HYNIX HY57V651620BLTC-10P, HY57V651620BLTC-10S, HY57V651620BLTC-55, HY57V651620BLTC-6, HY57V651620BLTC-7 Datasheet

...
HY57V651620B
4 Banks x 1M x 16Bit Synchronous DRAM
DESCRIPTION
The Hynix HY57V641620HG is a 67,108,864-bit CMOS Synchronous DRAM, ideally suited for the main memory applications which require large memory density and high bandwidth. HY57V641620HG is organized as 4banks of 1,048,576x16.
Programmable options include the length of pipeline (Read latency of 2 or 3), the number of consecutive read or write cycles initiated by a single control command (Burst length of 1,2,4,8 or Full page), and the burst count sequence(sequential or interleave). A burst of read or write cycles in progress can be terminated by a burst terminate command or can be interrupted and replaced by a new burst read or write command on any cycle. (This pipelined design is not restricted by a `2N` rule.)
FEATURES
Single 3.3±0.3V power supply
All device pins are compatible with LVTTL interface
JEDEC standard 400mil 54pin TSOP-II with 0.8mm of pin pitch
All inputs and outputs referenced to positive edge of system clock
Data mask function by UDQM or LDQM
Internal four banks operation
Note)
ORDERING INFORMATION
Part No. Clock Frequency Power Organization Interface Package
HY57V651620BTC-55 183MHz
HY57V651620BTC-6 166MHz HY57V651620BTC-7 143MHz
HY57V651620BTC-75 133MHz
HY57V651620BTC-8 125MHz HY57V651620BTC-10P 100MHz HY57V651620BTC-10S 100MHz
HY57V651620BTC-10 100MHz
HY57V651620BLTC-55 183MHz
HY57V651620BLTC-6 166MHz HY57V651620BLTC-7 143MHz
HY57V651620BLTC-75 133MHz
HY57V651620BLTC-8 125MHz HY57V651620BLTC-10P 100MHz HY57V651620BLTC-10S 100MHz
HY57V651620BLTC-10 100MHz
Low power
Auto refresh and self refresh
4096 refresh cycles / 64ms
Programmable Burst Length and Burst Type
- 1, 2, 4, 8 or Full page for Sequential Burst
- 1, 2, 4 or 8 for Interleave Burst
Programmable CAS Latency ; 2, 3 Clocks
Normal
4Banks x 1Mbits
x16
LVTTL
400mil 54pin TSOP II
Note : VDD(Min) of HY57V651620B(L)TC-55/6/7 is 3.135V
This document is a general product description and is subject to change without notice. Hyundai Electronics does not assume any responsibility for use of circuits described. No patent licenses are implied.
Rev. 1.9/Apr.01
PIN CONFIGURATION
HY57V651620B
VDD
DQ0
VDDQ
DQ1 DQ2
VSSQ
DQ3 DQ4
VDDQ
DQ5 DQ6
VSSQ
DQ7
VDD
LDQM
/WE /CAS /RAS
/CS BA0 BA1
A10/AP
A0 A1 A2 A3
VDD
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27
54pin TSOP II
400mil x 875mil
0.8mm pin pitch
54 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28
V SS DQ15 V SSQ DQ14 DQ13 V DDQ DQ12 DQ11 V SSQ DQ10 DQ9 V DDQ DQ8 V SS NC UDQM CLK CKE NC A11 A9 A8 A7 A6 A5 A4 V SS
PIN DESCRIPTION
PIN PIN NAME DESCRIPTION
CLK Clock
CKE Clock Enable
CS Chip Select Enables or disables all inputs except CLK, CKE and DQM
BA0,BA1 Bank Address
A0 ~ A11 Address
RAS, CAS, WE
LDQM, UDQM Data Input/Output Mask Controls output buffers in read mode and masks input data in write mode
DQ0 ~ DQ15 Data Input/Output Multiplexed data input / output pin
V DD /V SS Power Supply/Ground Power supply for internal circuits and input buffers
V DDQ /VSSQ Data Output Power/Ground Power supply for output buffers
NC No Connection No connection
Row Address Strobe, Column Address Strobe, Write Enable
The system clock input. All other inputs are registered to the SDRAM on the rising edge of CLK
Controls internal clock signal and when deactivated, the SDRAM will be one of the states among power down, suspend or self refresh
Selects bank to be activated during RAS activity Selects bank to be read/written during CAS activity
Row Address : RA0 ~ RA11, Column Address : CA0 ~ CA7 Auto-precharge flag : A10
RAS, CAS and WE define the operation Refer function truth table for details
Rev. 1.9/Apr.01 2
FUNCTIONAL BLOCK DIAGRAM
1Mbit x 4banks x 16 I/O Synchronous DRAM
HY57V651620B
Self refresh logic
& timer
CLK
CKE
CS
RAS
CAS
WE
UDQM
LDQM
Row active
State Machine
refresh
Column Active
Internal Row
counter
Row
Pre
Decoders
Column
Pre
Decoders
1Mx16 Bank 3
X decoders
1Mx16 Bank 2
X decoders
X decoders
1Mx16 Bank 1
1Mx16 Bank 0
X decoders
Memory
Y decoders
Cell
Array
Sense AMP & I/O Gate
DQ0
I/O Buffer & Logic
DQ1
DQ14 DQ15
Column Add
Counter
Burst
Counter
A0 A1
Bank Select
Address
Address buffers
Registers
A11 BA0 BA1
Rev. 1.9/Apr.01 3
Mode Registers
CAS Latency
Data Out Control
Pipe Line Control
HY57V651620B
ABSOLUTE MAXIMUM RATINGS
Parameter Symbol Rating Unit
Ambient Temperature T A 0 ~ 70 °C
Storage Temperature T STG -55 ~ 125 °C
Voltage on Any Pin relative to V SS V IN, V OUT -1.0 ~ 4.6 V
Voltage on V DD relative to VSS V DD, V DDQ -1.0 ~ 4.6 V
Short Circuit Output Current IOS 50 mA
Power Dissipation P D 1 W
Soldering Temperature ⋅ Time T SOLDER 260 ⋅ 10 °C ⋅ Sec
Note : Operation at above absolute maximum rating can adversely affect device reliability
DC OPERATING CONDITION (TA=0 to 70°C )
Parameter Symbol Min Typ. Max Unit Note
Power Supply Voltage V DD, V DDQ 3.0 3.3 3.6 V 1,2
Input High Voltage V IH 2.0 3.0 V DDQ + 2.0 V 1,3
Input Low Voltage V IL V SSQ - 2.0 0 0.8 V 1,4
Note :
1.All voltages are referenced to VSS = 0V
2.VDD(min) of HY57V651620B(L)TC-55/6/7 is 3.135V
3.V IH (max) is acceptable 5.6V AC pulse width with ≤ 3ns of duration
4.V IL (min) is acceptable -2.0V AC pulse width with ≤ 3ns of duration
AC OPERATING CONDITION (TA=0 to 70°C , V DD=3.3 ± 0.3V
Parameter Symbol Value Unit Note
AC Input High / Low Level Voltage V IH / V IL 2.4/0.4 V
Input Timing Measurement Reference Level Voltage Vtrip 1.4 V
Input Rise / Fall Time tR / tF 1 ns
Output Timing Measurement Reference Level Voutref 1.4 V
Output Load Capacitance for Access Time Measurement CL 50 pF 1
Note :
1. Output load to measure access time is equivalent to two TTL gates and one capacitor (50pF) For details, refer to AC/DC output circuit
2. VDD(min) of HY57V651620B(L)TC-55/6/7 is 3.135V
Note2
, V SS =0V)
Rev. 1.9/Apr.01 4
Loading...
+ 8 hidden pages