Integrated Device Technology Inc 7429FCT521DTSOB, 7429FCT521DTSO, 7429FCT521DTQB, 7429FCT521DTQ, 7429FCT521CTSO Datasheet
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Integrated Device Technology, Inc.
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
DESCRIPTION:
The IDT29FCT520AT/BT/CT/DT and IDT29FCT521AT/
BT/CT/DT each contain four 8-bit positive edge-triggered
registers. These may be operated as a dual 2-level or as a
single 4-level pipeline. A single 8-bit input is provided and any
of the four registers is available at the 8-bit, 3-state output.
These devices differ only in the way data is loaded into and
between the registers in 2-level operation. The difference is
illustrated in Figure 1. In the IDT29FCT520AT/BT/CT/DT
when data is entered into the first level (I = 2 or I = 1), the
existing data in the first level is moved to the second level. In
the IDT29FCT521AT/BT/CT/DT, these instructions simply
cause the data in the first level to be overwritten. Transfer of
data to the second level is achieved using the 4-level shift
instruction (I = 0). This transfer also causes the first level to
change. In either part I=3 is for hold.
FUNCTIONAL BLOCK DIAGRAM
2619 drw 01
REGISTER
CONTROL
2
1
I ,I10
CLK
OCTAL REG. A1
OCTAL REG. A2
OCTAL REG. B1
OCTAL REG. B2
MUX
MUX
2
S ,S10
8
Y -Y70
OE
8
D -D70
MULTILEVEL
PIPELINE REGISTERS
IDT29FCT520AT/BT/CT/DT
IDT29FCT521AT/BT/CT/DT
MILITARY AND COMMERCIAL TEMPERATURE RANGES APRIL 1994
1994 Integrated Device Technology, Inc. DSC-4215/4
1
FEATURES:
• A, B, C and D speed grades
• Low input and output leakage ≤1µA (max.)
• CMOS power levels
• True TTL input and output compatibility
– VOH = 3.3V (typ.)
– VOL = 0.3V (typ.)
• High drive outputs (-15mA IOH, 48mA IOL)
• Meets or exceeds JEDEC standard 18 specifications
• Product available in Radiation Tolerant and Radiation
Enhanced versions
• Military product compliant to MIL-STD-883, Class B
and DESC listed (dual marked)
• Available in DIP, SOIC, SSOP, QSOP, CERPACK and
LCC packages
6.2
6.2 2
IDT29FCT520AT/BT/CT/DT, 521AT/BT/CT/DT
MULTILEVEL PIPELINE REGISTERS MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN CONFIGURATIONS
NOTE:
1. I = 3 for hold.
Figure 1. Data Loading in 2-Level Operation
DUAL 2-LEVEL SINGLE 4-LEVEL
2619 drw 04
A1
A2
B1
B2
A1
A2
B1
B2
I = 2 I = 1
A
1
A2
B1
B2
A1
A2
B1
B2
I = 2 I = 1
A
1
A2
B1
B2
I = 0
A
1
A2
B1
B2
I = 0
IDT29FCT520T
IDT29FCT521T
5
6
7
8
9
10
11
12
GND
1
2
3
4
24
23
22
21
20
19
18
17
Vcc
16
15
14
13
P24-1
D24-1
SO24-2
SO24-7
SO24-8*
&
E24-1
S
0
S
1
Y
0
Y1
Y2
Y
3
Y
4
Y5
OE
I
0
I1
D0
D
1
D
2
D3
D4
D
5
D
6
D7
CLK
Y
6
Y
7
*FCT520 only
DEFINITION OF FUNCTIONAL TERMS
Pin Names Description
D
n Register input Port.
CLK Clock input. Enter data into registers on LOW-
to-HIGH transitions.
I
0, I1 Instruction inputs. See Figure 1 and in-
struction Control Tables.
S
0, S1 Multiplexer select. Inputs either register A1, A2,
B
1 or B2 data to be available at the output port.
OE
Output enable for 3-state output port.
Y
n Register output port.
2619 tbl 01
REGISTER SELECTION
S1 S0 Register
00B
2
01B1
10A2
11A1
2619 tbl 02
I
2619 drw 03
5
6
7
8
9
10
11
L28-1
25
24
23
22
21
20
19
INDEX
D
1
D
2
D
3
D
4
D
5
D
6
NC
Vcc
S
0S1
D0I
1
0
GND
NC
NC
NC
Y
0
Y
1
Y
2
Y
3
Y
4
Y
5
D
7
CLK
OE
Y
6Y7
12 13 14 15 16 17 18
432128 27 26
2619 drw 02
DIP/SOIC/SSOP/QSOP/CERPACK
TOP VIEW
LCC
TOP VIEW
IDT29FCT520AT/BT/CT/DT, 521AT/BT/CT/DT
MULTILEVEL PIPELINE REGISTERS MILITARY AND COMMERCIAL TEMPERATURE RANGES
6.2 3
CAPACITANCE (TA = +25°C, f = 1.0MHz)ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Rating Commercial Military Unit
VTERM
(2)
Terminal Voltage
with Respect to
GND
–0.5 to +7.0 –0.5 to +7.0 V
VTERM
(3)
Terminal Voltage
with Respect to
GND
–0.5 to
V
CC +0.5
–0.5 to
VCC +0.5
V
TA Operating
Temperature
0 to +70 –55 to +125 °C
TBIAS Temperature
Under Bias
–55 to +125 –65 to +135 °C
TSTG Storage
Temperature
–55 to +125 –65 to +150 °C
PT Power Dissipation 0.5 0.5 W
IOUT DC Output
Current
–60 to +120 –60 to +120 mA
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability. No terminal voltage may exceed
V
CC by +0.5V unless otherwise noted.
2. Input and V
CC terminals only.
3. Outputs and I/O terminals only.
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
V
IH Input HIGH Level Guaranteed Logic HIGH Level 2.0 — — V
V
IL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V
I
IH Input HIGH Current
(4)
VCC = Max. VI = 2.7V — — ±1 µA
I
IL Input LOW Current
(4)
VCC = Max. VI = 0.5V — — ±1 µA
I
OZH High Impedance
(4)
VCC = Max. VO = 2.7V — — ±1 µA
I
OZL Output Current VO = 0.5V — — ±1
I
I Input HIGH Current
(4)
VCC = Max., VI = VCC (Max.) — — ±1 µA
V
IK Clamp Diode Voltage VCC = Min., IN = –18mA — –0.7 –1.2 V
I
OS Short Circuit Current VCC = Max.
(3)
, VO = GND –60 –120 –225 mA
V
OH Output HIGH Voltage VCC = Min. IOH = –6mA MIL. 2.4 3.3 — V
V
IN = VIH or VIL IOH = –8mA COM’L.
I
OH = –12mA MIL. 2.0 3.0 —
I
OH = –15mA COM’L.
V
OL Output LOW Voltage VCC = Min. IOL = 32mA MIL. — 0.3 0.5 V
V
IN = VIH or VIL IOL = 48mA COM’L.
V
H Input Hysteresis — — 200 — mV
I
CC Quiescent Power VCC = Max. — 0.01 1 mA
Supply Current V
IN = GND or VCC
NOTES: 2619 tbl 05
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC = 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. The test limit for this parameter is ±5µA at T
A = -55°C.
Symbol Parameter
(1)
Conditions Typ. Max. Unit
CIN Input
Capacitance
VIN = 0V 6 10 pF
COUT Output
Capacitance
VOUT = 0V 8 12 pF
2619 lnk 04
2619 lnk 03
NOTE:
1. This parameter is measured at characterization but not tested.
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