Integrated Device Technology Inc IDT74FCT543DB, IDT74FCT543D, IDT74FCT543CPB, IDT74FCT543CP, IDT74FCT543CLB Datasheet
...
Integrated Device Technology, Inc.
FAST CMOS
OCTAL LATCHED
TRANSCEIVER
IDT54/74FCT543
IDT54/74FCT543A
IDT54/74FCT543C
FEATURES:
• IDT54/74FCT543 equivalent to FAST speed
• IDT54/74FCT543A 25% faster than FAST
• IDT54/74FCT543C 40% faster than FAST
• Equivalent to FAST output drive over full temperature
and voltage supply extremes
•IOL = 64mA (commercial), 48mA (military)
• Separate controls for data flow in each direction
• Back-to-back latches for storage
• CMOS power levels (1mW typ. static)
• Substantially lower input current levels than FAST
(5µA max.)
• TTL input and output level compatible
• CMOS output level compatible
• Product available in Radiation Tolerant and Radiation
Enhanced versions
• Military product compliant to MIL-STD-883, Class B
FUNCTIONAL BLOCK DIAGRAMS
Q
D
LE
DESCRIPTION:
The IDT54/74FCT543/A/C is a non-inverting octal transceiver built using an advanced dual metal CMOS technology.
These devices contain two sets of eight D-type latches with
separate input and output controls for each set. For data flow
from A to B, for example, the A-to-B Enable (
be LOW in order to enter data from A0–A7 or to take data from
B0–B7, as indicated in the Function Table. With
a LOW signal on the A-to-B Latch Enable (
the A-to-B latches transparent; a subsequent LOW-to-HIGH
transition of the
LEAB
signal puts the A latches in the storage
mode and their outputs no longer change with the A inputs.
With
CEAB
and
OEAB
both LOW, the 3-state B output buffers
are active and reflect the data present at the output of the A
latches. Control of data from B to A is similar, but uses the
CEBA, LEBA
and
DETAIL A
OEBA
inputs.
B0
CEAB
LEAB
) input must
CEAB
LOW,
) input makes
D
A0
A1
A2
A3
A4
A5
A6
A7
OEBA
CEBA
LEBA
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
FAST is a registered trademark of National Semiconductor Co.
DETAIL A x 7
Q
LE
B1
B2
B3
B4
B5
B6
B7
OEAB
CEAB
LEAB
2614 drw 01
MILITARY AND COMMERCIAL TEMPERATURE RANGES MAY 1992
1992 Integrated Device Technology, Inc. 7.17 DSC-4602/3
1
IDT54/74FCT543/A/C
FAST CMOS OCTAL LATCHED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN CONFIGURATIONS
IDT54/74FCT861 10-BIT TRANSCEIVERS
LEBA
OEBA
A
A1
A2
A3
A4
A5
A
A7
CEAB
GND
1
2
3
0
P24-1,
4
D24-1,
5
SO24-2
6
7
E24-1
8
9
6
10
11
12
DIP/SOIC/CERPACK
TOP VIEW
24
Vcc
23
CEBA
22
21
20
19
&
18
17
16
15
14
13
0
B
B1
B2
B3
B4
B5
B6
B7
LEAB
OEAB
PIN DESCRIPTION
Pin Names Description
OEAB
OEBA
CEAB
CEBA
LEAB
LEBA
0–A7 A-to-B Data Inputs or B-to-A 3-State Outputs
A
0–B7 B-to-A Data Inputs or A-to-B 3-State Outputs
B
A-to-B Output Enable Input (Active LOW)
B-to-A Output Enable Input (Active LOW)
A-to-B Enable Input (Active LOW)
B-to-A Enable Input (Active LOW)
A-to-B Latch Enable Input (Active LOW)
B-to-A Latch Enable Input (Active LOW)
LOGIC SYMBOL
2614 tbl 02
INDEX
A1
A2
A3
NC
A4
A5
A6
A0LEBA
OEBA
NC
Vcc
432128 27 26
5
6
7
8
9
10
11
L28-1
12 13 14 15 16 17 18
A7
GND
CEAB
NC
CEBA
LEAB
OEAB
B0
25
24
23
22
21
20
19
7
B
1
B
B2
B3
NC
B4
B5
B6
2614 drw 02
LCC
TOP VIEW
FUNCTION TABLE
(1,2)
For A-to-B (Symmetric with B-to-A)
Latch Output
Inputs Status Buffers
CEAB
CEAB
— H — Storing —
— — H — High Z
NOTES: 2614 tbl 01
1. * Before
H = HIGH Voltage Level
L = LOW Voltage Level
— = Don’t Care or Irrelevant
2. A-to-B data flow shown; B-to-A flow control is the same, except using
CEBA, LEBA
LEAB
LEAB
OEAB
OEAB
A-to-B B
0–B7
H — — Storing High Z
L L L Transparent Current A Inputs
L H L Storing Previous* A Inputs
LEAB
LOW-to-HIGH Transition
and
OEBA
.
LEAB CEAB CEBA LEBA
A
0
A1
A2
A3
A4
A5
A6
A7
OEBA
B0
B1
B2
B3
B4
B5
B6
B7
OEAB
2614 drw 03
7.17 2
IDT54/74FCT543/A/C
FAST CMOS OCTAL LATCHED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Rating Commercial Military Unit
(2)
V
TERM
Terminal Voltage –0.5 to +7.0 –0.5 to +7.0 V
with Respect
to GND
(3)
V
TERM
Terminal Voltage –0.5 to VCC –0.5 to VCC V
with Respect
to GND
T
A Operating 0 to +70 –55 to +125 °C
Temperature
T
BIAS Temperature –55 to +125 –65 to +135 °C
Under Bias
T
STG Storage –55 to +125 –65 to +150 °C
Temperature
P
T Power Dissipation 0.5 0.5 W
I
OUT DC Output Current 120 120 mA
NOTES: 2614 tbl 03
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage
may exceed V
2. Inputs and V
3. Outputs and I/O terminals only.
CC by +0.5V unless otherwise noted.
CC terminals only.
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Parameter
IN Input Capacitance VIN = 0V 6 10 pF
C
I/O I/O Capacitance VOUT = 0V 8 12 pF
C
NOTE: 2614 tbl 04
1. This parameter is guaranteed by characterization data and not tested.
(1)
Conditions Typ. Max. Unit
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V, VHC = VCC – 0.2V
Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol Parameter Test Conditions
IH Input HIGH Level Guaranteed Logic HIGH Level 2.0 — — V
V
IL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V
V
IH Input HIGH Current VCC = Max. VI = VCC ——5µA
I
(Except I/O pins) V
(1)
I = 2.7V — — 5
Min. Typ.
IIL Input LOW Current VI = 0.5V ——–5
(Except I/O pins) V
IH Input HIGH Current VCC = Max. VI = VCC ——15µA
I
(I/O pins Only) V
I = GND — — –5
I = 2.7V — — 15
IIL Input LOW Current VI = 0.5V — — –15
(I/O pins Only) V
IK Clamp Diode Voltage VCC = Min., IN = –18mA — –0.7 –1.2 V
V
OS Short Circuit Current V CC = Max.
I
OH Output HIGH Voltage VCC = 3V, VIN = VLC or VHC, IOH = –32µAVHC VCC —V
V
CC = Min. IOH = –300µAVHC
V
IN = VIH or VIL IOH = –12mA MIL. 2.4 4.3 —
V
OL Output LOW Voltage VCC = 3V, VIN = VLC or VHC, IOL = 300µA — GND VLC V
V
CC = Min. IOL = 300µA — GND VLC
V
(3)
, VO = GND –60 –120 — mA
VIN = VIH or VIL IOL = 48mA MIL.
NOTES: 2614 tbl 05
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. This parameter is guaranteed but not tested.
5. These are maximum IOL values per output, for 8 outputs turned on simultaneously. Total maximum IOL (all outputs) is 512mA for commercial and 384mA
for military. Derate I
CC = 5.0V, +25°C ambient and maximum loading.
OL for number of outputs exceeding 8 turned on simultaneously.
I = GND — — –15
(4)
OH = –15mA COM’L. 2.4 4.3 —
I
OL = 64mA COM’L.
I
(5)
— 0.3 0.55
(5)
— 0.3 0.55
(2)
Max. Unit
VCC —
(4)
(4)
(4)
(4)
(4)
µA
µA
7.17 3
Loading...