200pin Unbuffered DDR2 SDRAM SO-DIMMs based on 512 Mb 1st ver.
This Hynix unbuffered Slim Outline Dual In-Line Memory Module(DIMM) series consists of 512Mb 1st ver. DDR2
SDRAMs in Fine Ball Grid Array(FBGA) packages on a 200pin glass-epoxy substrate. This Hynix 512Mb 1st ver. based
Unbuffered DDR2 SO-DIMM series provide a high performance 8 byte interf ace in 67.60mm width form factor of industry standard. It is suitable for easy interchange and addition.
FEATURES
•JEDEC standard Double Data Rate2 Synchronous
DRAMs (DDR2 SDRAMs) with 1.8V +/- 0.1V Power
Supply
•All inputs and outputs are compatible with SSTL_1.8
interface
•Posted CAS
•Programmable CAS Latency 3 ,4 ,5
•OCD (Off-Chip Driver Impedance Adjustment) and
ODT (On-Die Termination)
•Fully differential clock operations (CK & CK
)
•Programmable Burst Length 4 / 8 with both sequential and interleave mode
This document is a general product description and is subject to change without notice. Hynix Semiconductor does not assume any
responsibility for use of circuits described. No patent licenses are implied.
256MB32M x 64132Mb x 16413(A0~A12)/2(BA0~BA1)/10(A0~A9)8K / 64ms
512MB64M x 64264Mb x 8814(A0~A13)/2(BA0~BA1)/10(A0~A9)8K / 64ms
512MB64M x 64132Mb x 16813(A0~A12)/2(BA0~BA1)/10(A0~A9)8K / 64ms
1GB128M x 64264Mb x 81614(A0~A13)/2(BA0~BA1)/10(A0~A9)8K / 64ms
# of
DRAMs
# of row/bank/column Address
Refresh
Method
Rev. 1.0 / Feb. 2005 2
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
PIN DESCRIPTION
SymbolType PolarityPin Description
The system clock inputs. All adress an commands lines are sampled on the cross point of
CK[1:0], CK
[1:0]Input
Cross
Point
the rising edge of CK and falling edge of CK
from the clock inputs and output tim ing for read operations is synchronized to the input
clock.
. A Delay Locked Loop(DLL) circuit is driven
CKE[1:0]Input
S
[1:0]Input
RAS
, CAS, WEInput
BA[1:0]InputSelects which DDR2 SDRAM internal bank of four is activated.
ODT[1:0]Input
A[9:0], A10/AP,
A[15:11]
DQ[63:0]In/OutData Input/Output pins.
DM[7:0]Input
Input
Active
High
Active
Low
Active
Low
Active
High
Active
High
Activates the DDR2 SDRAM CK signal when high and deactivates the CK signal when low.
By deactivating the clocks, CKE low initiates the Power Down mode or the Self Refresh
mode.
Enables the associated DDR2 SDRAM command decoder when low and disables the command decoder when high. When the command decoder is disabled, new commands are
ignored but previous operations continue. Rank 0 is selected by S
S
1
When sampled at the cross point of the ris ing edge of CK and falling ed ge of CK
and WE
define the operation to be excecuted by the SDRAM.
Asserts on-die termination for DQ, DM, DQS and DQS
SDRAM mode register.
During a Bank Activate command cycle, difines the row address when sampled at the cross
point of the rising edge of CK and falling edge of CK
cycle, defines the column address when sampled at the cr oss point of the rising edge of CK
and falling edge of CK
charge operation at the end of the burst read or write cycle. If AP is high., autoprecharge
is selected and BA0-BAn defines the bank to be precharged. If AP is low, autoprecharge is
disabled. During a Precharge command cycle., AP is used in conjunction with BA0-BAn to
control which bank(s) to precharge. If AP is high, all banks will be precharged regardless
of the state of BA0-BAn inputs. If AP is low, then BA0-BAn are used to define which bank
to precharge.
The data write masks, associated with one data byte. In Write mode , DM operates as a
byte mask by allowing input data to be written if it is low but blocks the write operation if
it is high. In Read mode, DM lines have no effect.
. In addition to the column address, AP is used to invoke autopre-
signals if enabled via the DDR2
. During a Read or Write command
0; Rank 1 is selected by
, CAS, RAS
The data strobe, associated with one data byte, sourced whit data transfers. In Write
mode, the data strobe is sourc ed by the c ontro ller and is cent ered in t he data w indo w. In
DQS[7:0], DQS
V
, VDDSPD,V
DD
SDAIn/Out
SCLInput
SA[1:0]InputAddress pins used to select the Serial Presence Detect base address.
TESTIn/Out
Rev. 1.0 / Feb. 2005 3
[7:0] In/Out
SupplyPower supplies for core, I/O, Serial Presense Detect, and ground for the module.
SS
Cross
point
Read mode, the data strobe is sourced by the DDR2 SDRAMs and is sent at leading edge
of the data window. DQS
of respective DQS and DQS
all DQS
signals must be tied on the system boar d to VS S and DDR2 SDRAM mode regis ters
programmed approriately.
This is a bidirectional pin used to transfer data int o or out of the SPD EEPROM. A resister
must be connected to V
This signals is used to clock data into and out of the SPD EEPROM. A resistor may be connected from SCL to VDD to act as a pull up.
The TEST pin is reserved for bus analysis tools and is not connected on normal memory
modules(SODIMMs).
signals are complements, and timing is relative to the crosspo int
. If the module is to be operated in single ended strobe mode,
o act as a pull up.
DD t
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
PIN ASSIGNMENT
Pin
Front
NO.
Side
1VREF2VSS51DQS252DM2101A1102A0151DQ42152DQ46
3VSS4DQ453VSS54VSS103VDD104VDD153DQ43154DQ47
5DQ06DQ555DQ1856DQ22105A10/AP106BA1155VSS156VSS
7DQ18VSS57DQ1958DQ23107BA0108R AS