HIT HAT2036R Datasheet

Silicon N Channel Power MOS FET
Features
Low on-resistance
=12m typ
DS(on)
Capable of 4.5 V gate drive
Low drive current
High density mounting
High speed switching
tf=60ns typ.
HAT2036R
Power Switching
ADE-208-665B(Z)
Target specification 3rd. Edition
May 1998
Outline
SOP–8
4
G
56 7 8 D
D
DD
SSS 1
23
5
6
7
8
2
1
1, 2, 3 Source 4 Gate 5, 6, 7, 8 Drain
4
3
HAT2036R
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V Gate to source voltage V Drain current I Drain peak current I Body-drain diode reverse drain current I Channel dissipation Pch*
DSS
GSS
D
D(pulse)
DR
1
*
2
Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C
Notes: 1. PW 10µs, duty cycle 1 %
2. When using the glass epoxy board (FR4 40 x 40 x 1.6 mm), PW 10s
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown voltage V Gate to source leak current I Zero gate voltege drain current I Gate to source cutoff voltage V Static drain to source on state R resistance R
(BR)DSS
GSS
DSS
GS(off)
DS(on)
DS(on)
Forward transfer admittance |yfs| 1220—S ID = 6A, VDS = 10V * Input capacitance Ciss 1200 pF VDS = 10V Output capacitance Coss 380 pF VGS = 0 Reverse transfer capacitance Crss 200 pF f = 1MHz Total gate charge Qg 23 nc VDD = 10V Gate to source charge Qgs 4.0 nc VGS = 10V Gate to drain charge Qgd 6.0 nc ID = 12A Turn-on delay time t Rise time t Turn-off delay time t Fall time t Body–drain diode forward voltage V Body–drain diode reverse
t
d(on)
r
d(off)
f
DF
rr
recovery time Note: 1. Pulse test
30——V I ——±0.1 µAVGS = ±20V, VDS = 0 ——1 µAVDS = 30 V, VGS = 0
1.5 3.0 V VDS = 10V, I D = 1mA —1215m ID = 6A, VGS = 10V * —2030m ID = 6A, VGS = 4.5V *
40 ns VGS = 4.5V, ID = 6A — 300 ns VDD 10V —35—ns —60—ns — 0.9 V IF = 12A, VGS = 0 * — 35 ns IF = 12A, VGS = 0
30 V ±20 V 12 A 96 A 12 A
2.5 W
= 10mA, VGS = 0
D
diF/ dt =20A/µs
1
1
1
1
2
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