HIT HM6264BLFPI-10T, HM6264BLFPI-12T, HM6264BLPI-10, HM6264BLPI-12 Datasheet

HM6264BI Series
64k SRAM (8-kword × 8-bit)
Wide Temperature Range version
ADE-203-492C (Z)
Rev. 3.0
May. 8, 2000
Description
The Hitachi HM6264BI is 64k-bit static RAM organized 8-kword × 8-bit. It realizes higher performance and low power consumption by 1.5 µm CMOS process technology. The device, packaged in 450 mil SOP (foot print pitch width), 600 mil plastic DIP, is available for high density mounting.
Features
Single 5 V supply: 5 V ± 10%
Access time: 100/120 ns (max)
Power dissipation:Standby: 10 µW (typ)Operation: 15 mW (typ) (f = 1 MHz)
Completely static memoryNo clock or timing strobe required
Equal access and cycle times
Common data input and outputThree state output
Directly TTL compatibleAll inputs and outputs
Battery backup operation capability
Operating temperature range: –40˚C to +85˚C
HM6264BI Series
Ordering Information
Type No. Access time Package
HM6264BLPI-10 HM6264BLPI-12
HM6264BLFPI-10T HM6264BLFPI-12T
Pin Arrangement
100 ns 120 ns
100 ns 120 ns
600-mil, 28-pin plastic DIP (DP-28)
450-mil, 28-pin plastic SOP(FP-28DA)
HM6264BLPI/BLFPI Series
1
NC
A12
A7 A6
A4
A0 I/O1 I/O2
I/O3
V
SS
2 3
4 5A5 6 7A3 8A2 9A1 10 11 12 13 14
28 27
24 23 22 21 20 19 18
V
CC
WE
CS226 A825 A9 A11
OE
A10
CS1
I/O8 I/O7 I/O617 I/O516 I/O415
(Top view)
2
Pin Description
Pin name Function
A0 to A12 Address input I/O1 to I/O8 Data input/output CS1 Chip select 1 CS2 Chip select 2
WE Write enable OE Output enable
NC No connection V
CC
V
SS
Power supply Ground
Block Diagram
A11
A8 A9
A7
A12
A5 A6
A4
Row
decoder
Memory array
256 × 256
HM6264BI Series
V
CC
V
SS
I/O1
I/O8
CS2
CS1
WE
OE
Column I/O
Input
data
Column decoder
control
A1 A3
A2 A0 A10
Timing pulse generator
Read, Write control
3
HM6264BI Series
Function Table
WE CS1 CS2 OE Mode VCC current I/O pin Ref. cycle
× H ××Not selected (power down) I ××L × Not selected (power down) ISB, I
H L H H Output disable I H L H L Read I L L H H Write I L L H L Write I
, I
SB
SB1
SB1
CC
CC
CC
CC
Note: ×: H or L
Absolute Maximum Ratings
Parameter Symbol Value Unit
Power supply voltage* Terminal voltage*
1
1
Power dissipation P Operating temperature Topr –40 to +85 °C Storage temperature Tstg –55 to +125 °C Storage temperature under bias Tbias –40 to +85 °C
Notes: 1. Relative to V
SS
2. VT min: –3.0 V for pulse half-width 50 ns
3. Maximum voltage is 7.0 V
V
CC
V
T
T
–0.5 to +7.0 V –0.5*2 to VCC + 0.3*3V
1.0 W
High-Z — High-Z — High-Z — Dout Read cycle (1)–(3) Din Write cycle (1) Din Write cycle (2)
Recommended DC Operating Conditions (Ta = –40 to +85°C)
Parameter Symbol Min Typ Max Unit
Supply voltage V
Input high voltage V Input low voltage V
CC
V
SS
IH
IL
Note: 1. VIL min: –3.0 V for pulse half-width 50 ns
4
4.5 5.0 5.5 V 000V
2.4 VCC + 0.3 V
1
–0.3*
0.6 V
HM6264BI Series
DC Characteristics (Ta = –40 to +85°C, VCC = 5 V ±10%, VSS = 0 V)
Parameter Symbol Min Typ*1Max Unit Test conditions
Input leakage current |I Output leakage current |ILO| ——2 µA CS1 = VIH or CS2 = VIL or OE = VIH or
Operating power supply current
Average operating power supply current
Standby power supply current
Output low voltage V Output high voltage V
Notes: 1. Typical values are at VCC = 5.0 V, Ta = +25°C and not guaranteed.
2. V
min = –0.3V
IL
| ——2 µA Vin = VSS to V
LI
WE = V
I
CCDC
7 20 mA CS1 = VIL, CS2 = VIH, I
others = V
I
CC1
30 50 mA Min cycle, duty = 100%,
CS1 = V others = V
I
CC2
3 8 mA Cycle time = 1 µs, duty = 100%, I
CS1 0.2 V, CS2 V V
VCC – 0.2 V, VIL 0.2 V
IH
I
SB
I
SB1
—13mACS1 = VIH, CS2 = V
2
*
2 200 µA CS1 VCC – 0.2 V, CS2 VCC – 0.2 V or
0 V CS2 0.2 V, 0 V Vin
OL
OH
0.4 V IOL = 2.1 mA
2.4 V IOH = –1.0 mA
CC
, V
= V
IL
I/O
IH/VIL
, CS2 = VIH, I
IL
IH/VIL
SS
to V
CC
IL
CC
= 0 mA
I/O
= 0 mA
I/O
– 0.2 V,
= 0 mA
I/O
Capacitance (Ta = 25°C, f = 1.0 MHz)
Parameter Symbol Min Typ Max Unit Test conditions
Input capacitance* Input/output capacitance*
1
1
Note: 1. This parameter is sampled and not 100% tested.
Cin 5 pF Vin = 0 V C
I/O
——7 pFV
= 0 V
I/O
5
HM6264BI Series
AC Characteristics (Ta = –40 to +85°C, VCC = 5 V ± 10%, unless otherwise noted.)
Test Conditions
Input pulse levels: 0.6 V to 2.4 V
Input and output timing reference level: 1.5 V
Input rise and fall time: 10 ns
Output load: 1 TTL Gate + CL (100 pF) (Including scope & jig)
Read Cycle
HM6264BI-10 HM6264BI-12
Parameter Symbol Min Max Min Max Unit Notes
Read cycle time t Address access time t Chip select access time CS1 t
CS2 t Output enable to output valid t Chip selection to output in low-Z CS1 t
CS2 t Output enable to output in low-Z t Chip deselection in to output in high-Z CS1 t
CS2 t Output disable to output in high-Z t Output hold from address change t
RC
AA
CO1
CO2
OE
LZ1
LZ2
OLZ
HZ1
HZ2
OHZ
OH
Notes: 1. tHZ is defined as the time at which the outputs achieve the open circuit conditions and are not
referred to output voltage levels.
2. At any given temperature and voltage condition, t given device and from device to device.
3. Address must be valid prior to or simultaneously with CS1 going low or CS2 going high.
100 120 ns — 100 120 ns — 100 120 ns — 100 120 ns — 50 60 ns 10 10 ns 2 10 10 ns 2 5—5—ns2 0 35 0 40 ns 1, 2 0 35 0 40 ns 1, 2 0 35 0 40 ns 1, 2 10 10 ns
maximum is less than tLZ minimum both for a
HZ
6
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