Integrated Device Technology Inc IDT54157ATSOB, IDT54157CTD, IDT54157CTDB, IDT54157CTE, IDT54157CTEB Datasheet

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Integrated Device Technology, Inc.
DESCRIPTION:
The FCT157T, FCT257T/FCT2257T are high-speed quad 2-input multiplexers built using an advanced dual metal CMOS technology. Four bits of data from two sources can be selected using the common select input. The four buffered outputs present the selected data in the true (non-inverting) form.
The FCT157T has a common, active-LOW, enable input. When the enable input is not active, all four outputs are held LOW. A common application of ‘FCT157T is to move data from two different groups of registers to a common bus. Another application is as a function generator. The ‘FCT157T can generate any four of the 16 different functions of two variables with one variable common.
The FCT257T/FCT2257T have a common Output Enable (OE) input. When OE is HIGH, all outputs are switched to a
high-impedance state allowing the outputs to interface directly with bus-oriented systems.
The FCT2257T has balanced output drive with current limiting resistors. This offers low ground bounce, minimal undershoot and controlled output fall times-reducing the need for external series terminating resistors. FCT2xxxT parts are plug-in replacements for FCTxxxT parts.
FAST CMOS QUAD 2-INPUT MULTIPLEXER
IDT54/74FCT157T/AT/CT/DT IDT54/74FCT257T/AT/CT/DT
IDT54/74FCT2257T/AT/CT
MILITARY AND COMMERCIAL TEMPERATURE RANGES JUNE 1996
1
1996 Integrated Device Technology, Inc. 6.6 2537/6
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
FEATURES:
• Common features:
– Low input and output leakage 1µA (max.) – CMOS power levels – True TTL input and output compatibility
– VOH = 3.3V (typ.)
– VOL = 0.3V (typ.) – Meets or exceeds JEDEC standard 18 specifications – Product available in Radiation Tolerant and Radiation
Enhanced versions – Military product compliant to MIL-STD-883, Class B
and DESC listed (dual marked) – Available in DIP, SOIC, SSOP, QSOP, CERPACK
and LCC packages
• Features for FCT157T/257T:
– Std., A, C and D speed grades – High drive outputs (-15mA IOH, 48mA IOL)
• Features for FCT2257T:
– Std., A, and C speed grades – Resistor outputs (-15mA I
OH, 12mA IOL Com.)
(-12mA IOH, 12mA IOL Mil.)
– Reduced system switching noise
E
157 Only
3 other multiplexers
OE257 Only
Z
A
Z B–Z D
S
I
1B–I1D
I0B–I
0D
I
1A
I
0A
2537 drw 01
2537 drw 02
2537 drw 03
FUNCTIONAL BLOCK DIAGRAM
PIN CONFIGURATIONS
LCC
TOP VIEW
4 5 6 7 8
L20-2
18 17 16 15 14
9
10 11 12 13
32
1
20 19
INDEX
GND
NC
Vcc
E or OE*
NC
NC NC
S
I
0A
I
1A
ZA I0B
I1B
ZB
ZDI
1D
I0C I
1C
ZC I
0D
DIP/SOIC/QSOP/CERPACK
TOP VIEW
5 6 7 8
S
I
0A
1 2 3 4
16 15 14 13 12 11 10
9
Vcc
P16-1, D16-1,
SO16-1,
SO16-7
&
E16-1
I
1A
Z
A
I
0B
I
1B
GND
Z
E or OE*
I
0C
I
1C
Z
C
I
0D
I Z
D
B
1D
* E for FCT157, OE for FCT257/FCT2257.
6.6 2
IDT54/74FCT157T/AT/CT/DT, IDT54/74FCT257T/AT/CT/DT- 2257T/AT/CT FAST CMOS QUAD 2-INPUT MULTIPLEXER MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN DESCRIPTION
Pin Names Description
I
0A–I0D Source 0 Data Inputs
I
1A–I1D Source 1 Data Inputs
E
Enable Input (Active LOW)–FCT157T
OE
Output Enable (Active LOW)–FCT257T/2257T S Select Input Z
A–ZD Outputs
2537 tbl 01
FUNCTION TABLE
(1)
Inputs Output ZN
EE/
OE
OE
SI0 I1 157 257
HXXX L Z
LHXL L L LHXH H H LLLX L L LLHX H H
NOTE: 2537 tbl 02
1. H = HIGH Voltage Level L = LOW Voltage Level X = Don’t Care Z = High Impedance
ABSOLUTE MAXIMUM RATINGS
(1)
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Rating Commercial Military Unit
VTERM
(2)
Terminal Voltage with Respect to GND
–0.5 to +7.0 –0.5 to +7.0 V
VTERM
(3)
Terminal Voltage with Respect to GND
–0.5 to
V
CC +0.5
–0.5 to
VCC +0.5
V
TA Operating
Temperature
0 to +70 –55 to +125 °C
TBIAS Temperature
Under Bias
–55 to +125 –65 to +135 °C
TSTG Storage
Temperature
–55 to +125 –65 to +150 °C
PT Power Dissipation 0.5 0.5 W IOUT DC Output
Current
–60 to +120 –60 to +120 mA
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT­INGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed V
CC by +0.5V unless otherwise noted.
2. Input and V
CC terminals only.
3. Outputs and I/O terminals only.
Symbol Parameter
(1)
Conditions Typ. Max. Unit
C
IN
Input Capacitance
VIN = 0V 6 10
pF
C
OUT
Output Capacitance
V
OUT
= 0V 8 12
pF
NOTE:
1. This parameter is measured at characterization but not tested.
2537 lnk 03
2537 lnk 04
IDT54/74FCT157T/AT/CT/DT, IDT54/74FCT257T/AT/CT/DT - 2257T/AT/CT FAST CMOS QUAD 2-INPUT MULTIPLEXER MILITARY AND COMMERCIAL TEMPERATURE RANGES
6.6 3
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
V
OH
Output HIGH Voltage VCC = Min.
V
IN
= V
IH
or V
IL
IOH = –6mA MIL. I
OH
= –8mA COM'L.
2.4 3.3 V
IOH = –12mA MIL. I
OH
= –15mA COM'L.
2.0 3.0 V
V
OL
Output LOW Voltage VCC = Min.
V
IN
= V
IH
or V
IL
I
OL
= 32mA MIL.
I
OL
= 48mA COM'L.
0.3 0.50 V
I
OS
Short Circuit Current VCC = Max., VO = GND
(3)
–60 –120 –225 mA
I
OFF
Input/Output Power Off Leakage
(5)
VCC = 0V, VIN or VO ≤ 4.5V
±
1
µ
A
OUTPUT DRIVE CHARACTERISITICS FOR FCT157/257T
2537 tbl 06
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
I
ODL
Output LOW Current VCC = 5V, V
IN
= V
IH or VIL, VOUT
= 1.5V
(3)
16 48 mA
I
ODH
Output HIGH Current VCC = 5V, V
IN
= V
IH
or V
IL,VOUT
= 1.5V
(3)
–16 –48 mA
V
OH
Output HIGH Voltage VCC = Min.
V
IN
= V
IH
or V
IL
IOH = –12mA MIL. I
OH
= –15mA COM'L.
2.4 3.3 V
V
OL
Output LOW Voltage VCC = Min.
V
IN
= V
IH
or V
IL
IOL = 12mA 0.3 0.50 V
OUTPUT DRIVE CHARACTERISTICS FOR FCT2257T
2537 lnk 07
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. The test limit for this parameter is ±5µA at T
A = –55°C.
5. This parameter is guaranteed but not tested.
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
V
IH
Input HIGH Level Guaranteed Logic HIGH Level 2.0 V
V
IL
Input LOW Level Guaranteed Logic LOW Level 0.8 V
I
I H
Input HIGH Current
(4)
VCC = Max. VI = 2.7V
±
1
µ
A
I
I L
Input LOW Current
(4)
VI = 0.5V
±
1
I
OZH
High Impedance Output Current VCC = Max. VO = 2.7V
±
1
µ
A
I
OZL
(3-State Output pins)
(4)
VO = 0.5V
±
1
II Input HIGH Current
(4)
VCC = Max., VI = V
CC
(Max.)
±
1
µ
A
V
IK
Clamp Diode Voltage VCC = Min., I
IN
= –18mA –0.7 –1.2 V
V
H
Input Hysteresis
200 mV
I
CC
Quiescent Power Supply Current VCC = Max., VIN = GND or V
CC
0.01 1 mA
2537 lnk 05
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