HIOKI RM3543, RM3543-01 User manual

Instruction Manual
RM3543
RM3543-01
RESISTANCE HiTESTER
September 2013 Revised edition 2 RM3543A981-02 13-09H
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Contents
Contents
1
Task-Oriented Reference...............................1
Measurement Flow.........................................2
Introduction.....................................................3
Verifying Package Contents...........................3
Safety Information..........................................5
Operating Precautions....................................7
Decide According to Upper/Lower Thresholds
(ABS Mode) ............................................. 37
3.8 Confirming Faulty Measurements ......38
Chapter 4 Customizing
2 3
Measurement Settings 41
Chapter 1 Overview 11
1.1 Product Overview and Features ........11
Block Diagram ..........................................14
1.2 Names and Functions of Parts ...........15
1.3 Screen Organization ..........................17
Chapter 2 Measurement
Preparations 21
2.1 Connecting the Power Cord............... 22
2.2 Connecting Measurement Cables and
Test Fixtures ......................................23
Making Your Own Measurement Cables ..24
2.3 Turning the Power On and Off ...........26
Chapter 3 Measurement
Settings (Basic Measurements) 27
3.1 Pre-Operation Inspection ...................27
3.2 Switching 100 m range Measurement
Currents .............................................28
3.3 Setting the Measurement Speed .......29
3.4 Setting Measurement Start Conditions
(Trigger Source) .................................30
3.5 Selecting the Measurement Range ....31
3.6 Zero Adjustment .................................32
3.7 Judging Measured Values
(Comparator Function) .......................34
Enabling and Disabling the Comparator
Function .................................... ................35
Decide According to Reference Value and
Tolerance (REF% Mode) ..........................35
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4.1 Making Range-Specific Measurement
Settings ..............................................41
4.2 Setting Pre-Measurement Delay ........42
4.3 Correcting Measured Values
(Scaling Function) ..............................44
4.4 Setting the Measurement Integration
Time Option ........................................46
4.5 Stabilizing Measured Values
(Averaging Function) ..........................48
4.6 Checking for Poor or Improper Contact
(Contact Check Function) ...................49
4.7 Improving Probe Contact
(Contact Improver Function) ...............50
4.8 Detecting Measurement Voltage Faults
(Voltage Level Monitor Function) .......52
4.9 Applying Current Only When Measuring
(Current Mode Setting) .......................53
4.10 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)
............................................................54
4.11 Comparing the Measurement Settings of Two Instruments
(Settings Monitor Function)................ 56
4.12 Retrying Measurement After a Fault
(Retry Function) ..................................59
4.13 Maintaining Measurement Precision
(Self-Calibration) ................................60
4.14 Compensating for Thermal EMF Offset (Offset Voltage Compensation - OVC) 61
Chapter 5 System Settings 63
5.1 Disabling and Enabling Key Operations
...........................................................63
Disabling Key Operations
(Key-Lock Function) ................................. 63
4 5
ii
Contents
Re-Enabling Key Operations
(Key-Lock Cancel) ................................... 64
5.2 Setting the Comparator Decision and
Key Beepers .......................................65
Enabling or Disabling the Key Beeper ..... 65
Setting the Comparator Decision (“JUDGE”)
Beeper ..................................................... 66
5.3 Power Line Frequency Manual Setting
...........................................................67
5.4 Setting the Clock ................................68
5.5 Adjusting Screen Contrast ..................69
5.6 Adjusting the Backlight .......................70
5.7 Initializing (Reset) ...............................71
Signal Descriptions .................................. 91
8.2 Timing Chart ......................................92
8.3 Internal Circuitry .................................94
Electrical Specifications ........................... 95
Connection Examples ............... ... ...... ... ... 96
8.4 External I/O Settings .......................... 97
Setting End-of-Measurement Signal Output
Signal Setting) ............................... 97
(EOM
Setting the Trigger (TRIG) Signal Logic ... 98
8.5 External Control Q&A ........................99
8.6 Supplied Connector Assembly .........100
Default Settings ........................................ 72
Chapter 9 Communications
(RS-232C/ GP-IB
Chapter 6 Storing and
Exporting Data 73
6.1 Storing Data at Specific Times
(Data Memory Function) .....................74
6.2 Store as soon as Measurement is Stable
(Auto-Memory Function) ....................75
6.3 Performing Statistical Calculations on
Measured Values ...............................78
Using Statistical Calculations ................... 79
Confirming, Printing, and Erasing Calculation
Results ..................................................... 80
6.4 Auto-Exporting Measured Values (at End of Measurement) (Data Output Function)
............................................................81
Chapter 7 Printing 83
7.1 Connecting the Printer ........................83
Connecting the Printer to the Instrument . 84
7.2 Instrument Settings ............................85
7.3 Printing ...............................................86
Printing Measured Values and Comparator
Decisions ................................................. 86
Printing Statistical Calculation Results ..... 86
Chapter 8 External Control 89
8.1 External Input/Output Connector
and Signals......................................... 89
Connector Type and Signal Pinouts ........ 90
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9.1 Overview and Features ....................101
9.2 Specifications ...................................102
9.3 Connecting .......................................103
Using the RS-232C Interface .................103
Using the GP-IB Interface
(RM3543-01 only) .................................. 104
9.4 Configuring the Communications
Protocol ............................................105
Configuring RS-232C Interface
Communications .................................... 105
Configuring GP-IB Interface Communications
(RM3543-01 only) .................................. 106
Select the Measurement Data Transmission
Format (both RS-232C and GP-IB) ........ 107
9.5 Communication Methods ................. 108
To cancel the Remote state
(enter the local state) ............................. 108
Message Format .................................... 109
Output Queue and Input Buffer .... ... ... ... . 112
Status Byte Register .............................. 113
Event Registers ......................................115
Initialization Items ................................... 118
Command Execution Time ..................... 119
Errors During Communications .... ... ... ... . 119
9.6 Message List ....................................120
Standard Commands ............................. 120
Device-Specific Commands ................... 121
9.7 Message Reference .........................126
Message Reference Interpretation ......... 126
Standard Commands ............................. 127
Device-Specific Commands ................... 131
9.8 Data Exporting Methods .................. 152
Interface) 101
9.9 Sample Programs ............................154
Using Visual Basic 5.0 or 6.0 ..................154
Creation Procedure (Visual Basic 2005) .164Sample Programs (Visual Basic 2005) ...166
9.10 Device Compliance Statement......... 168
Chapter 10Specifications 171
Chapter 11Maintenance and
Service 183
11.1 Troubleshooting ...............................183
Inspection and Repair .............................183
11.2 Cleaning ........................................... 184
11.3 Error Displays and Remedies ..........185
11.4 Disposing of the Instrument .............187
Removing the Lithium Battery .................187
iii
Contents
6
Appendix A 1
Appendix 1Four-Terminal (Voltage-Drop)
Method......................................A 1
Appendix 2Effect of Thermal emf ...............A 2
Appendix 3Unstable Measurement Values.A 3
Appendix 4Effects of Probing .....................A 9
Appendix 5Rack Mounting........................A 11
Appendix 6Dimensional Diagram .............A 13
Appendix 7Calibration...............................A 14
Appendix 8Adjustment Procedure............A 16
Appendix 9Table of Commands Compatible
with the ADEX AX-1152D.......A 17
Appendix 10Zero Adjustment....................A 19
Index Index 1
7 8 9 10 11 12
Appendix
Index
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Task-Oriented Reference

Setting the measurement speed (p. 29)
Setting the averaging function (p. 48)
1
Task-Oriented Reference
To minimize measurement error
To judge measurement results
To correct faulty measurements
Setting the measurement speed integration time option (p. 46)
Correcting measured values (p. 44)
Zero-adjustment (p. 32)
Judge measured values (comparator function) (p. 34) Compare the measurement settings of two instruments
(Settings Monitor function) (p. 56)
Confirm faulty measurement (p. 38)
Improve probe contact (Contact Improver function) (p. 50) Test for short-circuited probe (probe short-circuit detection
function) (p. 54) Compare the measurement settings of two instruments
(Settings Monitor function) (p. 56)
To automatically store measured values
To print measurement results Printing (p. 83)
To measure by PLC connection
(PLC: Programmable Logic Controller)
To connect to a computer Communications (RS-232C/GP-IB interface) (p. 101)
To automatically send measure­ment data to a computer
(RS-232C interface only)
To check operation
Store as soon as measurement is stable (Auto Memory function) (p. 75)
External control (p. 89)
Communications (RS-232C/GP-IB interface) (p. 101)
Export measurement values automatically (when finished measuring) (p. 81)
Setting Measurement Start Conditions (Trigger Source) (p. 30) Internal trigger (INT)
Calibration (p. A14)
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2
Computer communications (p. 101)
Printing (p. 83)
External control (p. 89)
EXT I/O
RS-232C
GP-IB
Compare the settings of two instruments (p. 56)
SET MONITOR
Connecting the Power Cord (p. 22)
Turn the power on (p. 26)
Connect (p. 21)
Install (p. 7)
Connect the measurement cables (p. 23)
Set measurement
conditions (as needed)
Confirm the screen confi guration (p. 17)
Confirm the initial setup (p. 72)
Basic Settings (p. 27)
Configure settings for your
specific conditions (p. 41)
System-related settings
(p. 63)
When changing settings
Change basic settings such as measurement speed
Change to detailed settings (measurement conditions and system-related)
Set decision criteria
(p. 34)
Data transmission (p. 81) Printing (p. 83)
Computer communications
(p. 101)
External control (p. 89)
Statistical calculations
(p. 78)
Instrument interface settings must be configured before printing or using communications or remote control.
Turn the power off (p. 26)

Measurement Flow

Measurement Flow
Be sure to read the "Operating Precautions " (p. 7) b efore us e.
Installing, Connecting and Turning On
Settings
Calculation, Printing, Communication, and External Control Settings
When Finished
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Introduction

When you receive the instrument, inspect it carefully to ensure that no damage occurred during ship­ping. In particular, check the accessories, panel switches, and connectors. If damage is evident, or if it fails to operate according to the specifications, contact your dealer or Hioki representative.
Confirm that these contents are provide d.
Model RM3543 or
RM3543-01 (with GP-IB included)......... ... ...1
Power Cord (2-line + ground)(p. 22)EXT I/O Male Connector (p. 100)
Instruction Manual (This document)............ 1
Operation Guide.......................................... 1
Thank you for purchasing the HIOKI Model RM3543/ RM3543-01 Resistance HiTester. To obtain maximum performance from the instrument, please read this manual first, and keep it handy for future reference.
Model RM3543-01 is the same as the RM3543, but with GP-IB included.
Registered trademarks
Windows and Visual Basic are registered trademark of Microsoft Corporation in the United States and/or other countries.

Verifying Package Contents

Inspection
3
Introduction
Content confirmation
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4
Measurement Probes and Fixtures
(connect to measurement jacks)
Model 9140 4-terminal Probe
Model 9500 4-terminal Probe
Model 9262 Test Fixture
Model 9263 SMD Test Fixture
Alligator-clip-type measurement probes. These general-purpose dual-electrode clips fit a wide range of conductor thicknesses.
Rubber-sheathed alligator-clip­type measurement probes. This design is ideal for 4-terminal­pair resistance measurement applications, for example mea­suring standard resistors
This fixture is for measuring lead components. (less than 10 m residual resistance after zero adjustment)
This fixture is for measuring chip components. (less than 10 m residual resistance after zero adjustment)
Interface Cables
Model 9637 RS-232C Cable
(9-pin to 9-pin/ crossover cable)
Model 9638 RS-232C Cable
(9-pin to 25-pin/ crossover cable)
Model 9151-02 GP-IB Connector Cable (2m)
Verifying Package Contents
Options
Contact your dealer or Hioki representative for details.
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5

Safety Information

Safety Information
This instrument is designed to comply with IEC 61010 Safety S t andards , and has b een thoroughly tested for safety prior to shipment. However, mishandling during use could result in injury or death, as well as damage to the instrument. Using the instru­ment in a way not described in this manual may negate the provided safety features. Be certain that you understand the instructions and precautions in the manual before use. We disclaim any responsibility for accidents or injuries not resulting directly from instrument defects.
This manual contains information and warnings essential for safe operation of the instrument and for main­taining it in safe operating condition. Before using it, be sure to carefully read the following safety precautions.
Safety Symbols
In the manual, the symbol indicates particularly important information that the user should read before using the instrument.
The symbol printed on the instrument indicates that the user should refer to a corresponding topic in the manual (marked with the symbol) before usi ng the relevant function.
Indicates AC (Alternating Current).
The following symbols in this manual indicate the relative importance of cautions and warnings.
Indicates that incorrect operation presents a significant hazard th at could result in serious injury or death to the user.
Indicates that incorrect operation presents a possibility of injury to the user or dama ge to the instru­ment.
Indicates advisory items related to performance or correct operation of the instru ment.
Symbols for Various Standards
This symbol indicates that the product conforms to regulations set out by the EC Directive.
WEEE marking: This symbol indicates that the electrical and electronic appliance is put on the EU market after August 13, 2005, and producers of the Member States are required to display it on the appliance under Arti­cle 11.2 of Directive 2002/96/EC (WEEE).
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6
Safety Information
Other Symbols
Indicates a prohibited action.
(p. )
*
[ ] SET
(Bold characters)
Unless otherwise specified, “Windows” represents Windows 95, 98, Me, Widows NT4.0, Windows 2000, Windows XP, or Windows Vista.
Click: Press and quickly release the left button of the mouse. Double click: Quickly click the left button of the mouse twice.
Indicates the location of reference information. Indicates that descriptive information is provided below. Square brackets indicate instrument display labels (such as setting item names).
Bold characters within the text indicate operating key labels.
Accuracy
We define measurement tolera nces in terms of f.s. (full scale), rdg. (reading) and dgt. (digit) values, with the following mean­ings.
f.s. (maximum display value)
The maximum displayable value. This is usually the name of the currently selected range.
rdg. (reading or displayed value)
The value currently being measured and indicated on the measuring instrument.
dgt. (resolution)
The smallest displayable unit on a digital measuring instrument, i.e., the input value that causes the digital display to show a “1” as the least-significant digit.
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Operating Precautions

The instrument can be used with the stand (p. 16). It can also be rack-mounted. (p. A11).
50 mm or more
10 mm or more
Rear
50 mm or more
Unplugging the power cord kills power to the instrument. Be sure to provide enough unobstructed space to unplug the power cord immediately in an emergency.
Follow these precautions to ensure safe operation and to obtain the full benefits of the various functions.
Preliminary Checks
• Before using the instrument for the first time, verify that it operates normally to ensure that no damage occurred during storage or shipping. If you find any damage, contact your dealer or Hioki representative.
• Before using the instrument make sure that the insulation on the powe r co rd is unda mag ed and that no bare conductors are improp erly exposed. Using the instru ment in such condi­tions could cause an electric shock, so contact your dealer or Hioki representative for repair.
• Before using the instrument, make sure that the insulation on the measurement cables is undamaged and that no bare metal is improperly exposed. If there is any damage, mea­sured values may be unstable and measurement errors may occur.
7
Operating Precautions
Instrument Installation
Storage temperature and humidity : -10°C to 50°C at 80% RH or less (non-condensating) Operating temperature and humidity : 0 to 40°C at 80% RH or less (non-condensating)
Avoid the following locations that could cause an accident or damage to the instrument.
Installation Precautions
Exposed to direct sunlight Exposed to high tempera­ture
Exposed to water, oil, other chemicals, or solvents Exposed to high humidity or condensation
Exposed to high levels of particulate dust
Subject to vibration
In the presence of corrosive or ex­plosive gases
Exposed to strong electromag­netic fields Near electromagnetic radiators
Near induction heating systems (e.g., high-frequency induction heating systems and IH cooking utensils)
• The instrument should be operated only with the bottom downwards.
• Do not place the instrument on an unstable or slanted surfa ce.
Vents must not be obstructed.
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Operating Precautions
Handling the Instrument
Do not allow the instrument to get wet, and do not take measurements with wet
hands. This may cause an electric shock.
Do not attempt to modify, disassemble or repair the instrument; as fire, electric
shock and injury could result.
To avoid damage to the instrument, protect it from physical shock when transporting and handling. Be especially careful to avoid physical shock from dropping.
This instrument may cause interference if used in residential areas. Such use must be avoided unless the user takes special measures to redu ce electromagnetic emissions to p re­vent interference to the reception of radio and television broadcasts.
Handling the Cords and Probes
• Avoid stepping on or pinching cables, which could damage the cable insulation.
• To avoid breaking the cables, do not bend or pull them.
• To avoid damaging the power cord, grasp the plug, not the cord, when unplugging it from the power outlet.
• When disconnecting the BNC connector, be sure to release the lock before pulling off the connector. Forcibly pulling the connector without releasing the lock, or pulling on the cable, can damage the connector (p. 23).
• Use only the specified connection cables. Using a non-specified cable may result in incor­rect measurements due to poor connection or other reasons.
• Before using a test fixture, read the instructions provided with it.
Before Turning Power On
Before turning the instrument on, make sure the supply voltage matches that indi­cated on its power connecto r. Connection to an improper supply vo ltage may damage the instrument and present an electrical hazard.
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Before Connecting EXT I/O
To avoid electric shock or damage to the equipment, always observe the following precautions when connecting to the EXT I/O connector.
Always turn off the power to the instrument and to any devices to be connected
before making connections.
Be careful to avoid exceeding the ratings of external terminals (p. 95).
During operation, a wire becoming dislocated and contacting another conductive
object can be serious hazard. Use screws to secure the external connectors.
Ensure that devices and syste ms to be connected to the EXT I/O ter minals ar e prop-
erly isolated.
The ISO_5V pin of the EXT I/O connector is a 5 V power output, and the ISO_12V pin
is a 12 V power output. Do not apply external power to this pin.
To avoid damage to the instrument, observe the following cautions:
• Do not apply voltage or current to the EXT I/O terminals that exceeds their ratings.
• When driving relays, be sure to install diodes to absorb counter-electromotive force.
• Be careful not to short-circuit ISO_5V to ISO_COM.
• Be careful not to short-circuit ISO_12V to ISO_COM.
• Do not draw loads from ISO_5V and ISO_12V at the same time.
See: "Connector Type and Signal Pinouts" (p. 90)
9
Operating Precautions
Before Measuring
• Do not apply any voltage to the measurement jacks. Doing so could damage the instru­ment.
• Never attempt to measure at a point wher e voltage is pr esent. In particular, do not measure a transformer or motor immediately after a temperature increase test or withstand-voltage test, as the instrument could be damaged by induced voltage or residual charge.
• Battery internal resistance cannot be measured with this instrument. It will sustain damage. To measure battery internal re sistance, we recommend the HIOKI 3554, 3555, BT35 62, BT3563, and 3561 Battery HiTesters.
• To obtain the guaranteed measurement accuracy, allow at least 30 minutes warm-up.
• The instrument internally retains all settings (but not measured values), such as measure­ment range and comparator settings. However, measurement settings made through the RS-232C or GP-IB interface are not memorized.
• The DC resistance of a power transformer cannot be measured. Do not measure objects with a large L (100 H or higher in the 10 m to 100 range, or 10 H or higher in the 1,000 range), such as choke coils and other inductors. In such cases, contact your dealer or Hioki representative.
• You may be unable to obtain accurate measured values when there is a capacitance com­ponent in parallel with the measurement target. For this instrument, any parallel capaci­tance component should be limited to a maximum of 1,000 pF.
• Carefully insulate all H cannot be performed and an error will occur if core and shield wires touch.
• During measurement, a transient current equal to about 1.5 times the steady-state current will flow for several microseconds (or about 10 mApk in the 1 k range). Exercise special care when measuring targets whose characteristics are prone to vary.
CUR
, H
POT
, L
POT
, and L
wiring. Proper 4-terminal measurements
CUR
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1.1 Product Overview and Features

The Hioki RM3543 Resistance HiTester employs the 4-terminal method to quickly and accurately measure the DC resistance of components such as resistors and current sensing resistors. It includes advanced con­tact-check, comparator, and data output functions. The intuitive user interface and high noise immunity are ideal for use with taping machines and separators.
Resistance Measurement
The factory defaults (initial settings) are optimized for current sensing re­sistors measurements.
Interface Communications
Connect the instrument to a controller via the RS-232C or GP-IB interface to control measurement data acquisi­tion (p. 101).
Send Measurement Data and Calculation Results to a Printer
Use a commercially available print­er with a serial interface to print measured values and calculation results (p. 83).
Save and Output Measured Values
Measured values can be stored in internal memory (p. 73) Statistical calculations can be per­formed on the stored data, which can be transferred to a computer in batch form (however, stored data cannot be confirmed internally).
Judge Measured Values
Measured values are compared with a pre-specified referenc e value or thresholds, and the result is out­put externally and indicated by the COMP indicators (comparator func­tion, p. 34).
Connect a PLC or I/O Board
To control from a PLC, con­nect to the EXT I/O connec­tor. In addition to comparator results, various measurement anomaly signals can be out­put (p. 89).
Upper limit
Lower limit
Compare Two Instrument’s Setting Conditions
When measuring with two inter­connected instruments, settings are compared, and an alarm is output and measurement is inhib­ited if the settings differ (Settings Monitor function, p. 56).
Optional Hioki probes and fixtures are available to connect to the mea­surement jacks (BNC jacks, p. 4). Alternatively, commercially available cables such as 1.5D-2V coax can be used (p. 24).
Overview Chapter 1
1.1 Product Overview and Features
11
1
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12
Ultra Fast and Accurate Measurements Increase Productivity
The RM3543 is ideally suited for use in testing current sensing resistors, where there has been remarkable progress in lowering resistance values. Measurement from which the effects of thermal EMF are consistently eliminated (by the OVC function) yields a resolution of 0.01
 in the 10 m range.
Since measurement results are obtained by means of a PASS/FAIL judgment process with a resolution of
0.001%, the instrument can test resistors of 1 m and less at a high rate of speed. Thanks to proprietary ul­tra-fast, high-stability circuit technology, the RM3543 completes the sequence of contact improvement, measurement and contact check, and judgment out­put in just 1.6 ms.
Specially designed for current sens in g resis­tors
Thanks to its scaling function, the RM3543 can com­pensate for the difference between resistance values obtained at the time of mounting on the board and dur­ing testing. By using the averaging function during su­per-low-resistance measurement with a small detection voltage, it is possible to achieve even higher levels of accuracy.
Multiple Interfaces
EXT I/O is isolated from the measurement and control circuits to provide noise immunity (p. 89). All data can be acquired in real time using the built-in
38.4-kbps high-speed RS-232C interface. Connect the commercially available printer with a serial inter­face to print measured values and statistical calcula­tion results (p. 83). The GP-IB interface is available for Model RM3543-01 (specified when ordering, p. 101).
Clearly Visible Display and Intuitive Opera­tion
High-contrast LCD provides clear visibility, helping avoid setting mistakes. The optimum range is selected automatically when comparator thresholds are en­tered.
Auto Memory Function Convenient for Sam­pling Tests (p. 75)
The auto memory function is convenient for sampling tests after screen-printing. Measured values are auto­matically acquired as soon as they stabilize, and statis­tical calculations proceed until the specified quantity is obtained, upon which an alert notification (alarm) oc­curs. Selecting [PRINT] (screen display) prints mea­sured values and statistical calculation results (p. 86).
Fixtures for Component Measurements (p. 4)
The BNC-type measurement jacks exhibit good noise immunity. Ready availability and easy assembly en­sure smooth system setup. Various test fixtures are available for Hioki LCR HiTesters.
Features
High-Speed Data Output and Ample Memory
The Data Output function transfers measured data at 5 ms/sample, even via RS-232C. Up to 30,000 mea­surements can be stored, and all data can be exported at the end of measuring each reel. This function is ide­al for system setup, debugging and process manage ­ment.
1.1 Product Overview and Features
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Reliable Contact Checkin g (p. 49)
Contact checking (that was previously performed be­fore and after measuring) is now performed during mea­surement, so probe bounce and contact resistance fluctuations can be detected. Contact checking time can be shortened, improving tact times.
Features
Measurement Circuit Strongly Immune to Contact Resistance Fluctuations
The effects of contact resistance fluctuations are re­duced even when scattering occurs near the end of probe life. Such effects are minimized by the fast re­sponse of the measurement circuit.
Contact Improver Function (p. 50)
The Contact Improver function improves bad contacts between probes and test samples. Contacts errors are reduced by penetrating oxidation and impurities be­tween probes and samples. Reducing contact errors can increase productivity and quality. The intensity of the contact improver function can be adjusted accord­ing to probe type.
Reject Faulty Data – Voltage Level Monitor Function (p. 52)
When the contact resistance of the H
CUR
and L
CUR
leads fluctuates, the measurement current changes momentarily. Such momentary changes are not detect­able by typical contact checking. The Voltage Level Monitor function detects a contact error if the detection voltage changes significantly, which can increase the reliability of measured values.
Minimize Human Error and Risk – the Settings Monitor Function (p. 56)
If the settings of two instruments are different, trigger­ing is inhibited and an alarm notification is generated to avoid setting mistakes due to human error.
Reliable Four-Terminal Measurement – Probe Short-Circuit Detection Function (p. 54)
Four-terminal measurements are inhibited when a conductive foreign object is present between the POT and CUR probe tips. Short-circuit probe anoma­lies are detected by checking the resistance between these tips when not measuring.
Strong Electrical Noise Immunity
The specified measurement accuracy is achieved even with ±1.5 kV mixed pulse noise. The floating measurement section design is highly impervious to electrical noise, minimizing the effect on measured values even when turning large-induction motors on and off. The free-range power supply input (90 to 264 V) is practically unaffected by voltage fluctuations, so stable measurements are possible even in under poor power conditions.
Previously
Model RM3543
Contact Condition
Contact Check
Measuring
Probe Bounce
Contact Condition
Detection Voltage
Error
Good Contact
Poor Contact
Excessive detection voltage fluctuation error
Good Contact
ERROR
Measurement Status
Contact Check
Contact Condition Contact Improver
Function
Contact Improvement
Measuring
Checking
ONON
DUT
Foreign object
POT
CUR
DUT electrode
13
1.1 Product Overview and Features
1
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14
AB
C
D
E
F
G
H
I
E
D
1.1 Product Overview and Features

Block Diagram

Constant current (determined by the measurement range) is applied between the H
age is measured between the H voltage (B) by the constant current flow (A).
POT
and L
terminals. The resistance value is obtained by dividing the measured
POT
CUR
and L
terminals while volt-
CUR
The effects of large offset voltage such as from thermal emf are reduced by current flowing in the positive and negative
directions (A).
The constant current source (A) and voltmeter (B) circuit designs are largely unaffected by contact resistance.
Faulty measurement values caused by unstable or chattering contact conditions can be eliminated by monitoring (C)
the detection voltage (B) waveform (Volta ge Le ve l Mo ni to r fu nction).
Before measuring, the Contact Improver circuit (D) optimizes contact when the probes touch the DUT.
By also performing contact checking (E), short circuits between CUR and POT terminals caused by a clogged probe tip
can be detected (probe short-circuit detection function).
When measurement starts, the contact check circuit (E) and constant current monitor (F) are activated to monitor for
fault conditions while measuring. The dual-CPU (C and G) design provides ultra-high-speed measurements and fast system response.
Immunity from electrical noise is provided by isolation between the Measurement and Control blocks (H).
The auto-ranging 100-to-240 V switching power supply (I) can provide stable measurements even in poor power quality
environments.
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15
Display Screen
Monochrome graphical LCD There are three general screen types: Measurement, Basic Set­tings and Detailed Settings.
Screen Configurations (p. 17)
Judging measured values (p. 34)
(Comparator function) Set a reference value and range for judging measurements, which can be confirmed by the COMP indicators.
Select this to judge measured val­ues relative to a reference value and tolerance (%). The REF% set­ting display appears.
Press to judge measured values relative to upper/lower thresholds. The ABS setting display appears.
Setting
POWER Button
Turns the instrument on and off (p. 26).
Unlit: power off
(when no power supplied)
Red light: power off
(while power is supplied)
Green light: power on
Power On/Off
Entering numerical values
Enter a numerical value. (we call these the “tenkeys”)
Switches the sign of a numer­ical value.
Selects the unit of measure. Sets the tolerance values.
Deletes the value in the se­lected field.
Accepts the displayed com­parator threshold values.
Aborts comparator setting and returns to the previous display.
Measurement Terminals
Connect measurement cables or a fix­ture (p. 23).
H
CUR
jack: Current source terminal
H
POT
jack: Detected voltage high
terminal
L
POT
jack: Detected voltage low ter-
minal
L
CUR
jack: Measurement current
detected terminal
GUARD jack: Shield (measurement
ground) terminal
Connecting Probes
COMP indicator LEDs
Indicate the decision re­sult of the measured value (p. 34).
Hi Measured value is
above upper limit
IN Pass (meets crite-
ria)
Lo Measured value is
below lower limit
Viewing
Comparator
Results
Viewing Measured
Values and Settings
Audible Alarm (beeper)
Selecting the setting contents
(“the F keys”) F1 to F4 keys Selects the corresponding item on the right side of the display.
Cursor keys Move among the displayed setting items. The cursor location is indicat­ed by reverse characters.

1.2 Names and Functions of Parts

1.2 Names and Functions of Parts
Front Panel
1
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16
Manufacturer's Serial Number
Shows the serial number. Do not remove this label, as it is required for product support.
Connect the supplied power cord (p. 22).
Connecting the Power Cord
RS-232C Connector
The RS-232C interface can be used to connect to a PLC or computer (p. 101). It is also used by the commercially available printer with a serial interface (p. 83).
RS-232C Communications
Printer Output
GP-IB Connector (RM3543-01 only)
The GP-IB interface can be used to connect to a computer (p. 101).
GP-IB Communications
SET MONITOR Connector
Connect another RM3543 here to compare instru­ment settings (p. 56).
Compare Two Instruments’
Settings
EXT I/O Connector
Connect to a PLC or I/O board to control measurement start, and to acquire com­parator results (p. 89).
External Control
Bottom Panel
Stand
When using the stand
Extend the stand until it clicks into place. Make sure to extend both legs of the stand.
Collapsing the stand
Fold in the stand until it clicks into place.
This instrument can be rack mounted.
See: "Appendix 5 Rack Mounting" (p. A11)
Parts removed from this instrument should be stored in a safe place to enable future reuse.
Do not apply heavy downward pressure with the stand extended. The stand could be damaged.
1.2 Names and Functions of Parts
Rear Panel
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17
Detailed Settings Screens (p. 19)
Measurement Settings Screens [MEAS SETTINGS]
Data Settings Screens [DATA SETTINGS]
System Screens [SYSTEM]
Measurement Screen (p. 18)
Basic Settings Screen (p. 18)
Return to Previous Screen
Indicates a Continued Screen
Return to Previous Screen

1.3 Screen Organization

1.3 Screen Organization
The instrument has three general display screen types: Measurement, Basic Settings and Detailed Settings. Refer to "11.3 Error Displays and Remedies" (p. 185) for error displays.
The screen examples in this guide appear reversed (black on white) for best visibility on the printed page. However, the instrument screens can actually be displayed only as white characters on black background.
1
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18
Measurement Screen
This screen normally appears while measuring. View cur­rently measured values and measurement conditions. Some parts of the display depend on the comparator mode and other settings.
Measured Value
Settings Menu (corresponding to F keys)
Displayed contents depend on the curre nt function set­tings. Parentheses ( ) indicate the corresponding F-key
MENU (F1) Displays the Basic Settings screen PRINT (F2) Print (p. 85)
Appears only when the interface is set for the printer
ST AT (F3) Statistical calculation results (p. 78)
Appears only when statistical calcu­lation is enabled
NUMBER (F4) Set Auto-Memory number (quantity)
(p. 75) Displays the number of stored data
items and the number of passed and failed products at the lower left.
UNDO (F3) Deletes the previously stored mea-
surement and calculation result (only one can be deleted) (p. 80) Appears only when calculation re­sults are displayed
ALLCLR (F4) Clears all memory and calculation
(p. 80) Appears only when calculation re­sults are displayed
LOCAL (F1) Enables local control (p. 108) UNLOCK (F1) Cancels the key-lock state (hold 1s)
(p. 64)
Criteria Setting Values (p. 34) Displayed contents depend on the selected comparator mode. (Ex.: REF% mode)
To display the Basic Settings screen
Measurement Conditions
Shows current setting contents. Displayed contents de­pend on the current settings.
INT/ EXT Trigger source type (p. 30) Measurement range (p. 31) FAST/ MED/ SLOW Measurement speed (p. 29) 0ADJ/
OFF (not shown)
Appears only when zero-adjust is enabled (p. 32)
OVC/
OFF (not shown)
(OVC: Offset Voltage Compensa­tion) Appears only when OVC is en­abled (p. 61)
SC/
OFF (not shown)
Appears only when the scaling function is enabled (p. 44)
NUM Appears only when tenkey input is
enabled
RMT Remote control (p. 108) M.LOCK Disables all operations except
comparator settings (p. 63)
F.LOCK Disables all operations including
comparator settings (p. 63)
Basic Settings Screen
Make basic measurement condition settings on this screen. Measurement speed and range can be changed while viewing measured values. (Trigger source: INT)
TRG
Change trigger source (measurement start control method) (p. 30) When EXT triggering is enabled, [MANU] ap-
pears beside the F4 key (press to trigger measurement manually).
RANGE Change range (p. 31) SPEED Change measurement speed (p. 29) 0ADJ Turn zero-adjust on/off (p. 32) COMP Turn comparator on/off (p. 34) LOCK Enable/disable key lock (p. 63)
Select measurement condition settings Move with cursor keys.
Measurement condition setting selections
Return to previous screen
To display the [MEAS SETTINGS] screen To display the [DATA SETTINGS] screen To display the [SYSTEM] screen
MISC To display the Detailed Settings screen
1.3 Screen Organization
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19
Measurement Settings Screen [MEAS SETTINGS]
Shows detailed settings for measurements. Adjust the measurement speed, stability and measurement fault detection functions.
DELAY1 Adjust the delay from probing to trigger
input (p. 42)
DELAY2 Adjust measurement object electrical re-
sponse (p. 42)
SCALING(A*R+B) Correct measured values with the scal-
ing function (p. 44)
INT (FAST/ MED/ SLOW)
Make fine adjustment to integration time (p. 46)
AVERAGE Stabilize measured values with the aver-
aging function (p. 48)
CONT CHECK Contact check threshold setting (p. 49) CONT IMP Contact Improver function setting (p. 50) VOLT MONITOR Voltage level monitor function setting
(p. 52)
CURRENT MODE Current mode setting (p. 53)
Data Settings Screen (Save, Analysis, and Output) [DATA SETTINGS]
These are settings for memory and statistical calculation functions.
AUTO MEMORY Turn Auto-Memory on/off (p. 75) STATISTICS Statistical calculation on/off (p. 78) DATA OUT Automatically output measured values
(communications) (p. 81)
Detailed Settings Screens
1.3 Screen Organization
1
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20
Set instrument system-related settings on this screen.
SET MONITOR Turn two-instrument setting comparison
on/off (p. 56)
PROBE CHECK Turn probe short-circuit detection on/off
(p. 54)
RETRY Retry function setting (p. 59) TRIG EDGE (External I/O) Set trigger rising/falling
edge (p. 98)
EOM (External I/O) Set EOM (end-of-mea-
surement) signal (p. 97)
INTERFACE Communications interface settings
(p. 105)
100m CURR 100 m range measurement current set-
tings 100 mA/1 A (p. 28)
CALIBRATION Self-calibration operation settings (p. 60) JUDGE BEEP Comparator beeper settings (p. 66) KEY BEEP Key beeper on/off (p. 65) CLOCK (Y-M-D) Set internal clock (p. 68) LINE FREQ Set power source frequency (p. 67) CONTRAST Adjust screen contrast (p. 69) BACKLIGHT Adjust screen backlight (p. 70) RESET Initialize (p. 71) ADJUST Instrument Adjustment (p. A16)
System Screen [SYSTEM]
1.3 Screen Organization
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21
Install this instrument (p. 7)
1
Rear PaneFront Panel
Connect measurement cables (p. 23)
Turn the power on (p. 26)
5
Connect to the test sample When finished measuring, turn the
power off (p. 26).
Connect the external interface
(as needed)
4
• Using the printer (p. 83)
• Using the RS-232C or GP-IB interface (p. 101)
• Connecting to a PLC or I/O board (p. 89)
• Automatically comparing the settings of two instruments (Settings Monitor function) (p. 56)
Connect the power cord (p. 22)
2 3
2
3
4
5
Make instrument settings (p. 27)
6
Measurement
Preparations Chapter 2
Be sure to read the "Operating Precautions" (p.7) before installing and connecting this instrument. Refer to "Appendix 5 Rack Mounting" (p. A11) for rack mounting.
2
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22
Rear Panel
1 Confirm that the mains supply voltage matches the
instrument, and connect the power cord to the power inlet on the instrument.
2 Plug the power cord into the mains outlet.
The POWER button on the front panel lights red. In event of a power outage, operation resumes with the same
settings when power is restored (breaker reset, etc.).
Power inlet

2.1 Connecting the Power Cord

2.1 Connecting the Power Cord
Before turning the instrument on, make sure the supply voltage matches that indi-
cated on its power connector. Connection to an improper supply voltage may dam­age the instrument and present an electrical hazard.
To avoid electrical accidents and to maintain the safety specifications of this instru-
ment, connect the power cord only to a 3-contact (two-conductor + ground) outlet.
Before using the instrument, make sure that the insulation on the power cord is
undamaged and that no bare conductors are improperly exposed. Any damage could cause electric shock, so cont act your dealer or Hioki representative.
To avoid damaging the power cord, grasp the plug, not the cord, when unplugging it from th e power outlet.
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2.2 Connecting Measurement Cables and Test Fixtures

Example of defeated guard measurement
Connecting measurement cables
Connecting a fixture
Connect directly to the measurement jacks with the label side up, and affix with the levers on the left and right.
Connect the red plugs to the H
CUR
and H
POT
jacks, and the
black plugs to the L
CUR
and
L
POT
jacks.
Black plugs
Red plugs
BNC Jack Guide Pins (on the instrument)
Lock
BNC plug slots
2
1
Align the slots in the BNC plug with the guide pins on the jack on the instrument, then push and twist the plug clockwise until it locks. Disconnecting BNC connectors Push the BNC plug, twist it counterclock­wise, and pull it out.
Making your own probes and extenders (p. 24)
Connection Methods
2.2 Connecting Measurement Cables and Test Fixtures
23
Connect your measurement cables, optional Hioki probes or test fixture to the measurement jacks. Refer to "Options" (p.4) for details. See the instructions provided with the fixture for operating details.
• Do not apply a voltage to the measurement terminals. Doing so may damage the unit.
• When disconnecting the BNC connector, be sure to release the lock before pulling off the connector. Forcibly pulling the connector without releasing the lock, or pulling on the cable, can damage the connector.
• We recommend using optional Hioki fix­tures.
• Use the GUARD jack only for Faraday shield, and avoid more than 10 mA cur­rent flow. This jack is not for guarding network resistance measurements.
2
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24
Wiring Diagram
Before Wiring
See: "Appendix 3 Unstable Measurement Values" (p. A3)
• Twist together the H
POT
and L
POT
wires, and the H
CUR
and L
CUR
wires. If not twisted together, measured
values may be unstable, and errors may occur, when measuring with low resistance values.
• The phenomenon of induction becomes pronounced in the 10 m and 100 m ranges (when the mea­surement current is set to 1 A). Changes in the cab le p ositio n and co nfigur ation ma y cau se me asur ed va l­ues to vary. Exercise particular care so that the cable position and configuration do not change. Additionally, measurement cables and measurement targets should be kept as far as possible from metal­lic objects.
• When using two or more RM3543 units, do not group the wires from multiple instruments together. The "C.E. Volt" error display may be trigger ed by the phenomenon of induction.
• Refer to the block diagram (p. 14) for internal circuit details.
• Probes and measurement objects should be shielded at BNC or GUARD jack potential.
• Wiring resistance in excess of the following values may cause a current monitor error, making measure­ment impossible. When using measurement current 1 A ranges, keep the wiring resistance as well as the contact resistance between the DUT and probe low.
Range
10m 100m 100m 1000m 10 100 1000
Measurement Current
1 A 1 A 100 mA 100 mA 10 mA 10 mA 1 mA
Between H
CUR
and DUT
1 1 18 18 180 180 1.8 k
Between L
CUR
and DUT
1 1 8 8 80 80 800
2.2 Connecting Measurement Cables and Test Fixtures

Making Your Own Measurement Cables

Recommended Measurement Cable Specifications
Conductor resistance Capacitance 150 pF/m or less
Cable dielectric material
Connector insulating material
Length 2 m or less
Example: JIS standard 3C-2V, 1.5D-2V MIL standard RG-58A/U * Teflon is a registered trademark of E. I. du Pont de Nemours and Company.
500 m
/m or less
Polyethylene (PE), Teflon* (TFE), polyethylene foam (PEF) Insulation resistance at least 10 G
Teflon* (TFE), polybutylene terephtalate (PBT) Insulation resistance at least 10 G
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25
• Measurement cable length should not exceed 2 m (with con ductor re sist ance 5 00 m/m or less). Long
cables are more susceptible to noise, and measured values may be unstable.
• Extensions should maintain the four-terminal structure. If converted to a two-terminal circuit in the wir-
ing, correct measurement may not be possible due to the effects of wiring and contact resistance.
• Cables and measurement ob jects should be shielded.
• After extending measurement cables, confirm operation and accuracy ("Measurement Specifications"
(p.180)).
• If cutting the ends off of optional measurement cables, make sure that the shield does not touch the
center conductor of the H
CUR
, H
POT
, L
POT
and L
CUR
cables. Correct measurement is not possible with
a shorted cable.
• Do not twist wires from multiple units together.
Extending Measurement Cables
Observe the following when extending measurement cables:
2.2 Connecting Measurement Cables and Test Fixtures
2
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26
Press the POWER button (it lights green).
Self-test
Indicates an error (p. 185).
After Power-On
A self-test (instrument diagnostic routine) is performed. During the self-test, the following information is displayed while the hardware is verified.
Error
No Errors
Normal display (measurement screen)
The following information is displayed during self-testing:
Manufacturer and model name
Firmware versions (main, and measurement)
Communication setting
Line frequency setting

2.3 Turning the Power On and Off

2.3 Turning the Power On and Off
Turning Power On
When the power is turned on, the same setting as when the power was last turned off appears (backup function). When powered up for the first time, the default settings appear.
See: "Default Settings" (p.72)
Before Starting Measurement
To obtain precise measurements, provide about 30 minutes warm-up after turning power on. Measurement settings are recalled from when the power was previously turned off (settings backup). However, measurement settings made through the RS-232C or GP-IB interface are not retained, although they can be stored using the
Turning Power Off
Press the POWER button (it lights red when the instrument is off). Disconnect the power cord from the outlet to extinguish the POWER button light. When power is turned on again, operation resumes with the same settings as when last turned off.
If a power outage (e.g., breaker trip) occurs when the instrument is on, it will automatically turn on again when power is restored (without pressing the POWER button).
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:SYSTem:BACKup command (p. 139).
27
Do not use the instrument if damage is found, as electric shock or short-circuit accidents could result. Contact your dealer or Hioki representative.
Metal Exposed
Is the power cord insulation torn, or is any metal exposed?
1
Before using the instrument for the first time, verify that it operates normally to ensure that no dam­age occurred during storage or shipping. If you find any damage, contact your dealer or Hioki repre­sentative.
Peripheral Device Inspection
Is the insulation on a measurement cable torn, or is any metal exposed?
No Metal Exposed
If there is any damage, measured val­ues may be unstable and measure­ment errors may occur. Replace the cable with an undamaged one.
Metal Exposed
No Metal Exposed
If damage is evident, request repairs.
Yes
Is damage to the instrument evident?
Instrument Inspection
When turning power on
Does the self-test screen appear (model no., version no.)? (p. 26)
No
2
The power cord may be damaged, or the instrument may be damaged inter­nally. Request repairs.
Does the Measurement screen appear after self-test?
No
Yes
The instrument may be damaged inter­nally. Request repairs.
See: "11.1 Troubleshooting" (p. 183)
"11.3 Error Displays and Reme­dies" (p. 185)
An error indication occurs (ERR)
Yes
Inspection complete
Please read the "Operating Precautions" (p. 7) before use.

3.1 Pre-Operation Inspection

Measurement Settings (Basic Measurements)
Chapter 3
See "Measurement Flow" (p. 2) for an outline of the measurement process from preparation to end­of-measurement.
3.1 Pre-Operation Inspection
3
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28
Measurement Current: 100 mA
To achieve more precise measure­ment
Measurement Current: 1 A
To limit the effects of external noise
The Basic Settings screen appears.
1
The System screen appears. [SYSTEM]
Selection
2
Selection
1
2
100 mA (default) 1 A
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.
The confirmation screen appears.
3.2 Switching 100 m range Measurement Currents
3.2 Switching 100 m range Measurement Currents
The 100 m range measurement current can be switched between 100 mA and 1 A. The 100 mA setting (which is the factory default) allows measurement at a high level of precision. The 1 A setting can be used to provide better resistance to external noise.
See: "(5) DUT Becomes Warm" (p. A6)
(Example)If the resistance to be measured is 100 m
(Measurement Current) 100 mA 100 m × 0.12 = 1 mW 1 A 100 m
× 1
2
= 100 mW
Open the Basic Settings screen.
1
Open the System screen.
2
Select the 100 m range measurement current.
3
Return to the Measurement screen.
4
• The 100 m range measurement condition settings are configured separately for each measurement cur­rent. Consequently, the 100 m range measurement condition settings should be configured after first set­ting the measurement current.
• During measurement, a transient current equal to about 1.5 times the steady-state current will flow for sev-
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eral microseconds (or about 10 mApk in the 1 k range). Exercise special care when measuring targets whose characteristics are prone to vary.
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29
The Basic Settings screen appears.
1
Selection
2
See table below (default)
Press the up/down cur­sor keys to change the setting.

3.3 Setting the Measurement Speed

3.3 Setting the Measurement Speed
The measurement speed can be set to FAST, MED (medium), or SLOW. A slower measurement speed provides greater measurement precision, and a faster measurement speed results in greater susceptibility to environmental noise. Ensure that measurement cables and the sample are suffi­ciently shielded.
The averaging function can be used to further stabilize measured values. (p. 48)
Open the Basic Settings screen.
1
Select the measurement speed.
2
3
Return to the Measurement screen.
3
Relationship Between Measurement Range and Speed
(factory defaults)
Measurement Range
10m Average: 16 times
11 ms 17 ms
10m 100m
(1A)
100m (100mA)
2.0 ms 6.4 ms
1000m
10
1.6 ms 6.0 ms
1.6 ms 4.0 ms
100
1.6 ms 4.0 ms
1000
FAST MED SLOW
176 ms 272 ms
*1
5.0 ms 13 ms
3.8 ms 13 ms
752 ms 640 ms
47 ms 40 ms
43 ms 36 ms
43 ms 36 ms
41 ms 35 ms
41 ms 34 ms
41 ms 34 ms
41 ms 34 ms
Integration time can be optionally set for each range (p. 46). Upper value: for 50-Hz power line frequency Lower value: for 60-Hz power line frequency Tolerance:
(Without retry) *1 When performing external trigger measurement.
When performing internal trigger measurement, same as when averaging is off.
±10%±0.2 ms
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30
Trigger signals are automatically generated internally for continuous measurement.
Measure with internal (INT) triggering
To measure automatically
Measurements are triggered by an external signal. Manual measurement triggering is also available.
Apply a trigger signal at the EXT I/O connector (p. 89)
Send the TRG command by communications interface (p. 130)
Press F4 [MANU] (only appears when EXT is selected)
Measure with external (EXT) triggering
To measure at specific times To retain measured values
• When internal triggering is enabled, the EXT I/O TRIG signal and the “TRG” command are ignored (except for memory storage and statistical calculations).
• When using the internal trigger, the delay time (DELAY1) is obtained by adding 100 ms to the setting (to prevent heat generation).
• To measure samples such as inductors that require time to settle, adjust delay time DELAY2. Start with a long delay, and gradually shorten it while watching for the measured value to settle.
See: "4.2 Setting Pre-Measurement Delay" (p. 42)
• When external triggering is enabled, the Auto-Memory function is disabled by force.
The Basic Settings screen appears.
1
Selection
2
Internal trigger External trigger
(default)
Press F3 [EXT] to display the F4 [MANU] indicator. Press to trigger a measurement manually.
Press the up/down cursor keys to change the setting.

3.4 Setting Measurement Start Conditions (Trigger Source)

3.4 Setting Measurement Start Conditions (Trigger Source)
Measurements can be started in two ways.
Open the Basic Settings screen.
1
Select internal (INT) or external (EXT) triggering.
2
Continuous measurement (:INITIATE:CONTINUOUS ON) is the normal trigger state when operating from the front panel. Selecting the internal (INT) trigger source activates continuous triggering ("free-run"). When
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external (EXT) triggering is selected, each external trigger event initiates one measure ment. Continuous mea­surement can be disabled by sending the IB. When continuous measurement is disabled, trigger acceptance is controlled only by the host (computer or PLC).
See: for trigger command: "Triggering" (p. 142), "9.8 Data Exporting Methods" (p. 152)
Return to the Measurement screen.
3
:INITIATE:CONTINUOUS OFF command via RS-232C or GP-
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31
The Basic Settings screen appears.
1
Selection
2
Press the up/down cursor keys to change the setting.
Increments the range
Decrements the range

3.5 Selecting the Measurement Range

3.5 Selecting the Measurement Range
The measurement range can be set as follows. When making comparator settings with the panel keys, the measurement range is selected automatically according to the settings (reference/toler­ance or upper/lower thresholds, see the following table). When the comparator settin gs are made by remote control commands, the measurement range is unaffected.
Changing the Range
Measurement error is larger when measuring values nearer the bottom of a measurement range.
Auto-Ranging (when making comparator settings)
Reference (REF%) and Upper/Lower Threshold (ABS) Ranges
0 to 10.009 m 10 m
10.01 to 100.09 m 100 m
100.1 to 1000.9 m 1000 m
1.001 to 10.009 10 
10.01 to 100.09 100 
100.1 to 1200.0 1000 
Selected Range
3
Manual Range Selection
Open the Basic Settings screen.
1
Select the range.
2
10m, 100m, 1000m, 10, 100, 1000 (default)
Return to the Measurement screen.
3
• The measurement range is automatically selected when using the comparator function, but an OvrRng error may occur when the scaling function is on. If this occurs, set an appropriate range manually. For example, the 1,000 m range will be selected under the following conditions, but the measurement tar­get of 2 will result in an OvrRng error:
Measurement target: 2 Scaling compensation coefficient: 0.5 Displayed measured value: 1 Comparator reference value: 1
• During measurement, a transient current equal to about 1.5 times the steady-state current will flow for sev­eral microseconds (or about 10 mApk in the 1 k range). Exercise special care when measuring targets
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whose characteristics are prone to vary.
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32
The Basic Settings screen appears.
1
Selection
2
Internal trigger
Press the up/down cur­sor keys to change the setting.
1
Selection
2
Disable zero adjustment (cancel) Execute zero adjustment

3.6 Zero Adjustment

3.6 Zero Adjustment
When four-terminal measurement (Kelvin connection) is impractical such as when measuring very small samples, the additional inherent resistance of the two-terminal wiring should be canceled out. The zero-adjustment function can cancel out up to 10 additional resistance.
Before Zero Adjustment
• The guaranteed accuracy of the instrument applies to four-terminal connections without zero adjustment. When using four-terminal connections, do not execute zero adjustment. Executing zero adjustment with incorrect wiring may amplify measurement error. However, zero adjustme nt may be nee ded even with four­terminal measurements if they are affected by a large offset voltage, such as due to thermal emf.
• Execute zero adjustment when the ambient temperature has changed, or when a probe is replaced.
Execute zero adjustment after the warm-up period following power on.
Open the Basic Settings screen.
1
Select the internal (INT) trigger mode.
2
Short the probes together.
3
Confirm that the measured value does not exceed 10 .
4
If no measured value is displayed, increment the measurement range (p. 31).
Select whether to enable or disable zero adjustment.
5
After confirming that the measured value does not exceed 10 , execute zero adjustment.
Return to the Measurement screen.
6
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Zero Adjustment Faults
If zero adjustment fails, the following error message appears.
33
3.6 Zero Adjustment
Before attempting zero adjustment again, confirm the following:
• With the 10 range selected, confirm that the displayed value does not exceed 10 .
• Confirm that the probe connections are correct.
When the scaling calculation function is on, you may be unable to zero out the measured value, even if you perform zero adjustment (because the zero-adjusted measured value is still subject to scaling calculation).
3
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Measured value is above upper limit
Pass (meets criteria)
Measured value is below lower limit
Select the REF% (relative values) decision mode
Decide whether a measured value is within specified tolerance limits rel­ative to a specified reference value (p. 35)
Select the ABS (absolute values) decision mode
Decide whether a measured value is between specified upper and lower threshold values (absolute values) (p. 37)
12.000 m.... reference value
+0.080%........ positive tolerance
-0.080%......... negative tolerance
example
100.00 m.... upper threshold
80.00 m...... lower threshold
example
Hi IN IN Lo
Hi IN
Lo
Positive tolerance [%]
Reference value [
]
Negative tolerance [%]
Upper threshold [
]
Lower threshold [
]

3.7 Judging Measured Values (Comparator Function)

3.7 Judging Measured Values (Comparator Function)
Comparator results are available as external output (at the EXT I/O connector) when the comparator reference/tolerance or upper/lower threshold values have been set.
See: "Chapter 8 External Co ntrol" (p. 89)
Comparator results are also indicated by the COMP Hi/IN/Lo panel lamps, and by audible beeper (disabled by default).
See: "Setting the Comparator Decision (“JUDGE”) Beeper" (p. 66)
The comparator decision mode can be set as one of the following:
Before Using the Comparator Function
• When the measured value is out of the selected measurement range, comparator decision indicators appear as follows. In the event of a measurement fault, no decision is made.
See:"3.8 Confirming Faulty Measurements" (p. 38)
Out-of-Range Display Comparator Decision Indicator
+OvrRng Hi
-OvrRng Lo
• If power is turned off during comp arator setting, changes to settings are lost as they revert to their previous values. To accept the settings, press the ENTER key.
• When setting comparator criteria, the appropriate range is selected automatically. Refer to "Auto-Ranging (when making comparator settings)" (p. 31) for range settings.
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3.7 Judging Measured Values (Comparator Function)
The Basic Settings screen appears.
1
Selection
2
Disable the function Enable the function
Press the up/down cursor keys to change the setting.
(When the function is disabled) Comparator decisions are indicated only when the function is enabled.
Relative Value = (tolerance)
Reference
Value
Measured
Value
- 1
X 100 [%]
Setting range:
-9.999% to +9.999% (When 10% or less)
-99.99% to +99.99% (When more than 10%)
Reference value Positive tolerance (upper decision threshold) Negative tolerance (lower decision threshold)

Enabling and Disabling the Comparator Function

The comparator function is enabled by default. When the function is disabled, comparator settings are ignored.
Open the Basic Settings screen.
1
Enable or disable the comparator function.
2
35
3
Return to the Measurement screen.
3

Decide According to Reference Value and Tolerance (REF% Mode)

Example: Set a reference value of 10.5
To abort the setting process, press . Settings are abandoned and the display returns to the previous screen.
 with ±4.5% decision tolerance.
Open the relative tolerance setting screen.
1
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36
Selection
1
To Reset Numerical Values
Deletes entered digits. This key is enabled only when en­tering numerical values.
To change the value after selecting the units, use the cursor keys to select the item to change, then enter the new val­ue with the tenkeys.
1_ 10_ 10._ 10.5_ 10.500
m
(Example: 10.5m)
2
Selection
To Reset Numerical Values
Deletes entered digits. This key is enabled only when enter­ing numerical values.
To change the value after selecting the units, use the cursor keys to select the item to change, then enter the new val­ue with the tenkeys.
To Set a Negative Value
Press this key to change the sign, as needed.
1
+4_ +4._ +4.5_ +4.500%
(Example: 4.5%)
2
Selection
Internal calculations are performed on floating-point values, and decisions round up any fraction of the
least-significant digit.
Displayed values of the reference and tolerances are rounded according to the selected range. Internal
calculations use unrounded data, so decisions are based on the entered (setting) values.
An error message appears if you press ENTER with the positive tolerance set lower than the negative
tolerance.
See: "11.3 Error Displays and Remedies" (p. 185) (ERR:001)
3.7 Judging Measured Values (Comparator Function)
Set the reference value.
2
Pressing an inoperative key during setting sounds a low-pitch beep (when the key beeper is enabled).
Press the units key to accept the setting and move the cursor to the positive tolerance.
Set the positive tolerance.
3
Press the % key to accept the setting and move the cursor to the negative tolerance value. The negative tolerance is initially set to the same amplitude as the positive tolerance (change as needed).
Set the negative tolerance in the same way (as needed).
4
Accept the settings and return to the Measurement screen.
5
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Upper threshold Lower threshold
1_ 15_ 150_ 150.0m
(Example: 150 m)
Selection
To Reset Numerical Values
Deletes entered digits. This key is enabled only when enter­ing numerical values.
To change the value after selecting the units, use the cursor keys to select the item to change, then enter the new val­ue with the tenkeys.
1
2
1
2
Selection
(Example: 50 m)
5_ 50_ 50.0m
Internal calculations are performed on floating-point values, and decisions round up any fraction of the
least-significant digit.
Displayed values of the reference and tolerances are rounded according to the selected range. Internal
calculations use unrounded data, so decisions are based on the entered (setting) values.
An error message appears if you press ENTER with the positive tolerance set lower than the negative
tolerance.
See: "11.3 Error Displays and Remedies" (p. 185) (ERR:001)
3.7 Judging Measured Values (Comparator Function)

Decide According to Upper/Lower Thresholds (ABS Mode)

Setting example: Upper threshold 150 m, lower threshold 50 m
To abort the setting process, press . Settings are abandoned and the display returns to the previous screen.
Open the absolute value threshold setting screen.
1
Set the positive tolerance.
2
Pressing an inoperative key during setting sounds a low-pitch beep (when the key beeper is enabled). No error message is displayed.
3
Press the units key to accept the setting and move the cursor to the lower threshold value.
Set the negative tolerance in the same way.
3
Press the units key to accept the setting and move the cursor to the upper threshold.
Accept the settings and return to the Measurement screen.
4
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Appears when the measured value is outside of the measurement or display range. Check for a broken sample component. The comparator result is Hi when +OvrRng is displayed, and Lo when -OvrRng is displayed. No external measurement fault signal (ERR
) is output.
Out-of-Range
The resistance between the H
POT
and H
CUR
probe contacts, and between the L
POT
and L
CUR
probe contacts, are measured and compared with specified contact fault values. An error message appears when the measured value reaches or exceeds the specified contact fault values. If this error persists, probe wear or cable failure may be the cause. If the error is not cleared by shorting the tips of a known-good measurement cable, the instrument requires repair.
Contact Check Fault
This method monitors the stability of the voltage between H
POT
and L
POT
probe contacts. An error message appears when voltage instability is detected due to chattering of the probe con­tacts. If this error persists, the probes may be degraded due to wear. C.E. Volt may also be displayed when external noise is strong.
Voltage Level Monitor Fault
See: "Out-of-Range Detection Function" (p. 39)
See: "4.6 Checking for Poor or Improper Contact
(Contact Check Function)" (p. 49)
See: "4.8 Detecting Measurement Voltage Faults
(Voltage Level Monitor Function)" (p. 52)
This display appears after changing measurement settings and before the next measurement is performed.
- - - - - - -
Display Examples: Display Measurement State and Appearance with Open-Circuit Probe
Display Measurement State
Current Monitor Results Normal (PASS) Fault (FAIL)
Contact Check Results Voltage Level Monitor
Results
Normal (PASS)
Display: Measured Value COMP indicator: According to the measured value
Display: +OvrRng COMP indicator: Hi (when connection to the measure­ment object is broken)
Fault
(FAIL)
Display: C.E. Hi/ C.E. Lo/ C.E. Volt COMP indicator: No decision EXT I/O: ERR
signal output
Display: C.E. Hi/ C.E. Lo/ C.E. Volt COMP indicator: No decision EXT I/O: ERR signal output
+OvrRng
-OvrRng
C.E. Hi C.E. Lo
C.E. Volt
Display
Display
Display
This method monitors the regulated measurement current for normal flow through the DUT. An error is detected mainly when a measurement fault occurs due to an open-circuit DUT or between the H
CUR
and
L
CUR
probe's poor contacts.
The error display depends on the contact check and voltage level monitor states (see the table below).
Current Monitor Fault
See: "Current Monito r Function" (p. 39)
The measurement fault display differs according to detection order
and settings.

3.8 Confirming Faulty Measurements

3.8 Confirming Faulty Measurements
When a measurement is not performed correctly, a measurement fault indicator appears and a measurement fault signal is output at the ERR detection). The instrument detects measurement faults by the following four methods.
pin of the EXT I/O connector (except for out-of-range
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Measurement Fault Detection Order
NoNoNoNoNo
No
No
Measurement Fault Detection Display EXT I/O signal
39
3.8 Confirming Faulty Measurements
Probe Short Circuit
Yes
Hi Wiring Contact Error
Yes
Lo Wiring Contact Error
Yes
Voltage Level Monitor Error
Yes
Constant-Current Error
Yes
Below Lower Limit
Yes
Above Upper Limit
Yes
No Measurement Data
Out-of-Range Detection Function
ERR: 021
C.E. Hi
C.E. Lo
C.E. Volt
+OvrRng
-OvrRng
+OvrRng
- - - - - - - -
PRB_SHORT output, ERR output
ERR output,
output
CE_HI
ERR output, CE_LO output
ERR output
HI output
LO output
HI output
Measurement fault detection proceeds in the order shown at the left, ending with display of the first detected error.
Corresponding measurement fault signals are also output at the EXT I/O connector.
3
Examples of Out-of-Range Faults
Out-of-Range Detection Measurement Example The measured value is outside of the
measurement range. The relative tolerance (%) display of
the measured value exceeds the dis­play range (999.999%).
The zero-adjusted value is outside of the display range.
While measuring, input voltage ex­ceed the A/D converter input range.
Attempting to measure 13 with the 10 range selected
Measuring 500 (+2400%) with a reference value of 20
In the 1000 m range with 0.5 zero-adjustment in effect, measuring 0.1 provides a zero-adjusted value of -0.4 , which is outside of the display range.
Measuring a large resistance value in an electrically noisy environment
Current Monitor Function
• The instrument supplies constant measurement current through the DUT via the H current monitor fault occurs if constant current cannot be attained. If the contact check and voltage level
monitor results are normal, the out-of-range and comparator result displays indicate “Hi”.
• Wiring resistance in excess of the following values may cause a current monitor error, making measure­ment impossible. When using measurement current 1 A ranges, keep the wiring resistance as well as the contact resistance between the DUT and probe low.
Range 10m 100m 100m 1000m 10 100 1000 Measurement Current 1 A 1 A 100 mA 100 mA 10 mA 10 mA 1 mA Between H Between L
and DUT 1 1 18 18 180 180 1.8 k
CUR
and DUT 1 1 8 8 80 80 800
CUR
CUR
and L
probes. A
CUR
Example of Current Monitor Fault
• Broken DUT (open work)
CUR CUR
or L or L
•H
•H
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probe contact fault
CUR
cable break
CUR
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4.1 Making Range-Specific Measurement Settings

The Basic Settings screen appears.
The Measurement Settings Screen appears. [MEAS SETTINGS]
1
Selection
2
1
2
Selection
Customizing Measurement
Settings Chapter 4
(set as needed)
Change measurement settings as appropriate for your application. Refer to "Detailed Settings Screens" (p. 19) for the available settings.
4.1 Making Range-Specific Measurement Settings
41
4
These settings can be made for each range (except for the DELAY1 setting).
Open the Basic Settings screen.
1
Open the Measurement Settings Screen.
2
Select the range to use.
3
Set the items as needed.
4
The 100 m range measurement condition settings are configured separately for each measurement current. Consequently, the 100 m range measurement condition settings should be configured after first setting the measurement current (p. 28).
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The DELAY1 setting is common to all ranges. The default set­ting is 0 ms (corresponding to trigger signal input at the same time as probe contacts become stable). Setting DELAY1 affects measurements in all ranges.
Set DELAY1
Adjust this setting to allow for probe contact mechanical stabili­zation.
Set DELAY2 to the time needed for stabilization after measure­ment current is applied, such as may be required for inductive components. The setting affects only the selected range. The default setting is 0 ms (corresponding to resistance measure­ment of non-inductive components).
Set DELAY2
Adjust this setting to allow for sta­bilization of the measurement sample.
DELAY1 and DELAY2 Timing Chart
* Internal delay is provided to suit purely resistive (non-reactive) DUTs,
and is different for each measurement range.
Acquisition
Stable Contact
Internal
Delay*
Probe Contact Condition
Start TRIG
Measurement Current
Acquisition of Measured Value
End of Measurement Signal EOM

4.2 Setting Pre-Measurement Delay

4.2 Setting Pre-Measurement Delay
This setting specifies the delay between trigger signal input and the start of measurement. Adjust this setting to delay measurement until the measured value has time to st abilize, so that even if the sample is connected after triggering, measurement starts only after the specified delay. The delay can be set by two methods, as follows.
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The Basic Settings screen appears.
The Measurement Settings Screen appears. [MEAS SETTINGS]
1
2
Selection
1
2
Setting range: 0.0 ms (default) to 100.0 ms
DELAY1 is common to all ranges, while DELAY2 can be set for each range inde­pendently (p. 41).
Tenkeys
3
Selection
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.
4.2 Setting Pre-Measurement Delay
Determining the Delay Time
Set the delay so that inductance does not affect measurements. To fine tune the delay, begin with a longer delay than necessary, then gradually shorten it while watching the
measured value.
Open the Basic Settings screen.
1
Open the Measurement Settings Screen.
2
Set DELAY1 or DELAY2.
3
Return to the Measurement screen.
4
4
When using the internal trigger, the delay time (DELAY1) is obtained by adding 100 ms to the setting (to pre­vent heat generation).
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The Basic Settings screen appears.
The Measurement Settings Screen appears. [MEAS SETTINGS]
1
2
Selection
Selection
1
2
Disables the function (default) (go to step 6)
Enables the function
The setting is specific to the selected range (p. 41)
1
2
Setting range: 0.50000 to 2.00000 (default: 1.00000)
Tenkeys
3
Selection

4.3 Correcting Measured Values (Scaling Function)

4.3 Correcting Measured Values (Scaling Function)
When measuring the resistance of current sensing resistors, there may be a discrepancy between the resistance value at the time of mounting on the board being used and the resistance value obtained when measuring the component alone (due to the ef fects of the probing location and other factors). The scaling function corrects the resistance measured value obtained from the component alone to yield the resistance value during actual use. Scaling is performed by me ans of the following equations:
Rs = A × R + B
R : Measured value before compensation Rs: Resistance value after compensation A : Compensation coefficient Setting range: 0.50000 to 2.00000 (default: 1.00000) B : Offset resistance value Setting range: ±10% of full scale for each range
(default: 0 m)
See: "Appendix 4 Effects of Probing" (p. A9)
Open the Basic Settings screen.
1
Open the Measurement Settings Screen.
2
Enable the scaling function.
3
Set the compensation coefficient.
4
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Set the offset.
1
2
Setting range: ±10% of full scale for each range (default: 0 m)
Tenkeys
3
Selection
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.
5
Return to the Measurement screen.
6
45
4.3 Correcting Measured Values (Scaling Function)
4
• Scaling calculation is performed on measured values after zero-adjustment calculation. Consequently, measured values may not equal zero even after zero adjustment.
• For the purpose of setting the offset resistance value, range full-scale signifies 1,200,000 dgt.
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The Basic Settings screen appears.
The Measurement Settings Screen appears. [MEAS SETTINGS] (The settings for the current mea­surement range are displayed.)
1
Selection
2
1
Selection
Set in units of time Set in units of power line cycles
2
The setting is specific to the selected range (p. 41)

4.4 Setting the Measurement Integration Time Option

4.4 Setting the Measurement Integration Time Option
The integration time can be optionally set for each range by selecting FAST, MED, or SLOW mea­surement speed. Integration time can be set in ms or PLC* units.
* PLC = Power Line Cycle, where one PLC is the period of the power line waveform. At 50 Hz, one PLC = 1/50th of a sec-
ond, and at 60 Hz, one PLC = 1/60th of a second. PLC setting units are useful where measurements may be affected by power line noise (high- or low-resistance measure­ments)
Default Settings
Range
10m 100m (1A) 100m (100A) 1000m 0.3 ms 2.5 ms 1PLC 10 0.3 ms 2.5 ms 1PLC 100 0.3 ms 1.5 ms 1PLC ON 1000 0.3 ms 1.5 ms 1PLC ON
*1. Two measurements are made within the above integration times.
Open the Basic Settings screen.
1
Open the Measurement Settings Screen.
2
Integration Time [INT]
FAST MED SLOW
2.0 ms 5.0 ms 1PLC ON
1.0 ms 5.0 ms 1PLC ON
0.5 ms 5.0 ms 1PLC ON
OVC
ON ON
*1 *1 *1 *1 *1 *1 *1
Select the integration setting units.
3
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Select the integration time.
Selection
1
Setting range:
When setting in ms units: 0.1ms to 100.0ms
When setting power-line-cycle units: 1 to 6PLC (60 Hz),
1 to 5PLC (50 Hz)
2 3
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.
4
Return to the Measurement screen.
5
47
4.4 Setting the Measurement Integration Time Option
4
• The instruments accuracy specifications are applicable only with the default integration times. Investigate your measurement requirements carefully before changing the integra­tion time.
• When the ef fects of power line noise can be ignored, the integration time can be set longer than the default to reduce scattering of measured values. On the other hand, if the inte gr a­tion time is too short, scattering increases.
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The Basic Settings screen appears.
The Measurement Settings Screen appears. [MEAS SETTINGS]
1
2
Selection
1
Selection
2
The setting is specific to the selected range (p. 41)
Disables the function (default) (go to step 5)
Enables the function
1
2
Setting range: 2 to 32 times (default: 16 times)
Tenkeys
3
Selection
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.

4.5 Stabilizing Measured Values (Averaging Function)

4.5 Stabilizing Measured Values (Averaging Function)
The averaging function averages multiple measured values to stabilize them. Accuracy specifica-
*1
tions have been determined for the 16-iteration averaging setting in the 10 m range more precise measurement to be performed.
For internal trigger measurement, a moving average is calculated. For external trigger measurement (and
:READ? command operation), a simple average is used.
Default setting Averaging function: OFF
Number of averaging iterations: 16Times
Open the Basic Settings screen.
1
, allowing
Open the Measurement Settings Screen.
2
Enable the averaging function.
3
Set the number of averaging iterations.
4
Return to the Measurement screen.
5
*1. SPEED = SLOW setting only.
Turning on the averaging function lengthens the external trigger measurement (and :READ? command oper­ation) time to (number of averaging iterations measurement time with averaging turned off). Since a moving average is used for internal trigger measurement, the measurement time does not change.
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The Basic Settings screen appears.
The Measurement Settings Screen appears. [MEAS SETTINGS]
1
Selection
2
Selection
1
2
Disables the function (go to step 5) Enables the function (default)
The setting is specific to the selected range (p. 41)
Selection
1
2
50, 100 (default), 150, 200, 300, 400, 500 A contact fault occurs when a measured value exceeds the threshold setting.
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.

4.6 Checking for Poor or Improper Contact (Contact Check Function)

4.6 Checking for Poor or Improper Contact (Contact Check Function)
This function detects poor contact between the probes and DUT, and broken measurement cables. The instrument continually monitors the resistance between the H
and L
L
CUR
When the resistance is outside of the specified value, a contact check fault occurs and the C.E. Hi or C.E. Lo error message appears. No comparator decision is applied to the measured value . When these error messages appear, check the probe contacts, and check for broken measurement cables. If the error is not cleared by shorting the tips of a known-good measurement cable, the instrument requires repair.
• During low-resist ance measure ment, poor co ntact of the H range measurement.
• When contact checking is disabled, measured values may be displayed even when a probe is not contact­ing the DUT.
probes from the start of integration (including response time) and while measuring.
POT
or L
CUR
CUR
and H
CUR
probe may be detected as an out-of-
probes and the
POT
4
Open the Basic Settings screen.
1
Open the Measurement Settings Screen.
2
Enable the Contact Check function.
3
Select the contact check fault threshold resistance.
4
Return to the Measurement screen.
5
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50
OFF setting
ON setting
PULSE setting
* Internal delay is different for
each range.
Measurement
Measuring
Start
TRIG
Internal delay *
Internal delay *
Internal
delay *
Approx.
100
s
Measuring
Measuring
Start
TRIG
Start
TRIG
Measurement
Measurement
Contact Improver current: Off
Contact Improver current: On
Contact Improver current: Pulse
Probe Contact
Condition
Probe Contact
Condition
Probe Contact
Condition
Stable Contact
Stable Contact
Stable Contact
Timing Chart (Contact Improver Function)
DELAY 2
DELAY 1
DELAY 2
DELAY 1
DELAY 2DELAY 1

4.7 Improving Probe Contact (Contact Improver Function)

4.7 Improving Probe Contact (Contact Improver Function)
Probe contacts can be improved by applying current from the POT to the CUR probes before mea­suring.
The Contact Improver function applies voltage to the sample. Be careful when measuring samples with characteristics that may be affected.
The current used for the Contact Improver functions can be selected as follows. 17 mA, 25 mA, 35 mA (default), 50 mA Higher current provides more effective contact improvement, but at the cost of faster probe deterioration. Contact Improver current can be set to be disabled (OFF), enabled (ON), or PULSE. The PULSE setting applies the contact improvement current for about 100 µs immediately before measure­ment. The PULSE setting is useful to decrease Joule heating if the DUT is susceptible to its current.
DUT current Steady-state current: 2 mA max. * DUT voltage 15 V max.
*:It takes several microseconds for the DUT current to reach the steady-state value. Until the steady-state
value is reached, a transient current that is approximately equal to the contact improvement current setting (default setting: 35 mA) will flow.
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4.7 Improving Probe Contact (Contact Improver Function)
The Basic Settings screen appears.
The Measurement Settings Screen appears. [MEAS SETTINGS]
1
Selection
2
Selection
2
Disable probe contact improvement (go to step 4).
Enable probe contact improvement. Apply contact improvement current for
about 100
µs immediately before mea-
surement.
1
The setting is specific to the selected range(p. 41)
Selection
1
2
17mA, 25mA, 35mA (default), 50mA
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.
Open the Basic Settings screen.
1
Open the Measurement Settings Screen.
2
Set the Contact Improver current timing to disabled (OFF), enabled (ON), or PULSE.
3
51
4
(When selecting ON or PULSE) Set the current limit value.
Return to the Measurement screen.
4
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52
The Basic Settings screen appears.
The Measurement Settings Screen appears. [MEAS SETTINGS]
1
Selection
2
Selection
1
2
Disables the function (go to step 5) Enables the function (default)
The setting is specific to the selected range (p. 41)
Selection
1
2
Loose Normal (default) Severe
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.

4.8 Detecting Measurement Voltage Faults (Voltage Level Monitor Function)

4.8 Detecting Measurement Voltage Faults (Voltage Level Monitor Function)
When a measurement voltage fault occurs due to probe chattering, the C.E. Volt error message appears on the measurement screen and an The C.E. Volt error may also appear when external noise is strong.
Check the following if errors occur frequently:
• Check for probe deterioration.
• Provide additional noise suppression. "Appendix 3 Unstable Measurement Values" (p. A3)
• Set the voltage level monitor to Loose, or OFF (disable).
• Keep wiring away from nearby equipment.
Open the Basic Settings screen.
1
ERR signal is output.
Open the Measurement Settings Screen.
2
Enable or disable the function.
3
(When enabled (ON selected))
4
Select the voltage level monitor threshold.
Return to the Measurement screen.
5
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53
The Basic Settings screen appears.
The Measurement Settings Screen appears. [MEAS SETTINGS]
1
Selection
2
Selection
1
2
Measurement current is applied while awaiting trigger.
Measurement current is applied only while measuring (default).
The setting is specific to the selected range (p. 41)
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.

4.9 Applying Current Only When Measuring (Current Mode Setting)

4.9 Applying Current Only When Measuring (Current Mode Setting)
When the Contact Improver function is set to Pulse or disabled (CONT IMP: PULSE or OFF) and measurement current is set for pulse output, open-circuit voltage when not measuring does not exceed 20 mV.
See: "4.7 Improving Probe Contact (Contact Improver Fu nction)" (p. 50)
When the Contact Improver fu nctio n is enab led (CONT IMP: PULSE or ON setting), the current mode setting is ignored even if set to continuous (CURRENT MODE: CONT setting). The Contact Improver function forces pulse operation with measurement current applied only during measurement.
Open the Basic Settings screen.
1
4
Open the Measurement Settings Screen.
2
Select whether to apply current when not measuring.
3
To apply measurement current continuously (CONT setting) even when waiting for a trigger, confirm that the Contact Improver function is disabled (CONT IMP: OFF, (p. 50)).
Return to the Measurement screen.
4
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54
Foreign Object
POT
CUR
DUT Electrode
DUT
Timin g Chart (Probe Short-Circuit Detection)
Probe short-circuit
PRB_SHORT
Comparator
Hi, IN, Lo
End of Measurement
EOM
Measurement
Start
TRIG
Contact
Transport
Measurement stage
Available
Short-Circuit Detection
Transport
DUT1 contact
DUT2 contactTransport
Probe short-circuit
DUT1
measurement
DUT2
measurement
Short-Circuit
No Decision
Detection timing setting

4.10 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)

4.10 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)
Four-terminal measurements are not possible when a conductive for­eign object is present between the POT and CUR probe tips. To detect short-circuited probes, this function measures the resistance between the CUR and POT terminals after a specific time (initially 5 ms) following the end of measurement. Probe short-circuit detection is disabled by default.
When a probe short-circuit is detected, an error message appears on the measurement screen, and the output. (
Short-circuit detection can also be controlled by asserting the active-low PRB_CHECK EXT I/O signal. Asserting the PRB_CHECK end of measurement (p. 89).
ERR:021 Probe short error)
signal while measuring causes short-circuit detection to be performed after the
PRB_SHORT and ERR signals are
About Probe Short-Circuit Detection
• If probes are connected to the DUT during probe short-circuit detectio n, the short circuit is detected. Ensure that the probes have sufficient time to separate from the measurement object.
• Probe short-circuit detection occurs within about 1 ms.
• The threshold for probe short-circuit detection is fixed at 500 , so if the resistance b etween CUR and POT probes is larger, detection is not possible.
Even while the probe short-circuit detection function is set to be disabled, short-circuit detection is performed when the EXT I/O PRB_CHECK signal is asserted.
When the internal trigger [TRG: INT] source is selected, short-circuit detection is not performed after the end of mea-
If probe short-circuit detection coincides with the timing of self-calibration processing, short-circuit detection will not be
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surement. However, short-circuit detection can still be executed by asserting the PRB_CHECK signal. performed. Short-circuit detection using the PRB_CHECK
completes.
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signal will be performed after self-calibration processing
4.10 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)
The Basic Settings screen appears.
The System screen appears. [SYSTEM]
1
Selection
2
Selection
1
2
Disables the function (default) (go to step 5)
Enables the function
Selection
1
2
Setting range: 1 to 100 ms, 5 ms (default)
Short-circuit detection is delayed for the speci­fied time following the end of measurement.
3
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.
Probe Short-Circuit Detection Enable/Disable
Open the Basic Settings screen.
1
Open the System screen.
2
Enable or disable the function.
3
55
4
(When enabled (ON selected))
4
Set the probe detection timing.
Return to the Measurement screen.
5
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56
1st Stage
2nd Stage
Transport Direction
ABCDE
Automatic Comparison
The SET MONITOR connectors are identical to RS-232C connectors. Be careful to avoid connecting the wrong connectors.
The Basic Settings screen appears.
The System screen appears. [SYSTEM]
1
Selection
2
Selection
1
2
Disables the function (default) Enables the function

4.11 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)

4.11 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)
This function automatically compares the settings of two instruments to determine whether they are the same. Only those measurement settings affecting the compar­ator and speed are compared. When the settings differ, an alarm notification appears and subsequent nal input is prevented from starting measurement.
When the settings of two instruments match, TRIG input is accepted and measurement starts. However, if the range defined by the upper and lower thresholds of the second stage is broader than that of the first stage, measurement still starts despite the different threshold settings.
TRIG sig-
Connect the two instruments SET MONITOR connectors together using a Hioki 9637
1
RS-232C cable.
Open the Basic Settings screen.
2
Open the System screen.
3
Enable the function on both instruments.
4
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57
Selection
1
2
Selects this instrument as the 1st stage Selects this instrument as the 2nd stage
3
Enter the difference in tolerance (%) to be allowed at the 2nd stage from the tol­erance range set for the 1st stage. Setting range: 0.000 to 9.999%
4
Example: If the 1st stage is set to measure 12
±0.800%, and the 2nd is to measure
12
±1.000%, enter the difference in toler-
ance of 0.300%.
Selection
1
2
Selects this instrument as the 1st stage Selects this instrument as the 2nd stage
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.
1st stage
2nd stage
UPP [%]
REF% setting ABS setting
REF [
]
LOW [%]
Tolerance range [%]
UPP []
LOW [
]
2nd upper limit - 1st upper limit
1st upper limit
Tolerance range [%] > 2nd upper limit [%] - 1st upper limit [%]
Tolerance range[%]
1st lower limit - 2nd lower limit
1st lower limit
(upper limit)
(
lower limit)
Permissible tolerance is calculated using floating-point values, so the setting must be at least 0.001% la rger than the difference between 2
nd
and 1st stage ranges. Set the upper and lower comparator thresholds ac­cording to the following conditions: 1
st
stage upper threshold < 2nd stage upper threshold
1
st
stage lower threshold > 2nd stage lower threshold
(upper limit)
(
lower limit)
1st stage
2nd stage
Tolerance range [%]
>
Tolerance range[%]
>
x 100
x 100
4.11 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)
Select the instrument to serve as the 1st stage, and set its tolerance range.
5
Set the instrument to serve as the 2nd stage (another RM3543).
6
4
Return to the Measurement screen.
7
Tolerance Range Setting Conditions
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58
1st Stage
TRIG Input Accepted
TRIG Input Inhibited
TRIG
Input Accepted
When changing the reference value
Change the reference value to match the 1
st
stage
The error message appears when the settings do not match.
2nd Stage
1st Stage
2nd Stage
1st Stage
2nd Stage
SET MONITOR: ON 1st 0.300%
(on the System screen)
SET MONITOR: ON 2nd
(on the System screen)
When an error is displayed
ERR:003 Setting monitor error. (COMP)
Comparator settings do not match. Please check.
ERR:004 Setting monitor error. (SPEED)
Measurement speed settings do not match. Please check.
4.11 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)
Practical Example
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4.12 Retrying Measurement After a Fault (Retry Function)

Retry
Chatter
Probe Contact Condition
Start TRIG
Contact Improver
Measurement Current
Contact Check
End of Measurement EOM
The Basic Settings screen appears.
The System screen appears. [SYSTEM]
1
Selection
2
Selection
1
2
Retry disabled (go to step 5) Retry enabled (default)
Selection
1
2
Setting range: 1 to 50 ms (default: 50 ms)
3
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.
4.12 Retrying Measurement After a Fault (Retry Function)
The Retry function causes measurement to be automatically retried when a measurement fault occurs due to probe chatter.
During Retry, all measurement operations including Con­tact Improvement and DELAY2 (but excluding DELAY1) are restarted. If a measurement fault persists after the specified contin­uous retry interval (e.g., if the DUT is not connected), retrying is aborted and the Retry is enabled, the maximum time to end-of-measure­ment occurs when recovering from a measurement fault immediately before the retry interval expires, which approaches the sum of the retry interval setting plus nor­mal measurement time. Decreasing test throughput may indicate probe maintenance is required.
EOM signal is output. When
59
4
Open the Basic Settings screen.
1
Open the System screen.
2
Select whether to enable or disable Retry.
3
(When enabled (ON selected))
4
Set the continuous retry interval.
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Return to the Measurement screen.
5
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60
Configure automatically.
Execute automatically.
(default)
Configure manually.
Execute at user-selected timing.
Internal self-calibration is performed automatically once every 10 minutes.
Self-calibration is performed at the user's desired timing us­ing the external control CAL input signal or a communica­tions command. Using this setting prevents self-calibration from being performed automatically at unexpected times.
The Basic Settings screen appears.
The System screen appears. [SYSTEM]
1
Selection
2
Selection
1
2
Configure automatically. (default) Configure manually.
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.

4.13 Maintaining Measurement Precision (Self-Calibration)

4.13 Maintaining Measurement Precision (Self-Calibration)
To maintain measurement precision, the instrument self-calibrates to compensate for internal circuit offset voltage and gain drift. This function cannot be disabled. You can select between two self-calibration function execution methods.
During self-calibration, the subsequent measurement is delayed for about 6PLC + 10 ms (PLC = Power Line Cycles) for internal circuit compensation.
Self-Calibration Timing Within 130 ms at 50 Hz, or 110 ms at 60 Hz
Open the Basic Settings screen.
1
Open the System screen.
2
Configure self-calibration operation.
3
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Return to the Measurement screen.
4
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61
RpRN–
2
----------------------

4.14 Compensating for Thermal EMF Offset (Offset Voltage Compensation - OVC)

• When the timing of self-calibration overlaps with a measurement, self-calibration is postponed until the end of measurement.
• When a trigger signal is applied during self-calibr ation, th e start of the triggered measurement is postponed until self-calibration is finished.
• Self-calibration executes automatically after changing comparator or measurement speed settings.
• During self-calibration, measureme nt curr en t an d th e Con tact Impr ov er curr e nt ar e inh ib ite d.
• When configuring manually, be sure to perform self-calibration if the temperature of the environment in which the instrument is operating changes by 2 degrees or more. (Accuracy cannot be guaranteed if self­calibration is not performed.)
4.14 Compensating for Thermal EMF Offset (Offset Voltage Compensation - OVC)
This function automatically compensates for offset voltage resulting from thermal emf or internal instrument bias. (OVC: Offset Voltage Compensation)
See: "Appendix 2 Effect of Thermal emf" (p. A2)
The following value is known to be a true resistance value from RP (>0), the value measured with current flowing in the positive direction, and R negative direction.
Offset voltage compensation is automatically enabled for all ranges, and cannot be modified or dis­abled.
Depending on the test object, some delay (DELAY2) is required (p. 42) to allow adequate current flow before starting measurement.
(<0), the value measured with current flowing in the
N
4
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5.1 Disabling and Enabling Key Operations

Key operations other than comparator settings (REF%, ABS, units and tenkeys) and F1 [UNLOCK] keys are disabled. To disable key operations: select [MENU] [M.LOCK] is displayed when returning to the measurement screen.
Disabling All Except Comparator Settings
Only comparator settings are enabled.
All key operations except F1 [UNLOCK] are disabled. To disable key operations: select [FULL] [F.LOCK] is displayed when returning to the measurement screen.
Disabling All Key Operations Including Comparator Settings
Key operations to change settings are disabled (although key­lock can be canceled).
Asserting (Low) the EXT I/O KEY_LOCK signal disables all panel keys, including F1 [UNLOCK] and F1 [LOCAL] (disables remote control) (p. 89). To disable the key-lock function and re-enable the keys, de-assert (High) the KEY_LOCK
signal.
Disabling All Panel Keys
All key operations are disabled.
The Basic Settings screen appears.
1
Selection
2
Key operations enabled (default) Disable all except key-lock cancel Disable all except key-lock cancel and
comparator setting change
[UNLOCK] is displayed only when key-lock is enabled by front panel key operations.
System Settings Chapter 5
5.1 Disabling and Enabling Key Operations

Disabling Key Operations (Key-Lock Function)

Activate the key-lock function to disable the instrument’s front panel key operations. Three key-lock levels are available to suit specific purposes.
63
5
Open the Basic Settings screen.
1
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Enable or disable key operations.
2
Return to the Measurement screen.
3
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64
5.1 Disabling and Enabling Key Operations

Re-Enabling Key Operations (Key-Lock Cancel)

Key-lock can be canceled only when [UNLOCK] is displayed.
Press and hold F1 [UNLOCK] for one second.
If key operations are disabled by the KEY_LOCK keys.
signal, de-assert (High) the signal to unlock the
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5.2 Setting the Comparator Decision and Key Beepers

The Basic Settings screen appears.
The System screen appears. [SYSTEM]
1
Selection
2
Selection
1
2
Disables the beeper Enables the beeper (default)
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.
5.2 Setting the Comparator Decision and Key Beepers

Enabling or Disabling the Key Beeper

The key beeper sound can be enabled and disabled. The key beeper is enabled (ON) by default.
Open the Basic Settings screen.
1
65
5
Open the System screen.
2
Select whether to enable or disable the key beeper.
3
Return to the Measurement screen.
4
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66
The Basic Settings screen appears.
The System screen appears. [SYSTEM]
1
Selection
2
Selection
1
2
Disables the beeper (default) Enables the beeper
Selection
1
2
IN (beep when within range) HI/LO (beep when out of range) LOW (beep when below lower threshold) HIGH (beep when above upper threshold)
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.
5.2 Setting the Comparator Decision and Key Beepers

Setting the Comparator Decision (“JUDGE”) Beeper

The comparator decision beeper can be enabled and disabled. The decision beeper is disabled (OFF) by default.
Open the Basic Settings screen.
1
Open the System screen.
2
Select whether to enable or disable the decision beeper.
3
(When enabled (ON selected))
4
Select the decision beep conditions.
Return to the Measurement screen.
5
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67
The Basic Settings screen appears.
The System screen appears. [SYSTEM]
1
Selection
2
Selection
1
2
Automatically detect local line frequency (default)
When the line frequency is 50 Hz When the line frequency is 60 Hz
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.

5.3 Power Line Frequency Manual Setting

5.3 Power Line Frequency Manual Setting
For proper electrical noise suppression, the instrument needs to be set to match the power line fre­quency. With the default setting (AUTO), the instrument attempts to automatically detect the line fre­quency, but manual setting is also available. Unless the line frequency is set correctly, measured values may be unstable. An error message appears if line noise is high enough to prevent correct frequency detection (ERR:041(p. 185)). In that case, set the instrument’s line frequency manually.
When the AUTO setting is selected, the line frequency is automatically set to 50 or 60 Hz when the instrument is turned on or reset.
However, automatic detection is not available when the line frequency changes after turning power on or resetting.
If the actual line frequency deviates from 50 or 60 Hz, select the closest frequency.
Examples: If the actual line frequency is 50.8 Hz, select the 50 Hz setting. If the actual line frequency is 59.3 Hz, select the 60 Hz setting.
Open the Basic Settings screen.
1
Open the System screen.
2
Select the line frequency being used.
3
5
Return to the Measurement screen.
4
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68
The Basic Settings screen appears.
The System screen appears. [SYSTEM]
1
Selection
2
Selection
1
2
Enter the last two digits of the year, and the month, day, hour, minutes and seconds in that order (the cursor moves automatically). Enter two digits for all values (e.g., 09).
Clock settings cannot be canceled.

5.4 Setting the Clock

5.4 Setting the Clock
To record and print the correct time when using statistical calculations (p. 78), the clock needs to be set correctly. The time of printing is also output when printing statistical calculation results.
Open the Basic Settings screen.
1
Open the System screen.
2
Set the date and time.
3
Return to the Measurement screen.
4
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69
The Basic Settings screen appears.
The System screen appears. [SYSTEM]
1
Selection
2
Selection
1
2
0 to 100%, 5% step (default: 50%)
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.

5.5 Adjusting Screen Contrast

5.5 Adjusting Screen Contrast
The screen may become hard to see when ambient temperature changes. In this case, adjust the contrast.
Open the Basic Settings screen.
1
Open the System screen.
2
5
Adjust the contrast.
3
Return to the Measurement screen.
4
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70
The Basic Settings screen appears.
The System screen appears. [SYSTEM]
1
Selection
2
Selection
1
2
0 to 100%, 5% step, (default: 80%)
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.

5.6 Adjusting the Backlight

5.6 Adjusting the Backlight
Adjust backlight brightness to suit ambient illumination.
• When external (EXT) triggering is selected, backlight brightness is automatically reduced after non-opera­tion for one minute.
• Be aware that the display may be hard to see when brightness is set too low (near 0%).
Open the Basic Settings screen.
1
Open the System screen.
2
Adjust the backlight.
3
Return to the Measurement screen.
4
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71
The Basic Settings screen appears.
The System screen appears. [SYSTEM]
1
Selection
2
Selection
1
2
Returns all settings to their factory defaults
Cancel the operation
Execute

5.7 Initializing (Reset)

5.7 Initializing (Reset)
The instrument can be reset by three methods.
• System reset from the System screen: Returns all settings (except the clock) to factory defaults.
• Turn the instrument on while simultaneously holding the REF% and ABS keys: Returns all settings (except the clock) to factory defaults.
• Reset by remote control command: returns all settings (except communication and clock settings) to their factory defaults.
RST command (non-backup, (p. 127))
:SYSTem:RESet command (p. 141)
This procedure describes system reset from the System screen.
Open the Basic Settings screen.
1
5
Open the System screen.
2
Select RESET.
3
Select whether to cancel or proceed to execute system reset.
4
The Measurement screen is displayed when system reset finishes.
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72
5.7 Initializing (Reset)

Default Settings

Display Setting value Default Settings Setting Description
TRG RANGE SPEED
MENU
0ADJ COMP LOCK MISC
MISC
DELAY1 DELAY2
SCALING
INT (FAST) INT (MED) INT (SLOW)
MEAS
AVERAGE
CONT CHECK
CONT IMP VOLT
MONITOR CURRENT
MODE AUTO MEMO-
RY
DATA
STATISTICS DATA OUT SET MONITOR PROBE
CHECK RETRY TRIG EDGE
EOM INTERFACE
SYS­TEM
100m CURR CALIBRATION JUDGE BEEP
KEY BEEP CLOCK LINE FREQ CONTRAST BACK LIGHT RESET ADJUST
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INT/ EXT/ MANU EXT Trigger source selection (p. 30) 10m/ 100m/ 1000m/ 10/
100/ 1000 SLOW/ MED/ FAST FAST Measurement speed (p. 29) OFF/ ON OFF Zero adjustment (p. 32) OFF/ ON ON Comparator function(p. 34) OFF/ FULL / MENU OFF Key-Lock function (p. 63) MEAS/ DATA/ SYSTEM (Miscellaneous settings)
0 to 100 ms (all ranges) 0 ms Probe delay setting (p. 42) 0 to 100 ms 0 ms DUT response setting (p. 42) OFF/ ON
Coefficient A Offset B
0.1 ms to 100 ms 1PLC to 6PLC (60 Hz) 1PLC to 5PLC (50 Hz)
OFF/ ON 2 to 32 times
OFF/ ON 50 / 100 / 150 / 200 / 300
/ 400 / 500 OFF/ ON/ PULSE
17 mA/ 25 mA/ 35 mA/ 50 mA OFF/ ON LOOSE/ NORMAL/ SEVERE
CONT/ PULSE PULSE Current mode setting (p. 53)
OFF/ ON OFF Auto-Memory function (p. 75)
OFF/ ON OFF OFF/ ON OFF Data output function (p. 81)
OFF/ ON, 1st/ 2nd, 0.000% to 9.999%
OFF/ ON, 0 to 100 ms OFF, 5 ms Probe short-circuit detection (p. 54) OFF/ ON, 1 to 50 ms ON, 50 ms Retry function (p. 59)
OFF EDGE/ ON EDGE ON EDGE Start Logic Setting (p. 98) PULSE/ HOLD
1 to 100 ms GP-IB/ RS232C/ PRINT
100mA/ 1A 100mA
AUTO/ MANU AUTO OFF/ ON
IN/ HI/LO/ LOW/ HIGH OFF/ ON ON Key beeper (p. 63)
AUTO/ 50 Hz/ 60 Hz AUTO Line frequency (detection) (p. 67) 0 to 100 50 Screen contrast adjustment (p. 69) 0 to 100 80 Screen backlight adjustment (p. 70)
- - Reset (p. 71)
- - Calibration (p. A16)
1000 Range selection (p. 31)
OFF A: 1 B: 0
Depends on measurement range Integration time (p. 46)
OFF, 16Times Averaging function (p. 48)
ON, 100 Contact-check (p. 49)
ON, 35 mA Contact Improvement (p. 50)
ON, NORMAL Voltage level monitor (p. 52)
OFF, 1st, 0.000% Settings Monitor function (p. 56)
PULSE, 5 ms RS232C, 9600bps
GP-IB, ADR01, LF
OFF, HI/LO Comparator decision beeper (p. 65)
Scaling function (p. 44)
Statistical calculation function (p. 78)
End-of-measurement pulse width (p. 97)
Interface setting (p. 105) Switching 100 m range measure-
ment currents (p. 28) Self-calibration operation settings
(p. 60)
Clock setting (p. 68)
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73
Store up to 30,000 measured values using the EXT I/O TRIG signal or by pressing F4 [MANU] on the Basic Settings screen.
Data Memory Function (p. 74)
Store measured values at spe­cific times.
This is convenient for batch exporting data to a controller while switching reels.
Measured values are automatically stored as they become sta­ble. When the specified number of data points (up to 99) is acquired, the beeper sounds and auto-storing halts.
Auto-Memory Function (p. 75)
Store data after measured value has stabilized.
This is convenient for sample inspec­tion after printing (vapor deposition) resistors on a board.
Minimizes transfer time by eliminating the need for transmit re­quests from the remote controller. (RS-232C interface only)
Data Output Function (p. 81)
Automatically output (export) measurements at the end of measurement.
Stored measurements are lost when the instrument is turned off.
Therefore, be sure to print out or export important data to a PC.
Storing and
Exporting Data Chapter 6
Measured values can be stored or automatically exported, according to application. Stored data can be output to a printer, RS-232C or GP-IB. Also, statistical calculations can be applied to internally stored data.
The data memory and auto-memory functions cannot be enabled at the same time.
6
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74

6.1 Storing Data at Specific Times (Data Memory Function)

6.1 Storing Data at Specific Times (Data Memory Function)
Measured values are stored in the instrument’s internal memory according to the following timings. (up to 30,000 points)
• Every time a measurement is performed by external (EXT) triggering
• When a trigger is applied during internally (INT) triggered measurement
The following three storage methods are available:
• Store upon receiving an EXT I/O TRIG
• Store upon receiving a
• Store by pressing the F4 [MANU] key on the [MENU] – [TRG] setting screen.
• This function can only be enabled by remote control. The data memory function should be enabled by remote control beforehand. This setting is not available from the front panel.
• Stored memory dat a cannot be viewed on the instrument’ s scr een. Use remote control commands to export stored data.
TRG command (p. 130)
signal (p. 89)
Data Memory Function Operating Procedure
Enable data memory mode.
1
Send this remote command to enable the data memory function:
:MEMory:MODE MEMory (p. 146)
Store measured values.
2
Execute external trigger measurement, or apply a trigger during internally triggered measurement.
Export the stored data.
3
Send this remote command to export the measured values stored in the instrument:
:MEMory:DATA? (p. 147)
Clear measurement data from instrument memory.
4
Send this remote command to erase the data from instrument memory:
:MEMory:CLEar (p. 146)
Stored data is automatically erased at the following times:
when the memory function setting (including auto-mem-
ory) is changed (p. 146)
when the range is changed (p. 31)
when changing comparator settings (p. 34)
when the scaling setting for the current range is changed
(p. 44)
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when printing the statistical calculations (p. 86)
when the DUT is changed (p. 28)
upon system reset (p. 71)
when the instrument is turned off
75
Printing (p. 86)
Prepare the printer (p. 83). Enable Auto-Memory and set
the number of values to store.
Set decision criteria (p. 34).
Measure
Beeper notifies when the specified number of values is stored.

6.2 Store as soon as Measurement is Stable (Auto-Memory Function)

6.2 Store as soon as Measurement is Stable (Auto-Memory Function)
This function automatically stores the value measured each time the probes cont act the sample with internal triggering. When the specified number of values has been acquired, auto-storage operation stops. St atistical calculations are applied to the stored dat a, with result s output to the screen or printer (RS­232C).
See: "6.3 Performing Statistical Calculations on Measured Values" (p. 78)
"Chapter 7 Printing" (p. 83)
Data storage and printing can be automatically controlled by the Auto-Memory function.
The Auto-Memory function is disabled by default. Enable the Auto-Memory function before settin g the nu m ber of valu es to stor e.
Enabling the Auto-Memory function affects other functions as follows:
• Statistical calculation is forced on.
• The voltage level monitor function is forced off (although the setting itself is not set to OFF, the function is actually disabled).
• The trigger source setting is forced to internal (INT).
When the trigger source is set to external (EXT), the Auto-Memory function is disabled by force.
Deleting Stored Data
Stored data is automatically erased at the following times:
when the memory function setting (including auto-mem-
ory) is changed (p. 146)
when the range is changed (p. 31)
when changing comparator settings (p. 34)
when the instrument is turned off
when the scaling setting for the current range is changed
(p. 44)
when printing the statistical calculations (p. 86)
when the DUT is changed (p. 28)
upon system reset (p. 71)
upon setting the auto-memory number of values to store
(p. 77)
when the instrument is turned off
6
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76
The Basic Settings screen appears.
The Data Settings screen appears. [DATA SETTINGS]
1
Selection
2
Selection
1
2
Disable the function (default) Enable the function
The confirmation screen appears.
When the function is enabled
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.
6.2 Store as soon as Measurement is Stable (Auto-Memory Function)
Enabling the Auto-Memory Function
Open the Basic Settings screen.
1
Open the Data Memory Settings screen.
2
Enable the function.
3
Return to the Measurement screen.
4
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6.2 Store as soon as Measurement is Stable (Auto-Memory Function)
Displays the Auto-Memory setting screen
Total Count Pass Count (IN) Fail Count (Hi/Lo)
Setting range: 1 to 99
To Reset Numerical Values
Deletes entered digits. This key is enabled only when enter­ing numerical values.
(Example: 20 values set to be stored)
Setting the Number of Values to Store
Open the Auto-Memory Settings screen.
1
Enter the number of values to store.
2
77
To abort the setting process, press . Settings are abandoned and the display returns to the pre­vious screen.
Accept the settings and return to the Measurement screen.
3
Acquiring Measured Values Automatically
Momentarily disconnect (open-circuit) the probes.
1
Connect the probes to the DUT.
2
6
When the measurement is stable, the value is automatically stored and the count is incremented. When the count reaches the specified number of values, a long beep sounds, and subsequent mea­surements are not stored. The (one) last acquired value can be deleted (Undo function (p. 80)).
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78
n
x
x
n
x2nx2–
n
---------------------------- -
=
n1
x2nx2–
n1
---------------------------- -
=
16
n
LoHi
Cp
1
6
2
n
xLoHiLoHi
CpK

6.3 Performing Statistical Calculations on Measured Values

6.3 Performing Statistical Calculations on Measured Values
Statistical calculations can be performed on up to 30,000 measured values, with results displayed. Printing is also available (p. 86).
Calculation types: average, maximum and minimum values, population standard deviation, sample standard deviation, process compatibility indices
Maximum value Minimum value
Average
Population standard deviation
Standard deviation of sample
Process capability index (dispersion) *
Process capability index (bias)*
• When only one valid data sample exists, standard deviation of sample and process capability indices are not displayed.
• When
• The upper limit of Cp and CpK is 99.99. If Cp or CpK exceeds 99.99, the value 99.99 is displayed
• Negative values of CpK are handled as CpK = 0.
• If statistical calculation is turned off and then ba ck on again without first clearing calculation results, calcula­tion resumes from the point when it was turned off.
• Measurement speed is restricted when statistical calculation is enabled.
• When Auto-Memory is enabled (ON), statistical calculation is enabled (ON) by force.
• When statistical calculation is disabled (OFF), Auto-Memory is disabled (OFF) by force.
= 0, Cp and CpK are 99.99.
n-1
Xmax = MAX (x1, ....., xn)
Xmin = MIN (x1, ....., xn)
In these formulas, n represents the number of valid data samples.
Hi and Lo are the upper and lower thresholds of the comparator.
*. The process capability indices represent the quality
achievement capability created by a process, which is the breadth of the dispersion and bias of the pro­cess' quality. Generally, depending on the values of Cp and CpK, process capability is evaluated as fol­lows:
Cp, CpK>1.33.........Process capability is ideal
Cp, CpK>1.00 Process capability is adequate
1.33
Cp, CpK.........Process capability is inade-
1.00 quate
Deleting Statistical Calculation Results
Stored data is automatically erased at the following times:
when the memory function setting (including data-mem­ory) is changed (p. 146)
when the range is changed (p. 31)
when changing comparator settings (p. 34)
when the scaling setting for the current range is changed
(p. 44)
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when printing the statistical calculations (p. 86)
when the DUT is changed (p. 28)
upon system reset (p. 71)
upon setting the auto-memory number of values to store
(p. 77)
when the instrument is turned off
79
The Basic Settings screen appears.
The Data Settings screen appears. [DATA SETTINGS]
1
Selection
2
Selection
1
2
Disable statistical calculation (default) Enable statistical calculation
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.
When statistical calculation is enabled, F3 [STAT] appears on the Measurement screen. Confirm calculation results (p. 80)
6.3 Performing Statistical Calculations on Measured Values

Using Statistical Calculations

When statistical calculation is enabled and an EXT I/O trigger signal is applied, operation is as fol­lows depending on the trigger source setting:
• With external (EXT) triggering: One measurement is performed and subjected to statistical calculation.
• With internal (INT) triggering: The next measured value after the trigger signal is subjected to st atistical cal­culation.
Operation is the same in the following cases:
(Key Operations) (Remote Control)
• when pressing the F4 [MANU] key on the [MENU] ­[TRG] selection screen
• when pressing the F2 [PRINT] key on the Measurement screen (with internal triggering and Auto-Memory dis­abled. Appears only when the interface is set for the printer.)
• when acquiring measured values by the Auto-Memory function (p. 75)
• when a TRG remote contro l command is received
• when an EXT I/O print signal is applied on the Measurement screen (with internal triggering and Auto-Memory disabled)
Open the Basic Settings screen.
1
Open the Data Memory Settings screen.
2
Enable or disable statistical calculation.
3
Return to the Measurement screen.
4
6
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80
Displays the Calculation Results screen (if statistical calculation is en­abled).
Num
Total data count
Val
Number of valid measured values (error-free data)
Ave
Mean
Sn
Population standard deviation
Max
Maximum
Sn1
Standard deviation of sample
Min
Minimum
Cp
Process capability index (dispersion)
Cpk
Process capability index (bias)
Output to the printer. "Example Printouts" (p. 87)
Statistical calculation results and stored data are erased when printing finishes.
Erases the last measurement and calcula­tion result (executes only once).
Erases all measured values and statistical calculation results.
After selecting, a confirmation screen ap­pears.
6.3 Performing Statistical Calculations on Measured Values

Confirming, Printing, and Erasing Calculation Results

Statistical calculation results are displayed on the screen. Printing is also available with the commercially available printer with a serial interface. Calculation results are automatically erased after printing. Before printing, select the [PRINT] interface setting.
See: "7.2 Instrument Settings" (p. 85)
The number of valid samples can be confirmed on the Calculation Results screen.
• When the number of valid samples is zero, no calculation results are displayed.
• When only one valid data sample exists, no standard deviation or process capability indices are displayed.
Display the Calculation Results screen.
1
To print
2
To print, select the printer as the interface setting on the System screen (p. 85)
To erase
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81
The Basic Settings screen appears.
The Data Settings screen appears. [DATA SETTINGS]
1
Selection
2
Selection
1
2
Disable auto-exporting (default) Enable auto-exporting
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.

6.4 Auto-Exporting Measured Values (at End of Measurement) (Data Output Function)

6.4 Auto-Exporting Measured Values (at End of Measurement) (Data Output Function)
At the end of measurement, the measured value is exported to a computer via RS-232C.
See: "Chapter 9 Commu nications (RS-232C/ GP-IB Interface)" (p. 101)
• Set the interface to [RS232C] beforehand. This function is not applicable to the GP-IB Interface.
See:"9.4 Configuring the Communications Protocol" (p. 105)
• When internal (INT) triggering is selected, data is exported only when a TRIG signal is applied.
• Executing a
• For other queries, be careful to avoid overlapping query response timing with auto-exp orting mea sured va l­ues.
• The data format for measured values can be selected as ASCII (default) or BINARY. Transfer time is mini­mized when BINARY is selected.
See:":SYSTem:FORMat <ASCii/ BINary>" (p. 141)
:READ? query command exports duplicate measured values.
Open the Basic Settings screen.
1
Open the Data Memory Settings screen.
2
Enable or disable auto-exporting (DATA OUT)
3
6
Return to the Measurement screen.
4
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7.1 Connecting the Printer

Printing (p. 86)
• Measurement values and comparator decisions
• Statistical calculation results
Connecting the printer to the instrument
Make instrument settings (p. 85)
Make printer settings
Printing Chapter 7
7.1 Connecting the Printer
83
Before connecting the printer
Because electric shock and instrument damage hazards are present, always follow the steps below when connecting the printer.
Always turn off the instrument and the printer before connecting.
A serious hazard can occur if a wire becomes dislocated and contacts another con-
ductor during operation. Make certain connec tions are secure.
• As much as possible, avoid printing in h ot and humid environ ments. O therwis e, prin ter life may be severely shortened.
• Use only compa tible recording p ap er in the printer. Using non-specified paper may not only result in faulty printing, but printing may become impossible.
• If the recording paper is skewed on the roller, paper jams may result.
Recommended printer
The requirements for a printer to be connected to the instrument are as follows. Confirm compatibility and make the appropriate settings on the printer before connecting it to the instrument.
See: "7.2 Instrument Settings" (p. 85)
7
• Interface ................................ RS-232C
• Characters per line................ At least 45
• Communication speed........... 9600 bps
• Data bits................................ 8
• Parity............ ... .... ... ... ... .... ..... none
• Stop bits................................. 1
• Flow control........................... none
• Control codes........................ Capable of directly printing plain text
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84
1 Confirm that the instrument and printer are
turned off.
2 Connect the AC adapter to the printer, and
insert the power plug into an outlet.
3 Connect the RS-232C cable to the RS-232C
connectors on the instrument and printer.
4 Turn the instrument and printer on.
2
3
Printer (Example)
AC adapter
RS-232C cable
25 ....................... 14
Printer (25-pin) Connector (Example)
RM3543 (9-pin) Connector
Pin
Signal Name
Function
2 TxD
Transmit Data
3 RxD
Receive Data
7 GND
Signal or Common Ground
4 RTS
Request to Send
5 CTS
Clear to Send
Function
Signal Name
Pin
Receive Data
RxD 2
Transmit Data
TxD 3
Signal or Common Ground
GND 5
6 7 8 9
1 2 3 4 5
Connector Pinouts
13 ....................... 1
7.1 Connecting the Printer

Connecting the Printer to the Instrument

Connection Methods
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7.2 Instrument Settings
The Basic Settings screen appears.
The System screen appears. [SYSTEM]
1
Selection
2
Selection
2
1
To use the printer
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.
Open the Basic Settings screen.
1
Open the System screen.
2
85

7.2 Instrument Settings

Select PRINT as the interface type.
3
Return to the Measurement screen.
4
7
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86
(When statistical calculation is enabled)

7.3 Printing

7.3 Printing
Before Printing
Verify that the instrument and printer settings (p. 85) are correct.

Printing Measured Values and Comparator Decisions

Printing by key operation
Press the PRINT key to print the measured value currently displayed on the Measurement screen.
Printing by external control
Measured values and comparator decisions print when the (active-low) PRINT signal (EXT I/O connec­tor) is connected to ISO_GND.
* ISO_GND is a pin in the instrument’s EXT I/O connector.
*
When statistical calculation is enabled [STATISTIC: ON] and internal triggering [TRG: INT] is selected, statistical calcula­tions are performed and measured values are printed. When external (EXT) triggering is selected, o nly measured values are printed. Use the TRIG
signal to perform statistical calculations with external triggering.

Printing Statistical Calculation Results

Statistical calculation results can be printed when auto-memory or statistical calculation is enabled (ON). To print, select PRINT on the screen or connect the (active-low) PRINT connector to ISO_GND.
To enable auto-memory:
See: "6.2 Store as soon as Measurement is Stable (Auto-Memory Function)" (p. 75)
To enable statistical calculation:
See: "6.3 Performing Statistical Calculations on Measured Values" (p. 78)
signal on the EXT I/O
If no valid data exists, only the data count is printed. When only one valid data sample exists, standar d devia­tion of sample and process capability indices cannot be printed.
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Example Printouts
Resistance measurements
1 0.8725mOhm Lo 2 0.484mOhm Lo 3 10.99998 Ohm IN 4 -10.0026 Ohm Lo 27 9.9986 Ohm Hi 28 9.996 Ohm Hi 29 0.01003 Ohm Hi 30 0.00012 Ohm Hi
Measurement fault values
1 OvrRng Hi 2 -OvrRng Lo 3 C.E.Hi -­ 4 C.E.Lo -­ 5 C.E.Volt -­ 6 -------- --
The “Valid” st atistical calculation result indicates the number (count)
of data samples not subject to errors such as measurement faults.
Among the comparator decision result counts (Hi, IN, Lo, and OR),
“OR” indicates the number (count) of out-of-range measurements.
Auto-memory data and statistical calculation results
Date: 11-02-01 Time: 06:18:00 Ref: 1000.000 Ohm Upp: +1.000% Low: -1.500% 1 999.885 Ohm -0.011% IN 2 1001.885 Ohm +0.189% IN 3 1002.394 Ohm +0.239% IN 4 1002.892 Ohm +0.289% IN 5 1012.894 Ohm +1.289% Hi 6 1000.897 Ohm +0.090% IN 7 998.902 Ohm -0.110% IN 8 994.888 Ohm -0.511% IN 9 1000.391 Ohm +0.039% IN 10 979.892 Ohm -2.011% Lo Hi: 1 IN: 8 Lo: 1 OR: 0 Number: 10 Valid: 10 Max 1012.894 Ohm +1.289% ( 5) Min 979.892 Ohm -2.011% ( 10) Avg 999.492 Ohm -0.051% Sn 7.83568 Ohm Sn-1 8.25953 Ohm Cp 0.50 CpK 0.42
87
7.3 Printing
7
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89
Signal input/output
Connect the instrument’s EXT I/O connector to the signal output or input device.
Make instrument settings (p. 97)

8.1 External Input/Output Connector and Signals

External Control Chapter 8
The EXT I/O connector on the rear of the instrument supports external control by providing outp ut of the end-of-measurement and comparator decision signals, and accepting input of measurement trigger and key-lock signals. All signals are isolated by optocouplers (inputs and outputs share a common signal ground).
Confirm input and output ratings, understand the safety precautions for connecting a control sys­tem, and use accordingly.
8.1 External Input/Output Connector and Signals
To avoid electric shock or damage to the equipment, always observe the following precautions when connecting to the EXT I/O terminals.
Always turn off the power to the instrument and to any devices to be connected
before making connections.
Be careful to avoid exceeding the ratings of external terminals (p. 95).
During operation, a wire becoming dislocated and contacting another conductive
object can be serious hazard. Use screws to secure the external connectors.
Ensure that devices and syste ms to be connected to the EXT I/O ter minals ar e prop-
erly isolated.
The ISO_5V pin of the EXT I/O connector is a 5 V power output, and the ISO_12V pin
is a 12 V power output. Do not apply external power to this pin.
To avoid damage to the instrument, observe the following cautions:
• Do not apply voltage or current to the EXT I/O terminals that exceeds their ratings.
• When driving relays, be sure to install diodes to absorb counter-electromotive force.
• Be careful not to short-circuit ISO_5V to ISO_COM.
• Be careful not to short-circuit ISO_12V to ISO_COM.
• Do not draw loads from ISO_5V and ISO_12V at the same time.
See: "Connector Type and Signal Pinouts" (p. 90)
8
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90
EXT I/O Connector (Instrument Side)
Connector: (Instrument Side)
37-pin D-sub female with #4-40 screws
Mating Connectors:
DC-37P-ULR (solder type) / DCSP-JB37PR (pressure weld type) Japan Aviation Electronics Industry Ltd.
TRIG
(Reserved)
KEY_LOCK
(Reserved)
(Reserved)
0ADJ
HOLD
ISO_5V
ISO_COM
ERR
HI
LO
CE_HI
(Reserved)
(Reserved)
(Reserved)
(Reserved)
(Reserved)
(Reserved)
(Reserved)
CAL
(Reserved)
(Reserved)
PRB_CHECK
(Reserved)
PRINT
ISO_COM
EOM
INDEX
IN
PRB_SHORT
CE_LO
(Reserved)
(Reserved)
(Reserved)
(Reserved)
ISO_12V
12345678910111213141516171819
202122232425262728293031323334353637
8.1 External Input/Output Connector and Signals

Connector Type and Signal Pinouts

Pos: positive, Neg: negative,: not applicable
Pin
Signal name I/O Function Logic Pin Signal name I/O Function Logic
1TRIG
(Reserved)
2 3
KEY_LOCK
(Reserved)
4
(Reserved)
5
6
0ADJ
7
HOLD
8
ISO_5V
9
ISO_COM
10
ERR
11
HI
12
LO
13
CE_HI
(Reserved)
14
(Reserved)
15
(Reserved)
16
(Reserved)
17
(Reserved)
18
(Reserved)
19
External trigger
IN
Key-Lock Neg Level
IN
Execute zero-ad-
IN
just Enable external
IN
triggering Isolated 5 V power
output Isolated common
signal ground Measurement fault Neg Level
OUT
HI comparator
OUT
decision LO comparator
OUT
decision Probe (HI side)
OUT
contact error
Pos/
Neg
Neg Edge
Neg Level
Neg Level
Neg Level
Neg Level
Edge
20 (Reserved) 21
   
CAL
(Reserved)
22
(Reserved)
23 24
PRB_CHECK
25
(Reserved)
26
PRINT
27
ISO_COM
28
EOM
29
INDEX
30
IN
31
PRB_SHORT
32
CE_LO
(Reserved)
33
(Reserved)
34
(Reserved)
35
(Reserved)
36 37
ISO_12V
Reserved pins are not connected inside the instrument. Do not connect to reserved pins.

Execute self-calibra-
IN
tion


Execute probe short-
IN
circuit detection

Print measured val-
IN
ue Isolated common
-
signal ground End of measurement Neg Edge
OUT
Analog measure-
OUT
ment finished IN comparator
OUT
decision Probe short-circuit
OUT
error Probe (LO side)
OUT
contact error




Isolated 12 V power
output
Neg Edge
 
Neg Edge
Neg Edge
Neg Edge
Neg Level
Neg Level
Neg Level
   
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•The 0ADJ signal should be asserted (Low) for at least 10 ms.
• The connector shell is conductively connected to the metal instrument chassis and the protective earth pin of the power plug. Be aware that it is not isolated from ground.
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Signal Descriptions

Input Signals
When external triggering (EXT) is enabled, one measuremen t is performed at the fall ing (ON) or rising (OFF) edge of the TRIG selected on the Settings screen (default: falling (ON) edge). When internal triggering (INT) is enabled, external triggering is disabled. Also, when the Set-
TRIG
tings Monitor function is enabled and an error occurs, triggering is disabled (p. 56). The TRIG
Stores statistical calculation data (when statistical calculation is enabled)
Stores measured data to internal memory (when the data memory function is enabled)
(also operates with internal triggering)
91
8.1 External Input/Output Connector and Signals
signal. Falling (ON) or rising (OFF) edge trigg ering can be
(p. 98)
signal performs the following operations in addition external triggering:
0ADJ
PRINT Asserting the PRINT signal prints the current measurement value.
CAL
HOLD
PRB_CHECK
KEY_LOCK
Asserting the 0ADJ signal executes zero adjustment once. To avoid malfunction, this signal should be asserted (Low) for at least 10 ms.
Asserting the CAL signal executes self calibration. The time required for self calibration is as follows: Approximately 130 ms (with 60-Hz line frequency setting), or 110 ms (with 50-Hz setting) If asserted during measurement, executes after the end of measurement.
Holding the HOLD signal low enables external triggering. When the HOLD signal is high, the settings made on the Settings screen or by commands are re-enabled.
Asserting the PRB_CHECK signal executes probe short-circuit adjustment one time. If asserted during measurement, executes after the specified time from the end of measurement.
While the KEY_LOCK signal is held low, all front panel keys (except POWER button) are dis­abled (key unlock and remote control cancellation operations are also disabled).
Output Signals
This signal indicates that a measurement fault has occurred (except out-of-range detection). It
ERR
CE_HI
is updated simultaneously with the EOM signal. At this time, comparator decision outputs are all de-asserted (high).
This signal indicates that a contact check error has occurred between H tacts. It is updated simultaneously with the EOM
puts are all de-asserted (high).
signal. At this time, comparator decision out-
CUR
and H
POT
(p. 32)
(p. 86)
(p. 60)
(p. 54)
(p. 63)
8
(p. 38)
con-
(p. 49)
CE_LO
PRB_SHORT
INDEX
EOM
HI, IN, LO
This signal indicates that a contact check error has occurred between L tacts. It is updated simultaneously with the EOM
puts are all de-asserted (high). This signal indicates that a foreign object is shorting the POT and C UR contacts in a four-ter-
minal probe tip. At this time, comparator decision outputs are all de-asserted (high). This signal indicates that A/D conversion in the measurement circuit is finished.
When the asserted (low) state occurs, the measurement sample can be removed. This signal indicates the end of a measurement. At this time, the states of the comparator deci-
sion outputs and ERR These are the comparator decision output signals.
, CE_HI, CE_LO, and PRB_SHORT are all determined.
signal. At this time, comparator decision out-
CUR
and L
POT
con-
(p. 49)
(p. 54)
(p. 97)
• Input signals are ignored when the following are displayed: Basic, Detailed, and Comparator Settings screens; Statistical Calculation Results screen (except for the print signal); and error messages (except Setting Monitor errors).
• EXT I/O input and output signals are not usable while changing measurement settings.
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92
Contact check
Measurement
currents
Contact Improver
Checking
Measurement
processing
Available
End of Measurement

8.2 Timing Chart

8.2 Timing Chart
Each signal level indicates a corresponding voltage level.
•The
• A self-calibration measurement (approximately 130 ms) is automatically performed every 10 minutes
• Do not apply a
• When changing settings such as measurement range, allow about 150 ms proc essin g time befor e applying
• Input signals are ignored when the following are displayed: Basic, Detailed, and Comparator Settings
•The
• Output of comparator decisions and error signals are determ ined before the
• With internal (INT) triggering, the
• When using the internal trigger [INT], the setting for the DELAY1 (t2) time is increased by 100 ms.
EOM operation when the EOM
The The
See: "Setting End-of-Measurement Signal Output (EOM Signal Setting)" (p. 97)
EOM signal is operational when the trigger source setting is EXT and the EOM output setting is Pulse.
(between measurements). ment is delayed until self-calibration is finished.
TRIG signal while measuring using external triggering (the signal is ignored).
TRIG signal.
a screens; Statistical Calculation Results screen (except for the print signal); and error messages (except
Setting Monitor errors).
INDEX and EOM signals are de-asserted simultaneously.
nals are not de-asserted (OFF) when measurement starts.
EOM signal is asserted (ON) at the end of measurement. EOM signal continues to be asserted until measurement starts again with the next TRIG signal input.
TRIG signal input is accepted during that ti me, but the correspond ing measure-
EOM signal is asserted.
EOM signal is fixed High (OFF). Also, comparator decisions and error sig-
Output setting is Hold
The EOM
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signal is de-asserted when the next measurement is started by the next TRIG signal.
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93
Output Signal State at Power-On
All signals are low (asserted active-low) when power is turned on. All output signals become high (de-asserted active-low) when ch anging from the initial screen to the Measurement screen.
Operation is shown when the trigger source is set to external triggering (EXT).
Instrument State
Power-On
Initial Screen Measurement Screen
8.2 Timing Chart
Timing Chart Interval Descriptions
Inter-
Description Duration Remarks
val
Trigger Pulse
t0
Asserted (ON) Trigger Pulse
t1
De-asserted (OFF)
t2 Delay 1 0 to 100 ms
t3 Delay 2 0 to 100 ms
1
t4 *
Measurement time 0.1 to 100 ms
t5 Calculation time 0.1 ms Calculation time is longer when memory storage is enabled. t6 EOM pu lse width 1 to 100 ms Setting-de pendent
*1: When the averaging function is on, the processing (t3 + t4) (time) is repeated the set number of times.
Internal Delay
Range Internal Delay [ms] 10m 3.5 100m (1A) 1.6 100m (100mA) 1.4 1000m 0.7 10 0.5 100 0.5 1000 0.5
0.1 ms or more Falling (ON)-/rising (OFF)-edge selectable
0.1 ms or more Setting-dependent (when using the internal trigger, increased by 100
ms) Setting-dependent (When the Contact Improver function is set to
Pulse, 0.1 ms is added.) OVC OFF: Integration Time + Internal Delay (see following table)
OVC ON: (Integration Time + Internal Delay)
8
× 2 + Delay2
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94
Input Circuit
Output Circuit
PLC, etc. (Controller)
Internally Isolated Common Signal Ground
Do not apply external power
Common
Output
PLC, etc. (Controller)
Input
Common Internally Isolated Common Signal Ground
Zener Voltage 30 V
Internally Isolated 5 V
Internally Isolated 12 V
Internally Isolated 5 V
Internally Isolated 12 V

8.3 Internal Circuitry

8.3 Internal Circuitry
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Electrical Specifications

95
8.3 Internal Circuitry
Input Signals
Output Signals
Internally Isolated Power Output
Input type Optocoupler-isolated, non-voltage contact inputs
(source input, active-low) Input asserted (ON) voltage 1 V or less Input de-asserted (OFF) voltage Open or 5 to 30 V Input asserted (ON) current 3 mA/ch Maximum applied voltage 30 V
Output type Optocoupler-isolated npn open-collector outputs
(current sink, active-low) Maximum load voltage 30 V Maximum output current 50 mA/ch Residual voltage 1 V (10 mA), 1.5 V (50 mA)
+5 V power output
Output Voltage 4.5 to 5.0 V Maximum output current 100 mA
+12 V power output
Output Voltage 11.0 to 13.0 V Maximum output current 20 mA
External power input none
The maximum output current figures for the +5 V and +12 V power outputs assume stan-
dalone use. Do not draw loads from the power supplies at the same time.
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Input Circuit Connection Examples
Output Circuit Connection Examples
Input
Input
Input
Output
Output
Common
Input
Common
Output
Output
Output
Output
Output
Output
Output
Input
Common
Input
Common
Active-Low Logic Output
Wired OR
Relay Connections
LED Connection
PLC Output (Source Output) Connections
PLC Output (Sink Output) Connections
Relay Connections
Switch Connections
PLC Input (Sink Input) Connections
PLC Input (Source Input) Connections
Active-Low Logic Output
8.3 Internal Circuitry

Connection Examples

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97
The Basic Settings screen appears.
The System screen appears. [SYSTEM]
1
Selection
2
Selection
1
2
The specified pulse is output after end­of-measurement (default).
The EOM signal remains asserted after end-of-measurement (to step 5).
Setting range: 1 ms to 100 ms (default: 5 ms)
2 3
Selection
1
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.

8.4 External I/O Settings

8.4 External I/O Settings
These settings affect the logic of the end-of-measurement and trigger signals.

Setting End-of-Measurement Signal Output (EOM Signal Setting)

The selected EOM output level is retained until the next trigger input, or for the specified pulse width.
Open the Basic Settings screen.
1
Open the System screen.
2
Select the EOM signal output type.
3
(When PULSE is selected)
4
Select the pulse width.
8
Return to the Measurement screen.
5
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98
The Basic Settings screen appears.
The System screen appears. [SYSTEM]
1
Selection
2
Selection
1
2
Measurement starts at the rising (OFF) edge of the (active-low) signal.
Measurement starts at the falling (ON) edge of the (active-low) signal. (default)
The confirmation screen appears.
Return to the setting screen. Save setting and return to
previous screen. Discard setting and return to
previous screen.
8.4 External I/O Settings

Setting the Trigger (TRIG) Signal Logic

Select whether triggering occurs on the falling (ON) or rising (OFF) edge.
Open the Basic Settings screen.
1
Open the System screen.
2
Select the triggering logic edge.
3
Return to the Measurement screen.
4
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8.5 External Control Q&A
Common Questions Answers
99

8.5 External Control Q&A

How do I connect external trigger input?
Which pins are common ground for input and output signals?
Are the common (signal ground) pins shared by both inputs and outputs?
How do I confirm output signals?
How do I troubleshoot input (control) signal issues?
Are the comparator decision signals retained during measurement (or can they be off)?
Why would the EOM signal not be detected?
Connect the (active low) TRIG input pin to an ISO_COM pin using a switch or open-collector output.
The ISO_COM pins.
Both common ground pins can be shared by inputs and outputs.
Confirm voltage waveforms with an oscilloscope. To do this, the output pins such as EOM and comparator decision outputs need to be pulled up
(through several k For example, if triggering does not operate properly, bypass the PLC and
short the TRIG pin directly to an ISO_COM pin. Be careful to avoid power shorts.
The state is determined at the end of measurement, and is off once at the start of measurement.
Try using the Pulse setting for EOM output. When the measurement time is short and EOM time to de-assert may be too short to be detected by the PLC. When the EOM output is set to Pulse, the signal is asserted (ON) for the specified pulse width before turning off.
).
output is set to Hold, the
What situations cause measurement faults to occur?
Is a connector or flat cable for connec­tion provided?
Is direct connection to a PLC possible?
Can external I/O be used at the same time as RS-232C or other communica­tions?
How should external power be con­nected?
Can free-running measured values be acquired using a footswitch?
An error is displayed in the following cases:
A probe is not connected
A contact is unstable
A probe or measurement object is dirty or corroded
Measurement object resistance is much higher than the measurement
range
A solder-type connector is supplied. The cable must be prepared at the user's side.
Direct connection is supported for relay or open-collector outputs and positive-ground optocoupler inputs. (Before connecting, confirm that volt­age and current ratings will not be exceeded.)
After setting up communications, it is possible to control measurement with the TRIG signal while acquiring measurement data via a communi­cations interface.
The instrument's external I/O input and output signals all operate from an internal isolated power source, so power must not be supplied from the PLC side.
Please use the free software for acquiring measured values available for download from our website.
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100
E Nut #4-40UNC
Required tools:
Screwdriver
Shielded cable
Soldering iron
Accessories
A Cover.....................................2
B Screws (+/-) #4-40UNC
(16.9 mm overall length) .......2
C Screws (+/-) #4-40UNC
(12.6 mm overall length) .......2
D Screws () #4-40UNC
(15.0 mm overall length) .......2
E Nuts #4-40UNC.....................2
F Cable Clamps........................2
G Saddle Washers
(shell protection)....................2
H Connector..............................1
B Screw (+/-) #4-40UNC (16.9 mm overall length)
A Cover
(Identical halves)
Shielded Cable (recommended)
D Screw () #4-40UNC
(15.0 mm overall length)
B Screw (+/) #4-40UNC
(16.9 mm
overall length)
E Nut #4-40UNC
D Screw () #4-40UNC
(15.0 mm overall length)
A Cover
(Identical halves)
F Cable Clamps
G Saddle Washers
(shell protection)
Assembly Sequence
1. Solder the (shielded) cable wires to the supplied EXT I/O connector (H) pins.
2. Affix the cable clamps (F) on the cable with screws (C).
3. Position the cable clamps (F) to fit properly inside the cover (A).
4. Insert screws (D) through the saddle washers (G).
5. In one half of cover (A), place connector (H), clamps (F), saddle washers (G) and screws (D).
6. Place the other half of cover (A) on top.
7. Affix the halve s of th e co ver (A) to ge th er with scr ew s (B ) and nu ts (E).
Be careful not to overtighten the screws, which could damage the covers.
H Connector
C Screw (+/) #4-40UNC
(12.6 mm overall length)

8.6 Supplied Connector Assembly

8.6 Supplied Connector Assembly
The EXT I/O connector and shell are supplied with the instrument. Assemble as shown below.
• Use shielded cables to connect a PLC to the EXT I/O connector. Using non-shielded conductors may result in system errors from electrical noise.
• Connect the shield to the ISO_COM pin of the EXT I/O connector.
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101
Wiring Diagram (p. 103)
Connect the Instrument and Controller with a GP-IB or RS-232C Interface Cable
Communications
Communications Protocol Settings (p. 105)
Entering an address Set the instrument to the same
communications protocol as the controller
Select the transmission format

9.1 Overview and Features

Communications (RS-232C/ GP-IB
Interface) Chapter 9
The symbols shown below indicate that the following instructions are specific to the RS-232C or the GP-IB interface. Instructions without these symbols are for both the RS-232C and the GP-IB interface.
: RS-232C only/ : GP-IB only
Before Use
• Always make use of the connector screws to affix the GP-IB or RS-232C connectors.
• When issuing commands that contain data, make certain that the data is provided in the specified format.
• External command operation is undetermined when the Printer is selected as the interface type. In this case, commands should not be sent.
9.1 Overview and Features
The instrument can be controlled by GP-IB or RS-232C. Instrument settings can also be reset.
Using the RS-232C, the measurement values can be printed out by connecting the instrument to the commercially available printer with a serial interface (p. 83).
IEEE 488.2-1987 standard (essential) commands can be used.
Applicable standard IEEE 488.1-1987
Reference standard IEEE 488.2-1987
If the output queue becomes full, a query error is generated and the output queue is cleared. Therefore, clear­ing the output queue and query error output from the deadlocked condition supported. For details about the communications commands, see "Message Format" (p. 109) and "Message Reference Interpretation" (p. 126)
.
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*1. ANSI/IEEE Standard 488.1-1987, IEEE Standard Digital Interface for Programmable Instrumentation *2. ANSI/IEEE Standard 488.2-1987, IEEE Standard Codes, Formats, Protocols, and Common Commands *3. The situation in which the input buffer and the output queue become full, so that processing cannot continue.
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*1 *2
*3
as defined in IEEE 488.2 is not
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