Integral INSSD480GS625SVR1SRI User Manual

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Product Specification

Integral SVR-PRO 100 SRI 2.5” SATA 6Gbps SSD

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INTRODUCTION

The SVR-PRO 100 SRI SSD range is designed for
Read intensive applications, offers up to a massive
8TB of data storage and features consistently low
latency with a superior level of read and write
IOPS, together with power loss protection.

PRODUCT OVERVIEW

Delivers solid I/O cost-to-performance benefits for
applications that demand low latency read speeds and
greater bandwidth for server and storage environments
for Serial Advanced Technology Attachment (SATA)-based
systems in capacities of 480GB, 960GB, 4TB and 8TB.

Uses a single-chip controller with a SATA interface on the
system side and 8-channels of Flash internally. The industry­standard 2.5-inch form factor enables interchangeability
with existing hard disk drives (HDDs) and native SATA HDD
drop-in replacement with the enhanced performance,
reliability, ruggedness, and power savings offered by an SSD.

SVR-PRO 100 has the capacity you require for storage-hungry
SATA based systems.

480

GB

960

GB

4

TB

8

TB

BENEFITS

• High capacity SSDs for big data storage (4TB and 8TB)

• Designed for read intensive applications

• Reduced latencies

• Lower Power Consumption

• Non-volatile Flash Memory for outstanding data
retention - Less likely to fail than HDD

• Shock resistance - No moving parts enable the product
to be used in tougher conditions

• Silent operation - Noiseless and low heat dissipation

• Much less heat generated than conventional HDD

FEATURES

• 2.5” form factor with SATA III 6Gbps interface (backwards
compatible with SATA 3Gbps and SATA 1.5Gbps)

• Sequential Read up to 554MB/s and Write up 517MB/s

• Random Read IOPS up to 80K, Random Write up to 70K

• Supports S.M.A.R.T. - Self-Monitoring, Analysis and
Reporting Technology

• Features an internal temperature sensor with an accuracy
of +/-2°C over a range of -40°C to +125°C which can be
monitored using a SMART attribute BEh

• The SSD hardware is built with a number of capacitors
that ensure that the data in the write cache of the SSD is
protected against corruption if a power loss was to occur,
enabling the SSD to complete the last write command to
the NAND flash

• CE and FCC compliant

• 5 Year Warranty or maximum endurance use.

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Rev:2

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Product Specification: for 480GB, 960GB

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CAPACITIES & INTERFACE

Capacities available 480GB and 960GB

Form Factor 2.5 Inch

Interface

SATA III 6Gbps (also Compatible with SATA
II 3Gbps and SATA 1.5Gbps)

Controller Novachips

NAND MLC

DIMENSIONS

Length mm 100.45

Width mm 69.85

Height mm 7mm

Weight 100g

Sequential Performance

1

up to

Random Performance

Typical Latency

Operating Temp

2

4

Read:520MB/s Write: 500MB/s

3

Read 80K IOPS, Write 70K IOPS

Read: 65us, Write: 40us

0 to 70°C

Humidity 5% to 95%, non-condensing

POWER CONSUMPTION

Supply Voltage 4.5V minimum – 5.5V maximum

Power Consumption
Active Maximum 128KB
sequential write

Idle Average
Power Consumptions

Shock (operating and non
operating) Maximum

Vibration Maximum

Supports SMART Ye s

5

MTBF

Endurance

6

WARRANTY

Compliancy CE, FCC, RoHS

Bulk Weight 100g

Packaged Weight 158g

Packaged Dimensions (mm) L = 133 W = 117 H = 13

7

480GB = 4700mW
960GB = 5200mW

145mW

7

1000G, duration 0.5ms

Operating 2.17 Grms (5-700Hz, Non­Operating 3.13 Grms (5-800Hz)

2 Million Hours

1 DWPD

5 YEARS or Maximum endurance

CAPACITY PART CODE BARCODE (EAN)

480GB INSSD480GS625SVR1SRI 5055288437364

960GB INSSD960GS625SVR1SRI 5055288437371

Notes:

1. Actual performance may vary and depends on use conditions, host and environment

2. 4KB transfers used for Read/Write latency values.

3. Typical I/O performance numbers as measured fresh-out-of-the-box (FOB) using IOmeter with a queue
depth 32 and write cache enabled.

4. Operating temperature is the drive case temperature as measured by the SMART temperature attribute

5. Mean Time Between Failures is estimated based on JEDEC-218/219 standard methodology.

6. TBW (Total bytes Written). DWPD (Drive Writes Per Day) TBW and DWPD is a measurement of SSDs
expected lifespan, which represents the amount of data written to the device and DWPD. This is only
an estimate and can differ based in user usage behaviour, platform and estimates provided by the
flash vendor

7. Power Consumption may differ according to flash configuration and platform

All Specifications are subject to change without notice

1GB = 1,000,000,000 Bytes, 1TB = 1,000,000,000,000 Bytes; 1 sector = 512 Bytes.

The total usable capacity of the SSD may be less than the total physical capacity because a small portion of
the capacity is used for NAND flash management and maintenance purposes.

Rev:2

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Product Specification: for 480GB, 960GB

Physical Dimensions
(2.5” 7mm z-height)

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Rev:2

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Product Specification: for 480GB, 960GB

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1.1 SUPPORTED COMMAND SETS

Table 1. Supported Command Sets

COMMAND NAME COMMAND CODE (HEX)

CHECK POWER MODE E5h or 98h

DEVICE RESET 08h

DEVICE CONFIGURATION

DEVICE CONFIGURATION FREEZE LOCK B1h/C1h

DEVICE CONFIGURATION IDENTIFY B1h/C2h

DEVICE CONFIGURATION RESTORE B1h/C0h

DEVICE CONFIGURATION SET B1h/C3h

DOWNLOAD MICROCODE 92h

DATA SET MANAGEMENT 06h

EXECUTE DEVICE DIAGNOSTIC 90h

FLUSH CACHE E7h

FLUSH CACHE EXT EAh

IDENTIFY DEVICE ECh

IDLE E3h or 97h

IDLE IMMEDIATE E1h or 95h

INITIALIZE DEVICE PARAMETERS 91h

READ BUFFER E4h

READ DMA C8h

READ DMA EXT 25h

READ FPDMA QUEUED 60h

READ LOG EXT 2Fh

READ MULTIPLE C4h

READ MULTIPLE EXT 29h

READ NATIVE MAX ADDRESS F8h

READ NATIVE MAX ADDRESS EXT 27h

READ SECTOR(S) 20h

READ SECTOR(S) EXT 24h

READ VERIFY SECTOR(S) 40h

READ VERIFY SECTOR(S) EXT 42h

SECURITY DISABLE PASSWORD F6h

SECURITY ERASE PREPARE F3h

SECURITY ERASE UNIT F4h

SECURITY FREEZE LOCK F5h

SECURITY SET PASSWORD F1h

SECURITY UNLOCK F2h

SEEK 70h

SET FEATURES

Enable write cache EFh/02h

Disable write cache EFh/82h

Set transfer mode EFh/03h

Enable Power-Up In Standby Efh/06h

Disable Power-Up In Standby Efh/86h

Enable DMA Setup FIS Auto-Activate
optimization

Disable DMA Setup FIS Auto-Activate
optimization

Efh/10h/02h

Efh/90h/02h

Enable Device-initiated interface power
state transitions

Disable Device-initiated interface power
state transitions

SET MAX

SET MAX ADDRESS F9h/na

SET MAX FREEZE LOCK F9h/04h

SET MAX LOCK F9h/02h

SET MAX SET PASSWORD F9h/01h

SET MAX UNLOCK F9h/03h

SET MAX ADDRESS EXT 37h

SET MULTIPLE MODE C6h

SLEEP E6h or 99h

SMART

SMART DISABLE OPERATIONS B0h/D9h

SMART ENABLE OPERATIONS B0h/D8h

SMART ENABLE/DISABLE ATTRIBUTE
AUTOSAVE

SMART EXECUTE OFF-LINE IMMIDIATE B0h/D4h

SMART READ ATTRIBUTE THRESHOLDS B0h/D1h

SMART READ DATA B0h/D0h

SMART READ LOG B0h/D5h

SMART RETURN STATUS B0h/DAh

SMART SAVE ATTRIBUTE VALUES B0h/D3h

SMART WRITE LOG B0h/D6h

STANDBY E2h or 96h

STANDBY IMMEDIATE E0h or 94h

SOFT RESET FFh

WRITE BUFFER E8h

WRITE DMA CAh

WRITE DMA EXT 35h

WRITE FPDMA QUEUED 61h

WRITE LOG EXT 3Fh

WRITE MULTIPLE C5h

WRITE MULTIPLE EXT 39h

WRITE SECTOR(S) 30h

WRITE SECTOR(S) EXT 34h

Efh/10h/03h

Efh/90h/03h

B0h/D2h

Rev:2

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Product Specification: for 480GB, 960GB

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1.2 SMART

1.2.1 SMART SUBCOMMAND SETS

In order to select a subcommand the host must write
the subcommand code to the device’s Features Register
before issuing the SMART Function Set command. The
subcommands are listed below.

Table 2. SMART Subcommand Sets

COMMAND COMMAND CODE (HEX)

SMART READ DATA D0h

SMART ENABLE/DISABLE ATTRIBUTE
AUTOSAVE

SMART EXECUTE OFF-LINE IMMIDIATE D4h

SMART READ LOG D5h

SMART WRITE LOG D6h

SMART ENABLE OPERATIONS D8h

SMART DISABLE OPERATIONS D9h

SMART RETURN STATUS DAh

D2h

1.2.2 SMART READ DATA (SUBCOMMAND D0H)

This subcommand returns the device’s Attribute Values to
the host. The Attribute Values consist of 512bytes.

Table 3. Device Attribute Data Structure

Table 4. Individual Attribute Data Structure

BYTE DESCRIPTION

0 Attribute ID Number

1~2 Flags

3 Current Value

4 Worst Value

5~10

11 Reserved

Attribute Value (FFFF FFFF
FFFFh)

BYTE DESCRIPTION

0~1 Data structure revision number (Vendor Specific)

2~361 1st - 30th Individual attribute data (Vendor Specific)

362 Off-line data collection status

363 Self-test execution status

364~365 Total time in seconds to complete off-line data

366 Vendor Specific

367 Off-line data collection capability

368-369 SMART capability

370 Error logging capability

371 Self-test failure check point (Vendor Specific)

372 Short self-test routine recommended polling time(in

373 Extended self-test routine recommended polling

374-510 Reserved

511 Data structure checksum

collection activity

7-1 Reserved
0 1=Device error logging supported

minutes)

time(in minutes)

Rev:2

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Product Specification: for 480GB, 960GB

Table 5. Attribute ID Numbers

ID (DEC) ID (HEX) ATRIBUTE NAME DESCRIPTION

1 01h Vendor-specific

9 09h Power-On Hours The time amount of power-on state (unit: hours)

12 0Ch Power Cycle Count Counts of full power on/off cycles

13 0Dh Vendor-specific

181 AFh Program Failure Block Count Counts the number of flash program failures

184 B8h Initial Bad Block Count The number of bad blocks which was detected

187 BBh Read Failure Block Count

(Uncorrectable)

190 BEh Temperature Current device temperature (unit: ˚C)

199 C7h SATA Error CRC Count The number of encountered SATA interface errors

200 C8h Total count of write commands The total number of written command during the

201 C9h Total count of read commands The total number of read command during the

202 CAh Vendor-specific

204 CCh Vendor-specific

209 D1h SSD Life Left

(Remaining Drive Life)

210 D2h Erase Count Indicates the minimum, average, maximum erased

213 D5h Maximum PE Cycle Count Returns maximum PE cycle counts of flash

225 E1h Vendor-specific

226 E2h Flush command count Flush command count 00~23 : self flush count /

227 E3h Vendor-specific

228 E4h Vendor-specific

229 E5h Vendor-specific

230 E6h Total Free Block The current total free blocks count

241 F1h Vendor-specific

242 F2h TRIM remain amount Remaining TRIM amount

00~23 : flash program failure count / 24~47 : flash
erase failure count

when firmware was installed

Uncorrectable read failure block count 00~23 :
read bad block count / 24~47 : potential read bad
block count

00~23 : CRC Error count / 24~47 : Handshake
Error Count

entire lifetime of the device

entire lifetime of the device

Indicates the approximate SSD life left [(maximum
PE cycle – average erase count) / maximum PE
cycle]

counts of all the blocks
00~15 : The minimum erased count
16~31 : The average erased count
32~47 : The maximum erased count

24~47 : host flush count

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Rev:2

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Product Specification: for 480GB, 960GB

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1.2.3 SMART SAVE ATTRIBUTE VALUES
(SUBCOMMAND D3H)

This subcommand causes the device to immediately save
any updated Attribute Values to the device’s Attribute Data
sector regardless of the state of the Attribute Autosave
feature.

1.2.4 SMART EXECUTE OFF-LINE IMMEDIATELY
(SUBCOMMAND D4H)

This subcommand causes the device to start the off-line
process for the requested mode and operation. The LBA
Low register shall be set to specify the operation to be
executed.

Table 6. SMART Execute Off-line Immediately

LBA LOW DESCRIPTION

00h Execute SMART off-line data collection routine

immediately

01h Execute SMART Short self-test routine

immediately in off-line mode

02h Execute SMART Extended self-test routine

immediately in off-line mode

03h Reserved

04h Execute SMART Selective self-test routine

immediately in off-line mode

40h Reserved

7Fh Abort off-line mode self-test routine

81h Execute SMART short self-test routine

immediately in captive mode

82h Execute SMART Extended self-test routine

immediately in captive mode

84h Execute SMART selective self-test routine

immediately in captive mode

C0h Reserved

Status - Set ERR to one when the self-test has failed
Error - Set ABRT to one when the self-test has failed
LBA Low - Set to F4h when the self-test has failed
LBA High - Set to 2Ch when the self-test has failed

1.2.5 SMART READ LOG SECTOR
(SUBCOMMAND D5H)

This command returns the specified log sector content to
the host.LBA Low and Sector Count Registers shall be set
to specify the log sector and sector number to be written.

Table 7. SMART Read Log Sector

LOG SECTOR
ADDRESS

00h 1 Log directory Read Only

01h 1 SMART error log Read Only

02h 51 Comprehensive SMART

03h 37 Extended Comprehensive

06h 1 SMART self-test log Read Only

07h 1 Extended SMART

09h 1 Selective self-test log Read and Write

10h 1 NCQ Error log Read only

11h 1 SATA Phy event counter

80h-9Fh 32 Host vendor specific Read and Write

Table 8. SMART Log Directory

BYTE DESCRIPTION

0~1 SMART Logging Version (set to 01h)

2~3 Number of sectors in the log at log address 1

4~5 Number of sectors in the log at log address 2

…

510~511 Number of sectors in the log at log address 255

NO.
SECTOR

CONTENT

Read Only

error log

Read Only

SMART error log

Read Only

self-test log

Read only

log

Table 9. Self-test log structure

OFF-LINE MODE

The device executes command completion before executing
the specified routine. During execution of the routine the
device will not set BSY nor clear DRDY. If the device is in
the process of performing its routine and is interrupted
by a new command from the host, the device will abort or
suspend its routine and service the host within two seconds
after receipt of the new command. After servicing the
interrupting command, the device will resume its routine
automatically or not start its routine depending on the
interrupting command.

CAPTIVE MODE

When executing self-test in captive mode, the device sets
BSY to one and executes the specified self-test routine
after receipt of the command. At the end of the routine,
the device sets the execution result in the Self-test
execution status byte (see Table 7-1: “Device Attribute Data
Structure” on page 23) and ATA registers and then executes
the command completion. See definitions below.

Rev:2

BYTE DESCRIPTION

0~1 Data structure revision

n*24+2 Self-test number

n*24+3 Self-test execution status

n*24+4~n*24+5 Life timestamp

n*24+6 Self-test failure check point

n*24+7~n*24+10 LBA of first failure

n*24+11~n*24+25 Vendor specific

….. …..

506~507 Vendor specific

508 Self-test log pointer

509~510 Reserved

511 Data structure checksum

N is 0 through 20
The data structure contains the descriptor of the Self-test that the device has performed. Each descriptor

is 24 bytes long and the self-test data structure is capable to contain up to 21 descriptors. After 21
descriptors have been recorded, the oldest descriptor will be overwritten with the new descriptor. The
self-test log pointer points to the most recent descriptor. When there is no descriptor, the value is 0.
When there are descriptor(s), the value is 1 through 21.

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Product Specification: for 480GB, 960GB

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Table 10. Selective self-test log structure

BYTE CONTENT REMARKS

0-1 Data structure revision Read and Write

2-9 Starting LBA for test span 1 Read and Write

10-17 Ending LBA for test span 1 Read and Write

18-25 Starting LBA for test span 2 Read and Write

26-33 Ending LBA for test span 2 Read and Write

34-41 Starting LBA for test span 3 Read and Write

42-49 Ending LBA for test span 3 Read and Write

50-57 Starting LBA for test span 4 Read and Write

58-65 Ending LBA for test span 4+ Read and Write

66-73 Starting LBA for test span 5 Read and Write

74-81 Ending LBA for test span 5 Read and Write

82-337 Reserved Reserved

338-491 Vendor specific Vendor specific

492-499 Current LBA under test Read

500-501 Current span under test Read

502-503 Feature flags R/W Read and Write

504-507 Vendor Specific Vendor specific

508-509 Selective self test pending time Read and Write

510 Reserved Reserved

511 Data structure checksum Read and Write

1.2.6 SMART WRITE LOG SECTOR
(SUBCOMMAND D6H)

This command writes 512 bytes of data to the specified log
sector. LBA Low and Sector Count registers shall be set to
specify the log address and sector number to be written.

1.2.8 SMART DISABLE OPERATIONS
(SUBCOMMAND D9H)

This subcommand disables all SMART capabilities. After
receipt of this subcommand the device disables all SMART
operations. Non self-preserved Attribute Values will no
longer be monitored. The state of SMART—either enabled
or disabled—is preserved by the device across power cycles.
Note that this subcommand does not preclude the device’s
power mode attribute auto saving.

After receipt of the SMART Disable Operations subcommand
from the host, all other SMART subcommands except SMART
Enable Operations are disabled and will be aborted by the
device returning the error code as specified in “SMART
Error Codes”.

Any Attribute Values accumulated and saved to volatile
memory prior to receipt of the SMART Disable Operations
command will be preserved in the device’s Attribute Data
Sectors. If the device is re-enabled, these Attribute Values
will be updated, as needed, upon receipt of a SMART
Read Attribute Values or a SMART Save Attribute Values
command.

1.2.9 SMART RETURN STATUS
(SUBCOMMAND DAH)

This subcommand is used to communicate the reliability
status of the device to the host’s request. Upon receipt of
the SMART Return Status subcommand the device saves
any updated Attribute Values to the reserved sector, and
compares the updated Attribute Values to the Attribute
Thresholds.

1.2.7 SMART ENABLE OPERATIONS
(SUBCOMMAND D8H)

This subcommand enables access to all SMART capabilities.
Prior to receipt of a SMART Enable Operations
subcommand, Attribute Values are neither monitored nor
saved by the device. The state of SMART—either enabled
or disabled—will be preserved by the device across power
cycles. Once enabled, the receipt of subsequent SMART
Enable Operations subcommands will not affect any of the
Attribute Values.

Rev:2

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Product Specification: for 480GB, 960GB

1.3 IDENTIFY DEVICE COMMAND DATA

Table 11. Returned Sector Data

F=FIXED

WORD

0 X 0040h General configuration bit-significant information

1 X 3FFFh Obsolete - Number of logical cylinders (16,383)

2 V C837h Specific configuration

3 X 0010h Obsolete - Number of logical heads (16)

4-5 X 0h Retired

6 X 003Fh Obsolete - Number of logical sectors per logical track (63)

7-8 V 0h Reserved for assignment by the CompactFlash* Association (CFA)

9 X 0h Retired

10-19 F varies Serial number (20 ASCII characters)

20-21 X 0h Retired

22 X 0000h Obsolete

23-26 F varies Firmware revision (8 ASCII characters)

27-46 F varies Model number

47 F 8001h Maximum number of sectors transferred per interrupt on multiple

48 F 4000h Trusted Computing Feature Set

49

50 F 4000h Capabilities

51-52 X 0h Obsolete

53 F 0007h Words 88 and 70:64 valid

54 X 3FFFh Obsolete - Number of logical cylinders (16,383)

55 X 0010h Obsolete - Number of logical heads (16)

56 X 003Fh Obsolete - Number of logical sectors per logical track (63)

57-58 X 0h Obsolete

59 F 0101 h Number of sectors transferred per interrupt on multiple commands

60-62 V varies Total number of user-addressable sector

63 X 0407h Multi-word DMA modes supported/selected

64 F 0003h PIO modes supported

65 F 0078h Minimum multiword DMA transfer cycle time per word

66 F 0078h Manufacturer’s recommended multiword DMA transfer cycle time

67 F 0078h Minimum PIO transfer cycle time without flow control

68 F 0078h Minimum PIO transfer cycle time with IORDY flow control

69 F 4020h Additional Supported

70 F 0000h Reserved

71-74 F 0h Reserved for IDENTIFY PACKET DEVICE command

75 F 001Fh Queue depth

76 F 050Eh Serial ATA capabilities

77 F 0006h Reserved for future Serial ATA definition

78 F 0044h Serial ATA features supported

79 V 0044h Serial ATA features enabled

80 F 01E0h Major version number

V=VARIABLE
X=BOTH

F

ATRIBUTE NAME DESCRIPTION

commands

2F00h Capabilities

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NOTES:

F = Fixed. The content of the word is fixed and does not change. For removable media devices, these values may change when media is removed or changed.

V = Variable. The state of at least one bit in a word is variable and may change depending on the state of the device or the commands executed by the device.

X = F or V. The content of the word may be fixed or variable.

Rev:2

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Product Specification: for 480GB, 960GB

F=FIXED

WORD

81 F 0000h Minor version number

82 F 346Bh Command set supported

83 F 7D01h Command sets supported

84 F 4122h Command set/feature supported extension

85 V 3469h Command set/feature enabled

86 V 3C01h Command set/feature enabled

87 V 4122h Command set/feature default

88 V 007Fh Ultra DMA Modes

89 F 0004h Time required for security erase unit completion

90 F 0004h Time required for enhanced security erase completion

91 V 0000h Current advanced power management value

92 V FFFEh Master Password Revision Code

93 X 0000h Hardware reset result: the contents of bits (12:0) of this word shall

94 V 0000h Vendor’s recommended and actual acoustic management value

95 F 0000h Stream minimum request size

96 V 0000h Streaming transfer time - DMA

97 V 0000h Streaming access latency - DMA and PIO

98-99 F 0000h Streaming performance granularity

100-103 V Varies Maximum user LBA for 48-bit address feature set

104 V 0000h Streaming transfer time - PIO

105 V 0001h Maximum number of 512-byte blocks of LBA Range Entries per

106 F 4000h Physical sector size / logical sector size

107 F 0000h Inter-seek delay for ISO-7779 acoustic testing in microseconds

108-111 F varies Unique ID

112-115 F 0h Reserved for world wide name extension to 128 bits

116 V 0000h Reserved for technical report

117-118 F 0h Words per logical sector

119 F 0000h Supported settings

120 F 0000h Command set/feature enabled/supported

121-126 F 0h Reserved

127 X 0000h Removable Media Status Notification feature set support

128 V 0001h Security status

129 V 0000h Vendor-specific

130-159 X 0h Vendor-specific

160 X 0000h CompactFlash Association (CFA) power mode 1

161-167 X 0h Reserved for assignment by the CFA

168 X 0003h Reserved for assignment by the CFA

169 X 0001h Data set management Trim attribute support

170-175 F 0h Reserved for assignment by the CFA

176-205 X 0h Current media serial number

206 X 0000h SCT Command Transport

207-208 F 0h Reserved

209 X 4000h Alignment of logical blocks within a physical block

V=VARIABLE
X=BOTH

ATRIBUTE NAME DESCRIPTION

change only during the execution of a hardware reset

DATASET MANAGEMENT command

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NOTES:

F = Fixed. The content of the word is fixed and does not change. For removable media devices, these values may change when media is removed or changed.

V = Variable. The state of at least one bit in a word is variable and may change depending on the state of the device or the commands executed by the device.

X = F or V. The content of the word may be fixed or variable.

Rev:2

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Product Specification: for 480GB, 960GB

F=FIXED

WORD

210-211 V 0h Write-Read-Verify Sector Count Mode 3 (DWord)

212-213 F 0h Write-Read-Verify Sector Count Mode 2 (DWord)

214 X 0000h NV Cache Capabilities

215-216 V 0h NV Cache Size in Logical Blocks (DWord)

217 F 0001h Nominal media rotation rate

218 V 0000h Reserved

219 F 0000h NV Cache Options

220 V 0000h Write-Read-Verify feature set

221 X 0000h Reserved

222 F 103Fh Transport major version number

223 F 0000h Transport minor version number

224-229 F 0h Reserved

230-233 X 0h Extended Number of User Addressable Sectors (QWord)

234 F 0000h Minimum number of 512-byte data blocks per DOWNLOAD

235 F 0000h Maximum number of 512-byte data blocks per DOWNLOAD

236-254 X 0h Reserved

255 V varies Integrity word

V=VARIABLE
X=BOTH

ATRIBUTE NAME DESCRIPTION

MICROCODE command for mode 03h

MICROCODE command for mode 03h

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NOTES:

F = Fixed. The content of the word is fixed and does not change. For removable media devices, these values may change when media is removed or changed.

V = Variable. The state of at least one bit in a word is variable and may change depending on the state of the device or the commands executed by the device.

X = F or V. The content of the word may be fixed or variable.

Rev:2

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Product Specification

Integral SVR-PRO 100 SRI 2.5” SATA 6Gbps SSD

15mm

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7mm

INTRODUCTION

The Integral SVR-PRO 100 SRI SATA III 6Gbps 2.5”
SSD offers massive 4TB and 8TB of storage and
delivers all of the advantages of flash memory
technology for ultimate performance and reliability.
The best big data SSD solution for server and
desktop computing environments. Ideal for read
intensive and performance hungry applications;
including Video on Demand, streaming, Web server,
file server and operating system boot.

PRODUCT OVERVIEW

The SVR-PRO 100 SRI SSD range is designed for Read
intensive applications, offers up to a massive 8TB of
data storage and features consistently low latency with
a superior level of read and write IOPS, together with
power-loss protection.

Delivers solid I/O cost-to-performance benefits for
applications that demand low latency read speeds for
server and storage environments for Serial Advanced
Technology Attachment (SATA)-based systems in capacities
of 4TB and 8TB.

Uses a single-chip controller with a SATA interface on the
system side and 8-channels of HLNAND Flash internally.
The industry-standard 2.5-inch form factor enables
interchangeability with existing hard disk drives (HDDs)
and native SATA HDD drop-in replacement with the
enhanced performance, reliability, ruggedness, and power
savings offered by an SSD.

SVR-PRO 100 has the capacity you require for storage­hungry SATA based systems.

4

TB

8

TB

BENEFITS

• High capacity SSDs for big data storage

• Designed for read intensive applications

• Reduced latencies

• Lower Power Consumption

• Non-volatile Flash Memory for outstanding data
retention - Less likely to fail than HDD

• Shock resistance - No moving parts enable the product
to be used in tougher conditions

• Silent operation - Noiseless and low heat dissipation

• Much less heat generated than conventional HDD

FEATURES

• 2.5” form factor with SATA III 6Gbps interface (backwards
compatible with SATA 3Gbps and SATA 1.5Gbps)

• Sequential Read up to 551MB/s and Write up 517MB/s

• Random Read IOPS up to 52K, Random Write up to 78K

• TBW – Up to 2000 (8TB model)

• Supports S.M.A.R.T. - Self-Monitoring, Analysis and
Reporting Technology

• Features an internal temperature sensor with an accuracy
of +/-2°C over a range of -40°C to +125°C which can be
monitored using a SMART attribute BEh

• The SSD hardware is built with a number of capacitors
that ensure that the data in the write cache of the SSD is
protected against corruption if a power loss was to occur,
enabling the SSD to complete the last write command to
the NAND flash.

• CE and FCC compliant

• 5 Year Warranty or TBW

Rev:1

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Product Specification: for 4TB, 8TB

i

CAPACITIES & INTERFACE

Capacities available 4TB and 8TB

Form Factor 2.5 Inch

Interface

Controller Novachips

NAND HLNAND MLC

SATA III 6Gbps (also Compatible with SATA
II 3Gbps and SATA 1.5Gbps)

DIMENSIONS

Length mm 100.45

Width mm 69.85

Height mm 4TB: 7mm, 8TB: 15mm

Weight 4TB = 120g, 8TB 200g

Sequential Performance
up to

Random Performance

Typical Latency Read: 65us, Write: 40us

Operating Temp 0 to 70°C

Humidity 5% to 95%, non-condensing

Supply Voltage 4.5V minimum – 5.5V maximum

Power Consumption
maximum (Watt)

4TB: Read:551MB/s Write: 517MB/s
8TB: Read:551MB/s Write: 517MB/s

4TB: Read 52K IOPS, Write 78K IOPS
8TB: Read 49K IOPS, Write 77K IOPS

4TB Sequential Read: 5.9W / Write 8.45W
Random 4K: Read: 5W / Write 8.40W
Idle: 2.78W
8TB Sequential: Read: 8.94W / Write:

8.45W
Random 4K: Read: 5.44W / Write 9.40W
Idle: 3.10W

CAPACITY PART CODE BARCODE (EAN)

4TB INSSD4TS625SVR100SRI 5055288435056

8TB INSSD8TS625SVR100SRI 5055288435063

Notes:

1. Actual performance may vary and depends on use conditions, host and environment

2. 4KB transfers used for Read/Write latency values.

3. Typical I/O performance numbers as measured fresh-out-of-the-box (FOB) using IOmeter with a queue
depth 32 and write cache enabled.

4. The product achieves a mean time between failure (MTBF) based on population statistics not relevant
to individual units.

5. Based on full sustained 128K random write workload

6. Operating temperature is the drive case temperature as measured by the SMART temperature attribute

7. Mean Time Between Failures is estimated based on JEDEC-218/219 standard methodology.

8. TBW (Terabytes Written). TBW is a measurement of SSDs expected lifespan, which represents the
amount of data written to the device. This is only an estimate and can differ based in user usage
behaviour, platform and estimates provided by the flash vendor

9. Power Consumption may differ according to flash configuration and platform

HLNAND™ is a trademark of Novachips Co., Ltd

All Specifications are subject to change without notice

1GB = 1,000,000,000 Bytes, 1TB = 1,000,000,000,000 Bytes; 1 sector = 512 Bytes.

The total usable capacity of the SSD may be less than the total physical capacity because a small portion of
the capacity is used for NAND flash management and maintenance purposes.

POWER CONSUMPTION

4TB Sequential: Read: 3.63W / Write: 5.5W
Random 4K: Read: 3.33W / Write 4.85W

Average (Watt)

Shock (operating and non
operating

Vibration

Supports SMART Ye s

MTBF 1.5 Million Hours

TBW 4TB: 1000 TBW, 8TB 2000 TBW

WARRANTY

Compliancy CE, FCC, RoHS

Bulk Weight 4TB = 120g, 8TB 200g

Packaged Weight 4TB = 178g 8TB = 258g

Packaged Dimensions (mm) L = 120 W = 163 H = 31

Idle: 2.17W
8TB Sequential: Read: 4.59W / Write:

6.09W
Random 4K: Read: 4.03W / Write 5.17W
Idle: 2.73W

1000G, duration 0.5ms

Operating 2.17 Grms (5-700Hz, Non­Operating 3.13 Grms (5-800Hz)

5 YEARS or TBW

Rev:1

i

Product Specification: for 4TB, 8TB

4TB diagram
(2.5” 7mm z-height)

i

8TB diagram

2.5” 15mm z-height

Rev:1

i

Product Specification: for 4TB, 8TB

i

1.1 SUPPORTED COMMAND SETS

Table 1. Supported Command Sets

COMMAND NAME COMMAND CODE (HEX)

CHECK POWER MODE E5h or 98h

DEVICE RESET 08h

DEVICE CONFIGURATION

DEVICE CONFIGURATION FREEZE LOCK B1h/C1h

DEVICE CONFIGURATION IDENTIFY B1h/C2h

DEVICE CONFIGURATION RESTORE B1h/C0h

DEVICE CONFIGURATION SET B1h/C3h

DOWNLOAD MICROCODE 92h

DATA SET MANAGEMENT 06h

EXECUTE DEVICE DIAGNOSTIC 90h

FLUSH CACHE E7h

FLUSH CACHE EXT EAh

IDENTIFY DEVICE ECh

IDLE E3h or 97h

IDLE IMMEDIATE E1h or 95h

INITIALIZE DEVICE PARAMETERS 91h

READ BUFFER E4h

READ DMA C8h

READ DMA EXT 25h

READ FPDMA QUEUED 60h

READ LOG EXT 2Fh

READ MULTIPLE C4h

READ MULTIPLE EXT 29h

READ NATIVE MAX ADDRESS F8h

READ NATIVE MAX ADDRESS EXT 27h

READ SECTOR(S) 20h

READ SECTOR(S) EXT 24h

READ VERIFY SECTOR(S) 40h

READ VERIFY SECTOR(S) EXT 42h

SECURITY DISABLE PASSWORD F6h

SECURITY ERASE PREPARE F3h

SECURITY ERASE UNIT F4h

SECURITY FREEZE LOCK F5h

SECURITY SET PASSWORD F1h

SECURITY UNLOCK F2h

SEEK 70h

SET FEATURES

Enable write cache EFh/02h

Disable write cache EFh/82h

Set transfer mode EFh/03h

Enable Power-Up In Standby Efh/06h

Disable Power-Up In Standby Efh/86h

Enable DMA Setup FIS Auto-Activate
optimization

Disable DMA Setup FIS Auto-Activate
optimization

Efh/10h/02h

Efh/90h/02h

Enable Device-initiated interface power
state transitions

Disable Device-initiated interface power
state transitions

SET MAX

SET MAX ADDRESS F9h/na

SET MAX FREEZE LOCK F9h/04h

SET MAX LOCK F9h/02h

SET MAX SET PASSWORD F9h/01h

SET MAX UNLOCK F9h/03h

SET MAX ADDRESS EXT 37h

SET MULTIPLE MODE C6h

SLEEP E6h or 99h

SMART

SMART DISABLE OPERATIONS B0h/D9h

SMART ENABLE OPERATIONS B0h/D8h

SMART ENABLE/DISABLE ATTRIBUTE
AUTOSAVE

SMART EXECUTE OFF-LINE IMMIDIATE B0h/D4h

SMART READ ATTRIBUTE THRESHOLDS B0h/D1h

SMART READ DATA B0h/D0h

SMART READ LOG B0h/D5h

SMART RETURN STATUS B0h/DAh

SMART SAVE ATTRIBUTE VALUES B0h/D3h

SMART WRITE LOG B0h/D6h

STANDBY E2h or 96h

STANDBY IMMEDIATE E0h or 94h

SOFT RESET FFh

WRITE BUFFER E8h

WRITE DMA CAh

WRITE DMA EXT 35h

WRITE FPDMA QUEUED 61h

WRITE LOG EXT 3Fh

WRITE MULTIPLE C5h

WRITE MULTIPLE EXT 39h

WRITE SECTOR(S) 30h

WRITE SECTOR(S) EXT 34h

Efh/10h/03h

Efh/90h/03h

B0h/D2h

Rev:1

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Product Specification: for 4TB, 8TB

i

1.2 SMART

1.2.1 SMART SUBCOMMAND SETS

In order to select a subcommand the host must write
the subcommand code to the device’s Features Register
before issuing the SMART Function Set command. The
subcommands are listed below.

Table 2. SMART Subcommand Sets

COMMAND COMMAND CODE (HEX)

SMART READ DATA D0h

SMART ENABLE/DISABLE ATTRIBUTE
AUTOSAVE

SMART EXECUTE OFF-LINE IMMIDIATE D4h

SMART READ LOG D5h

SMART WRITE LOG D6h

SMART ENABLE OPERATIONS D8h

SMART DISABLE OPERATIONS D9h

SMART RETURN STATUS DAh

D2h

1.2.2 SMART READ DATA (SUBCOMMAND D0H)

This subcommand returns the device’s Attribute Values to
the host. The Attribute Values consist of 512bytes.

Table 3. Device Attribute Data Structure

Table 4. Individual Attribute Data Structure

Table 5. Attribute ID Numbers

BYTE DESCRIPTION

0 Attribute ID Number

1~2 Flags

3 Current Value

4 Worst Value

5~10

11 Reserved

Attribute Value (FFFF FFFF
FFFFh)

BYTE DESCRIPTION

0~1 Data structure revision number (Vendor Specific)

2~361 1st - 30th Individual attribute data (Vendor Specific)

362 Off-line data collection status

363 Self-test execution status

364~365 Total time in seconds to complete off-line data

366 Vendor Specific

367 Off-line data collection capability

368-369 SMART capability

370 Error logging capability

371 Self-test failure check point (Vendor Specific)

372 Short self-test routine recommended polling time(in

373 Extended self-test routine recommended polling

374-510 Reserved

511 Data structure checksum

collection activity

7-1 Reserved
0 1=Device error logging supported

minutes)

time(in minutes)

Rev:1

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Product Specification: for 4TB, 8TB

Table 5. Attribute ID Numbers

ID (DEC) ID (HEX) ATRIBUTE NAME DESCRIPTION

1 01h Vendor-specific

9 09h Power-On Hours The time amount of power-on state (unit: hours)

12 0Ch Power Cycle Count Counts of full power on/off cycles

13 0Dh Vendor-specific

181 AFh Program Failure Block Count Counts the number of flash program failures

184 B8h Initial Bad Block Count The number of bad blocks which was detected

187 BBh Read Failure Block Count

(Uncorrectable)

190 BEh Temperature Current device temperature (unit: ˚C)

199 C7h SATA Error CRC Count The number of encountered SATA interface errors

200 C8h Total count of write commands The total number of written command during the

201 C9h Total count of read commands The total number of read command during the

202 CAh Vendor-specific

204 CCh Vendor-specific

209 D1h SSD Life Left

(Remaining Drive Life)

210 D2h Erase Count Indicates the minimum, average, maximum erased

00~23 : flash program failure count / 24~47 : flash
erase failure count

when firmware was installed

Uncorrectable read failure block count 00~23 :
read bad block count / 24~47 : potential read bad
block count

00~23 : CRC Error count / 24~47 : Handshake
Error Count

entire lifetime of the device

entire lifetime of the device

Indicates the approximate SSD life left [(maximum
PE cycle – average erase count) / maximum PE
cycle]

counts of all the blocks
00~15 : The minimum erased count
16~31 : The average erased count
32~47 : The maximum erased count

i

213 D5h 20h Returns maximum PE cycle counts of flash

225 E1h 24h

226 E2h 40h Flush command count 00~23 : self flush count /

227 E3h 42h

228 E4h F6h

229 E5h F3h

230 E6h F4h The current total free blocks count

241 F1h F5h

24~47 : host flush count

Rev:1

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Product Specification: for 4TB, 8TB

i

1.2.3 SMART EXECUTE OFF-LINE IMMEDIATELY
(SUBCOMMAND D4H)

This subcommand causes the device to start the off-line
process for the requested mode and operation. The LBA
Low register shall be set to specify the operation to be
executed.

Table 6. SMART Execute Off-line Immediately

LBA LOW DESCRIPTION

00h Execute SMART off-line data collection routine

immediately

01h Execute SMART Short self-test routine

immediately in off-line mode

02h Execute SMART Extended self-test routine

immediately in off-line mode

03h Reserved

04h Execute SMART Selective self-test routine

immediately in off-line mode

40h Reserved

7Fh Abort off-line mode self-test routine

81h Execute SMART short self-test routine

immediately in captive mode

82h Execute SMART Extended self-test routine

immediately in captive mode

84h Execute SMART selective self-test routine

immediately in captive mode

C0h Reserved

1.2.4 SMART READ LOG SECTOR
(SUBCOMMAND D5H)

This command returns the specified log sector content to
the host. LBA Low and Sector Count Registers shall be set
to specify the log sector and sector number to be written.

Table 7. SMART Read Log Sector

LOG SECTOR
ADDRESS

00h 1 Log directory Read Only

01h 1 SMART error log Read Only

02h 51 Comprehensive SMART

03h 37 Extended Comprehensive

06h 1 SMART self-test log Read Only

07h 1 Extended SMART

09h 1 Selective self-test log Read and Write

10h 1 NCQ Error log Read only

11h 1 SATA Phy event counter

80h-9Fh 32 Host vendor specific Read and Write

A0h 1 Reserved Vendor Specific

Table 8. SMART Log DirectoryTable

NO.
SECTOR

CONTENT

Read Only

error log

Read Only

SMART error log

Read Only

self-test log

Read only

log

OFF-LINE MODE

The device executes command completion before executing
the specified routine. During execution of the routine the
device will not set BSY nor clear DRDY. If the device is in
the process of performing its routine and is interrupted
by a new command from the host, the device will abort or
suspend its routine and service the host within two seconds
after receipt of the new command. After servicing the
interrupting command, the device will resume its routine
automatically or not start its routine depending on the
interrupting command.

CAPTIVE MODE

When executing self-test in captive mode, the device sets
BSY to one and executes the specified self-test routine
after receipt of the command. At the end of the routine,
the device sets the execution result in the Self-test
execution status byte (see Table 7-1: “Device Attribute Data
Structure” on page 23) and ATA registers and then executes
the command completion. See definitions below.

Status - Set ERR to one when the self-test has failed
Error - Set ABRT to one when the self-test has failed
LBA Low - Set to F4h when the self-test has failed
LBA High - Set to 2Ch when the self-test has failed

BYTE DESCRIPTION

0~1 SMART Logging Version (set to 01h)

2~3 Number of sectors in the log at log address 1

4~5 Number of sectors in the log at log address 2

…

510~511 Number of sectors in the log at log address 255

Table 9. Self-test log structureTable 5.

BYTE DESCRIPTION

0~1 Data structure revision

n*24+2 Self-test number

n*24+3 Self-test execution status

n*24+4~n*24+5 Life timestamp

n*24+6 Self-test failure check point

n*24+7~n*24+10 LBA of first failure

n*24+11~n*24+25 Vendor specific

….. …..

506~507 Vendor specific

508 Self-test log pointer

509~510 Reserved

511 Data structure checksum

N is 0 through 20
The data structure contains the descriptor of the Self-test that the device has performed. Each descriptor

is 24 bytes long and the self-test data structure is capable to contain up to 21 descriptors. After 21
descriptors have been recorded, the oldest descriptor will be overwritten with the new descriptor. The
self-test log pointer points to the most recent descriptor. When there is no descriptor, the value is 0.
When there are descriptor(s), the value is 1 through 21.

Rev:1

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Product Specification: for 4TB, 8TB

i

Table 10. Selective self-test log structure

BYTE CONTENT REMARKS

0-1 Data structure revision Read and Write

2-9 Starting LBA for test span 1 Read and Write

10-17 Ending LBA for test span 1 Read and Write

18-25 Starting LBA for test span 2 Read and Write

26-33 Ending LBA for test span 2 Read and Write

34-41 Starting LBA for test span 3 Read and Write

42-49 Ending LBA for test span 3 Read and Write

50-57 Starting LBA for test span 4 Read and Write

58-65 Ending LBA for test span 4+ Read and Write

66-73 Starting LBA for test span 5 Read and Write

74-81 Ending LBA for test span 5 Read and Write

82-337 Reserved Reserved

338-491 Vendor specific Vendor specific

492-499 Current LBA under test Read

500-501 Current span under test Read

502-503 Feature flags R/W Read and Write

504-507 Vendor Specific Vendor specific

508-509 Selective self test pending time Read and Write

510 Reserved Reserved

511 Data structure checksum Read and Write

1.2.5 SMART WRITE LOG SECTOR
(SUBCOMMAND D6H)

This command writes 512 bytes of data to the specified log
sector. LBA Low and Sector Count registers shall be set to
specify the log address and sector number to be written.

1.2.7 SMART DISABLE OPERATIONS
(SUBCOMMAND D9H)

This subcommand disables all SMART capabilities. After
receipt of this subcommand the device disables all SMART
operations. Non self-preserved Attribute Values will no
longer be monitored. The state of SMART - either enabled
or disabled - is preserved by the device across power cycles.
Note that this subcommand does not preclude the device’s
power mode attribute auto saving.

After receipt of the SMART Disable Operations subcommand
from the host, all other SMART subcommands except SMART
Enable Operations are disabled and will be aborted by the
device returning the error code as specified in “SMART
Error Codes”.

Any Attribute Values accumulated and saved to volatile
memory prior to receipt of the SMART Disable Operations
command will be preserved in the device’s Attribute Data
Sectors. If the device is re-enabled, these Attribute Values
will be updated, as needed, upon receipt of a SMART
Read Attribute Values or a SMART Save Attribute Values
command.

1.2.8 SMART RETURN STATUS
(SUBCOMMAND DAH)

This subcommand is used to communicate the reliability
status of the device to the host’s request. Upon receipt of
the SMART Return Status subcommand the device saves
any updated Attribute Values to the reserved sector, and
compares the updated Attribute Values to the Attribute
Thresholds.

1.2.6 SMART ENABLE OPERATIONS
(SUBCOMMAND D8H)

This subcommand enables access to all SMART capabilities.
Prior to receipt of a SMART Enable Operations
subcommand, Attribute Values are neither monitored nor
saved by the device. The state of SMART—either enabled
or disabled—will be preserved by the device across power
cycles. Once enabled, the receipt of subsequent SMART
Enable Operations subcommands will not affect any of the
Attribute Values.

Rev:1

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Product Specification: for 4TB, 8TB

1.3 IDENTIFY DEVICE COMMAND DATA

Table 11. Returned Sector Data

F=FIXED

WORD

0 X 0040h General configuration bit-significant information

1 X 3FFFh Obsolete - Number of logical cylinders (16,383)

2 V C837h Specific configuration

3 X 0010h Obsolete - Number of logical heads (16)

4-5 X 0h Retired

6 X 003Fh Obsolete - Number of logical sectors per logical track (63)

7-8 V 0h Reserved for assignment by the CompactFlash* Association (CFA)

9 X 0h Retired

10-19 F varies Serial number (20 ASCII characters)

20-21 X 0h Retired

22 X 0000h Obsolete

23-26 F varies Firmware revision (8 ASCII characters)

27-46 F varies Model number

47 F 8001h Maximum number of sectors transferred per interrupt on multiple

48 F 4000h Trusted Computing Feature Set

49

50 F 4000h Capabilities

51-52 X 0h Obsolete

53 F 0007h Words 88 and 70:64 valid

54 X 3FFFh Obsolete - Number of logical cylinders (16,383)

55 X 0010h Obsolete - Number of logical heads (16)

56 X 003Fh Obsolete - Number of logical sectors per logical track (63)

57-58 X 0h Obsolete

59 F 0101 h Number of sectors transferred per interrupt on multiple commands

60-62 V varies Total number of user-addressable sector

63 X 0407h Multi-word DMA modes supported/selected

64 F 0003h PIO modes supported

65 F 0078h Minimum multiword DMA transfer cycle time per word

66 F 0078h Manufacturer’s recommended multiword DMA transfer cycle time

67 F 0078h Minimum PIO transfer cycle time without flow control

68 F 0078h Minimum PIO transfer cycle time with IORDY flow control

69 F 4020h Additional Supported

70 F 0000h Reserved

71-74 F 0h Reserved for IDENTIFY PACKET DEVICE command

75 F 001Fh Queue depth

76 F 050Eh Serial ATA capabilities

77 F 0006h Reserved for future Serial ATA definition

78 F 0044h Serial ATA features supported

79 V 0044h Serial ATA features enabled

80 F 01E0h Major version number

V=VARIABLE
X=BOTH

F

ATRIBUTE NAME DESCRIPTION

commands

2F00h Capabilities

i

NOTES:

F = Fixed. The content of the word is fixed and does not change. For removable media devices, these values may change when media is removed or changed.

V = Variable. The state of at least one bit in a word is variable and may change depending on the state of the device or the commands executed by the device.

X = F or V. The content of the word may be fixed or variable.

Rev:1

i

Product Specification: for 4TB, 8TB

F=FIXED

WORD

81 F 0000h Minor version number

82 F 346Bh Command set supported

83 F 7D01h Command sets supported

84 F 4122h Command set/feature supported extension

85 V 3469h Command set/feature enabled

86 V 3C01h Command set/feature enabled

87 V 4122h Command set/feature default

88 V 007Fh Ultra DMA Modes

89 F 0004h Time required for security erase unit completion

90 F 0004h Time required for enhanced security erase completion

91 V 0000h Current advanced power management value

92 V FFFEh Master Password Revision Code

93 X 0000h Hardware reset result: the contents of bits (12:0) of this word shall

94 V 0000h Vendor’s recommended and actual acoustic management value

95 F 0000h Stream minimum request size

96 V 0000h Streaming transfer time - DMA

97 V 0000h Streaming access latency - DMA and PIO

98-99 F 0000h Streaming performance granularity

100-103 V Varies Maximum user LBA for 48-bit address feature set

104 V 0000h Streaming transfer time - PIO

105 V 0001h Maximum number of 512-byte blocks of LBA Range Entries per

106 F 4000h Physical sector size / logical sector size

107 F 0000h Inter-seek delay for ISO-7779 acoustic testing in microseconds

108-111 F varies Unique ID

112-115 F 0h Reserved for world wide name extension to 128 bits

116 V 0000h Reserved for technical report

117-118 F 0h Words per logical sector

119 F 0000h Supported settings

120 F 0000h Command set/feature enabled/supported

121-126 F 0h Reserved

127 X 0000h Removable Media Status Notification feature set support

128 V 0001h Security status

129 V 0000h Vendor-specific

130-159 X 0h Vendor-specific

160 X 0000h CompactFlash Association (CFA) power mode 1

161-167 X 0h Reserved for assignment by the CFA

168 X 0003h Reserved for assignment by the CFA

169 X 0001h Data set management Trim attribute support

170-175 F 0h Reserved for assignment by the CFA

176-205 X 0h Current media serial number

206 X 0000h SCT Command Transport

207-208 F 0h Reserved

209 X 4000h Alignment of logical blocks within a physical block

V=VARIABLE
X=BOTH

ATRIBUTE NAME DESCRIPTION

change only during the execution of a hardware reset

DATASET MANAGEMENT command

i

NOTES:

F = Fixed. The content of the word is fixed and does not change. For removable media devices, these values may change when media is removed or changed.

V = Variable. The state of at least one bit in a word is variable and may change depending on the state of the device or the commands executed by the device.

X = F or V. The content of the word may be fixed or variable.

Rev:1

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Product Specification: for 4TB, 8TB

F=FIXED

WORD

210-211 V 0h Write-Read-Verify Sector Count Mode 3 (DWord)

212-213 F 0h Write-Read-Verify Sector Count Mode 2 (DWord)

214 X 0000h NV Cache Capabilities

215-216 V 0h NV Cache Size in Logical Blocks (DWord)

217 F 0001h Nominal media rotation rate

218 V 0000h Reserved

219 F 0000h NV Cache Options

220 V 0000h Write-Read-Verify feature set

221 X 0000h Reserved

222 F 103Fh Transport major version number

223 F 0000h Transport minor version number

224-229 F 0h Reserved

230-233 X 0h Extended Number of User Addressable Sectors (QWord)

234 F 0000h Minimum number of 512-byte data blocks per DOWNLOAD

235 F 0000h Maximum number of 512-byte data blocks per DOWNLOAD

236-254 X 0h Reserved

255 V varies Integrity word

V=VARIABLE
X=BOTH

ATRIBUTE NAME DESCRIPTION

MICROCODE command for mode 03h

MICROCODE command for mode 03h

i

NOTES:

F = Fixed. The content of the word is fixed and does not change. For removable media devices, these values may change when media is removed or changed.

V = Variable. The state of at least one bit in a word is variable and may change depending on the state of the device or the commands executed by the device.

X = F or V. The content of the word may be fixed or variable.

Rev:1