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•184-Pin Registered 8-Byte Dual-In-Line
DDR SDRAM Module for “1U” PC, Workstation and Server main memory applications
•One rank 32 M × 72 and 64M × 72 and two ranks 64 M ×72 and 128 M ×72 organization
•JEDEC standard Double Data Rate Synchronous DRAMs (DDR SDRAM) with a single + 2.5 V (± 0.2 V) power
supply and + 2.6 V (± 0.1 V) power supply for DDR400
•Built with 256-Mbit DDR SDRAMs in P-TFBGA-60-1 packages
•Programmable CAS
•Auto Refresh (CBR) and Self Refresh
•All inputs and outputs SSTL_2 compatible
•Re-drive for all input signals using register and PLL devices.
•Serial Presence Detect with E
•Low Profile Modules form factor:
133.35 mm × 28.58 mm × 4.00 mm / 2.64 mm and for 1GB 133.35 mm × 30.48 mm (1.2”)× 4.00 mm
•JEDEC standard reference layout for one rank 256 MB, 512 MB and two ranks 512 MB, 1 GB:
PC2700 and PC3200 Registered DIMM Raw Cards A,B,C,D
•Gold plated contacts
Table 1Performance
Latency, Burst Length, and Wrap Sequence (Sequential & Interleave)
2
PROM
Part Number Speed Code–5–6Unit
Speed GradeComponentDDR400BDDR333B—
ModulePC3200–3033PC2700–2533—
max. Clock Frequency@CL3
@CL2.5
@CL2
f
CK3
f
CK2.5
f
CK2
200166MHz
166166MHz
133133MHz
1.2Description
The HYS72D[128/64/32][300/320]GBR–[5/6]–C and HYS72D64320GBR–5–C are low profile versions of the
standard Registered DIMM modules suitable for 1U Server Applications. The Low Profile DIMM versions are
available as 32 M ×72 (256 MB), 64 M ×72 (512 MB) and 128 M ×72 (1 GB)
The memory array is designed with Double Data Rate Synchronous DRAMs for ECC applications. All control and
address signals are re-driven on the DIMM using register devices and a PLL for the clock distribution. This reduces
capacitive loading to the system bus, but adds one cycle to the SDRAM timing. A variety of decoupling capacitors
are mounted on the PC board. The DIMMs feature serial presence detect based on a serial E
the 2-pin I
available to the customer.
2
C protocol. The first 128 bytes are programmed with configuration data and the second 128 bytes are
2
PROM device using
Data Sheet6Rev. 1.0, 2004-03
07302003-2MI6-FOP1
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
Table 2Ordering Information
Type Compliance CodeDescriptionSDRAM
The pin configuration of the Registered DDR SDRAM
DIMM is listed by function in Table 3 (184 pins). The
abbreviations used in columns Pin and Buffer Type are
explained in Table 4 and Table 5 respectively. The pin
numbering is depicted in Figure 1.
Figure 5Block Diagram Raw Card D ×72 2 Ranks ×4, ECC
V
VDD/V
DQS7
DQ56
DQ57
DQ58
DQ59
DQS6
DQ48
DQ49
DQ50
DQ51
DQS15
DQ52
DQ53
DQ54
DQ55
DQS16
DQ60
DQ61
DQ62
DQ63
DQS14
DQ44
DQ45
DQ46
DQ47
DQS5
DQ40
DQ41
DQ42
DQ43
DQS4
DQ32
DQ33
DQ34
DQ35
DQS8
CB0
CB1
CB2
CB3
DQS13
DQ36
DQ37
DQ38
DQ39
DD,SPD
DDQ
V
REF
V
V
DDID
SS
Strap: see Note 1
VDD: SPD EEPROM E0
V
V
V
DM: SDRAMs D0 - D35
SCL
SAD
SA0
SA1
SA2
V
SS
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
Pin Configuration
: SDRAMs D0 - D35
DD/VDDQ
: SDRAMs D0 - D35
REF
: SDRAMs D0 - D35
SS
SCL
SAD
A0
A1
A2
WP
D5
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D1D3
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D13
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D9
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D21
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D17
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D25
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D28D31
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D33
CKE CS
DQS
I/O 0
I/O 1
I/O 2
I/O 3
MPBD1061
E0
D7
D15
D11
D23
D19
D27
D35
Notes
1.
V
DD
= V
, therefore V
DDQ
strap open
DDID
2. DQ, DQS, DM resistors are 18 ohms
±
5%
3. BAn, An, RAS, CAS, WE resistors are 22 ohms ±5%
4. For Wire per Clock Loading please see Figure
“Differental Clock Net Wiring“
Data Sheet16Rev. 1.0, 2004-03
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
Electrical Characteristics
3Electrical Characteristics
3.1Operating Conditions
Table 7Absolute Maximum Ratings
ParameterSymbolValuesUnit Note/ Test
min.typ.max.
Voltage on I/O pins relative to
Voltage on inputs relative to
Voltage on
Voltage on
V
supply relative to V
DD
V
supply relative to V
DDQ
Operating temperature (ambient)
Storage temperature (plastic)
Power dissipation (per SDRAM component)
Short circuit output current
V
SS
V
SS
SS
SS
V
V
V
V
T
T
P
I
IN
IN
DD
DDQ
A
STG
D
OUT
, V
–0.5–V
OUT
+0.5V–
DDQ
–1–+3.6V–
–1–+3.6V–
–1–+3.6V–
0–+70°C–
-55–+150°C–
–1–W–
–50–mA–
Attention: Permanent damage to the device may occur if “Absolute Maximum Ratings” are exceeded. This
is a stress rating only, and functional operation should be restricted to recommended operation
conditions. Exposure to absolute maximum rating conditions for extended periods of time may
affect device reliability and exceeding only one of the values may cause irreversible damage to
the integrated circuit.
Condition
Table 8Electrical Characteristics and DC Operating Conditions
ParameterSymbolValuesUnit Note/Test Condition
Voltage
Input Reference Voltage
I/O Termination Voltage
V
DD
V
DD
DDQ
DDQ
DDSPD
V
SS
V
SSQ
V
REF
V
TT
2.32.52.7V
f
≤ 166 MHz
CK
2.52.62.7VfCK>166MHz
2.32.52.7Vf
≤ 166 MHz
CK
2.52.62.7VfCK>166MHz
2.32.53.6V—
,
00V—
0.49 × V
V
– 0.04V
REF
DDQ
0.5 × V
DDQ
0.51 × V
+ 0.04 V
REF
DDQ
4)
V
5)
2)
3)
2)3)
(System)
Input High (Logic1) Voltage V
Input Low (Logic0) Voltage V
Input Voltage Level,
CK and CK
Inputs
Input Differential Voltage,
CK and CK
Inputs
VI-Matching Pull-up
V
V
VI
IH(DC)
IL(DC)
IN(DC)
ID(DC)
Ratio
V
+ 0.15V
REF
–0.3V
–0.3V
0.36V
+ 0.3V
DDQ
– 0.15 V
REF
+ 0.3V
DDQ
+ 0.6V
DDQ
0.711.4—
8)
8)
8)
8)6)
7)
Current to Pull-down
Current
1)
Data Sheet17Rev. 1.0, 2004-03
07302003-2MI6-FOP1
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
Electrical Characteristics
Table 8Electrical Characteristics and DC Operating Conditions (cont’d)
ParameterSymbolValuesUnit Note/Test Condition
1)
Min.Typ.Max.
Input Leakage Current
Output Leakage CurrentI
Output High Current,
I
I
OZ
I
OH
–22µAAny input 0 V ≤ VIN≤ VDD;
All other pins not under test
8)9)
=0V
–55µADQs are disabled;
0V ≤
V
—–16.2mAV
= 1.95 V
OUT
OUT
≤V
DDQ
Normal Strength Driver
Output Low
I
OL
16.2—mAV
= 0.35 V
OUT
Current, Normal Strength
Driver
1) 0 °C ≤ TA ≤ 70 °C
2) DDR400 conditions apply for all clock frequencies above 166 MHz
V
3) Under all conditions,
4) Peak to peak AC noise on
V
is not applied directly to the device. VTT is a system supply for signal termination resistors, is expected to be set equal
5)
TT
to V
, and must track variations in the DC level of V
REF
V
is the magnitude of the difference between the input level on CK and the input level on CK.
6)
ID
7) The ratio of the pull-up current to the pull-down current is specified for the same temperature and voltage, over the entire
temperature and voltage range, for device drain to source voltage from 0.25 to 1.0 V. For a given output, it represents the
maximum difference between pull-up and pull-down drivers due to process variation.
8) Inputs are not recognized as valid until
9) Values are shown per DDR SDRAM component
must be less than or equal to VDD.
DDQ
V
may not exceed ± 2% V
REF
V
stabilizes.
REF
REF (DC)
REF
. V
is also expected to track noise variations in V
REF
.
DDQ
.
Data Sheet18Rev. 1.0, 2004-03
07302003-2MI6-FOP1
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
Current Specification and Conditions
4Current Specification and Conditions
Table 9IDD Conditions
ParameterSymbol
Operating Current 0
one bank; active/ precharge; DQ, DM, and DQS inputs changing once per clock cycle;
address and control inputs changing once every two clock cycles.
Operating Current 1
one bank; active/read/precharge; Burst Length = 4; see component data sheet.
Precharge Power-Down Standby Current
all banks idle; power-down mode; CKE ≤
V
IL,MAX
Precharge Floating Standby Current
CS
≥V
address and other control inputs changing once per clock cycle;
, all banks idle; CKE ≥ V
IH,,MIN
IH,MIN
;
V
IN
= V
for DQ, DQS and DM.
REF
Precharge Quiet Standby Current
CS
≥V
address and other control inputs stable at ≥
, all banks idle; CKE ≥ V
IHMIN
IH,MIN
; VIN = V
V
IH,MIN
for DQ, DQS and DM;
REF
or ≤ V
IL,MAX
.
Active Power-Down Standby Current
one bank active; power-down mode; CKE ≤
V
ILMAX
; VIN = V
for DQ, DQS and DM.
REF
Active Standby Current
one bank active; CS
≥V
IH,MIN
; CKE ≥ V
IH,MIN
; tRC= t
RAS,MAX
;
DQ, DM and DQS inputs changing twice per clock cycle;
address and control inputs changing once per clock cycle.
Operating Current Read
one bank active; Burst Length = 2; reads; continuous burst;
address and control inputs changing once per clock cycle;
50% of data outputs changing on every clock edge;
CL = 2 for DDR266(A), CL = 3 for DDR333 and DDR400B;
I
OUT
=0mA
Operating Current Write
one bank active; Burst Length = 2; writes; continuous burst;
address and control inputs changing once per clock cycle;
50% of data outputs changing on every clock edge;
CL = 2 for DDR266(A), CL = 3 for DDR333 and DDR400B
Auto-Refresh Current
t
RC
= t
RFCMIN
, burst refresh
Self-Refresh Current
CKE ≤ 0.2 V; external clock on
Operating Current 7
four bank interleaving with Burst Length = 4; see component data sheet.
I
DD0
I
DD1
I
DD2P
I
DD2F
I
DD2Q
I
DD3P
I
DD3N
I
DD4R
I
DD4W
I
DD5
I
DD6
I
DD7
Data Sheet19Rev. 1.0, 2004-03
07302003-2MI6-FOP1
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
Table 10
I
Specification for PC3200
DD
Current Specification and Conditions
UnitNote/ Test Conditions1)
HYS72D32300GBR–5–C
HYS72D64300GBR–5–C
HYS72D64320GBR–5–C
256 MB512 MB512 MB
×72×72×72
1 Rank1 Rank2 Ranks
Part Number & Organization
–5–5–5
SymbolTyp.Max.Typ.Max.Typ.Max.
I
DD0
I
DD1
I
DD2P
I
DD2F
I
DD2Q
I
DD3P
I
DD3N
I
DD4R
I
DD4W
I
DD5
I
DD6
I
DD7
1) Test condition for maximum values: VDD=2.7V, TA=10°C
2) Module
3) The module IDD values are calculated from the component IDD datasheet values are:
n * I
n * I
4) DQ I/O (I
conditions
5) The module IDD values are calculated from the component IDD datasheet values are:
is calculated on the basis of component IDD and includes Register an PLL
DD
×[component] for single bank modules (n: number of components per module bank)
DD
×[component] + n * I
DD
) currents are not included into calculations: module IDD values will be measured differently depending on load
DDQ
×[component] for single bank modules (n: number of components per module bank)
DD
×[component] for single two bank modules (n: number of components per module bank)
DD
[component] for two bank modules (n: number of components per module bank)
DD3N
2)
3)
3)4)
5)
5)
5)
5)
5)
3)4)
3)
3)
5)
3)4)
Data Sheet21Rev. 1.0, 2004-03
07302003-2MI6-FOP1
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
Current Specification and Conditions
4.1AC Characteristics
Table 12AC Timing - Absolute Specifications for PC3200 and PC2700
ParameterSymbol –5–6Unit Note/ Test
CK
CK
CK
ns
CK
CK
CK
CK
CK
CK
Condition
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)6)
2)3)4)5)6)
2)3)4)5)7)
2)3)4)5)7)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)8)
2)3)4)5)9)
2)3)4)5)
3)4)5)6)10)
DQ output access time from CK/CK
DQS output access time from CK/CKt
CK high-level widtht
CK low-level widtht
Clock Half Periodt
Clock cycle timet
DQ and DM input hold timet
DQ and DM input setup timet
Control and Addr. input pulse width (each
input)
DQ and DM input pulse width (each input)t
Data-out high-impedance time from CK/CKt
Data-out low-impedance time from CK/CKt
Write command to 1st DQS latching transitiont
DQS-DQ skew (DQS and associated DQ
signals)
Data hold skew factort
DQ/DQS output hold timet
DQS input low (high) pulse width (write cycle)t
DQS falling edge to CK setup time (write cycle) t
DQS falling edge hold time from CK (write
cycle)
Mode register set command cycle timet
Write preamble setup timet
Write postamblet
Write preamblet
Address and control input setup timet
t
AC
DQSCK
CH
CL
HP
CK
DH
DS
t
IPW
DIPW
HZ
LZ
DQSS
t
DQSQ
QHS
QH
DQSL,H
DSS
t
DSH
MRD
WPRES
WPST
WPRE
IS
DDR400BDDR333
Min.Max.Min.Max.
–0.5+0.5–0.7+0.7ns
–0.6+0.6–0.6+0.6ns
0.450.550.450.55t
0.450.550.450.55t
min. (tCL, tCH)min. (tCL, tCH)ns
58612nsCL = 3.0
612612nsCL = 2.5
7.5127.512nsCL = 2.0
0.4—0.45—ns
0.4—0.45—ns
2.2—2.2—ns
1.75—1.75—ns
—+0.7–0.7+0.7ns
–0.7+0.7–0.7+0.7ns
0.721.250.751.25t
—+0.40—+0.40nsTFBGA
—+0.50—+0.50nsTFBGA
t
–t
HP
QHS
0.35—0.35—t
0.2—0.2—t
0.2—0.2—t
2—2—t
0—0—ns
0.400.600.400.60t
0.25—0.25—t
0.6—0.75—nsfast slew rate
1)
Address and control input hold timet
0.7—0.8—nsslow slew
IH
0.6—0.75—nsfast slew rate
3)4)5)6)10)
rate
3)4)5)6)10)
0.7—0.8—nsslow slew
3)4)5)6)10)
rate
Data Sheet22Rev. 1.0, 2004-03
07302003-2MI6-FOP1
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
Current Specification and Conditions
Table 12AC Timing - Absolute Specifications for PC3200 and PC2700
ParameterSymbol –5–6Unit Note/ Test
DDR400BDDR333
Condition
1)
Min.Max.Min.Max.
Read preamble
Read postamblet
Active to Precharge commandt
Active to Active/Auto-refresh command period t
Auto-refresh to Active/Auto-refresh command
t
RPRE
RPST
RAS
RC
t
RFC
0.91.10.91.1t
0.400.600.400.60t
4070E+34270E+3ns
55—60—ns
70—72—ns
CK
CK
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
period
ns
CK
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)
2)3)4)5)11)
Active to Read or Write delayt
Precharge command periodt
Active to Autoprecharge delayt
Active bank A to Active bank B commandt
Write recovery timet
Auto precharge write recovery + precharge
RCD
RP
RAP
RRD
WR
t
DAL
15—18—ns
15—18—ns
t
or t
RCD
RASmin
10—12—ns
15—15—ns
(tWR/tCK)+(tRP/tCK)t
time
Internal write to read command delayt
Exit self-refresh to non-read commandt
Exit self-refresh to read commandt
Average Periodic Refresh Intervalt
1) 0 °C ≤ TA ≤ 70 °C; V
= 2.5 V ± 0.2 V, VDD = +2.5 V ± 0.2 V (DDR333); V
DDQ
WTR
XSNR
XSRD
REFI
2—1—t
75—75—ns
200—200—t
—7.8—7.8µs
= 2.6 V ± 0.1 V, VDD = +2.6 V ± 0.1 V
DDQ
(DDR400)
2) Input slew rate ≥ 1 V/ns for DDR400, DDR333
3) The CK/CK
level for signals other than CK/CK, is V
4) Inputs are not recognized as valid until
input reference level (for timing reference to CK/CK) is the point at which CK and CK cross: the input reference
. CK/CK slew rate are ≥ 1.0 V/ns.
REF
V
stabilizes.
REF
5) The Output timing reference level, as measured at the timing reference point indicated in AC Characteristics (note 3) is
6) These parameters guarantee device timing, but they are not necessarily tested on each device.
t
and tLZ transitions occur in the same access time windows as valid data transitions. These parameters are not referred
7)
HZ
to a specific voltage level, but specify when the device is no longer driving (HZ), or begins driving (LZ).
8) The specific requirement is that DQS be valid (HIGH, LOW, or some point on a valid transition) on or before this CK edge.
A valid transition is defined as monotonic and meeting the input slew rate specifications of the device. When no writes were
previously in progress on the bus, DQS will be transitioning from Hi-Z to logic LOW. If a previous write was in progress,
t
DQS could be HIGH, LOW, or transitioning from HIGH to LOW at this time, depending on
DQSS
.
9) The maximum limit for this parameter is not a device limit. The device operates with a greater value for this parameter, but
system performance (bus turnaround) degrades accordingly.
10) Fast slew rate ≥ 1.0 V/ns , slow slew rate ≥ 0.5 V/ns and < 1 V/ns for command/address and CK & CK
measured between
IH(ac)
and V
IL(ac)
.
V
11) For each of the terms, if not already an integer, round to the next highest integer. tCK is equal to the actual system clock
cycle time.
12) A maximum of eight Autorefresh commands can be posted to any given DDR SDRAM device.
2)3)4)5)
CK
2)3)4)5)
2)3)4)5)
CK
2)3)4)5)12)
V
slew rate > 1.0 V/ns,
TT
.
Data Sheet23Rev. 1.0, 2004-03
07302003-2MI6-FOP1
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
5SPD Contents
Table 13SPD Codes for HYS72D[128/64/32][300/320]GBR–5–C
SPD Contents
HYS72D64300GBR–5–C
512 MB512 MB256 MB
×72×72×72
Product Type & Organization
Label CodePC3200R–30331PC3200R–30331PC3200R–30331
Jedec SPD RevisionRev 1.0Rev 1.0Rev 1.0
Byte#DescriptionHEXHEXHEX
0Programmed SPD Bytes in E2PROM808080
1Total number of Bytes in E2PROM080808
2Memory Type (DDR = 07h)070707
3Number of Row Addresses0D0D0D
4Number of Column Addresses0B0A0A
5Number of DIMM Ranks010201
6Data Width (LSB)484848
7Data Width (MSB)000000
8Interface Voltage Levels040404
9tCK @ CLmax (Byte 18) [ns]505050
10tAC SDRAM @ CLmax (Byte 18) [ns]505050
11 Error Correction Support020202
12 Refresh Rate828282
13 Primary SDRAM Width040808
14 Error Checking SDRAM Width040808
15 tCCD [cycles]010101
16 Burst Length Supported0E0E0E
17 Number of Banks on SDRAM Device040404
18 CAS Latency1C1C1C
19 CS Latency010101
20 Write Latency020202
21 DIMM Attributes262626
22 Component AttributesC1C1C1
23tCK @ CLmax -0.5 (Byte 18) [ns]606060
24tAC SDRAM @ CLmax -0.5 [ns]505050
25tCK @ CLmax -1 (Byte 18) [ns]757575
1 Rank2 Ranks1 Rank
HYS72D64320GBR–5–C
HYS72D32300GBR–5–C
Data Sheet24Rev. 1.0, 2004-03
07302003-2MI6-FOP1
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
Table 13SPD Codes for HYS72D[128/64/32][300/320]GBR–5–C
SPD Contents
HYS72D64300GBR–5–C
512 MB512 MB256 MB
×72×72×72
Product Type & Organization
Label CodePC3200R–30331PC3200R–30331PC3200R–30331
Jedec SPD RevisionRev 1.0Rev 1.0Rev 1.0
Table 14SPD Codes for HYS72D[128/64/32][300/320]GBR–6–C
SPD Contents
HYS72D128320GBR–6–C
1GByte512MB512MB256MB
×72×72×72×72
Product Type & Organization
Label CodePC2700R–
Jedec SPD RevisionRev 0.0Rev 0.0Rev 0.0Rev 0.0
Byte#DescriptionHEXHEXHEXHEX
0 Programmed SPD Bytes in E2PROM80808080
1 Total number of Bytes in E2PROM08080808
2 Memory Type (DDR = 07h)07070707
3 Number of Row Addresses0D0D0D0D
4 Number of Column Addresses0B0B0A0A
5 Number of DIMM Ranks02010201
6 Data Width (LSB)48484848
7 Data Width (MSB)00000000
8 Interface Voltage Levels04040404
9 tCK @ CLmax (Byte 18) [ns]60606060
10 tAC SDRAM @ CLmax (Byte 18) [ns]70707070
11 Error Correction Support02020202
12 Refresh Rate82828282
13 Primary SDRAM Width04040808
14 Error Checking SDRAM Width04040808
15 tCCD [cycles]01010101
16 Burst Length Supported0E0E0E0E
17 Number of Banks on SDRAM Device04040404
18 CAS Latency0C0C0C0C
19 CS Latency01010101
20 Write Latency02020202
21 DIMM Attributes26262626
22 Component AttributesC1C1C1C1
23 tCK @ CLmax -0.5 (Byte 18) [ns]75757575
24 tAC SDRAM @ CLmax -0.5 [ns]70707070
25 tCK @ CLmax -1 (Byte 18) [ns]00000000
2 Ranks1 Rank2 Ranks1 Rank
25330
HYS72D64300GBR–6–C
PC2700R–
25330
HYS72D64320GBR–6–C
PC2700R–
25330
HYS72D32300GBR–6–C
PC2700R–
25330
Data Sheet27Rev. 1.0, 2004-03
07302003-2MI6-FOP1
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
Table 14SPD Codes for HYS72D[128/64/32][300/320]GBR–6–C
SPD Contents
HYS72D128320GBR–6–C
1 GByte512 MB512 MB256 MB
×72×72×72×72
Product Type & Organization
Label CodePC2700R–
Jedec SPD RevisionRev 0.0Rev 0.0Rev 0.0Rev 0.0
Byte#DescriptionHEXHEXHEXHEX
26 tAC SDRAM @ CLmax -1 [ns]00000000
27 tRPmin [ns]48484848
28 tRRDmin [ns]30303030
29 tRCDmin [ns]48484848
30 tRASmin [ns]2A2A2A2A
31 Module Density per Rank80804040
32 tAS, tCS [ns]75757575
33 tAH, TCH [ns]75757575
34 tDS [ns]45454545
35 tDH [ns]45454545
36 - 40 not used00000000
41 tRCmin [ns]3C3C3C3C
42 tRFCmin [ns]48484848
43 tCKmax [ns]30303030
44 tDQSQmax [ns]28282828
45 tQHSmax [ns]50505050
46 not used00000000
47 DIMM PCB Height00000000
48 - 61 not used00000000
62 SPD Revision00000000
63 Checksum of Byte 0-624948100F
64 JEDEC ID Code of Infineon (1)C1C1C1C1
65 - 71JEDEC ID Code of Infineon (2 - 8)00000000
72 Module Manufacturer Locationxxxxxxxx
73 Part Number, Char 137373737
74 Part Number, Char 232323232
75 Part Number, Char 344444444
2 Ranks1 Rank2 Ranks1 Rank
25330
HYS72D64300GBR–6–C
PC2700R–
25330
HYS72D64320GBR–6–C
PC2700R–
25330
HYS72D32300GBR–6–C
PC2700R–
25330
Data Sheet28Rev. 1.0, 2004-03
07302003-2MI6-FOP1
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
Table 14SPD Codes for HYS72D[128/64/32][300/320]GBR–6–C
SPD Contents
HYS72D128320GBR–6–C
1GByte512MB512MB256MB
×72×72×72×72
Product Type & Organization
Label CodePC2700R–
Jedec SPD RevisionRev 0.0Rev 0.0Rev 0.0Rev 0.0
Byte#DescriptionHEXHEXHEXHEX
76 Part Number, Char 431363633
77 Part Number, Char 532343432
78 Part Number, Char 638333333
79 Part Number, Char 733303230
80 Part Number, Char 832303030
81 Part Number, Char 930474747
82 Part Number, Char 1047424242
83 Part Number, Char 1142525252
84 Part Number, Char 1252363636
85 Part Number, Char 1336434343
86 Part Number, Char 1443202020
87 Part Number, Char 1520202020
88 Part Number, Char 1620202020
89 Part Number, Char 1720202020
90 Part Number, Char 1820202020
91 Module Revision Codexxxxxxxx
92 Test Program Revision Codexxxxxxxx
93 Module Manufacturing Date Yearxxxxxxxx
94 Module Manufacturing Date Weekxxxxxxxx
95 - 98Module Serial Number (1 - 4)xxxxxxxx
99 -127 BlankFFFFFF0FF
2 Ranks1 Rank2 Ranks1 Rank
25330
HYS72D64300GBR–6–C
PC2700R–
25330
HYS72D64320GBR–6–C
PC2700R–
25330
HYS72D32300GBR–6–C
PC2700R–
25330
Data Sheet29Rev. 1.0, 2004-03
07302003-2MI6-FOP1
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
6Package Outlines
CA B
0.1
±0.1
4
1
±0.1
2.5
ø0.1
A
BC
64.77
133.35
128.95
6.62
2.175
Package Outlines
0.15
A
±0.13
28.58
92
6.35
49.53
B
0.4
BAC
2.64 MAX.
C
±0.1
1.27
±0.13
3.8
93
3 MIN.
Detail of contacts
0.2
1.27
1
±0.05
±0.2
2.5
95
x=120.65
1.27
1.8
0.1
A
CB
±0.1
0.1
BA
C
184
10
17.8
Burr max. 0.4 allowed
Figure 6Package Outlines – Raw Card A HYS72D32300GBR–[5/6]–C (1 Rank × 8)
Data Sheet30Rev. 1.0, 2004-03
L-DIMM-184-021
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
±0.1
4
CB
A
0.1
1
2.5
±0.1
ø0.1
A BC
64.77
133.35
128.95
6.62
2.175
1.2795 x=
A
92
6.35
49.53
120.65
Package Outlines
0.15
±0.13
28.58
B
0.4
4 MAX.
C
1.27
BAC
±0.1
±0.13
3.8
93
3 MIN.
Detail of contacts
0.2
1.27
Burr max. 0.4 allowed
±0.05
1
±0.2
2.5
0.1
ABC
1.8
±0.1
0.1
AB
C
184
10
17.8
L-DIMM-184-22-2
Figure 7Package Outlines – Raw Card C HYS72D64300GBR–[5/6]–C (1 Rank × 4)
Data Sheet31Rev. 1.0, 2004-03
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
6.62
x95
133.35
128.95
A
92
2.175
6.35
49.53
120.651.27 =
±0.1
4
B CA
0.1
1
2.5
±0.1
ø0.1
AB
64.77
C
Package Outlines
0.15
±0.13
28.58
B
C
0.4
4 MAX.
1.27
AB
±0.1
C
±0.13
3.8
93
3 MIN.
Detail of contacts
0.2
1.27
Burr max. 0.4 allowed
±0.05
±0.2
2.5
0.1
±0.1
1.8
C1B
A
0.1
BA
C
184
10
17.8
L-DIMM-184-23
Figure 8Package Outlines – Raw Card B HYS72D64320GBR–[5/6]–C (2 Ranks ×8)
Data Sheet32Rev. 1.0, 2004-03
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
133.35
±0.1
4
BC
A
0.1
1
2.5
±0.1
ø0.1
ABC
64.77
128.95
6.62
2.175
1.27
95 x120.65=
AA
92
6.35
49.53
Package Outlines
0.15
A BC
4 MAX.
±0.13
30.48
B
C
0.4
1.27
±0.1
±0.1
±0.13
3.8
93184
3 MIN.
Detail of contacts
±0.2
1
2.5
±0.05
0.1
0.2
1.27
Burr max. 0.4 allowed
1.8
CA
B
0.1
A
CB
10
17.8
L-DIMM-184-24-3
Figure 9Package Outlines – Raw Card D HYS72D128320GBR–[5/6]–C (2 Ranks ×4)
Data Sheet33Rev. 1.0, 2004-03
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
Application Note
7Application Note
Power Up and Power Management on DDR Registered DIMMs(according to JEDEC ballot JC-42.5 Item
1173)
184-pin Double Data Rate (DDR) Registered DIMMs include two new features to facilitate controlled power-up and
to minimize power consumption during low power mode. One feature is externally controlled via a systemgenerated RESET signal; the second is based on module detection of the input clocks. These enhancements
permit the modules to power up with SDRAM outputs in a High-Z state (eliminating risk of high current dissipations
and/or dotted I/Os), and result in the powering-down of module support devices (registers and Phase-Locked
Loop) when the memory is in Self-Refresh mode.
The new RESET pin controls power dissipation on the module’s registers and ensures that CKE and other SDRAM
inputs are maintained at a valid ‘low’ level during power-up and self refresh. When RESET is at a low level, all the
register outputs are forced to a low level, and all differential register input receivers are powered down, resulting
in very low register power consumption. The RESET
an asynchronous signal according to the attached details. Using this function also permits the system and DIMM
clocks to be stopped during memory Self Refresh operation, while ensuring that the SDRAMs stay in Self Refresh
mode.
Table 15RESET
Truth Table
pin, located on DIMM tab #10, is driven from the system as
Register InputsRegister
Outputs
RESET
HRisingFallingHH
HRisingFallingLL
HL or HL or HXQo
HHigh ZHigh ZXIllegal input
LX or Hi-ZX or Hi-ZX or Hi-ZL
X: Don’t care, Hi-Z: High Impedance, Qo: Data latched at the previous of CK rising and CK
As described in the table above, a low on the RESET
maintained low at the SDRAM pins (CKE being one of the 'Q' signals at the register output). Holding CKE low
maintains a high impedance state on the SDRAM DQ, DQS and DM outputs — where they will remain until
activated by a valid ‘read’ cycle. CKE low also maintains SDRAMs in Self Refresh mode when applicable.
The DDR PLL devices automatically detect clock activity above 20MHz. When an input clock frequency of 20MHz
or greater is detected, the PLL begins operation and initiates clock frequency lock (the minimum operating
frequency at which all specifications will be met is 95MHz). If the clock input frequency drops below 20MHz (actual
detect frequency will vary by vendor), the PLL VCO (Voltage Controlled Oscillator) is stopped, outputs are made
High-Z, and the differential inputs are powered down — resulting in a total PLL current consumption of less than
1mA. Use of this low power PLL function makes the use of the PLL RESET
inactive on the DIMM.
This application note describes the required and optional system sequences associated with the DDR Registered
DIMM 'RESET
bank DIMM. Because RESET
CKE to one physical DIMM bank through the use of the RESET
' function. It is important to note that all references to CKE refer to both CKE0 and CKE1 for a 2-
CKCKData in (D)Data out (Q)
applies to all DIMM register devices, it is therefore not possible to uniquely control
conditions
falling
input ensures that the Clock Enable (CKE) signal(s) are
(or G pin) unnecessary, and it is tied
pin.
Data Sheet34Rev. 1.0, 2004-03
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
Power-Up Sequence with RESET
1. The system sets RESET
This is the preferred default state during power-up. This input condition forces all register outputs to a low state
independent of the condition on the register inputs (data and clock), ensuring that CKE is at a stable low-level
at the DDR SDRAMs.
2. The power supplies should be initialized according to the JEDEC-approved initialization sequence for DDR
SDRAMs.
3. Stabilization of Clocks to the SDRAM
The system must drive clocks to the application frequency (PLL operation is not assured until the input clock
reaches 20 MHz). Stability of clocks at the SDRAMs will be affected by all applicable system clock devices,
and time must be allotted to permit all clock devices to settle. Once a stable clock is received at the DIMM PLL,
the required PLL stabilization time (assuming power to the DIMM is stable) is 100 microseconds. When a
stable clock is present at the SDRAM input (driven from the PLL), the DDR SDRAM requires 200 µsec prior to
SDRAM operation.
4. The system applies valid logic levels to the data inputs of the register (address and controls at the DIMM
connector).
CKE must be maintained low and all other inputs should be driven to a known state. In general these
commands can be determined by the system designer. One option is to apply an SDRAM ‘NOP’ command
(with CKE low), as this is the first command defined by the JEDEC initialization sequence (ideally this would
be a ‘NOP Deselect’ command). A second option is to apply low levels on all of the register inputs to be
consistent with the state of the register outputs.
5. The system switches RESET
The SDRAM is now functional and prepared to receive commands. Since the RESET
setting the RESET
must remain stable).
6. The system must maintain stable register inputs until normal register operation is attained.
The registers have an activation time that allows their clock receivers, data input receivers, and output drivers
sufficient time to be turned on and become stable. During this time the system must maintain the valid logic
levels described in step 5. It is also a functional requirement that the registers maintain a low state at the CKE
outputs to guarantee that the DDR SDRAMs continue to receive a low level on CKE. Register activation time
(
t (ACT) ), from asynchronous switching of RESET from low to high until the registers are stable and ready to
accept an input signal, is specified in the register and DIMM do-umentation.
7. The system can begin the JEDEC-defined DDR SDRAM power-up sequence (according to the JEDECpproved initialization sequence).
at a valid low level.
timing in relation to a specific clock edge is not required (during this period, register inputs
— Required
to a logic ‘high’ level.
Application Note
signal is asynchronous,
Self Refresh Entry (RESET
Self Refresh can be used to retain data in DDR SDRAM DIMMs even if the rest of the system is powered down
and the clocks are off. This mode allows the DDR SDRAMs on the DIMM to retain data without external clocking.
Self Refresh mode is an ideal time to utilize the RESET
(RESET
1. 1. The system applies Self Refresh entry command.
Note: Note: The commands reach the DDR SDRAM one clock later due to the additional register pipelining on a
2. The system sets RESET
3. The system turns off clock inputs to the DIMM. (Optional)
Data Sheet35Rev. 1.0, 2004-03
low deactivates register CK and CK, data input receivers, and data output drivers).
(CKE→Low, CS
Registered DIMM. After this command is issued to the SDRAM, all of the address and control and clock input
conditions to the SDRAM are Don’t Cares— with the exception of CKE.
This input condition forces all register outputs to a low state, independent of the condition on the registerm
inputs (data and clock), and ensures that CKE, and all other control and address signals, are a stable low-level
at the DDR SDRAMs. Since the RESET
specific clock edge is not required.
a. In order to reduce DIMM PLL current, the clock inputs to the DIMM are turned off, resulting in High-Z clock
→Low, RAS → Low, CAS→ Low, WE→ High)
low, clocks powered off) — Optional
pin, as this can reduce register power consumption
at a valid low level.
signal is asynchronous, setting the RESET timing in relation to a
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
inputs to both the SDRAMs and the registers. This must be done after the RESET
register (t (INACT). The deactivate time defines the time in which the clocks and the control and address
signals must maintain valid levels after RESET
documentation.
b.The system may release DIMM address and control inputs to High-Z.
This can be done after the RESET
the clocks and the control and the address signals must maintain valid levels after RESET
applied. It is highly recommended that CKE continue to remain low during this operation.
4. The DIMM is in lowest power Self Refresh mode.
Self Refresh Exit (RESET
1. Stabilization of Clocks to the SDRAM.
The system must drive clocks to the application frequency (PLL operation is not assured until the input clock
reaches ~20MHz). Stability of clocks at the SDRAMs will be affected by all applicable system clock devices,
and time must be allotted to permit all clock devices to settle. Once a stable clock is received at the DIMM PLL,
the required PLL stabilization time (assuming power to the DIMM is stable) is 100 microseconds.
2. The system applies valid logic levels to the data inputs of the register (address and controls at the DIMM
connector).
CKE must be maintained low and all other inputs should be driven to a known state. In general these
commands can be determined by the system designer. One option is to apply an SDRAM ‘NOP’ command
(with CKE low), as this is the first command defined by the JEDEC Self Refresh Exit sequence (ideally this
would be a ‘NOP Deselect’ command). A second option is to apply low levels on all of the register inputs, to
be consistent with the state of the register outputs.
3. The system switches RESET
The SDRAM is now functional and prepared to receive commands. Since the RESET
RESET
remain stable).
4. The system must maintain stable register inputs until normal register operation is attained.
The registers have an activation time that allows the clock receivers, input receivers, and output drivers
sufficient time to be turned on and become stable. During this time the system must maintain the valid logic
levels described in Step 2. It is also a functional requirement that the registers maintain a low state at the CKE
outputs to guarantee that the DDR SDRAMs continue to receive a low level on CKE. Register activation time
(t (ACT) ), from asynchronous switching of RESET
accept an input signal, is specified in the register and DIMM do-umentation.
5. System can begin the JEDEC-defined DDR SDRAM Self Refresh Exit Procedure.
timing relationship to a specific clock edge is not required (during this period, register inputs must
low, clocks powered off) — Optional
deactivate time of the register. The deactivate time defines the time in which
to a logic ‘high’ level.
low has been applied and is specified in the register and DIMM
from low to high until the registers are stable and ready to
Application Note
deactivate time of the
low has been
signal is asynchronous,
Self Refresh Entry (RESET
Although keeping the clocks running increases power consumption from the on-DIMM PLL during self refresh, this
is an alternate operating mode for these DIMMs.
Note: Note: The commands reach the DDR SDRAM one clock later due to the additional register pipelining on a
Registered DIMM. After this command is issued to the SDRAM, all of the address and control and clock input
conditions to the SDRAM are Don’t Cares — with the exception of CKE.
2. The system sets RESET
This input condition forces all register outputs to a low state, independent of the condition on the data and clock
register inputs, and ensures that CKE is a stable low-level at the DDR SDRAMs.
3. The system may release DIMM address and control inputs to High-Z.
This can be done after the RESET
the time in which the clocks and the control and the address signals must maintain valid levels after RESET
low has been applied. It is highly recommended that CKE continue to remain low during the operation.
4. The DIMM is in a low power, Self Refresh mode.
Data Sheet36Rev. 1.0, 2004-03
→ Low, RAS→ Low, CAS→ Low, WE→ High)
low, clocks running) — Optional
at a valid low level.
deactivate time of the register (t (INACT) ). The deactivate time describes
HYS72D[128/64/32][300/320]GBR–[5/6]–C
Registered Double Data Rate SDRAM
Self Refresh Exit (RESET
1. The system applies valid logic levels to the data inputs of the register (address and controls at the DIMM
connector). CKE must be maintained low and all other inputs should be driven to a known state. In general
these commands can be determined by the system designer. One option is to apply an SDRAM ‘NOP’
command (with CKE low), as this is the first command defined by the Self Refresh Exit sequence (ideally this
would be a ‘NOP Deselect’ command). A second option is to apply low levels on all of the register inputs to be
consistent with the state of the register outputs.
2. The system switches RESET
The SDRAM is now functional and prepared to receive commands. Since the RESET
it does not need to be tied to a particular clock edge (during this period, register inputs must continue to remain
stable).
3. The system must maintain stable register inputs until normal register operation is attained.
The registers have an activation time that allows the clock receivers, input receivers, and output drivers
sufficient time to be turned on and become stable. During this time the system must maintain the valid logic
levels described in Step 1. It is also a functional requirement that the registers maintain a low state at the CKE
outputs in order to guarantee that the DDR SDRAMs continue to receive a low level on CKE. This activation
time, from asynchronous switching of RESET
an input signal, is t (ACT ) as specified in the register and DIMM documentation.
4. The system can begin JEDEC defined DDR SDRAM Self Refresh Exit Procedure.
Self Refresh Entry/Exit (RESET
As this sequence does not involve the use of the RESET
explains in detail the method for entering and exiting Self Refresh for this case.
low, clocks running) — Optional
to a logic 'high' level.
from low to high, until the registers are stable and ready to accept
high, clocks running) — Optional
function, the JEDEC standard SDRAM specification
Application Note
signal is asynchronous,
Self Refresh Entry (RESET
In order to maintain a valid low level on the register output, it is required that either the clocks be running and the
system drive a low level on CKE, or the clocks are powered off and RESET
sequence defined in this application note. In the case where RESET
the PLL drives a High-Z clock input into the register clock input. Without the low level on RESET
state will result.
high, clocks powered off) — Not Permissible
remains high and the clocks are powered off,
is asserted low according to the
an unknown DIMM
Data Sheet37Rev. 1.0, 2004-03
www.infineon.com
Published by Infineon Technologies AG
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