output frequency range of 15.625MHz to 500MHz. The
device powers up at a default output frequency of
200MHz with a 16.6667MHz crystal interface, and the
frequency can then be changed using the serial programming interface to change the M feedback divider and N
output divider. Frequency steps as small as 125kHz can
be achieved using a 16.6667MHz crystal and the output
divider set for ÷16. The low jitter and frequency range of the
ICS8427-02 make it an ideal clock generator for most
clock tree applications.
BLOCK DIAGRAM
The ICS8427-02 is a general purpose, six
LVHSTL output high frequency synthesizer
and a member of the HiPerClockS™ family of
High Performance Clock Solutions from ICS.
The ICS8427-02 can support a very wide
ICS8427-02
500MHZ, LOW JITTER
FEATURES
• Six differential LVHSTL outputs
• Selectable crystal input interface or TEST_CLK input
• TEST_CLK accepts the following input types:
LVCMOS, LVTTL
• Output frequency range: 15.625MHz to 500MHz
• VCO range: 250MHz to 500MHz
• Serial interface for programming feedback and output dividers
• Supports SSC, -0.5% downspread. Can be enabled through
use of the serial programming interface.
• Output skew: 100ps (maximum)
• Cycle-to-cycle jitter: 50ps (maximum)
• 2.5V core/1.8V output supply voltage
• 0°C to 70°C ambient operating temperature
• Industrial temperature information available upon request
• Available in both standard and lead-free RoHS-compliant
packages
VCO_SEL
XTAL_SEL
TEST_CLK
XTAL_IN
XTAL_OUT
MR
OE
S_LOAD
S_DATA
S_CLOCK
0
OSC
1
÷ 16
PHASE DETECTOR
÷ M
PLL
VCO
÷ 2
CONFIGURATION
INTERFACE
LOGIC
PIN ASSIGNMENT
VCO_SEL
V
DD
nFOUT5
FOUT5
XTAL_IN
GND
24
23
22
21
20
19
18
17
XTAL_OUT
TEST_CLK
XTAL_SEL
V
DDA
S_LOAD
S_DATA
S_CLOCK
MR
nFOUT1
32 31 30 29 28 27 26 25
V
DDO
1
FOUT2
nFOUT2
÷ 1,
÷ 2,
÷ 4,
0
÷ 8,
÷ 16
1
FOUT0
nFOUT0
FOUT1
nFOUT1
FOUT2
nFOUT2
FOUT3
nFOUT3
FOUT4
nFOUT4
FOUT5
nFOUT5
FOUT3
nFOUT3
2
3
V
DDO
4
5
6
OE
7
8
GND
9 10 11 12 13 14 15 16
7mm x 7mm x 1.4mm package body
nFOUT0
V
DDO
FOUT0
FOUT1
ICS8427-02
V
nFOUT4
FOUT4
VDDTEST
32-Lead LQFP
DDO
Y Package
Top View
32-Lead VFQFN
TEST
5mm x 5mm x 0.75mm package body
K Package
Top View
8427DY-02www.icst.com/products/hiperclocks.htmlREV. A FEBRUARY 17, 2006
1
Integrated
Circuit
Systems, Inc.
LVCMOS/CRYSTAL-TO-LVHSTL FREQUENCY SYNTHESIZER
FUNCTIONAL DESCRIPTION
NOTE: The functional description that follows describes operation using a 16.6667MHz crystal. Valid PLL loop divider
values for different crystal or input frequencies are defined in
the Input Frequency Characteristics, T ab le 6 NO TE 1.
The ICS8427-02 features a fully integrated PLL and therefore
requires no external components for setting the loop bandwidth.
A parallel-resonant, fundamental crystal is used as the input to
the on-chip oscillator. The output of the oscillator is divided by
16 prior to the phase detector. With a 16.6667MHz crystal, this
provides a 1.0417MHz reference frequency. The VCO of the
PLL operates over a range of 250MHz to 500MHz. The output of
the M divider is also applied to the phase detector.
The phase detector and the M divider force the VCO output frequency to be 2M times the reference frequency by adjusting
the VCO control voltage. Note that for some values of M (either too
high or too low), the PLL will not achieve lock. The output of the
VCO is scaled by a divider prior to being sent to each of the LVPECL
output buffers. The divider provides a 50% output duty cycle.
The ICS8427-02 powers up by default to 200MHz output frequency, using a 16.6667MHz crystal (M = 192, N = 2). The
output frequency can be changed after power-up by using the
serial interface to program the M feedback divider and the N
output divider.
ICS8427-02
500MHZ, LOW JITTER
The M value and the required values of M0 through M8 are shown
in Table 3B, Programmable VCO Frequency Function Table. Valid
M values for which the PLL will achieve lock for a 16.6667MHz
reference are defined as 120 ≤ M ≤ 240. The frequency out is
defined as follows:
Serial operation occurs when S_LOAD is LOW. The shift
register is loaded by sampling the S_DATA bits with the rising
edge of S_CLOCK. The contents of the shift register are
loaded into the M divider and N output divider when S_LOAD
transitions from LOW-to-HIGH. The M divide and N output
divide values are latched on the HIGH-to-LOW transition of
S_LOAD. If S_LOAD is held HIGH, data at the S_DATA input
is passed directly to the M divider and N outputdivider on each
rising edge of S_CLOCK. The serial mode can be used to
program the M and N bits and test bits T1 and T0. The internal
registers T0 and T1 determine the state of the TEST output
as follows:
T1T0TEST Output
00LOW
01S_Data, Shift Register Input
10Output of M divider
11CMOS Fout
(Power-up
Default)
fout
=
fVCO
N
=
16
2Mfxtal
x
N
The relationship between the VCO frequency, the crystal frequency and the M divider is defined as follows:
fxtal
fVCO =
S_CLOCK
S_DATA
S_LOAD
16
x 2M
T1T0
tSt
H
N2
N1N0M8M7M6M5M4M3M2M1M0SSC
Time
FIGURE 1. SERIAL LOAD OPERATIONS
NOTE: Default Output Frequency, using a 16.6667MHz crystal
on power-up = 200MHz (M = 192, N = 2) SSC off
t
S
8427DY-02www.icst.com/products/hiperclocks.htmlREV. A FEBRUARY 17, 2006
2
Integrated
Circuit
Systems, Inc.
Test Mode
Control Register
LVCMOS/CRYSTAL-TO-LVHSTL FREQUENCY SYNTHESIZER
M AND N DIVIDERS, SSC AND TEST MODE CONTROL BITS
N Divider
M Divider
ICS8427-02
500MHZ, LOW JITTER
SSC Control
Register
➤
➤
➤
S_DATA
➤
➤
1T0T2N1N0N8M7M6M5M4M3M2M1M0MCSS
➤
1T0T2N1N0N8M7M6M5M4M3M2M1M0MCSS
➤
➤
➤
➤
➤
➤
➤
➤
➤
➤
➤
➤
➤
➤
➤
Shift Register
TEST Output
T1:T0 = 01
ICS8427-02 SHIFT REGISTER OPERATION – READ BACK CAPABILITY
1. Device powers up by default in Test Mode 01.
The Test Output in this case is wired to the shift register.
2. Shift in serial data stream and latch into M, N, T1, T0 and SSC Control Bits.
Shift in T1:T0=00, so that the TEST Output will be turned off after the bits are shifted in and latched.
TEST Output
T1 T0 N2 N1 N0 M8 M7 M6 M5 M4 M3 M2 M1 M0 SSC
➤
➤
➤
➤
Data transfer from shift register
to M and N dividers and SSC and
Test Control Bits on a low-to-high
transition of S_LOAD.
S_CLOCK
S_DATA
S_LOAD
8427DY-02www.icst.com/products/hiperclocks.htmlREV. A FEBRUARY 17, 2006
T1 T0 N2 N1 N0 M8 M7 M6 M5 M4 M3 M2 M1 M0 SSC
tSt
H
Time
Data transferred to M, N dividers, TEST and SSC Control Bits.
Changes to M, N, SSC and TEST mode bits take affect at this time.
Data latched into M, N Dividers, TEST and SSC control bits.