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IDT54/74FCT821AT/BT/CT, 823/825AT/BT/CT/DT
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTERS MILITARY AND COMMERCIAL TEMPERATURE RANGES
HIGH-PERFORMANCE
CMOS BUS
INTERFACE REGISTERS
Integrated Device Technology, Inc.
IDT54/74FCT821AT/BT/CT
IDT54/74FCT823AT/BT/CT/DT
IDT54/74FCT825AT/BT/CT
FEATURES:
• Common features:
– Low input and output leakage ≤1µA (max.)
– CMOS power levels
– True TTL input and output compatibility
– VOH = 3.3V (typ.)
– V
OL = 0.3V (typ.)
– Meets or exceeds JEDEC standard 18 specifications
– Product available in Radiation Tolerant and Radiation
Enhanced versions
– Military product compliant to MIL-STD-883, Class B
and DESC listed (dual marked)
– Available in DIP, SOIC, SSOP, QSOP, CERPACK
and LCC packages
• Features for FCT821T/FCT823T/FCT825T:
– A, B, C and D speed grades
– High drive outputs (-15mA IOH, 48mA IOL)
– Power off disable outputs permit “live insertion”
FUNCTIONAL BLOCK DIAGRAM
DESCRIPTION:
The FCT82xT series is built using an advanced dual metal
CMOS technology. The FCT82xT series bus interface registers are designed to eliminate the extra packages required to
buffer existing registers and provide extra data width for wider
address/data paths or buses carrying parity. The FCT821T
are buffered, 10-bit wide versions of the popular FCT374T
function. The FCT823T are 9-bit wide buffered registers with
Clock Enable (EN) and Clear (
interfacing in high-performance microprogrammed systems.
The FCT825T are 8-bit buffered registers with all the FCT823T
controls plus multiple enables (OE1, OE2, OE3) to allow multiuser control of the interface, e.g., CS, DMA and RD/WR. They
are ideal for use as an output port requiring high I
The FCT82xT high-performance interface family can drive
large capacitive loads, while providing low-capacitance bus
loading at both inputs and outputs. All inputs have clamp
diodes and all outputs are designed for low-capacitance bus
loading in high-impedance state.
CLR
) – ideal for parity bus
OL/IOH.
D
EN
CLR
CP
OE
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
0
CL
D
Q
CP
Q
Y
0
D
N
CL
D
Q
CP
Q
Y
N
2567 drw 01
MILITARY AND COMMERCIAL TEMPERATURE RANGES AUGUST 1995
1995 Integrated Device Technology, Inc 6.21 DSC-4202/5
6.21 1
1
IDT54/74FCT821AT/BT/CT, 823/825AT/BT/CT/DT
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTERS MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN CONFIGURATIONS
FCT821 10-BIT REGISTER
OE
D
0
2
D1
3
4
5
SO24-2
6
SO24-7
7
SO24-8
8
9
10
11
12
P24-1
D24-1
&
E24-1
D2
D3
D4
D5
D6
D7
D
D9
GND
8
DIP/SOIC/SSOP/QSOP/CERPACK
TOP VIEW
FCT823 9-BIT REGISTER
1
OE
2
0
D
3
D
1
D
2
D
3
D
4
D
5
D
6
D
7
8
D
CLR
GND
DIP/SOIC/SSOP/QSOP/CERPACK
P24-1
4
D24-1
5
SO24-2
6
SO24-7
7
SO24-8
8
&
9
E24-1
10
11
12
TOP VIEW
24
23
22
21
20
19
18
17
16
15
14
13
24
23
22
21
20
19
18
17
16
15
14
13
VCC1
Y
Y1
Y2
Y3
Y4
Y
Y6
Y7
Y8
Y9
CP
V
Y
Y
Y
Y
Y
Y
Y
Y
Y
EN
CP
0
5
CC
0
1
2
3
4
5
6
7
8
INDEX
INDEX
D2
D3
D4
NC
D
D6
D7
D
D
D
NC
D
D
D
1
D0
D
32
4
5
6
7
8
9
5
10
11
1213
D9
D8
NC
OE
1
L28-1
NC
GND
CC
V
CP
Y0
Y1
262728
Y2
25
Y3
24
Y4
23
NC
22
Y
21
20
19
5
Y6
Y7
1817161514
9
Y8
Y
2567 drw 02
LCC
TOP VIEW
0
1
D
D
4
2
3
4
32
5
6
7
8
9
5
6
10
11
7
1213
8
D
CLR
NC
OE
1
L28-1
NC
GND
CC
V
CP
0
Y
1817161514
EN
1
Y
262728
25
Y
2
24
Y
3
23
Y
4
NC
22
21
20
19
8
Y
5
Y
Y
6
Y
7
2567 drw 03
LCC
TOP VIEW
FCT825 8-BIT REGISTER
OE1
OE2
CLR
GND
2
D0
3
D1
4
P24-1
5
6
7
8
9
10
D24-1
SO24-2
SO24-8
&
E24-1
D2
D3
D4
D5
D6
D7
11
12
DIP/SOIC/QSOP/CERPACK
TOP VIEW
24
23
22
21
20
19
18
17
16
15
14
13
VCC1
OE3
0
Y
Y1
Y2
Y3
Y4
5
Y
Y6
Y7
EN
CP
INDEX
D1
D
D3
NC
D
D5
D6
2
1
0
D
OE
OE
32
4
5
6
2
7
8
9
4
L28-1
10
11
1213
7
D
GND
CLR
1
NC
NC
3
VCCOE
CP
EN
0
Y
262728
Y1
25
Y2
24
Y3
23
NC
22
Y
21
20
19
4
Y5
Y6
1817161514
7
Y
2567 drw 04
LCC
TOP VIEW
6.21 2
IDT54/74FCT821AT/BT/CT, 823/825AT/BT/CT/DT
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTERS MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN DESCRIPTION
Names I/O Description
DI I The D flip-flop data inputs.
CLR
CP I Clock Pulse for the Register; enters
YI O The register 3-state outputs.
EN
OE
I When the clear input is LOW and OE is
LOW, the Q
I outputs are LOW. When
the clear input is HIGH, data can be
entered into the register.
data into the register on the LOW-toHIGH transition.
I Clock Enable. When the clock enable is
LOW, data on the D
to the Q
I output on the LOW-to-HIGH
I input is transferred
clock transition. When the clock enable
is HIGH, the Q
I outputs do not change
state, regardless of the data or clock
input transitions.
I Output Control. When the OE input is
HIGH, the Y
I outputs are in the high-
impedance state. When the OE input is
LOW, the TRUE register data is present
at the Y
I outputs.
2567 tbl 01
FUNCTION TABLE
Inputs
OEOECLR
CLRENEN
H
H
H
H
H
L
H
H
L
H
H
H
H
H
L
H
L
H
NOTE: 2567 tbl 02
1. H = HIGH
L = LOW
X = Don’t Care
NC = No Change
↑ = LOW-to-HIGH Transition
Z = High Impedance
L
L
L
X
L
X
H
H
L
L
L
L
(1)
Internal/
Outputs
DI CP QI YI
L
↑
L
H
X
X
X
X
L
H
L
H
↑
X
X
X
X
↑
↑
↑
↑
H
L
L
NC
NCZNC
L
H
L
H
Z
Z
Z
L
Z
Z
L
H
Function
High Z
Clear
Hold
Load
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Rating Commercial Military Unit
(2)
VTERM
Terminal Voltage
–0.5 to +7.0 –0.5 to +7.0 V
with Respect to
GND
(3)
VTERM
TA Operating
Terminal Voltage
with Respect to
GND
–0.5 to
CC +0.5
V
–0.5 to
VCC +0.5
0 to +70 –55 to +125 °C
V
Temperature
TBIAS Temperature
–55 to +125 –65 to +135 °C
Under Bias
TSTG Storage
–55 to +125 –65 to +150 °C
Temperature
PT Power Dissipation 0.5 0.5 W
IOUT DC Output
–60 to +120 –60 to +120 mA
Current
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability. No terminal voltage may exceed
CC by +0.5V unless otherwise noted.
V
2. Input and V
3. Outputs and I/O terminals only.
CC terminals only.
2567 lnk 03
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Parameter
CIN Input
Capacitance
COUT Output
Capacitance
NOTE:
1. This parameter is measured at characterization but not tested.
(1)
Conditions Typ. Max. Unit
VIN = 0V 6 10 pF
VOUT = 0V 8 12 pF
2567 lnk 04
6.21 3