Hioki ST4030, ST4030A Users guide

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ST4030A

Instruction Manual

IMPULSE WINDING TESTER

Be sure to read this manual before using the instrument.

When using the instrument for the

rst time

Parts Names and Functions

Communication Command Instruction Manual

Dec. 2019 Revised edition 2 ST4030A961-02 19-12H

p.8 Maintenance and Service



CD Error Display and Solution



Troubleshooting



p.207



p.214



p.5

Measurement Flowchart

The basic measuring ow is as described below.

Preparation

See “2 Preparation for Measurements” (p. 13)

Master workpiece

(known-good winding)

Setting Test Conditions and Judgment Conditions

Select [SETTING] in test conditions settings mode. (p. 18)

Select the settings table that will acquire the master waveform. (p. 29)

Workpiece

under test

Set the output items such as applied voltage, applied number of pulses, sampling frequency,

etc. (p. 41)

Connect the master workpiece to the test lead.

ST4030A961-02

Calibrate the voltage and acquire the master waveform. (p. 49)

Set the judgment criteria. (p. 53)

Implementing tests

Select [TEST] in test mode. (p. 18)

Select the settings table that acquired the master waveform to be used in the test (p. 29)

Connect the workpiece under test to the test lead.

Start the test and check the test results. (p. 84)

Save the test results

Make the settings for saving the data. (p. 169)

Save the test results. (p. 176)

Contents

Introduction Notations Conrming Package Contents Options (Sold separately) Usage Notes

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1 Overview 7

1.1 Overview

1.2 Features

1.3 Parts Names and Functions

1.4 Screen Operations

Measuring mode settings Moving windows Touch keyboard inputs Screen conguration

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2 Preparation for

Measurements

2.1 Connecting the Test Lead (on the ST4030)

2.2 Connecting the Power Cord

2.3 Power Supply ON/OFF

Main power supply ON Main power supply OFF Sleep mode Startup mode

2.4 Select Measuring Mode

2.5 Inspecting before Measurement and Verifying Operations

Inspection Checking the voltage generated Checking the impulse response waveforms

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3 Switching Test

Conditions (Table

Functions)

3.1 Overview

Overview of test conditions switching functions Items that can be saved

Operations owchart in test conditions settings mode and test mode Screen conguration

3.2 Current Table Selection

3.3 Table Initialization

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.......................29

3.4 Table Deletion

3.5 Changing the Table Name

3.6 Table Copying

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4 Setting the Test

Conditions

4.1 Overview

Operations owchart in test conditions settings mode Screen conguration

4.2 Applied Voltage

4.3 Number of Applied Pulses

4.4 Sampling Frequency/Number of Sampling Data

Automatic settings for range of waveform acquisition

4.5 Trigger Delay

4.6 Voltage Calibration

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...............................49

5 Setting Judgment

Conditions

5.1 Overview

Judgment types Settings operations procedure

5.2 LC and RC Values Area Judgments [LCRC AREA]

Enabling the LC and RC values judgments function Importing LC and RC master values Auto creation of the PASS judgment area Manually creating the PASS judgment area

5.3 Waveform Judgments

Surface area comparison judgments

[AREA]

Differential surface area comparison judgments [DIFF AREA] Flutter detection judgments [FLUTTER]

Secondary differential detection judgments [LAPLACIAN]

Waveform judgment area and judgment threshold value automatic settings

functions

5.4 Discharge Judgments (When Incorporating Model ST9000)

Discharge judgment methods

[DISCHARGE]

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.. 58

..... 66

Contents

Threshold value of the test waveform discharge amount over the master

waveform discharge amount Deviation threshold value of the test

waveform discharge amount Setting the discharge amount judgment

area

..........................................................76

......................74

......................75

6 Implementing Tests 77

6.1 Overview

Operations owchart in test mode Screen conguration

6.2 Checking Test Start and Test Results

................................................77

..............77

..................................78

7 Break down voltage

test (BDV)

7.1 Overview

Operations owchart in break down voltage test mode Screen conguration

7.2 Checking Test Start and Test Results

7.3 Setting the Test Conditions

Applied voltage settings Number of applied pulses settings

Setting the sampling frequency and number of sampling data

Setting the waveform acquisition area automatically

7.4 Setting Dielectric Break down Judgment Conditions

LC and RC values judgments Discharge judgment

Waveform surface area comparison judgment Peak voltage value uctuations Vibration frequency uctuations

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8 Other Functions 101

8.1 Interlock Function

Unlocking the interlocks

8.2 Key Lock Function

Unlocking the key locks

8.3 Double Action Function

8.4 Memory Function

Memory function settings (ON/OFF) Saving memory data Deleting memory data

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8.5 Displays

8.6 Graph Display Settings

Overlay settings Waveform color settings LC and RC graph scale settings

Implementing the LC and RC graph auto scale

8.7 Judgment Beep

8.8 Key Beep

8.9 Test Time (EOM) Display

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8.10 Communications Commands Long Format Settings

..................................120

8.11 Initializing the Instrument (System Reset)

8.12 Terminal Open Error Setting

8.13 Voltage Error Setting

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.............122

..........................123

9 System Settings 125

9.1 Instrument System Information

9.2 Self-test Function

Touch panel test Touch panel correction Screen display test ROM/RAM test EXT. I/O test

............................................131

9.3 Date and Time Settings

................................126

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........................................ 129

.....................132

........125

10 External Control

(EXT. I/O)

10.1 External Control Measurement

......................................................134

Flow

10.2 Sinking Current (NPN) / Sourcing Current (PNP)

10.3 Connection (Instrument and Control Devices)

Instrument connector and compatible connectors Signal functions Internal circuit conguration Electrical specications Connection examples

10.4 Timing Chart

Explanation of timing chart times Measurement timing example

Flow of starting measurements from an external device, and reading the

judgment results

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133

Contents

Index

11 Communications

Interface

11.1 Overview

Screen display

11.2 Specications

RS-232C GP-IB USB LAN Total

11.3 Mounting and Removing an Interface

11.4 Interface Settings

11.5 Connecting and Setting RS-232C (Model Z3001)

11.6 Connecting and Setting GP-IB (Model Z3000)

11.7 Connecting and Setting USB

11.8 Setting and Connecting LAN

Connection method Setting procedure

11.9 Remote Mode

11.10 Communications Monitor

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145

12 USB Host 165

12.1 Overview

12.2 Removing the USB Memory

12.3 File Window

12.4 Settings for Saving the Data

Setting auto save Setting manual save Text save items settings Setting the text save format Setting the image save format

Setting the name of the saved le and its folder

12.5 Saving Test Results

Saving manually Checking the test results that have been

saved

12.6 Saving and Importing Test Conditions

Saving test conditions Importing test conditions

12.7 Editing Files and Folders

Formatting USB memory

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Deleting les and folders Creating folders Changing the folder name and le name Information display

.......................................187

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. . 188

..................................189

13 Specications 191

13.1 General Specications

13.2 Input Specications/Output Specications/Measurement Specications

Basic specications Accuracy specications

13.3 Functional Specications

Test conditions settings Set judgment conditions Test conditions switching functions Break down voltage test (BDV) mode Safety protection function Other functions

13.4 Interface Specications

External control terminal (EXT.I/O) specications Communications interface specications USB host specications Test time (Reference value)

13.5 L2250 Clip Type Lead (Option)

General Specications Basic specications

13.6 L2252 Unprocessed Lead Cable (Option)

General Specications Basic specications

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14 Maintenance and

Service

14.1 Troubleshooting

Before sending the instrument for repair FAQ regarding external control (EXT. I/O)

14.2 Initializing the Instrument (Full Reset)

14.3 Error Display

14.4 Discarding the Instrument (Removing the Lithium Battery)

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207

..208

212

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iii

Contents

15 Appendix 221

15.1 Block Diagram

15.2 Circuit Conguration

Circuit operations during tests Effects of cable parasitic components

15.3 Rack Mount

Metal tting dimensions Installation method

15.4 Dimensions Diagram

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......223

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15.5 Repeat Accuracy (Reference Value)

Reproducibility of the voltage generated Oscillation waveform reproducibility

..230

.........231

15.6 Max. Applicable Voltage (Reference Value) According to the Workpiece Inductance

.................232

15.7 Voltage Switching Time (Reference Value)

...................................................233

15.8 Waveform Differences (Typical Values) Between Instruments

...........234

15.9 Affects on Measurements According to the Length of the Test Lead

.............................................236

15.10 Precautions when Processing Test

....................................................237

Leads

15.11 Ver. 1.01 Compatibility Function

.......239

230

Index 241

Warranty Certicate

Introduction

Thank you for choosing the Hioki ST4030, ST4030A Impulse Winding Tester. Preserve this manual carefully and keep it handy to make full use of this instrument for a long time. Read the separate document “Operating Precautions” carefully before using the instrument.

Target audience

This manual has been written for use by individuals who use the product in question or who teach others to do so. It is assumed that the reader possesses basic electrical knowledge (equivalent to that of someone who graduated from the electrical program at a technical high school).

Trademarks

• Windows is either registered trademarks or trademarks of Microsoft Corporation in the United States and other countries.

• Any other products and company names are generally either trade names, registered trademarks or trademarks of respective companies.

Introduction

Notations

Safety symbols

In this document, the risk seriousness and the hazard levels are classied as follows.

WARNING

CAUTION

IMPORTANT

Indicates a potentially hazardous situation that may result in death or serious injury to the operator.

Indicates a potentially hazardous situation that may result in minor injury to the operator or damage to the instrument or malfunction.

Indicates information related to the operation of the instrument or maintenance tasks with which the operators must be fully familiar.

Indicates prohibited actions.

Indicates an action that must be performed.

Symbols afxed to the instrument

Indicates cautions and hazards. Refer to the “Usage Notes” (p. 5) and warning messages presented at the beginning of each instruction for use of the Instruction Manual, and included “Operating Precautions”.

Indicates that dangerous voltage may be present at this terminal.

Other Descriptions

(p. ) Indicates the location of reference information.

START

(Boldface)

[ ]

S/s

Indicates the names and keys on the windows in boldface.

Names of menus, dialog boxes, buttons in a dialog box, and other UI elements on the screen are enclosed in brackets [ ].

The instrument describes the number per second of digitized analog input signals in units of samples per second (S/s). Example: “20 MS/s” (20 megasamples per second) means digitization of 20 × 10

times per second.

Accuracy descriptions

We dene measurement tolerances in terms of setting values with the following meanings.

Setting Indicates the value set as the output voltage, current, or other quantity.

Conrming Package Contents

When you receive the instrument, inspect it carefully to ensure that no damage occurred during shipping. In particular, check the accessories, panel switches, and connectors. If damage is evident, or if it fails to operate according to the specications, contact your authorized Hioki distributor or reseller.

Store the packaging materials even after unpacking, because you will need them when you transport the instrument.

Conrm that these contents are provided.

Model ST4030 or ST4030A Impulse Winding Tester



Power cord



Instruction Manual (this document)



Operating Precautions (0990A903)



Application disc (CD)



• Communication Command Instruction Manual Communication Command Reference Default settings table

• USB driver

The latest version can be downloaded from our website.

Options (Sold separately)

The following options are available for the instrument. To purchase an option, please contact your authorized Hioki distributor or reseller. Options are subject to change. Please check Hioki’s website for the latest information.

Model ST9000 Discharge Detection Upgrade



(Optional when shipped from factory)

Model L2250 Clip Type Lead



(Maximum rated voltage: 3300 V AC peak)

Model L2252 Unprocessed Lead Cable



(Maximum rated voltage: 4200 V AC peak)

Model Z3000 GP-IB Interface



Model 9151-02 GP-IB Connector Cable (2 m)



Model Z3001 RS-232C Interface



Model 9637 RS-232C Cable (9pin-9pin/1.8 m)



Usage Notes

Read the separate document “Operating Precautions” carefully before using the instrument. Follow these precautions to ensure safe operation and to obtain the full benets of the various functions.

Installation

CAUTION

• Ventilation holes for heat radiation are provided on the rear of the instrument. Leave sufcient space around the ventilation holes and install the instrument with the holes unobstructed. Installation of the instrument with the ventilation holes obstructed may cause a malfunction of the instrument or a re.

• Do not place the instrument on an unstable surface or inclined place.Dropping or knocking down the instrument could cause bodily injury or damage to the instrument.

Usage Notes

Open 5 cm or longer

This instrument may cause interference if used in residential areas. Such use must be avoided unless the user takes special measures to reduce electromagnetic emissions to prevent interference to the reception of radio and television broadcasts.

Application disc

• Exercise care to keep the recorded side of discs free of dirt and scratches. When writing text on a disc’s label, use a pen or marker with a soft tip.

• Keep discs inside a protective case and do not expose them to direct sunlight, high temperature, or high humidity.

• Hioki is not liable for any issues your computer system experiences in the course of using this disc.

Test lead

CAUTION

• Do not make small bends or repeatedly bend the cable. As a benchmark, bending to 6x or less the cable diameter will damage the cable core and cover, causing deterioration.

• Do not hold the cable when removing the clip from the workpiece.

• Hold the clip in your hand, and open and close gently.

Repeatedly opening and closing so that the clip springs risks damaging and causing deterioration to the opening and closing mechanism.

Usage Notes

Overview

1.1 Overview

Windings (workpieces) found in motors, coils, and other components are covered with insulation, but the insulation resistance may fall and short circuits occur between proximate layers for some reason. The condition is called a “layer short circuit”. The ST4030, ST4030A Impedance Winding Tester not only compares and judges waveform conformance through comparisons with existing response waveforms, but also detects layer short circuits using judgment methods that employ the rendering of response waveforms as numerical values (LC and RC values). Further, incorporating the ST9000 Discharge Detection Upgrade (optional) into the instrument enables highly precise detection of partial discharges that occur in the stages in advance of a layer short circuit.

1.2 Features

High-speed and high-resolution sampling

Sampling using 200 MHz, 12 bit resolution enables the detection of minute changes in the response waveform that hitherto could not be seen. In this way, it is possible to detect layer short circuits with a high level of accuracy compared to before.

Numerical rendering of impulse response waveforms (LC and RC values)

Overview

The equivalence circuits for the impulse test are viewed as LCR linear equivalent circuits, and the response waveforms are rendered numerically into LC and RC values. Rendering the response waveforms into numerical values enables the response waveforms to be judged quantitatively. Further, the data can be managed more easily than the waveform data.

Impulse can be tested with the rotor mounted

With the rotor and motor stator mounted, the stray capacitance between the rotor and the stator changes depending on the rotor angle. Changes in the stray capacitance also change the impulse response waveform, so judgments are difcult using existing waveform comparison methods. Numerical judgment values using LC and RC values can create PASS judgment area from the LC and RC values distribution, and so by creating PASS judgment area using a healthy phase, it is possible to test the impulse with the rotor mounted.

High-precision Discharge Detection Upgrade

Extracting the high-frequency discharge components of the response waveform enables highly precise detection of partial discharges, which have hitherto been difcult to detect using utter operations and Laplacian operations.

High waveform reproducibility

The applied voltage variation is small, so it is possible to detect defective products accurately. Further, the instrument differences when the same workpiece is tested are small, so it is possible to use the master workpiece data as is even if the instrument is replaced. Reference: “15.5 Repeat Accuracy (Reference Value)” (p. 230)

Easy-to-use interfaces and an abundance of interfaces

The screen uses 8.4-inch color TFT crystals with touch panel for easy viewing and intuitive operability. Compatible with various usage scenarios using external control (EXT. I/O), USB memory, USB devices, and LAN. Further, RS-232C or GP-IB can be added as options.

Parts Names and Functions

1.3 Parts Names and Functions

2 3 4 5 6 7

Front

18 17 16

8 11

9310

Rear

14 13 12

19 19

Bottom

212020

Top

Parts Names and Functions

No. Name Function

Display 8.4-inch color TFT liquid crystal display.

START button Starts measurements. p. 77

OUTPUT lamp Shows the voltage

USB connector Connects a USB memory. p. 165

STOP button Stops the voltage application and suspends testing.

PASS/FAIL lamp Shows the total judgment

Startup button Switches the instrument

Voltage output terminal Connects a test lead (optional). p. 14

Serial number The serial number consists of 9 digits. The rst two (from the left)

Comes with a resistant lm touch panel.

Red: Voltage is being applied p. 84

application status.

Also used during double actions.

result.

ON and OFF.

indicate the year of manufacture, and the next two indicate the month of manufacture. Required for production control. Do not peel off the label.

OFF: Standby

Green: Total judgment result PASS p. 84

Red: Total judgment result FAIL

OFF: No judgments

OFF: Main power supply OFF p. 16

Red: Sleep mode

Green: ON mode

Reference

p. 10

p. 84,

106

125

Overview

MAC address MAC address of the instrument. p. 125

Vent holes For ventilation, and to prevent the interior of the instrument from

EXT.I/O

NPN/PNP switch

mount

LAN connector *

USB connector *

External control

terminal (EXT.I/O)

Communications

interface*

Power inlet Connects the provided power cord. p. 15

Main power supply

switch

Stand Tilts the instrument to enable the screen to be viewed easily.

Support legs

overheating. Install so that the vent holes are not blocked.

Switches the programmable type of the external control terminal. Left: NPN (current sink)

Connects a LAN cable. p. 157

Connects a USB cable. p. 155

Enters signals from the programmable controller and I/O boards to control the instrument.

Mount a Z3000 GP-IB Interface (optional) or Z3001 RS-232C Interface (optional).

Turns ON and OFF the main power supply to the instrument. p. 16

Make sure to fully open both the left and right stands before installation.

When mounting the instrument to a rack* legs.

Right: PNP (current source)

, remove the support

–

133

p. 133

152,

154

–

Handle Used to carry the instrument. –

*1: For how to use RS-232C, GP-IB, USB, and LAN, see the “Communications Commands Instruction

Manual” on the application disk.

*2: The instrument can be mounted to a rack. See “15.3 Rack Mount” (p. 224).

Screen Operations

1.4 Screen Operations

The instrument uses a touch panel for all settings and changes to the measuring conditions. Gently touch the onscreen keys to select the items and values set for those keys.

CAUTION

Do not press the touch panel forcefully or jab it with the point of a hard object. Doing so may cause a malfunction.

This document describes below the procedures up to displaying the various settings screens. Example: When displaying the [SETTING] screen

Measurement screen

(

) [MODE] > [SETTING]

Measuring mode settings

Example: Selecting the test conditions settings mode

Tap [MODE] to display the measuring mode selection window.

Select the measuring mode.

Here, tap [SETTING].

Tap [EXIT] to return to the measurement screen.

Moving windows

Press and hold the window title bar while dragging the window to move the window to a new position.

Window title bar

Screen Operations

Overview

Touch keyboard inputs

Enter text and then tap [SET] to conrm. To cancel, tap [CANCEL].

1 3 4

5 6 7





BS Deletes 1 character.

CLR Deletes all.

Moves the cursor to the left.

Moves the cursor to the right.

KEY TYPE Switches the keyboard type.

A   a Switches between upper and

lower case.

!   A Switches between symbols/

numbers, and the alphabet.

Screen Operations

Screen conguration

The instrument settings windows are congured using the following stages.

Measurement screen

MODE VOLT

SETTING

TEST

BDV

NONE

OUTPUT

PULSE

SAMPLING

DELAY

JUDGE

OUTPUT START

LCRC AREA

DISCHARGE

AREA

DIFF AREA

FLUTTER

LAPLACIAN

END

TABLE

SYSTEM

FILE

SYSTEM

I/F

INFO

TEST

CLOCK

JUDGE

STEP

PULSE

SAMPLING

LCRC AREA

DISCHARGE

AREA

Preparation for Measurements

Make sure to read through both “Usage Notes” (p. 5) in this manual and the separate “Operating Precautions” before starting the preparations that precede measuring. For rack mounts, see “15.3 Rack Mount” (p. 224).

Installing the device.

Connecting the test lead.

p. 5

p. 14

Connecting and setting the external interface (as necessary).

EXT. I/O p. 136

RS-232C p.

GP-IB p.

USB p.

152

154

155

Preparation for Measurements

LAN p.

USB memory p.

Connecting the power cord.

Turning on the instrument power supply.

Setting the date and time (as necessary).

Setting the measuring mode.

Inspecting before measurement and verifying operations.

157

169

p. 15

p. 16

p. 132

p. 18

p. 19

Connecting the Test Lead (on the ST4030)

2.1 Connecting the Test Lead (on the ST4030)

Connect the test lead to the voltage output terminal on the instrument.

CAUTION

• To prevent damage to the coaxial connectors or joint, make sure to unlock rst, and grasp the coaxial connector and pull it out.

• Model L2250 Clip Type Lead’s maximum rated voltage is 3300 V AC peak. To test

higher voltages, use the L2252 Unprocessed Lead Cable.

• Model L2252 requires customer modication. To prevent electric shock and equipment damage when modifying the lead, see “15.10 Precautions when Processing Test Leads” (p. 237).

Red Black

Rear

Align the groove on the test lead’s coaxial cable to the lock pin on the voltage output

terminal on the ST4030 side and insert.

Rotate the coaxial connector on the test lead to the right to lock it.

When removing, rotate the coaxial connector on the connection cable to the left and then pull out.

Connecting the Power Cord

2.2 Connecting the Power Cord

To supply power to the instrument, connect the power cord to the power supply inlet on the rear of the instrument.

WARNING

Before turning on the power supply, check that the power supply voltage described on the power supply connector on the instrument and the power supply voltage to be used match each other. Using outside the range of the designated power supply voltage may cause damage and electrical malfunction to the instrument.

Preparation for Measurements

OFF

Rear

Turn OFF the main power supply switch on the rear of the instrument.

Connect the power cord to the power inlet.

Connect the plug of the power cord to the grounded outlet.

IMPORTANT

If the power supply is cut off while the main power supply is ON (by a breaker tripping, etc.), the instrument will start automatically when the power is supplied again.

To grounded outlet

Power Supply ON/OFF

IMPORTANT

• If the main power supply switch is turned OFF or there is a power failure during startup, the instrument

settings may be lost.

• If the instrument’s settings have not been saved, “WARNING 101” will be displayed on start-up. If you

encounter the warning, perform either of the following steps:

• Reset the instrument’s settings and then recongure them.

• Reset the instrument’s settings and then load a previously saved settings le from a USB drive.

2.3 Power Supply ON/OFF

Turn ON the main power supply on the rear of the instrument beforehand to enable turning ON and OFF the power supply using the startup button on the front. This is convenient if incorporating the instrument into an automated machine or assembly line. If the main power supply is turned OFF while the instrument is in sleep mode and then turned ON again, the instrument will start in sleep mode.

• Using the startup button in sleep mode will hold the instrument settings even if the main power supply switch is turned OFF (backup).

• If the instrument was not used for a long time, it is necessary to charge the internal backup battery. Turning ON the instrument’s main power supply will charge the internal battery. Charge for a minimum of 3 hours, although 24 hours is recommended.

Main power supply

switch

Main power supply ON

Turn ON the main power supply switch.

The startup button lamp will turn on.

Startup mode

Lit green

Main power supply OFF

Startup button

Rear Front

Sleep mode

Lit red

Turn OFF the main power supply switch.

The startup button lamp will turn off.

Power Supply ON/OFF

IMPORTANT

After writing to the settings internal memory is nished, the device will enter sleep mode. While writing is underway, the date and time display will have a red background.

IMPORTANT

To measure using the accuracy in the specications, leave the instrument to warm up for 60 minutes or longer after turning ON the main power supply and canceling sleep mode.

Sleep mode

This is the mode in which the device power supply is OFF. Only the circuit that turns on the startup button lamp is operating.

With the main power supply switch turned ON, press and hold the startup button for approx.

2 sec.

The startup button lamp will turn red and the instrument will enter sleep mode.

Startup mode Sleep mode

Lit green Lit red

Approx. 2 sec.

Startup mode

Press the startup button when the instrument is in sleep mode.

The startup button lamp will turn green and the instrument will enter startup mode.

Sleep mode

Startup mode

Preparation for Measurements

Lit red

Lit green

Select Measuring Mode

2.4 Select Measuring Mode

Tap [MODE] in the measurement screen to display the measuring mode selection window. Choose from 4 types of measuring mode.

1 2 3

[SETTING] Test conditions settings mode

[TEST] Test mode

[BDV] Break down voltage test (BDV) mode

[NONE] Voltage application disabled mode

Sets the test conditions, sets the judgment conditions, and acquire the master waveforms.

Calls the test conditions that have been set using test conditions settings mode, and to test objects.

Tests the impedance while gradually increasing the voltage applied to the workpiece to determine the break down voltage.

It is not possible to output from the instrument for safety reasons.

Inspecting before Measurement and Verifying Operations

2.5 Inspecting before Measurement and Verifying Operations

Inspection

Before using the instrument for the rst time, verify that it operates normally to ensure that no damage occurred during storage or shipping. If you nd any damage, contact your authorized Hioki distributor or reseller.

Is the sheath of the cable

normal without any damage or exposed metal part?

Not exposed

Is the instrument normal

without any damage?

Exposed

Damaged

This may cause electric shock or short circuit, so replace with an undamaged cable. Contact your authorized Hioki distributor or reseller.

Send for repairs.

Preparation for Measurements

Not damaged

When the main power supply

is ON, is the startup button lamp either green or red?

Lamp is ON

When the startup button is ON,

is the opening screen (model

name and version) displayed?

Displayed

After the opening screen is

displayed, is the interface board error screen displayed?

Lamp is

OFF

Not

displayed

Displayed

Send for repairs. There is a risk of a broken wire in the power cord, or of a malfunction in the instrument.

Send for repairs. There is a risk of a malfunction in the device.

Turn OFF the power supply, remove the interface board, and turn ON the power supply again. Z3002 LAN Interface boards cannot be used with this instrument.

Not displayed

Inspection is complete.

Inspecting before Measurement and Verifying Operations

Checking the voltage generated

Check that operations are at an environmental temperature of 23C±5C, and that the humidity is 80% RH or less.

Select an empty table to which nothing has been saved in the test conditions settings mode.

Set the applied voltage to 100 V, the sampling frequency to 200 MHz, the number of sampling

data to 1001, and the number of pulses to be applied to 1.

Implement the tests with nothing connected to the voltage output terminal.

(Illustration below is ST4030A)

(Nothing is connected)

Rear

Check that the peak voltage (value displayed on the instrument) is 100 V ±2%.

Change the voltage setting.

ST4030: 3300 V ST4030A: 4200 V

Implement the test with nothing connected to the voltage output terminal.

Check that the peak voltage (value displayed on the instrument) is below.

ST4030: 3300 V±2% ST4030A: 4200 V±2%

IMPORTANT

Contact your authorized Hioki distributor or reseller if the peak voltage differs from the set voltage by 2% or greater.

Inspecting before Measurement and Verifying Operations

Checking the impulse response waveforms

Implement impulse testing on the inspection master workpiece to check that there are no abnormalities in the instrument or equipment. Set the test conditions according to the workpiece.

Tools to be prepared

Master workpiece (a workpiece close to the mass production master workpiece, or a coil of approx. 1 mH created using reinforced insulation wire) Calibrate the voltage of the master workpiece beforehand and record the master waveform.

Connect the master workpiece to the test lead.

Select the table to which the master waveform was saved in test mode.

Implement the test.

If the waveform shape (peak voltage, zero‑cross point, etc.) changes greatly

(1) Being affected by residual magnetization from the workpiece core.

Preparation for Measurements

Apply a degaussing impulse to the workpiece until the waveform stops changing.

You can see how waveforms diverge by turning on waveform superposition and repeating the test multiple times. Reference: “Overlay settings” (p.

112)

Inspecting before Measurement and Verifying Operations

(2) Waveform reproducibility is poor.

Periods of magnetic saturation reduces the workpiece inductance, so the vibration frequency of the response waveform increases (i.e., inclination is more sudden). The waveform may experience major variation when multiple impulse tests are performed on the same workpiece because of the magnetic characteristics of the core.

If the core is magnetically saturated, the waveform will tilt rapidly.

(3) Being affected by the magnetic anisotropy of the workpiece core.

The characteristics of the magnetic materials may depend on its orientation. Implement the tests using the same layout as during the voltage calibration.

(4) The master workpiece has been changed.

Recalibrate the voltages. Even if the coil and motor have the same model number, if they have different magnetic core characteristics (varied by lot), there is a risk that the waveform will change due to differences in the stray capacitance of the workpiece.

(5) The equipment cable or device connected in parallel to the instrument has changed.

The cable capacitance and the parasitic capacitance of the equipment connected in parallel affects the vibration frequency. Recalibrate the voltages.

Example:

Waveform difference due to cable length when implementing impulse tests on coils with the same inductance values (1 mH).

If 1.5 m

If 3.0 m

Inspecting before Measurement and Verifying Operations

If ringing occurs that did not occur during voltage calibration

(1) Master workpiece is grounded.

When the master workpiece is grounded, ringing may occur due to parasitic components of the power cord or test lead. Do not ground the master workpiece.

(2)

e test lead has been extended.

The longer the test lead the more the parasitic capacitance and parasitic inductance increase, making it easy for ringing to occur. If the user is processing the test lead themselves, make the lead as short as possible. If replacing the test lead, recalibrate the voltages.

Ringing

Preparation for Measurements

(3) Master workpiece insulation is worn.

Prepare a new master workpiece, and implement voltage calibration.

(4) Test lead insulation is worn.

Prepare a new test lead, and implement voltage calibration.

IMPORTANT

If none of these apply, there is a risk that the instrument is damaged. Contact your authorized Hioki distributor or reseller.

Inspecting before Measurement and Verifying Operations

Switching Test Conditions (Table

Functions)

3.1 Overview

• The test conditions, judgment conditions, and master waveform are saved to the instrument’s internal memory as settings tables. A maximum of 255 settings tables (No. 001 to No. 255) can be created.

• Select a table that creates the master waveform in test conditions settings mode to acquire the master waveform.

• Select the table to which the master waveform to be used in the test was saved in test mode, and implement the test.

• Even if the instrument’s power supply is turned OFF, the settings table details will be retained.

Overview of test conditions switching functions

You can save multiple test conditions, judgment conditions, and master waveforms as settings tables and switch between them as desired.

Switching Test Conditions (Table Functions)

Number of settings saved

Retained settings

Switching between settings

tables

Settings table settings

initialization

Settings table name settings

IMPORTANT

Select the table to be used, and change the test conditions and acquire the waveform. Changing the test conditions and acquiring the waveform will overwrite the previous settings.

255

Test conditions, judgment conditions, and master waveforms

Switch using screen operations, communications, and signal inputs to external control terminal (EXT.

Restores the settings such as the master waveforms in the settings tables to their default settings.

Add a user-selected name to each settings table (127 characters max.) Default value: TBL_XX (XX is the table number)

I/O).

Overview

Items that can be saved

The following items can be saved to settings tables.

Test conditions settings

VOLT Applied voltage

PULSE No. of applied pulses, No. of degaussing pulses, min. interval between pulse outputs

SAMPLING Sampling frequency, No. of sampling data

DELAY Trigger delay

Judgment conditions settings

LCRC AREA LC and RC values judgments

DISCHARGE*

AREA Waveform surface area comparison judgment

DIFF-AREA Waveform difference surface area comparison judgments

Discharge judgment*

FLUTTER Waveform utter detection judgments

LAPLACIAN Waveform secondary differential detection judgments

*1: When incorporating Model ST9000

Master waveform

Master waveform data

Overview

Operations owchart in test conditions settings mode and test mode

In test conditions settings mode and test mode, select the table to be used before you move on to the next operation, by using the operations procedure as shown in the diagram.

Test conditions

settings mode

[SETTING]

Select the table to which to save

the master waveform.

[TABLE]

Set the test conditions.

[OUTPUT]

Enable the judgment conditions to be

used.

[JUDGE]

Calibrate the voltage and import the

master waveform.

[V CAL]

Test mode

[TEST]

Select the table to which the master waveform to be used

in the tests was saved.

[TABLE]

Implement the test.

Check the test results.

Finish

Switching Test Conditions (Table Functions)

Import the master data for the LC and

RC values (When using LC and RC

values judgments).

Set the judgment conditions.

[JUDGE]

Finish

Overview

Screen conguration

(Measurement screen) [MODE] > [SETTING] or [TEST] > [TABLE]

1 2 5

3 4

6 7 8 9 10

Current table number

Table name

Tables list List of the tables that have been saved.

Scroll bar Drag to scroll the table.

UP/DOWN buttons Moves up or down the table that is displayed.

Table setting description Settings descriptions for the table selected onscreen.

[SELECT] Sets the selected table as the current table.

[DELETE] Deletes the selected table.

[INIT] Initializes the selected table.

[RENAME] Changes the name of the selected table.

[COPY] [No.xxx] [PASTE] Copies the table that has been created and pastes it to a table

Number and name of the (current) table that is presently set.

The table in which the characters are light blue is the present table.

Reference: “3.2 Current Table Selection” (p. 29)

Reference: “3.4 Table Deletion” (p. 31)

Reference: “3.3 Table Initialization” (p. 30)

Reference: “3.5 Changing the Table Name” (p. 32)

chosen by the user. The table selected for copying is displayed as [No. xxx] (with the characters in yellow). Reference: “3.6 Table Copying” (p. 33)

Current Table Selection

3.2 Current Table Selection

Sets the table used as the test conditions as the current table (i.e., the table to be used from now on).

(Measurement screen) [MODE] > [SETTING] or [TEST] > [TABLE]

Tap the table that is to be set as the current table.

The table selected will be surrounded by a yellow frame.

Tap [SELECT].

The characters in the table selected as the current table will turn light blue.

Test conditions settings mode: Saves the settings and the master waveform to the selected current table. Test mode: Implements tests using the master waveform in the selected current table.

Switching Test Conditions (Table Functions)

Table Initialization

3.3 Table Initialization

Restores the settings details of the selected table to their default values. Also deletes the master waveform. Reference: “Default settings table” on the application disc

(Measurement screen) [MODE] > [SETTING] > [TABLE]

Tap the table.

Tap [INIT].

The conrmation window will be displayed.

Tap [OK].

3.4 Table Deletion

Deletes the settings details from unnecessary tables. After deletion, the [TABLE NAME] is displayed as [– – –].

(Measurement screen) [MODE] > [SETTING] > [TABLE]

Table Deletion

Tap the table to be deleted.

Tap [DELETE].

The conrmation window will be displayed.

Tap [OK].

Switching Test Conditions (Table Functions)

Changing the Table Name

3.5 Changing the Table Name

Changes the name of the table saved to the instrument.

(Measurement screen) [MODE] > [SETTING] > [TABLE]

Tap the table whose name you want to change.

Tap [RENAME].

Enter the new name of the table.

Reference: “Touch keyboard inputs” (p. 11)

3.6 Table Copying

You can copy the table that has been created and paste it to your chosen table.

(Measurement screen) [MODE] > [SETTING] > [TABLE]

Table Copying

Tap the table to be copied.

Tap [COPY].

Tap the table to be pasted.

Tap [PASTE].

The conrmation window will be displayed.

Tap [OK].

Switching Test Conditions (Table Functions)

IMPORTANT

If there is already data in the target table, the source data will be overwritten.

Table Copying

Setting the Test Conditions

4.1 Overview

Use the master workpiece to set the test conditions in order to judge whether or not the workpiece to be tested is defective. In test conditions settings mode, set the output conditions and the judgment conditions such as the pulse to be applied, etc., and acquire the master waveform. You can save up to 255 test conditions settings in a table.

Operations owchart in test conditions settings mode

In test conditions settings mode, set the output conditions and judgment conditions, and acquire the master waveform using the operations procedure as shown in the diagram.

Test conditions settings mode

[SETTING]

Select the table to which to save the master waveform.

[TABLE]

Setting the Test Conditions

Set the test conditions.

[OUTPUT]

Enable the judgment conditions to be used.

[JUDGE]

Calibrate the voltage and import the master waveform.

[V CAL]

Import the master data for the LC and RC values.

(When using LC and RC values judgments)

Set the judgment conditions.

[JUDGE]

Finish

Overview

Screen conguration

Measurement screen

1 2

3 5 6 8 9

4 7

Graph display Displays the waveform graph and the LC and RC graph.

Menu icons [MODE]: See “2.4 Select Measuring Mode” (p. 18)

[DISP] Switches the graph displayed onscreen.

Test conditions settings

display

[GRAPH] Sets the graph display.

[SCALE] Auto-scales the LC and RC graph.

Judgment conditions settings

display

[SAVE] Saves the test results to USB memory.

Reference: “Graph display (display graph switching)” (p.

[TABLE]: See “3.2 Current Table Selection” (p. [OUTPUT]: See “4 Setting the T [JUDGE]: See “5 Setting Judgment Conditions” (p. [SYSTEM]: See “9 System Settings” (p. [FILE]: See “12 USB Host” (p.

[WAVE]: Waveform graph [LCRC]: LC and RC graph [WAVE&LCRC]: Waveform graph + LC and RC graph

Displays the setting for the applied voltage, number of pulses, and sampling frequency.

Reference: “8.6 Graph Display Settings” (p. 112)

Reference: “LC and RC graph scale settings” (p.

Displays the judgment conditions settings.

Reference: “12 USB Host” (p. 165)

est Conditions” (p. 35)

125)

165)

37)

29)

51)

115)

[V CAL] Calibrates the voltages.

IMPORTANT

Tap items such as the output conditions settings and the judgment conditions settings to display each settings window directly.

Reference: “4.6 Voltage Calibration” (p. 49)

Graph display (display graph switching)

Waveform graph display

Displays the waveform graph only.

21 3 54

Overview

Number of applied pulses and

peak voltage display

Waveform judgment area and

LC and RC values operation

range bar

Response waveform Yellow: Master waveform

Discharge judgment threshold

value bar

Discharge waveform Green dotted line: Discharge judgment threshold value

[P:XX/XX]: Number of pulses that have been applied/Total number of

pulses

[xxxV]: Max. peak voltage value of the response waveform

Blue: AREA judgment area Green: DIFF judgment area Purple FLUTTER judgment area Gray: LAPLACIAN judgment area Yellow (×2): LC and RC value operation areas

Blue: Test waveform Note: You can change the color of the waveform. Reference: “8.6 Graph Display Settings” (p.

Displays the discharge judgment threshold value.

Gray: Discharge amount graph (Parts where the discharge amount exceeds the threshold value are displayed in red) Note: Displayed only if the Discharge Detection Upgrade is ON. Reference: “5.4 Discharge Judgments (When Incorporating Model ST9000)” (p.

72)

Setting the Test Conditions

112)

Overview

LC and RC graph display

Displays only the LC and RC graph.

1 2

LC and RC graph Blue (dots): Latest LC and RC values

LC and RC cursor values [No.XXX, (XXX)]: Master data number of the cursor values (Total

[DELETE] Deletes the master data for the LC and RC values shown by the

[DELETE ALL] Deletes the master data for all LC and RC values.

[CREATE] Creates the PASS judgment area automatically.

IMPORTANT

Tap the LC and RC values on the graph to move the cursor and check each LC and RC value.

Yellow (dots): Imported LC and RC values master data Gray (solid): LC and RC values PASS judgment area Note: Dotted colors operate in tandem with the waveform colors. Also, you can change the color of the waveform. Reference: “8.6 Graph Display Settings” (p.

number of master data that have been imported)

[LC/RC: xxx]: LC and RC values selected using the cursor

cursor. Reference: “Importing LC and RC master values” (p. 56)

Reference: “Importing LC and RC master values” (p.

Reference: “Auto creation of the PASS judgment area” (p. 58)

112)

56)

Display the waveform graph and the LC and RC graph

Displays the waveform graph and the LC and RC graph simultaneously.

Overview

Setting the Test Conditions

Overview

Instrument status display and error display

1 2 3

Current measurement

mode display

Current table display Displays the number and table name of the table presently being used.

Communications

interface settings display Voltage calibration status

display

Test status display Displays the test status.

USB memory status

display

Double action status

display

Interlock status display

Communications status

display

Date and time display Displays the date and time that has been set in the instrument.

5 6 8 9 10

Displays the settings for the communications interface presently being used.

Reference: “14.3 Error Display” (p.

Note: The background is displayed in red while writing to the settings internal memory.

(Gray) (Blue) (Red)

(No display) (Green) (Gray)

(No display) (Red) (Gray)

Voltage application disabled mode Test conditions settings mode Test mode

BDV mode

Voltage calibration not implemented (Master waveform not acquired)

Voltage calibration implemented (Master waveform acquired)

214) USB memory not connected USB memory connecting Accessing USB Double action function OFF

START button enabled START button disabled

Interlock function OFF Interlock engaged Interlock canceled Remote status Local status

4.2 Applied Voltage

Sets the peak voltage value of the pulse applied to the workpiece. Inputs can be set either by using the up and down keys, or be entered using the numeric keypad.

(Measurement screen) [MODE] > [SETTING] > [OUTPUT] > [VOLT]

Applied Voltage

Set the applied voltage value.

Settings range: ST4030: 100 V to 3300 V (resolution: 10 V)

ST4030A: 100 V to 4200 V (resolution:10 V)





C Sets to the default values.

‑KEY Displays the numeric keypad.

Increases by 1.

Decreases by 1.

Setting the Test Conditions

Number of Applied Pulses

4.3 Number of Applied Pulses

Sets the number of test pulses to be used in the tests and the number of degaussing pulse applications to eliminate magnetic elds from the workpiece. Both the test pulses and degaussing pulses continue to be applied until their set number is reached.

PULSE NUM

(Number of test pulses applied)

DEGAUSS NUM

(Number of degaussing pulses applied)

PULSE PERIOD

(Pulse application interval)

Sets the number of test pulses to be applied. When multiple test pulses are applied, each test pulse is judged individually.

Sets the number of degaussing pulses to be applied. A degaussing pulse is a pulse that is applied before the test pulses to remove any residual magnetization from the workpiece. Degaussing pulse waveforms are not sampled or judged.

Sets the pulse application interval if multiple degaussing pulses and test pulses are to be applied. When multiple pulses are applied, the pulse application interval operates at or above the set time.

Overview of application pulse settings

TRIG EOM

Degaussing pulse

Test pulse

Pulse application interval

*1: Sampling and judgment not implemented

Each pulse is sampled and judged

*2:

*3: If the single pulse test time setting is shorter than the application interval time setting, the set time will wait

before applying the next pulse. If the single pulse test time is longer than the set time, the next pulse is applied after the previous pulse test has nished.

(Measurement screen) [MODE] > [SETTING] > [OUTPUT] > [PULSE]

Number of Applied Pulses

Set the number of test pulses.

Setting range: 1 to 32





C Sets to the default values.

Set the number of degaussing pulses.

Setting range: 0 to 10





C Sets to the default values.

Increases by 1.

Decreases by 1.

Increases by 1.

Decreases by 1.

Setting the Test Conditions

Set the pulse application interval.

Setting range: 0.050 s to 1.000 s (resolution 0.001 s)





C Sets to the default values.

10‑KEY Displays the numeric keypad.

Increases by 1.

Decreases by 1.

Sampling Frequency/Number of Sampling Data

4.4 Sampling Frequency/Number of Sampling Data

Sets the voltage sampling frequency and the number of sampling data to be imported to the instrument.

Sets the voltage sampling frequency.

SAMPLING

(Sampling frequency)

RECORD LENGTH

(No. of sampling data)

If a sufciently long response waveform cannot be imported because the response waveform vibration period is long, you can extend the length of the waveform being imported by extending the sampling frequency.

Sets the number of sampling data to be imported to the instrument. Sets the length of the waveform to be imported, and sets the sampling frequency. Adjust the number of sampling data so that a suitable waveform length can be imported for judgment.

AUTO SET

(Automatic settings function for range of waveform acquisition)

Sampling waveform lengths

Pulse application

area

Imported waveform length when the number of sampling data is 8001 points

Imported waveform length when the number of sampling data is

6001 points

This function automatically adjusts and sets the sampling frequency and number of sampling data during voltage calibration so that the waveform acquisition range is optimal.

Self-resonant area

Important: Recommended import length of the sampling waveform

Adjust the sampling wavelength so that the vibration waveform of the self-resonant area imports for 4 or more periods to enable sufcient waveform data to be used by the LC and RC values operations and the waveform judgment function. Slow the sampling frequency to lengthen the waveform to be imported.

Sampling Frequency/Number of Sampling Data

(Measurement screen) [MODE] > [SETTING] > [OUTPUT] > [SAMPLING]

Set the sampling frequency.

Setting range: 10 MHz, 20 MHz, 50 MHz, 100 MHz, 200 MHz





Set the number of sampling data.

Setting range: 1001 points to 8001 points (resolution: 1000 points)





Slows the sampling frequency.

Accelerates the sampling frequency.

Decreases by 1000.

Increases by 1000.

Setting the Test Conditions

Sampling Frequency/Number of Sampling Data

Automatic settings for range of waveform acquisition

You can automatically adjust and set the sampling frequency and number of sampling data during voltage calibration so that the waveform acquisition range is optimal.

(Measurement screen) [MODE] > [SETTING] > [OUTPUT] > [SAMPLING]

Tap [AUTO SET].

Trigger Delay

4.5 Trigger Delay

Sets the delay time (trigger delay) from the start of measuring to the application of the rst pulse. If using this function, you can start measuring after the workpiece connection status has stabilized even if trigger timing and probing timing are the same when combined in the equipment.

Trigger delay

Trigger

(Measurement start)

IMPORTANT

The OUTPUT lamp is synced to the EOM signals and so turns on even if the trigger is delayed.

Pulse application

Setting the Test Conditions

Trigger Delay

(Measurement screen) [MODE] > [SETTING] > [OUTPUT] > [DELAY]

Set the trigger delay.

Setting range: 0.000 s to 9.999 s (resolution: 0.001 s)





C Sets to the default values.

‑KEY Displays the numeric keypad.

Increases by 1.

Decreases by 1.

4.6 Voltage Calibration

Calibrates the voltages after the test conditions settings are nished. Voltage calibration adjusts the output voltage so that the set voltage is applied to the workpiece, and then imports the master waveform using the output voltage after making the adjustments.

Items implemented using voltage calibration

Gradually raise and adjust the output voltage so that the max. peak

Output voltage calibration

voltage of the response waveform is the same as the set voltage value.

Voltage Calibration

Automatically sets the sampling frequency and number of sampling data

LC and RC values operation range settings

Importing basic data for discharge judgments

Auto settings for the judgment range and judgment standards for each waveform judgment

Importing master waveform

Implemented when the auto setting for the waveform acquisition range is ON.

Implemented when the ST9000 Discharge Detection Upgrade is enabled.

Implemented when the auto settings for waveform judgment areas and judgment threshold values are ON.

Calibrating output voltages

The max. peak voltage of the response waveform is repeatedly compared to the pulse application, max. peak voltage, and set voltage values while gradually increasing the set voltage value and the output voltage.

Setting the Test Conditions

Max. peak voltage

Even if the response waveform max. peak voltage is outside the primary peak, adjust so that the max. peak voltage value is the same as the set voltage value.

Voltage Calibration

(Measurement screen) [MODE] > [SETTING] > [OUTPUT]

Tap [V CAL].

The settings window will open.

Select the calibration type.

TYPE1 If the instrument determines that the entire workpiece response waveform can be measured

using more appropriate settings by adjusting the sampling frequency and sampling data count, either “INFORMATION 1021” or “INFORMATION 1022” will be displayed. If the set voltage is not applied, “WARNING 104” will be displayed.

TYPE2 The above information will not be displayed.

Tap [YES].

Voltage calibration starts. When importing the master waveform has nished after the voltage calibration has nished, the icon at the bottom left of the screen will change from [UNCAL] (red) to [CAL] (blue).

Reference: See “14.3 Error Display” (p. 214).

Setting Judgment Conditions

5.1 Overview

Applies a set impulse voltage using voltage calibration to the workpiece to be tested, and compares the response waveform, LC and RC values, and discharge composition amount to the master workpiece data to judge whether or not the workpiece being tested conforms to quality.

LC and RC values judgments

Judgment types

The following three types of judgment are available.

LC and RC values judgments

Waveform judgments

“LC and RC Values Area Judgments [LCRC AREA]” (p. 53)

“Surface area comparison judgments [AREA]” (p. 62) “Differential surface area comparison judgments [DIFF AREA]” (p. 64) “Flutter detection judgments [FLUTTER]” (p. 66) “Secondary differential detection judgments [LAPLACIAN]” (p.

69)

Discharge judgments

Setting Judgment Conditions

Discharge judgments (When

incorporating ST9000)

“Discharge judgment methods [DISCHARGE]” (p. 73)

Overview

Settings operations procedure

Imports the master workpiece waveform as the master waveform, and sets the threshold values for each judgment function from the master waveform.

Turns ON the [ENABLE] settings for the

Test conditions

settings mode

[SETTING]

Select the table to which to save

the master waveform.

[TABLE]

Set the test conditions.

[OUTPUT]

Enable the judgment conditions

to be used.

[JUDGE]

Calibrate the voltage and import the

master waveform.

[V CAL]

Imports the master data for the LC

and RC values and creates the PASS

judgment area.

(When using LC and RC values

judgments)

Set the judgment conditions.

[JUDGE]

Finish

judgment functions to be used. (p. 55)

• [JUDGE] > Use the judgment functions tab to turn ON the [ENABLE] setting for the judgment functions to be

used, and to turn OFF the [ENABLE] setting for the judgment functions that will not be used.

• Turning OFF the judgment functions that will not be used shortens the test times.

Press START button to implement the impulse

tests and import the LC and RC master values

(Implemented multiple times). (p. 56)

• Up to 1024 LC and RC master values max. can be imported.

• Tap

[SCALE] at the bottom of the screen to

automatically set the LC and RC graph scale values.

• Tap the master values on the LC and RC graph to move the cursor.

• Tap

[DELETE] alongside the LC and RC graph to

delete the LC and RC master values selected by the cursor.

• Tap [DELETE ALL] alongside the LC and RC graph to delete all the imported LC and RC master values.

The PASS judgment area is created

automatically from the imported LC and RC

master values. (p. 58)

• Tap [CREATE] alongside the LC and RC graph> Set the margin for the master values in the PASS judgment area, and then tap [CREATE] to automatically create the PASS judgment area.

• The PASS judgment area that has been created is displayed in a gray square on the LC and RC graph.

Adjust the PASS judgment area manually.

(p. 60)

• You can set the PASS judgment area manually using the [JUDGE] > [LCRC AREA] tab.

You can set the PASS judgment area using the upper and lower limit values of the LC and RC values when

[HI-LO] is ON.

You can set the PASS judgment area using the LC and RC values of the rectangle’s zenith when [HI-LO] is OFF.

• Tap the LC and RC values graph when the [LCRC

AREA] tab is selected to edit the PASS judgment

area directly.

Setting judgment conditions other than LC

and RC values judgments.

• [JUDGE] > Set the judgment threshold values in the judgment functions tab.

LC and RC Values Area Judgments [LCRC AREA]

5.2

LC and RC Values Area Judgments [LCRC AREA]

What are LC and RC values?

The equivalence circuit for the impulse tests is viewed as a LCR linear equivalence circuit as shown in the diagram below, and is the value that was quantied as the 2 parameters of “L*C” value and “R*C” value using the equivalence circuit and impulse response waveform data.

Impulse response waveforms

: R*C value

Power supply

: L*C value

Setting Judgment Conditions

Impulse Winding Tester Motor

IMPORTANT

The LC and RC values are values approximated from the impulse response waveform. Accurate equivalence circuit parameter values may be different.

LC and RC Values Area Judgments [LCRC AREA]

LC and RC values judgments

Test conditions settings mode

The PASS judgment area is created based on multiple LC and RC values imported from the master workpiece after voltage calibration has been implemented.

LC and RC graph (Test conditions settings mode)

Yellow dots: Imported LC and RC master values Gray: The PASS judgment area that has been created

Test mode

Judged by whether the LC and RC values of the workpiece being tested are inside the PASS judgment area that has been created.

LC and RC graph (Test mode)

Blue dots: LC and RC values of workpiece under test Gray: PASS judgment area

IMPORTANT

• The LC and RC values judgments function calculates the internal coefcients such as the waveform operation area of the LC and RC values during voltage calibration. Consequently, make sure to enable the LC and RC values judgments function before implementing voltage calibration.

• The PASS judgment area created during voltage calibration is set based on the LC and RC values variation for the conforming workpiece during voltage calibration. If the settings include LC and RC values variation for the workpiece under test, it is necessary to import the LC and RC master values and create a P

ASS judgment area, or to adjust the judgment area manually.

• If the measured waveforms lacks the second and subsequent cycles, the LC and RC values will be calculated using the area that includes the point at which the voltage was applied. In this case, the LC and RC values will not correspond to the values calculated based on a conventional LCR resonance circuit, but they can still be used to generate a judgment.

LC and RC Values Area Judgments [LCRC AREA]

Enabling the LC and RC values judgments function

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [LCRC AREA]

Tap [ENABLE], and turn [ON] the LC and RC values area operation functions.

Tap [JUDGE], and turn [ON] the LC and RC values judgments functions.

IMPORTANT

If implementing LC and RC values operations only with no judgment, turn ON [ENABLE] and turn OFF

[JUDGE].

Setting Judgment Conditions

LC and RC Values Area Judgments [LCRC AREA]

Importing LC and RC master values

Implement voltage calibration and import the master waveform before importing multiple LC and RC values as the master values. Test while implementing voltage calibration to save the LC and RC values acquired for each test as master values to the instrument.

• Up to 1024 LC and RC master values max. can be imported.

• LC and RC master values are deleted when the power supply is turned OFF.

Checking and editing imported LC and RC master values

You can check imported LC and RC master values using the cursor. The cursor moves whenever a LC or RC value is tapped.

• Tap [SCALE] at the bottom of the screen to automatically set the LC and RC graph scale values.

• Tap [DELETE] alongside the LC and RC graph to delete the LC and RC master values presently

selected by the cursor.

• Tap [DELETE ALL] alongside the LC and RC graph to delete all the imported LC and RC master values.

LC and RC Values Area Judgments [LCRC AREA]

IMPORTANT

Tap the LC and RC values on the graph to move the cursor and check each LC and RC value.

LC and RC cursor values [No.XXX]: Master data number of the cursor value.

[DELETE] Deletes the master data for the LC and RC values shown by the cursor.

[DELETE ALL] Deletes the master data for all LC and RC values.

[CREATE] Creates the PASS judgment area automatically.

[SCALE] Auto-scales the LC and RC graph.

[(XXX)]: Total number of master data that have been imported.

Reference: “Importing LC and RC master values” (p.

Reference: “Auto creation of the PASS judgment area” (p.

Reference: “LC and RC graph scale settings” (p.

56)

58)

115)

Setting Judgment Conditions

LC and RC Values Area Judgments [LCRC AREA]

Auto creation of the PASS judgment area

The PASS judgment area is created automatically from the imported LC and RC master values.

(Measurement screen) [MODE] > [SETTING]

Tap [CREATE] (on the measurements screen).

Tap [AREA TYPE] to set the shape of the area when the PASS judgment area is created

automatically.

HI-LO Creates a rectangular PASS judgment area from the maximum and minimum LC and RC

master values. Used when the master workpiece’s LC and RC values are distributed in close proximity.

FIT Creates a banded PASS judgment area that covers the LC and RC master values.

Used if the LC and RC values distribution is banded by the rotor position (angle) with a motor that has been combined with a rotor.

Rectangular PASS judgment area

[HI-LO]

Set the margin when creating the PASS judgment area automatically.

[AREA TYPE] [HI-LO] : Adds the result of multiplying the LC and RC average values by the margin rate to the

upper and lower limit values.

[FIT] : Adds the result of multiplying the length of the long and short sides of the banded area

by the margin rate to the outside of the long and short sides, respectively. Since a value of 100% will cause the original lengths to be added on both sides, the long and short sides will be 3 times their original length.

Banded PASS judgment area

[FIT]

LC and RC Values Area Judgments [LCRC AREA]

Tap [CREATE].

The PASS judgment area is created automatically. The PASS judgment area that has been created is displayed in a gray square on the LC and RC graph.

IMPORTANT

• When the margin is 0%, the distribution of the imported LC and RC master values remain unchanged, and a PASS judgment area is created for the distribution to act as the PASS judgment area threshold values.

• If the margin rate increases, a PASS judgment area is created so that the P values are greater than the distribution of the imported LC and RC master values.

ASS judgment area threshold

Setting Judgment Conditions

LC and RC Values Area Judgments [LCRC AREA]

Manually creating the PASS judgment area

You can set the PASS judgment area manually. You can manually micro-adjust the PASS judgment area after auto creation.

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [LCRC AREA]

Tap [HI-LO] to set the shape of the PASS judgment area.

(ON)

(OFF)

IMPORTANT

Adjusts the PASS judgment area directly by tapping the PASS judgment area in the LC and RC graph when

[LCRC AREA] tab is displayed.

(ON):

Adjusts the size of the rectangle by tapping and dragging the borders of the area rectangle.

(OFF):

Adjusts the zenith positions by tapping and dragging the zeniths of the area trapezoids.

[LO][HI]

Sets the PASS judgment area threshold values using the upper and lower limit values of the LC and RC values.

[POINT1] [POINT2] [POINT3] [POINT4]

Sets the PASS judgment area threshold values using the LC and RC values of the rectangle’s zenith.

Tap any of the following: [HI] [LO] or [LC] [RC].

Set the PASS judgment area threshold values using either the upper and lower limit values of the LC and RC values, or the LC and RC values at the rectangle’s zenith.

LC and RC Values Area Judgments [LCRC AREA]

Use the numeric keypad to enter the threshold values.

Settings range: ±(0.000 f to 1.000) (effective number of digits: 4)

C Clear the entered value.

− Enter a minus sign.

X10

/10

Multiplies the entered value by ×1000.

Multiplies the entered value by ×1/1000.

[HI-LO] is ON (Threshold value set using upper and lower limit values)

HILO

[HI-LO] is OFF (Threshold value set using LC and RC values zeniths)

POINT 1

POINT 2

Setting Judgment Conditions

POINT 4

POINT 3

Waveform Judgments

5.3 Waveform Judgments

Surface area comparison judgments [AREA]

Compares the master waveform surface area and the test waveform surface area in the area specied by the user and judges whether the workpiece being tested conforms by the extent of the difference. The surface area of the waveform in the judgment area (solid yellow color) is calculated as shown in the “Waveform surface area calculation example” below. The judgment standard is set using percentage value, and if the surface area difference is within that range, the workpiece being tested is judged to conform.

Waveform surface area calculation example

Judgment area

Surface area comparison value operation

Test waveform surface

AREA

(%) =

area value

Master waveform surface

area value



100

Enabling the surface area comparison judgment function

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [AREA]

Tap [ENABLE], and turn [ON] the surface area comparison judgment function.

Setting the surface area comparison judgment threshold value

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [AREA]

Waveform Judgments

Tap [LIMIT].

Use the numeric keypad to enter the surface area comparison threshold value.

Settings range: 0.00% to 99.99% (resolution: 0.01%)

OFF Surface area comparison value operations are implemented, but judgments are not.

Tap [SET] to conrm.

Setting the surface area comparison judgment area

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [AREA]

Judgment area bar

You can change the judgment area by dragging the lines of the start and end points.

Setting Judgment Conditions

/

/

Set the start and end points for the judgment area.

Moves 1 point.

Moves 100 points.

[END]: End point

[BEGIN]: Start point

Waveform Judgments

Differential surface area comparison judgments [DIFF AREA]

Calculates the surface area surrounded by the master waveform and test waveform in the userdesignated area to judge whether the test workpiece within that area conforms. The surface area surrounded by the master and test waveforms in the judgment area (surface area in a solid orange color) is calculated as shown in the “Differential surface area calculation example” below. The judgment standards are set using percentages, and the test workpiece is judged to conform if the percentage of the test waveform surface area over the master waveform surface area is in that range.

Differential surface area calculation example

Judgment area

Differential surface area comparison value operation formula

Diff

(Test waveform surface area value −

(%) =

Master waveform surface area value

Master waveform surface area value)

Enabling the differential surface area comparison judgment function

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [DIFF AREA]

100

Tap [ENABLE], and turn [ON] the differential surface area comparison judgment function.

Waveform Judgments

Setting the differential surface area comparison judgment threshold value

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [DIFF AREA]

Tap [LIMIT].

Use the numeric keypad to enter the threshold values.

Settings range: 0.00% to 99.99% (resolution: 0.01%)

OFF Differential surface area comparison value operations are implemented, but judgments are not.

Tap [SET] to conrm.

Setting the differential surface area comparison judgment area

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [DIFF AREA]

Judgment area bar

You can change the judgment area by dragging the lines of the start and end points.

Setting Judgment Conditions

/

/

Set the start and end points for the judgment area.

Moves 1 point.

Moves 100 points.

[END]: End point

[BEGIN]: Start point

Waveform Judgments

Flutter detection judgments [FLUTTER]

The amount of the high-frequency component expressed by the test waveform in the userdesignated area is detected, and the size of the amount used to judge the discharge. The response waveform is primarily differentiated and the surface area of the differentiated waveform calculated as the amount of the high-frequency component.

Example of the test waveform discharge component

Example of high-frequency components due to discharge

Flutter value operation

Number of data

Flutter

−

Judgment area

−1

Enabling waveform utter detection judgment functions

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [FLUTTER]

Waveform Judgments

Tap [ENABLE], and turn [ON] the utter detection judgment functions.

Setting the utter detection judgment threshold values

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [FLUTTER]

Setting Judgment Conditions

Tap [LIMIT].

Enter the utter detection judgment threshold values.

Setting range: 0 to 999,999 (resolution: 1)

OFF Flutter value operations are implemented, but judgments are not.

Tap [SET] to conrm.

Waveform Judgments

Setting the utter detection judgment area

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [FLUTTER]

Judgment area bar

You can change the judgment area by dragging the lines of the start and end points.

/

/

Set the start and end points for the judgment area.

Moves 1 point.

Moves 100 points.

[END]: End point

[BEGIN]: Start point

Waveform Judgments

Secondary differential detection judgments [LAPLACIAN]

The amount of the high-frequency component expressed by the test waveform in the userdesignated area is detected, and the size of the amount used to judge the discharge. The response waveform is secondarily differentiated and the surface area of the differentiated waveform calculated as the amount of the high-frequency component.

Laplacian operations

Number of data−1

Laplacian

Enabling secondary differential detection judgment functions

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [LAPLACIAN]

−

|−

−1

Tap [ENABLE], and turn [ON] the secondary differential detection judgments.

Setting Judgment Conditions

Waveform Judgments

Setting the secondary differential detection judgment threshold values

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [LAPLACIAN]

Tap [LIMIT].

Enter the secondary differential detection judgment threshold values.

Setting range: 0 to 999,999 (resolution: 1)

OFF Laplacian value operations are implemented, but judgments are not.

Tap [SET] to conrm.

Setting the secondary differential detection judgment areas

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [LAPLACIAN]

Judgment area bar

You can change the judgment area by dragging the lines of the start and end points.

/

/

Set the start and end points for the judgment area.

Moves 1 point.

Moves 100 points.

[END]: End point

[BEGIN]: Start point

Waveform Judgments

Waveform judgment area and judgment threshold value automatic settings functions

Waveform judgment areas and judgment threshold values are set automatically by the instrument based on the waveform and variability at the set voltage during voltage calibration so as to optimize judgment settings for waveform judgment functions.

This function can be set individually using the next judgment function. The judgment threshold values and judgment areas for the enabled judgment functions are set automatically during voltage calibration.

• Surface area comparison judgments [AREA]

• Differential surface area comparison judgments [DIFF AREA]

• Flutter detection judgments [FLUTTER]

• Secondary differential detection judgments [LAPLACIAN]

Each judgment function sets threshold values by adding the result of multiplying the average measured value by the margin rate to the variability exhibited by each measured value during voltage calibration.

Enabling waveform judgment area automatic settings functions

(Measurement screen)

[MODE] > [SETTING] > [JUDGE] > [AREA], [DIFF AREA], [FLUTTER], [LAPLACIAN]

Setting Judgment Conditions

Tap [AUTO SET], and turn [ON] the auto settings function.

Tap [MARGIN] and set the margin rate to add to the judgment threshold.

Setting range: LC, RC, FLUTTER, LAPLACIAN: 0.00% to 999.99% (resolution: 0.01%)

AREA, DIFF AREA: 0.00% to 99.99% (resolution: 0.01%)

Discharge Judgments (When Incorporating Model ST9000)

5.4 Discharge Judgments (When Incorporating Model ST9000)

Noise manifesting at a xed level in the overall waveform among the high-frequency components manifesting in the test waveform is eliminated, and only the amount of the partial discharge components manifesting locally are sampled and judged. Discharge judgments are enabled only when the Model ST9000 Discharge Detection Upgrade (optional when shipped from factory) has been incorporated.

IMPORTANT

Discharge detection upgrade eliminates simple noise such as utter and Laplacian operations that are difcult to separate using primary and secondary differential operations using ltering. This way, you can detect the partial discharge components with high precision.

Discharge judgment algorithm (when judgments are AUTO)

Test waveform

Test waveform HPF and standardization

processing

Compensation processing

Judgment processing

Discharge waveform

• The high-frequency discharge components of the test waveform are sampled by separating them from the vibration waveform components.

• Standardization components (In order to enable size comparison of the regular noise components)

Compensating the distortion part of the test waveform

The compensated standardization waveform is used to judge whether or not the max. deviation value has exceeded the threshold value (σ value).

using the standard deviation of the high-frequency

Green dotted line: Discharge judgment threshold value bar

Gray waveform: Discharge amount graph (Parts where the discharge amount exceeds the threshold value are displayed in red)

IMPORTANT

The Discharge Detection Upgrade calculates the internal coefcient, etc., used for judgments during voltage calibration. Consequently, make sure to set the discharge judgment method before implementing voltage calibration. If voltage calibration is not implemented, the discharge amount is not calculated even if the judgment setting is other than OFF.

Discharge Judgments (When Incorporating Model ST9000)

Discharge judgment methods [DISCHARGE]

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [DISCHARGE]

Tap [ENABLE], and turn [ON] the discharge judgment methods.

OFF Disables the Discharge Detection Upgrade.

FIXED Compares the amount of the discharge component of the master waveform and the amount of

the discharge component of the test waveform.

AUTO Calculates variations in the high-frequency component that appears in test waveforms as the

standard deviation (σ). Discharges will be detected based on whether the deviation exceeds a xed amount due to a sudden increase in the high-frequency component due to discharge.

IMPORTANT

If the discharge judgment method is AUTO, suitable ltering is automatically selected according the the response waveform of the conforming workpiece by implementing voltage calibration. The discharge judgment method AUTO has a higher discharge judgment performance than FIXED, so normally make sure to select the AUTO setting. If using a special workpiece that emits a greatly different response waveform than normal, it may be difcult to render judgments when the discharge judgment method is AUTO. In such cases, set the discharge judgment method to FIXED.

Setting Judgment Conditions

Discharge Judgments (When Incorporating Model ST9000)

Threshold value of the test waveform discharge amount over the master waveform discharge amount

When the judgment method is [FIXED]

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [DISCHARGE]

Tap [LIMIT].

Enter the threshold value of the test waveform discharge amount over the master waveform

discharge amount.

Settings range: 0% to 999% (resolution: 1)

OFF Discharge amount operations are implemented, but judgments are not.

Tap [SET] to conrm.

IMPORTANT

• When the threshold value is 100%, the discharge amount has the same threshold value as the master waveform discharge value.

• When the threshold value is 200%, the discharge amount has double the threshold value of the master waveform discharge value.

Discharge Judgments (When Incorporating Model ST9000)

Deviation threshold value of the test waveform discharge amount

When the judgment method is [AUTO]

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [DISCHARGE]

Tap [LIMIT].

Enter the deviation threshold value of the test waveform discharge amount.

Setting range: 3σ to 100σ (resolution: 1)





C Sets to the default values.

OFF Discharge amount operations are implemented, but judgments are not.

IMPORTANT

• Individual points’ high-frequency components are standardized using the standard deviation of the entire waveform’ set thresholds for most workpieces.

• In the absence of any discharges, the deviation for the points will fall within a xed area.

• In the event of a discharge, the magnitude of the high-frequency component will increase during the

discharge, causing the deviation for that point to increase.

• The instrument automatically corrects internally for a certain amount of variation in workpiece L values and applied voltages.

• If a different type of workpiece is measured, or if the waveform changes for another reason, for example due to a short-circuit in the workpiece, the instrument may detect a discharge even though no discharge has occurred.

Increases by 1.

Decreases by 1.

s high-frequency component and converted to deviations. This process makes it unnecessary to

Setting Judgment Conditions

Discharge Judgments (When Incorporating Model ST9000)

Setting the discharge amount judgment area

Sets the extend of the the response waveform for the discharge judgment to target. Shorten the judgment area to reduce the operations time.

(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [DISCHARGE]

Set the end point for the judgment area.

Setting range: 1001 points to 8001 points (resolution: 1000 points)





IMPORTANT

Set the settings range so that the vibration waveform of the self-resonant area includes at least 4 periods. If the settings range is too narrow, the discharge judgment will always be FAIL.

Decreases by 1000.

Increases by 1000.

Implementing Tests

6.1 Overview

Calls the master waveform that has been set using test conditions settings mode, and tests the workpiece to be tested. The text results are output to the screen, communications, and external control terminal (EXT. I/O).

Operations owchart in test mode

In test mode, select the master waveform and implement the test, by using the operations procedure as shown in the diagram.

Test mode

[TEST]

Select the table to which the

master waveform to be used in

the tests was saved

[TABLE]

Implement the test

Check the test results

Finish

Implementing Tests

Overview

Screen conguration

Measurement screen

1 2

3 5 6 87

Graph display Displays the waveform graph and the LC and RC graph.

Menu icons [MODE]: “2.4 Select Measuring Mode” (p. 18)

[DISP] Switches the graph displayed onscreen.

Test conditions settings

display

[GRAPH] Sets the graph display.

[SCALE] Auto-scales the LC and RC graph.

Judgment results display Displays the judgment threshold value settings and the judgment

[SAVE] Saves the test results to USB memory.

Reference: “Graph display (display graph switching)” (p.

[TABLE]: “3.2 Current Table Selection” (p. [SYSTEM]: “9 System Settings” (p. [FILE]: “12 USB Host” (p.

[WAVE]: Waveform graph [LCRC]: LC and RC graph [WAVE&LCRC]: Waveform graph + LC and RC graph [RESULT]: Advanced judgment results display

Displays the settings for the applied voltage, number of pulses, and sampling frequency.

Reference: “8.6 Graph Display Settings” (p. 112)

Reference: “LC and RC graph scale settings” (p. 115)

results.

Reference: “12 USB Host” (p. 165)

165)

29)

125)

79)

Graph display (display graph switching)

Waveform graph display

Displays the waveform graph only.

Overview

1 4

2 3

Number of applied pulses and

peak voltage display

Waveform judgment area and

LC and RC values operation

range bar

Response waveform Yellow: Master waveform

Discharge judgment threshold

value bar

Discharge amount graph Discharge amount graph (Parts where the discharge amount

[P:XX/XX]: Number of pulses that have been applied/Total number of

pulses

[xxxV]: Max. peak voltage value of the response waveform

Blue: AREA judgment area Green: DIFF judgment area Purple FLUTTER judgment area Gray: LAPLACIAN judgment area Yellow (×2): LC and RC value operation areas

Blue: Test waveform (Failures are displayed in red)

Displays the discharge judgment threshold value.

exceeds the threshold value are displayed in red) Note: Displayed only if the Discharge Detection Upgrade is enabled. Reference: “5.4 Discharge Judgments (When Incorporating Model ST9000)” (p. 72)

Implementing Tests

Overview

LC and RC graph display

Displays only the LC and RC graph.

1 2

LC and RC graph Blue dots: Test LC and RC values (Failures displayed in red)

LC and RC cursor values [No.XXX, (XXX)]: Cursor value test number, (total number of LC and

IMPORTANT

Tap the LC and RC values on the graph while multiple pulses are applied, to move the cursor and check each LC and RC value.

Gray (solid): LC and RC values PASS judgment area

RC values)

[LC]/[RC]: LC and RC values presently selected by the cursor

Display waveform graph and the LC and RC graph

Displays the waveform graph and the LC and RC graph simultaneously.

Overview

Implementing Tests

Overview

Expanded judgment results

Expands and displays the judgment results.

21 3 4

Tap the LC and RC values judgments area to check the LC and RC values for each pulse.

Judgment settings Displays the set values of the judgment functions.

Total judgment results Displays the total judgment results.

Judgment values Displays the judgment operation values of the judgment functions.

Judgment results Displays the judgment results of the judgment functions.

Instrument status display and error display

Overview

1 2 3

Present measurement

mode display

Current table display Displays the number and table name of the table presently being used.

Information saved to

internal memory Communications

interface settings display Voltage calibration status

display

Test status display Displays the test status. Reference: “14.3 Error Display” (p. 214)

USB memory status

display

Double action status

display

Interlock status display

Communications status

display

Date and time display Displays the date and time that has been set in the instrument.

6 7 9 10 118

Displays the settings for the communications interface presently being used.

(Gray) (Blue) (Red)

(No display) (Green) (Gray)

Note: The background is displayed in red while writing to the settings internal memory.

(No display) (Red) (Gray)

Voltage application disabled mode Test conditions settings mode Test mode BDV mode

Number of data saved to internal memory

Voltage calibration not implemented (Master waveform not acquired)

Voltage calibration implemented (Master waveform acquired)

USB memory not connected USB memory connecting Accessing USB Double action function OFF

START button enabled START button disabled

Interlock function OFF Interlock engaged Interlock canceled Remote status Local status

Implementing Tests

Checking Test Start and Test Results

6.2 Checking Test Start and Test Results

Press the instrument START button to implement the test. (You can start the test from either

communications or external control terminal as well.) When a test nishes, the test results are output to the screen and external control terminal (EXT.I/O). Test results can also be acquired using communications. See “6.1 Overview” (p. 77) for the display details of the test results onscreen.

CAUTION

If the OUTPUT lamp is red, do not touch the test lead clip or workpiece. There is no adverse impact on the human body but electric shock will occur.

PASS judgment example

FAIL judgment example

Total judgment results

Judgment results

Total judgment results

Judgment results

IMPORTANT

To cancel a test that is underway, press the STOP button.

Break down voltage test (BDV)

7.1 Overview

Implement the test while gradually increasing the voltage applied to the test object, and evaluate the voltage at which the insulation starts to break down from the waveform LC and RC values, discharge amount, and waveform surface area, etc.

Operations owchart in break down voltage test mode

Break down voltage test mode evaluates the break down voltage, by using the operations procedure as shown in the diagram.

BDV mode

[BDV]

Set the test conditions.

[OUTPUT]

Set the judgment conditions.

[JUDGE]

Implement the test.

[START]

Check the break down voltage.

Finish

Break down voltage test (BDV)

Overview

Screen conguration

Measurement screen

1 2

3 654

Graph display Displays the waveform graph and the LC and RC graph.

Menu icons [MODE]: “2.4 Select Measuring Mode” (p. 18)

[GRAPH] Sets the graph display.

Test conditions settings

display

Judgment results display Displays the test results and the individual judgment results.

[SAVE] Saves the test results to USB memory.

Reference: “Graph display (display graph switching)” (p.

[OUTPUT]: “7.3 Setting the Test Conditions” (p. [JUDGE]: “7.4 Setting Insulation Break down Judgment Conditions”

(p. 95)

[SYSTEM]: “9 System Settings” (p. [FILE]: “12 USB Host” (p.

Reference: “8.6 Graph Display Settings” (p.

Displays the settings for application start voltage, max. voltage, and voltage rise width.

Reference: “7.2 Checking Test Start and Test Results” (p. 89)

Reference: “12 USB Host” (p. 165)

165)

125)

112)

37)

90)

Graph display

1 52 3 4 6

Overview

Number of steps, number

of applied pulses, and peak voltage value display

Response waveform Blue: PASS waveform

Discharge judgment threshold

value bar

Discharge amount graph Discharge amount graph (Parts where the discharge amount

LC and RC cursor values [No.XXX, (XXX)]: Cursor value test number, (total number of LC and

LC and RC graph Blue dots: Test LC and RC values

IMPORTANT

Tap the LC and RC values on the graph to move the cursor and check each LC and RC value.

[S:X/X]: Present number of steps/total number of steps [P:X/X]: Present number of pulse applications/total number of pulses [xxxxV]: Response waveform peak voltage

Red: FAIL waveform

Discharge judgment threshold value

exceeds the threshold value are displayed in red)

RC values)

[LC]/[RC]: LC and RC values presently selected by the cursor

Break down voltage test (BDV)

Overview

Instrument status display and error display

1 2

3 4 6 7 85

Present measurement

mode display

Communications

interface settings display Test status display Displays the test status. Reference: “14.3 Error Display” (p. 214)

USB memory status

display

Double action status

display

Interlock status display

Communications status

display

Date and time display Displays the date and time that has been set in the instrument.

Displays the settings for the communications interface presently being used.

(Gray)

(Blue)

(Red)

(No display) (Green) (Gray)

(No display)

(Red)

(Gray)

Note: The background is displayed in red while writing to the settings internal memory.

Voltage application disabled mode

Test conditions settings mode

Test mode

BDV mode

USB memory not connected

USB memory connecting

Accessing USB

Double action function OFF

START button enabled START button disabled

Interlock function OFF

Interlock engaged

Interlock canceled

Remote status

Local status

Checking Test Start and Test Results

7.2 Checking Test Start and Test Results

Press the instrument START button to implement the test. (You can start the test from either

communications or external control terminal as well.) When a test nishes, the test results are output to the screen, communications, and external control terminal (EXT. I/O).

IMPORTANT

If any of the judgment results are FAIL, it views that dielectric breakdown as having started and the test ends at that point in time. If the judgment results are all PASS, implement testing until max. voltage is reached.

PASS judgment example

FAIL judgment example (discharge FAIL at 2000 V)

Present applied voltage value

Total judgment results

Judgment results

Voltage value during breakdown judgment

Total judgment results

Break down voltage test (BDV)

Judgment results

*1: LCRC: XXσ Max. deviation of LC and RC values DCHG: XXσ Max. deviation of discharge amount AREA: XXσ Max. deviation of waveform surface area value Vpeak XX% Max. misalignment width from standard of the peak voltage value FREQ XX% Max. misalignment value from standard of the vibration frequency

Note: The values displayed are the judgment values and results of the present voltage values

Setting the Test Conditions

7.3 Setting the Test Conditions

Sets the application voltage, number of pulses applied per voltage, and the sampling frequency.

Applied voltage settings

Sets the start voltage, max. voltage, and voltage rise width. Evaluate the voltage at which isolation break down starts by implementing impulse tests while increasing the voltage for each voltage rise width from the application start voltage that has been set to the max. application voltage.

START

(Application start voltage)

END

(Max. applied voltage)

STEP

oltage rise width)

(Measurement screen) [MODE] > [BDV] > [OUTPUT]

Sets the application start voltage. Starts application from the set voltage. Settings range:

Sets the max. applied voltage. Implement tests while increasing the voltage to the set voltage. Settings range:

Note: If isolation break down is identied before the max. voltage is reached, the test ends at that time.

Sets the voltage rise width. Settings range:

1 2

ST4030: 100 V to 3300 V (resolution: 10 V)

ST4030A: 100 V to 4200 V (resolution: 10 V)

ST4030: 100 V to 3300 V (resolution: 10 V)

ST4030A: 100 V to 4200 V (resolution: 10 V)

ST4030: 10 V to 3200 V (resolution: 10 V)

ST4030A: 10 V to 4100 V (resolution: 10 V)

Tap [START], and set the start voltage.

Settings range: ST4030: 100 V to 3300 V (resolution: 10 V)

ST4030A: 100 V to 4200 V (resolution: 10 V)

Tap [END], and set the max. voltage.

Settings range: ST4030: 100 V to 3300 V (resolution: 10 V)

ST4030A: 100 V to 4200 V (resolution: 10 V)

Tap [STEP], and set the voltage rise width.

Settings range: ST4030: 10 V to 3200 V (resolution: 10 V)

ST4030A: 10 V to 4100 V (resolution: 10 V)

Setting the Test Conditions

Number of applied pulses settings

Sets the number of test pulses to be used in the tests and the number of degaussing pulse applications to eliminate magnetic elds from the workpiece. Reference: “4.3 Number of Applied Pulses” (p. 42)

PULSE NUM

(Number of test pulses applied)

DEGAUSS

(Number of degaussing pulses applied)

PERIOD

(Pulse application interval)

There can be up to 32 test voltage steps max. If the voltage rise width setting is small, the test will end when 32 steps have been completed even if the max. application voltage has not been reached.

(Measurement screen) [MODE] > [BDV] > [OUTPUT]

Sets the number of test pulses to be applied. The test pulses are applied continuously for the number of times that have been set respectively in each voltage step.

Sets the number of degaussing pulses to be applied. Degaussing pulses are applied continuously for the number of times set at the start of BDV testing. (Degaussing pulse waveforms are not sampled or judged.)

Tap [PULSE].

Set the number of test pulses to be applied.

Setting range: 3 to 32





C Sets to the default values.

Set the number of degaussing pulses to be applied.

Setting range: 0 to 10

Tap [Period], and set the pulse application interval.

Setting range: 0.050 s to 1.000 s (resolution: 0.001 s)

Increases by 1.

Decreases by 1.

Break down voltage test (BDV)

Setting the Test Conditions

IMPORTANT

Since statistical values are used in the calculation of discharge judgments, reducing the number of pulse applications will increase the magnitude of errors and may result in erroneous judgments. If you encounter this issue, either increase the LCRC and AREA judgment thresholds or set judgment to “OFF.”

Setting the Test Conditions

Setting the sampling frequency and number of sampling data

Sets the voltage sampling frequency and the number of sampling data to be imported to the instrument.

Sets the voltage sampling frequency.

SAMPLING

(Sampling frequency)

RECORD LENGTH

(Number of sampling data)

If a sufciently long response waveform cannot be imported because the response waveform vibration period is long, you can extend the waveform to be imported by extending the sampling frequency.

Sets the number of sampling data to be imported to the instrument. If there are vibration waveform parts that are unnecessary for judgment at the end of the waveform after the sampling frequency has been adjusted and the waveform length decided, you can adjust so as to exclude the unnecessary waveform parts by reducing the number of sampling data.

AUTO SET

(Automatic settings function for range of waveform acquisition)

Reference: “4.4 Sampling Frequency/Number of Sampling Data” (p. 44)

(Measurement screen) [MODE] > [BDV] > [OUTPUT]

This function automatically adjusts and sets the sampling frequency and number of sampling data during voltage calibration so that the waveform acquisition range is optimal.

Break down voltage test (BDV)

Tap [SAMPLING].

Set the sampling frequency.

Setting range: 10 MHz, 20 MHz, 50 MHz, 100 MHz, 200 MHz





Set the number of sampling data.

Setting range: 1001 points to 8001 points (resolution: 1000 points)

Increases by 1.

Decreases by 1.

Hioki ST4030, ST4030A Users guide

Specifications and Main Features

Frequently Asked Questions

User Manual