The HY57V561620T is a 268,435,456bit CMOS Synchronous DRAM, ideally suited for the main memory applications
which require large memory density and high bandwidth. HY57V561620 is organized as 4 banks of 4,194,304x16.
The HY57V561620T is offering fully synchronous operation referenced to a positive edge of the clock. All inputs and
outputs are synchronized with the rising edge of the clock input. The data paths are internally pipelined to achieve very
high bandwidth. All input and output voltage levels are compatible with LVTTL.
Programmable options include the length of pipeline ( CAS latency of 2 or 3), the number of consecutive read or write
cycles initiated by a single control command (Burst length of 1,2,4,8 or full page), and the burst count
sequence(sequential or interleave). A burst of read or write cycles in progress can be terminated by a burst terminate
command or can be interrupted and replaced by a new burst read or write command on any cycle. (This pipelined
design is not restricted by a `2N` rule.)
FEATURES
•Single 3.3V ± 0.3V power supply
•All device pins are compatible with LVTTL interface
•JEDEC standard 400mil 54pin TSOP-II with 0.8mm
of pin pitch
•All inputs and outputs referenced to positive edge of
system clock
•Data mask function by UDQM and LDQM
•Internal four banks operation
ORDERING INFORMATION
Part No.Clock FrequencyPowerOrganizationInterfacePackage
This document is a general product description and is subject to change without notice. Hyundai Electronics does not assume any
responsibility for use of circuits described. No patent licenses are implied.
RAS, CAS and WE define the operation
Refer function truth table for details
Revision 1.8 / Apr.01
Page 3
FUNCTIONAL BLOCK DIAGRAM
I/O Buffer & Logic
Sense AMP & I/O Gate
4Mbit x 4banks x16 I/O Synchronous DRAM
HY57V561620(L)T
Self Refresh Logic
& Timer
CLK
CKE
CS
RAS
CAS
WE
UDQM
LDQM
State Machine
Row Active
Column
Active
Internal Row
Counter
Row
Pre
Decoders
Column
Pre
Decoders
4Mx16 Bank 3
X decoders
4Mx16 Bank 2
X decoders
4Mx16 Bank 1
4Mx16 Bank 0
X decoders
Memory
Y decoders
DQ0
DQ1
Cell
Array
DQ14
DQ15
A0
A1
A12
BA0
BA1
Bank Select
Address
Address buffers
Register
Mode Registers
Column Add
Counter
Burst
Counter
CAS Latency
Data Out Control
Pipe Line Control
Revision 1.8 / Apr.01
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HY57V561620(L)T
ABSOLUTE MAXIMUM RATINGS
ParameterSymbolRatingUnit
Ambient TemperatureTA0 ~ 70°C
Storage TemperatureTSTG-55 ~ 125°C
Voltage on Any Pin relative to VSSVIN, VOUT-1.0 ~ 4.6V
Voltage on VDD relative to VSSVDD, VDDQ-1.0 ~ 4.6V
Short Circuit Output CurrentIOS50mA
Power DissipationPD1W
Soldering Temperature ⋅ TimeTSOLDER260 ⋅ 10°C⋅ Sec
Note : Operation at above absolute maximum rating can adversely affect device reliability
DC OPERATING CONDITION (TA=0 to 70°C)
ParameterSymbolMinTyp.MaxUnitNote
Power Supply VoltageVDD, VDDQ3.03.33.6V1
Input High VoltageVIH2.03.0VDDQ + 0.3V1,2
Input Low VoltageVILVSSQ-2.000.8V1,3
Note :
1. All voltages are referenced to VSS = 0V
2. VIH (max) is acceptable 5.6V AC pulse width with ≤3ns of duration
3. VIL (max) is acceptable -2.0V AC pulse width with ≤3ns of duration
AC OPERATING CONDITION (TA=0 to 70°C, VDD=3.3 ± 0.3V, VSS=0V)
ParameterSymbolValueUnitNote
AC Input High / Low Level VoltageVIH / VIL2.4/0.4V
Input Timing Measurement Reference Level VoltageVtrip1.4V
Input Rise / Fall TimetR / tF1ns
Output Timing Measurement Reference LevelVoutref1.4V
Output Load Capacitance for Access Time MeasurementCL50pF1
Note :
1. Output load to measure access time is equivalent to two TTL gates and one capacitor (50pF)
For details, refer to AC/DC output circuit
1. VIN = 0 to 3.6V, All other pins are not under test = 0V
2. DOUT is disabled, VOUT=0 to 3.6V
Revision 1.8 / Apr.01
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DC CHARACTERISTICS II (TA=0°C to 70°C, VDD=3.3V ± 0.3V, VSS=0V)
HY57V561620(L)T
ParameterSymbolTest Condition
Operating CurrentIDD1
Precharge Standby Current
in power down mode
Precharge Standby Current
in non power down mode
Active Standby Current
in power down mode
Active Standby Current
in non power down mode
Burst Mode Operating
Current
Auto Refresh CurrentIDD5tRRC ≥ tRRC(min), All banks active260260260250250mA2
IDD2P
IDD2PS
IDD2N
IDD2NS
IDD3P
IDD3PS
IDD3N
IDD3NS
IDD4
Burst Length=1, One bank active
tRAS ≥ tRAS(min),tRP ≥ tRP(min), IO=0mA
CKE≤ VIL(max), tCK = min.
CKE≤ VIL(max), tCK = ∞
CKE ≥ VIH(min), CS ≥ VIH(min), tCK = min
Input signals are changed one time during 2clks.
All other pins ≥ VDD-0.2V or ≤ 0.2V
CKE ≥ VIH(min), tCK = ∞
Input signals are stable.
CKE≤ VIL(max), tCK = min
CKE≤ VIL(max), tCK = ∞
CKE ≥ VIH(min), CS ≥ VIH(min), tCK = min
Input signals are changed one time during 2clks.
All other pins ≥ VDD-0.2V or ≤ 0.2V
CKE ≥ VIH(min), tCK = ∞
Input signals are stable
tCK ≥ tCK(min),
tRAS ≥ tRAS(min), IO=0mA
All banks active
-HP-H-8-P-S
120120110100100mA1
150150140120120mA1
Speed
UnitNote
2
mA
2
20
mA
10
3
mA
3
25
mA
15
Self Refresh CurrentIDD6CKE≤ 0.2V
3mA3
1.5mA4
Note :
1. IDD1 and IDD4 depend on output loading and cycle rates. Specified values are measured with the output open.
2. Min. of tRRC (Refresh RAS cycle time) is shown at AC CHARACTERISTICS II
3. HY57V561620T-HP/H/8/P/S
4. HY57V561620LT-HP/H/8/P/S
Revision 1.8 / Apr.01
Page 7
AC CHARACTERISTICS I
HY57V561620(L)T
ParameterSymbol
System clock cycle
time
Clock high pulse widthtCHW2.5-2.5-3-3-3-ns1
Clock low pulse widthtCLW2.5-2.5-3-3-3-ns1
Access time from
clock
Data-out hold timetOH2.7-2.7-3-3-3-ns
Data-Input setup timetDS1.5-1.5-2-2-2-ns1
Data-Input hold timetDH0.8-0.8-1-1-1-ns1
Address setup timetAS1.5-1.5-2-2-2-ns1
Address hold timetAH0.8-0.8-1-1-1-ns1
CKE setup timetCKS1.5-1.5-2-2-2-ns1
CKE hold timetCKH0.8-0.8-1-1-1-ns1
Command setup timetCS1.5-1.5-2-2-2-ns1
Command hold timetCH0.8-0.8-1-1-1-ns1
CLK to data output in low Z-timetOLZ1-1-1-1-1-ns
CLK to data output
in high Z-time
CAS Latency = 3tCK37.5
CAS Latency = 2tCK21010101012ns
CAS Latency = 3tAC3-5.4-5.4-666ns
CAS Latency = 2tAC2-6-6-666ns
CAS Latency = 3tOHZ32.75.42.75.4363636ns
CAS Latency = 2tOHZ23636363636ns
-HP-H-8-P-S
MinMaxMinMaxMinMaxMinMaxMinMax
1000
7.5
1000
8
1000
10
1000
10
1000
UnitNote
ns
2
Note :
1. Assume tR / tF (input rise and fall time ) is 1ns.
2. Access times to be measured with input signals of 1v/ns slew rate, 0.8v to 2.0v
Revision 1.8 / Apr.01
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AC CHARACTERISTICS II
HY57V561620(L)T
ParameterSymbol
RAS cycle time
RAS to CAS delaytRCD20-20-20-20-20-ns
RAS active timetRAS45100K45100K48100K50100K50100Kns
RAS precharge timetRP20-20-20-20-20-ns
RAS to RAS bank active delaytRRD15-15-16-20-20-ns
CAS to CAS delaytCCD1-1-1-1-1-CLK
Write command to data-in delaytWTL0-0-0-0-0-CLK
Data-in to precharge commandtDPL2-2-2-2-2-CLK
Data-in to active commandtDAL5-5-5-4-4-CLK
DQM to data-out Hi-ZtDQZ2-2-2-2-2-CLK
DQM to data-in masktDQM0-0-0-0-0-CLK
MRS to new commandtMRD2-2-2-2-2-CLK
Precharge to data
output Hi-Z
Power down exit timetPDE1-1-1-1-1-CLK
Self refresh exit timetSRE1-1-1-1-1-CLK1
OperationtRC65-65-68-70-70-ns
Auto RefreshtRRC65-65-68-70-70-ns
CAS Latency = 3tPROZ33-3-3-3-3-CLK
CAS Latency = 2tPROZ2------2-2-CLK
-HP-H-8-P-S
UnitNote
MinMaxMinMaxMinMaxMinMaxMinMax
Refresh TimetREF-64-64-64-64-64ms
Note :
1. A new command can be given tRRC after self refresh exit.
Revision 1.8 / Apr.01
Page 9
HY57V561620(L)T
I (mA)
I (mA)
IBIS SPECIFICATION
IOH Characteristics (Pull-up) 66MHz and 100MHz Pull-up
Voltage
(V)I (mA)I (mA)I (mA)
3.45-2.4
3.3-27.3
3.00.0-74.1-0.7
2.6-21.1-129.2-7.5
2.4-34.1-153.3-13.3
2.0-58.7-197.0-27.5
1.8-67.3-226.2-35.5
1.65-73.0-248.0-41.1
1.5-77.9-269.7-47.9
1.4-80.8-284.3-52.4
1.0-88.6-344.5-72.5
0.0-93.0-502.4-93.0
100MHz
Min
100MHz
Max
66MHz
Min
00.511.522.533.5
0
-100
-200
-300
-400
-500
-600
Voltage (V)
Ioh Min (100MHz)
Ioh Min (66MHz)
Ioh Min (66 and 100MHz)
IOL Characteristics (Pull-down) 66MHz and 100MHz Pull-down