parallel resonant crystal, the following frequencies can be
generated based on the 2 frequency select pins (F_SEL1:0):
156.25MHz, 125MHz, and 62.5MHz. The ICS840002-01 uses
ICS’ 3
achieve 1ps or lower typical random rms phase jitter, easily
meeting Ethernet jitter requirements. The ICS840002-01 is
packaged in a small 16-pin TSSOP package.
FREQUENCY SELECT FUNCTION TABLE
0052452.651
01525 521
1052015.26
11525 521
The ICS840002-01 is a 2 output LVCMOS/LVTTL
Synthesizer optimized to generate Ethernet
reference clock frequencies and is a member of
TM
the HiPerClocks
family of high performance
clock solutions from ICS. Using a 25MHz 18pF
rd
generation low phase noise VCO technology and can
stupnI
1LES_F0LES_FeulaVrediviDMeulaVrediviDN
FEATURES
• Two LVCMOS/LVTTL outputs @ 3.3V,
17Ω typical output impedance
• Selectable crystal oscillator interface
or LVCMOS/LVTTL single-ended input
• Output frequency range: 56MHz - 175MHz
• VCO range: 560MHz - 700MHz
• Output skew: 12ps (maximum)
• RMS phase jitter at 156.25MHZ (1.875MHz - 20MHz):
0.47ps (typical)
Phase noise:
OffsetNoise Power
100Hz ............... -97.4 dBc/Hz
1kHz .............. -120.2 dBc/Hz
10kHz .............. -127.6 dBc/Hz
100kHz ..............-126.1 dBc/Hz
• Full 3.3V or 3.3V core/2.5V output supply mode
• -30°C to 85°C ambient operating temperature
• Available in both standard and lead-free RoHS compliant
packages
ycneuqerFtuptuO
).feRzHM52(
BLOCK DIAGRAM PIN ASSIGNMENT
Pullup
OE
Phase
2
M = ÷25 (fixed)
VCO
1
F_SEL1:0
N
0 0 ÷4
0 1 ÷5
1 0 ÷10
1 1 ÷5
1
0
Q0
Q1
F_SEL1:0
nPLL_SEL
nXTAL_SEL
XTAL_IN
XTAL_OUT
TEST_CLK
840002AG-01www.icst.com/products/hiperclocks.htmlREV. B JANUARY 13, 2006
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device. These ratings are stress specifications only. Functional
operation of product at these conditions or any conditions be-
yond those listed in the DC Characteristics or AC Character-istics is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect product reliability.