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Integrated Device Technology, Inc.
3.3V CMOS OCTAL
TRANSPARENT
LATCHES
IDT54/74FCT3573/A
ADVANCE INFORMATION
FEATURES:
• 0.5 MICRON CMOS Technology
• ESD > 2000V per MIL-STD-883, Method 3015;
> 200V using machine model (C = 200pF, R = 0)
• 25 mil Center SSOP Packages
• Extended commercial range of -40°C to +85°C
•V
CC = 3.3V ±0.3V, Normal Range or
VCC = 2.7V to 3.6V, Extended Range
• CMOS power levels (0.4µW typ. static)
• Rail-to-Rail output swing for increased noise margin
• Military product compliant to MIL-STD-883, Class B
FUNCTIONAL BLOCK DIAGRAM
D0
D
G
LE
D1
D
O
G
D2
D
O
O
G
DESCRIPTION:
The FCT3573/A are octal transparent latches built using an
advanced dual metal CMOS technology.
These octal latches have 3-state outputs and are intended
for bus oriented applications. The flip-flops appear transparent to the data when Latch Enable (LE) is HIGH. When LE is
LOW, the data that meets the set-up time is latched. Data
appears on the bus when the Output Enable (OE) is LOW.
When OE is HIGH, the bus output is in the high-impedance
state.
D3
D
G
D4
D
O
G
D5
D
O
G
D6
D
O
G
D7
O
D
O
G
OE
O
0
PIN CONFIGURATION FUNCTION TABLE
OE
D0
D1
D2
D3
D4
D5
D6
D7
GND
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
2
3
P20-1
4
D20-1
SO20-2
5
&
6
SO20-7
7
8
9
10 11
DIP/SOIC/SSOP
TOP VIEW
20
19
18
17
16
15
14
13
12
O
1
O
2
O
3
O
4
O
5
O
6
O
3093 drw 01
(1)
VCC1
O
O1
O2
O3
O4
O
O6
O7
LE
0
5
3093 drw 02
DN LE
HHLH
LHLL
XXHZ
NOTE:
1. H = HIGH Voltage Level
X = Don’t Care
L = LOW Voltage Level
Z = High Impedance
DEFINITION OF FUNCTIONAL TERMS
Pin Names Description
DN Data Inputs
LE Latch Enable Input (Active HIGH)
OE
ON 3-State Outputs
O
N Complementary 3-State Outputs
Inputs Outputs
OE
OE
Output Enable Input (Active LOW)
ON
3093 tbl 02
3093 tbl 03
MILITARY AND COMMERCIAL TEMPERATURE RANGES AUGUST 1995
1995 Integrated Device Technology, Inc. 8.13 DSC-4648/-
1
7
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IDT54/74FCT3573/3573A
3.3V CMOS OCTAL TRANSPARENT LATCHES MILITARY AND COMMERCIAL TEMPERATURE RANGES
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Rating Commercial Military Unit
(2)
VTERM
Terminal Voltage
–0.5 to +4.6 –0.5 to +4.6 V
with Respect to
GND
(3)
VTERM
Terminal Voltage
–0.5 to +7.0 –0.5 to +7.0 V
with Respect to
GND
(4)
VTERM
Terminal Voltage
with Respect to
GND
TA Operating
–0.5 to
CC + 0.5
V
–40 to +85 –55 to +125 °C
–0.5 to
VCC + 0.5
V
Temperature
TBIAS Temperature
–55 to +125 –65 to +135 °C
Under Bias
TSTG Storage
–55 to +125 –65 to +150 °C
Temperature
PT Power Dissipation 1.0 1.0 W
IOUT DC Output
–60 to +60 –60 to +60 mA
Current
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. Vcc terminals.
3. Input terminals.
4. Output and I/O terminals.
3093 lnk 03
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Parameter
CIN Input
Capacitance
COUT Output
Capacitance
NOTE:
1. This parameter is measured at characterization but not tested.
(1)
Conditions Typ. Max. Unit
VIN = 0V 3.5 6.0 pF
VOUT = 0V 4.0 8.0 pF
3093 lnk 04
8.13 2
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IDT54/74FCT3573/3573A
3.3V CMOS OCTAL TRANSPARENT LATCHES MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Commercial: TA = –40°C to +85°C, VCC = 2.7V to 3.6V; Military: TA = –55°C to +125°C, VCC = 2.7V to 3.6V
Symbol Parameter Test Conditions
(1)
Min. Typ.
VIH Input HIGH Level (Input pins) Guaranteed Logic HIGH Level 2.0 — 5.5 V
Input HIGH Level (I/O pins) 2.0 — VCC+0.5
VIL Input LOW Level Guaranteed Logic LOW Level –0.5 — 0.8 V
(Input and I/O pins)
(6)
(6)
(6)
VCC = Max. VI = 5.5V — — ±1 µA
VI = VCC — — ±1
(6)
VI = GND — — ±1
VI = GND — — ±1
II H Input HIGH Current (Input pins)
Input HIGH Current (I/O pins)
II L Input LOW Current (Input pins)
Input LOW Current (I/O pins)
IOZH High Impedance Output Current VCC = Max. VO = VCC — — ±1 µA
IOZL (3-State Output pins)
(6)
VO = GND — — ±1
VIK Clamp Diode Voltage VCC = Min., IIN = –18mA — –0.7 –1.2 V
IODH Output HIGH Current VCC = 3.3V, VIN = VIH or VIL, VO = 1.5V
IODL Output LOW Current VCC = 3.3V, VIN = VIH or VIL, VO = 1.5V
(3)
(3)
–36 –60 –110 mA
50 90 200 mA
VOH Output HIGH Voltage VCC = Min. IOH = –0.1mA VCC–0.2 — — V
VIN = VIH or VIL IOH = –3mA 2.4 3.0 —
(5)
VCC = 3.0V
IN = VIH or VIL
V
IOH = –6mA MIL.
OH = –8mA COM'L.
I
2.4
VOL Output LOW Voltage VCC = Min. IOL = 0.1mA — — 0.2 V
VIN = VIH or VIL IOL = 16mA — 0.2 0.4
IOL = 24mA — 0.3 0.55
IOS Short Circuit Current
(4)
VCC = 3.0V
IN = VIH or VIL
V
VCC = Max., VO = GND
IOL = 24mA — 0.3 0.50
(3)
–60 –135 –240 mA
VH Input Hysteresis — — 150 — mV
ICCL
ICCH
Quiescent Power Supply Current VCC = Max.,
IN = GND or VCC
V
COM'L. — 0.1 10 µA
ICCZ MIL. — 0.1 100
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 3.3V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. This parameter is guaranteed but not tested.
5. V
OH = VCC –0.6V at rated current.
6. The test limits for this parameter is ± 5µA at T
A = –55°C.
(2)
Max. Unit
3.0 —
3093 lnk 05
8.13 3