Datasheet IDT54FCT257T, IDT54FCT257AT, IDT54FCT257CT, IDT54FCT257DT, IDT74FCT257T Datasheet (IDT)

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IDT54/74FCT257T/AT/CT/DT
FAST CMOS QUAD 2-INPUT MULTIPLEXER

MILITARY AND INDUSTRIAL TEMPERATURE RANGES

FAST CMOS
QUAD 2-INPUT
MULTIPLEXER

FEA TURES:

• Std., A, C, and D grades

• Low input and output leakage

• CMOS power levels

• True TTL input and output compatibility:

–VOH = 3.3V (typ.)
–VOL = 0.3V (typ.)

• High Drive outputs (-15mA IOH, 48mA IOL)

• Meets or exceeds JEDEC standard 18 specifications

• Military product compliant to MIL-STD-883, Class B and DESC
listed (dual marked)

• Power off disable outputs permit "live insertion"

• Available in the following packages:

– Industrial: SOIC, QSOP
– Military: CERDIP, LCC

FUNCTIONAL BLOCK DIAGRAM

≤≤

≤1µA (max.)

≤≤

IDT54/74FCT257T/AT/CT/DT

DESCRIPTION:

The FCT257T is a high-speed quad 2-input multiplexer built using an
advanced dual metal CMOS technology. Four bits of data from two sources
can be selected using the common select input. The four buffered outputs
present the selected data in the true (non-inverting) form.

The FCT257T has a common Output Enable (OE) input. When OE is
high, all outputs are switched to a high-impedance state allowing the outputs
to interface directly with bus-oriented systems.

I

1BI1D

I

0BI0D

I

I

1A

0A

S

OE

Three other multiplexers

ZBZ

Z

A

D

The IDT logo is a registered trademark of Integrated Device Technology, Inc.

JUNE 2001MILITARY AND INDUSTRIAL TEMPERATURE RANGES

1

© 2002 Integrated Device Technology, Inc. DSC-5500/2

IDT54/74FCT257T/AT/CT/DT
FAST CMOS QUAD 2-INPUT MULTIPLEXER

PIN CONFIGURATION

MILITARY AND INDUSTRIAL TEMPERATURE RANGES

S

0A

I
I1A

ZA

I0B
I1B

Z

B

GND

1
2

3
4

5
6

7
8

CERDIP/ SOIC/ QSOP

TOP VIEW

16
15
14
13

12
11
10

INDEX

A

0

S

I

C
N

C
C

V

E
O

VCC
OE

0C

I

I1A

ZA

4
5

23

1

1920

18
17

I

0C

I1C

I1C

NC

6

16

NC

ZC

0B

I

7

15

ZC

I0D

I1B

I1D

9

ZD

8

10 11 12 13

9

B

Z

D
N

C
N

14

D

D

1

Z

I

I0D

G

LCC

TOP VIEW

ABSOLUTE MAXIMUM RATINGS

Symbol Description Max Unit

(2)

VTERM
VTERM
TSTG Storage Temperature –65 to +150 °C
I

OUT DC Output Current –60 to +120 mA

NOTES:

1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage may exceed
Vcc by +0.5V unless otherwise noted.

2. Inputs and Vcc terminals only.

3. Output and I/O terminals only.

Terminal Voltage with Respect to GND –0.5 to +7 V

(3)

Terminal Voltage with Respect to GND –0.5 to VCC+0.5 V

(1)

CAPACITANCE (TA = +25°C, F = 1.0MHz)

Symbol Parameter

CIN Input Capacitance VIN = 0V 6 10 pF
C

OUT Output Capacitance VOUT = 0V 8 12 pF

NOTE:

1. This parameter is measured at characterization but not tested.

(1)

Conditions Typ. Max. Unit

PIN DESCRIPTION

Pin Names Description

I0A–I0D Source 0 Data Inputs
I1A–I1D Source 1 Data Inputs

OE Output Enable (Active LOW)

S Select Input

ZA–ZD Outputs

FUNCTION TABLE

Inputs

OE SI0 I1 Output Zx

HXXX Z

LHXL L
LHXH H
LLLX L
LLHX H

NOTE:

1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
Z = High-Impedance

(1)

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IDT54/74FCT257T/AT/CT/DT
FAST CMOS QUAD 2-INPUT MULTIPLEXER

MILITARY AND INDUSTRIAL TEMPERATURE RANGES

DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE

Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ±5%; Military: TA = –55°C to +125°C, VCC = 5.0V ±10%

Symbol Parameter Test Conditions

(1)

Min. Typ.

VIH Input HIGH Level Guaranteed Logic HIGH Level 2 — — V
VIL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V

IIH Input HIGH Current
IIL Input LOW Current

OZH High Impedance Output Current VCC = Max VO = 2.7V — — ±1µA

I
IOZL (3-State output pins)

II Input HIGH Current

(4)

(4)

(4)

(4)

VCC = Max. VI = 2.7V — — ±1µA
VCC = Max. VI = 0.5V — — ±1µA

VO = 0.5V — — ±1

VCC = Max., VI = VCC (Max.) — — ±1µA

VIK Clamp Diode Voltage VCC = Min, IIN = -18mA — –0.7 –1.2 V

VH Input Hysteresis — — 200 — mV

I

CC Quiescent Power Supply Current VCC = Max., VIN = GND or VCC — 0.01 1 mA

(2)

Max. Unit

OUTPUT DRIVE CHARACTERISTICS

Symbol Parameter Test Conditions

V

OH Output HIGH Voltage VCC = Min IOH = –8mA 2.4 3.3 — V

(1)

Min. Typ.

VIN = VIH or VIL IOH = –15mA 2 3 —

VOL Output LOW Voltage VCC = Min IOL = 48mA — 0.3 0.5 V

VIN = VIH or VIL

IOS Short Circuit Current VCC = Max., VO = GND

IOFF Input/Output Power Off Leakage

NOTES:

1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at VCC = 5.0V, +25°C ambient.

3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.

4. The test limit for this parameter is ±5µA at TA = –55°C.

5. This parameter is guaranteed but not tested.

(5)

VCC = 0V, VIN or VO

(3)

≤≤

≤

4.5V — — ±1µA

≤≤

–60 –120 –225 mA

(2)

Max. Unit

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IDT54/74FCT257T/AT/CT/DT
FAST CMOS QUAD 2-INPUT MULTIPLEXER

MILITARY AND INDUSTRIAL TEMPERATURE RANGES

POWER SUPPLY CHARACTERISTICS

Symbol Parameter Test Conditions

CC Quiescent Power Supply Current VCC = Max. — 0.5 2 mA

∆I

TTL Inputs HIGH VIN = 3.4V

(3)

(1)

Min. Typ.

ICCD Dynamic Power Supply VCC = Max. VIN = VCC — 0.15 0.25 mA/

(4)

Current

Outputs Open VIN = GND MHz
OE = GND
One Input Toggling
50% Duty Cycle

I

C Total Power Supply Current

(6)

VCC = Max. VIN = VCC — 1.5 3.5 mA
Outputs Open V

IN = GND

fo = 10MHz
50% Duty Cycle V

OE = GND V

IN = 3.4V — 1.8 4.5
IN = GND

One Bit Toggling
V

CC = Max. VIN = VCC — 1.5 3.5

Outputs Open VIN = GND
fo = 2.5MHz

50% Duty Cycle V

IN = 3.4V — 2.5 7.5

OE = GND VIN = GND
Four Bits Toggling

(2)

Max. Unit

(5)

(5)

NOTES:

1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at VCC = 5.0V, +25°C ambient.

3. Per TTL driven input; (VIN = 3.4V). All other inputs at VCC or GND.

4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.

5. Values for these conditions are examples of ∆ICC formula. These limits are guaranteed but not tested.

6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ∆ICC DHNT + ICCD (fONO)
ICC = Quiescent Current
∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL)
fO = Output Frequency
NO = Number of Outputs at fO

All currents are in milliamps and all frequencies are in megahertz.

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IDT54/74FCT257T/AT/CT/DT
FAST CMOS QUAD 2-INPUT MULTIPLEXER

MILITARY AND INDUSTRIAL TEMPERATURE RANGES

SWITCHING CHARACTERISTICS OVER OPERATING RANGE - INDUSTRIAL

Symbol Parameter Condition

t

PLH Propagation Delay CL = 50pF 1.5 5 1.5 4.3 1.5 3.9 ns

(1)

tPHL Ix to Zx RL = 500Ω

PLH Propagation Delay 1.5 7 1.5 5.2 1.5 4.4 ns

t
tPHL S to Zx

PZH Output Enable Time 1.5 7 1.5 6 1.5 4.4 ns

t
tPZL
tPHZ Output Disable Time 1.5 5.5 1. 5 5 1.5 4.4 ns

PLZ

t

NOTES:

1. See test circuit and waveforms.

2. Minimum limits are guaranteed but not tested on Propagation Delays.

FCT257AT FCT275CT FCT275DT

Min.

(2)

Max. Min.

(2)

Max. Min.

(2)

Max. Unit

SWITCHING CHARACTERISTICS O VER OPERATING RANGE - MILIT ARY

Symbol Parameter Condition

PLH Propagation Delay CL = 50pF 1.5 7 1.5 5.8 1.5 5 ns

t

(1)

tPHL Ix to Zx RL = 500Ω
t

PLH Propagation Delay 1.5 1 2 1.5 8.1 1.5 6 ns

tPHL S to Zx

PZH Output Enable Time 1.5 1 0 1.5 8 1.5 6.8 ns

t
tPZL
tPHZ Output Disable Time 1.5 8 1.5 5.8 1.5 5.3 ns

PLZ

t

FCT257T FCT275AT FCT275CT

Min.

(2)

Max. Min.

(2)

Max. Min.

(2)

Max. Unit

NOTES:

1. See test circuit and waveforms.

2. Minimum limits are guaranteed but not tested on Propagation Delays.

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IDT54/74FCT257T/AT/CT/DT
FAST CMOS QUAD 2-INPUT MULTIPLEXER

TEST CIRCUITS AND WAVEFORMS

MILITARY AND INDUSTRIAL TEMPERATURE RANGES

Pulse

Generator

D.U.T
.

T

R

Test Circuits for All Outputs

VIN

DATA

INPUT

TIMING

INPUT

ASYNCHRONOUS CONTROL

PRESET

CLEAR

ETC.

SYNCHRONOUS CONTROL

PRESET

CLEAR

CLOCK ENABLE

ETC.

Set-Up, Hold, and Release Times

VCC

tSU

tSU

VOUT

tREM

tH

50pF

L

C

tH

Octal link

500Ω

500Ω

Octal link

7.0V

3V

1.5V
0V

3V

1.5V
0V

3V

1.5V
0V

3V

1.5V
0V

SWITCH POSITION

Test Switch

Open Drain

Disable Low Closed

Enable Low

All Other Tests Open

DEFINITIONS:

L = Load capacitance: includes jig and probe capacitance.

C
R

T = Termination resistance: should be equal to ZOUT of the Pulse Generator.

LOW-HIGH-LOW

HIGH-LOW-HIGH

PULSE

tW

PULSE

Octal link

Pulse Width

1.5V

1.5V

SAME PHASE

INPUT TRANSITION

OUTPUT

OPPOSITE PHASE

INPUT TRANSITION

tPLH

tPLH tPHL

Propagation Delay

tPHL

Octal link

3V

1.5V
0V

V

OH

1.5V
VOL

3V

1.5V
0V

ENABLE DISABLE

3V

CONTROL

INPUT

OUTPUT

NORMALLY

LOW

SWITCH
CLOSED

3.5V

1.5V

t

PLZtPZL

0.3V

1.5V
0V

3.5V
VOL

tPZH tPHZ

OUTPUT

NORMALLY

HIGH

SWITCH
OPEN

1.5V
0V

0.3V

VOH

0V

Octal link

Enable and Disable Times

NOTES:

1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.

2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns.

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IDT54/74FCT257T/AT/CT/DT
FAST CMOS QUAD 2-INPUT MULTIPLEXER

ORDERING INFORMATION

MILITARY AND INDUSTRIAL TEMPERATURE RANGES

IDT XX

Temp. Range

FCT

Device Type

XXXX

XX

Package

X

Process

BlankBIndustrial

MIL-STD-883, Class B

Industrial Options
SO
Q

Small Outline IC (300 mil)

Quarter-size Small Outline Package

Military Options
D
L

257T

CERDIP

Leadless Chip Carrier

Quad 2-Input Multiplexer (3-State)
257AT
257CT
257DT

54
74

– 55°C to +125°C

– 40°C to +85°C

CORPORATE HEADQUARTERS for SALES: for Tech Support:

2975 Stender Way 800-345-7015 or 408-727-6116 [e-mail]
Santa Clara, CA 95054 fax: [phone] [phone]

www.idt.com

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