The HM62G36256 is a synchronous fast static RAM organized as 256-kword × 36-bit. It has realized high
speed access time by employing the most advanced CMOS process and high speed circuit designing
technology. It is most appropriate for the application which requires high speed, high density memory and
wide bit width configuration, such as cache and buffer memory in system. It is packaged in standard 119bump BGA.
Note: All power supply and ground pins must be connected for proper operation of the device.
Features
• Power supply: 3.3 V +10%, –5%
• Clock frequency: 200 MHz to 250 MHz
• Internal self-timed late write
• Byte write control (4 byte write selects, one for each 9-bit)
• Optional ×18 configuration
• HSTL compatible I/O
• Programmable impedance output drivers
• User selective input trip-point
• Differential, HSTL clock inputs
• Asynchronous G output control
• Asynchronous sleep mode
• Limited set of boundary scan JTAG IEEE 1149.1 compatible
• Protocol: Single clock register-register mode
Preliminary: The specifications of this device are subject to change without notice. Please contact your
nearest Hitachi’s Sales Dept. regarding specifications.
HM62G36256 Series
Ordering Information
Type No.Access timeCycle timePackage
HM62G36256BP-4
HM62G36256BP-5
Pin Arrangement
2.1 ns
2.5 ns
4.0 ns
5.0 ns
119-bumps BGA
1234567
A
VDDQ SA0 SA6 NC SA4 SA2 VDDQ
B
NCNC SA7 NC SA8 SA9 NC
C
NC SA14 SA3 VDD SA5 SA1 NC
D
DQc1 DQc0 VSS ZQ VSS DQb0 DQb1
E
DQc2 DQc3 VSS SS VSS DQb3 DQb2
F
VDDQ DQc4 VSSGVSS DQb4 VDDQ
G
DQc6 DQc5 SWEc NCDQb5 DQb6
H
DQc7 DQc8 VSS NC VSS DQb8 DQb7
J
VDDQ VDD VREF VDD VREF VDD VDDQ
K
DQd7 DQd8 VSSKVSS DQa8 DQa7
L
DQd6 DQd5K SWEa DQa5 DQa6
M
VDDQ DQd4 VSS SWE VSS DQa4 VDDQ
N
DQd2 DQd3 VSS SA17 VSS DQa3 DQa2
P
DQd1 DQd0 VSS SA16 VSS DQa0 DQa1
R
NC SA10 M1 VDD M2 SA11 NC
T
NCNC SA12 SA15 SA13 NCZZ
U
VDDQ TMS TDI TCK TDO NC VDDQ
SWEd
SWEb
119-bump 1. 27 mm
14 mm × 22 mm BGA (BP-119A)
(Top view)
2
HM62G36256 Series
Pin Description
NameI/O typeDescriptionsNotes
V
DD
V
SS
V
DDQ
V
REF
KInputClock input. Active high.
KInputClock input. Active low.
SSInputSynchronous chip select
SWEInputSynchronous write enable
SAnInputSynchronous address inputn = 0, 1, 2...17
SWExInputSynchronous byte write enablesx = a, b, c, d
GInputAsynchronous output enable
ZZInputPower down mode select
ZQInputOutput impedance control1
DQxnI/OSynchronous data input/outputx = a, b, c, d
M1, M2InputOutput protocol mode select
TMSInputBoundary scan test mode select
TCKInputBoundary scan test clock
TDIInputBoundary scan test data input
TDOOutputBoundary scan test data output
NC—No connection
SupplyCore power supply
SupplyGround
SupplyOutput power supply
SupplyInput reference: provides input reference voltage
n = 0, 1, 2...8
M1M2ProtocolNotes
V
SS
V
DD
Synchronous register to register operation2
Notes: 1. ZQ is to be connected to VSS via a resistance RQ where 150 Ω≤ RQ ≤ 300 Ω, if ZQ = V
open, output buffer impedance will be maximum. A case of minimum impedance, it needs to
connect over 120 Ω between ZQ and V
2. There is 1 protocol with mode pin. Mode control pins (M1, M2) are to be tied either V
.
SS
DD
respectively. The state of the Mode control inputs must be set before power-up and must not
change during device operation. Mode control inputs are not standard inputs and may not meet
V
or VIL specification. This SRAM is tested only in the synchronous register to register
H××ЧЧЧЧЧЧ×sleep modeHigh-ZHigh-Z
LH×ЧЧЧЧЧL-H H-L Dead
(not selected)
L×HЧЧЧЧЧЧ×Dead
(Dummy read)
LLLH ××××L-H H-L Read×Dout
LL×LLLLLL-HH-LWrite a, b, c, d
byte
LL×LHLLLL-H H-L Write b, c, d
byte
LL×LLHLLL-H H-L Write a, c, d
byte
LL×LLLHLL-HH-LWrite a, b, d
byte
LL×LLLLHL-HH-LWrite a, b, c
byte
LL×LHHLLL-H H-L Write c, d byte High-ZDin (c,d)0-8
LL×LLHHLL-H H-L Write a, d byte High-ZDin (a,d)0-8
LL×LLLHHL-H H-L Write a, b byte High-ZDin (a,b)0-8
LL×LHLLHL-H H-L Write b, c byte High-ZDin (b,c)0-8
LL×LHHHLL-HH-LWrite d byteHigh-ZDin (d)0-8
LL×LHHLHL-H H-L Write c byteHigh-ZDin (c)0-8
LL×LHLHHL-H H-L Write b byteHigh-ZDin (b)0-8
LL×LLHHHL-H H-L Write a byteHigh-ZDin (a)0-8
Notes: 1. × means don’t care for synchronous inputs, and H or L for asynchronous inputs.
2. SWE , SS, SWEa to SWEd, SA are sampled at the rising edge of K clock.
3. Although differential clock operation is implied, this SRAM will operate properly with one clock
phase (either K or K) tied to V
specified within this document will be met.
. Under such single-ended clock operation, all parameters
REF
×High-Z
High-ZHigh-Z
(a,b,c,d)0-8
High-ZDin (a,b,c,d)0-8
High-ZDin (b,c,d)0-8
High-ZDin (a,c,d)0-8
High-ZDin (a,b,d)0-8
High-ZDin (a,b,c)0-8
5
HM62G36256 Series
Absolute Maximum Ratings
ParameterSymbolValueUnitNotes
Input voltage on any pinV
Core supply voltageV
Output supply voltageV
Operating temperatureT
Storage temperatureT
IN
DD
DDQ
OPR
STG
–0.5 to V
–0.5 to 3.9V1
–0.5 to 2.2V1, 4
0 to 70°C
–55 to 125°C
Junction temperatureTj110°C
Output short–circuit currentI
Latch up currentI
OUT
LI
25mA
200mA
Package junction to case thermal resistanceθJC5°C/W5, 7
Package junction to ball thermal resistanceθJB8°C/W6, 7
Notes: 1. All voltage is referred to VSS.
2. Permanent device damage may occur if Absolute Maximum Ratings are exceeded. Functional
operation should be restricted the Operation Conditions. Exposure to higher than recommended
voltages for extended periods of time could affect device reliability.
3. These CMOS memory circuits have been designed to meet the DC and AC specifications shown
in the tables after thermal equilibrium has been established.
4. The supply voltage application sequence need to be powered up in the following manner: V
V
, V
, V
DD
DDQ
then VIN. Remember, according to the Absolute Maximum Ratings table, V
REF
not to exceed 3.9 V, whatever the instantaneous value of V
5. θJC is measured at the center of mold surface in fluorocarbon (See Figure “Definition of
Measurement”).
6. θJB is measured on the center ball pad after removing the ball in fluorocarbon (See Figure
“Definition of Measurement”).
7. These thermal resistance values have error of ± 5°C/W.
+ 0.5V1, 4
DDQ
.
DDQ
DDQ
,
SS
is
θJC
θJB
T.C.
Fluorocarbon
T.C.
Fluorocarbon
Definition of Measurement
6
HM62G36256 Series
Note: The following the DC and AC specifications shown in the Tables, this device is tested under the
minimum transverse air flow exceeding 500 linear feet per minute.
DC Operating Conditions (Ta = 0 to 70°C [Tj max = 110°C])
ParameterSymbolMinTypMaxUnitNotes
Supply voltage (Core)V
Supply voltage (I/O)V
Supply voltageV
Input reference voltage (I/O)V
Input high voltageV
Input low voltageV
Clock differential voltageV
Clock common mode voltageV
DD
DDQ
SS
REF
IH
IL
DIF
CM
Notes: 1. Peak to peak AC component superimposed on V
2. Minimum differential input voltage required for differential input clock operation.
3. See following figure.
4. V
= 0.75 V (typ).
REF
3.1353.303.63V
1.41.51.6V
000 V
0.650.750.90V1
V
+ 0.1 —V
REF
–0.5—V
0.1—V
+ 0.3V4
DDQ
– 0.1V4
REF
+ 0.3V2, 3
DDQ
0.55—0.90V3
may not exceed 5% of V
REF
REF
.
V
DDQ
V
SS
V
DIF
V
CM
Differential Voltage/Common Mode Voltage
7
HM62G36256 Series
DC Characteristics (Ta = 0 to 70°C, [Tj max = 110°C], VDD = 3.3 V +10%, –5%)
ParameterSymbol MinTypMaxUnit Notes
Input leakage currentI
Output leakage current I
Standby currentI
VDD operating current,
Output low voltageV
Output high voltageV
ZQ pin connect
resistance
Output low currentI
Output high currentI
Notes: 1. 0 ≤ Vin ≤ V
2. 0 ≤ Vout ≤ V
DDQ
DDQ
3. All inputs (except clock) are held at either V
guaranteed at 75°C junction temperature.
4. Iout = 0 mA, read 50%/write 50%, V
5
. Iout = 0 mA, read 50%/write 50%, V
6. Minimum impedance push pull output buffer mode, I
7. Measured at V
8. Measured at V
9. Output buffer impedance can be programmed by terminating the ZQ pin to V
precision resister (RQ). The value of RQ is five times the output impedance desired. The
allowable range of RQ to guarantee impedance matching with a tolerance of 15% is between
150 Ω and 300 Ω. If the status of ZQ pin is open, output impedance is maximum. Maximum
impedance occurs with ZQ connected to V
occurs when the SRAM is in High-Z. Write and Deselect operations will synchronously switch
the SRAM into and out of High-Z, therefore triggering an update. The user may choose to
invoke asynchronous G updates by providing a G setup and hold about the K clock to guarantee
the proper update. At power-up, the output impedance defaults to minimum impedance. It will
take 2048 cycles for the impedance to be completely updated if the programmed impedance is
much higher than minimum impedance.
LI
LO
SBZZ
I
DD4
I
DD5
I
DD2
RQ150250300Ω
OL
OH
for all input pins (except V
OL
OH
——2 µA1
——5 µA2
——100mA 3
——700mA 4
——650mA 4
——200mA 5
V
OL
OH
SS
V
– 0.4—V
DDQ
(V
/2)/[(RQ/5)–15%]—(V
DDQ
(V
/2)/[(RQ/5–4)+15%] —(V
DDQ
REF
—VSS + 0.4V6
DDQ
/2)/[(RQ/5)+15%]mA 7, 9
DDQ
/2)/[(RQ/5–4)–15%] mA 8, 9
DDQ
, ZQ, M1, M2 pin).
, DQ in High-Z.
or VIL, ZZ is held at VIH, Iout = 0 mA, Spec is
IH
= VDD max, VIN = VIH or VIL, Frequency = minimum cycle.
DD
= VDD max, VIN = VIH or VIL, Frequency = 3 MHz.
DD
= –6 mA, IOL = 6 mA.
OH
= 1/2 V
= 1/2 V
DDQ
DDQ
.
.
. The impedance update of the output driver
DDQ
through a
SS
V6
8
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