Integrated Device Technology Inc IDT74FCT543TPB, IDT74FCT543TP, IDT74FCT543TLB, IDT74FCT543TL, IDT74FCT543TEB Datasheet

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IDT54/74FCT543T/AT/CT/DT
IDT54/74FCT2543T/AT/CT
Integrated Device Technology, Inc.
FAST CMOS OCTAL LATCHED TRANSCEIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES JANUARY 1995
1995 Integrated Device Technology, Inc. 6.17 DSC-4203/5
The FCT543T/FCT2543T is a non-inverting octal trans­ceiver built using an advanced dual metal CMOS technology. This device contains two sets of eight D-type latches with separate input and output controls for each set. For data flow from A to B, for example, the A-to-B Enable (
CEAB
) input must be LOW in order to enter data from A0–A7 or to take data from B0–B7, as indicated in the Function Table. With
CEAB
LOW,
a LOW signal on the A-to-B Latch Enable (
LEAB
) input makes the A-to-B latches transparent; a subsequent LOW-to-HIGH transition of the
LEAB
signal puts the A latches in the storage mode and their outputs no longer change with the A inputs. With
CEAB
and
OEAB
both LOW, the 3-state B output buffers are active and reflect the data present at the output of the A latches. Control of data from B to A is similar, but uses the
CEBA, LEBA
and
OEBA
inputs.
The FCT2543T has balanced output drive with current limiting resistors. This offers low ground bounce, minimal undershoot and controlled output fall times-reducing the need for external series terminating resistors. FCT2xxxT parts are plug-in replacements for FCTxxxT parts.
1
FEATURES:
• Common features:
– Low input and output leakage 1µA (max.) – CMOS power levels – True TTL input and output compatibility
– VOH = 3.3V (typ.) – V
OL = 0.3V (typ.)
– Meets or exceeds JEDEC standard 18 specifications – Product available in Radiation Tolerant and Radiation
Enhanced versions
– Military product compliant to MIL-STD-883, Class B
and DESC listed (dual marked)
– Available in DIP, SOIC, SSOP, QSOP, CERPACK
and LCC packages
• Features for FCT543T:
– Std., A, C and D speed grades – High drive outputs (-15mA IOH, 64mA IOL) – Power off disable outputs permit “live insertion”
• Features for FCT2543T:
– Std., A, and C speed grades – Resistor outputs (-15mA IOH, 12mA IOL Com.)
(-12mA IOH, 12mA IOL Mil.)
– Reduced system switching noise
2613 drw 01
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
FUNCTIONAL BLOCK DIAGRAM
A1
Q
OEBA
A2 A3 A4 A5 A6 A7
B1 B2 B3 B4 B5
B6 B7
CEBA
LEBA
OEAB
CEAB
LEAB
DETAIL A x 7
D
LE
Q
D
LE
DETAIL A
A
0
B0
IDT54/74FCT543T/AT/CT/DT - 2543T/AT/CT FAST CMOS OCTAL LATCHED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
6.17 2
PIN CONFIGURATIONS
DIP/SOIC/SSOP/QSOP/CERPACK
TOP VIEW
5 6 7 8 9 10 11 12
GND
A
0
A1 A2
1 2 3 4
24 23 22 21 20 19 18 17
Vcc
16 15 14 13
P24-1
D24-1 SO24-2 SO24-7 SO24-8
&
E24-1
B
0
A3 A4 A5
A
6
A7
B1 B2 B3 B4 B5 B6 B7 LEAB OEAB
LEBA
OEBA
CEAB
CEBA
LCC
TOP VIEW
5 6 7 8 9 10 11
L28-1
25 24 23 22 21 20 19
INDEX
A
1
A
2
A
3
A
4
A
5
A
6
NC
Vcc
GND
NC
NC
NC
B
1
B
2
B
3
B
4
B
5
B
6
A
0
LEBA
OEBA
B0CEBA
A
7
CEAB
B
7
LEAB
OEAB
12 13 14 15 16 17 18
432128 27 26
2613 drw 02
2613 drw 03
FUNCTION TABLE
(1, 2)
For A-to-B (Symmetric with B-to-A)
Latch Output
Inputs Status Buffers
CEAB
CEAB
LEAB
LEAB
OEAB
OEAB
A-to-B B
0–B7
H Storing High Z — H Storing — — H High Z
L L L Transparent Current A Inputs L H L Storing Previous* A Inputs
NOTES: 2613 tbl 02
1. * Before
LEAB
LOW-to-HIGH Transition H = HIGH Voltage Level L = LOW Voltage Level — = Don’t Care or Irrelevant
2. A-to-B data flow shown; B-to-A flow control is the same, except using
CEBA, LEBA
and
OEBA
.
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Rating Commercial Military Unit
VTERM
(2)
Terminal Voltage with Respect to GND
–0.5 to +7.0 –0.5 to +7.0 V
VTERM
(3)
Terminal Voltage with Respect to GND
–0.5 to
V
CC +0.5
–0.5 to
VCC +0.5
V
TA Operating
Temperature
0 to +70 –55 to +125 °C
TBIAS Temperature
Under Bias
–55 to +125 –65 to +135 °C
TSTG Storage
Temperature
–55 to +125 –65 to +150 °C
PT Power Dissipation 0.5 0.5 W IOUT DC Output
Current
–60 to +120 –60 to +120 mA
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT­INGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed V
CC by +0.5V unless otherwise noted.
2. Input and V
CC terminals only.
3. Outputs and I/O terminals only.
2613 lnk 03
PIN DESCRIPTION
Pin Names Description
OEAB
A-to-B Output Enable Input (Active LOW)
OEBA
B-to-A Output Enable Input (Active LOW)
CEAB
A-to-B Enable Input (Active LOW)
CEBA
B-to-A Enable Input (Active LOW)
LEAB
A-to-B Latch Enable Input (Active LOW)
LEBA
B-to-A Latch Enable Input (Active LOW)
A
0–A7 A-to-B Data Inputs or B-to-A 3-State Outputs
B
0–B7 B-to-A Data Inputs or A-to-B 3-State Outputs
2613 tbl 01
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Parameter
(1)
Conditions Typ. Max. Unit
CIN Input
Capacitance
VIN = 0V 6 10 pF
COUT Output
Capacitance
VOUT = 0V 8 12 pF
NOTE:
1. This parameter is measured at characterization but not tested.
2613 lnk 04
IDT54/74FCT543T/AT/CT/DT - 2543T/AT/CT FAST CMOS OCTAL LATCHED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
6.17 3
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
V
IH
Input HIGH Level Guaranteed Logic HIGH Level 2.0 V
V
IL
Input LOW Level Guaranteed Logic LOW Level 0.8 V
I
I H
Input HIGH Current
(4)
VCC = Max. VI = 2.7V
±
1
µ
A
I
I L
Input LOW Current
(4)
VI = 0.5V
±
1
I
OZH
High Impedance Output Current VCC = Max. VO = 2.7V
±
1
µ
A
I
OZL
(3-State Output pins)
(4)
VO = 0.5V
±
1
II Input HIGH Current
(4)
VCC = Max., VI = V
CC
(Max.)
±
1
µ
A
V
IK
Clamp Diode Voltage VCC = Min., I
IN
= –18mA –0.7 –1.2 V
V
H
Input Hysteresis
200 mV
I
CC
Quiescent Power Supply Current VCC = Max., VIN = GND or V
CC
0.01 1 mA
2613 lnk 05
OUTPUT DRIVE CHARACTERISTICS FOR 543T/AT/CT/DT
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
VOH Output HIGH Voltage VCC = Min.
V
IN = VIH or VIL
IOH = –6mA MIL. I
OH = –8mA COM'L.
2.4 3.3 V
IOH = –12mA MIL. I
OH = –15mA COM'L.
2.0 3.0 V
VOL Output LOW Voltage VCC = Min.
V
IN = VIH or VIL
IOL = 48mA MIL. I
OL = 64mA COM'L.
0.3 0.55 V
IOS Short Circuit Current VCC = Max., VO = GND
(3)
–60 –120 –225 mA
IOFF Input/Output Power Off Leakage
(5)
VCC = 0V, VIN or VO 4.5V ±1 µA
2613 lnk 06
OUTPUT DRIVE CHARACTERISTICS FOR 2543T/AT/CT/DT
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
I
ODL
Output LOW Current VCC = 5V, V
IN
= V
IH or VIL, VOUT
= 1.5V
(3)
16 48 mA
I
ODH
Output HIGH Current VCC = 5V, V
IN
= V
IH
or V
IL,VOUT
= 1.5V
(3)
–16 –48 mA
V
OH
Output HIGH Voltage VCC = Min.
V
IN
= V
IH
or V
IL
IOH = –12mA MIL. I
OH
= –15mA COM'L.
2.4 3.3 V
V
OL
Output LOW Voltage VCC = Min.
V
IN
= V
IH
or V
IL
IOL = 12mA 0.3 0.50 V
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. The test limit for this parameter is ±5µA at T
A = –55°C.
5. This parameter is guaranteed but not tested.
2613 lnk 07
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