Intel® Solid-State Drive DC S3700 Series
Product Specification
Capacity: 2.5-inch : 100GB, 200GB, 400GB, 800GB 1.8-inch : 200GB, 400GB
Components:
−Intel® 25nm NAND Flash Memory
−High Endurance Technology (HET) Multi-Level Cell (MLC)
Form Factor: 2.5- and 1.8-inch
Read and Write IOPS1,2 (Full LBA Range, Iometer* Queue Depth 32)
−Random 4KB3 Reads: Up to 75,000 IOPS
−Random 4KB Writes: Up to 36,000 IOPS
−Random 8KB3 Reads: Up to 47,500 IOPS
−Random 8KB Writes: Up to 20,000 IOPS
Bandwidth Performance1
−Sustained Sequential Read: Up to 500 MB/s4
−Sustained Sequential Write: Up to 460 MB/s
Endurance: 10 drive writes per day5 for 5 years
Latency (average sequential)
−Read: 50 µs (TYP)
−Write: 65 µs (TYP)
Quality of Service6,8
−Read/Write: 500 µs (99.9%)
Performance Consistency7,8
Read/Write: Up to 90%/90% (99.9%)
AES 256-bit Encryption
Altitude (simulated)
–Operating: -1,000 to 10,000ft
–Non-operating: -1,000 to 40,000ft
Product Ecological Compliance
−RoHS*
Compliance
−SATA Revision 3.0; compatible with SATA 6Gb/s, 3Gb/s and 1.5Gb/s interface rates
−ATA9-ACS2; includes SCT (Smart Command Transport) and device statistics log support
−Enhanced SMART ATA feature set
−Native Command Queuing (NCQ) command set
−Data set management Trim command
Power Management
−2.5” 5V or 12V SATA Supply Rail9
−1.8” 3.3V SATA Supply Rail
−SATA Interface Power Management
−OS-aware hot plug/removal
−Enhanced power-loss data protection
Power10
−Active: Up to 6 W (TYP)
−Idle: 650 mW
Weight:
−2.5” 200, 400, 800GB: 73.6 grams ± 2 grams
−2.5” 100GB: 70 grams ± 2 grams
−1.8” 200, 400GB: 38 grams ± 2 grams
Temperature
−Operating: 0o C to 70o C
−Non-Operating11: -55o C to 95o C
−Temperature monitoring and logging
−Thermal throttling
Shock (operating and non-operating):
−1,000 G/0.5 msec
Vibration
−Operating: 2.17 GRMS (5-700 Hz)
−Non-operating: 3.13 GRMS (5-800 Hz)
Reliability
−Uncorrectable Bit Error Rate (UBER):
1sector per 1017 bits read
−Mean Time Between Failures (MTBF):
2 million hours
−End-to-End data-path protection
Certifications and Declarations
−UL*, CE*, C-Tick*, BSMI*, KCC*, Microsoft* WHCK*, VCCI*, SATA-IO*
Compatibility
−Windows* 7 and Windows* 8
−Windows* Server 2012
−Windows* Server 2008 Enterprise 32/64bit SP2
−Windows* Server 2008 R2 SP1
−Windows* Server 2003 Enterprise R2 64bit SP2
−Red Hat* Enterprise Linux* 5.5, 5.6, 6.1, 6.3
−SUSE* Linux Enterprise Server 10, 11 SP1
−CentOS* 64bit 5.7, 6.3
−Intel® SSD Toolbox with Intel® SSD Optimizer
1.Performance values vary by capacityandformfactor
2.Performance specifications apply to both compressible and incompressible data
3.4KB = 4,096 bytes; 8KB = 8,192 bytes.
4.MB/s = 1,000,000 bytes/second
5.Based on JESD218 standard. For 200GB 1.8 inches drive, it is 9.8 drives write per day.
6.Based on Random 4KB QD=1 workload, measured as the time taken for 99.9 percentile of commands to finish the round-trip from host to drive and back to host
7.Based on Random 4KB QD=32 workload, measured as the (IOPS in the 99.9th percentile slowest 1-second interval)/(average IOPS during the test)
8.Measurement taken once the workload has reached steady state but including all background activities required for normal operation and data reliability
9.Defaults to 12V, if both 12V and 5V are present
10.Based on 5V supply; refer to Table 7 for more details
11.Please contact your Intel representative for details on the non-operating temperature range
Order Number: 328171-007US
Ordering Information
Contact your local Intel sales representative for ordering information.
INFORMATION IN THIS DOCUMENT IS PROVIDED IN CONNECTION WITH INTEL PRODUCTS. NO LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE, TO ANY INTELLECTUAL PROPERTY RIGHTS IS GRANTED BY THIS DOCUMENT. EXCEPT AS PROVIDED IN INTEL'S TERMS AND CONDITIONS OF SALE FOR SUCH PRODUCTS, INTEL ASSUMES NO LIABILITY WHATSOEVER AND INTEL DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY, RELATING TO SALE AND/OR USE OF INTEL PRODUCTS INCLUDING LIABILITY OR WARRANTIES RELATING TO FITNESS FOR A PARTICULAR PURPOSE, MERCHANTABILITY, OR INFRINGEMENT OF ANY PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY RIGHT.
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Intel may make changes to specifications and product descriptions at any time, without notice. Designers must not rely on the absence or characteristics of any features or instructions marked "reserved" or "undefined." Intel reserves these for future definition and shall have no responsibility whatsoever for conflicts or incompatibilities arising from future changes to them. The information here is subject to change without notice. Do not finalize a design with this information.
The products described in this document may contain design defects or errors known as errata which may cause the product to deviate from published specifications. Current characterized errata are available on request.
Contact your local Intel sales office or your distributor to obtain the latest specifications and before placing your product order.
Copies of documents which have an order number and are referenced in this document, or other Intel literature, may be obtained by calling 1-800-548-4725, or go to: http://www.intel.com/design/literature.htm
Low Halogen applies only to brominated and chlorinated flame retardants (BFRs/CFRs) and PVC in the final product. Intel components as well as purchased components on the finished assembly meet JS-709 requirements, and the PCB/substrate meet IEC 61249-2-21 requirements. The replacement of halogenated flame retardants and/or PVC may not be better for the environment.
Intel and the Intel logo are trademarks of Intel Corporation in the U.S. and other countries. *Other names and brands may be claimed as the property of others.
Copyright © 2014 Intel Corporation. All rights reserved.
Advance Product Specification |
March 2014 |
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328171-007 |
Intel® Solid-State Drive DC S3700 Series
Contents
Revision History ............................................................................................................................. |
4 |
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Terms and Acronyms...................................................................................................................... |
5 |
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1.0 |
Overview ............................................................................................................................ |
6 |
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2.0 |
Product Specifications ......................................................................................................... |
7 |
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2.1 |
Capacity............................................................................................................................... |
7 |
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2.2 |
Performance........................................................................................................................ |
7 |
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2.3 |
Electrical Characteristics ..................................................................................................... |
9 |
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2.4 |
Environmental Conditions................................................................................................. |
11 |
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2.5 |
Product Regulatory Compliance........................................................................................ |
12 |
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2.6 |
Reliability........................................................................................................................... |
12 |
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2.7 |
Temperature Sensor.......................................................................................................... |
13 |
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2.8 |
Power Loss Capacitor Test ................................................................................................ |
13 |
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2.9 |
Hot Plug Support ............................................................................................................... |
13 |
3.0 |
Mechanical Information ..................................................................................................... |
14 |
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4.0 |
Pin and Signal Descriptions................................................................................................. |
16 |
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4.1 |
2.5” Form Factor Pin Locations ......................................................................................... |
16 |
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4.2 |
1.8” Form Factor Pin Locations ......................................................................................... |
16 |
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4.3 |
Connector Pin Signal Definitions....................................................................................... |
17 |
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4.4 |
Power Pin Signal Definitions ............................................................................................. |
17 |
5.0 |
Supported Command Sets .................................................................................................. |
19 |
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5.1 |
ATA General Feature Command Set ................................................................................. |
19 |
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5.2 |
Power Management Command Set .................................................................................. |
19 |
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5.3 |
Security Mode Feature Set................................................................................................ |
19 |
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5.4 |
SMART Command Set ....................................................................................................... |
20 |
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5.5 |
Device Statistics................................................................................................................. |
25 |
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5.6 |
SMART Command Transport (SCT).................................................................................... |
27 |
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5.7 |
Data Set Management Command Set............................................................................... |
27 |
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5.8 |
Host Protected Area Command Set .................................................................................. |
27 |
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5.9 |
48-Bit Address Command Set............................................................................................ |
27 |
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5.10 |
General Purpose Log Command Set.................................................................................. |
28 |
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5.11 |
Native Command Queuing................................................................................................ |
28 |
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5.12 |
Software Settings Preservation......................................................................................... |
28 |
6.0 |
Certifications and Declarations ........................................................................................... |
28 |
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7.0 |
References ......................................................................................................................... |
29 |
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Appendix A: IDENTIFY DEVICE Command Data ............................................................................... |
30 |
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March 2014 |
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Product Specification |
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328171-007 |
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3 |
Intel® Solid-State Drive DC S3700 Series
Date |
Revision |
Description |
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October 2012 |
001 |
Initial release |
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November 2012 |
002 |
Updated Power On to Ready specification for 800 GB capacity |
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February 2013 |
003 |
Updated: OS Compatibility; Certifications and Declarations; Power Pin Signal Definitions; |
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SMART Attributes descriptions |
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March 2013 |
004 |
Edited for clarity |
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April 2013 |
005 |
Updated Device Identify Table; SMART Attribute Definition. Endurance spec for 1.8-inch 200 |
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GB drive, voltage spec |
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June 2013 |
006 |
Added X,Y, Z dimension in section 3.0 |
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Page 1: Compliance, Changed from ATA8-ACS2 to ATA9-ACS2 |
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Table 14: Changed Endurance Rating Value |
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March 2014 |
007 |
Table 18: Changed SMART Attribute E9h, PW and Threshold values to 1. |
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Section 5.4.1.1: Added User Notes and changed step 6 in Use Case 2. |
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Appendix A: Changes to Words 59-62, 80, 81, 89, 90, 129-159, 176-205 and 255. |
Product Specification |
March 2014 |
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328171-007 |
Intel® Solid-State Drive DC S3700 Series
Table 1 defines the terms and acronyms used in this document.
Table 1. |
Glossary of Terms and Acronyms |
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Term |
|
Definition |
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ATA |
|
Advanced Technology Attachment |
CRC |
|
Cyclic Redundancy Check |
DAS |
|
Device Activity Signal |
DMA |
|
Direct Memory Access |
ECC |
|
Error Correction Code |
EXT |
|
Extended |
FPDMA |
|
First Party Direct Memory Access |
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Gigabyte |
GB |
|
Note: The total usable capacity of the SSD may be less than the total physical capacity because a small |
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|
portion of the capacity is used for NAND flash management and maintenance purposes. |
Gb |
|
Gigabit |
HDD |
|
Hard Disk Drive |
HET |
|
High Endurance Technology |
KB |
|
Kilobyte |
I/O |
|
Input/Output |
IOPS |
|
Input/Output Operations Per Second |
ISO |
|
International Standards Organization |
LBA |
|
Logical Block Address |
MB |
|
Megabyte (1,000,000 bytes) |
MLC |
|
Multi-level Cell |
MTBF |
|
Mean Time Between Failures |
NCQ |
|
Native Command Queuing |
NOP |
|
No Operation |
PB |
|
Petabyte |
PCB |
|
Printed Circuit Board |
PIO |
|
Programmed Input/Output |
RDT |
|
Reliability Demonstration Test |
RMS |
|
Root Mean Square |
SATA |
|
Serial Advanced Technology Attachment |
SCT |
|
SMART Command Transport |
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Self-Monitoring, Analysis and Reporting Technology |
SMART |
|
An open standard for developing hard drives and software systems that automatically monitors the |
|
|
health of a drive and reports potential problems. |
SSD |
|
Solid-State Drive |
TB |
|
Terabyte |
TYP |
|
Typical |
UBER |
|
Uncorrectable Bit Error Rate |
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March 2014 |
Product Specification |
328171-007 |
5 |
Intel® Solid-State Drive DC S3700 Series
This document describes the specifications and capabilities of the Intel® SSD DC S3700 Series.
The Intel SSD DC S3700 Series delivers leading performance and Quality of Service combined with world-class reliability and endurance for Serial Advanced Technology Attachment (SATA)-based computers in four capacities: 100 GB, 200 GB, 400 GB and 800 GB.
By combining 25nm Intel® NAND Flash Memory technology with SATA 6Gb/s interface support, the Intel SSD DC S3700 Series delivers sequential read speeds of up to 500 MB/s and sequential write speeds of up to 460 MB/s. Intel SSD DC S3700 Series delivers Quality of Service of 500 us for random 4KB reads and writes measured at a queue depth of 1.
The Intel SSD DC S3700 Series also includes High Endurance Technology (HET), which combines NAND silicon enhancements and SSD NAND management techniques to extend the write endurance of an SSD, leading to lifetime endurance levels of 10 drive writes per day for 5 years.
The industry-standard 2.5-inch form factor enables interchangeability with existing hard disk drives (HDDs) and native SATA HDD drop-in replacement with the enhanced performance, reliability, ruggedness, and power savings offered by an SSD.
Intel SSD DC S3700 Series offers these key features:
•High Endurance Technology (HET)
•High I/O and throughput performance
•Consistent I/O latency
•Enhanced power-loss data protection
•End-to-End data-path protection
•Thermal throttling
•Temperature Sensor
•Inrush current management
•Low power
•High reliability
•Enhanced ruggedness
•Temperature monitor and logging
•Power loss protection capacitor self-test
Product Specification |
March 2014 |
6 |
328171-007 |
Intel® Solid-State Drive DC S3700 Series
Table 2. |
User Addressable Sectors |
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Intel® SSD DC S3700 Series |
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Unformatted Capacity |
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(Total User Addressable Sectors in LBA Mode) |
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100GB |
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195,371,568 |
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200GB |
|
390,721,968 |
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400GB |
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781,422,768 |
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800GB |
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1,562,824,368 |
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Notes: 1GB = 1,000,000,000 bytes; 1 sector = 512 bytes.
LBA count shown represents total user storage capacity and will remain the same throughout the life of the drive.
The total usable capacity of the SSD may be less than the total physical capacity because a small portion of the capacity is used for NAND flash management and maintenance purposes.
Table 3. |
Random Read/Write Input/Output Operations Per Second (IOPS) |
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Specification1 |
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Unit |
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Intel SSD DC S3700 Series |
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100 GB |
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200 GB |
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400 GB |
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800 GB |
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(2.5”/1.8”) |
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(2.5”/1.8”) |
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Random 4KB Read (up to)2 |
IOPS |
75,000 |
75,000 / 75,000 |
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75,000 / 75,000 |
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75,000 |
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Random 4KB Write (up to) |
IOPS |
19,000 |
32,000 / 29,000 |
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36,000 / 36,000 |
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36,000 |
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Random 8KB Read (up to)3 |
IOPS |
47,500 |
47,500 / 47,500 |
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47,500 / 47,500 |
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47,500 |
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Random 8KB Write (up to) |
IOPS |
9,500 |
16,500 / 14,500 |
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19,500 / 19,500 |
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20,000 |
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Table 4. |
Random Read/Write IOPS Consistency |
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Specification4 |
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Unit |
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Intel SSD DC S3700 Series |
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100 GB |
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200 GB |
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400 GB |
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800 GB |
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(2.5”/1.8”) |
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(2.5”/1.8”) |
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Random 4KB Read (up to)2 |
% |
90 |
90 |
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90 |
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90 |
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Random 4KB Write (up to) |
% |
85 |
90 |
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90 |
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90 |
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Random 8KB Read (up to)3 |
% |
90 |
90 |
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90 |
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90 |
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Random 8KB Write (up to) |
% |
85 |
90 |
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90 |
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90 |
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Notes: 1. Performance measured using Iometer* with Queue Depth 32. Measurements are performed on a full Logical Block
Address (LBA) span of the drive.
2.4KB = 4,096 bytes
3.8KB = 8,192 bytes
4.Performance consistency measured using Iometer* based on Random 4KB QD=32 workload, measured as the (IOPS in the 99.9th percentile slowest 1-second interval)/(average IOPS during the test). Measurements are performed on a full Logical Block Address (LBA) span of the drive once the workload has reached steady state but including all background activities required for normal operation and data reliability
March 2014 |
Product Specification |
328171-007 |
7 |
Intel® Solid-State Drive DC S3700 Series
Table 5. |
Sequential Read and Write Bandwidth |
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Intel® SSD DC S3700 Series |
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Specification |
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Unit |
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100GB |
200GB |
400GB |
800GB |
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Sequential Read (SATA 6Gb/s)1 |
MB/s |
500 |
500 |
500 |
500 |
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Sequential Write (SATA 6Gb/s)1 |
MB/s |
200 |
365 |
460 |
460 |
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Notes: 1. Performance measured |
using Iometer* with 128KB (131,072 bytes) of transfer size with Queue Depth 32. |
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Table 6. |
Latency |
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Specification |
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Intel SSD DC S3700 Series |
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100, 200 and 400GB |
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800 GB |
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Latency1 (TYP) |
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Read |
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50 µs |
50 µs |
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Write |
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65 µs |
65 µs |
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Power On to Ready2 |
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2.0 s |
3.0 s |
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Table 7. |
Quality of Service |
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Intel SSD DC S3700 Series |
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Specification |
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Unit |
Queue Depth=1 |
Queue Depth=32 |
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100GB |
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200/400/800 |
100GB |
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200/400/800 |
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GB |
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GB |
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Quality of Service3,4 (99.9%) |
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Reads |
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ms |
0.5 |
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0.5 |
1 |
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1 |
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Writes |
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ms |
0.5 |
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0.5 |
15 |
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10 |
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Quality of Service3,4 (99.9999%) |
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Reads |
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ms |
10 |
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5 |
10 |
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5 |
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Writes |
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ms |
10 |
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5 |
20 |
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20 |
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Notes:
1.Device measured using Iometer. Latency measured using 4 KB (4,096 bytes) transfer size with Queue Depth equal to 1 on a sequential workload.
2.Power On To Ready time assumes proper shutdown. Time varies if shutdown is not preceded by STANDBY IMMEDIATE command.
3.Device measured using Iometer. Quality of Service measured using 4 KB (4,096 bytes) transfer size on a random workload on a full Logical Block Address (LBA) span of the drive once the workload has reached steady state but including all background activities required for normal operation and data reliability.
4.Based on Random 4KB QD=1, 32 workloads, measured as the time taken for 99.9(or 99.9999) percentile of commands to finish the round-trip from host to drive and back to host.
Product Specification |
March 2014 |
8 |
328171-007 |
Intel® Solid-State Drive DC S3700 Series
2.3Electrical Characteristics
Table 8. |
Operating Voltage for 2.5-inch Form Factor |
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Intel® SSDDC S3700 Series |
|
Electrical Characteristics |
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100, 200, 400 and 800GB |
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5 V Operating Characteristics: |
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Operating Voltage range |
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5 V (±5%) |
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Rise time (Max/Min) |
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1 s / 1 ms |
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Fall time (Min)2 |
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1 ms |
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Noise level |
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500 mV pp 10 Hz – 100 KHz |
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50 mV pp 100 KHz – 20 MHz |
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Min Off time3 |
|
|
500 ms |
|
Inrush Current (Typical Peak) 1 |
|
1.0 A, < 1 s |
|
|
12 V Operating Characteristics: |
|
|
|
|
Operating Voltage range |
|
12 V (±10%) |
|
|
Rise time (Max/Min) |
|
|
1 s / 1 ms |
|
Fall time (Min)2 |
|
|
1 ms |
|
Noise level |
|
|
1000 mV pp 10 Hz – 100 KHz |
|
|
|
|
100 mV pp 100 KHz – 20 MHz |
|
Min Off time3 |
|
|
500 ms |
|
Inrush Current (Typical Peak) 1 |
|
1.0 A, < 1 s |
|
Notes:
1.Measured from initial device power supply application
2.Fall time needs to be equal or better than minimum in order to guarantee full functionality of enhanced power loss management
3.The drive needs to be powered off for at least 500msec before powering on
Table 9. Power Consumption for 2.5-inch Form Factor (5V Supply)
|
|
|
|
|
|
|
|
|
|
|
|
Intel SSD DC S3700 Series |
|
|
|
Specification |
Unit |
|
|
|
|
|
|
|
|
|
|
|
|
||
|
|
|
100GB |
200GB |
400GB |
800GB |
|
|
|
|
|
|
|
|
|
Active Write - RMS Average 1 |
W |
2.8 |
4.2 |
5.2 |
5.8 |
|
|
Active Write - RMS Burst 2 |
W |
3.1 |
4.6 |
7.7 |
8.2 |
|
|
Idle |
W |
0.6 |
0.6 |
0.6 |
0.6 |
|
|
|
|
|
|
|
|
|
|
Table 10. Power Consumption for 2.5-inch Form Factor (12V Supply)
|
|
|
|
|
|
|
|
|
|
|
|
Intel SSD DC S3700 Series |
|
|
|
Specification1 |
Unit |
|
|
|
|
|
|
|
|
|
|
|
|
||
|
100GB |
200GB |
400GB |
800GB |
|
||
|
|
|
|
||||
|
|
|
|
|
|
|
|
Active Write - RMS Average |
W |
2.9 |
4.4 |
5.4 |
6.0 |
|
|
|
|
|
|
|
|
|
|
Active Write - RMS Burst |
W |
3.3 |
4.8 |
7.6 |
8.2 |
|
|
|
|
|
|
|
|
|
|
Idle |
W |
0.8 |
0.8 |
0.8 |
0.8 |
|
|
|
|
|
|
|
|
|
|
Notes:
1.The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. Root Mean Squared (RMS) average power is measured using scope trigger over a 100 ms sample period
2.The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. Root Mean Squared (RMS) burst power is measured using scope trigger over a 500 us sample period
March 2014 |
Product Specification |
328171-007 |
9 |
Intel® Solid-State Drive DC S3700 Series
Table 11. |
Operating Voltage and Power Consumption for 1.8-inch Form Factor |
||
|
|
|
|
Electrical Characteristics |
Intel® SSD DC S3700 Series |
||
|
|||
200 and 400GB |
|||
|
|
||
|
|
|
|
Operating Voltage for 3.3 V (±5%) |
|
||
Min |
|
3.13 V |
|
Max |
|
3.47 V |
|
Rise time (Max/Min) |
|
1 s / 1 ms |
|
Fall time (Min)2 |
|
1 ms |
|
Noise level |
|
300 mV pp 10 Hz – 100 KHz |
|
|
|
500 mV pp 100 KHz – 20 MHz |
|
Min Off time3 |
|
500 ms |
|
Inrush Current (Typical Peak) 1 |
1.2 A, < 1 s |
Notes:
1.Measured from initial device power supply application
2.Fall time needs to be equal or better than minimum in order to guarantee full functionality of enhanced power loss management
3.The drive needs to be powered off for at least 500msec before powering on
Table 12. |
Power Consumption for 1.8-inch Form Factor |
|
||
Specification1 |
|
Unit |
Intel SSD DC S3700 Series |
|
|
200GB |
400GB |
||
|
|
|
||
Active Write - RMS Average @ 3.3V |
W |
4.3 |
5.3 |
Active Write - RMS Burst @ 3.3V |
W |
4.7 |
7.9 |
|
|
|
|
Idle @ 3.3V |
W |
0.6 |
0.6 |
Notes:
1.The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. Root Mean Squared (RMS) power is measured using scope trigger over a 100 ms sample period.
Product Specification |
March 2014 |
10 |
328171-007 |