Integrated Device Technology Inc IDT74FCT299CTD, IDT74FCT299CTSOB, IDT74FCT299CTSO, IDT74FCT299CTQB, IDT74FCT299CTQ Datasheet
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Integrated Device Technology, Inc.
FAST CMOS
8-INPUT UNIVERSAL
SHIFT REGISTER
IDT54/74FCT299T/AT/CT
FEATURES:
• Std., A and C speed grades
• Low input and output leakage ≤1µA (max.)
• CMOS power levels
• True TTL input and output compatibility
– V
OH = 3.3V (typ.)
– VOL = 0.3V (typ.)
• High drive outputs (-15mA IOH, 48mA IOL)
• Power off disable outputs permit “live insertion”
• Meets or exceeds JEDEC standard 18 specifications
• Product available in Radiation Tolerant and Radiation
Enhanced versions
• Military product compliant to MIL-STD-883, Class B
and DESC listed (dual marked)
• Available in DIP, SOIC, QSOP, CERPACK and LCC
packages
FUNCTIONAL BLOCK DIAGRAM
S1 S0
DESCRIPTION:
The IDT54/74FCT299T/AT/CT are built using an advanced
dual metal CMOS technology. The IDT54/74FCT299T/AT/
CT are 8-input universal shift/storage registers with 3-state
outputs. Four modes of operation are possible: hold (store),
shift left, shift right and load data. The parallel load inputs and
flip-flop outputs are multiplexed to reduce the total number of
package pins. Additional outputs are provided for flip-flops Q0
and Q7 to allow easy serial cascading. A separate active LOW
Master Reset is used to reset the register.
DS
0
CP
D
P
C
CD
0
Q
MR
OE1
OE2
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
Q
CD
D
P
C
Q
CD
DS7
D
P
C
Q
CD
D
P
C
Q
CD
D
P
C
Q
CD
D
P
C
Q
D
P
C
CD
Q
I/O6I/O5I/O4I/O3I/O2I/O1I/O0 I/O7
CD
D
C
Q
2632 drw 01
P
Q7
MILITARY AND COMMERCIAL TEMPERATURE RANGES APRIL 1995
1995 Integrated Device Technology, Inc. 6.11 DSC-4205/4
1
IDT54/74FCT299T/AT/CT
FAST CMOS 8-INPUT UNIVERSAL SHIFT REGISTER MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN CONFIGURATIONS
1
S0
Q0
2
3
4
5
6
7
8
9
10
P20-1
D20-1
SO20-2
SO20-8
E20-1
OE1
OE2
I/O6
I/O4
I/O2
I/O0
MR
GND
DIP/SOIC/QSOP/CERPACK
TOP VIEW
20
Vcc
19
S1
18
DS7
17
Q
7
16
I/O7
15
&
14
13
12
11
I/O5
I/O
I/O
CP
DS
2632 drw 02
PIN DESCRIPTION
Pin Names Description
CP Clock Pulse Input (Active Edge Rising)
0 Serial Data Input for Right Shift
DS
7 Serial Data Input for Left Shift
DS
0, S1 Mode Select Inputs
S
MR
1, OE2 3-State Output Enable Inputs (Active LOW)
OE
0–I/O7 Parallel Data Inputs or 3-State Parallel Outputs
I/O
0, O7 Serial Outputs
O
Asynchronous Master Reset Input (Active LOW)
2
INDEX
I/O
6
I/O
4
I/O
2
I/O
0
3
1
0
Q
0
OE
32
4
5
6
7
8
10 11 12 13
9
MR
1
OE
L20-2
GND
1
0
S
0
DS
Vcc
20 19
CP
1
S
18
17
16
15
14
1
I/O
2632 drw 03
DS
Q
I/O
I/O
I/O
7
7
7
5
3
LCC
TOP VIEW
(1)
0–Q7 = LOW
n → Qn
7 → Q7, Q7→ Q6, etc.
2632 tbl 01
FUNCTION TABLE
Inputs
1 S0 CP Response
MRMRS
L X X X Asynchronous Reset Q
HH H ↑Parallel Load; I/O
HL H ↑Shift Right; DS0 → Q0, Q0 → Q1, etc.
HH L ↑Shift Left; DS
H L L X Hold
NOTE: 2632 tbl 02
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
↑ = LOW-to-HIGH clock transition
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Rating Commercial Military Unit
(2)
VTERM
Terminal Voltage
–0.5 to +7.0 –0.5 to +7.0 V
with Respect to
GND
(3)
VTERM
TA Operating
Terminal Voltage
with Respect to
GND
–0.5 to
V
CC +0.5
–0.5 to
VCC +0.5
0 to +70 –55 to +125 °C
V
Temperature
TBIAS Temperature
–55 to +125 –65 to +135 °C
Under Bias
TSTG Storage
–55 to +125 –65 to +150 °C
Temperature
PT Power Dissipation 0.5 0.5 W
IOUT DC Output
–60 to +120 –60 to +120 mA
Current
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this
specification is not
conditions for extended periods may affect reliability. No terminal voltage
may exceed V
2. Input and V
3. Outputs and I/O terminals only.
implied. Exposure to absolute maximum rating
CC by +0.5V unless otherwise noted.
CC terminals only.
2632 lnk 03
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Parameter
C
IN
Input
Capacitance
C
OUT
Output
Capacitance
NOTE:
1. This parameter is measured at characterization but not tested.
(1)
Conditions Typ. Max. Unit
VIN = 0V 6 10
V
OUT
= 0V 8 12
pF
pF
2632 lnk 04
6.11 2
IDT54/74FCT299T/AT/CT
FAST CMOS 8-INPUT UNIVERSAL SHIFT REGISTER MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol Parameter Test Conditions
V
IH Input HIGH Level Guaranteed Logic HIGH Level 2.0 — — V
IL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V
V
(4)
(4)
(4)
VCC = Max., VI = 2.7V — — ±1 µA
VCC = Max., VI = 0.5V — — ±1 µA
VCC = Max., VI = Vcc (Max.) — — ±1 µA
(3)
VO = GND –60 –120 –225 mA
IN = VIH or VIL IOH = –8mA COM'L.
V
IN = VIH or VIL IOL = 48mA COM'L.
V
IH Input HIGH Current
I
IL Input LOW Current
I
I Input HIGH Current
I
IK Clamp Diode Voltage VCC = Min., IN = –18mA — –0.7 –1.2 V
V
OS Short Circuit Current VCC = Max.,
I
OH Output HIGH Voltage VCC = Min. IOH = –6mA MIL. 2.4 3.3 — V
V
OL Output LOW Voltage VCC = Min. IOL = 32mA MIL. — 0.3 0.5 V
V
OFF Input/Output Power Off VCC = 0V, VIN or VO ≤ 4.5V — — ±1 µA
I
Leakage
(5)
(1)
OH = –12mA MIL. 2.0 3.0 — V
I
OH= –15mA COM'L.
I
Min. Typ.
VH Input Hysteresis — — 200 — mV
CC Quiescent Power VCC = Max. — 0.01 1 mA
I
Supply Current V
NOTES: 2632 tbl 05
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. The test limit for this parameter is ±5µA at T
5. This parameter is guaranteed but not tested.
CC = 5.0V, +25°C ambient.
IN = GND or VCC
A = -55°C.
(2)
Max. Unit
6.11 3
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