The Hitachi HM628512B is a 4-Mbit static RAM organized 512-kword × 8-bit. It realizes higher density,
higher performance and low power consumption by employing 0.35 µm Hi-CMOS process technology. The
device, packaged in a 525-mil SOP (foot print pitch width) or 400-mil TSOP TYPE II or 600-mil plastic DIP,
is available for high density mounting. The HM628512B is suitable for battery backup system.
Read cycle timet
Address access timet
Chip select access timet
Output enable to output validt
Chip selection to output in low-Zt
Output enable to output in low-Zt
Chip deselection to output in high-Zt
Output disable to output in high-Zt
Output hold from address changet
Write cycle timet
Chip selection to end of writet
Address setup timet
Address valid to end of writet
Write pulse widtht
Write recovery timet
WE to output in high-Zt
Data to write time overlapt
Data hold from write timet
Output active from output in high-Zt
Output disable to output in high-Zt
Notes: 1. tHZ, t
OHZ
and t
are defined as the time at which the outputs achieve the open circuit conditions and
WHZ
are not referred to output voltage levels.
2. This parameter is sampled and not 100% tested.
3. A write occurs during the overlap (t
transition of CS going low or WE going low. A write ends at the earlier transition of CS going high
or WE going high. t
4. t
is measured from CS going low to the end of write.
CW
5. t
is measured from the address valid to the beginning of write.
AS
6. t
is measured from the earlier of WE or CS going high to the end of write cycle.
WR
is measured from the beginning of write to the end of write.
WP
7. During this period, I/O pins are in the output state so that the input signals of the opposite phase to
the outputs must not be applied.
8. If the CS low transition occurs simultaneously with the WE low transition or after the WE transition,
the output remain in a high impedance state.
9. Dout is the same phase of the write data of this write cycle.
10.Dout is the read data of next address.
11.If CS is low during this period, I/O pins are in the output state. Therefore, the input signals of the
opposite phase to the outputs must not be applied to them.
12.In the write cycle with OE low fixed, t
data bus contention. t
) of a low CS and a low WE. A write begins at the later
WP
must satisfy the following equation to avoid a problem of
WP
max
WHZ
8
Timing Waveforms
Read Timing Waveform (WE = VIH)
Address
CS
OE
HM628512B Series
t
RC
t
AA
t
CO
t
LZ
t
OE
t
OLZ
t
HZ
t
OHZ
Dout
Valid Data
t
OH
9
HM628512B Series
Write Timing Waveform (1) (OE Clock)
Address
t
WC
OE
CS
WE
Dout
Din
t
AW
t
CW
*8
t
AS
t
OHZ
t
WP
t
DW
t
WR
t
DH
Valid Data
10
Write Timing Waveform (2) (OE Low Fixed)
Address
t
HM628512B Series
WC
CS
WE
Dout
Din
t
CW
*8
t
AW
t
WP
t
AS
t
WHZ
t
DW
t
t
DH
WR
t
OW
t
OH
*9
*11
*10
Valid Data
11
HM628512B Series
Low VCC Data Retention Characteristics (Ta = –20 to +70°C)
ParameterSymbol MinTypMaxUnitTest conditions*
VCC for data retentionV
Data retention currentI
DR
CCDR
2——V CS ≥ VCC – 0.2 V, Vin ≥ 0 V
—1*550*1µAVCC = 3.0 V, Vin ≥ 0 V
CS≥ V
– 0.2 V
CC
—1*515*2µA
—1*510*3µA
Chip deselect to data retention time t
Operation recovery timet
CDR
R
0——nsSee retention waveform
tRC*6—— ns
Notes: 1. For L-version and 20 µA (max.) at Ta = –20 to +40°C.
2. For L-SL-version and 3 µA (max.) at Ta = –20 to +40°C.
3. For L-UL-version and 3 µA (max.) at Ta = –20 to +40°C.
4. CS controls address buffer, WE buffer, OE buffer, and Din buffer. In data retention mode, Vin
levels (address, WE, OE, I/O) can be in the high impedance state.
5. Typical values are at V
6. t
= read cycle time.
RC
= 3.0 V, Ta = +25°C and specified loading, and not guaranteed.
CC
Low VCC Data Retention Timing Waveform (CS Controlled)
t
R
V
CC
4.5 V
t
CDR
Data retention mode
4
12
2.2 V
V
DR
CS
0 V
CS≥ VCC – 0.2 V
Package Dimensions
HM628512BLP Series (DP-32)
3217
HM628512B Series
Unit: mm
41.90
42.50 Max
13.4
13.7 Max
1
2.30 Max
2.54 ± 0.25
1.20
0.48 ± 0.10
16
5.08 Max
2.54 Min
0.51 Min
Hitachi Code
JEDEC
EIAJ
Weight
15.24
0.25
0° – 15°
(reference value)
+ 0.11
– 0.05
DP-32
—
Conforms
5.1 g
13
HM628512B Series
Package Dimensions (cont.)
HM628512BLFP Series (FP-32D)
20.45
20.95 Max
32
Unit: mm
17
11.30
1
1.00 Max
0.15
0.10
M
1.27
*0.40 ± 0.08
0.38 ± 0.06
*Dimension including the plating thickness
Base material dimension
16
+ 0.12
– 0.10
0.15
3.00 Max
0.20 ± 0.04
*0.22 ± 0.05
Hitachi Code
JEDEC
EIAJ
Weight
(reference value)
14.14 ± 0.30
1.42
0° – 8°
0.80 ± 0.20
FP-32D
Conforms
—
1.3 g
14
Package Dimensions (cont.)
HM628512BLTT Series (TTP-32D)
20.95
21.35 Max
32
HM628512B Series
Unit: mm
17
10.16
1
*0.42 ± 0.08
0.40 ± 0.06
1.15 Max
1.20 Max
*Dimension including the plating thickness
Base material dimension
0.21
0.10
1.27
M
16
*0.17 ± 0.05
0.125 ± 0.04
11.76 ± 0.20
0.13 ± 0.05
Hitachi Code
JEDEC
EIAJ
Weight
0° – 5°
(reference value)
0.80
0.50 ± 0.10
TTP-32D
Conforms
—
0.51 g
15
HM628512B Series
Package Dimensions (cont.)
HM628512BLRR Series (TTP-32DR)
20.95
21.35 Max
1
Unit: mm
16
10.16
32
*0.42 ± 0.08
0.40 ± 0.06
1.15 Max
1.20 Max
*Dimension including the plating thickness
Base material dimension
0.21
0.10
1.27
M
17
*0.17 ± 0.05
0.125 ± 0.04
11.76 ± 0.20
0.13 ± 0.05
Hitachi Code
JEDEC
EIAJ
Weight
0° – 5°
(reference value)
0.80
0.50 ± 0.10
TTP-32DR
Conforms
—
0.51 g
16
HM628512B Series
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent,
copyright, trademark, or other intellectual property rights for information contained in this document.
Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual
property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of
bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic,
safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for
maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and
other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the
guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or
failure modes in semiconductor devices and employ systemic measures such as fail-safes, so that the
equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage
due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor
products.
Hitachi, Ltd.
Semiconductor & Integrated Circuits.
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan
Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
URLNorthAmerica : http:semiconductor.hitachi.com/
For further information write to:
Hitachi Semiconductor
(America) Inc.
179 East Tasman Drive,
San Jose,CA 95134
Tel: <1> (408) 433-1990
Fax: <1>(408) 433-0223
Europe: http://www.hitachi-eu.com/hel/ecg
Asia (Singapore): http://www.has.hitachi.com.sg/grp3/sicd/index.htm
Asia (Taiwan): http://www.hitachi.com.tw/E/Product/SICD_Frame.htm
Asia (HongKong): http://www.hitachi.com.hk/eng/bo/grp3/index.htm
Japan: http://www.hitachi.co.jp/Sicd/indx.htm
Hitachi Europe GmbH
Electronic components Group
Dornacher Straße 3
D-85622 Feldkirchen, Munich
Germany
Tel: <49> (89) 9 9180-0
Fax: <49> (89) 9 29 30 00
Hitachi Europe Ltd.
Electronic Components Group.
Whitebrook Park
Lower Cookham Road
Maidenhead
Berkshire SL6 8YA, United Kingdom
Tel: <44> (1628) 585000
Fax: <44> (1628) 778322
Hitachi Asia (Hong Kong) Ltd.
Group III (Electronic Components)
7/F., North Tower, World Finance Centre,
Harbour City, Canton Road, Tsim Sha Tsui,
Kowloon, Hong Kong
Tel: <852> (2) 735 9218
Fax: <852> (2) 730 0281
Telex: 40815 HITEC HX
17
HM628512B Series
Revision Record
Rev.DateContents of ModificationDrawn byApproved by
0.0Apr. 24, 1998Initial issueM. HiguchiK. Imato
0.1Nov. 19, 1998DC Characteristics
I
max: 40/20 µA to 100/50 µA
SB1
Low V
Data Retention Characteristics
CC
I
max: 20/10 µA to 50/15 µA
CCDR
Change of note1 and 2
1.0Jan. 13, 1999Deletion of Preliminary
Features
Change of Power dissipation
Standby: TBD (typ) to 10 µW (typ)
DC Characteristics
I
typ: TBD/TBD to 2/2 µA
SB1
Low V
Data Retention Characteristics
CC
I
typ: TBD/TBD to 1/1 µA
CCDR
2.0Apr. 8, 1999Addition of L-UL-version
DC Characteristics
I
typ: 2/2 µA to 2/2/2 µA
SB1
I
max: 100/50 µA to 100/50/20 µA
SB1
Addition of note4
Low V
Data Retention Characteristics
CC
I
typ: 1/1 µA to 1/1/1 µA
CCDR
I
max: 50/15 µA to 50/15/10 µA
CCDR
Addition of note3
3.0Aug. 24, 1999Low VCC Data Retention Characteristics
Correct error: t
unit ms to ns
R
S. kunitoK. Imato
S. kunitoK. Imato
S. kunitoK. Makuta
18
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