanced Technology Attachment (SATA)-based computers in capacities of 80GB, 120GB, 240GB, 480GB, 800GB, 1.2TB and 1.6TB in a 2.5-inch form factor.
By combining 16nm NAND Flash Memory technology with SATA 6Gb/s interface support, the Intel SSD DC S3510 Series delivers Sequential Read speeds of up to 500 MB/s and Sequential Write speeds of up to 460 MB/s. The Intel SSD DC S3510 Series also delivers Random 4k Read speeds of up to 68,000 IOPS and Random 4K Write speeds of up to 20,000 IOPS, and Quality of Service of 500 µs for random 4KB reads measured at a queue depth of 1.
The industry-standard 2.5-inch form factors enable interchangeability with existing hard disk drives (HDDs) and native SATA HDD drop-in replacement with the enhanced performance, reliability, ruggedness, and power savings offered by an SSD.
Intel SSD DC S3510 Series offers these key features:
Standard Endurance Technology
High I/O and throughput performance
Consistent I/O latency
Enhanced power-loss data protection
End-to-End data protection
Thermal throttling
Temperature Sensor
Inrush current management
Low power
High reliability
Temperature monitor and logging
Power loss protection capacitor self-test
February 2016 Product Specification 332211-004US 7
Page 8

2 Product Specifications

Intel SSD DC S3510 Series
80GB
120GB
240GB
480GB
800GB
1.2TB
1.6TB

2.1 Capacity

Table 1: User-Addressable Sectors
Intel® Solid State Drive DC S3510 Series
Intel SSD DC S3510 Series
80GB 156,301,488
120GB 234,441,648
240GB 468,862,128
480GB 937,703,088
800GB 1,562,824,368
1.2TB 2,344,225,968
1.6TB 3,125,627,568
Notes: 1GB = 1,000,000,000 bytes; 1 sector = 512 bytes.
LBA count shown represents total user storage capacity and will remain the same throughout the life of the drive.
The total usable capacity of the SSD may be less than the total physical capacity because a small portion of the capacity is used for NAND flash management and maintenance purposes.
(Total User Addressable Sectors in LBA Mode)
Unformatted Capacity

2.2 Performance

Table 2: Random Read/Write Input/Output Operations Per Second (IOPS)1
Specification Unit
Random 4KB Read (up to)2 IOPS 68,000 68,000 68,000 68,000 67,000 67,000 65,000
Random 4KB Write (up to) IOPS 8,400 5,300 10,200 15,100 15,300 20,000 15,200
Random 8KB Read (up to)3 IOPS 41,500 46,000 46,500 46,500 45,000 45,000 44,500
Random 8KB Write (up to) IOPS 4,200 2,600 5,000 7,500 7,700 10,000 7,800
Random 4KB 70/30 Read/Write (up to)
Random 8KB 70/30 Read/Write
Notes:
1. Performance measured using IOMeter* with Queue Depth 32. Measurements are performed on a full Logical Block Address (LBA) span of the drive.
2. 4KB = 4,096 bytes
3. 8KB = 8,192 bytes
Product Specification February 2016 8 332211-004US
(up to)3
IOPS 22,000 14,500 25,000 32,500 32,000 38,000 32,000
2
IOPS 10,500 7,500 13,000 18,000 18,500 23,500 19,000
Page 9
Intel SSD DC S3510 Series
80GB
120GB
240GB
480GB
800GB
1.2TB
1.6TB
Random 4KB Read (up to)2
%
90
92
94
93
95
95
95
Random 8KB Read (up to)3
%
90
90
95
95
94
95
93
Random 8KB Write (up to)
%
88
80
72
86
96
92
88
Intel SSD DC S3510 Series
Unit
80GB
120GB
240GB
480GB
800GB
1.2TB
1.6TB
Sequential Read (SATA 6Gb/s) 1
MB/s
375
475
500
500
500
500
500
Intel® Solid State Drive DC S3510 Series
Table 3: Random Read/Write IOPS Consistency1
Specification Unit
Random 4KB Write (up to) % 95 89 88 85 90 95 92
Notes:
1. Performance consistency measured using IOMeter* based on Random 4KB QD=32 workload, measured as the (IOPS in the 99.9th percentile
slowest 1-second interval) / (average IOPS during the test). Measurements are performed on a full Logical Block Address (LBA) span of the drive once the workload has reached steady state but including all background activities required for normal operation and data reliability
2. 4KB = 4,096 bytes
3. 8KB = 8,192 bytes
Table 4: Sequential Read and Write Bandwidth1
Specification
Sequential Write (SATA 6Gb/s) 1 MB/s 110 135 260 440 460 440 430
Note:
1. Performance measured using IOMeter* with 128KB (131,072 bytes) of transfer size with Queue Depth 32.
Table 5: Latency
Intel SSD DC S3510 Series
Specification
80GB, 120GB, 240GB,400GB 800GB/1.2TB/1.6TB
Latency (TYP)1
Read
Write
Power On to Ready
Notes:
1. Device measured using IOMeter*. Latency measured using 4KB (4,096 bytes) transfer size with Queue Depth equal to 1 on a sequential workload.
2. Power On To Ready time assumes proper shutdown. Time varies if shutdown is not preceded by STANDBY IMMEDIATE command.
For 95% of the time, the maximum time for power on to ready will be less than 15 seconds.
2
55 µs
66 µs
5.0 s
55 µs
66 µs
7.0 s
February 2016 Product Specification 332211-004US 9
Page 10
Table 6: Quality of Service
Intel SSD DC S3510 Series
Queue Depth=1
Queue Depth=32
80GB/ 120GB
240GB/
480GB
800GB/1.2TB/
1.6TB
80GB/
120GB
240GB/
480GB
800GB/1.2TB/
1.6TB
(99.9%)
Reads
ms
<500 µs
<500 µs
<500 µs
<5
<2
<2 /<2 /<5
Writes
ms
<5
<2
<1 /<500 µs/<1
<15
<10
<10 /<5 /<10
(99.9999%)
Reads
ms
<5
<5
<2 /<5 /<2
<5
<5
<5 /<5 /<10
Writes
ms
<15
<10
<5
<20
<15
<15 /<15 /<20
Intel SSDDC S3510 Series
80GB, 120GB, 240GB, 480GB, 800GB, 1.2TB, 1.6TB
Inrush Current (Typical Peak)3
1.2 A, < 1 s
12 V Operating Characteristics:
Inrush Current (Typical Peak) 3
1.2 A, < 1 s
Specification Unit
Intel® Solid State Drive DC S3510 Series
Quality of Service
Quality of Service
Notes:
1. Device measured using IOMeter*. Quality of Service measured using 4KB (4,096 bytes) transfer size on a random workload on a full
Logical Block Address (LBA) span of the drive once the workload has reached steady state but including all background activities required for normal operation and data reliability.
2. Based on Random 4KB QD=1, 32 workloads, measured as the time taken for 99.9(or 99.9999) percentile of commands to finish the
round-trip from host to drive and back to host.
1,2
1,2

2.3 Electrical Characteristics

Table 7: Operating Voltage
Electrical Characteristics
5 V Operating Characteristics:
Operating Voltage range Rise time (Max/Min) Fall time (Min)
1
Noise level
Min Off time
2
500 mV pp 10 Hz – 100 KHz
50 mV pp 100 KHz – 20 MHz
5 V (±5%) 1 s / 1 ms
1 ms
500 ms
Operating Voltage range Rise time (Max/Min) Fall time (Min) Noise level
Min Off time
Notes:
1. Fall time must be equal or better than minimum in order to guarantee full functionality of enhanced power loss management.
2. The drive must be power ed off for at least 500msec before powering on.
3. Measured from initial device power supply application.
Product Specification February 2016 10 332211-004US
1
2
12 V (±10%)
1 s / 1 ms
1 ms
1000 mV pp 10 Hz – 100 KHz
100 mV pp 100 KHz – 20 MHz
500 ms
Page 11
Intel SSD DC S3510 Series
80GB
120GB
240GB
480GB
800GB
1.2TB
1.6TB
Active Write - RMS Average1
W
1.91
2.14
3.06
4.45
4.74
5.24
5.60
Active Write - Burst2
W
2.04
2.43
3.36
5.42
7.08
8.34
8.44
Active Write - Max Burst3
W
3.72
3.52
4.49
6.80
8.02
8.80
9.90
Active Read - RMS Average4
W
1.93
2.14
2.21
2.32
2.39
2.61
2.69
Active Read - Burst5
W
2.06
2.32
2.97
3.63
3.61
3.96
4.14
Active Read – Max Burst6
W
3.58
3.52
3.86
4.09
4.66
5.31
5.34
Idle
W
0.6
0.6
0.6
0.6
0.7
0.7
0.7
Intel® Solid State Drive DC S3510 Series
Table 8: Power Consumption (5V Supply)
Specification Unit
Notes:
1. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. RMS (Root Mean Squared) Average Power is
measured using Agilent Power Analyzer over a 100 ms sample period with PLI capacitor charge enabled.
2. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. RMS (Root Mean Squared) Burst Power is
measured using Agilent Power Analyzer over a 500 µs sample period with PLI capacitor charge disabled.
3. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. RMS (Root Mean Squared) Max Burst power is
measured using Agilent Power Analyzer over a 500 µs sample period with PLI capacitor charge enabled. Pulse is 0.25% of total time.
4. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential reads. RMS (Root Mean Squared) average power is
measured using Agilent Power Analyzer over a 100 ms sample period with PLI capacitor charge enabled.
5. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential reads. RMS (Root Mean Squared) burst power is
measured using Agilent Power Analyzer over a 500 µs sample period with PLI capacitor charge disabled.
6. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential reads. RMS (Root Mean Squared) Max Burst power is
measured using Agilent Power Analyzer over a 500 µs sample period with PLI capacitor charge enabled. Pulse is approximately 0.25% of total time.
February 2016 Product Specification 332211-004US 11
Page 12
Table 9: Power Consumption (5V + 12V Supply)
Intel SSD DC S3510 Series
800GB
120GB
240GB
480GB
800GB
1.2TB
1.6TB
Specification1 Unit
5V 12V 5V 12V 5V 12V 5V 12V 5V 12V 5V 12V 5V 12V
Intel® Solid State Drive DC S3510 Series
Active Write - RMS Average1 W
Active Write - Burst2 W
Active Write - Max Burst3 W
Active Read - RMS Average4 W
Active Read - Burst5 W
Active Read – Max Burst6 W
Idle W
Notes:
1. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. RMS (Root Mean Squared) Average Power is
measured using Agilent Power Analyzer over a 100 ms sample period with PLI capacitor charge enabled.
2. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. RMS (Root Mean Squared) Burst Power is
measured using Agilent Power Analyzer over a 500 µs sample period with PLI capacitor charge disabled.
3. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. RMS (Root Mean Squared) Max Burst power is
measured using Agilent Power Analyzer over a 500 µs sample period with PLI capacitor charge enabled. Pulse is 0.25% of total time.
4. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential reads. RMS (Root Mean Squared) average power is
measured using Agilent Power Analyzer over a 100 ms sample period with PLI capacitor charge enabled.
5. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential reads. RMS (Root Mean Squared) burst power is
measured using Agilent Power Analyzer over a 500 µs sample period with PLI capacitor charge disabled.
6. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential reads. RMS (Root Mean Squared) Max Burst power is
measured using Agilent Power Analyzer over a 500 µs sample period with PLI capacitor charge enabled. Pulse is approximately 0.25% of total time.
1.22 0.78 1.26 1.0 1.40 1.87 1.71 2.95 1.76 3.11 1.99 3.24 2.13 3.63
1.22 0.77 1.25 1.01 1.40 1.85 1.72 3.01 1.85 3.21 1.98 3.30 2.12 3.64
2.98 0.88 2.72 1.14 2.89 2.14 3.47 4.00 3.55 5.99 4.26 7.00 4.60 7.09
1.43 0.56 1.49 0.72 1.55 0.75 1.64 0.77 1.69 0.76 1.88 0.81 1.90 0.88
1.42 0.56 1.50 0.71 1.54 0.76 1.62 0.77 1.73 0.95 1.89 0.82 1.88 0.87
3.13 0.70 2.79 0.91 2.79 1.34 3.23 1.40 3.45 1.68 3.97 1.71 4.40 1.84
0.60 0.01 0.60 0.01 0.60 0.01 0.60 0.01 0.60 0.01 0.70 0.01 0.70 0.01
Product Specification February 2016 12 332211-004US
Page 13
Temperature
Range
Temperature Gradient
2
Non-operating
30o C/hr (Typical)
Non-operating
5 – 95 %
Shock and Vibration
Range
Shock
3
Non-operating
1,000 G (Max) at 0.5 ms
Vibration
4
Non-operating
3.13 G
(5-800 Hz) Max
Conformity Declared
TITLE 47-Telecommunications CHAPTER 1—
Standard Digital Apparatus
FCC Part 15B Class B
22:2008
USA
measurement CISPR24:2010
IEC 55022 Information Technology Equipment —
methods of measurement CISPR24:2008 (Modified)
EN-55022: 2010 and its amendments
European Union EN-60950-1 2nd Edition
Information Technology Equipment — Safety — Part 1: General Requirements
USA/Canada
UL/CSA EN-60950-1 2nd Edition
Intel® Solid State Drive DC S3510 Series

2.4 Environmental Conditions

Table 10: Temperature, Shock, Vibration
Case Temperature Operating Non-operating
1
Operating
Humidity Operating
Operating
Operating
Notes:
3. Contact your Intel representative for details on the non-operating temperature range.
2. Temperature gradient measured without condensation.
3. Shock specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting screws. Stimulus may be applied
in the X, Y or Z axis. Shock specification is measured using Root Mean Squared (RMS) value.
4. Vibration specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting screws. Stimulus may be applied in the X, Y or Z axis. Vibration specification is measured using RMS value.
0 – 70o C
o
-55 – 95
C
30o C/hr (Typical)
5 – 95 %
1,000 G (Max) at 0.5 ms
2.17 G
(5-700 Hz) Max
RMS
RMS

2.5 Product Regulatory Compliance

Intel SSD DC S3510 Series meets or exceeds the regulatory or certification requirements listed in the following table.
Table 11: Product Regulatory Compliance Specifications
Title Description
FEDERAL COMMUNMICATIONS COMMISSION PART 15 — RADIO FREQUENCY DEVICES ICES-003, Issue 5 Interference-Causing Equipment
IEC 55024 Information Technology Equipment — Immunity characteristics— Limits and methods of
Radio disturbance Characteristics— Limits and
CA/CSA-CEI/IEC CISPR 22-10. This is CISPR
EN-55024: 2010 and its amendments European Union
Information Technology Equipment — Safety — Part 1: General Requirements
Region For Which
Canada
USA/Canada
February 2016 Product Specification 332211-004US 13
Page 14
Intel® Solid State Drive DC S3510 Series
Uncorrectable bit error rate will not exceed one
corrupt and is not returned to the host.
ity Demonstration Test (RDT).
Power On/Off Cycles
Power On/Off Cycles is defined as power being re-
hibernate as well as on a system shutdown.
Insertion Cycles
The time period for retaining data in the NAND at maximum rated endurance.
Endurance Rating
while running JESD218 standard1

2.6 Reliability

Intel SSD DC S3510 Series meets or exceeds SSD endurance and data retention requirements as specified in the JESD218 standard. Reliability specifications are listed in the following table.
Table 12: Reliability Specifications
Parameter Value
Uncorrectable Bit Error Rate (UBER)
sector in the specified number of bits read. In the unlikely event of a non-recoverable read error, the SSD will report it as a read failure to the host; the sector in error is considered
Mean Time Between Failures (MTBF)
Mean Time Between Failures is estimated based on Telcordia* methodology and demonstrated through Reliabil-
moved from the SSD, and then restored. Most host systems remove power from the SSD when entering suspend and
SATA/power cable insertion/removal cycles.
Data Retention
< 1 sector per 1017 bits read
2 million hours
24 per day
50 on SATA cable 500 on backplane
3 months power-off retention once SSD reaches rated write endurance at 40 °C
While running JESD218 standard1 and based on JESD219 workload.
Note:
1. Refer to JESD218 standard table 1 for UBER, FFR and other Enterprise SSD endurance verification requirements. Endurance verification
acceptance criterion based on establishing <1E-16 at 60 confidence.
Product Specification February 2016 14 332211-004US
80GB: Up to 45 TBW
120GB: Up to 70 TBW
240GB: Up to 140 TBW
480GB: Up to 275 TBW
800GB: Up to 450 TBW
1.2TB: Up to 660 TBW
1.6TB: Up to 880 TBW
Page 15
Intel® Solid State Drive DC S3510 Series

2.7 Temperature Sensor

The Intel SSD DC S3510 Series has an internal temperature sensor with an accuracy of +/-2° C over a range of -20° C to +80° C which can be monitored using two SMART attributes: Airflow Temperature (BEh) and Device Internal Temperature (C2h). Both attributes report the same temperature value. For more information on supported SMART attributes, see “SMART Attributes” on page 20.

2.8 Power Loss Capacitor Test

The Intel SSD DC S3510 Series supports testing of the power loss capacitor, which can be monitored using the following SMART attribute: (175, AFh).

2.9 Hot Plug Support

Hot Plug insertion and removal is supported in the presence of a proper connector and appropriate operating system (OS), as described in the SATA 3.0 specification.
This product supports asynchronous signal recovery and issues an unsolicited COMINIT when first mated with a powered connector to guarantee reliable detection by a host system without hardware device detection.
User Data is protected from planned or unplanned power loss by the Enhanced Power Management technology on the Intel® SSD DC S3510 Series.
February 2016 Product Specification 332211-004US 15
Page 16
Intel® Solid State Drive DC S3510 Series

3 Mechanical Information

Figure 1 shows the physical package information for the Intel SSD DC S3510 Series in the 2.5 inch form factor. All dimensions are in millimeters.
Figure 1: Intel® SSD DC S3510 Series 2.5-inch Dimensions
Product Specification February 2016 16 332211-004US
Page 17
S1
Ground
1st mate
S2
A+
S3
A-
S4
Ground
1st mate
S5
B-
S6
B+
Intel® Solid State Drive DC S3510 Series

4 Pin and Signal Descriptions

4.1 2.5-inch Form Factor Pin Locations

Figure 2: Layout of 2.5-inch Form Factor Signal and Power Segment Pins
Note: 2.5-inch connector supports built in latching capability.

4.2 Connector Pin Signal Definitions

Table 13: Serial ATA Connector Pin Signal Definitions—2.5-inch Form Factor
Pin Function Definition
Differential signal pair A
Differential signal pair B
S7 Ground 1st mate
Note: Key and spacing separate signal and power segments.
February 2016 Product Specification 332211-004US 17
Page 18
Intel® Solid State Drive DC S3510 Series
P12
Not connected
(3.3V Power)
--
P22
Not connected
(3.3V Power)
--
P32
Not connected
(3.3V Power; pre-charge)
2nd Mate
P4
Ground
Ground
1st Mate
P53
Ground
Ground
1st Mate
P63
Ground
Ground
1st Mate
P7
V5
5V Power
1st Mate
P8
V5
5V Power
2nd Mate
P9
V5
5V Power
2nd Mate
P103
Ground
Ground
1st Mate
P116
DAS
Device Activity Signal
2nd Mate
P12
Ground
Ground
1st Mate
P137
V12
12V Power
1st Mate
P147
V12
12V Power
2nd Mate
P157
V12
12V Power
2nd Mate

4.3 Power Pin Signal Definitions

Table 14: Serial ATA Power Pin Definitions—2.5-inch Form Factors
Pin1 Function Definition Mating Order
3,4
3,5
3,5
3,5
3,4
Notes:
1. All pins are in a single row, with a 1.27 mm (0.050-inch) pitch.
2. Pins P1, P2 and P3 are connected together, although they are not connected internally to the device. The host may put 3.3V on these pins.
3. The mating sequence is:
ground pins P4-P6, P10, P12 and the 5V power pin P7
signal pins and the rest of the 5V power pins P8-P9
4. Ground connectors P4 and P12 may contact before the other 1st mate pins in both the power and signal connectors to discharge ESD in a suitably configured backplane connector.
5. Power pins P7, P8, and P9 are internally connected to one another within the device.
6. The host may ground P11 if it is not used for Device Activity Signal (DAS).
7. Pins P13, P 14 and P15 are internally connected to one another within the device. The host may put 12V on these pins.
Product Specification February 2016 18 332211-004US
Page 19
Intel® Solid State Drive DC S3510 Series

5 Supported Command Sets

The Intel SSD DC S3510 Series supports all mandatory ATA (Advanced Technology Attachment) commands defined in the ATA8-ACS specification described in this section.

5.1 ATA General Feature Command Set

The Intel SSD DC S3510 Series supports the ATA General Feature command set (non- PACKET), which consists of:
EXECUTE DEVICE DIAGNOSTIC
SET FEATURES
IDENTIFY DEVICE
Note: See Appendix A, “IDENTIFY DEVICE Command Data” for details on the sector data returned after issuing an IDENTIFY DEVICE command.
The Intel SSD DC S3510 Series also supports the following optional commands:
READ DMA
WRITE DMA
READ SECTOR(S)
READ VERIFY SECTOR(S)
READ MULTIPLE
SEEK
SET FEATURES
WRITE SECTOR(S)
SET MULTIPLE MODE
WRITE MULTIPLE
FLUSH CACHE
READ BUFFFER
WRITE BUFFER
NOP
DOWNLOAD MICROCODE
WRITE UNCORRECTABLE EXT
1. The only multiple supported will be multiple 1
1

5.2 Power Management Command Set

The Intel SSD DC S3510 Series supports the Power Management command set, which consists of:
CHECK POWER MODE
IDLE
IDLE IMMEDIATE
SLEEP
STANDBY
STANDBY IMMEDIATE

5.3 Security Mode Feature Set

The Intel SSD DC S3510 Series supports the Security Mode command set, which consists of:
SECURITY SET PASSWORD
SECURITY UNLOCK
SECURITY ERASE PREPARE
SECURITY ERASE UNIT
SECURITY FREEZE LOCK
SECURITY DISABLE PASSWORD
February 2016 Product Specification 332211-004US 19
Page 20
Intel® Solid State Drive DC S3510 Series
SP
EC
ER
PE
OC
PW
number of power cycle events over the life of the device.
AAh
Available Reserved Space (See Attribute E8)
1 1 0 0 1 1 10
gram fails.
shows the percent remaining of allowable erase fails.
Unexpected Power Loss
of PLI activity using capacitor power).

5.4 SMART Command Set

The Intel SSD DC S3510 Series supports the SMART command set, which consists of:
SMART READ DATA
SMART READ ATTRIBUTE THRESHOLDS
SMART ENABLE/DISABLE ATTRIBUTE AUTOSAVE
SMART SAVE ATTRIBUTE VALUES
SMART EXECUTE OFF-LINE IMMEDIATE
SMART READ LOG SECTOR
SMART WRITE LOG SECTOR
SMART ENABLE OPERATIONS
SMART DISABLE OPERATIONS
SMART RETURN STATUS
SMART ENABLE/DISABLE AUTOMATIC OFFLINE

5.4.1 Attributes

Table 15 lists the SMART attributes supported by the Intel SSD DC S3510 Series and the corresponding status flags and threshold settings.
Table 15: SMART Attributes
Status Flags
ID Attribute
Threshold
05h
09h
0Ch
ABh
ACh
AEh
Re-allocated Sector Count
The raw value of this attribute shows the number
of retired blocks since leaving the factory (grown defect count).
Power-On Hours Count
The raw value reports power-on time, cumulative over
the life of the SSD, integer number in hour time units.
Power Cycle Count
The raw value of this attribute reports the cumulative
Program Fail Count
The raw value of this attribute shows total count of program fails and the normalized value, beginning at 100, shows the percent remaining of allowable pro-
Erase Fail Count
The raw value of this attribute shows total count of erase fails and the normalized value, beginning at 100,
Also known as “Power-off Retract Count” per magnet­ic-drive terminology. Reports number of unclean shutdowns, cumulative over the life of the SSD. An “unclean shutdown” is the removal of power without STANDBY IMMEDIATE as the last command (regardless
1 1 0 0 1 0 0 (none)
1 1 0 0 1 0 0 (none)
1 1 0 0 1 0 0 (none)
1 1 0 0 1 0 0 (none)
1 1 0 0 1 0 0 (none)
1 1 0 0 1 0 0 (none)
Product Specification February 2016 20 332211-004US
Page 21
SP
EC
ER
PE
OC
PW
Power Loss Protection Failure
1: Last test result as microseconds to discharge
power cycle, saturates at max value.
lected lower signaling rate due to error.
Normalized value: always 100.
Normalized value: always 100.
Case Temperature - Reports the SSD case temperature.
Raw value suggests 100 - case temperature in C degrees.
being the last command.
(PCB) sensor without offset.
be re-allocated on next write.
redundancy check (CRC) errors.
by the host.
Intel® Solid State Drive DC S3510 Series
ID Attribute
Last test result as microseconds to discharge cap, saturates at max value. Also logs minutes since last test and lifetime number of tests.
Bytes 0-
AFh
B7h
B8h
cap, saturates at max value. Test result expected in range 25 <= result <= 5000000, lower indicates specific error code
Bytes 2-3: Minutes since last test, saturates at max value.
Bytes 4-5: Lifetime number of tests, not incremented on
SATA Downshift Count
The count of the number of times SATA interface se-
End-to-End Error Detection Count
Raw value: reports number of LBA tag mismatches in end-to-end data protection path.
Status Flags
Threshold
1 1 0 0 1 1 10
1 1 0 0 1 0 0 (none)
1 1 0 0 1 1 90
BBh
BEh
C0h
C2h
C5h
C7h
E1h
Uncorrectable Error Count
The raw value shows the count of errors that could not be recovered using Error Correction Code (ECC).
Same values as reported in the attribute C2h.
Power-Off Retract Count (Unsafe Shutdown Count)
The raw value of this attribute reports the cumulative
number of unsafe (unclean) shutdown events over the life of the device. An unsafe shutdown occurs whenever the device is powered off without STANDBYIMMEDIATE
Temperature - Device Internal Temperature
Reports internal temperature of the SSD. Temperature reading is the value direct from the printed circuit board
Pending Sector Count
Number of current unrecoverable read errors that will
CRC Error Count
The total number of encountered SATA interface cyclic
Host Writes
The raw value of this attribute reports the total number
of sectors written by the host system. The raw value is increased by 1 for every 65,536 sectors (32MB) written
1 1 0 0 1 0 0 (none)
1 0 0 0 1 0 0 (none)
1 1 0 0 1 0 0 (none)
1 0 0 0 1 0 0 (none)
0 1 0 0 1 0 0 (none)
1 1 0 0 1 0 0 (none)
1 1 0 0 1 0 0 (none)
February 2016 Product Specification 332211-004US 21
Page 22
ID Attribute
SP
EC
ER
PE
OC
PW
maximum rated cycles.
E4h).
starting this workload timer).
10 percent availability.
wear can be put on the device.
by the host.
the host.
Timed Workload Media Wear
E2h
E3h
E4h
E8h
Measures the wear seen by the SSD (since reset of the
workload timer, attribute E4h), as a percentage of the
Timed Workload Host Read/Write Ratio
Shows the percentage of I/O operations that are read
operations (since reset of the workload timer, attribute
Timed Workload Timer
Measures the elapsed time (number of minutes since
Available Reserved Space
This attribute reports the number of reserve blocks
remaining. The normalized value begins at 100 (64h), which corresponds to 100 percent availability of the reserved space. The threshold value for this attribute is
Intel® Solid State Drive DC S3510 Series
Status Flags
Threshold
1 1 0 0 1 0 0 (none)
1 1 0 0 1 0 0 (none)
1 1 0 0 1 0 0 (none)
1 1 0 0 1 1 10
E9h
EAh
F1h
F2h
Media Wearout Indicator
This attribute reports the number of cycles the NAND media has undergone. The normalized value declines linearly from 100 to 1 as the average erase cycle count increases from 0 to the maximum rated cycles.
Once the normalized value reaches 1, the number will not decrease, although it is likely that significant additional
Thermal Throttle Status
Reports Percent Throttle Status and Count of events
Byte 0 = Throttling status. Decimal value 0 = No Throt­tle Applied, 100 = 100% throttling applied. Intermedi­ate percentages are supported. A value larger than 100d is invalid. Bytes 1-4 = Throttling event count. 32 bit counter indi­cates the number of times thermal throttle has activated. Value is preserved over power cycles. Byte 5 = Reserved
Total LBAs Written
The raw value of this attribute reports the total number
of sectors written by the host system. The raw value is increased by 1 for every 65,536 sectors (32MB) written
Total LBAs Read
The raw value of this attribute reports the total number of sectors read by the host system. The raw value is increased by 1 for every 65,536 sectors (32MB) read by
1 1 0 0 1 0 0 (none)
1 1 0 0 1 0 0 (none)
1 1 0 0 1 0 0 (none)
1 1 0 0 1 0 0 (none)
Product Specification February 2016 22 332211-004US
Page 23
SP
EC
ER
PE
OC
PW
returned once per minute.
SP
Self-preserving attribute
Not a self-preserving attribute
Self-preserving attribute
EC
Event count attribute
Not an event count attribute
Event count attribute
ER
Error rate attribute
Not an error rate attribute
Error rate attribute
PE
Performance attribute
Not a performance attribute
Performance attribute
activity
online activity
PW
Pre-fail warranty attribute
Advisory
Pre-fail
Intel® Solid State Drive DC S3510 Series
Status Flags
ID Attribute
Total Bytes Written
The raw value of this attribute reports the total number of sectors
F3h
writes triggered by host writes, defrag, background data refresh and wear level relo cation writes etc.
value is increased by 1 for every 65,536 sectors (32MB) writes to the NAND media. Upon NAND write, new value
written to the NAND media. This includes NAND
The raw
1 1 0 0 1 0 0 (none)
Table 16: SMART Attribute Status Flags
Status Flag Description Value = 0 Value = 1
Threshold
OC Online collection attribute
Collected only during offline

5.4.2 Timed Workload Endurance Indicators

Timed Workload Media Wear Indicator — ID E2h
This attribute tracks the drive wear seen by the device during the last wear timer loop, as a percentage of the maximum rated cycles. The raw value tracks the percentage up to 2 decimal precision points. This value should be divided by 1024 to get the percentage.
For example: if the raw value is 4455, the percentage is 4455/1024 = 4.35%. The raw value is held at FFFFh until the wear timer (attribute E4h) reaches 60 (minutes) after a SMART EXECUTE OFFLINE IMMEDIATE (B0h/D4h) subcommand 40h to the SSD. The normalized value is always set to 100 and should be ignored.
Timed Workload Host Reads Percentage — ID E3h
This attribute shows the percentage of I/O operations that are read operations during the last workload timer loop. The raw value tracks this percentage and is held at FFFFh until the workload timer (attribute E4h) reaches 60 (minutes). The normalized value is always set to 100 and should be ignored.
Workload Timer — ID E4h
This attribute is used to measure the time elapsed during the current workload. The attribute is re­set when a SMART EXECUTE OFFLINE IMMEDIATE (D4h) subcommand 40h is issued to the drive. The raw value tracks the time in minutes and has a maximum value of 2 (8,171 years). The normalized value is always set to 100 and should be ignored.
Collected during both offline and
32
= 4,294,967,296 minutes
February 2016 Product Specification 332211-004US 23
Page 24
Intel® Solid State Drive DC S3510 Series
User Notes
Sending a SMART EXECUTE OFFLINE IMMEDIATE (B0h/D4h) subcommand 40h to the SSD
resets and starts all three attributes (Media Wear Indicator, Attribute E2h, Host Reads Percentage, Attribute E3h, and the Workload timer, Attribute E4h to FFFFh.
The Attribute raw values are held at FFFFh until the Workload timer (Attribute E4h) reaches
a total of 60 (minutes) of power on time. After 60 minutes, the Timed Workload data is made available.
After the Workload timer (E4h) reaches 60 (minutes), the Timed Workload data is saved
every minute so only 59 seconds of data is lost if power is removed without receiving ATA STANDBY IMMEDIATE. Accumulated data is not reset due to power loss.
Upon power up, the attributes hold a snapshot of their last saved values for 59 seconds
and live data is available after 60 seconds, once the initial one hour interval is completed.
Example Use Cases
The Timed Workload Endurance attributes described in this section are intended to be used to measure the amount of media wear that the drive is subjected to during a timed workload.
Ideally, the system that the drive is being used in should be capable of issuing SMART commands. Otherwise, provisions have been provided to allow the media wear attributes to be persistent so the drive can be moved to a SMART capable system to read out the drive wear attribute values.
Use Case 1 – With a System Capable of SMART Commands
1. On a SMART capable system, issue the SMART EXECUTE OFF-LINE IMMEDIATE (D4h)
sub-command 40h to reset the drive wear attributes.
2. Run the workload to be evaluated for at least 60 minutes. Otherwise the drive wear attrib-
utes will not be available.
3. Read out the drive wear attributes with the SMART READ DATA (D0h) command.
Use Case 2 – With a System Not Capable of SMART Commands
1. On a SMART capable system, issue the SMART EXECUTE OFF-LINE IMMEDIATE (D4h)
sub-command 40h to reset the drive wear attributes.
2. Move the drive to the system where the workload will be measured (and not capable of
SMART commands).
3. Run the workload to be evaluated for at least 60 minutes. Otherwise the drive wear
attributes will not be available.
4. Do a clean system power down by issuing the ATA STANDBY IMMEDIATE command
prior to shutting down the system. This will store all the drive wear SMART attributes to persistent memory within the drive.
5. Move the drive to a SMART capable system.
6. Read out the drive wear attributes with the SMART READ DATA (D0h) command within
59 seconds after power-up.
Product Specification February 2016 24 332211-004US
Page 25
Intel® Solid State Drive DC S3510 Series
Example Calculation of Drive Wear
The following is an example of how the drive wear attributes can be used to evaluate the impact of a given workload. The Host Writes SMART attribute (E1h) can also be used to calculate the amount of data written by the host during the workload by reading this attribute before and after running the workload. This example assumes that the steps shown in “Example Use Cases” on page 24 were followed to obtain the following attribute values:
Timed Workload Media Wear (E2h) has a raw value of 16. Therefore, the percentage wear =
16/1024 = 0.016%.
Timed Workload Host Read/Write Ratio (E3h) has a normalized value of 80, indicating that
80% of operations were reads.
Workload Timer (E4h) has a raw value of 500. Therefore the workload ran for 500 minutes.
Host Writes Count (E1h) had a raw value of 100,000 prior to running the workload and a
value of 130,000 at the end of the workload. Therefore, the number of sectors written by the host during the workload was 30,000 * 65,535 = 1,966,050,000 sectors or 1,966,050,000 * 512/1,000,000,000 = 1,007 GB.
The following conclusions can be made for this example case:
The workload took 500 minutes to complete with 80% reads and 20% writes. A total of 1,007 GB of data was written to the device, which increased the media wear in the drive by 0.016%. At this point in time, this workload is causing a wear rate of 0.016% for every 500 minutes, or 0.00192%/hour.

5.4.3 SMART Logs

The Intel SSD DC S3510 Series implements the following Log Addresses: 00h, 02h, 03h, 06h, and 07h.
The DC S3510 Series implements host vendor specific logs (addresses 80h-9Fh) as read and write scratchpads, where the default value is zero (0). Intel SSD DC S3510 does not write any specific values to these logs unless directed by the host through the appropriate commands.
The DC S3510 Series also implements a device vendor specific log at address A9h as a read-only log area with a default value of zero (0). Besides that, the DC S3510 Series also implements log address B8h (if the drive is in disable logical mode, log address B8h will have the word error code for *BAD_CTX). Finally the DC S3510 Series also implements log at addresses B9h and BAh (both of them are Intel error logs, and read only for customers).

5.5 Device Statistics

In addition to the SMART attribute structure, statistics pertaining to the operation and health of the Intel SSD DC S3510 Series can be reported to the host on request through the Device Statistics log as defined in the ATA specification.
The Device Statistics log is a read-only GPL/SMART log located at read log address 0x04 and is accessible using READ LOG EXT, READ LOG DMA EXT or SMART READ LOG commands.
The following table lists the Device Statistics supported by the Intel SSD DC S3510 Series.
February 2016 Product Specification 332211-004US 25
Page 26
Equivalent SMART
attribute (if applicable)
0x00
--
List of Supported Pages
--
0x08
Power Cycle Count
0Ch
0x18
Logical Sectors Written
E1h
one for every host write
0x28
Logical Sectors Read
F2h
for every host read
and Completion
150
Table 17: Serial ATA Power Pin Definitions—2.5-inch Form Factors
Page Offset Description
0x10 Power-On Hours 09h
Intel® Solid State Drive DC S3510 Series
0x01 – General Statistics
0x04 – General Error Statistics
0x05 – Temperature Statistics
0x06 – Transport Statistics
0x07 – Solid State Device Statistics
0x20
0x30
0x08 Num Reported Uncorrectable Errors BBh
0x10
0x00 Device Statistics Information Header --
0x08 Current Temperature --
0x10 Average Short Term Temperature --
0x18 Average Long Term Temperature --
0x20 Highest Temperature --
0x28 Lowest Temperature --
0x30 Highest Average Short Term Temperature --
0x38 Lowest Average Short Term Temperature --
0x40 Highest Average Long Term Temperature --
0x48 Lowest Average Long Term Temperature --
0x50 Time in Over-Temperature --
0x58 Specified Maximum Operating Temperature --
0x60 Time in Under-Temperature --
0x68 Specified Minimum Operating Temperature --
0x08 Number of Hardware Resets --
0x10 Number of ASR Events --
0x18 Number of Interface CRC Errors --
0x08 Percentage Used Endurance Indicator
Num Write Commands – incremented by
Num Read Commands – incremented by one
Num Resets Between Command Acceptance
--
--
--
E9h
Note: This device statistic counts from 1 to
Product Specification February 2016 26 332211-004US
Page 27
Intel® Solid State Drive DC S3510 Series

5.6 SMART Command Transport (SCT)

With SMART Command Transport (SCT), a host can send commands and data to an SSD and receive status and data from an SSD using standard write/read commands to manipulate two SMART Logs:
Log Address E0h ("SCT Command/Status") — used to send commands and retrieve status
Log Address E1h ("SCT Data Transfer") — used to transport data
Intel SSD DC S3510 supports the following standard SCT actions:
Write Same — DC S3510 Series implements this action code as described in the ATA specification.
Error Recovery Control — DC S3510 Series accepts this action code, and will store and return
error-recovery time limit values.
Feature Control - DC S3510 Series supports feature code 0001h (write cache) feature code 0002h
(write cache reordering), and feature code 0003h (time interval for temperature logging). It also supports D000h (Power Safe Write Cache capacitor test interval), D001h (read/write power governor mode), D002h (read thermal governor mode), D003h (read power governor burst power), and D004h (read power governor average power).
Data table command - DC S3510 Series supports data table command as specified in ATA8-ACS2.
This will read out temperature logging information in table ID 0002h.
Read Status Support - DC S3510 supports read status log
By using SCT command 0xD801with State=0, Option=1, ID Word 106 can be changed from 0x6003
to 0x4000 (4KB physical sector size to 512B physical sector size support change).

5.7 Data Set Management Command Set

Intel SSD DC S3510 Series supports the Data Set Management command set Trim attribute, which consists of:
DATA SET MANAGEMENT

5.8 Host Protected Area Command Set

Intel SSD DC S3510 Series supports the Host Protected Area command set, which consists of:
READ NATIVE MAX ADDRESS
SET MAX ADDRESS
READ NATIVE MAX ADDRESS EXT
SET MAX ADDRESS EXT
Intel SSD DC S3510 Series also supports the following optional commands:
SET MAX SET PASSWORD
SET MAX LOCK
SET MAX FREEZE LOCK
SET MAX UNLOCK
February 2016 Product Specification 332211-004US 27
Page 28

5.9 48-Bit Address Command Set

Intel SSD DC S3510 Series supports the 48-bit Address command set, which consists of:
FLUSH CACHE EXT
READ DMA EXT
READ NATIVE MAX ADDRESS EXT
READ SECTOR(S) EXT
READ VERIFY SECTOR(S) EXT
SET MAX ADDRESS EXT
WRITE DMA EXT
WRITE MULTIPLE EXT
WRITE SECTOR(S) EXT
WRITE MULTIPLE FUA EXT
WRITE DMA FUA EXT

5.10 General Purpose Log Command Set

Intel SSD DC S3510 Series supports the General Purpose Log command set, which consists of:
READ LOG EXT
WRITE LOG EXT

5.11 Native Command Queuing

Intel® Solid State Drive DC S3510 Series
Intel SSD DC S3510 Series supports the Native Command Queuing (NCQ) command set, which includes:
READ FPDMA QUEUED
WRITE FPDMA QUEUED
Note: With a maximum Queue Depth set to 32.

5.12 Software Settings Preservation

Intel SSD DC S3510 Series supports the SET FEATURES parameter to enable/disable the preservation of software settings.
Product Specification February 2016 28 332211-004US
Page 29
Certification
Description
THE COUNCIL of 15 December 2004.
Part 1: General Requirements)
Compatibility (EMC) Framework requirements of the Australian Communication Authority (ACA).
is harmonized with CISPR 22: 2005.04.
Radio Research Laboratory (RRL) Ministry of Information and Communication Republic of Korea.
computers or facsimile.
Intel® Solid State Drive DC S3510 Series

6 Certifications and Declarations

The following table describes the Device Certifications supported by the Intel SSD DC S3510 Series.
Table 18: Device Certifications and Declarations
Low Voltage DIRECTIVE 2006/95/EC OF THE EUROPEAN PARLIAMENT AND OF THE COUNCIL of
CE Compliant
UL Recognized
12 December 2006, and EMC Directive 2004/108/EC OF THE EUROPEAN PARLIAMENT AND OF
Underwriters Laboratories, Inc. Bi-National Component Recognition; UL 60950-1, 2nd Edition, 2007-03-27 (Information Technology Equipment - Safety - Part 1: General Requirements)
CSA C22.2 No. 60950-1-07, 2nd Edition, 2007-03 (Information Technology Equipment - Safety -
RCM Mark Compliant
Compliance with the Australia/New Zealand Standard AS/NZS3548 and Electromagnetic
Compliance to the Taiwan EMC standard CNS 13438: Information technology equipment - Radio
BSMI Compliant
disturbance Characteristics - limits and methods of measurement, as amended on June 1, 2006,
Compliance with paragraph 1 of Article 11 of the Electromagnetic Compatibility Control
KCC
VCCI
Regulation and meets the Electromagnetic Compatibility (EMC) Framework requirements of the
Voluntary Control Council for Interface to cope with disturbance problems caused by personal
RoHS Compliant Restriction of Hazardous Substance Directive
WEEE Directive on Waste Electrical and Electronic Equipment
February 2016 Product Specification 332211-004US 29
Page 30
Intel® Solid State Drive DC S3510 Series
Date
Title
Location
Method (JESD219)
ents/results/jesd219
Method (JESD218)
ents/docs/jesd218/
Dec 2008
VCCI
http://www.vcci.jp/vcci_e/
datasheet
August 2009
ACS-2-ATA/ATAPI Command Set 2 Specification
http://www.t13.org/
May 2006
SFF-8223, 2.5-inch Drive w/Serial Attachment Connector
http://www.sffcommittee.org/
voltage variations immunity tests)
(Radiated electromagnetic field from digital radio telephones)
radimmun.htm/

7 References

The following table identifies the standards information referenced in this document.
Table 19: Standards References
July 2012
Sept 2010
June 2009 RoHS
June 2009 Serial ATA Revision 3.0 http://www.sata-io.org/
May 2005 SFF-8201, 2.5-inch drive form factor http://www.sffcommittee.org/
1995
1996
1995
1995
1997
1994
Solid State Drive (SSD) Requirements and Endurance Test
Solid State Drive (SSD) Requirements and Endurance Test
International Electrotechnical Commission EN 61000
4-2 (Electrostatic discharge immunity test)
4-3 (Radiated, radio-frequency, electromagnetic field immunity test)
4-4 (Electrical fast transient/burst immunity test)
4-5 (Surge immunity test)
4-6 (Immunity to conducted disturbances, induced by radio­frequency fields)
4-11 (Voltage Variations, voltage dips, short interruptions and
http://www.jedec.org/standards-docum
http://www.jedec.org/standards-docum
http://qdms.intel.com/
Click Search MDDS Database and search for material description
http://www.iec.ch/
1995
ENV 50204
Product Specification February 2016 30 332211-004US
http://www.dbicorporation.com/
Page 31
F = Fixed
X = Both
0 X
0040h
General configuration bit-significant information
1 X
3FFFh
Obsolete - Number of logical cylinders (16,383)
2 V
C837h
Specific configuration
3 X
0010h
Obsolete - Number of logical heads (16)
4-5 X
0h
Retired 6 X
003Fh
Obsolete - Number of logical sectors per logical track (63)
7-8 V
0h
Reserved for assignment by the CompactFlash* Association (CFA)
9 X
0h
Retired
10-19 F
Serial number (20 ASCII characters)
20-21 X
Retired
22 X
0h
Obsolete
varies
varies
7:0—Maximum number of sectors transferred per interrupt on multiple commands
48 F
4000h
Trusted Computing Feature Set
49 F
2F00h
Capabilities
50 F
4000h
Capabilities
51-52 X
0h
Obsolete
53 F
0007h
Words 88 and 70:64 valid
54 X
3FFFh
Obsolete - Number of logical cylinders (16,383)
55 X
0010h
Obsolete - Number of logical heads (16)
56 X
003Fh
Obsolete - Number of logical sectors per logical track (63)
57-58 X
FC1000FBh
Obsolete
80GB: 0950F8B0h
1600GB: 0FFFFFFFh
62 X 0h
Obsolete
63 X
0007h
Multi-word DMA modes supported/selected
64 F
0003h
PIO modes supported
65 F
0078h
Minimum multiword DMA transfer cycle time per word
66 F
0078h
Manufacturer’s recommended multiword DMA transfer cycle time
67 F
0078h
Minimum PIO transfer cycle time without flow control
68 F
0078h
Minimum PIO transfer cycle time with IORDY flow control
69 F
4030h
Additional Supported
70 F
0000h
Reserved
71-74 F
0h
Reserved for IDENTIFY PACKET DEVICE command
Intel® Solid State Drive DC S3510 Series

Appendix A: IDENTIFY DEVICE Command Data

Table 20: Returned Sector Data
Word
23-26
27-46
47
V = Variable
F
F
F
Default Value Description
varies
0h
Firmware revision (8 ASCII characters)
Model number (Intel® Solid State Drive)
8001h
59
60-61
February 2016 Product Specification 332211-004US 31
F
120GB: 0DF94B80h 200GB: 0FFFFFFFh
V
400GB: 0FFFFFFFh 480GB: 0FFFFFFFh 800GB: 0FFFFFFFh 1200GB: 0FFFFFFFh
BF01
Number of sectors transferred per interrupt on multiple commands
Total number of user-addressable sector for 28-bit commands
Page 32
Intel® Solid State Drive DC S3510 Series
F = Fixed
X = Both
75 F
Queue depth
76 F
Serial ATA capabilities
77 F
Reserved for future Serial ATA definition
78 F
0040h
Serial ATA features supported
0040h
03FCh
81 F
0110h
Minor version number
82 F
746Bh
Command set supported
7501h
84 F
6163h
Command set/feature supported extension
85 X
Command set/feature enabled
86 X
B401h
Command set/feature enabled
87 X
6163h
Command set/feature default
88 X
407Fh
Ultra DMA Modes
0002h
0002h
0h
92 V
0FFFEh
Master Password Revision Code
Hardware reset result: the contents of bits (12:0) of this word shall change only during the execution of a hardware reset
94 V
0h
Vendor’s recommended and actual acoustic management value
95 F
0h
Stream minimum request size
96 V
0h
Streaming transfer time - DMA
97 V
0h
Streaming access latency - DMA and PIO
98-99 F
0h
Streaming performance granularity
1600GB: BA4D4AB0h
104 V
0h
Streaming transfer time - PIO
SET MANAGEMENT command
6003h
Physical sector size / logical sector size – User Changeable by SCT command to report 512B
107 F
0h
Inter-seek delay for ISO-7779 acoustic testing in microseconds
108-111 F
varies
Unique ID
112-115 F
0h
Reserved for worldwide name extension to 128 bits
116 V
0h
Reserved for technical report
117-118 F
0h
Words per logical sector
119 F
405Ch
Supported settings
120 X
401Ch
Command set/feature enabled/supported
121-126 F
0h
Reserved
127 X
Removable Media Status Notification feature set support
128 X
Security status
Word
79
80
83
89
90
91
93
V = Variable
V
F
F
F
F
V
X
Default Value Description
001Fh
850Eh
0006h
Serial ATA features enabled
Major version number
Command sets supported
7469h
Time required for security erase unit completion
Time required for enhanced security erase completion
Current advanced power management value
0h
100-103
105
106
80GB: 0950F8B0h 120GB: 0DF94BB0h 200GB: 1749F1B0h
V
400GB: 2E9390B0h 480GB: 37E436B0h
Maximum user LBA for 48-bit address feature set
800GB: 5D26CEB0h
1200GB: 8BBA0CB0h
V
F
0006h
0h
0021h
Maximum number of 512-byte blocks of LBA Range Entries per DATA
Product Specification February 2016 32 332211-004US
Page 33
F = Fixed
X = Both
129 V
Vendor-specific
130-139 X 0h
Vendor-specific
140-149 X 0h
Disable Logical Error Field
150-159 X 0h
Vendor-specific
160 X
0h
CompactFlash Association (CFA) power mode 1
161-167 X
0h
Reserved for assignment by the CFA
168 X
0003h
Reserved for assignment by the CFA
169 X
0001h
Data set management Trim attribute support
170-175 F
0h
Reserved for assignment by the CFA
176-205 V
Varies
Current media serial number
206 X
003Dh
SCT Command Transport
207-208 F
Reserved
209 X
Alignment of logical blocks within a physical block
210-211 V
Write-Read-Verify Sector Count Mode 3 (DWord)
212-213 F
0000h
Write-Read-Verify Sector Count Mode 2 (DWord)
214 X
0000h
NV Cache Capabilities
0000h
217 F
0001h
Nominal media rotation rate
218 V
0000h
Reserved
219 F
0000h
NV Cache Options
220 V
0000h
Write-Read-Verify feature set
221 X
0000h
Reserved
222 F
101Fh
Transport major version number
223 F
0000h
Transport minor version number
224-229 F
0000h
Reserved
230-233 X
0000h
Extended Number of User Addressable Sectors (QWord)
MICROCODE command for mode 03h
MICROCODE command for mode 03h
0000h
Varies
Intel® Solid State Drive DC S3510 Series
Word
215-216
V = Variable
V
Default Value Description
001Ch
0000h
4000h
0000h
NV Cache Size in Logical Blocks (DWord)
234
F
235
F
236-254
255
Notes:
F = Fixed. The content of the word is fixed and does not change. For removable media devices, these values may change when media is removed or
changed.
V = Variable. The state of at least one bit in a word is variable and may change depending on the state of the device or the commands executed by the
device.
X = F or V. The content of the word may be fixed or variable.
X
V
0001h
FFFFh
Minimum number of 512-byte data blocks per DOWNLOAD
Maximum number of 512-byte data blocks per DOWNLOAD
Reserved
Integrity word
February 2016 Product Specification 332211-004US 33
Loading...