Intel SSDSC2BA800G301, SSDSC2BA100G301, SSDSC2BA200G301, SSDSC2BA400G301 User manual

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Intel® Solid-State Drive DC S3700 Series

Product Specification

Capacity: 2.5-inch : 100GB, 200GB, 400GB, 800GB 1.8-inch : 200GB, 400GB

Components:

Intel® 25nm NAND Flash Memory

High Endurance Technology (HET) Multi-Level Cell (MLC)

Form Factor: 2.5- and 1.8-inch

Read and Write IOPS1,2 (Full LBA Range, Iometer* Queue Depth 32)

Random 4KB3 Reads: Up to 75,000 IOPS

Random 4KB Writes: Up to 36,000 IOPS

Random 8KB3 Reads: Up to 47,500 IOPS

Random 8KB Writes: Up to 20,000 IOPS

Bandwidth Performance1

Sustained Sequential Read: Up to 500 MB/s4

Sustained Sequential Write: Up to 460 MB/s

Endurance: 10 drive writes per day5 for 5 years

Latency (average sequential)

Read: 50 µs (TYP)

Write: 65 µs (TYP)

Quality of Service6,8

Read/Write: 500 µs (99.9%)

Performance Consistency7,8

Read/Write: Up to 90%/90% (99.9%)

AES 256-bit Encryption

Altitude (simulated)

Operating: -1,000 to 10,000ft

Non-operating: -1,000 to 40,000ft

Product Ecological Compliance

RoHS*

Compliance

SATA Revision 3.0; compatible with SATA 6Gb/s, 3Gb/s and 1.5Gb/s interface rates

ATA9-ACS2; includes SCT (Smart Command Transport) and device statistics log support

Enhanced SMART ATA feature set

Native Command Queuing (NCQ) command set

Data set management Trim command

Power Management

2.5” 5V or 12V SATA Supply Rail9

1.8” 3.3V SATA Supply Rail

SATA Interface Power Management

OS-aware hot plug/removal

Enhanced power-loss data protection

Power10

Active: Up to 6 W (TYP)

Idle: 650 mW

Weight:

2.5” 200, 400, 800GB: 73.6 grams ± 2 grams

2.5” 100GB: 70 grams ± 2 grams

1.8” 200, 400GB: 38 grams ± 2 grams

Temperature

Operating: 0o C to 70o C

Non-Operating11: -55o C to 95o C

Temperature monitoring and logging

Thermal throttling

Shock (operating and non-operating):

1,000 G/0.5 msec

Vibration

Operating: 2.17 GRMS (5-700 Hz)

Non-operating: 3.13 GRMS (5-800 Hz)

Reliability

Uncorrectable Bit Error Rate (UBER):

1sector per 1017 bits read

Mean Time Between Failures (MTBF):

2 million hours

End-to-End data-path protection

Certifications and Declarations

UL*, CE*, C-Tick*, BSMI*, KCC*, Microsoft* WHCK*, VCCI*, SATA-IO*

Compatibility

Windows* 7 and Windows* 8

Windows* Server 2012

Windows* Server 2008 Enterprise 32/64bit SP2

Windows* Server 2008 R2 SP1

Windows* Server 2003 Enterprise R2 64bit SP2

Red Hat* Enterprise Linux* 5.5, 5.6, 6.1, 6.3

SUSE* Linux Enterprise Server 10, 11 SP1

CentOS* 64bit 5.7, 6.3

Intel® SSD Toolbox with Intel® SSD Optimizer

1.Performance values vary by capacityandformfactor

2.Performance specifications apply to both compressible and incompressible data

3.4KB = 4,096 bytes; 8KB = 8,192 bytes.

4.MB/s = 1,000,000 bytes/second

5.Based on JESD218 standard. For 200GB 1.8 inches drive, it is 9.8 drives write per day.

6.Based on Random 4KB QD=1 workload, measured as the time taken for 99.9 percentile of commands to finish the round-trip from host to drive and back to host

7.Based on Random 4KB QD=32 workload, measured as the (IOPS in the 99.9th percentile slowest 1-second interval)/(average IOPS during the test)

8.Measurement taken once the workload has reached steady state but including all background activities required for normal operation and data reliability

9.Defaults to 12V, if both 12V and 5V are present

10.Based on 5V supply; refer to Table 7 for more details

11.Please contact your Intel representative for details on the non-operating temperature range

Order Number: 328171-007US

Ordering Information

Contact your local Intel sales representative for ordering information.

INFORMATION IN THIS DOCUMENT IS PROVIDED IN CONNECTION WITH INTEL PRODUCTS. NO LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE, TO ANY INTELLECTUAL PROPERTY RIGHTS IS GRANTED BY THIS DOCUMENT. EXCEPT AS PROVIDED IN INTEL'S TERMS AND CONDITIONS OF SALE FOR SUCH PRODUCTS, INTEL ASSUMES NO LIABILITY WHATSOEVER AND INTEL DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY, RELATING TO SALE AND/OR USE OF INTEL PRODUCTS INCLUDING LIABILITY OR WARRANTIES RELATING TO FITNESS FOR A PARTICULAR PURPOSE, MERCHANTABILITY, OR INFRINGEMENT OF ANY PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY RIGHT.

A "Mission Critical Application" is any application in which failure of the Intel Product could result, directly or indirectly, in personal injury or death. SHOULD YOU PURCHASE OR USE INTEL'S PRODUCTS FOR ANY SUCH MISSION CRITICAL APPLICATION, YOU SHALL INDEMNIFY AND HOLD INTEL AND ITS SUBSIDIARIES, SUBCONTRACTORS AND AFFILIATES, AND THE DIRECTORS, OFFICERS, AND EMPLOYEES OF EACH, HARMLESS AGAINST ALL CLAIMS COSTS, DAMAGES, AND EXPENSES AND REASONABLE ATTORNEYS' FEES ARISING OUT OF, DIRECTLY OR INDIRECTLY, ANY CLAIM OF PRODUCT LIABILITY, PERSONAL INJURY, OR DEATH ARISING IN ANY WAY OUT OF SUCH MISSION CRITICAL APPLICATION, WHETHER OR NOT INTEL OR ITS SUBCONTRACTOR WAS NEGLIGENT IN THE DESIGN, MANUFACTURE, OR WARNING OF THE INTEL PRODUCT OR ANY OF ITS PARTS.

Intel may make changes to specifications and product descriptions at any time, without notice. Designers must not rely on the absence or characteristics of any features or instructions marked "reserved" or "undefined." Intel reserves these for future definition and shall have no responsibility whatsoever for conflicts or incompatibilities arising from future changes to them. The information here is subject to change without notice. Do not finalize a design with this information.

The products described in this document may contain design defects or errors known as errata which may cause the product to deviate from published specifications. Current characterized errata are available on request.

Contact your local Intel sales office or your distributor to obtain the latest specifications and before placing your product order.

Copies of documents which have an order number and are referenced in this document, or other Intel literature, may be obtained by calling 1-800-548-4725, or go to: http://www.intel.com/design/literature.htm

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Intel and the Intel logo are trademarks of Intel Corporation in the U.S. and other countries. *Other names and brands may be claimed as the property of others.

Copyright © 2014 Intel Corporation. All rights reserved.

Advance Product Specification

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Contents

Revision History .............................................................................................................................

4

Terms and Acronyms......................................................................................................................

5

1.0

Overview ............................................................................................................................

6

2.0

Product Specifications .........................................................................................................

7

 

2.1

Capacity...............................................................................................................................

7

 

2.2

Performance........................................................................................................................

7

 

2.3

Electrical Characteristics .....................................................................................................

9

 

2.4

Environmental Conditions.................................................................................................

11

 

2.5

Product Regulatory Compliance........................................................................................

12

 

2.6

Reliability...........................................................................................................................

12

 

2.7

Temperature Sensor..........................................................................................................

13

 

2.8

Power Loss Capacitor Test ................................................................................................

13

 

2.9

Hot Plug Support ...............................................................................................................

13

3.0

Mechanical Information .....................................................................................................

14

4.0

Pin and Signal Descriptions.................................................................................................

16

 

4.1

2.5” Form Factor Pin Locations .........................................................................................

16

 

4.2

1.8” Form Factor Pin Locations .........................................................................................

16

 

4.3

Connector Pin Signal Definitions.......................................................................................

17

 

4.4

Power Pin Signal Definitions .............................................................................................

17

5.0

Supported Command Sets ..................................................................................................

19

 

5.1

ATA General Feature Command Set .................................................................................

19

 

5.2

Power Management Command Set ..................................................................................

19

 

5.3

Security Mode Feature Set................................................................................................

19

 

5.4

SMART Command Set .......................................................................................................

20

 

5.5

Device Statistics.................................................................................................................

25

 

5.6

SMART Command Transport (SCT)....................................................................................

27

 

5.7

Data Set Management Command Set...............................................................................

27

 

5.8

Host Protected Area Command Set ..................................................................................

27

 

5.9

48-Bit Address Command Set............................................................................................

27

 

5.10

General Purpose Log Command Set..................................................................................

28

 

5.11

Native Command Queuing................................................................................................

28

 

5.12

Software Settings Preservation.........................................................................................

28

6.0

Certifications and Declarations ...........................................................................................

28

7.0

References .........................................................................................................................

29

Appendix A: IDENTIFY DEVICE Command Data ...............................................................................

30

March 2014

 

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Intel® Solid-State Drive DC S3700 Series

Revision History

Date

Revision

Description

 

 

 

October 2012

001

Initial release

 

 

 

November 2012

002

Updated Power On to Ready specification for 800 GB capacity

 

 

 

February 2013

003

Updated: OS Compatibility; Certifications and Declarations; Power Pin Signal Definitions;

SMART Attributes descriptions

 

 

March 2013

004

Edited for clarity

 

 

 

April 2013

005

Updated Device Identify Table; SMART Attribute Definition. Endurance spec for 1.8-inch 200

GB drive, voltage spec

 

 

June 2013

006

Added X,Y, Z dimension in section 3.0

 

 

 

 

 

Page 1: Compliance, Changed from ATA8-ACS2 to ATA9-ACS2

 

 

Table 14: Changed Endurance Rating Value

March 2014

007

Table 18: Changed SMART Attribute E9h, PW and Threshold values to 1.

 

 

Section 5.4.1.1: Added User Notes and changed step 6 in Use Case 2.

 

 

Appendix A: Changes to Words 59-62, 80, 81, 89, 90, 129-159, 176-205 and 255.

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Intel® Solid-State Drive DC S3700 Series

Terms and Acronyms

Table 1 defines the terms and acronyms used in this document.

Table 1.

Glossary of Terms and Acronyms

 

 

 

Term

 

Definition

 

 

 

 

 

 

 

ATA

 

Advanced Technology Attachment

CRC

 

Cyclic Redundancy Check

DAS

 

Device Activity Signal

DMA

 

Direct Memory Access

ECC

 

Error Correction Code

EXT

 

Extended

FPDMA

 

First Party Direct Memory Access

 

 

Gigabyte

GB

 

Note: The total usable capacity of the SSD may be less than the total physical capacity because a small

 

 

portion of the capacity is used for NAND flash management and maintenance purposes.

Gb

 

Gigabit

HDD

 

Hard Disk Drive

HET

 

High Endurance Technology

KB

 

Kilobyte

I/O

 

Input/Output

IOPS

 

Input/Output Operations Per Second

ISO

 

International Standards Organization

LBA

 

Logical Block Address

MB

 

Megabyte (1,000,000 bytes)

MLC

 

Multi-level Cell

MTBF

 

Mean Time Between Failures

NCQ

 

Native Command Queuing

NOP

 

No Operation

PB

 

Petabyte

PCB

 

Printed Circuit Board

PIO

 

Programmed Input/Output

RDT

 

Reliability Demonstration Test

RMS

 

Root Mean Square

SATA

 

Serial Advanced Technology Attachment

SCT

 

SMART Command Transport

 

 

Self-Monitoring, Analysis and Reporting Technology

SMART

 

An open standard for developing hard drives and software systems that automatically monitors the

 

 

health of a drive and reports potential problems.

SSD

 

Solid-State Drive

TB

 

Terabyte

TYP

 

Typical

UBER

 

Uncorrectable Bit Error Rate

 

 

 

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Intel® Solid-State Drive DC S3700 Series

1.0Overview

This document describes the specifications and capabilities of the Intel® SSD DC S3700 Series.

The Intel SSD DC S3700 Series delivers leading performance and Quality of Service combined with world-class reliability and endurance for Serial Advanced Technology Attachment (SATA)-based computers in four capacities: 100 GB, 200 GB, 400 GB and 800 GB.

By combining 25nm Intel® NAND Flash Memory technology with SATA 6Gb/s interface support, the Intel SSD DC S3700 Series delivers sequential read speeds of up to 500 MB/s and sequential write speeds of up to 460 MB/s. Intel SSD DC S3700 Series delivers Quality of Service of 500 us for random 4KB reads and writes measured at a queue depth of 1.

The Intel SSD DC S3700 Series also includes High Endurance Technology (HET), which combines NAND silicon enhancements and SSD NAND management techniques to extend the write endurance of an SSD, leading to lifetime endurance levels of 10 drive writes per day for 5 years.

The industry-standard 2.5-inch form factor enables interchangeability with existing hard disk drives (HDDs) and native SATA HDD drop-in replacement with the enhanced performance, reliability, ruggedness, and power savings offered by an SSD.

Intel SSD DC S3700 Series offers these key features:

High Endurance Technology (HET)

High I/O and throughput performance

Consistent I/O latency

Enhanced power-loss data protection

End-to-End data-path protection

Thermal throttling

Temperature Sensor

Inrush current management

Low power

High reliability

Enhanced ruggedness

Temperature monitor and logging

Power loss protection capacitor self-test

Product Specification

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2.0Product Specifications

2.1Capacity

Table 2.

User Addressable Sectors

 

 

 

 

 

 

 

Intel® SSD DC S3700 Series

 

Unformatted Capacity

 

 

 

 

(Total User Addressable Sectors in LBA Mode)

 

 

 

 

 

 

 

 

 

 

 

100GB

 

195,371,568

 

 

 

 

 

 

 

200GB

 

390,721,968

 

 

 

 

 

 

 

400GB

 

781,422,768

 

 

 

 

 

 

 

800GB

 

1,562,824,368

 

 

 

 

 

 

Notes: 1GB = 1,000,000,000 bytes; 1 sector = 512 bytes.

LBA count shown represents total user storage capacity and will remain the same throughout the life of the drive.

The total usable capacity of the SSD may be less than the total physical capacity because a small portion of the capacity is used for NAND flash management and maintenance purposes.

2.2Performance

Table 3.

Random Read/Write Input/Output Operations Per Second (IOPS)

 

 

 

 

 

 

 

 

 

 

 

Specification1

 

Unit

 

 

Intel SSD DC S3700 Series

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

100 GB

 

200 GB

 

 

400 GB

 

800 GB

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

(2.5”/1.8”)

 

 

(2.5”/1.8”)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Random 4KB Read (up to)2

IOPS

75,000

75,000 / 75,000

 

75,000 / 75,000

 

75,000

Random 4KB Write (up to)

IOPS

19,000

32,000 / 29,000

 

36,000 / 36,000

 

36,000

 

 

 

 

 

 

 

 

Random 8KB Read (up to)3

IOPS

47,500

47,500 / 47,500

 

47,500 / 47,500

 

47,500

Random 8KB Write (up to)

IOPS

9,500

16,500 / 14,500

 

19,500 / 19,500

 

20,000

 

 

 

 

 

 

 

 

 

 

 

Table 4.

Random Read/Write IOPS Consistency

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Specification4

 

Unit

 

 

Intel SSD DC S3700 Series

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

100 GB

 

200 GB

 

 

400 GB

 

800 GB

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

(2.5”/1.8”)

 

 

(2.5”/1.8”)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Random 4KB Read (up to)2

%

90

90

 

90

 

90

Random 4KB Write (up to)

%

85

90

 

90

 

90

 

 

 

 

 

 

 

 

Random 8KB Read (up to)3

%

90

90

 

90

 

90

Random 8KB Write (up to)

%

85

90

 

90

 

90

 

 

 

 

 

 

 

 

 

 

 

Notes: 1. Performance measured using Iometer* with Queue Depth 32. Measurements are performed on a full Logical Block

Address (LBA) span of the drive.

2.4KB = 4,096 bytes

3.8KB = 8,192 bytes

4.Performance consistency measured using Iometer* based on Random 4KB QD=32 workload, measured as the (IOPS in the 99.9th percentile slowest 1-second interval)/(average IOPS during the test). Measurements are performed on a full Logical Block Address (LBA) span of the drive once the workload has reached steady state but including all background activities required for normal operation and data reliability

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Intel® Solid-State Drive DC S3700 Series

Table 5.

Sequential Read and Write Bandwidth

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Intel® SSD DC S3700 Series

 

 

Specification

 

Unit

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

100GB

200GB

400GB

800GB

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Sequential Read (SATA 6Gb/s)1

MB/s

500

500

500

500

 

Sequential Write (SATA 6Gb/s)1

MB/s

200

365

460

460

 

Notes: 1. Performance measured

using Iometer* with 128KB (131,072 bytes) of transfer size with Queue Depth 32.

 

Table 6.

Latency

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Specification

 

 

Intel SSD DC S3700 Series

 

 

 

 

 

 

 

 

100, 200 and 400GB

 

800 GB

 

 

 

 

 

 

 

 

 

 

Latency1 (TYP)

 

 

 

 

 

Read

 

 

50 µs

50 µs

Write

 

 

65 µs

65 µs

Power On to Ready2

 

2.0 s

3.0 s

 

 

 

 

 

 

Table 7.

Quality of Service

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Intel SSD DC S3700 Series

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Specification

 

Unit

Queue Depth=1

Queue Depth=32

 

 

 

 

 

 

 

 

 

 

 

 

100GB

 

200/400/800

100GB

 

200/400/800

 

 

 

 

 

GB

 

 

GB

 

 

 

 

 

 

 

 

 

Quality of Service3,4 (99.9%)

 

 

 

 

 

 

 

Reads

 

ms

0.5

 

0.5

1

 

1

 

 

 

 

 

 

 

 

 

Writes

 

ms

0.5

 

0.5

15

 

10

 

 

 

 

 

 

 

 

Quality of Service3,4 (99.9999%)

 

 

 

 

 

 

 

Reads

 

ms

10

 

5

10

 

5

 

 

 

 

 

 

 

 

 

Writes

 

ms

10

 

5

20

 

20

 

 

 

 

 

 

 

 

 

Notes:

1.Device measured using Iometer. Latency measured using 4 KB (4,096 bytes) transfer size with Queue Depth equal to 1 on a sequential workload.

2.Power On To Ready time assumes proper shutdown. Time varies if shutdown is not preceded by STANDBY IMMEDIATE command.

3.Device measured using Iometer. Quality of Service measured using 4 KB (4,096 bytes) transfer size on a random workload on a full Logical Block Address (LBA) span of the drive once the workload has reached steady state but including all background activities required for normal operation and data reliability.

4.Based on Random 4KB QD=1, 32 workloads, measured as the time taken for 99.9(or 99.9999) percentile of commands to finish the round-trip from host to drive and back to host.

Product Specification

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Intel® Solid-State Drive DC S3700 Series

2.3Electrical Characteristics

Table 8.

Operating Voltage for 2.5-inch Form Factor

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Intel® SSDDC S3700 Series

 

Electrical Characteristics

 

 

 

 

 

 

 

100, 200, 400 and 800GB

 

 

 

 

 

 

 

 

 

 

5 V Operating Characteristics:

 

 

 

Operating Voltage range

 

5 V (±5%)

 

Rise time (Max/Min)

 

 

1 s / 1 ms

 

Fall time (Min)2

 

 

1 ms

 

Noise level

 

 

500 mV pp 10 Hz – 100 KHz

 

 

 

 

50 mV pp 100 KHz – 20 MHz

 

Min Off time3

 

 

500 ms

 

Inrush Current (Typical Peak) 1

 

1.0 A, < 1 s

 

12 V Operating Characteristics:

 

 

 

Operating Voltage range

 

12 V (±10%)

 

Rise time (Max/Min)

 

 

1 s / 1 ms

 

Fall time (Min)2

 

 

1 ms

 

Noise level

 

 

1000 mV pp 10 Hz – 100 KHz

 

 

 

 

100 mV pp 100 KHz – 20 MHz

 

Min Off time3

 

 

500 ms

 

Inrush Current (Typical Peak) 1

 

1.0 A, < 1 s

 

Notes:

1.Measured from initial device power supply application

2.Fall time needs to be equal or better than minimum in order to guarantee full functionality of enhanced power loss management

3.The drive needs to be powered off for at least 500msec before powering on

Table 9. Power Consumption for 2.5-inch Form Factor (5V Supply)

 

 

 

 

 

 

 

 

 

 

 

 

Intel SSD DC S3700 Series

 

 

Specification

Unit

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

100GB

200GB

400GB

800GB

 

 

 

 

 

 

 

 

 

Active Write - RMS Average 1

W

2.8

4.2

5.2

5.8

 

Active Write - RMS Burst 2

W

3.1

4.6

7.7

8.2

 

Idle

W

0.6

0.6

0.6

0.6

 

 

 

 

 

 

 

 

 

Table 10. Power Consumption for 2.5-inch Form Factor (12V Supply)

 

 

 

 

 

 

 

 

 

 

 

 

Intel SSD DC S3700 Series

 

 

Specification1

Unit

 

 

 

 

 

 

 

 

 

 

 

 

 

100GB

200GB

400GB

800GB

 

 

 

 

 

 

 

 

 

 

 

 

 

Active Write - RMS Average

W

2.9

4.4

5.4

6.0

 

 

 

 

 

 

 

 

Active Write - RMS Burst

W

3.3

4.8

7.6

8.2

 

 

 

 

 

 

 

 

Idle

W

0.8

0.8

0.8

0.8

 

 

 

 

 

 

 

 

 

Notes:

1.The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. Root Mean Squared (RMS) average power is measured using scope trigger over a 100 ms sample period

2.The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. Root Mean Squared (RMS) burst power is measured using scope trigger over a 500 us sample period

March 2014

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Intel SSDSC2BA800G301, SSDSC2BA100G301, SSDSC2BA200G301, SSDSC2BA400G301 User manual

Intel® Solid-State Drive DC S3700 Series

Table 11.

Operating Voltage and Power Consumption for 1.8-inch Form Factor

 

 

 

Electrical Characteristics

Intel® SSD DC S3700 Series

 

200 and 400GB

 

 

 

 

 

Operating Voltage for 3.3 V (±5%)

 

Min

 

3.13 V

Max

 

3.47 V

Rise time (Max/Min)

 

1 s / 1 ms

Fall time (Min)2

 

1 ms

Noise level

 

300 mV pp 10 Hz – 100 KHz

 

 

500 mV pp 100 KHz – 20 MHz

Min Off time3

 

500 ms

Inrush Current (Typical Peak) 1

1.2 A, < 1 s

Notes:

1.Measured from initial device power supply application

2.Fall time needs to be equal or better than minimum in order to guarantee full functionality of enhanced power loss management

3.The drive needs to be powered off for at least 500msec before powering on

Table 12.

Power Consumption for 1.8-inch Form Factor

 

Specification1

 

Unit

Intel SSD DC S3700 Series

 

200GB

400GB

 

 

 

Active Write - RMS Average @ 3.3V

W

4.3

5.3

Active Write - RMS Burst @ 3.3V

W

4.7

7.9

 

 

 

 

Idle @ 3.3V

W

0.6

0.6

Notes:

1.The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. Root Mean Squared (RMS) power is measured using scope trigger over a 100 ms sample period.

Product Specification

March 2014

10

328171-007

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