Integrated Device Technology Inc IDT61298SA12Y, IDT61298SA15Y Datasheet

Integrated Device Technology, Inc.
W
CMOS STATIC RAM 256K (64K x 4-BIT)
IDT61298SA
FEATURES:
• 64K x 4 high-speed static RAM
• Fast Output Enable (OE) pin available for added system
flexibility
• High speed (equal access and cycle times) — Commercial: 12/15 ns (max.)
• JEDEC standard pinout
• 300 mil 28-pin SOJ
• Produced with advanced CMOS technology
• Bidirectional data inputs and outputs
• Inputs/Outputs TTL-compatible
• Three-state outputs
• Military product compliant to MIL-STD-883, Class B
FUNCTIONAL BLOCK DIAGRAM
A0
D E C O D E R
DESCRIPTION:
The lDT61298SA is a 262,144-bit high-speed static RAM organized as 64K x 4. It is fabricated using IDT’s high­performance, high-reliability CMOS technology. This state-of­the-art technology, combined with innovative circuit design techniques, provides a cost-effective approach for memory intensive applications.
The IDT61298SA features two memory control functions: Chip Select (CS) and Output Enable (OE). These two func­tions greatly enhance the IDT61298SA's overall flexibility in high-speed memory applications.
Access times as fast as 12ns are available. The IDT61298SA offers a reduced power standby mode, I the designer to considerably reduce device power require­ments. This capability significantly decreases system power and cooling levels, while greatly enhancing system reliability.
All inputs and outputs are TTL-compatible and the device operates from a single 5 volt supply. Fully static asynchronous
VCC GND
262,144-BIT
MEMORY ARRAY
SB1, which enables
A15
I/O0
I/O1
I/O2
I/O3
CS
E
OE
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
INPUT
DATA
CONTROL
I/O CONTROL
2971 drw 01
COMMERCIAL TEMPERATURE RANGES MAY 1996
1996 Integrated Device Technology, Inc. DSC-2971/6
7.1
1
IDT61298SA CMOS STATIC RAM 256K (64K x 4-BIT) COMMERCIAL TEMPERATURE RANGE
DESCRIPTION (Continued)
circuitry, along with matching access and cycle times, favor the simplified system design approach.
The IDT61298SA is packaged in a 300 mil, 28-pin SOJ,
providing improved board-level packing densities.
PIN CONFIGURATION
NC
A A A A A A A A A A
CS OE
GND
0 1 2 3 4 5 6 7 8 9
1 2 3 4 5 6 7
SO28-5
8 9 10 11 12 13 14
SOJ
TOP VIEW
28 27 26 25 24 23 22
21 20
19 18 17 16 15
V
CC
A
15
A
14
A
13
A
12
A
11
A
10
NC NC
3
I/O I/O
2
I/O
1
I/O
0
WE
2971 drw 02
TRUTH TABLE
(1,2)
CSCSOEOEWEWE I/O Function
L L H DATA L X L DATA
OUT Read Data
IN Write Data
L H H High-Z Outputs Disabled
H X X High-Z Deselected - Standby (I
(3)
V
HC
NOTES: 2971 tbl 01
1. H = VIH, L = VIL, x = Don't care.
2. V
3. Other inputs V
ABSOLUTE MAXIMUM RATINGS
X X High-Z Deselected - Standby (ISB1)
LC = 0.2V, VHC = VCC -0.2V.
HC or VLC.
(1)
SB)
Symbol Rating Com’l. Unit
(2)
V
TERM
Terminal Voltage –0.5 to +7.0 V with Respect to GND
A Operating 0 to +70 °C
T
Temperature
BIAS Temperature –55 to +125 °C
T
Under Bias
STG Storage –55 to +125 °C
T
Temperature PT Power Dissipation 1.0 W I
OUT DC Output 50 mA
Current
NOTES: 2971 tbl 02
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
TERM must not exceed VCC + 0.5V.
2. V
PIN DESCRIPTIONS
Name Description
A
0–A14 Addresses
I/O
0–I/O7 Data Input/Output
CS WE OE
GND Ground V
CC Power
Chip Select Write Enable Output Enable
CAPACITANCE
(TA = +25°C, f = 1.0MHz, SOJ Package)
Symbol Parameter
CIN Input Capacitance V IN = 3dV 5 pF
I/O I/O Capacitance VOUT = 3dV 7 pF
C
NOTE: 2971 tbl 03
1. This parameter is determined by device characterization, but is not
2971 tbl 04
production tested.
7.1 2
(1)
Conditions Max. Unit
IDT61298SA CMOS STATIC RAM 256K (64K x 4-BIT) COMMERCIAL TEMPERATURE RANGE
RECOMMENDED OPERATING TEMPERATURE AND SUPPLY VOLTAGE
Grade Temperature GND Vcc
RECOMMENDED DC OPERATING CONDITIONS
Symbol Parameter Min. Typ. Max. Unit
VCC Supply Voltage 4.5 5.0 5.5 V
Commercial 0°C to +70°C 0V 5V ± 10%
DC ELECTRICAL CHARACTERISTICS
(1)
2971 tbl 05
GND Supply Voltage 0 0 0 V VIH Input High Voltage 2.2 — VCC + 0.5V V
IL Input Low Voltage –0.5
V
NOTE: 2971 tbl 06
1. VIL (min.) = –1.5V for pulse width less than 10ns, once per cycle.
(1)
0.8 V
(VCC = 5V ± 10%, VLC = 0.2V, VHC = VCC - 0.2V)
61298SA12 61298SA15
Symbol Parameter
CC Dynamic Operating Current
I
CS
= V
IL, Outputs Open 160 140 mA
V
CC = Max., f = fMAX
(2)
ISB Standby Power Supply
Current (TTL Level) 50 45 mA
CS
V
IH, VCC = Max.,
Outputs Open, f = f
MAX
(2)
ISB1 Full Standby Power
Supply Current (CMOS Level) 20 20 mA
CS
V
HC, VCC = Max.,
(2),
f = 0
NOTES: 2971 tbl 07
1. All values are maximum guaranteed values.
MAX = 1/tRC (all address inputs are cycling at fMAX); f = 0 means no address input lines are changing.
2. f
VLC VIN VHC
Com’l. Mil. Com’l. Mil. Unit
AC TEST CONDITIONS
Input Pulse Levels GND to 3.0V Input Rise/Fall Times 3ns Input Timing Reference Levels 1.5V Output Reference Levels 1.5V AC Test Load See Figures 1 and 2
5V
480
DATA
OUT
255
Figure 1. AC Test Load Figure 2. AC Test Load
30pF*
2971 drw 03
*Includes scope and jig capacitances
2971 tbl 08
DATA
5V
OUT
255
CLZ, tOLZ, tCHZ, tOHZ, tOW, tWHZ)
(for t
480
5pF*
2971 drw 04
7.1 3
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