INFINEON HYB39S256400DT-6, HYB39S256400DT-7, HYB39S256400DT-7.5, HYB39S256400DT-8, HYB39S256800DT-6 User Manual

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HYB39S256400D[C/T](L) HYB39S256800D[C/T](L) HYB39S256160D[C/T](L)
256-MBit Synchronous DRAM SDRAM
Memory Products
Never stop thinking.
Edition 2004-02 Published by Infineon Technologies AG,
St.-Martin-Strasse 53, 81669 München, Germany
© Infineon Technologies AG 2004.
All Rights Reserved. Attention please!
The information herein is given to describe certain components and shall not be considered as a guarantee of characteristics.
Terms of delivery and rights to technical change reserved. We hereby disclaim an y and all war ranties , including b ut not limited to w arranties of non -infringement, regarding
circuits, descriptions and charts stated herein. Infineon Technologies is an appro ved CECC manufacturer.
Information
For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office in Germany or our Infineon Technologies Representatives worldwide (www.infineon.com).
Warnings
Due to technical requirements components may contain dangerous substances. For in formation on the types in question please contact your nearest Infineon Technologies Office.
Infineon Technologies Components ma y only be used in lif e-support devices or systems with the e xpress written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
Data Sheet, Rev. 1.02, Feb. 2004
HYB39S256400D[C/T](L) HYB39S256800D[C/T](L) HYB39S256160D[C/T](L)
256-MBit Synchronous DRAM SDRAM
Memory Products
Memory Products
Never stop thinking.
HYB39S256[40/80/16]0D[C/T](L)
Revision History: Rev. 1.02 2004-02
Page Subjects (major changes since last revision) 17 Corrected Mode Register Definition in chapter 3 all Various layout and editorial changes Previous Version: Rev. 1.01 2004-01 all Various layout and editorial changes Previous Version: Rev. 1.0 2002-06
We Listen to Your Comments
Any information within this document that you feel is wrong, unclear or missing at all? Your feedback will help us to continuously improve the quality of this document. Please send your proposal (including a reference to this do cument) to:
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Template: mp_a4_v2.0_2003-06-06.fm
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Table of Contents Page
1 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
1.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
1.2 Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
2 Pin Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2.1 Signal Pin Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2.2 Package P–TSOPII–54 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2.3 Package P–TFBGA–54 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.4 Block Diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
3 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3.1 Operation Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3.2 Initialization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
3.3 Mode Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
3.3.1 Burst Length . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
3.4 Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
3.5 Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
3.5.1 Read and Write . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
3.5.2 DQM Function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
3.5.3 Suspend Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
3.5.4 Power Down . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
4 Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
4.1 Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
4.2 AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
5 Package Outlines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Data Sheet 5 Rev. 1.02, 2004-02
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
1Overview
1.1 Features
Fully Synchronous to Positive Clock Edge
0 to 70 °C operating temperature
Four Banks controlled by BA0 & BA1
Programmable CAS
Programmable Wrap Sequence: Sequential or Interleave
Programmable Burst Length: 1, 2, 4, 8 and full page
Multiple Burst Read with Single Write Operation
Automatic and Controlled Precharge Command
Data Mask for Read / Write control (x4, x8)
Data Mask for byte control (x16)
Auto Refresh (CBR) and Self Refresh
Power Down and Clock Suspend Mode
8192 refresh cycles / 64 ms (7,8 µs)
Random Column Address every CLK (1-N Rule)
Single 3.3 V
LVTTL Interface versions
Plastic Packages: P–TSOPII–54 400mil width (x4, x8, x16)
Chipsize Packages: P–TFBGA–54 (12 mm x 8 mm)
± 0.3 V Power Supply
Latency: 2 & 3
Overview
Table 1 Performance Part Number Speed Code –6–7-7.5–8Unit
Speed Grade PC166 3–3–3 PC133 2–2–2 PC133 3–3–3 PC100 2–2–2 — max. Clock Frequency @CL3
@CL2
f
166 143 133 125 MHz
CK3
t
677.58ns
CK3
t
5 5.4 5.4 6 ns
AC3
t
7.5 7.5 10 10 ns
CK2
t
5.4 5.4 6 6 ns
AC2
1.2 Description
The HYB39S256[40/80/16]0D[C/T](L) are four bank Synchronous DRAM’s organized as 4 banks x 16 MBit x4, 4 banks x 8 MBit x8 and 4 banks x 4 Mbit x16 respectively. These synchronous devices achieve high speed data transfer rates for CAS synchronizes the output data to a system clock. The chip is fabricated with INFINEON’s advanced 0.14 µm 256-MBit DRAM process technology.
The device is designed to comply with all industry standards set for synchronous DRAM products, both e lectrically and mechanically. All of the contro l, address, data input and output circuits are synchronized with the positive edge of an externally supplied clock.
Operating the four memory banks in an interleave fashion allows random access operation to occur at a higher rate than is possible with standard DRAMs. A sequential and gapless data rate is possible depending on burst length, CAS
Auto Refresh (CBR) and Self Refresh opera tion are supporte d. These d evices opera te with a single 3.3V power supply. All 256-Mbit components are available in P–TSOPII–54 and P–TFBGA–54 packages.
latency and speed grade of the device.
-latencies by employing a chip architecture that prefetches multiple bits and then
± 0.3 V
Data Sheet 6 Rev. 1.02, 2004-02 10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Table 2 Ordering Information Type Speed Grade Package Description
HYB 39S256400DT-6 PC166-333-520 P-TSOP-54-2 (400mil) 166MHz 4B x 16M x 4 SDRAM HYB 39S256400DT-7 PC133-222-520 P-TSOP-54-2 (400mil) 143MHz 4B x 16M x 4 SDRAM HYB 39S256400DT-7.5 PC133-333-520 P-TSOP-54-2 (400mil) 133MHz 4B x 16M x 4 SDRAM HYB 39S256400DT-8 PC100-222-620 P-TSOP-54-2 (400mil) 125MHz 4B x 16M x 4 SDRAM HYB 39S256800DT-6 PC166-333-520 P-TSOP-54-2 (400mil) 166MHz 4B x 8M x 8 SDRAM HYB 39S256800DT-7 PC133-222-520 P-TSOP-54-2 (400mil) 143MHz 4B x 8M x 8 SDRAM HYB 39S256800DT-7.5 PC133-333-520 P-TSOP-54-2 (400mil) 133MHz 4B x 8M x 8 SDRAM HYB 39S256800DT-8 PC100-222-620 P-TSOP-54-2 (400mil) 125MHz 4B x 8M x 8 SDRAM HYB 39S256160DT-6 PC166-333-520 P-TSOP-54-2 (400mil) 166MHz 4B x 4M x 16 SDRAM HYB 39S256160DT-7 PC133-222-520 P-TSOP-54-2 (400mil) 143MHz 4B x 4M x 16 SDRAM HYB 39S256160DT-7.5 PC133-333-520 P-TSOP-54-2 (400mil) 133MHz 4B x 4M x 16 SDRAM HYB 39S256160DT-8 PC100-222-620 P-TSOP-54-2 (400mil) 125MHz 4B x 4M x 16 SDRAM HYB39S256400DTL-x P-TSOP-54-2 (400mil) 4B x 16M x 4 SDRAM Low Power
Versions (on request)
HYB39S256800DTL-x P-TSOP-54-2 (400mil) 4B x 8M x 8 SDRAM Low Power
Versions (on request)
HYB39S256160DTL-x P-TSOP-54-2 (400mil) 4B x 4M x 16 SDRAM Low Power
Versions (on request)
HYB39S256xx0DC(L)-x – P-TFBGA-54 (on request)
Overview
Data Sheet 7 Rev. 1.02, 2004-02 10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
2 Pin Configuration
2.1 Signal Pin Description
Table 3 Signal Pin Description Pin Type Signal Polarity Function
CLK Input Pulse Positive
Edge
CKE Input Level Active
High
CS
RAS CAS WE
A0 - A12 Input Level Address Inputs
BA0, BA1 Input Level Bank Select
DQx Input
DQM LDQM UDQM
Input Pulse Active
Low
Input Pulse Active
Low
Level Data Input/Output
Output
Input Pulse Active
High
Clock Input
The system clock input. All of the SDRAM inputs are sampled on the rising edge of the clock.
Clock Enable
Activates the CLK signal when high and deactivates the CLK signal when low, thereby initiating either the Powe r Down mode, Suspend mode, or the Self Refresh mode.
Chip Select
CS
enables the command decoder when low and disables the command decoder when high. When the command decoder is disabled, new commands are ignored but previous operations continue.
Command Signals
When sampled at the positive rising edge of the clock, CAS define the command to be executed by the SDRAM.
During a Bank Activate command cycle, A0-A12 define the row address (RA0-RA12) when sampled at the rising clock edge. During a Read or Write command cycle, A0-An define the column address (CA0-CAn) when sampled at the rising clock edge. CAn depends upon the SDRAM organization: 64M x4 SDRAM CAn = CA9, CA11 (Page Length = 2048 bits) 32M x8 SDRAM CAn = CA9 (Page Length = 1024 bits) 16M x16 SDRAM CAn = CA8 (Page Length = 512 bits) In addition to the column address, A10 (= AP) is used to invoke the autoprecharge operation at the end of the b urst read or write cycle . If A10 is high, autoprecharge is selected and BA0, BA1 defines the bank to be precharged. If A10 is low, autoprecharge is disabled. During a Precharge command cycle, A10 (= AP) is used in conjunction with BA0 and BA1 to control which bank(s) to pr echarge. If A10 is h igh, all four banks will be precharged regardless of the state of BA0 and BA1. If A10 is low, then BA0 and BA1 are used to define which bank to precharge.
Bank Select Inputs. Bank address inputs selects which of the four banks a command applies to.
Data Input/Output pins operate in the same manner as on EDO or FPM DRAMs.
Data Mask
The Data Input/Output mask places the DQ buffers in a high impedance state when sampled high. In Read mode, DQM has a latency of two clock cycles and controls the output buffers like an output enable. In Write mo de, DQM has a latency of zero and operates as a word mask by allowing input data to be written if it is low but blocks the write operation if DQM is high. One DQM input is present in x4 and x8 SDRAMs, LDQM and UDQM controls the lower and upper bytes in x16 SDRAMs.
Pin Configuration
, RAS, and WE
Data Sheet 8 Rev. 1.02, 2004-02 10072003-13LE-FGQQ
HYB39S256[40/80/16]0D[C/T](L)
256-MBit Synchronous DRAM
Table 3 Signal Pin Description Pin Type Signal Polarity Function
V
DD VSS
Supply – Power and Ground
Power and ground for the input buffers and the core logic (3 .3 V)
V
DDQ VSSQ
Supply – Power and Ground for DQs
Isolated power supply and ground for the output buffers to provide improved noise immunity.
NC Not Connected
No internal electrical connection is present.
2.2 Package P–TSOPII–54
16 M x 16
32 M x 8 64 M x 4
V
V
DD
DD
DQ0
DQ0
V
V
DDQ
SSQ
DDQ
SSQ
DD
DD
DDQ
N.C. DQ1
V
SSQ
N.C. DQ2
V
DDQ
N.C. DQ3
V
SSQ
N.C.
V
DD
N.C. WE CAS RAS CS BA0
A10/AP A0 A1 A2 A3
V
DD
DQ1 DQ2
V
DQ3 DQ4
V
DQ5 DQ6
V
DQ7
V
LDQM WE CAS RAS CS BA0 BA1 BA1 A10/AP A0 A1 A2 A3
V
V
DD
N.C.
V
DDQ
N.C. DQ0
V
SSQ
N.C. N.C.
V
DDQ
N.C. DQ1
V
SSQ
N.C.
V
DD
N.C. WE CAS RAS CS BA0 BA1 A10/AP A0 A1 A2 A3
V
DD
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27
54 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28
V
N.C.
V
N.C. DQ3
V
N.C. N.C.
V
N.C. DQ2
V
N.C.
V
N.C. DQM CLK CKE A12 A11 A9 A9 A8 A7 A6 A5 A4
V
SS
SSQ
DDQ
SSQ
DDQ
SS
SS
V
DQ7
V
N.C. DQ6
V
N.C. DQ5
V
N.C. DQ4
V
N.C.
V
N.C. DQM CLK CKE A12 A11
A8 A7 A6 A5 A4
V
SS
SSQ
DDQ
SSQ
DDQ
SS
SS
V
SS
DQ15
V
SSQ
DQ14 DQ13
V
DDQ
DQ12 DQ11
V
SSQ
DQ10 DQ9
V
DDQ
DQ8
V
SS
N.C. UDQM CLK CKE A12 A11 A9 A8 A7 A6 A5 A4
V
SS
Pin Configuration
TSOPII-54 (400 mil x 875 mil, 0.8 mm pitch)
SPP04126
Figure 1 Pinouts P–TSOPII–54
Data Sheet 9 Rev. 1.02, 2004-02 10072003-13LE-FGQQ
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