HYNIX HY57V561620LT, HY57V561620T User Manual

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查询HY57V561620供应商
HY57V561620(L)T
4Banks x 4M x 16Bit Synchronous DRAM
DESCRIPTION
The HY57V561620T is a 268,435,456bit CMOS Synchronous DRAM, ideally suited for the main memory applications which require large memory density and high bandwidth. HY57V561620 is organized as 4 banks of 4,194,304x16.
Programmable options include the length of pipeline ( CAS latency of 2 or 3), the number of consecutive read or write cycles initiated by a single control command (Burst length of 1,2,4,8 or full page), and the burst count sequence(sequential or interleave). A burst of read or write cycles in progress can be terminated by a burst terminate command or can be interrupted and replaced by a new burst read or write command on any cycle. (This pipelined design is not restricted by a `2N` rule.)
FEATURES
Single 3.3V ± 0.3V power supply
All device pins are compatible with LVTTL interface
JEDEC standard 400mil 54pin TSOP-II with 0.8mm of pin pitch
All inputs and outputs referenced to positive edge of system clock
Data mask function by UDQM and LDQM
Internal four banks operation
ORDERING INFORMATION
Part No. Clock Frequency Power Organization Interface Package
HY57V561620T-HP 133MHz HY57V561620T-H 133MHz HY57V561620T-8 125MHz HY57V561620T-P 100MHz
Normal
Auto refresh and self refresh
8192 refresh cycles / 64ms
Programmable Burst Length and Burst Type
- 1, 2, 4, 8 and Full Page for Sequential Burst
- 1, 2, 4 and 8 for Interleave Burst
Programmable CAS Latency ; 2, 3 Clocks
HY57V561620T-S 100MHz HY57V561620LT-HP 133MHz HY57V561620LT-H 133MHz HY57V561620LT-8 125MHz HY57V561620LT-P 100MHz HY57V561620LT-S 100MHz
This document is a general product description and is subject to change without notice. Hyundai Electronics does not assume any responsibility for use of circuits described. No patent licenses are implied.
Revision 1.8 / Apr.01
Lower Power
4Banks x 4Mbits
x16
LVTTL 400mil 54pin TSOP II
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PIN CONFIGURATION
HY57V561620(L)T
VDD
DQ0
V
DDQ
DQ1 DQ2
V
SSQ
DQ3 DQ4
VDDQ
DQ5 DQ6
V
SSQ
DQ7
V
DD
LDQM
/WE /CAS /RAS
/CS BA0 BA1
A10/AP
A0 A1 A2 A3
V
DD
1 2 3 4 5 6 7 8 9 10 11 12 13
400mil x 875mil
14
0.8mm pin pitch
15 16 17 18 19 20 21 22 23 24 25 26 27
54pin TSOP II
54 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28
VSS DQ15 V
SSQ
DQ14 DQ13 V
DDQ
DQ12 DQ11 VSSQ DQ10 DQ9 V
DDQ
DQ8 V
SS
NC UDQM CLK CKE A12 A11 A9 A8 A7 A6 A5 A4 V
SS
PIN DESCRIPTION
PIN PIN NAME DESCRIPTION
CLK Clock
CKE Clock Enable
CS Chip Select Enables or disables all inputs except CLK, CKE, UDQM and LDQM
BA0, BA1 Bank Address
A0 ~ A12 Address
Row Address Strobe, Col-
RAS, CAS, WE
umn Address Strobe, Write
Enable UDQM, LDQM Data Input/Output Mask Controls output buffers in read mode and masks input data in write mode DQ0 ~ DQ15 Data Input/Output Multiplexed data input / output pin VDD/VSS Power Supply/Ground Power supply for internal circuits and input buffers VDDQ/VSSQ Data Output Power/Ground Power supply for output buffers NC No Connection No connection
The system clock input. All other inputs are registered to the SDRAM on the rising edge of CLK
Controls internal clock signal and when deactivated, the SDRAM will be one of the states among power down, suspend or self refresh
Selects bank to be activated during RAS activity Selects bank to be read/written during CAS activity
Row Address : RA0 ~ RA12, Column Address : CA0 ~ CA8 Auto-precharge flag : A10
RAS, CAS and WE define the operation Refer function truth table for details
Revision 1.8 / Apr.01
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FUNCTIONAL BLOCK DIAGRAM
I/O Buffer & Logic
Sense AMP & I/O Gate
4Mbit x 4banks x16 I/O Synchronous DRAM
HY57V561620(L)T
Self Refresh Logic
& Timer
CLK
CKE
CS
RAS
CAS
WE
UDQM
LDQM
State Machine
Row Active
Column Active
Internal Row
Counter
Row
Pre
Decoders
Column
Pre
Decoders
4Mx16 Bank 3
X decoders
4Mx16 Bank 2
X decoders
4Mx16 Bank 1
4Mx16 Bank 0
X decoders
Memory
Y decoders
DQ0 DQ1
Cell
Array
DQ14 DQ15
A0 A1
A12 BA0 BA1
Bank Select
Address
Address buffers
Register
Mode Registers
Column Add
Counter
Burst
Counter
CAS Latency
Data Out Control
Pipe Line Control
Revision 1.8 / Apr.01
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HY57V561620(L)T
ABSOLUTE MAXIMUM RATINGS
Parameter Symbol Rating Unit
Ambient Temperature TA 0 ~ 70 °C Storage Temperature TSTG -55 ~ 125 °C Voltage on Any Pin relative to VSS VIN, VOUT -1.0 ~ 4.6 V Voltage on VDD relative to VSS VDD, VDDQ -1.0 ~ 4.6 V Short Circuit Output Current IOS 50 mA Power Dissipation PD 1 W Soldering TemperatureTime TSOLDER 260 10 °C Sec
Note : Operation at above absolute maximum rating can adversely affect device reliability
DC OPERATING CONDITION (TA=0 to 70°C)
Parameter Symbol Min Typ. Max Unit Note
Power Supply Voltage VDD, VDDQ 3.0 3.3 3.6 V 1 Input High Voltage VIH 2.0 3.0 VDDQ + 0.3 V 1,2 Input Low Voltage VIL VSSQ-2.0 0 0.8 V 1,3
Note :
1. All voltages are referenced to VSS = 0V
2. VIH (max) is acceptable 5.6V AC pulse width with 3ns of duration
3. VIL (max) is acceptable -2.0V AC pulse width with 3ns of duration
AC OPERATING CONDITION (TA=0 to 70°C, VDD=3.3 ± 0.3V, VSS=0V)
Parameter Symbol Value Unit Note
AC Input High / Low Level Voltage VIH / VIL 2.4/0.4 V Input Timing Measurement Reference Level Voltage Vtrip 1.4 V Input Rise / Fall Time tR / tF 1 ns Output Timing Measurement Reference Level Voutref 1.4 V Output Load Capacitance for Access Time Measurement CL 50 pF 1
Note :
1. Output load to measure access time is equivalent to two TTL gates and one capacitor (50pF) For details, refer to AC/DC output circuit
Revision 1.8 / Apr.01
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CAPACITANCE (TA=25°C, f=1MHz)
HY57V561620(L)T
Parameter Pin Symbol
Input capacitance CLK CI1 2.5 3.5 2.5 4.0 pF
A0 ~ A12, BA0, BA1, CKE, CS, RAS, CAS, WE, UDQM, LDQM
Data input / output capacitance DQ0 ~ DQ15 CI/O 4.0 6.5 4.0 6.5 pF
CI2 2.5 3.8 2.5 5.0 pF
-H -8/P/S
Min Max Min Max
OUTPUT LOAD CIRCUIT
Vtt=1.4V
RT=250
Output
50pF
Output
50pF
Unit
DC Output Load Circuit AC Output Load Circuit
DC CHARACTERISTICS I (TA=0 to 70°C, VDD=3.3±0.3V)
Parameter Symbol Min. Max Unit Note
Input leakage current ILI -1 1 uA 1 Output leakage current ILO -1 1 uA 2 Output high voltage VOH 2.4 - V IOH = -4mA Output low voltage VOL - 0.4 V IOL =+4mA
Note :
1. VIN = 0 to 3.6V, All other pins are not under test = 0V
2. DOUT is disabled, VOUT=0 to 3.6V
Revision 1.8 / Apr.01
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DC CHARACTERISTICS II (TA=0°C to 70°C, VDD=3.3V ± 0.3V, VSS=0V)
HY57V561620(L)T
Parameter Symbol Test Condition
Operating Current IDD1
Precharge Standby Current in power down mode
Precharge Standby Current in non power down mode
Active Standby Current in power down mode
Active Standby Current in non power down mode
Burst Mode Operating Current
Auto Refresh Current IDD5 tRRC tRRC(min), All banks active 260 260 260 250 250 mA 2
IDD2P
IDD2PS
IDD2N
IDD2NS
IDD3P
IDD3PS
IDD3N
IDD3NS
IDD4
Burst Length=1, One bank active tRAS tRAS(min),tRP tRP(min), IO=0mA
CKE VIL(max), tCK = min. CKE VIL(max), tCK =
CKE VIH(min), CS VIH(min), tCK = min Input signals are changed one time during 2clks. All other pins VDD-0.2V or 0.2V
CKE VIH(min), tCK = Input signals are stable.
CKE VIL(max), tCK = min CKE VIL(max), tCK =
CKE VIH(min), CS VIH(min), tCK = min Input signals are changed one time during 2clks. All other pins VDD-0.2V or 0.2V
CKE VIH(min), tCK = Input signals are stable
tCK tCK(min), tRAS tRAS(min), IO=0mA All banks active
-HP -H -8 -P -S
120 120 110 100 100 mA 1
150 150 140 120 120 mA 1
Speed
Unit Note
2
mA
2
20
mA
10
3
mA
3
25
mA
15
Self Refresh Current IDD6 CKE 0.2V
3 mA 3
1.5 mA 4
Note :
1. IDD1 and IDD4 depend on output loading and cycle rates. Specified values are measured with the output open.
2. Min. of tRRC (Refresh RAS cycle time) is shown at AC CHARACTERISTICS II
3. HY57V561620T-HP/H/8/P/S
4. HY57V561620LT-HP/H/8/P/S
Revision 1.8 / Apr.01
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AC CHARACTERISTICS I
HY57V561620(L)T
Parameter Symbol
System clock cycle time
Clock high pulse width tCHW 2.5 - 2.5 - 3 - 3 - 3 - ns 1 Clock low pulse width tCLW 2.5 - 2.5 - 3 - 3 - 3 - ns 1
Access time from clock
Data-out hold time tOH 2.7 - 2.7 - 3 - 3 - 3 - ns Data-Input setup time tDS 1.5 - 1.5 - 2 - 2 - 2 - ns 1 Data-Input hold time tDH 0.8 - 0.8 - 1 - 1 - 1 - ns 1 Address setup time tAS 1.5 - 1.5 - 2 - 2 - 2 - ns 1 Address hold time tAH 0.8 - 0.8 - 1 - 1 - 1 - ns 1 CKE setup time tCKS 1.5 - 1.5 - 2 - 2 - 2 - ns 1 CKE hold time tCKH 0.8 - 0.8 - 1 - 1 - 1 - ns 1 Command setup time tCS 1.5 - 1.5 - 2 - 2 - 2 - ns 1 Command hold time tCH 0.8 - 0.8 - 1 - 1 - 1 - ns 1 CLK to data output in low Z-time tOLZ 1 - 1 - 1 - 1 - 1 - ns
CLK to data output in high Z-time
CAS Latency = 3 tCK3 7.5 CAS Latency = 2 tCK2 10 10 10 10 12 ns
CAS Latency = 3 tAC3 - 5.4 - 5.4 - 6 6 6 ns CAS Latency = 2 tAC2 - 6 - 6 - 6 6 6 ns
CAS Latency = 3 tOHZ3 2.7 5.4 2.7 5.4 3 6 3 6 3 6 ns CAS Latency = 2 tOHZ2 3 6 3 6 3 6 3 6 3 6 ns
-HP -H -8 -P -S
Min Max Min Max Min Max Min Max Min Max
1000
7.5 1000
8
1000
10
1000
10
1000
Unit Note
ns
2
Note :
1. Assume tR / tF (input rise and fall time ) is 1ns.
2. Access times to be measured with input signals of 1v/ns slew rate, 0.8v to 2.0v
Revision 1.8 / Apr.01
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AC CHARACTERISTICS II
HY57V561620(L)T
Parameter Symbol
RAS cycle time
RAS to CAS delay tRCD 20 - 20 - 20 - 20 - 20 - ns RAS active time tRAS 45 100K 45 100K 48 100K 50 100K 50 100K ns RAS precharge time tRP 20 - 20 - 20 - 20 - 20 - ns RAS to RAS bank active delay tRRD 15 - 15 - 16 - 20 - 20 - ns CAS to CAS delay tCCD 1 - 1 - 1 - 1 - 1 - CLK Write command to data-in delay tWTL 0 - 0 - 0 - 0 - 0 - CLK Data-in to precharge command tDPL 2 - 2 - 2 - 2 - 2 - CLK Data-in to active command tDAL 5 - 5 - 5 - 4 - 4 - CLK DQM to data-out Hi-Z tDQZ 2 - 2 - 2 - 2 - 2 - CLK DQM to data-in mask tDQM 0 - 0 - 0 - 0 - 0 - CLK MRS to new command tMRD 2 - 2 - 2 - 2 - 2 - CLK
Precharge to data output Hi-Z
Power down exit time tPDE 1 - 1 - 1 - 1 - 1 - CLK Self refresh exit time tSRE 1 - 1 - 1 - 1 - 1 - CLK 1
Operation tRC 65 - 65 - 68 - 70 - 70 - ns Auto Refresh tRRC 65 - 65 - 68 - 70 - 70 - ns
CAS Latency = 3 tPROZ3 3 - 3 - 3 - 3 - 3 - CLK CAS Latency = 2 tPROZ2 - - - - - - 2 - 2 - CLK
-HP -H -8 -P -S Unit Note
Min Max Min Max Min Max Min Max Min Max
Refresh Time tREF - 64 - 64 - 64 - 64 - 64 ms
Note :
1. A new command can be given tRRC after self refresh exit.
Revision 1.8 / Apr.01
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HY57V561620(L)T
I (mA)
I (mA)
IBIS SPECIFICATION
IOH Characteristics (Pull-up) 66MHz and 100MHz Pull-up
Voltage
(V) I (mA) I (mA) I (mA)
3.45 -2.4
3.3 -27.3
3.0 0.0 -74.1 -0.7
2.6 -21.1 -129.2 -7.5
2.4 -34.1 -153.3 -13.3
2.0 -58.7 -197.0 -27.5
1.8 -67.3 -226.2 -35.5
1.65 -73.0 -248.0 -41.1
1.5 -77.9 -269.7 -47.9
1.4 -80.8 -284.3 -52.4
1.0 -88.6 -344.5 -72.5
0.0 -93.0 -502.4 -93.0
100MHz
Min
100MHz
Max
66MHz
Min
0 0.5 1 1.5 2 2.5 3 3.5
0
-100
-200
-300
-400
-500
-600 Voltage (V)
Ioh Min (100MHz) Ioh Min (66MHz) Ioh Min (66 and 100MHz)
IOL Characteristics (Pull-down) 66MHz and 100MHz Pull-down
Voltage
(V) I (mA) I (mA) I (mA)
0.0 0.0 0.0 0.0
0.4 27.5 70.2 17.7
0.65 41.8 107.5 26.9
0.85 51.6 133.8 33.3
1.0 58.0 151.2 37.6
1.4 70.7 187.7 46.6
1.5 72.9 194.4 48.0
1.65 75.4 202.5 49.5
1.8 77.0 208.6 50.7
1.95 77.6 212.0 51.5
3.0 80.3 219.6 54.2
3.45 81.4 222.6 54.9
** IBIS spec. is also applied to 133MHz device.
100MHz
Min
100MHz
Max
66MHz
Min
250
200
150
100
50
0
0 0.5 1 1.5 2 2.5 3 3.5
Voltage (V)
I (mA) 100 min I (mA) 66 min I (mA) 100 max
Revision 1.8 / Apr.01
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HY57V561620(L)T
mA
mA
VDD Clamp @ CLK, CKE, CS, DQM & DQ
VDD (V) I(mA)
0.0 0.0
0.2 0.0
0.4 0.0
0.6 0.0
0.7 0.0
0.8 0.0
0.9 0.0
1.0 0.23
1.2 1.34
1.4 3.02
1.6 5.06
1.8 7.35
2.0 9.83
2.2 12.48
2.4 15.30
2.6 18.31
VSS Clamp @ CLK, CKE, CS, DQM & DQ
Minimum VDD clamp current (Referenced to VDD)
20
15
10
5
0
0 1 2 3
Voltage
I (mA)
Minimum VSS clamp current
VSS (V) I (mA)
-2.6 -57.23
-2.4 -45.77
-2.2 -38.26
-2.0 -31.22
-1.8 -24.58
-1.6 -18.37
-1.4 -12.56
-1.2 -7.57
-1.0 -3.37
-0.9 -1.75
-0.8 -0.58
-0.7 -0.05
-0.6 0.0
-0.4 0.0
-0.2 0.0
0.0 0.0
-3 -2.5 -2 -1.5 -1 -0.5 0
0
-10
-20
-30
-40
-50
-60
Voltage
I (mA)
Revision 1.8 / Apr.01
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HY57V561620(L)T
DEVICE OPERATING OPTION TABLE
HY57V561620(L)T-HP
CAS Latency tRCD tRAS tRC tRP tAC tOH
133MHz(7.5ns) 3CLKs 3CLKs 6CLKs 9CLKs 3CLKs 5.4ns 2.7ns
125MHz(8ns) 3CLKs 3CLKs 6CLKs 9CLKs 3CLKs 6ns 3ns
100MHz(10ns) 2CLKs 2CLKs 5CLKs 7CLKs 2CLKs 6ns 3ns
HY57V561620(L)T-H
CAS Latency tRCD tRAS tRC tRP tAC tOH
133MHz(7.5ns) 3CLKs 3CLKs 6CLKs 9CLKs 3CLKs 5.4ns 2.7ns
125MHz(8ns) 3CLKs 3CLKs 6CLKs 9CLKs 3CLKs 6ns 3ns
100MHz(10ns) 3CLKs 3CLKs 6CLKs 9CLKs 3CLKs 6ns 3ns
HY57V561620(L)T-8
CAS Latency tRCD tRAS tRC tRP tAC tOH
125MHz(8ns) 3CLKs 3CLKs 6CLKs 9CLKs 3CLKs 6ns 3ns
100MHz(10ns) 3CLKs 3CLKs 6CLKs 9CLKs 3CLKs 6ns 3ns
83MHz(12ns) 2CLKs 2CLKs 4CLKs 6CLKs 2CLKs 6ns 3ns
HY57V561620(L)T-P
CAS Latency tRCD tRAS tRC tRP tAC tOH
100MHz(10ns) 2CLKs 2CLKs 5CLKs 7CLKs 2CLKs 6ns 3ns
83MHz(12ns) 2CLKs 2CLKs 5CLKs 7CLKs 2CLKs 6ns 3ns 66MHz(15ns) 2CLKs 2CLKs 4CLKs 6CLKs 2CLKs 6ns 3ns
HY57V561620(L)T-S
CAS Latency tRCD tRAS tRC tRP tAC tOH
100MHz(10.0ns) 3CLKs 2CLKs 5CLKs 7CLKs 2CLKs 6ns 3ns
83MHz(12.0ns) 2CLKs 2CLKs 5CLKs 7CLKs 2CLKs 6ns 3ns 66MHz(15.0ns) 2CLKs 2CLKs 4CLKs 6CLKs 2CLKs 6ns 3ns
Revision 1.8 / Apr.01
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COMMAND TRUTH TABLE
HY57V561620(L)T
Command CKEn-1 CKEn CS RAS CAS WE DQM ADDR
Mode Register Set H X L L L L X OP code 1
No Operation H X
Bank Active H X L L H H X RA V Read
H X L H L H X CA
Read with Autoprecharge H Write
H X L H L L X CA
Write with Autoprecharge H Precharge All Banks
H X L L H L X X
Precharge selected Bank L V Burst Stop H X L H H L X X UDQM, LDQM H X V X Auto Refresh H H L L L H X X
Entry H L L L L H X
Self Refresh
Exit L H
H X X X
X X
L H H H
H X X X
X
L H H H
A10/
AP
L
L
H X
X
BA Note
V
V
Entry H L
Precharge power down
Exit L H
Clock Suspend
Note :
1. OP Code : Operand Code
2. V = Valid, X = Don’t care, H = Logic High, L= Logic Low, RA = Row Address, CA = Column Address.
Entry H L
Exit L H X X
H X X X
X
L H H H
H X X X
X
L H H H
H X X X
X
X
XL V V V
Revision 1.8 / Apr.01
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PACKAGE INFORMATION 400mil 54pin Thin Small Outline Package
HY57V561620(L)T
Unit : mm(Inch)
Revision 1.8 / Apr.01
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