3.3V CMOS Static RAM
1 Meg (64K x 16-Bit)
IDT71V016SA
Features
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64K x 16 advanced high-speed CMOS Static RAM
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Equal access and cycle times
— Commercial: 10/12/15/20ns
— Industrial: 12/15/20ns
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One Chip Select plus one Output Enable pin
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Bidirectional data inputs and outputs directly
LVTTL-compatible
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Low power consumption via chip deselect
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Upper and Lower Byte Enable Pins
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Single 3.3V power supply
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Available in 44-pin Plastic SOJ, 44-pin TSOP, and
48-Ball Plastic FBGA packages
Functional Block Diagram
Output
Enable
Buffer
Address
Buffers
A0–A
OE
15
Row / Column
Decoders
Description
The IDT71V016 is a 1,048,576-bit high-speed Static RAM organized
as 64K x 16. It is fabricated using IDT’s high-perfomance, high-reliability
CMOS technology. This state-of-the-art technology, combined with innovative circuit design techniques, provides a cost-effective solution for highspeed memory needs.
The IDT71V016 has an output enable pin which operates as fast
as 5ns, with address access times as fast as 10ns. All bidirectional
inputs and outputs of the IDT71V016 are LVTTL-compatible and operation
is from a single 3.3V supply. Fully static asynchronous circuitry is used,
requiring no clocks or refresh for operation.
The IDT71V016 is packaged in a JEDEC standard 44-pin Plastic
SOJ, a 44-pin TSOP Type II, and a 48-ball plastic 7 x 7 mm FBGA.
CS
WE
BHE
BLE
©2000 Integrated Device Technology, Inc.
Chip
Enable
Buffer
Write
Enable
Buffer
Byte
Enable
Buffers
64K x 16
Memory
Array
I/O
15
8
Sense
16
Amps
and
Write
Drivers
8
High
Byte
I/O
Buffer
Low
Byte
I/O
Buffer
8
8
3834 drw01
I/O
I/O
I/O
8
7
0
JUNE 2002
1
DSC-3834/06
IDT71V016SA, 3.3V CMOS Static RAM
I/O0-I/O7I/O8-I/O15Function
1 Meg (64K x 16-Bit) Commercial and Industrial Temperature Ranges
Pin Configurations
1
4
2
3
3
2
1
4
0
5
6
7
0
8
1
2
9
3
10
11
12
4
13
5
14
6
15
7
16
SO44-1
SO44-2
17
18
19
20
21
22
I/O
I/O
I/O
I/O
V
V
I/O
I/O
I/O
I/O
WE
A
A
A
A
A
A
A
A
A
CS
DD
SS
15
14
13
12
NC
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
A
5
A
6
A
7
OE
BHE
BLE
I/O
I/O
I/O
I/O
V
SS
V
DD
I/O
I/O
I/O
I/O
NC
A
8
A
9
A
10
A
11
NC
123456
A
BLE OE
BI/O
CI/O9I/O
15
14
13
12
DVSSI/O
EVDDI/O
FI/O14I/O
11
10
9
8
GI/O15NC A
8
BHE
10
11
12
13
HNC A8A
A
0
3
A
A
5
NC A
A
1
4
A
A
6
7
NC NC I/O
14
A
12
9
15
A
13
A
10
A
FBGA (BF48-1)
A
CS
I/O
I/O
I/O
WE
A
1
3
4
5
NC
0
I/O
I/O
2
DD
V
SS
V
6
I/O
7
I/O
NC
3834 tbl 02a
2
11
Top View
Pin Description
15
SOJ/TSOP
Top View
3834 drw 02
A0 – A
CS
WE
OE
Address Inputs Input
Chip Select Input
Write Enable Input
Output En able Input
BHE High By te Enable Input
BLE Low By te En able Input
0
15
Truth Table
(1)
I/O
V
V
– I/O
DD
SS
Data Input/Output I/O
3.3V Pow er Pow er
Ground Gnd
CS OE WE BLE BHE
H X X X X High-Z High-Z Deselected – Stan dby
LLHL H DATA
L L H H L High-Z DATA
LLHL L DATA
LXL L L DATA
LXL L H DATA
L X L H L High-Z DATA
OUT
OUT
High-Z Low By t e Read
OUT
OUT
DATA
IN
IN
IN
DATA
High-Z Low By t e Write
IN
High Byt e Read
Word Re ad
Word Write
High Byt e Write
L H H X X H igh-Z High-Z Outputs D isabled
L X X H H H igh-Z High-Z Outputs D isabled
NOTE:
1. H = VIH, L = VIL, X = Don't care.
3834 tbl 01
3834 tbl 02
6.42
2
IDT71V016SA, 3.3V CMOS Static RAM
1 Meg (64K x 16-Bit) Commercial and Industrial Temperature Ranges
Absolute Maximum Ratings
(1)
Recommended Operating
Temperature and Supply Voltage
DD
V
IN
, V
V
BIAS
T
STG
T
T
P
OUT
I
NOTE:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
Capacitance
(TA = +25°C, f = 1.0MHz, SOJ package)
Symbol Parameter
C
IN
C
I/O
NOTE:
1. This parameter is guaranteed by device characterization, but not production tested.
Supply Voltage Relativ e to
SS
V
Terminal Voltage Relative
OUT
SS
to V
–0.5 t o +4. 6 V
–0.5 t o VDD+0.5 V
Tem perature Under Bias –55 to +125
Storage Temperature –55 to + 125
Pow er Dissipation 1.25 W
DC Out put C urrent 50 mA
Con ditio ns M ax. Unit
Input Capacitance VIN = 3dV 6 pF
I/O C apacitance V
= 3dV 7 pF
OUT
o
C
o
C
3834 tbl 03
3834 tbl 0 6
Com me rc ial 0° C to +7 0°C 0V Se e Be lo w
Indus trial -40° C to + 85°C 0V Se e B e lo w
Recommended DC Operating
Conditions
(1)
V
Supply Voltage 3.15 3.3 3.6 V
DD
(2)
DD
V
Supply Voltage 3.0 3.3 3.6 V
Vss Ground 0 0 0 V
IH
V
Input H igh Voltage 2.0
IL
V
Input L ow Voltage –0.3
NOTES:
1. For 71V016SA10 only.
2. For all speed grades except 71V016SA10.
3. VIH (max.) = VDD+2V for pulse width less than 5ns, once per cycle.
4. VIL (min.) = –2V for pulse width less than 5ns, once per cycle.
____
VDD+0.3
(4 )
____
0.8 V
3834 tbl 04
(3)
3834 tbl 05
V
DC Electrical Characteristics
(VDD = Min. to Max., Commercial and Industrial Temperature Ranges)
Symbol Parameter Test Condition
LI
|I
| Input Leakage C urrent VDD = Max., VIN = VSS to V
LO
|I
| O utput Leakage Current VDD = Max., CS = VIH, V
OL
V
OH
V
DC Electrical Characteristics
Output Low Voltage IOL = 8mA, VDD = Min.
Output H igh Voltage IOH = –4mA, VDD = M in. 2.4
(1,2)
(VDD = Min. to Max., VLC = 0.2V, VHC = VDD – 0.2V)
Dynamic Operating Current
CC
I
LC
CS ≤ V
Dynamic Standby Power Supply Current
SB
I
CS ≥ V
Full Stand b y Po we r Sup p ly Current (static )
SB1
I
CS ≥ V
, Outputs Open, VDD = Max., f = f
HC
, Outputs Open, VDD = Max., f = f
HC
, Outputs Open, VDD = Max., f = 0
MAX
MAX
(3)
(3)
(3)
NOTES:
1. All values are maximum guaranteed values.
2. All inputs switch between 0.2V (Low) and VDD – 0.2V (High).
3. fMAX = 1/tRC (all address inputs are cycling at fMAX); f = 0 means no address input lines are changing .
4. Typical values are measured at 3.3V, 25°C and with equal read and write cycles.
6.42
160 150 160 130 130 120 120
125 120 -- 110 -- 110 --
45 40 45 35 35 30 30
10 10 10 10 10 10 10 mA
3
DD
OUT
= VSS to V
IDT71V016SA
UnitMin. Max.
5µA
DD
5µA
0.4 V
V
3834 tbl 0 7
mA
mA
3834 tbl 08