• Fast Output Enable (OE) pin available for added system
flexibility
• High speed (equal access and cycle times)
— Commercial: 12/15 ns (max.)
• JEDEC standard pinout
• 300 mil 28-pin SOJ
• Produced with advanced CMOS technology
• Bidirectional data inputs and outputs
• Inputs/Outputs TTL-compatible
• Three-state outputs
• Military product compliant to MIL-STD-883, Class B
FUNCTIONAL BLOCK DIAGRAM
A0
D
E
C
O
D
E
R
DESCRIPTION:
The lDT61298SA is a 262,144-bit high-speed static RAM
organized as 64K x 4. It is fabricated using IDT’s highperformance, high-reliability CMOS technology. This state-ofthe-art technology, combined with innovative circuit design
techniques, provides a cost-effective approach for memory
intensive applications.
The IDT61298SA features two memory control functions:
Chip Select (CS) and Output Enable (OE). These two functions greatly enhance the IDT61298SA's overall flexibility in
high-speed memory applications.
Access times as fast as 12ns are available. The IDT61298SA
offers a reduced power standby mode, I
the designer to considerably reduce device power requirements. This capability significantly decreases system power
and cooling levels, while greatly enhancing system reliability.
All inputs and outputs are TTL-compatible and the device
operates from a single 5 volt supply. Fully static asynchronous
VCC
GND
262,144-BIT
MEMORY ARRAY
SB1, which enables
A15
I/O0
I/O1
I/O2
I/O3
CS
E
OE
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
IDT61298SA
CMOS STATIC RAM 256K (64K x 4-BIT)COMMERCIAL TEMPERATURE RANGE
DESCRIPTION (Continued)
circuitry, along with matching access and cycle times, favor
the simplified system design approach.
The IDT61298SA is packaged in a 300 mil, 28-pin SOJ,
providing improved board-level packing densities.
PIN CONFIGURATION
NC
A
A
A
A
A
A
A
A
A
A
CSOE
GND
0
1
2
3
4
5
6
7
8
9
1
2
3
4
5
6
7
SO28-5
8
9
10
11
12
13
14
SOJ
TOP VIEW
28
27
26
25
24
23
22
21
20
19
18
17
16
15
V
CC
A
15
A
14
A
13
A
12
A
11
A
10
NC
NC
3
I/O
I/O
2
I/O
1
I/O
0
WE
2971 drw 02
TRUTH TABLE
(1,2)
CSCSOEOEWEWE I/OFunction
LLH DATA
LXL DATA
OUT Read Data
INWrite Data
LHH High-ZOutputs Disabled
HXX High-ZDeselected - Standby (I
(3)
V
HC
NOTES:2971 tbl 01
1. H = VIH, L = VIL, x = Don't care.
2. V
3. Other inputs ≥V
ABSOLUTE MAXIMUM RATINGS
XX High-ZDeselected - Standby (ISB1)
LC = 0.2V, VHC = VCC -0.2V.
HC or ≤VLC.
(1)
SB)
SymbolRatingCom’l.Unit
(2)
V
TERM
Terminal Voltage–0.5 to +7.0V
with Respect
to GND
AOperating0 to +70°C
T
Temperature
BIASTemperature–55 to +125°C
T
Under Bias
STGStorage–55 to +125°C
T
Temperature
PTPower Dissipation1.0W
I
OUTDC Output50mA
Current
NOTES:2971 tbl 02
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
TERM must not exceed VCC + 0.5V.
2. V
PIN DESCRIPTIONS
NameDescription
A
0–A14Addresses
I/O
0–I/O7Data Input/Output
CSWEOE
GNDGround
V
CCPower
Chip Select
Write Enable
Output Enable
CAPACITANCE
(TA = +25°C, f = 1.0MHz, SOJ Package)
SymbolParameter
CINInput CapacitanceV IN = 3dV5pF
I/OI/O CapacitanceVOUT = 3dV7pF
C
NOTE:2971 tbl 03
1. This parameter is determined by device characterization, but is not
2971 tbl 04
production tested.
7.12
(1)
ConditionsMax.Unit
IDT61298SA
CMOS STATIC RAM 256K (64K x 4-BIT)COMMERCIAL TEMPERATURE RANGE
RECOMMENDED OPERATING
TEMPERATURE AND SUPPLY VOLTAGE
GradeTemperatureGNDVcc
RECOMMENDED DC OPERATING
CONDITIONS
SymbolParameterMin.Typ.Max.Unit
VCCSupply Voltage4.55.05.5V
Commercial0°C to +70°C0V5V ± 10%
DC ELECTRICAL CHARACTERISTICS
(1)
2971 tbl 05
GNDSupply Voltage000V
VIHInput High Voltage2.2— VCC + 0.5V V
ILInput Low Voltage –0.5
V
NOTE:2971 tbl 06
1. VIL (min.) = –1.5V for pulse width less than 10ns, once per cycle.
(1)
—0.8V
(VCC = 5V ± 10%, VLC = 0.2V, VHC = VCC - 0.2V)
61298SA1261298SA15
SymbolParameter
CCDynamic Operating Current
I
CS
= V
IL, Outputs Open160—140—mA
V
CC = Max., f = fMAX
(2)
ISBStandby Power Supply
Current (TTL Level)50—45—mA
CS
≥ V
IH, VCC = Max.,
Outputs Open, f = f
MAX
(2)
ISB1Full Standby Power
Supply Current (CMOS Level)20—20—mA
CS
≥ V
HC, VCC = Max.,
(2),
f = 0
NOTES:2971 tbl 07
1. All values are maximum guaranteed values.
MAX = 1/tRC (all address inputs are cycling at fMAX); f = 0 means no address input lines are changing.
2. f
VLC≥ VIN≥ VHC
Com’l.Mil.Com’l.Mil.Unit
AC TEST CONDITIONS
Input Pulse LevelsGND to 3.0V
Input Rise/Fall Times3ns
Input Timing Reference Levels1.5V
Output Reference Levels1.5V
AC Test LoadSee Figures 1 and 2
5V
480
Ω
DATA
OUT
255
Ω
Figure 1. AC Test LoadFigure 2. AC Test Load
30pF*
2971 drw 03
*Includes scope and jig capacitances
2971 tbl 08
DATA
5V
OUT
255Ω
CLZ, tOLZ, tCHZ, tOHZ, tOW, tWHZ)
(for t
480Ω
5pF*
2971 drw 04
7.13
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