Infineon TLE4997 User Manual

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Page 1

TLE4997

Configuration and Calibration of Linear Hall Sensor

User’s Manual

v01_01, 2019-08

Sense & Control

Page 2

Edition 2019-08

Published by Infineon Technologies AG 81726 Munich, Germany

Legal Disclaimer

The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party.

Information

For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com).

Warnings

Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office.

Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.

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TLE4997

User’s Manual

Table of Contents

Table of Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3

1Scope . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4

2 TLE4997 Signal Processing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4

3 TLE4997 Programming . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

3.1 Programmer Connection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

3.2 Programming Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6

3.2.1 Communication Scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6

3.3 Command Frame . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7

3.3.1 Data Frame . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

3.3.2 Interface Specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

3.4 Register Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11

3.5 EEPROM Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13

3.6 Programming Flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14

3.6.1 Setting the TEST register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16

3.6.2 Readout of the EEPROM Content . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16

3.6.3 Setting the EEPROM Content . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16

3.6.4 Calculation of Bits to Erase . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16

3.6.5 Calculation of Bits to Write . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16

3.6.6 Margin Voltage Check . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17

3.6.7 DATA access example . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17

3.6.8 Temporary overwrite of EEPROM data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18

3.6.9 DAC setup example . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19

4 Configuration & Calibration Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20

4.1 Magnetic Field Range - R . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20

4.2 Gain Setting - G . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20

4.3 Offset Setting - OS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20

4.4 Low-Pass Filter - LP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21

4.5 DAC Input Interpolation Filter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22

4.6 Clamping - CH, CL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23

4.7 Temperature Compensation - TL, TQ & TT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24

5 Calibration of TLE4997 Temperature Compensation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25

5.1 Integrated Temperature Polynomial . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25

5.2 Application Sensitivity Polynomial . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25

5.3 Determination of Sensitivity Polynomial from Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27

5.4 Calculation of Final Temperature Compensation Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28

5.4.1 Algorithm for Finding the Optimum Temperature Coefficient Set . . . . . . . . . . . . . . . . . . . . . . . . . . 28

5.4.2 Example Implementation Code for Temperature Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29

5.5 Usage of Infineon’s Temperature Calibration Tool . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32

6 Calibration of TLE4997 Output Characteristic . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34

6.1 Two-Point Calibration Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34

6.2 Two-Point Calibration Examples . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35

6.2.1 Calibration with Application Readout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35

6.2.2 Calibration without Application Readout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36

User’s Manual 3 v01_01, 2019-08

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TLE4997

Stored in

EEPROM

Memory

Hall

Sensor

Limiter

(Clamp)

Out

Range LP

Offset

Gain

Clamping Low

Clamping High

TADC TCAL

Temperature

Sensor

Norm-

alize

T-Polynomial

HADC

HCAL

VOUT

VDAC

User’s Manual

Scope

1Scope

This document is valid for all TLE4997 variants and derivates. It gives a detailed description of the configuration and calibration procedure, which is recommended to configure the TLE4997 for optimum accuracy in a sensing application.

2 TLE4997 Signal Processing

The TLE4997 uses a fully digital signal processing concept. Analog values from the Hall probe are directly converted to raw digital signals by the Hall ADC and then compensated and processed in the digital signal processing unit (DSP) using configuration parameters stored in the EEPROM and the temperature data acquired by an integrated temperature sensor. A configurable second-order temperature polynomial is implemented to compensate the thermal reduction of the remanent magnetic flux of a permanent magnet used in a position sensing application. Additionally, an application-specific output characteristic can be set by configuring the EEPROM parameters of Gain and Offset.

Figure 2-1 Signal Flow Diagram of the TLE4997

Figure 2-1 shows the signal flow diagram for temperature compensation and output characteristic in the DSP, and

the influence of the relevant configuration parameters stored in the EEPROM. The Hall signal is processed in the following sequence of steps:

1. The analog Hall signal is converted by the Hall ADC, which operates at the configured magnetic range setting.

2. The digital value is filtered by a digital low-pass filter, which operates at a configurable filter frequency given by the “LP filter”-setting. The output of the filter is stored in the HADC register.

3. The HADC value is multiplied by the temperature compensation polynomial and stored in the HCAL register. The first order (TL) and second order (TQ) coefficients of the polynomial are configurable. The third order coefficient (TT) is fixed.

4. The HCAL value is multiplied by the configured gain value.

5. The configured offset value is added to the HCAL value.

6. The digital Hall value is clamped according to the configured upper and lower clamping limits. The output value of the clamping stage is converted from digital to analog.

7. An output voltage is transmitted on the OUT pin and is proportional to the supply voltage (ratiometric DAC).

User’s Manual 4 v01_01, 2019-08

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TLE4997

optional

VDD

I/O 1

I/O2

GND

47nF

PROGRAMMER

TLE

4997x

out

GND

TLE

4997x

out

GND

application module

User’s Manual

TLE4997 Programming

3 TLE4997 Programming

3.1 Programmer Connection

Figure 3-1 shows the connection of the TLE4997 to a programmer. The pins VDD and OUT of the sensor IC are

used for the digital programming interface as described in Table 3-1 (See datasheet of corresponding TLE4997 type for pinout).

Figure 3-1 Connection of TLE4997 to Programmer

Table 3-1 Pin Functions for Programming Interface

Pin Programming Function

VDD Programming interface clock

GND Ground

OUT Programming interface data I/O

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TLE4997

VDD

Vout

LSB MSB

duri ng first transmission , the output stage is stil l switch ed on

power up

interface activated

internal buffer on

VDD

Vout

LSB MSB

during transmission the buffer is switched off internal buffer on

interface

active

interface

active

protocol

output

leading driver

off pulse

protocol

output

User’s Manual

TLE4997 Programming

3.2 Programming Interface

3.2.1 Communication Scheme

The digital programming interface uses specific frames, which can have one of the two following functions:

• Command frames contain a specific task (e.g. read/write data, select EEPROM programming etc.) and a corresponding address

• Data frames contain a 16 bit data value sent to or received from the device - these frames can only follow a proper command frame for reading or writing data

A valid frame has the following properties:

• A frame consists of 21 bits in total

• A bit is shifted in or out via the output line with a rising clock edge on the supply line

• A frame always starts and ends with a '1' (frame bits)

• The LSB of a frame transmitted to the sensor is shifted in first

• The LSB of a frame replied by the sensor is shifted out first

• The whole frame sent to the device, including frame bits, is protected with an even positional and an odd positional parity bit

The first frame sent has to be a valid command to activate the interface mode and it has to be sent within 19ms after power up. As an additional protection, the device does not deactivate its output stage during this transmission (using 21 clock pulses) as shown in Figure 3-2. This means that the interface driver of the programmer needs to overrule the open drain output stage of the sensor during this initial transmission.

Figure 3-2 First Frame Transmission to the Sensor

Attention: Overruling Vout requires a strong driver on the programmer, since the OUT line must be driven

to low levels close to GND for any “0”-bit and close to VDD for any “1”-bit in order to ensure a proper communication with the sensor.

After the first frame, to avoid additional power consumption in the output stage of the device, the internal driver is deactivated in programming mode while the sensor is receiving a frame. It is activated again after completion of the transmission. This is illustrated in Figure 3-3.

Figure 3-3 Further Frame Transmisson from the Programmer to the Sensor (Write Access)

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TLE4997

VDD

Vout

LSB

MSB

digital data readout, buffer in I/O mode

inte rnal buffer o n internal buffer on

tailing driver on

pulse

1 1

POP

0 0 ADDR (6bit) 1 0 CMD (6bit) 1

MSB (bit 20) LSB (bit 0)

User’s Manual

TLE4997 Programming

In case of a wrong command or data frame, the interface is immediately locked and the device falls back to its normal application mode. The read access to the device is triggered by clock pulses on the supply line as shown in Figure 3-4. The timing of read and write accesses is described in Chapter 3.3.2.

Figure 3-4 Frame Transmisson from the Sensor to the Programmer (Read Access)

3.3 Command Frame

The structure of a command frame is shown in Figure 3-5. Available commands are given in Table 3-2. The parity bits PE (bit 17) and PO (bit 18) have to be set in the follwing way (bit 0 is the LSB, bit 20 is the MSB):

bit0 XOR bit2 XOR bit4 XOR …. XOR bit20 = 0

bit1 XOR bit3 XOR bit5 XOR …. XOR bit19 = 0

Figure 3-5 Command Frame Structure

Table 3-2 List of Available Commands

Command Bits (MSB...LSB) Function

000000 Leave programming mode

000001 Single data readout from given address without increment (sensor

response: one data frame)

000011 Data readout from given address with increment (readout finishes

when address “xxx111

” is reached)

001001 Single data write to given address without increment (followed by

one data frame)

001011 Data write to given address with increment (followed by multiple data

frames; finishes at address “xxx111

command frame)

1) not to be followed by any data frame

2) followed by application of a programming pulse

3) followed by application of a margin voltage level before the last clock pulse falling edge

001100 Enable EEPROM write mode (programs “1”-bits)

001101 Enable EEPROM erase mode (programs “0”-bits)

001110 Enable EEPROM margin check mode (programs level check)

001111 EEPROM refresh (update EEPROM registers)

” or by sending another

1)2)

1)3)

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TLE4997

1 0

POP

DATA (16bit) 1

MSB (bit 20) LSB (bit 0)

1 ADR (3 LSBs) DATA (16bit) 1

MSB (bit 20) LSB (bit 0)

User’s Manual

TLE4997 Programming

3.3.1 Data Frame

The structure of a data frame sent to the device is shown in Figure 3-6. The parity bits PE (bit 17) and PO (bit 18) have to be set in the same way as for the command frame (bit 0 is the LSB, bit 20 is the MSB):

bit0 XOR bit2 XOR bit4 XOR …. XOR bit20 = 0

bit1 XOR bit3 XOR bit5 XOR …. XOR bit19 = 0

Figure 3-6 Data Frame to Sensor

Figure 3-7 shows a the structure data frame received from the sensor. Instead of a zero bit followed by two parity

bits, the least significant 3 bits of the address used for the readout are transmitted together with the data. This is to check the plausibility of the received data.

Figure 3-7 Data Frame from Sensor

3.3.2 Interface Specification

Table 3-3 specifies the operating conditions of the programming interface, which must be met in order to ensure

correct operation of the TLE4997 during programming. All specified parameters refer to these operating conditions, unless otherwise noted.

Table 3-3 Operating Range of the Programming Interface

Parameter Symbol Values Unit Note / Test Condition

Min. Typ. Max.

Supply voltage V

Supply buffer capacitance C

Load capacitance C

Ambient temperature T

Number of programming

PRG

cycles

Programming time

Programming start time

1) >47nF soldered to the device required in case that connectivity failures can influence the programming voltage.

PRG

PRG_START

4.5 – 5.5 V –

47 – 1000 nF VDD to GND

0.0

– 210 nF OUT to GND

10 – 60 °C during programming

10 Cycles Programming is allowed only at

start of lifetime

– 100 – ms For complete memory

– – 19 ms To start programming mode, a

first read command shall be sent within this time window after power-up

The specification for timings and electrical levels of the programming interface is shown in Table 3-4. The meaning of the timing parameters is illustrated in Figure 3-8.

User’s Manual 8 v01_01, 2019-08

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TLE4997

VDD

Vout

LSB MSB

tsut

hldt

del

hlm

LSB

set t

set

min

init

fram e

data read

frame

User’s Manual

TLE4997 Programming

Figure 3-8 Frame Timing

Table 3-4 Electrical and Timing Specification of the Programming Interface

Parameter Symbol Values Unit Note / Test Condition

Min. Typ. Max.

clock high level V

DD,CLKHI

8.8 9.4 10 V specification of VDD operating range does not apply to clock

clock low level V

OUT data out high level V

OUT data out low level V

OUT data in high level V

OUT data in low level V

OUT data input current I

VDD clock high time t

clock low time t

Data in setup time t

Data in hold time t

Data out settling time t

Time between frames t

Buffer off delay t

Buffer on delay t

DD,CLKLOW

O,OHIGH

O,OLOW

O,IHIGH

O,ILOW

HLD

SET

MIN

DEL

HLM

1) capacity of external driver, especially during initial interface access (to overwrite ratiometric device output).

2) to reduce collisions with the ext. driver, it must be switched on slower than t charge/discharge behaviour on V

OUT

3) to reach again a valid and stable ratiometric V

4.8 5 5.2 V

VDD - 2 – V

DD,CLKHI

V OUT follows V

0–2.0 V

3.0 V

VDD + 0.1 V

-0.2 0.0 0.1 V

-50 – 50 mA

2.4 50 100 µs 5k...250kBit/s

1.6 4.0 100 µs 5k...250kBit/s

1.5 2.0 – µs to rising V

2.3 3.0 – µs after rising V

– 1.0 1.7 µs after rising V

10.0 – – µs

10.0 25.0 – µs

– 5.0 10.0 µs

depends also on capacitive output load.

signal state, please check the power-on time in the data sheet.

OUT

DEL

2)3)

min. and switched off faster than t

if ‘high’

HLM max.

;

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TLE4997

VDD

Vout

MSB

HLD

LSB

MIN

next command

frame

MIN

erase or write command frame

(buffer stays off)

prog

puls e

O,PROG

(rise)

O,PROG

(fall)

PROG,WR

or t

PROG,ER

HLD

VDD

Vout

MSB LSB

MARG

next command

frame

min

margin

command frame

(buff er sta ys off)

Vdd/t (fall)

hld

apply V

O,MARG

and

capture EEPROM data

min

User’s Manual

TLE4997 Programming

In order to permanently store a programmed parameter set to the EEPROM, the “EEPROM erase” and “EEPROM write” commands shall be sent, followed by a programming pulse. Figure 3-9 shows the timing of the programming pulse.

Figure 3-9 Programming Pulse Timing

After programming, a margin check is necessary to test the stability of the programmed data. The margin check is initiated by an “EEPROM margin check” command followed by a margin voltage.

Figure 3-10 Margin Check Timing

The margin voltage is varied during subsequent steps within the threshold margin level range. A too low margin voltage value indicates a too short programming pulse duration or a too low programming voltage. A too high margin voltage value indicates a too long programming pulse duration or a too high programming voltage.

Table 3-5 gives the electrical and timing specifications of the programming pulse and the margin voltage check

procedure.

Table 3-5 Electrical and Timing Specification of the Programming Pulse and Margin Voltage

Parameter Symbol Values Unit Note / Test Condition

OUT data input current I

OUT margin level V

Threshold margin level V

Margin setup time t

OUT program level V

User’s Manual 10 v01_01, 2019-08

Min. Typ. Max.

O,MARG

MARG

slope for margin VDD/t 5 10 150 V/µs

O,PROG

0 – 20 mA during application of

-0.1 – 7 V

2.23 – 4.5

0.4

200 – – µs

19.2 19.3 19.4 V

V V

programming pulse or margin voltage

check “1” check “0”

Page 11

TLE4997

User’s Manual

TLE4997 Programming

Table 3-5 Electrical and Timing Specification of the Programming Pulse and Margin Voltage (cont’d)

Parameter Symbol Values Unit Note / Test Condition

Min. Typ. Max.

OUT program slope

(rise)

OUT program slope

(fall)

OUT write time t

OUT erase time t

1) faster slope may lead to permanent damage of the EEPROM.

O,PROG

PROG,WR

PROG,ER

/t – – 2 V/µs time to reach V

O,PROG

shall not

exceed 50 µs

/t -10 – – V/µs time to reach 1v max. shall not

exceed 50 µs

9.9 10.0 10.1 ms

79.2 80.0 80.8 ms

3.4 Register Map

Table 3-6 shows the internal registers of the TLE4997 (compare also Figure 2-1).

Table 3-6 TLE4997 Register Map

Address Symbol Function R/W

...19

HCAL Calibrated Hall value read only

TCAL Calibrated temperature value, including reference temperature T0read only

VDAC Calculated DAC value, incl. clampling read only

HADC Uncalibrated Hall ADC value read only

TADC Uncalibrated temperature ADC value read only

STATUS Status register read only

EEPROM EEPROM registers (see Chapter 3.5) read/write

DAC_SET Direct setup of DAC value read/write

TEST Test mode register read/write

Note: To access the registers (except STATUS, HADC, TADC, VADC, DAC_SET and TEST), the digital signal

processing unit (DSPU) has to be disabled first via the TEST register.

HCAL

This register contains the temperature compensated magnetic measurement as a 16bit signed value. This value is in the range of +/- 30000.

TCAL

This register contains a 16 bit signed value and delivers the current junction temperature of the device. The junction temperature in °C is calculated from the register value by: T

= (TCAL/16+48) [°C].

VDAC

This register contains a 12 bit unsigned decimal result applied to the internal DAC for the ratiometric output stage. The value range is from 0 to 4095 and corresponds to 0% to 100% of V

HADC

This register contains a 16bit signed value that corresponds to the raw Hall cell measurement value. This value is in the range of +/- 20000.

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TLE4997

15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0

LSB

ROMSIG4

perr_more

LOCKED

perr_adr0

CRC ok

perr_adr1

perr_adr2

perr_adr3

HWver0

ROMSIG3

ROMSIG2

ROMSIG1

ROMSIG0

HWver1

HWver2

perr_col

15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0

LSB

FEC off

DAC test

DSP stop

REF off

DSP off

MSB

User’s Manual

TLE4997 Programming

TADC

This register contains a 15bit unsigned raw temperature value.

STATUS

The content of the status register is shown in Figure 3-11.

Figure 3-11 Status Register

• CRC ok has to be “1”, otherwise the DSP built-in self-test was failed and the device is defective

• LOCKED must be ’0’ as long as the lockbits are not programmed. After setting the lockbits the lock can be verified by refreshing the EEPROM content and checking this bit before the supply of the device is removed or the interface is closed.

• perr_adr has to be on address F

(“1111B”), otherwise it shows the first EEPROM address where the internal

parity check failed.

• perr_more must be “0”, otherwise more than one EEPROM address has a parity error.

• perr_col must be “0”, otherwise one or more EEPROM columns have a parity error.

• HWver contains the actual silicon revision starting with 0 (=”000”). The latest version from 8’ manufacturing line is version 3 (=”011”, availability from mid 2006 and released for productive use).

• ROMSIG has to be 1F

, otherwise the DSP ROM is not valid and the device is defective.

DAC_SET

This register contains a 12 bit unsigned decimal value. When the DAC test bit is set, the value of this register is used on the ratiometric output.

TEST

The content of the test register is shown in Figure 3-12. All bits are “0” after reset. All bits not described or used shall be kept at “0”.

Figure 3-12 Test Register

• “Margin zero on” is used to select the margin test mode. It is set to ‘1’ for testing the EEPROM threshold voltages of cells programmed to ‘0’, and it is set to ‘0’ for testing the EEPROM threshold voltages of cells programmed to ‘1’.

• “FEC off” switches off the error correction of the EEPROM. This bit has to be set when reading the EEPROM content.

• “REF off” switches off the automatic (cyclic) refresh performed by the DSP to actualize the EEPROM registers from the EEPROM cells. This bit has to be set when writing new values to the EEPROM registers.

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TLE4997

ADDR Description 15141312111009080706050403020100

Parity of each column PlPcPcPcPcPcPcPcPcPcPcPcPcPcPcP

IC lock high, USER,

clamping low

LH USER CL - Clamping low (bit 11...0)

Clamping high value PlReserved CH - Clamping high (bit 11...0)

Gain P

G - Gain (bit 14...0)

Offset P

OS - Offset (bit 14...0)

TQ value, TT value P

TQ - quadratic temperature

coefficient (bit 7...0)

precal area - do not modify

TT - register (bit 6 … 0)

LP value, Range, TL

Value, IC lock low

LP -

(bit 0,2,1)

R-

(bit 1,0)

TL - linear temperature coefficient (bit

8…0)

Reserved P

Reserved - do not modify

Reserved P

Reserved - do not modify

Reserved P

Reserved - do not modify

User’s Manual

• “DSP off” switches off the signal processing unit (DSP). This bit has to be set prior to accessing the internal register values via the interface (HCAL, TCAL, SCAL and EEPROM).

• “DSP stop” has to be set prior to switching the DSP off (as a separate command) before reading out the calculated data HCAL, TCAL, and/or SCAL. This allows the DSP to finish the calculation of the current sample and all values in the RAM are consistent.

• “DAC test” switches from the DSP DAC value to the DAC_SET value. This allows setting any DAC value directly to measure the output voltage for a given DAC value for calibration proposes.

TLE4997 Programming

3.5 EEPROM Map

Figure 3-13 shows the content of the EEPROM registers.

low pass

Range

Figure 3-13 EEPROM Map of TLE4997 (all types).

The fields marked in red are configuration parameters for the sensor hardware. Those marked in yellow are used by the DSP algorithms for signal processing. The purple fields are used to determine the condition of the parameters by an external programming software (user defined) and the blue and cyan fields are parity bits for the corresponding lines and columns used by the internal forward error correction (FEC). All parameters are unsigned integer values. The reserved fields marked in white shall not be changed.

The functional description of the configuration and calibration parameters in the EEPROM map is given in

Chapter 4.

Parity Bits

The parity P bit4, ... bit14) and the parity P line (address 0x10 ... 0x19) needs to be calculated so that the sum of its bits is always odd.

Note: Before accessing the EEPROM, the forward error correction (FEC) shall be disabled via the TEST register.

User’s Manual 13 v01_01, 2019-08

of each column (including the precalibration ranges) is even for even bit positions (bit0=LSB, bit2,

for all odd columns (bit1, bit3, ... bit15=MSB) is odd. The parity Pl of every EEPROM

Page 14

TLE4997

User’s Manual

TLE4997 Programming

User Bits

The two USER bits are free bits which can be used by the system integrator, for example to track calibration steps.

Lock Bits

LH and LL are lock bits (LH locked if '1', LL locked if '0'). If either LH, LL or both are set to locked state, the programming interface cannot be accessed anymore.

3.6 Programming Flow

The programming flow diagram in Figure 3-14 shows the procedural steps to setup the EEPROM content and to program new values (EEP_NEW). EEP_PROG means the intermediate values stored in the EEPROM register and EEP_OLD means the initial (old) EEPROM content.

Flowchart description:

1. Switch on the device.

2. Send an initial command (status register readout): Check that the status is valid (Status register = F93D and check the failure.

3. Set the register bits FECoff = 1, DSPoff = 1, REFoff = 1 (allows EEPROM access).

4. Read out the EEPROM content to an array EEP_OLD (store also for reference purpose and traceability) In parallel: Prepare the data that shall be programmed as an array EEP_NEW.

5. Calculate the bits to be cleared from EEP_OLD to EEP_NEW as EEP_PROG array.

6. Write the EEPROM content from the EEP_PROG array to the EEPROM registers

7. Send the EEPROM erase command Apply an erase programming pulse on the output pin (see Chapter 3.3.2).

8. Calculate the bits to be set from EEP_OLD to EEP_NEW as EEP_PROG array.

9. Write the EEPROM content from the EEP_PROG array to the EEPROM registers.

10. Send the EEPROM write command Apply a write programming pulse on the output pin (see Chapter 3.3.2).

11. Send the EEPROM margin command During the falling edge of the margin pulse on V

12. Read out the EEPROM content to the array EEP_PROG.

13. Verify the EEP_PROG data against EEP_NEW to check the programming (no bits flipped) Optionally, steps 11 to 13 can be looped to find the exact margin threshold voltage. If the margin threshold voltage is too low, do not continue and check the failure.

14. Check the status register again.

or F B3DH, compare Chapter 3.4), if not, do not continue

, apply V

on the output (see Chapter 3.3.2).

O,MARG

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TLE4997

EEP_OLD

EEP_NEW

EEP_PROG

EEP_OLD

EEP_NEW

EEP_PROG

For each line I from 0x10 to 0x19:

EEP_PROG[i] = (EEP_OLD[i] XOR EEP_NEW[i]) AND EEP_NEW[i]

(as precal areas must not be changed, the bits in this areas must remain ‚0')

Readout could be looped f or s everal margin v oltages (s tarting from a very

high volt age e. g. 5V) to find the margin

level of t he EEPR OM

see abov e (lik e c omplete

readout proc edure f or

EEP_OLD)

EEPROM

programming

INIT-CMD:

cmd=0x 01

adr=0x0F

READ DAT A

Vdd = 5V

Is 0xF93D or 0xF B3D ?

ILLEGAL

STATU S:

analyse problem

CMD (write):

cmd=0x 09

adr=0x21

DAT : 0x0640

(DSP, FEC ,

REF off)

CMD (b read)

cmd=0x 03 adc=0x 10

RD. B-DATA

CMD (read)

cmd=0x 01 adc=0x 18

READ DATA

CMD (read)

cmd=0x 01 adc=0x 19

READ DATA

10x 16bit

> EEP_OLD <

Store this initial

dataset (allow s

later res tore)

> EEP_NEW <

Given by TC

setup and/or 2P

algorithms etc.

User input, T C

setup algorithm or

2P calibrat ion

algorithm set up

Create erase

pattern for

programming

2x 10x 16bit

CMD (bwrite)

cmd=0x 0b adc=0x 10

WR. B-DATA

CMD (write)

cmd=0x 09 adc=0x 18

WR. DATA CMD (write)

cmd=0x 09 adc=0x 19

WR. DATA

CMD (eras e):

cmd=0x 0D

adr=0x00

prog

PULSE

Create wri te

pattern for

programming

2x 10x 16bit

CMD (write):

cmd=0x 0C

adr=0x00

prog

PULSE

CMD(marg.):

cmd=0x 0E

adr=0x00

mar g+Vdd

-ra mp

CMDs (read)

cmd=0x 03/01 adr=0x10/8/ 9

READ DATA

content =

EEP_NEW ?

ILLEGAL MARGIN

READ: analyse problem

FIN ISH ED

margin higher

required limit ?

Vdd = 0V (off)

For each line I from 0x10 to 0x19:

EEP_PROG[i] = INVERT ((EEP_OLD[i] XOR EEP_NEW[i]) AND EEP_OLD[i])

(as precal areas must not be changed, the bits in this areas must remain ‚1')

Optionally do a last status

readout (adr. 0x 0F) to c heck

the I F mode is still act ive

and the devic e is ok.

User’s Manual

Figure 3-14 Programming Flow

The following chapters give a more detailed description of individual steps of the programming flow:

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TLE4997 Programming

Page 16

TLE4997

User’s Manual

3.6.1 Setting the TEST register

The following steps are used to set the TEST register:

1. Send a write command (TEST register set: Command 09

, Adress: 21H).

2. Send a new data word for the register.

3.6.2 Readout of the EEPROM Content

The following steps are used to readout the EEPROM and store the content in an array:

1. Send a block read command (EEPROM data readout: Command 03

, Address: 10H).

2. Read the first 8 data words of the EEPROM and store it in an array.

3. Send a read command (EEPROM data readout: Command 01

, Address: 18H).

4. Read the 9th data word of the EEPROM and store it in an array.

5. Send a read command (EEPROM data readout: Command 01

, Address: 19H).

6. Read the 10th data word of the EEPROM and store it in an array.

3.6.3 Setting the EEPROM Content

The following steps are used to set the EEPROM content with data from an array:

1. Send a block write command (EEPROM data write: Command 0B

2. Send the first 8 data words from the array to the EEPROM.

3. Send a write command (EEPROM data write: Command 09

4. Send the 9th data word from the array to the EEPROM.

5. Send a write command (EEPROM data write: Command 09

6. Send the 10th data word from the array to the EEPROM

, Address: 10H).

, Address: 18H).

, Address: 19H).

TLE4997 Programming

3.6.4 Calculation of Bits to Erase

The EEP_PROG array for the erase procedure is calculated from the old EEPROM content EEP_OLD and the new EEPROM content EEP_NEW in the following way:

For each data word i: EEP_PROG[i] = INVERT ((EEP_OLD[i] XOR EEP_NEW[i]) AND EEP_OLD[i])

Table 3-7 shows an example of a calculated erase mask.

Table 3-7 Erase Array Example

EEP_OLD 0101010101010101

EEP_NEW 0101110001010101

EEP_PROG 1111111011111111

3.6.5 Calculation of Bits to Write

The EE P_PROG array for the wr ite procedure is calculated from the old EEPROM content EEP_OLD and the new EEPROM content EEP_NEW in the following way:

For each data word i: EEP_PROG[i] = (EEP_OLD[i] XOR EEP_NEW[i]) AND EEP_NEW[i]

Table 3-7 shows an example of a calculated erase mask.

Table 3-8 Write Array Example

EEP_OLD 0101010101010101

EEP_NEW 0101110001010101

EEP_PROG 0000100000000000

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TLE4997

EEPROM

programm ing

INIT-CMD: cm d=0x01

adr=0x0F

READ DAT A

Vdd = 5V

0xF 93D or

0xFB3D ?

ILLEGAL

STATUS:

analys e problem

CMD (write):

cm d=0x09

adr=0x21

DAT: 0x0800

(DSP stop)

FINISHED

Vdd = 0V (off)

Optionally do a last status

readout (adr. 0x0F) to check

the IF mode is still active

and t he dev ice is ok .

CMD (read)

cm d=0x01

adr=0x05

READ DATA

CMD (wr ite):

cm d=0x09

adr=0x21

DA T: 0x0C00

(DSP stop,

DSP off)

Like reading out H_CAL, also all other RAM and EEPROM registers c an be read out here in a loop.

User’s Manual

TLE4997 Programming

3.6.6 Margin Voltage Check

The threshold voltage of EEPROM cells is dependent on the programming voltage and programming pulse length. For reliable programming the programming pulse has to be kept within the specification (Table 3-5) at the sensor interface. The margin command can be used to check the threshold voltages of the programmed cells:

To check the cells programmed to '1', a voltage V E

). For EEPROM cells with a threshold voltage smaller than the applied V

EEPROM registers, for those with a higher threshold voltage, a '1' will be written. By sweeping the applied V

is applied after the margin check command (Command

O,MARG

, a '0' will be stored to the

O,MARG

the actual threshold voltages of each EEPROM cell can be identified.

In order to check the threshold voltages of EEPROM cells programmed to ‘0’, it is necessary to activate the “Margin zero on” bit in the TEST register before sending the margin check command. Also for the ‘0’ cells, the actual threshold voltages of each EEPROM cell can be identified, by sweeping the applied V

O,MARG

3.6.7 DATA access example

Following steps are required to readout other internal data like the calibrated temperature and Hall value (as shown below in Table 3-15). This routines can also be used for an EEPROM access (in that case also FECoff should be set to ’1’).

Figure 3-15 Basic data access flow

Flowchart description:

Switch on the device

2. Send an inital command (status register readout)

3. Read the status data,check that the device is valid and the EEPROM content is valid

4. Set the test register: DSP stop=1 (see previous chapter)

5. Set the test register: DSP stop=1 DSP off=1 (see previous chapter)

6. Send a read command (HCAL) – Read the data word

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TLE4997

EEPROM

programm ing

INIT-CMD:

cm d=0x01

adr=0x0F

READ DATA

Vdd = 5V

Is 0xF93D or 0xFB3D ?

ILLEGAL

STATUS:

analyse problem

CMD (write):

cm d=0x09

adr=0x21

DAT: 0x0640

(DSP, F EC,

REF off)

FINISHED

Vdd = 0V (off)

Optionally do a las t st atus

readout (adr. 0x0F ) t o c heck

the IF m ode is s till act ive

and the device is ok.

All ot her EEPR OM regis ters can be written here in a loop (as re qui red ).

CMD (wri te)

cm d=0x09

adr=0x10.. 19

WR. DATA

CMD (write):

cm d=0x09

adr=0x21

DAT: 0x0250

(FEC, R EF

off)

Here the output should show (temporarily) the desired result (before switc hing off the supply, of co urse).

User’s Manual

TLE4997 Programming

– This readout might be looped for reading out also other parameters (like TCAL)

7. Check the status register again

Note: This routine can be merged with other (exemplary shown) routines. In that case only one initial frame (the

very first interface access) is required after power-on.

3.6.8 Temporary overwrite of EEPROM data

Following steps are required to readout other internal data like the calibrated temperature and Hall value (as shown below Table 3-16). As the error correction stays disabled, it is not necessary to use correct parity values for this temporary setup. In case the parity is always corrected (and it is desired to check the complete behavior and correct EEPROM array calculation), the “FECoff” bit could be switched off again after the temporary EEPROM write.

Figure 3-16 Basic EEPROM register overwrite flow

Flowchart description:

1. Switch on the device

2. Send an inital command (status register readout)

3. Read the status data,check that the device is valid and the EEPROM content is valid

4. Set the test register: DSP off=1 FEC off=1 REF off=1 (see previous chapter)

Send a write command (for any EEPROM register) Send the data words (in 16bit format, MSBs containing the parity may be kept ’0’)

6. Set the test register: FEC off=1 REF off=1 (see previous chapter)

- The device is now temporarily working with the new EEPROM setting.

7. Check the status register again

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Page 19

TLE4997

EEPROM

programm ing

INIT-CMD:

cm d=0x01

adr=0x0F

READ DATA

Vdd = 5V

Is 0xF93D or 0xFB3D ?

ILLEGAL

STATUS:

analyse problem

CMD (write):

cm d=0x09

adr=0x21

DAT: 0x4000

(DAC test)

FINISHED

Vdd = 0V (off)

Optionally do a las t st atus

readout (adr. 0x0F ) t o c heck

the IF m ode is s till act ive

and the device is ok.

Set all required DAC

values in a loop

CMD (wri te)

cm d=0x09

adr=0x20

WR. DATA

Wait 10ms and

evaluate the response on

the V

out

-pin

User’s Manual

TLE4997 Programming

3.6.9 DAC setup example

To find the exact DAC value for a desired output voltage (e.g. to set up the clamping low/high registers with the best available accuracy), it is possible to set the DAC value directly and to measure the result on the output pin.

Figure 3-17 Basic DAC setup flow

Flowchart description:

1. Switch on the device

2. Send an inital command (status data readout)

Read the status data,check that the device is valid and the EEPROM content is valid

4. Set the test register: “DAC Test”=1 (see previous chapter)

- The output immediately shows the content given by the DAC_SET register.

5. Send a write command (DAC_SET register)

- Send the data word for the desired 12bit DAC value (in 16bit format, MSBs are ’0’)

- The output changes accordingly to the new DAC value in DAC_SET

6. After 10ms (max. output setup time), measure Vout

- Repeat writing a new DAC value (continue at step 5) until the response of all desired DAC values are measured

7. Check the status register again

User’s Manual 19 v01_01, 2019-08

Page 20

TLE4997

Gain

G 16384–()

4096

------------------------------

OS 16384–()

4096

---------------------------------

V×

User’s Manual

Configuration & Calibration Parameters

4 Configuration & Calibration Parameters

This chapter describes the configuration and calibration parameters that can be set in the EEPROM of the TLE4997 (see EEPROM map, Chapter 3.5)

4.1 Magnetic Field Range - R

Table 4-1 Range Setting

Parameter R Range Nominal Range in mT

3Low ±50

0 High ±200

1) Absolute accuracy of range values is not specified.

2) Setting R = 2 is not used, internally changed to R = 1.

Mid ±100

4.2 Gain Setting - G

The overall sensitivity is defined by the range and the gain setting. The output of the ADC is multiplied by the Gain value. The Gain value is given by:

(4.1)

Table 4-2 Gain

Parameter Symbol Values Unit Note / Test Condition

Min. Typ. Max.

Gain range Gain - 4.0 – 3.9998 –

Gain quantization steps ΔGain – 244.14 – ppm Corresponds to 1/4096

1) For Gain values between -0.5 and +0.5, the numerical accuracy decreases. To obtain a flatter output curve, it is recommended to select a higher range setting.

2) In 100 mT range, a gain value of +1.0 corresponds to typically 40mV/mT. Infineon pre-calibrates the samples to 60mV/mT.. It is recommended to do a final 2-point calibration of each IC within the application.

1)2)

4.3 Offset Setting - OS

The offset value corresponds to an output voltage with zero field at the sensor. The offset value can be calculated by:

(4.2)

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Page 21

TLE4997

User’s Manual

Configuration & Calibration Parameters

Table 4-3 Offset

Parameter Symbol Values Unit Note / Test Condition

Min. Typ. Max.

Offset range

Offset quantization steps ΔOUT

1) Infineon pre-calibrates the samples at zero field to typically 50% output value in 100 mT range. It is recommended to do a final 2-point calibration of each IC within the application.

-400 – 399 %V

– 1.22 – mV at VDD = 5V

generally V

/4095

4.4 Low-Pass Filter - LP

A configurable digital low-pass filter is implemented at the output of the Hall ADC. The possible settings are shown in Table 4-4. Figure 4-1 shows the filter characteristics as a magnitude plot for the settings 78 Hz to 1320 Hz (from left to right). The update rate of the low-pass filter output is nominally 16 kHz.

Attention: The bit arrangement of the LP-Filter register is "0,2,1" (see EEPROM map in Figure 3-13).

Therefore, the bits have to be rearranged accordingly to obtain the desired configuration. For example, the LP-filter setting "6" corresponds to the binary "011" in the LP-filter register.

Table 4-4 Low Pass Filter Setting

Parameter LP Nominal cutoff frequency in Hz (-3 dB point)

078

1244

2421

3615

4826

5 1060

6 1320

7Off

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TLE4997

-6

-5

-4

-3

-2

-1

Magnitude (dB)

Frequency (Hz)

-6

-5

-4

-3

-2

-1

Magnitude (dB)

Frequency (Hz)

User’s Manual

Figure 4-1 DSP Input Filter (Magnitude Plot)

Configuration & Calibration Parameters

Table 4-5 Low-Pass Filter

Parameter Symbol Values Unit Note / Test Condition

Min. Typ. Max.

Corner frequency variation Δ

f -25 – +25 % –

4.5 DAC Input Interpolation Filter

An interpolation filter is placed between the DSP and the output DAC. This filter determines the frequency behavior of theTLE4997 in case the DSP input filter is disabled input filter is disabled . The update rate after interpolation filter is 256 kHz

Figure 4-2 DAC Input Filter (Magnitude Plot)

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Page 23

TLE4997

min

B (mT)

max

out

(V)

Error range

Operating range

CLH

CLL

4096

------------

VDD×=

User’s Manual

Configuration & Calibration Parameters

4.6 Clamping - CH, CL

The clamping function is useful for separating the output range into an operating range and error ranges. If the magnetic field is exceeding the selected measurement range, the output voltage V values. Any value in the error range is interpreted as an error by the sensor counterpart.

Figure 4-3 shows an example in which the magnetic field range between B

and B

min

between 0.8 V and 4.2 V.

is limited to the clamping

OUT

is mapped to voltages

max

Figure 4-3 Clamping Example

Clamping - TLE4997 :

Table 4-6 Clamping

Parameter Symbol Values Unit Note / Test Condition

Min. Typ. Max.

) < V

CLL

CLH

CLQ

) < V

< ( 94% of VDD) for 120°C < TJ ≤ 150°C

OUT

<(95% of VDD) for T

OUT

0 – 99.98 %V

–1.22–%mVat V

-15 15 mV in lifetime

≤ 120°C

= 5 V

over temperature

Clamping low

Clamping high

Clamping quantization steps ΔV

Clamping voltage drift ΔV

1) If clamping is set it must be within the allowed output range.

2)Valid in the range (5% of V

and (6% of V

The clamping values are calculated by:

Clamping low voltage :

(4.3)

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Page 24

TLE4997

CLH

4096

------------

VDD×=

User’s Manual

Configuration & Calibration Parameters

Clamping high voltage:

(4.4)

4.7 Temperature Compensation - TL, TQ & TT

The TLE4997 has an integrated third-order temperature compensation using the coefficients TL, TQ, and TT, which is used to compensate the thermal drift of the Hall cell (pre-configured by Infineon).

The magnetic field strength of a magnet depends on the temperature. This material constant is specific for the different magnet types. The temperature compensation parameters TL and TQ of the TLE4997 can be adapted to compensate this temperature dependency of the magnet in the application. The TT value is fixed and cannot be modified.

Three parameters are used for the application temperature compensation:

• Reference temperature T

• A linear part (1st order) TC

• A quadratic part (2nd order) TC

The detailed procedure to derive the optimum TL and TQ parameters for a a given magnet characteristic is described in Chapter 5.

Table 4-7 Temperature Compensation

Parameter Symbol Values Unit Note / Test Condition

Min. Typ. Max.

order coefficient TC

Quantization steps of TC

order coefficient TC

Quantization steps of TC

Reference temp. T

1) Relative range to Infineon TC1 temperature pre-calibration, the maximum adjustable range is limited by the register-size and depends on specific pre-calibrated TL setting, full adjustable range: -2441 to +5355 ppm/°C.

2) Relative range to Infineon TC2 temperature pre-calibration, the maximum adjustable range is limited by the register-size and depends on specific pre-calibrated TQ setting, full adjustable range: -15 to +15 ppm/°C2.

ΔTC

-1000 – 3000 ppm/ °C

– 15.26 – ppm/ °C –

-6 – 6 ppm/ °C²

– 0.119 – ppm/ °C² –

-48 – 64 °C –

User’s Manual 24 v01_01, 2019-08

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TLE4997

DSP

TCAL()1

TL 160–

8 8192⋅

----------------------

TCAL

----------------

⎝⎠

⎛⎞

TQ 128–

1024 8192⋅

----------------------------

TCAL

----------------

⎝⎠

⎛⎞

TT 64–

131072 8192⋅

----------------------------------

TCAL

----------------

⎝⎠

⎛⎞

⋅+⋅+⋅+=

TCAL 16 TJ48–()⋅=

AppTJ

() 1TC1TJT0–()TC2TJT0–()

++=

User’s Manual

Calibration of TLE4997 Temperature Compensation

5 Calibration of TLE4997 Temperature Compensation

A temperature compensation mechanism is implemented in the TLE4997 to account for thermal drift of the Hall probe sensitivity and thermal reduction of the remanent magnetization of a permanent magnet used in a position sensing application. Initially, the TLE4997 is pre-configured by Infineon to have a constant magnetic sensitivity over temperature.

In case the TLE4997 is used to measure an absolute magnetic field, for example in a current sensing application, then no additional adaption of the temperature compensation by the user is required.

If the TLE4997 is used in a position sensing application where it measures the magnetic field generated by a moving permanent magnet, then it is typically desired that the output signal of the TLE4997 depend only on the magnet position. In this case, a user adaptation of the temperature compensation is required to account for thermal reduction of the magnet’s remanence. Therefore, the TLE4997 has to be configured to increase its sensitivity accordingly with increasing temperature to compensate the thermal reduction of the remanence.

This temperature coefficient of the remanence depends on the chosen magnet material, so the temperature compensation of the TLE4997 has to be adapted to the permanent magnet employed in the application.

5.1 Integrated Temperature Polynomial

The integrated temperature compensation of the TLE4997 uses a third order polynomial, as shown in

Equation (5.1).

(5.1)

with:

(5.2)

is the junction temperature in °C. The coefficients TL, TQ, and TT are the linear, quadratic and cubic

temperature compensation coefficients, respectively. They are stored in the EEPROM and pre-configured by Infineon for a constant magnetic sensitivity over temperature (see Chapter 3.5 for EEPROM map).

The coefficients TL and TQ can be adapted by the user to implement a compensation of the thermal reduction of a magnet’s remanence. The coefficient TT is fixed to the value pre-calibrated by Infineon. It cannot be adapted.

5.2 Application Sensitivity Polynomial

In order to find the optimum TL and TQ parameters to minimized the position signal error due to the thermal reduction of the magnet’s remanence, an application sensitivity polynomial has to be derived from a sensitivity measurement in the application over temperature that describes the desired sensitivity factor as a function of temperature (see Chapter 5.3). The application sensitivity polynomial is given by Equation (5.3).

(5.3)

is the junction temperature in °C, TC1 (in ppm/°C) and TC2 (in ppm/°C2) are the first and second order

application temperature coefficients and T

(in °C) is a reference temperature.

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TLE4997

0,925

0,950

0,975

1,000

1,025

1,050

1,075

-50 0 50 100 150

Rel. Change

TJ(°C)

MR(T)

Sapp(T)

MR(T)*Sapp(T)

AppTJ

()MRTA()cons ttan≈⋅

UI⋅()⋅+=

DSPfinalTJ

()S

DSPpreTJ

()S

AppTJ

()⋅≈

User’s Manual

Calibration of TLE4997 Temperature Compensation

Figure 5-1 Example thermal behavior of magnetic remanence M(T) and application sensitivity polynomial

(T) with reference temperature 48°C.

app

The reference temperature T

is a degree of freedom that can be chosen by the user, such that the gain of the

TLE4997 that is configured in the EEPROM, applies at this reference temperature.

In case the calibration of the offset and gain for the output charateristic is done after the calibration of the temperature compensation, the choice of T configured separately. A choice of T

= 48°C is recommended for simplicity (to match the reference temperature

is not relevant. In this case, the gain at a specific temperature is

in the definition of TCAL in Equation (5.2)).

The application sensitivity polynomial S

has to be determined in the application to approximately cancel the

App

temperature dependency of the remanence, as stated in Equation (5.4) and illustrated in Figure 5-1.

(5.4)

is the remanence of the permanent magnet as a function of temperature and TA is the ambient temperature in

the application that relates to the junction temperature T

by Equation (5.5).

(5.5)

is the thermal resistance of the TLE4997 as specified in the data sheet, U is the supply voltage and I is the

supply current.

After determining the application sensitivity polynomial S sensor parameters TL

and TQ

final

for the final sensor configuration have to be adapted to combine the

final

compensation of the Hall sensing element drift (given by the precalibrated values TL cancellation of the thermal reduction of the magnet’s remanence (given by S

from a sensitivity measurement over temperature, the

App

and TQ

pre

), as stated in Equation (5.6).

App

) and the

pre

(5.6)

DSPfinal(TJ

Equation (5.2), with the final parameters TL

with the pre-configured parameters TL

) is the integrated temperature polynomial given by the combination of Equation (5.1) and

and TQ

final

and TQ

pre

After determination of the application sensitivity polynomial coefficients and readout of the pre-configured TL TQ

, and TT parameters via the programming interface, the optimum TL

pre

. S

final

DSPpre(TJ

) is the integrated temperature polynomial

final

and TQ

parameters have to be

final

derived from Equation (5.6) and programmed into the TLE4997.

pre

User’s Manual 26 v01_01, 2019-08

Page 27

TLE4997

B(T)

Movement

N S

TLE4997

i()

VDAC

i()

VDAC

–

-------------------------------------------------

User’s Manual

Calibration of TLE4997 Temperature Compensation

5.3 Determination of Sensitivity Polynomial from Measurement

For the determination of the Coefficients for the application sensitivity polynomial (Equation (5.3)) a measurement of the temperature behavior of the sensor output in the application is recommended. A basic example for a position sensing application using the TLE4997 and a moveable permanent magnet is shown in Figure 5-2.

In a setup that uses a permanent magnet, the magnetic field has a temperature dependency due to the thermal reduction of the remanence. In order to determine the optimum sensitivity compensation behavior of the sensor in to cancel this temperature dependency, the sensor’s output value shall be measured at different temperatures, with the permanent magnet in a fixed position.

As the thermal reduction of the remanence depends mainly on the magnetic material used and has typically only minor variations from sample to sample, a reference measurement on a number of application samples is typically sufficient to determine a reference polynomial for the application in general, which is to be used for production. It is typically not required to perform the described measurement over temperature for every individual sample.

Figure 5-2 Example Position Sensing Application

With the described setup, the following procedure is used to obtain the coefficients of the application sensitivity polynomial:

• Measure the sensor output for at least three different temperatures at a defined, fixed magnet position. The magnetic flux densitiy at the sensor shall be non-zero at this given magnet position. It is recommended for best accuracy of the calibration procedure to use a magnet position that leads to the highest possible magnetic flux at the sensor, while still being inside the configured magnetic flux range (± 50 mT, ±100 mT, or ±200 mT).

• For each data point, read the junction Temperature T

• For each data point, calculate the compensation sensitivity value S value at zero field VDAC

• Plot S

(i)

as a function of T

Figure 5-3).

, using Equation (5.7)

(i)

and apply a quadratic fit (cx2 + bx + a) which yields coefficients a, b and c (See

(i)

, and the VDAC

(i)

value via the programming interface.

(i)

from the VDAC

(i)

value and the output

(5.7)

User’s Manual 27 v01_01, 2019-08

Page 28

TLE4997

y = 2,135E-06x2+ 6,550E-04x + 1,305E+00

1,26

1,28

1,30

1,32

1,34

1,36

1,38

1,40

1,42

1,44

-50 0 50 100 150

Sensitivity correction S(T

)

TJ(°C)

S(i)

Quadratic fit

a = 1.305, b = 6.55E-4°C-1, c = 2.135E-6°C

-2

b2cT

⋅⋅+

abT0cT

⋅+⋅+

------------------------------------------

abT0cT

⋅+⋅+

------------------------------------------

ε TJ()

DSPfinalTJ

()

DSPpreTJ

()S

appTJ

()⋅⋅

----------------------------------------------------------------

1–=

User’s Manual

Figure 5-3 Example Polynomial Fit Procedure.

Calibration of TLE4997 Temperature Compensation

• Derive the coefficients of the application sensitivity polynomial from the parameters a, b, and c obtained from the quadratic fit using Equation (5.8) and Equation (5.9).

(5.8)

(5.9)

5.4 Calculation of Final Temperature Compensation Parameters

After determination of the application sensitivity polynomial S compensation paramters TL and TQ in the EEPROM such that the overall sensitivity of the TLE4997 shows the desired increase over temperature to compensate for the thermal reduction of the magnet’s remanence in the application.

, it is necessary to adapt the temperature

app

5.4.1 Algorithm for Finding the Optimum Temperature Coefficient Set

For an optimum temperature compensation in the application, the set of coefficients TL and TQ have to be found that best fulfill the condition stated in Equation (5.6). To find this parameter set, an error function ε(T) is defined in that is minimized in an iterative procedure.

(5.10)

DSPfinal(TJ

Equation (5.2), with the final parameters TL

with the pre-configured parameters TL

) is the integrated temperature polynomial given by the combination of Equation (5.1) and

User’s Manual 28 v01_01, 2019-08

and TQ

final

and TQ

pre

. C is a constant to be varied in the iterative procedure.

pre

final

. S

DSPpre(TJ

) is the integrated temperature polynomial

Page 29

TLE4997

rms

----

ε T

i()

()()

i1=

∑

User’s Manual

In a second step, the error function defined in Equation (5.10) is summed over the temperature range in finite equidistant steps T TQ, and the constant C are varied until the residual ε

(i)

. For the computation, a step size of 10°C or less is recommended. Then, the parameters TL,

Calibration of TLE4997 Temperature Compensation

in Equation (5.11) is minimized.

rms

(5.11)

5.4.2 Example Implementation Code for Temperature Calibration

The following code example is done in Microsoft® Visual Basic® and can be adapted to any other programming language.

Setup of global Variables

Precalibrated parameter set read from the sensor:

• TL_pre (as stored in EEPROM)

• TQ_pre (as stored in EEPROM)

• TT (as stored in EEPROM)

Valid ranges are: TR_pre: 0...7; TL_pre: 0...511; TQ_pre: 0...255; TT: 0...31.

Given user values in °C and ppm:

• T0 (application sensitivity polynomial reference temperature)

• TC1 (application sensitivity polynomial linear temperature coefficient)

• TC2 (application sensitivity polynomial quadratic temperature coefficient)

Valid ranges are: T0_user: -50...80, TC1_user: -0.001...0.0025, TC2_user: -0.000004...0.000004.

Last but not least we have the new setup values, we initialize partly:

• TL (used as sweep variable, needs no initialization)

• TQ (used as sweep variable, needs no initialization)

Valid ranges are: TL: 0...511; TQ: 0...255;

Sensitivity Calculation Subroutines

The first function calculates the user polynomial at a given temperature T:

Private Function S_app(ByVal T) As Double S_app = 1 + TC1 * (T - T0) + TC2 * (T - T0) ^ 2 End Function

The next function calculates the sensor DSP behaviour after precalibration at a given temperature T:

Private Function S_dsppre(ByVal T) As Double S_dsppre = 1 + (TL_pre - 160) * (T - 48) / 8 / 8192 +

(TQ_pre - 128) * ((T - 48) ^ 2) / 1024 / 8192 + (TT - 64) * ((T -48) ^ 3) / 131072 / 8192

End Function

Finally, there is the calculation function for the DSP polynomial at a temperature T:

Private Function S_dsp(ByVal T) As Double S_dsp = 1 + (TL - 160) * (T -48) / 8 / 8192 +

(TQ - 128) * ((T -48) ^ 2) / 1024 / 8192 + (TT-64) * ((T - 48) ^ 3) / 131072 / 8192

End Function

For the algorithm we need the already explained error function:

User’s Manual 29 v01_01, 2019-08

Page 30

TLE4997

User’s Manual

Private Function epsilon(ByVal T) As Double epsilon = -1 + S_dsp(T) / (C * S_dsppre(T) * S_app(T)) End Function

Iteration Loop

The iteration loop looks through all TL and TQ values and check for the smallest rms error. It is done in two steps: First it looks for a rough optimum point with a coarse step size of 10 for both parameters. In a second step it iterates again using stepsize 1 around that point to find a refined optimum.

Rem --> Initialize temperature sweep parameters T_min = -40 T_max = 150 T_step = 10 n = Math.Round((T_max - T_min) / T_step)

Rem --> Initialize variables to keep track of current optimum values epsilon_rms_opt = 9999 TL_opt = 0 TQ_opt = 0

Rem ========================================================================= Rem --> Sweep in two runs, the coarse global and the fine local search For Rounds = 1 To 2

Calibration of TLE4997 Temperature Compensation

Rem ===================================================================== Rem --> Initialize sweep parameters Rem First round coarse, second round fine If (Rounds = 1) Then TL_lo = 0 TL_hi = 500 TL_step = 10 TQ_lo = 0 TQ_hi = 240 TQ_step = 10 ElseIf (Rounds = 2) Then TL_lo = TL_opt - 9 TL_hi = TL_opt + 9 TL_step = 1 TQ_lo = TQ_opt - 9 TQ_hi = TQ_opt + 9 TQ_step = 1 End If

Rem ===================================================================== Rem --> TL sweep For TL = TL_lo To TL_hi Step TL_step

Rem ================================================================= Rem --> TQ sweep For TQ = TQ_lo To TQ_hi Step TQ_step

Rem =============================================================

User’s Manual 30 v01_01, 2019-08

Page 31

TLE4997

User’s Manual

Calibration of TLE4997 Temperature Compensation

Rem --> Determine minimizing C by calculating average epsilon epsilon_sum = 0 C = 1 For T = T_min To T_max Step T_step epsilon_sum = epsilon_sum + epsilon(T) Next epsilon_mean = (epsilon_sum / n) C = epsilon_mean + 1

Rem ============================================================= Rem --> Determine epsilon sum epsilon_sum = 0 For T = T_min To T_max Step T_step epsilon_sum = epsilon_sum + epsilon(T) ^ 2 Next epsilon_rms = Math.Sqr(epsilon_sum / n)

Rem ============================================================= Rem --> Determine if new optimum parameters were found If epsilon_rms < epsilon_rms_opt Then epsilon_rms_opt = epsilon_rms TL_opt = TL TQ_opt = TQ End If Next Next Next

Rem ========================================================================= Rem --> Finally retrieve the best TL, TQ values stored during the sweep TL_final = TL_opt TQ_final = TQ_opt

After the iteration is complete, the values TL

final

and TQ

contain the optimum values for TL and TQ. These

final

values shall be programmed into the sensor’s EEPROM.

User’s Manual 31 v01_01, 2019-08

Page 32

TLE4997

(i)

[°C]

VOUT

(i)

[V] S

(i)

1 -40 4,45000 1,282

1,31E+00

2 -20 4,43500 1,292

6,55E-04

°C-1]

3 0 4,41000 1,309

2,14E-06

°C-2]

4 25 4,39000 1,323

5 50 4,36500 1,340

user

= 1 + TC1

user

(T-T0

user

) + TC2

user

(T-T0

user

)

6 75 4,32500 1,370

user

= 48

°C]

7 100 4,30000 1,389

user

= 641

°C]

8 120 4,26500 1,416

user

= 1,59

°C2]

(i)

[°C] and VOUT

(i)

shall be read from the sensor for each data point (TJ= TCAL/16 + 48)

y = 2,135E-06x2+ 6,550E-04x + 1,305E+00

1,26

1,28

1,30

1,32

1,34

1,36

1,38

1,40

1,42

1,44

-50 0 50 100 150

Sensitivity correction S(T

)

TJ(°C)

S(i)

Quadratic fit

User’s Manual

Calibration of TLE4997 Temperature Compensation

5.5 Usage of Infineon’s Temperature Calibration Tool

For laboratory calibration purpose, Infineon provides a simple tool to determine the calibration parameters from measurement data (see Figure 5-4).

The following sequence of steps is used for the temperature calibration the Infineon tool:

1. Measure the sensor’s AOUT and TCAL registers at a fixed magnet position for different temperatures as described in Chapter 5.3, enter the T

Figure 5-4, upper left side). For the readout of this data, the Infineon TLE4997 Evaluation Kit can be used.

2. The tool automatically calculates the corresponding Sensitivity correction values S from the entered T AOUT values according to Equation (5.7).

3. Based on the calculated S values, the tool performs a quadratic fit and calculates the Application Sensitivity Polynomial parameters TC1 and TC2 (see Figure 5-4, upper right side).

User Parameter Calculation

(in °C) and AOUT (in V) values in the table fields marked in yellow (see

and

y = a + bx + c

a =

b =

c =

TC1

TC2

[

[ppm/

Figure 5-4 Infineon tool for temperature calibration, application sensitivity polynomial fit.

4. Readout the sensor’s preprogrammed TL marked in yellow (see Figure 5-5 upper left side). For the readout of this data, the Infineon TLE4997 Evaluation Kit can be used.

5. The tool calculates the TL value and the TC1 and TC2 coefficients determined in steps 1-3. For that, an automated script is used that implements the procedure explained in Chapter 5.4. The calculated values TL corresponding table fields marked in green (see Figure 5-5 upper right side)

6. Program the calculated TL or a suitable programmer tool.

For illustration purpose, the tool also displays graphs for the preprogrammed and final sensitivity polynomials, S succesful calibration, S

DSP,pre

and S

DSP,final

User’s Manual 32 v01_01, 2019-08

, the application sensitivity polynomial S

DSP,final

and TQ

pre

and TQ

final

and TQ

final

parameters out of the entered TL

values into the TLE4997 using the Infineon TLE4997 Evaluation Kit

should by approximately equal S

values and enter them in the corresponding table fields

pre

and the product S

app

DSP,pre*Sapp

and TQ

pre

final

values, the (fixed) TT

pre

and TQ

DSP,pre*Sapp

(compare Equation (5.6)).

appear in the

final

. Ideally, after

Page 33

TLE4997

New DSP Parameter Calculation

Input: T0

user

= 48

°C]

final

and TQ

final

are calculated

automatically by VB script:

pre

= 166 ( 0 to 511) TC1

user

= 6,41E-04

-1

]

final

= 209

pre

= 162 ( 0 to 255) TC2

user

= 1,59E-06

-2

]

final

= 175

pre

= 28 ( 0 to 31) TT

final

= 28

pre

and TQ

pre

shall be read from the sensor via the programming interface

TT is fixed by Infineon to value 28 (leaded package devices) or 21 (SMD devices)

(i)

[°C] S

dsp,pre

app

dsp,final

dsp,pre

* S

app

Error (%) 1 -40 1,0944 0,9559 1,0487 1,0462 0,24 2 -20 1,0453 0,9638 1,0079 1,0074 0,04 3 0 1,0165 0,9729 0,9886 0,9889 -0,04 4 25 1,0013 0,9861 0,9870 0,9874 -0,04 5 50 1,0002 1,0013 1,0015 1,0015 0,00

6 75 1,0034 1,0185 1,0222 1,0219 0,03 7 100 1,0011 1,0376 1,0394 1,0387 0,06 8 120 0,9887 1,0544 1,0439 1,0424 0,14

0,80

0,85

0,90

0,95

1,00

1,05

1,10

1,15

1,20

-50 0 50 100 150

Sensitivity

TJ(°C)

Sdsp, pre

Sapp

User’s Manual

Calibration of TLE4997 Temperature Compensation

The tool displays also the error that occurs due to imperfect matching of S the calibration procedure, this error should be on the order of ±0.1%.

[ [

[

DSP,final

and S

DSP,pre*Sapp

. Typically, after

Figure 5-5 Infineon tool for temperature calibration, TL and TQ calculation.

Note: Error (%) is the deviation of S

dsp,final

from the product of S

User’s Manual 33 v01_01, 2019-08

dsp,pre

times S

app

Page 34

TLE4997

VDAC

~ Vout

[%]

Positi on

~ M agnetic Flux ( mT)

VDAC 1'

out1

VDAC2' ~V

out2

Pos 2 (B2)

Pos 1 (B

)

application m ovement r ange

Max Output

(100 %)

Min Output

(0 %)

befor e 2-poi nt

cal i br ation

after 2-point

cal i br ation

~HC AL 1

~HC AL 2

VDAC

G 16384–()HCAL⋅

32768

----------------------------------------------------

OS 16384–+=

User’s Manual

Calibration of TLE4997 Output Characteristic

6 Calibration of TLE4997 Output Characteristic

In a position sensing application, the maximum and minimum magnetic field sensed by the TLE4997 depends on the employed permanent magnet and the movement range covered by the application. To achieve the maximum possible accuracy in such applications, it is recommended to adapt the output characteristic of the TLE4997 so the possible analog output range is matched to the magnetic input range that is available in the application.

6.1 Two-Point Calibration Procedure

Position sensor modules are typically subject to production variations in terms of magnet strength and magnet position, therefore it is recommended to do a two-point calibration of the TLE4997 after assembly of each module to achieve the desired output characteristics independent of such production variations.

In order to configure an application specific output-characteristic, a two-point calibration procedure is used, where the IC-internal representation HCAL (compare Figure 2-1) of the Hall measurement value is evaluated at two defined positions and the output offset and gain are adjusted accordingly. This procedure is illustrated in

Figure 6-1.

Figure 6-1 Schematic of Two-Point Calibration

The value VDAC is calculated in the TLE4997 with the configured offset (OS) and gain (G) value according to

Equation (6.1).

For the two-point calibration, the following procedure is used:

1. Select two reference positions Pos1 and Pos2 for the moveable magnet in the application module. For maximum accuracy of the calibration routine it is recommended that the desired signal difference between these positions is at least half the full signal range.

2. Chose the desired output signals VDAC1’ and VDAC2’ which should correspond to positions Pos1 and Pos2 in the final configuration.

3. Fix the application module in position Pos1 and read the HCAL register via the programming interface. This value is HCAL1.

4. Fix the application module in position Pos2 and read the HCAL register via the programming interface. This value is HCAL2.

User’s Manual 34 v01_01, 2019-08

(6.1)

Page 35

TLE4997

G 16384 32768+

VDAC2' VDAC1'–

HCAL2 HCAL1–

---------------------------------------------------

⋅=

OS 16384 VDAC1'

G 16384–()HCAL1⋅

32768

-------------------------------------------------------

–+=

G 16384 32768+

3890 205–()

6203 5435–()–()

------------------------------------------

⋅ 26759==

OS 16384 205-

26759 16384–()5435–()⋅

32768

-----------------------------------------------------------------

18310=+=

User’s Manual

5. Calculate the according gain and offset parameters from the recorded HCAL1 and HCAL2 values and the desired VDAC1’ and VDAC2’ values using Equation (6.2) and Equation (6.3).

6. Programm the gain (G) and offset (OS) values into the sensor’s EEPROM.

Attention: HCAL is a 16bit signed integer value in the range of ±30000. VDAC is a 12bit unsigned decimal

value applied to the internal DAC for the ratiometric output stage. The value range is from 0 to 4095 and corresponds to 0% to 100% of VDD..

Calibration of TLE4997 Output Characteristic

(6.2)

(6.3)

6.2 Two-Point Calibration Examples

6.2.1 Calibration with Application Readout

Optimum accuracy of the TLE4997 can be achived by using a two-point calibration with readout of the HCAL registers in the application. The sensor´s output register HCAL is measured at the end points of the applications range of motion and derive the optimum offset and gain parameters from the desired VOUT values. The registers can be read using the TLE4997 Evaluation Kit.

Example

An example application has a linear movement range from x recorded.

In the application , it is desired to have the output value VOUT1’ = 0.25V (5% of the full 5V range) at position x and VOUT2’ = 4.75V (95% of full 5V range ) at position x2 .

The measured HCAL and desired VOUT’ values are shown in Table 6-1

Table 6-1 Example VOUT and HCAL values for 2-point calibration

Position measured

HCAL (Hex)

Applying the HCAL and VDAC’ values form Table 6-1 in Equation (6.2) and Equation (6.3) yields:

This corresponds to a multiplicative gain of 2.53 and an offset of 2.35V, according to the formulas in Chapter 4.

EAC5

183B

HCAL (Dec, signed) Range ±30000

-5435 0.25 CD

6203 4.75 F32

to x2. In both positions , the register value HCAL is

desired VOUT’ (V)

desired VDAC’(Hex)

VDAC’ (Dec) Range 0 to 4095

205

3890

(6.4)

(6.5)

Attention: If the measured HCAL values are close to the range limits ±30000, saturation takes place. In this

case, it is recommended to switch to a higher magnetic range (±100 or ±200 mT) prior to the calibration.

User’s Manual 35 v01_01, 2019-08

Page 36

TLE4997

User’s Manual

Calibration of TLE4997 Output Characteristic

6.2.2 Calibration without Application Readout

In case a readout of the sensor before calibration is not desired, the sensor can be roughly calibrated just from a knowledge of the minimum and maximum magnetic flux values that occur in the application. In this case, the calibration cannot compensate any variation of parameters due to production spread of sensor IC or application module. The offset and gain are calculated only based on the minimum and maximum magnetic field in the application.

Example

An example application has a minimum magnetic flux of B mT, which needs to be mapped to 4.5V and 0.5V, the clamping levels must be set to 4.7V and 0.3V.

The precalibrated gain value is 1.62 and the precalibrated offset value is 50% (sensor read-out).

The +/- 100mT default range is well suited, as both magnetic flux values are well within the allowed range.

The sensitivity needs to be set in that way that the magnetic flux change from B in a voltage change from V

So the required sensitivity is (V

= 0.5V to V

out2

- V

out1

= 4.5V.

out1

)/(B1 - B2) = (4.5-0.5) / (+75-(-25)) = 0.04 V/mT = 40mV/mT.

out2

As the default sensitivity is about 60mV/mT, the gain value needs to be lowered by a factor of (40 / 60) = 0.667. So the gain must be reprogrammed to (1.62 x 0.667) = 1.08.

For the offset setup, we can proceed as follows:

A magnetic flux of 75mT will cause with the new sensitivity value of 40mV/mT a output change of (75 x 40) = 3000 mV = 3V.

With the default offset setup of 2.5V we would see on the output (only theoretically) 5.5V, but we need 4.5V. So the offset value needs to be lowered by (5.5-4.5) = 1V.

This corresponds to an ratiometric percentage of (1/5) x 100% = 20%. So it is necessary to set the new offset to (50 - 20) = 30 %.

The clamping parameters need to be set to (0.3 / 5) x 100% = 6% and (4.7 / 5) x 100% = 94% to provide the required output limits.

= -25 mT and a maximum magnetic flux of B

min

= -25mT to B1 = +75mT results

max

= 75

User’s Manual 36 v01_01, 2019-08

Page 37

TLE4997

User’s Manual

Revision History

Page or Item Subjects (major changes since previous revision)

v01_01, 2019-08

Page 35 Corrected Equation (6.3)

Page 35 Corrected Equation (6.5)

Page 35 Corrected offset value in the paragraph

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User’s Manual 37 v01_01, 2019-08

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