Programmable dual channel linear Hall sensor with fast SPC
interface
Features
•Two highly accurate redundant Hall measurement channels (main and sub)
integrated on one chip.
•Developed compliant to ISO 26262 (first edition 2011) Safety Element out of
Context for safety requirements rated up to ASIL D.
•High diagnostic coverage by plausibility checking of main and sub signal on
system level.
•Fast digital SPC interface with min. 0.5µs unit time for transmission of main
and sub signals in less than 500 µs.
•Bus-capability for up to 4 sensor ICs on one data line.
•Selectable 12/14/16bit output signals, protected by CRC and rolling counter.
•Thin 8-pin SMD single sensor package.
•Operating automotive temperature range -40°C to 125°C.
•Digital temperature and stress compensation.
•Reverse-polarity and over voltage protection for VDD, GND and OUT pins.
•Main and sub channel programmable independently in EEPROM.
•Multipoint calibration up to 9 points.
•Frameholder mechanism.
•Single-wire SICI programming interface on output pin.
•2 x 16 bit user-configurable ID in EEPROM.
PRO-SIL™ Features
•Safety Manual and Safety Analysis Summary Report.
Potential applications
•Robust replacement of potentiometers: No mechanical abrasion, resistant to humidity, temperature,
pollution, and vibration.
•Linear and angular position sensing in automotive and industrial applications with highest accuracy
requirements.
•Suited for safety applications such as pedal position, throttle position, and steering torque sensing.
TLE4999C8
Programmable dual channel linear Hall sensor with fast SPC interface
Product validation
Qualified for automotive applications. Product validation according to AEC-Q100.
Description
The TLE4999C8 is a dual channel linear Hall sensor with a bus-capable digital Short-PWM-Code (SPC)
interface. Both channels are integrated on one die in the chip.
The highly accurate measurement channels (main and sub) can be used for a plausibility check on system
level. This enables a high diagnostic coverage.
The sensor is developed in compliance to ISO 26262 (first edition 2011), supporting safety requirements on
system level rated up to ASIL D.
Highest accuracy over a wide temperature range and lifetime is achieved by an integrated digital
temperature- and stress-compensation.
Table 1 Ordering Information
Product NameMarkingOrdering CodePackage
TLE4999C899CSP002662500single sensor, PG-TDSO-8-1
Data Sheet2v01_00
2020-11-02
TLE4999C8
Programmable dual channel linear Hall sensor with fast SPC interface
Programmable dual channel linear Hall sensor with fast SPC interface
Block diagram
1Block diagram
Figure 1 Block diagram
Data Sheet4v01_00
2020-11-02
Main
Hall
Sub
Hall
Main Channel
Sub Channel
SPC
Pin 4 - OU T
Pin 3 - GN D
Pin 2 - VDD
TLE4999 C8
TLE4999C
TLE4999C8
Pin 1 - C BU F
A0.2
B0.2
Center of sensitive area
1
2
34
8
7
65
0.90
0.96
Main/Sub
Hall Probes
TLE4999C8
Programmable dual channel linear Hall sensor with fast SPC interface
Pin and package configuration
2Pin and package configuration
Figure 2 shows the arrangement of the measurement channels of the TLE4999C8. The location of the Hall
probes in the package and the pin configuration of the TLE4999C8 are shown in Figure 3.
Figure 2 TLE4999C8 Package configuration
Table 2 TLE4999C8 Pin definitions and functions
Pin No.SymbolTLE4999C8 Function
1CBUFBuffer capacitor pin
1)
2VDDSupply voltage
3GND Ground
4OUTSPC output / programming interface I/O
5NCNot connected
6NCNot connected
7NCNot connected
8NCNot connected
1) In case CBUF capacitor is not used, CBUF pin shall be left floating
Figure 3 Pin Configuration of TLE4999C8 package
Data Sheet5v01_00
2020-11-02
TLE4999C8
Programmable dual channel linear Hall sensor with fast SPC interface
General
3General
3.1Functional description
The TLE4999C8 is a dual channel linear Hall sensor designed to meet the requirements of applications with
highly accurate and reliable magnetic field measurement. The sensor provides a digital SPC (Short PWM Code)
protocol on the OUT pin that is based on the SENT (Single Edge Nibble Transmission) standard. Configuration
parameters can be programmed after assembly of the sensor in a module in an end-of-line calibration
procedure using the serial inspection and configuration interface (SICI).
The two measurement channels have separate analog supply domains controlled by the main and sub analog
regulators. These regulators feed separate biasing units for the main and sub Hall sensor elements.
A multiplexed second analog-digital converter (Sub HTS-ADC) is used to convert analog signals from the main
and sub temperature sensors, and the sub Hall probe. The sub Hall, the temperature and the stress signals are
fed into the second digital signal processing unit (DSP2).
The DSP2 uses the signals from all stress and temperature sensing elements for plausibility and range checks
to ensure the integrity of the sensing elements and the analog signal path.
The analog signal of the main Hall probe is fed into an analog-digital converter (Main HADC), and is then
processed in a digital signal processing unit (DSP1).
Each DSP uses its corresponding Hall signal, together with compensation parameters stored in the EEPROM,
to calculate a Hall measurement value that is compensated for stress and temperature effects.
A high speed SPC protocol is generated containing the data of the two DSPs in the SPC protocol encoder and
transmitted after a SPC trigger pulse.
Data Sheet6v01_00
2020-11-02
TLE4999C
GND
SP C
µC
V
DD
GND
V
µC
V
DD_1
CS
Out
CL
V
pu ll- up_2
Rp
CBuf
TLE4999C
GND
SP C
CS
Out
CL
CBuf
V
DD
CBuf
V
DD
CBuf
V
DD_2
Rp
V
pu ll- up_1
Unit Time
0.5 - 1 µs
1.05 - 2 µs 2.05 - 3 µs
CL1 nF2.2 nF3.9 nF
CS
CBuf
Pull-up
resistor
min.typ.max.
Rp
1.45 kΩ
2.2 kΩ10 kΩ
Voltages min.typ.max.
V
DD
4.5V-5.5V
V
pull-up
3.0V-5.5V
100 nF
68 nF
TLE4999C8
Programmable dual channel linear Hall sensor with fast SPC interface
Application circuit
4Application circuit
Figure 4 shows the recommended application circuit for two TLE4999C8 sensors.
Figure 4 Application circuit
Attention: The system integrator shall take in consideration that the maximum value of CL shall include
also the capacitance of the bus line.
Note:For improved EMC capability the usage of a twisted cable is recommended.
Data Sheet7v01_00
2020-11-02
TLE4999C8
Programmable dual channel linear Hall sensor with fast SPC interface
Maximum ratings
5Maximum ratings
All specifications are valid over the full temperature range and over lifetime. They refer to each of the
implemented sensors IC’s, unless otherwise noted.
Table 3 Absolute maximum ratings
ParameterSymbolLimit ValuesUnitNotes
Min.
Max.
Junction temperatureT
Non-operating temperatureT
Maximum supply voltageV
Maximum voltage on OUTV
Maximum voltage on C
Buf
Maximum voltage between 2
V
V
J
NO
DD
OUT
Cbuf
Diff
pins
Voltage peaksVDD, V
OUT short circuit current
Supply current in over voltage I
Supply current in reverse
2)
I
OUT
DD, ov
I
DD, rev
voltage
OUT
-40140°Cmax. 1000h at 140°C1) (not
additive)
-40125°Cmax. 1400h (not additive)
1)
-2020Vmax. 24 h for -40°C to 30°C T
max. 10 min. for 30°C to 80°C T
max. 30 s for 80°C to 125°C T
max. 15 s above 125°C T
J
-1819.5Vmax. 40 h (not additive)
-0.320Vmax. 24 h for -40°C to 30°C T
max. 10 min. for 30°C to 80°C T
max. 30 s for 80°C to 125°C T
max. 15 s above 125°C T
J
-2020Vmax. 24 h for -40°C to 30°C T
max. 10 min. for 30°C to 80°C T
max. 30 s for 80°C to 125°C T
max. 15 s above 125°C T
J
–30Vfor max. 50 µs
-130130mAmax. 1 h
45mAtime limitation for VDD applies
-75–mAtime limitation for VDD applies
J
J
J
J
J
J
J
J
J
Magnetic flux densityB
ESD ImmunityV
1) Maximum exposure time at other junction temperatures shall be calculated using the Arrhenius-model.
2) Short to VDD or GND.
3) Human Body Model (HBM) according to ANSI/ESDA/JEDEC JS-001.
4) Charged Device Model (CDM) according to ANSI/ESDA/JEDEC JS-002.
max
HBM
V
CDM
–1000mT
-4+4kVHuman Body Model
3)
-0.75+0.75kVCharged Device Model
4)
Note: Any stress exceeding the values listed in Table 3 may cause permanent damage to the device. The
values given are stress ratings only and functional operation of the device at these conditions is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect device
reliability.
Data Sheet8v01_00
2020-11-02
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