128Kx16 bit 1.8V and Ultra Low Power CMOS Static RAM
Revision History
Revision NoHistoryDraft DateRemark
0AInitial DraftApril 23,2002Preliminary
The attached datasheets are provided by ICSI. Integrated Circuit Solution Inc reserve the right to change the specifications and
products. ICSI will answer to your questions about device. If you have any questions, please contact the ICSI offices.
Integrated Circuit Solution Inc.1
LPSR024-0A 4/23/2002
IC62VV12816L
IC62VV12816LL
128K x 16 1.8V ULTRA
LOW POWER CMOS STATIC RAM
FEATURES
• High-speed access times: 70, 100 ns
• CMOS low power operation
I
CC1=7mA (typical)* operating
I
SB2=0.5µA (typical)* CMOS standby
* Typical values are measured at V
A=25°C
T
CC=1.8V,
• TTL compatible interface levels
• Single 1.65V-2.2V Vcc power supply
• Fully static operation: no clock or refresh
required
• Three state outputs
• Data control for upper and lower bytes
• Industrial temperature available
• Available in the 44-pin TSOP-2 and 48-pin
6*8mm TF-BGA
FUNCTIONAL BLOCK DIAGRAM
DESCRIPTION
The ICSI IC62VV12816L and IC62VV12816LL are low-power,
2,097,152 bit static RAMs organized as 131,072 words by 16
bits. They are fabricated using ICSI's high-performance CMOS
technology. This highly reliable process coupled with innovative circuit design techniques, yields high-performance and low
power consumption devices.
When CE is HIGH (deselected) or both LB and UB are HIGH,
the device assumes a standby mode at which the power
dissipation can be reduced by using CMOS input levels.
Easy memory expansion is provided by using Chip Enable
Output and Enable inputs, CE and OE. The active LOW Write
Enable (WE) controls both writing and reading of the memory.
A data byte allows Upper Byte (UB) and Lower Byte (LB)
access.
The IC62VV12816L and IC62VV12816LL are packaged in the
JEDEC standare 44-pin TSOP-2 and 48-pin 6*8mm TF-BGA.
LBLower-byte Control (l/O0-I/O7)
UBUpper-byte Control (l/O8-I/O15)
N CNo Connection
VccPower
GNDGround
TRUTH TABLE
I/O PIN
Mode
WEWE
WE
WEWE
Not SelectedXHXXXHigh-ZHigh-ZStand by
Output Disabled HLHXXHigh-ZHigh-ZActive
ReadHLLLHDOUTHigh-ZActive
WriteLLXLHDINHigh-ZActive
CECE
CE
CECE
OEOE
OE
OEOE
LBLB
LB
LBLB
UBUB
UBI/O0/-I/O7I/O8-I/O15Power
UBUB
XLXHHHigh-ZHigh-ZStand by
XLXHHHigh-ZHigh-ZStand by
HLLHLHigh-ZDOUT
HLLLLDOUTDOUT
LLXHLHigh-ZDIN
LLXLLDINDIN
Integrated Circuit Solution Inc.3
LPSR024-0A 4/23/2002
IC62VV12816L
IC62VV12816LL
OPERATING RANGE
RangeAmbient TemperatureVCC
Commercial0°C to +70°C1.65V- 2.2V
Industrial–40°C to +85°C1.65V - 2.2V
ABSOLUTE MAXIMUM RATINGS
(1)
SymbolParameterValueUnit
VTERMTerminal Voltage with Respect to GND–0.5 to Vcc + 0.4V
TBIASTemperature Under Bias–40 to + 85°C
VCCVcc related to GND–0.3 to + 2.4V
TSTGStorage Temperature–65 to + 150°C
PTPower Dissipation1.0W
Notes:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at these or any other conditions above
those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)
2. The device is continuously selected. OE, CE,UB, or LB = V
3. Address is valid prior to or coincident with CE LOW transitions.
HIGH-Z
LZB
IL.
DATA VALID
t
HZOE
t
HZCE
t
HZB
t
OHA
Integrated Circuit Solution Inc.7
LPSR024-0A 4/23/2002
IC62VV12816L
IC62VV12816LL
WRITE CYCLE SWITCHING CHARACTERISTICS
(1,2)
(Over Operating Range)
-70-100
SymbolParameterMin.Max.Min.MaxUnit
tWCWrite Cycle Time70—100—ns
tSCECE to Write End65—80—ns
tAWAddress Setup Time to Write End65—80—ns
tHAAddress Hold from Write End0—0—ns
tSAAddress Setup Time0—0—ns
tPWBLB, UB Valid to End of Write60—80—ns
tPWEWE Pulse Width55—80—ns
tSDData Setup to Write End30—40—ns
tHDData Hold from Write End0—0—ns
(3)
tHZWE
tLZWE
Notes:
1. Test conditions assume signal transition times of 5 ns or less, input pulse levels of 0.4V to 1.4V and output loading specified in
Figure 1.
2. The internal write time is defined by the overlap of CE LOW, and UB or LB, and WE LOW. All signals must be in valid states to
initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the
rising or falling edge of the signal that terminates the Write.
3. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
WE LOW to High-Z Output—30—40ns
(3)
WE HIGH to Low-Z Output5—5—ns
AC WAVEFORMS
CE
WE
UB, LB
D
OUT
D
(1,2)
(CE Controlled)
IN
t
SA
DATA UNDEFINED
t
WC
VALID ADDRESS
t
SCS
t
AW
t
PWE
t
PBW
t
HZWE
HIGH-Z
t
SD
DATAIN VALID
t
HD
t
LZWE
t
HA
WRITE CYCLE NO. 1
ADDRESS
Notes:
1. WRITE is an internally generated signal asserted during an overlap of the LOW states on the CE and WE inputs and at least
one of the LB and UB inputs being in the LOW state.
2. WRITE = (CE) [ (
LB) = (UB) ] (WE).
8Integrated Circuit Solution Inc.
LPSR024-0A 4/23/2002
IC62VV12816L
IC62VV12816LL
WRITE CYCLE NO. 2 (WE Controlled)
t
WC
ADDRESS
LOW
CE
WE
t
SA
UB, LB
D
OUT
D
IN
DATA UNDEFINED
WRITE CYCLE NO. 3 (UB / LB Controlled)
VALID ADDRESS
t
AW
t
PWE
t
PBW
t
HZWE
HIGH-Z
t
SD
DATAIN VALID
t
t
HD
t
LZWE
HA
ADDRESS
CE
WE
UB, LB
OUT
D
D
LOW
DATA UNDEFINED
IN
t
HZWE
t
t
SD
WC
t
WORD 2
t
WC
ADDRESS 1ADDRESS 2
t
SA
t
HA
t
SA
t
PBW
WORD 1
HIGH-Z
t
t
SD
DATAIN
VALID
HD
PBW
DATAIN
VALID
t
LZWE
t
t
HD
HA
Integrated Circuit Solution Inc.9
LPSR024-0A 4/23/2002
IC62VV12816L
IC62VV12816LL
DATA RETENTION SWITCHING CHARACTERISTICS
SymbolParameterTest ConditionMin.Max.Unit
VDRVcc for Data RetentionSee Data Retention Waveform1.02.2V