HIT HAF2011-L, HAF2011-S Datasheet

HAF2011(L),HAF2011(S)
Silicon N Channel MOS FET Series
Power Switching
Target specification
ADE-208-738 (Z)
1st. Edition
Jan. 1999
This FET has the over temperature shut–down capability sensing to the junction temperature. This FET has the built–in over temperature shut–down circuit in the gate area. And this circuit operation to shut–down the gate voltage in case of high junction temperature like applying over power consumption, over current etc.
Logic level operation (4 to 6 V Gate drive)
High endurance capability against to the short circuit
Built–in the over temperature shut–down circuit
Latch type shut–down operation (Need 0 voltage recovery)
Outline
1. Gate
2. Drain
3. Source
4. Drain
1
2
3
4
1
2
3
4
LDPAK
Gate resistor
Tempe– rature Sencing Circuit
Latch Circuit
Gate Shut– down Circuit
D
S
G
HAF2011(L),HAF2011(S)
2
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V
DSS
60 V
Gate to source voltage V
GSS
16 V
Gate to source voltage V
GSS
–2.5 V
Drain current I
D
40 A
Drain peak current I
D(pulse)
Note1
80 A
Body-drain diode reverse drain current I
DR
40 A
Channel dissipation Pch
Note2
50 W Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C
Note: 1. PW 10µs, duty cycle 1 %
2. Value at Ta = 25°C
Typical Operation Characteristics
Item Symbol Min Typ Max Unit Test Conditions
Input voltage V
IH
3.5 V
V
IL
1.2 V
Input current I
IH1
100 µA Vi = 8V, VDS = 0
(Gate non shut down) I
IH2
——50µA Vi = 3.5V, VDS = 0
I
IL
——1 µA Vi = 1.2V, VDS = 0
Input current I
IH(sd)1
0.8 mA Vi = 8V, VDS = 0
(Gate non shut down) I
IH(sd)2
0.35 mA Vi = 3.5V, VDS = 0
Shut down temperature T
sd
175 °C Channel temperature
Gate operation voltage V
OP
3.5 12 V
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