When you receive the instrument, inspect it carefully to ensure that no damage occurred during shipping. In particular, check the accessories, panel switches, and connectors. If damage is evident, or if it
fails to operate according to the specifications, contact your dealer or Hioki representative.
Confirm that these contents are provide d.
Model RM3543 or
RM3543-01 (with GP-IB included)......... ... ...1
Power Cord (2-line + ground)(p. 22)
EXT I/O Male Connector (p. 100)
Thank you for purchasing the HIOKI Model RM3543/ RM3543-01 Resistance HiTester.
To obtain maximum performance from the instrument, please read this manual first, and keep
it handy for future reference.
Model RM3543-01 is the same as the RM3543, but with GP-IB included.
Registered trademarks
Windows and Visual Basic are registered trademark of Microsoft Corporation in the United
States and/or other countries.
Alligator-clip-type measurement
probes. These general-purpose
dual-electrode clips fit a wide
range of conductor thicknesses.
Rubber-sheathed alligator-cliptype measurement probes. This
design is ideal for 4-terminalpair resistance measurement
applications, for example measuring standard resistors
This fixture is for measuring lead
components. (less than 10 m
residual resistance after zero
adjustment)
This fixture is for measuring chip
components. (less than 10 m
residual resistance after zero
adjustment)
Interface Cables
Model 9637 RS-232C Cable
(9-pin to 9-pin/ crossover cable)
Model 9638 RS-232C Cable
(9-pin to 25-pin/ crossover cable)
Model 9151-02 GP-IB Connector Cable (2m)
Verifying Package Contents
Options
Contact your dealer or Hioki representative for details.
This instrument is designed to comply with IEC 61010 Safety S t andards , and has b een
thoroughly tested for safety prior to shipment. However, mishandling during use
could result in injury or death, as well as damage to the instrument. Using the instrument in a way not described in this manual may negate the provided safety features.
Be certain that you understand the instructions and precautions in the manual before
use. We disclaim any responsibility for accidents or injuries not resulting directly
from instrument defects.
This manual contains information and warnings essential for safe operation of the instrument and for maintaining it in safe operating condition. Before using it, be sure to carefully read the following safety precautions.
Safety Symbols
In the manual, the symbol indicates particularly important information that the user should read
before using the instrument.
The symbol printed on the instrument indicates that the user should refer to a corresponding
topic in the manual (marked with the symbol) before usi ng the relevant function.
Indicates AC (Alternating Current).
The following symbols in this manual indicate the relative importance of cautions and warnings.
Indicates that incorrect operation presents a significant hazard th at could result in serious injury or
death to the user.
Indicates that incorrect operation presents a possibility of injury to the user or dama ge to the instrument.
Indicates advisory items related to performance or correct operation of the instru ment.
Symbols for Various Standards
This symbol indicates that the product conforms to regulations set out by the EC Directive.
WEEE marking:
This symbol indicates that the electrical and electronic appliance is put on the EU market after August
13, 2005, and producers of the Member States are required to display it on the appliance under Article 11.2 of Directive 2002/96/EC (WEEE).
Unless otherwise specified, “Windows” represents Windows 95, 98, Me, Widows NT4.0, Windows 2000,
Windows XP, or Windows Vista.
Click: Press and quickly release the left button of the mouse.
Double click: Quickly click the left button of the mouse twice.
Indicates the location of reference information.
Indicates that descriptive information is provided below.
Square brackets indicate instrument display labels (such as setting item names).
Bold characters within the text indicate operating key labels.
Accuracy
We define measurement tolera nces in terms of f.s. (full scale), rdg. (reading) and dgt. (digit) values, with the following meanings.
f.s.(maximum display value)
The maximum displayable value. This is usually the name of the currently selected range.
rdg.(reading or displayed value)
The value currently being measured and indicated on the measuring instrument.
dgt.(resolution)
The smallest displayable unit on a digital measuring instrument, i.e., the input value that causes the
digital display to show a “1” as the least-significant digit.
The instrument can be used with the stand (p. 16).
It can also be rack-mounted. (p. A11).
50 mm or more
10 mm or more
Rear
50 mm or more
Unplugging the power cord
kills power to the instrument.
Be sure to provide enough
unobstructed space to unplug
the power cord immediately
in an emergency.
Follow these precautions to ensure safe operation and to obtain the full benefits of the various
functions.
Preliminary Checks
• Before using the instrument for the first time, verify that it operates normally to ensure that
no damage occurred during storage or shipping. If you find any damage, contact your
dealer or Hioki representative.
• Before using the instrument make sure that the insulation on the powe r co rd is unda mag ed
and that no bare conductors are improp erly exposed. Using the instru ment in such conditions could cause an electric shock, so contact your dealer or Hioki representative for
repair.
• Before using the instrument, make sure that the insulation on the measurement cables is
undamaged and that no bare metal is improperly exposed. If there is any damage, measured values may be unstable and measurement errors may occur.
7
Operating Precautions
Instrument Installation
Storage temperature and humidity: -10°C to 50°C at 80% RH or less (non-condensating)
Operating temperature and humidity : 0 to 40°C at 80% RH or less (non-condensating)
Avoid the following locations that could cause an accident or damage to the instrument.
Installation Precautions
Exposed to direct sunlight
Exposed to high temperature
Exposed to water, oil, other
chemicals, or solvents
Exposed to high humidity
or condensation
Exposed to high levels of
particulate dust
Subject to vibration
In the presence of corrosive or explosive gases
Exposed to strong electromagnetic fields
Near electromagnetic radiators
Near induction heating systems
(e.g., high-frequency induction
heating systems and IH cooking
utensils)
• The instrument should be operated only with the bottom downwards.
• Do not place the instrument on an unstable or slanted surfa ce.
• Do not allow the instrument to get wet, and do not take measurements with wet
hands. This may cause an electric shock.
• Do not attempt to modify, disassemble or repair the instrument; as fire, electric
shock and injury could result.
To avoid damage to the instrument, protect it from physical shock when transporting and
handling. Be especially careful to avoid physical shock from dropping.
This instrument may cause interference if used in residential areas. Such use must be
avoided unless the user takes special measures to redu ce electromagnetic emissions to p revent interference to the reception of radio and television broadcasts.
Handling the Cords and Probes
• Avoid stepping on or pinching cables, which could damage the cable insulation.
• To avoid breaking the cables, do not bend or pull them.
• To avoid damaging the power cord, grasp the plug, not the cord, when unplugging it from
the power outlet.
• When disconnecting the BNC connector, be sure to release the lock before pulling off the
connector. Forcibly pulling the connector without releasing the lock, or pulling on the cable,
can damage the connector (p. 23).
• Use only the specified connection cables. Using a non-specified cable may result in incorrect measurements due to poor connection or other reasons.
• Before using a test fixture, read the instructions provided with it.
Before Turning Power On
Before turning the instrument on, make sure the supply voltage matches that indicated on its power connecto r. Connection to an improper supply vo ltage may damage
the instrument and present an electrical hazard.
To avoid electric shock or damage to the equipment, always observe the following
precautions when connecting to the EXT I/O connector.
• Always turn off the power to the instrument and to any devices to be connected
before making connections.
• Be careful to avoid exceeding the ratings of external terminals (p. 95).
• During operation, a wire becoming dislocated and contacting another conductive
object can be serious hazard. Use screws to secure the external connectors.
• Ensure that devices and syste ms to be connected to the EXT I/O ter minals ar e prop-
erly isolated.
• The ISO_5V pin of the EXT I/O connector is a 5 V power output, and the ISO_12V pin
is a 12 V power output. Do not apply external power to this pin.
To avoid damage to the instrument, observe the following cautions:
• Do not apply voltage or current to the EXT I/O terminals that exceeds their ratings.
• When driving relays, be sure to install diodes to absorb counter-electromotive force.
• Be careful not to short-circuit ISO_5V to ISO_COM.
• Be careful not to short-circuit ISO_12V to ISO_COM.
• Do not draw loads from ISO_5V and ISO_12V at the same time.
See: "Connector Type and Signal Pinouts" (p. 90)
9
Operating Precautions
Before Measuring
• Do not apply any voltage to the measurement jacks. Doing so could damage the instrument.
• Never attempt to measure at a point wher e voltage is pr esent. In particular, do not measure
a transformer or motor immediately after a temperature increase test or withstand-voltage
test, as the instrument could be damaged by induced voltage or residual charge.
• Battery internal resistance cannot be measured with this instrument. It will sustain damage.
To measure battery internal re sistance, we recommend the HIOKI 3554, 3555, BT35 62,
BT3563, and 3561 Battery HiTesters.
• To obtain the guaranteed measurement accuracy, allow at least 30 minutes warm-up.
• The instrument internally retains all settings (but not measured values), such as measurement range and comparator settings. However, measurement settings made through the
RS-232C or GP-IB interface are not memorized.
• The DC resistance of a power transformer cannot be measured. Do not measure objects
with a large L (100 H or higher in the 10 m to 100 range, or 10 H or higher in the
1,000 range), such as choke coils and other inductors. In such cases, contact your
dealer or Hioki representative.
• You may be unable to obtain accurate measured values when there is a capacitance component in parallel with the measurement target. For this instrument, any parallel capacitance component should be limited to a maximum of 1,000 pF.
• Carefully insulate all H
cannot be performed and an error will occur if core and shield wires touch.
• During measurement, a transient current equal to about 1.5 times the steady-state current
will flow for several microseconds (or about 10 mApk in the 1 k range). Exercise special
care when measuring targets whose characteristics are prone to vary.
The Hioki RM3543 Resistance HiTester employs the 4-terminal method to quickly and accurately measure
the DC resistance of components such as resistors and current sensing resistors. It includes advanced contact-check, comparator, and data output functions. The intuitive user interface and high noise immunity are
ideal for use with taping machines and separators.
Resistance Measurement
The factory defaults (initial settings)
are optimized for current sensing resistors measurements.
Interface
Communications
Connect the instrument to a
controller via the RS-232C
or GP-IB interface to control
measurement data acquisition (p. 101).
Send Measurement Data and
Calculation Results to a
Printer
Use a commercially available printer with a serial interface to print
measured values and calculation
results (p. 83).
Save and Output Measured
Values
Measured values can be stored in
internal memory (p. 73)
Statistical calculations can be performed on the stored data, which
can be transferred to a computer in
batch form (however, stored data
cannot be confirmed internally).
Judge Measured Values
Measured values are compared
with a pre-specified referenc e value
or thresholds, and the result is output externally and indicated by the
COMP indicators (comparator function, p. 34).
Connect a PLC or
I/O Board
To control from a PLC, connect to the EXT I/O connector. In addition to comparator
results, various measurement
anomaly signals can be output (p. 89).
Upper limit
Lower limit
Compare Two Instrument’s
Setting Conditions
When measuring with two interconnected instruments, settings
are compared, and an alarm is
output and measurement is inhibited if the settings differ (Settings
Monitor function, p. 56).
Optional Hioki probes and fixtures
are available to connect to the measurement jacks (BNC jacks, p. 4).
Alternatively,
commercially
available cables
such as 1.5D-2V
coax can be used
(p. 24).
Ultra Fast and Accurate Measurements
Increase Productivity
The RM3543 is ideally suited for use in testing current
sensing resistors, where there has been remarkable
progress in lowering resistance values.
Measurement from which the effects of thermal EMF
are consistently eliminated (by the OVC function)
yields a resolution of 0.01
in the 10 m range.
Since measurement results are obtained by means of
a PASS/FAIL judgment process with a resolution of
0.001%, the instrument can test resistors of 1 m and
less at a high rate of speed. Thanks to proprietary ultra-fast, high-stability circuit technology, the RM3543
completes the sequence of contact improvement,
measurement and contact check, and judgment output in just 1.6 ms.
Specially designed for current sens in g resistors
Thanks to its scaling function, the RM3543 can compensate for the difference between resistance values
obtained at the time of mounting on the board and during testing. By using the averaging function during super-low-resistance measurement with a small
detection voltage, it is possible to achieve even higher
levels of accuracy.
Multiple Interfaces
EXT I/O is isolated from the measurement and control
circuits to provide noise immunity (p. 89).
All data can be acquired in real time using the built-in
38.4-kbps high-speed RS-232C interface. Connect
the commercially available printer with a serial interface to print measured values and statistical calculation results (p. 83).
The GP-IB interface is available for Model RM3543-01
(specified when ordering, p. 101).
Clearly Visible Display and Intuitive Operation
High-contrast LCD provides clear visibility, helping
avoid setting mistakes. The optimum range is selected
automatically when comparator thresholds are entered.
Auto Memory Function Convenient for Sampling Tests (p. 75)
The auto memory function is convenient for sampling
tests after screen-printing. Measured values are automatically acquired as soon as they stabilize, and statistical calculations proceed until the specified quantity is
obtained, upon which an alert notification (alarm) occurs. Selecting [PRINT] (screen display) prints measured values and statistical calculation results (p. 86).
Fixtures for Component Measurements (p. 4)
The BNC-type measurement jacks exhibit good noise
immunity. Ready availability and easy assembly ensure smooth system setup. Various test fixtures are
available for Hioki LCR HiTesters.
Features
High-Speed Data Output and Ample Memory
The Data Output function transfers measured data at
5 ms/sample, even via RS-232C. Up to 30,000 measurements can be stored, and all data can be exported
at the end of measuring each reel. This function is ideal for system setup, debugging and process manage ment.
Contact checking (that was previously performed before and after measuring) is now performed during measurement, so probe bounce and contact resistance
fluctuations can be detected. Contact checking time can
be shortened, improving tact times.
Features
Measurement Circuit Strongly Immune to
Contact Resistance Fluctuations
The effects of contact resistance fluctuations are reduced even when scattering occurs near the end of
probe life. Such effects are minimized by the fast response of the measurement circuit.
Contact Improver Function (p. 50)
The Contact Improver function improves bad contacts
between probes and test samples. Contacts errors are
reduced by penetrating oxidation and impurities between probes and samples. Reducing contact errors
can increase productivity and quality. The intensity of
the contact improver function can be adjusted according to probe type.
Reject Faulty Data –
Voltage Level Monitor Function (p. 52)
When the contact resistance of the H
CUR
and L
CUR
leads fluctuates, the measurement current changes
momentarily. Such momentary changes are not detectable by typical contact checking. The Voltage Level
Monitor function detects a contact error if the detection
voltage changes significantly, which can increase the
reliability of measured values.
Minimize Human Error and Risk –
the Settings Monitor Function (p. 56)
If the settings of two instruments are different, triggering is inhibited and an alarm notification is generated
to avoid setting mistakes due to human error.
Reliable Four-Terminal Measurement –
Probe Short-Circuit Detection Function
(p. 54)
Four-terminal measurements are inhibited when a
conductive foreign object is present between the
POT and CUR probe tips. Short-circuit probe anomalies are detected by checking the resistance between
these tips when not measuring.
Strong Electrical Noise Immunity
The specified measurement accuracy is achieved
even with ±1.5 kV mixed pulse noise. The floating
measurement section design is highly impervious to
electrical noise, minimizing the effect on measured
values even when turning large-induction motors on
and off. The free-range power supply input (90 to 264
V) is practically unaffected by voltage fluctuations, so
stable measurements are possible even in under
poor power conditions.
Shows the serial number. Do not remove this label, as
it is required for product support.
Connect the supplied power cord (p. 22).
Connecting the Power Cord
RS-232C Connector
The RS-232C interface can be used to connect to
a PLC or computer (p. 101).
It is also used by the commercially available printer
with a serial interface (p. 83).
RS-232C Communications
Printer Output
GP-IB Connector (RM3543-01 only)
The GP-IB interface can be used to connect to a computer
(p. 101).
GP-IB Communications
SET MONITOR Connector
Connect another RM3543 here to compare instrument settings (p. 56).
Compare Two Instruments’
Settings
EXT I/O Connector
Connect to a PLC or I/O board to control
measurement start, and to acquire comparator results (p. 89).
External Control
Bottom Panel
Stand
When using the stand
Extend the stand until it clicks into place.
Make sure to extend both legs of the stand.
Collapsing the stand
Fold in the stand until it clicks into place.
This instrument can be rack mounted.
See: "Appendix 5 Rack Mounting" (p. A11)
Parts removed from this instrument should be stored in
a safe place to enable future reuse.
Do not apply heavy downward pressure with the
stand extended. The stand could be damaged.
The instrument has three general display screen types: Measurement, Basic Settings and Detailed
Settings.
Refer to "11.3 Error Displays and Remedies" (p. 185) for error displays.
The screen examples in this guide appear reversed (black on white) for best visibility on the printed page.
However, the instrument screens can actually be displayed only as white characters on black background.
This screen normally appears while measuring. View currently measured values and measurement conditions.
Some parts of the display depend on the comparator
mode and other settings.
Measured Value
Settings Menu (corresponding to F keys)
Displayed contents depend on the curre nt function settings.
Parentheses ( ) indicate the corresponding F-key
MENU (F1)Displays the Basic Settings screen
PRINT (F2)Print (p. 85)
Appears only when the interface is
set for the printer
ST AT (F3)Statistical calculation results (p. 78)
Appears only when statistical calculation is enabled
NUMBER (F4)Set Auto-Memory number (quantity)
(p. 75)
Displays the number of stored data
items and the number of passed and
failed products at the lower left.
UNDO (F3)Deletes the previously stored mea-
surement and calculation result (only
one can be deleted) (p. 80)
Appears only when calculation results are displayed
ALLCLR (F4)Clears all memory and calculation
(p. 80)
Appears only when calculation results are displayed
LOCAL (F1)Enables local control (p. 108)
UNLOCK (F1)Cancels the key-lock state (hold 1s)
(p. 64)
Criteria Setting Values (p. 34)
Displayed contents depend on the
selected comparator mode.
(Ex.: REF% mode)
To display the Basic Settings screen
Measurement Conditions
Shows current setting contents. Displayed contents depend on the current settings.
INT/ EXTTrigger source type (p. 30)Measurement range (p. 31)
FAST/ MED/ SLOW Measurement speed (p. 29)
0ADJ/
OFF (not shown)
Appears only when zero-adjust is
enabled (p. 32)
OVC/
OFF (not shown)
(OVC: Offset Voltage Compensation)
Appears only when OVC is enabled (p. 61)
SC/
OFF (not shown)
Appears only when the scaling
function is enabled (p. 44)
NUMAppears only when tenkey input is
enabled
RMTRemote control (p. 108)
M.LOCKDisables all operations except
comparator settings (p. 63)
F.LOCKDisables all operations including
comparator settings (p. 63)
Basic Settings Screen
Make basic measurement condition settings on this
screen. Measurement speed and range can be changed
while viewing measured values. (Trigger source: INT)
TRG
Change trigger source (measurement start
control method) (p. 30)
When EXT triggering is enabled, [MANU] ap-
pears beside the F4 key (press to trigger
measurement manually).
Connect to the test sample
When finished measuring, turn the
power off (p. 26).
Connect the external interface
(as needed)
4
• Using the printer (p. 83)
• Using the RS-232C or GP-IB interface
(p. 101)
• Connecting to a PLC or I/O board
(p. 89)
• Automatically comparing the settings
of two instruments (Settings Monitor
function) (p. 56)
Connect the power cord (p. 22)
2
3
2
3
4
5
Make instrument settings (p. 27)
6
Measurement
PreparationsChapter 2
Be sure to read the "Operating Precautions" (p.7) before installing and connecting this instrument.
Refer to "Appendix 5 Rack Mounting" (p. A11) for rack mounting.
2.2 Connecting Measurement Cables and Test Fixtures
Example of defeated guard measurement
Connecting measurement cables
Connecting a fixture
Connect directly to the measurement
jacks with the label side up, and affix
with the levers on the left and right.
Connect the red plugs to the
H
CUR
and H
POT
jacks, and the
black plugs to the L
CUR
and
L
POT
jacks.
Black plugs
Red plugs
BNC Jack Guide Pins
(on the instrument)
Lock
BNC plug slots
2
1
Align the slots in the BNC plug with the
guide pins on the jack on the instrument,
then push and twist the plug clockwise
until it locks.
Disconnecting BNC connectors
Push the BNC plug, twist it counterclockwise, and pull it out.
Making your own probes and extenders (p. 24)
Connection Methods
2.2Connecting Measurement Cables and
Test Fixtures
23
Connect your measurement cables, optional Hioki probes or test fixture to the measurement jacks.
Refer to "Options" (p.4) for details. See the instructions provided with the fixture for operating
details.
• Do not apply a voltage to the measurement terminals. Doing so may damage the unit.
• When disconnecting the BNC connector, be sure to release the lock before pulling off the
connector. Forcibly pulling the connector without releasing the lock, or pulling on the cable,
can damage the connector.
• We recommend using optional Hioki fixtures.
• Use the GUARD jack only for Faraday
shield, and avoid more than 10 mA current flow. This jack is not for guarding
network resistance measurements.
values may be unstable, and errors may occur, when measuring with low resistance values.
• The phenomenon of induction becomes pronounced in the 10 m and 100 m ranges (when the measurement current is set to 1 A). Changes in the cab le p ositio n and co nfigur ation ma y cau se me asur ed va lues to vary. Exercise particular care so that the cable position and configuration do not change.
Additionally, measurement cables and measurement targets should be kept as far as possible from metallic objects.
• When using two or more RM3543 units, do not group the wires from multiple instruments together. The
"C.E. Volt" error display may be trigger ed by the phenomenon of induction.
• Refer to the block diagram (p. 14) for internal circuit details.
• Probes and measurement objects should be shielded at BNC or GUARD jack potential.
• Wiring resistance in excess of the following values may cause a current monitor error, making measurement impossible. When using measurement current 1 A ranges, keep the wiring resistance as well as the
contact resistance between the DUT and probe low.
Range
10m100m100m1000m101001000
Measurement Current
1 A1 A100 mA100 mA10 mA10 mA1 mA
Between H
CUR
and DUT
1 1 18 18 180 180 1.8 k
Between L
CUR
and DUT
1 1 8 8 80 80 800
2.2 Connecting Measurement Cables and Test Fixtures
Making Your Own Measurement Cables
Recommended Measurement Cable Specifications
Conductor resistance
Capacitance150 pF/m or less
Cable dielectric material
Connector insulating material
Length2 m or less
Example: JIS standard 3C-2V, 1.5D-2V MIL standard RG-58A/U
* Teflon is a registered trademark of E. I. du Pont de Nemours and Company.
500 m
/m or less
Polyethylene (PE), Teflon* (TFE), polyethylene foam (PEF)
Insulation resistance at least 10 G
Teflon* (TFE), polybutylene terephtalate (PBT)
Insulation resistance at least 10 G
A self-test (instrument diagnostic routine) is performed.
During the self-test, the following information is displayed while the hardware is verified.
Error
No Errors
Normal display (measurement screen)
The following information is displayed during self-testing:
• Manufacturer and model name
• Firmware versions (main, and measurement)
• Communication setting
• Line frequency setting
2.3 Turning the Power On and Off
2.3Turning the Power On and Off
Turning Power On
When the power is turned on, the same setting as when the power was last turned off
appears (backup function).
When powered up for the first time, the default settings appear.
See: "Default Settings" (p.72)
Before Starting Measurement
To obtain precise measurements, provide about 30 minutes warm-up after turning power on.
Measurement settings are recalled from when the power was previously turned off (settings
backup).
However, measurement settings made through the RS-232C or GP-IB interface are not
retained, although they can be stored using the
Turning Power Off
Press the POWER button (it lights red when the instrument is off).
Disconnect the power cord from the outlet to extinguish the POWER button light.
When power is turned on again, operation resumes with the same settings as when last
turned off.
If a power outage (e.g., breaker trip) occurs when the instrument is on, it will automatically
turn on again when power is restored (without pressing the POWER button).
Do not use the instrument if damage is
found, as electric shock or short-circuit
accidents could result. Contact your
dealer or Hioki representative.
Metal Exposed
Is the power cord insulation torn, or is
any metal exposed?
1
Before using the instrument for the first time, verify that it operates normally to ensure that no damage occurred during storage or shipping. If you find any damage, contact your dealer or Hioki representative.
Peripheral Device Inspection
Is the insulation on a measurement
cable torn, or is any metal exposed?
No Metal Exposed
If there is any damage, measured values may be unstable and measurement errors may occur. Replace the
cable with an undamaged one.
Metal Exposed
No Metal Exposed
If damage is evident, request repairs.
Yes
Is damage to the instrument evident?
Instrument Inspection
When turning power on
Does the self-test screen appear
(model no., version no.)? (p. 26)
No
2
The power cord may be damaged, or
the instrument may be damaged internally. Request repairs.
Does the Measurement screen appear
after self-test?
No
Yes
The instrument may be damaged internally. Request repairs.
See: "11.1 Troubleshooting" (p. 183)
"11.3 Error Displays and Remedies" (p. 185)
An error indication
occurs (ERR)
Yes
Inspection complete
Please read the "Operating Precautions" (p. 7) before use.
3.1 Pre-Operation Inspection
Measurement Settings
(Basic Measurements)
Chapter 3
See "Measurement Flow" (p. 2) for an outline of the measurement process from preparation to endof-measurement.
Return to the setting screen.
Save setting and return to
previous screen.
Discard setting and return to
previous screen.
The confirmation screen appears.
3.2 Switching 100 m range Measurement Currents
3.2Switching 100 m range Measurement
Currents
The 100 m range measurement current can be switched between 100 mA and 1 A. The 100 mA
setting (which is the factory default) allows measurement at a high level of precision. The 1 A setting
can be used to provide better resistance to external noise.
See: "(5) DUT Becomes Warm" (p. A6)
(Example)If the resistance to be measured is 100 m
• The 100 m range measurement condition settings are configured separately for each measurement current. Consequently, the 100 m range measurement condition settings should be configured after first setting the measurement current.
• During measurement, a transient current equal to about 1.5 times the steady-state current will flow for sev-
eral microseconds (or about 10 mApk in the 1 k range). Exercise special care when measuring targets
whose characteristics are prone to vary.
www.GlobalTestSupply.com
29
The Basic Settings screen appears.
1
Selection
2
See table below
(default)
Press the up/down cursor keys to change the
setting.
3.3 Setting the Measurement Speed
3.3Setting the Measurement Speed
The measurement speed can be set to FAST, MED (medium), or SLOW. A slower measurement
speed provides greater measurement precision, and a faster measurement speed results in greater
susceptibility to environmental noise. Ensure that measurement cables and the sample are sufficiently shielded.
The averaging function can be used to further stabilize measured values. (p. 48)
Open the Basic Settings screen.
1
Select the measurement speed.
2
3
Return to the Measurement screen.
3
Relationship Between Measurement Range and Speed
(factory defaults)
Measurement Range
10m
Average: 16 times
11 ms17 ms
10m
100m
(1A)
100m
(100mA)
2.0 ms6.4 ms
1000m
10
1.6 ms6.0 ms
1.6 ms4.0 ms
100
1.6 ms4.0 ms
1000
FASTMEDSLOW
176 ms272 ms
*1
5.0 ms13 ms
3.8 ms13 ms
752 ms
640 ms
47 ms
40 ms
43 ms
36 ms
43 ms
36 ms
41 ms
35 ms
41 ms
34 ms
41 ms
34 ms
41 ms
34 ms
Integration time can be optionally set for each range (p. 46).
Upper value: for 50-Hz power line frequency
Lower value: for 60-Hz power line frequency
Tolerance:
(Without retry)
*1 When performing external trigger measurement.
When performing internal trigger measurement, same as
when averaging is off.
Trigger signals are automatically generated internally for continuous
measurement.
Measure with internal (INT) triggering
To measure automatically
Measurements are triggered by an external signal.
Manual measurement triggering is also available.
• Apply a trigger signal at the EXT I/O connector (p. 89)
• Send the TRG command by communications interface (p. 130)
• Press F4 [MANU] (only appears when EXT is selected)
Measure with external (EXT) triggering
To measure at specific times
To retain measured values
• When internal triggering is enabled, the EXT I/O TRIG signal and the “TRG” command are ignored
(except for memory storage and statistical calculations).
• When using the internal trigger, the delay time (DELAY1) is obtained by adding 100 ms to the setting (to
prevent heat generation).
• To measure samples such as inductors that require time to settle, adjust delay time DELAY2. Start with
a long delay, and gradually shorten it while watching for the measured value to settle.
See: "4.2 Setting Pre-Measurement Delay" (p. 42)
• When external triggering is enabled, the Auto-Memory function is disabled by force.
The Basic Settings screen appears.
1
Selection
2
Internal trigger
External trigger
(default)
Press F3 [EXT] to display the F4 [MANU] indicator.
Press to trigger a measurement manually.
Press the up/down
cursor keys to
change the setting.
Select internal (INT) or external (EXT) triggering.
2
Continuous measurement (:INITIATE:CONTINUOUS ON) is the normal trigger state when operating from
the front panel. Selecting the internal (INT) trigger source activates continuous triggering ("free-run"). When
external (EXT) triggering is selected, each external trigger event initiates one measure ment. Continuous measurement can be disabled by sending the
IB. When continuous measurement is disabled, trigger acceptance is controlled only by the host (computer or
PLC).
:INITIATE:CONTINUOUS OFF command via RS-232C or GP-
www.GlobalTestSupply.com
31
The Basic Settings screen appears.
1
Selection
2
Press the up/down
cursor keys to
change the setting.
Increments the
range
Decrements the
range
3.5 Selecting the Measurement Range
3.5Selecting the Measurement Range
The measurement range can be set as follows. When making comparator settings with the panel
keys, the measurement range is selected automatically according to the settings (reference/tolerance or upper/lower thresholds, see the following table). When the comparator settin gs are made by
remote control commands, the measurement range is unaffected.
Changing the Range
Measurement error is larger when measuring values nearer the bottom of a measurement range.
Auto-Ranging (when making comparator settings)
Reference (REF%) and
Upper/Lower Threshold (ABS) Ranges
0 to 10.009 m10 m
10.01 to 100.09 m100 m
100.1 to 1000.9 m1000 m
1.001 to 10.009 10
10.01 to 100.09 100
100.1 to 1200.0 1000
Selected Range
3
Manual Range Selection
Open the Basic Settings screen.
1
Select the range.
2
• 10m, 100m, 1000m, 10, 100, 1000 (default)
Return to the Measurement screen.
3
• The measurement range is automatically selected when using the comparator function, but an OvrRng
error may occur when the scaling function is on. If this occurs, set an appropriate range manually.
For example, the 1,000 m range will be selected under the following conditions, but the measurement target of 2 will result in an OvrRng error:
• During measurement, a transient current equal to about 1.5 times the steady-state current will flow for several microseconds (or about 10 mApk in the 1 k range). Exercise special care when measuring targets
Press the up/down cursor keys to change the
setting.
1
Selection
2
Disable zero adjustment (cancel)
Execute zero adjustment
3.6 Zero Adjustment
3.6Zero Adjustment
When four-terminal measurement (Kelvin connection) is impractical such as when measuring very
small samples, the additional inherent resistance of the two-terminal wiring should be canceled out.
The zero-adjustment function can cancel out up to 10 additional resistance.
Before Zero Adjustment
• The guaranteed accuracy of the instrument applies to four-terminal connections without zero adjustment.
When using four-terminal connections, do not execute zero adjustment. Executing zero adjustment with
incorrect wiring may amplify measurement error. However, zero adjustme nt may be nee ded even with fourterminal measurements if they are affected by a large offset voltage, such as due to thermal emf.
• Execute zero adjustment when the ambient temperature has changed, or when a probe is replaced.
Execute zero adjustment after the warm-up period following power on.
Open the Basic Settings screen.
1
Select the internal (INT) trigger mode.
2
Short the probes together.
3
Confirm that the measured value does not exceed 10 .
4
If no measured value is displayed, increment the measurement range (p. 31).
Select whether to enable or disable zero adjustment.
5
After confirming that the measured value does not exceed 10 , execute zero adjustment.
If zero adjustment fails, the following error message appears.
33
3.6 Zero Adjustment
Before attempting zero adjustment again, confirm the following:
• With the 10 range selected, confirm that the displayed value does not exceed 10 .
• Confirm that the probe connections are correct.
When the scaling calculation function is on, you may be unable to zero out the measured value, even if you
perform zero adjustment (because the zero-adjusted measured value is still subject to scaling calculation).
Decide whether a measured value is
within specified tolerance limits relative to a specified reference value
(p. 35)
Select the ABS (absolute values) decision
mode
Decide whether a measured value is
between specified upper and lower
threshold values (absolute values)
(p. 37)
12.000 m .... reference value
+0.080%........ positive tolerance
-0.080%......... negative tolerance
example
100.00 m .... upper threshold
80.00 m ...... lower threshold
example
Hi
IN
IN
Lo
Hi
IN
Lo
Positive
tolerance [%]
Reference value [
]
Negative
tolerance [%]
Upper
threshold [
]
Lower
threshold [
]
3.7 Judging Measured Values (Comparator Function)
3.7Judging Measured Values
(Comparator Function)
Comparator results are available as external output (at the
EXT I/O connector) when the comparator reference/tolerance
or upper/lower threshold values have been set.
See: "Chapter 8 External Co ntrol" (p. 89)
Comparator results are also indicated by the COMP Hi/IN/Lo
panel lamps, and by audible beeper (disabled by default).
See: "Setting the Comparator Decision (“JUDGE”) Beeper" (p. 66)
The comparator decision mode can be set as one of the following:
Before Using the Comparator Function
• When the measured value is out of the selected measurement range, comparator decision indicators
appear as follows. In the event of a measurement fault, no decision is made.
See:"3.8 Confirming Faulty Measurements" (p. 38)
Out-of-Range DisplayComparator Decision Indicator
+OvrRngHi
-OvrRngLo
• If power is turned off during comp arator setting, changes to settings are lost as they revert to their previous
values. To accept the settings, press the ENTER key.
• When setting comparator criteria, the appropriate range is selected automatically. Refer to "Auto-Ranging
(when making comparator settings)" (p. 31) for range settings.
Deletes entered digits.
This key is enabled only when entering numerical values.
To change the value after selecting the
units, use the cursor keys to select
the item to change, then enter the new value with the tenkeys.
1_10_10._10.5_10.500
m
(Example: 10.5m)
2
Selection
To Reset Numerical Values
Deletes entered digits.
This key is enabled only when entering numerical values.
To change the value after selecting the
units, use the cursor keys to select
the item to change, then enter the new value with the tenkeys.
To Set a Negative Value
Press this key to change the sign,
as needed.
1
+4_+4._+4.5_+4.500%
(Example: 4.5%)
2
Selection
• Internal calculations are performed on floating-point values, and decisions round up any fraction of the
least-significant digit.
• Displayed values of the reference and tolerances are rounded according to the selected range. Internal
calculations use unrounded data, so decisions are based on the entered (setting) values.
• An error message appears if you press ENTER with the positive tolerance set lower than the negative
tolerance.
See: "11.3 Error Displays and Remedies" (p. 185) (ERR:001)
3.7 Judging Measured Values (Comparator Function)
Set the reference value.
2
Pressing an inoperative key during setting sounds a low-pitch beep (when the key beeper is enabled).
Press the units key to accept the setting and move the cursor to the positive tolerance.
Set the positive tolerance.
3
Press the % key to accept the setting and move the cursor to the negative tolerance value.
The negative tolerance is initially set to the same amplitude as the positive tolerance (change as needed).
Set the negative tolerance in the same way (as needed).
4
Accept the settings and return to the Measurement screen.
Appears when the measured value is outside of the measurement or display range.
Check for a broken sample component.
The comparator result is Hi when +OvrRng is displayed, and Lo when -OvrRng is displayed.
No external measurement fault signal (ERR
) is output.
Out-of-Range
The resistance between the H
POT
and H
CUR
probe contacts, and between the L
POT
and L
CUR
probe contacts, are measured and compared with specified contact fault values.
An error message appears when the measured value reaches or exceeds the specified contact fault
values.
If this error persists, probe wear or cable failure may be the cause.
If the error is not cleared by shorting the tips of a known-good measurement cable, the instrument
requires repair.
Contact Check Fault
This method monitors the stability of the voltage between H
POT
and L
POT
probe contacts.
An error message appears when voltage instability is detected due to chattering of the probe contacts.
If this error persists, the probes may be degraded due to wear.
C.E. Volt may also be displayed when external noise is strong.
Voltage Level Monitor Fault
See: "Out-of-Range Detection Function" (p. 39)
See: "4.6 Checking for Poor or Improper Contact
(Contact Check Function)" (p. 49)
See: "4.8 Detecting Measurement Voltage Faults
(Voltage Level Monitor Function)" (p. 52)
This display appears after changing measurement settings and before the next measurement is
performed.
- - - - - - -
Display Examples: Display Measurement State and Appearance with Open-Circuit Probe
Display Measurement State
Current Monitor Results
Normal (PASS)Fault (FAIL)
Contact Check Results
Voltage Level Monitor
Results
Normal
(PASS)
Display: Measured Value
COMP indicator: According to the
measured value
Display: +OvrRng
COMP indicator: Hi
(when connection to the measurement object is broken)
Fault
(FAIL)
Display: C.E. Hi/ C.E. Lo/ C.E. Volt
COMP indicator: No decision
EXT I/O: ERR
signal output
Display: C.E. Hi/ C.E. Lo/ C.E. Volt
COMP indicator: No decision
EXT I/O: ERR signal output
+OvrRng
-OvrRng
C.E. Hi
C.E. Lo
C.E. Volt
Display
Display
Display
This method monitors the regulated measurement current for normal flow through the DUT.
An error is detected mainly when a measurement fault occurs due to an open-circuit DUT or between the H
CUR
and
L
CUR
probe's poor contacts.
The error display depends on the contact check and voltage level monitor states (see the table below).
Current Monitor Fault
See: "Current Monito r Function" (p. 39)
The measurement fault display differs according to detection order
and settings.
3.8 Confirming Faulty Measurements
3.8Confirming Faulty Measurements
When a measurement is not performed correctly, a measurement fault indicator appears and a
measurement fault signal is output at the ERR
detection).
The instrument detects measurement faults by the following four methods.
pin of the EXT I/O connector (except for out-of-range
Measurement fault detection
proceeds in the order shown at
the left, ending with display of
the first detected error.
Corresponding measurement
fault signals are also output at
the EXT I/O connector.
3
Examples of Out-of-Range Faults
Out-of-Range DetectionMeasurement Example
The measured value is outside of the
measurement range.
The relative tolerance (%) display of
the measured value exceeds the display range (999.999%).
The zero-adjusted value is outside of
the display range.
While measuring, input voltage exceed the A/D converter input range.
Attempting to measure 13 with the 10 range selected
Measuring 500 (+2400%) with a reference value of 20
In the 1000 m range with 0.5 zero-adjustment in effect, measuring 0.1
provides a zero-adjusted value of -0.4 , which is outside of the display range.
Measuring a large resistance value in an electrically noisy environment
Current Monitor Function
• The instrument supplies constant measurement current through the DUT via the H
current monitor fault occurs if constant current cannot be attained. If the contact check and voltage level
monitor results are normal, the out-of-range and comparator result displays indicate “Hi”.
• Wiring resistance in excess of the following values may cause a current monitor error, making measurement impossible. When using measurement current 1 A ranges, keep the wiring resistance as well as the
contact resistance between the DUT and probe low.
Range10m100m100m1000m101001000
Measurement Current1 A1 A100 mA100 mA10 mA10 mA1 mA
Between H
Between L
The Measurement Settings Screen
appears.
[MEAS SETTINGS]
1
Selection
2
1
2
Selection
Customizing Measurement
SettingsChapter 4
(set as needed)
Change measurement settings as appropriate for your application.
Refer to "Detailed Settings Screens" (p. 19) for the available settings.
4.1Making Range-Specific Measurement
Settings
41
4
These settings can be made for each range (except for the DELAY1 setting).
Open the Basic Settings screen.
1
Open the Measurement Settings Screen.
2
Select the range to use.
3
Set the items as needed.
4
The 100 m range measurement condition settings are configured separately for each measurement current.
Consequently, the 100 m range measurement condition settings should be configured after first setting the
measurement current (p. 28).
The DELAY1 setting is common to all ranges. The default setting is 0 ms (corresponding to trigger signal input at the same
time as probe contacts become stable). Setting DELAY1 affects
measurements in all ranges.
Set DELAY1
Adjust this setting to allow for
probe contact mechanical stabilization.
Set DELAY2 to the time needed for stabilization after measurement current is applied, such as may be required for inductive
components. The setting affects only the selected range. The
default setting is 0 ms (corresponding to resistance measurement of non-inductive components).
Set DELAY2
Adjust this setting to allow for stabilization of the measurement
sample.
DELAY1 and DELAY2 Timing Chart
* Internal delay is provided to suit purely resistive (non-reactive) DUTs,
and is different for each measurement range.
Acquisition
Stable Contact
Internal
Delay*
Probe Contact
Condition
Start
TRIG
Measurement
Current
Acquisition of
Measured Value
End of Measurement
Signal
EOM
4.2 Setting Pre-Measurement Delay
4.2Setting Pre-Measurement Delay
This setting specifies the delay between trigger signal input and the start of measurement.
Adjust this setting to delay measurement until the measured value has time to st abilize, so that even
if the sample is connected after triggering, measurement starts only after the specified delay. The
delay can be set by two methods, as follows.
The Measurement Settings Screen
appears.
[MEAS SETTINGS]
1
2
Selection
1
2
Setting range: 0.0 ms (default) to 100.0 ms
DELAY1 is common to all ranges, while
DELAY2 can be set for each range independently (p. 41).
Tenkeys
3
Selection
The confirmation screen appears.
Return to the setting screen.
Save setting and return to
previous screen.
Discard setting and return to
previous screen.
4.2 Setting Pre-Measurement Delay
Determining the Delay Time
Set the delay so that inductance does not affect measurements.
To fine tune the delay, begin with a longer delay than necessary, then gradually shorten it while watching the
measured value.
Open the Basic Settings screen.
1
Open the Measurement Settings Screen.
2
Set DELAY1 or DELAY2.
3
Return to the Measurement screen.
4
4
When using the internal trigger, the delay time (DELAY1) is obtained by adding 100 ms to the setting (to prevent heat generation).
The Measurement Settings Screen
appears.
[MEAS SETTINGS]
1
2
Selection
Selection
1
2
Disables the function (default)
(go to step 6)
Enables the function
The setting is specific to the selected range
(p. 41)
1
2
Setting range: 0.50000 to 2.00000 (default: 1.00000)
Tenkeys
3
Selection
4.3 Correcting Measured Values (Scaling Function)
4.3Correcting Measured Values
(Scaling Function)
When measuring the resistance of current sensing resistors, there may be a discrepancy between
the resistance value at the time of mounting on the board being used and the resistance value
obtained when measuring the component alone (due to the ef fects of the probing location and other
factors). The scaling function corrects the resistance measured value obtained from the component
alone to yield the resistance value during actual use. Scaling is performed by me ans of the following
equations:
Rs = A × R + B
R : Measured value before compensation
Rs: Resistance value after compensation
A : Compensation coefficientSetting range: 0.50000 to 2.00000 (default: 1.00000)
B : Offset resistance valueSetting range: ±10% of full scale for each range
Setting range: ±10% of full scale for each range (default: 0 m)
Tenkeys
3
Selection
The confirmation screen appears.
Return to the setting screen.
Save setting and return to
previous screen.
Discard setting and return to
previous screen.
5
Return to the Measurement screen.
6
45
4.3 Correcting Measured Values (Scaling Function)
4
• Scaling calculation is performed on measured values after zero-adjustment calculation. Consequently,
measured values may not equal zero even after zero adjustment.
• For the purpose of setting the offset resistance value, range full-scale signifies 1,200,000 dgt.
The Measurement Settings Screen
appears.
[MEAS SETTINGS]
(The settings for the current measurement range are displayed.)
1
Selection
2
1
Selection
Set in units of time
Set in units of power line cycles
2
The setting is specific to the selected range
(p. 41)
4.4 Setting the Measurement Integration Time Option
4.4Setting the Measurement Integration Time
Option
The integration time can be optionally set for each range by selecting FAST, MED, or SLOW measurement speed. Integration time can be set in ms or PLC* units.
* PLC = Power Line Cycle, where one PLC is the period of the power line waveform. At 50 Hz, one PLC = 1/50th of a sec-
ond, and at 60 Hz, one PLC = 1/60th of a second.
PLC setting units are useful where measurements may be affected by power line noise (high- or low-resistance measurements)
• When setting power-line-cycle units: 1 to 6PLC (60 Hz),
1 to 5PLC (50 Hz)
2
3
The confirmation screen appears.
Return to the setting screen.
Save setting and return to
previous screen.
Discard setting and return to
previous screen.
4
Return to the Measurement screen.
5
47
4.4 Setting the Measurement Integration Time Option
4
• The instruments accuracy specifications are applicable only with the default integration
times. Investigate your measurement requirements carefully before changing the integration time.
• When the ef fects of power line noise can be ignored, the integration time can be set longer
than the default to reduce scattering of measured values. On the other hand, if the inte gr ation time is too short, scattering increases.
The averaging function averages multiple measured values to stabilize them. Accuracy specifica-
*1
tions have been determined for the 16-iteration averaging setting in the 10 m range
more precise measurement to be performed.
For internal trigger measurement, a moving average is calculated. For external trigger measurement (and
:READ? command operation), a simple average is used.
Default settingAveraging function:OFF
Number of averaging iterations:16Times
Open the Basic Settings screen.
1
, allowing
Open the Measurement Settings Screen.
2
Enable the averaging function.
3
Set the number of averaging iterations.
4
Return to the Measurement screen.
5
*1. SPEED = SLOW setting only.
Turning on the averaging function lengthens the external trigger measurement (and :READ? command operation) time to (number of averaging iterations measurement time with averaging turned off). Since a moving
average is used for internal trigger measurement, the measurement time does not change.
The Measurement Settings Screen
appears.
[MEAS SETTINGS]
1
Selection
2
Selection
1
2
Disables the function (go to step 5)
Enables the function (default)
The setting is specific to the selected range
(p. 41)
Selection
1
2
50, 100 (default), 150, 200, 300,
400, 500
A contact fault occurs when a measured
value exceeds the threshold setting.
The confirmation screen appears.
Return to the setting screen.
Save setting and return to
previous screen.
Discard setting and return to
previous screen.
4.6 Checking for Poor or Improper Contact (Contact Check Function)
4.6Checking for Poor or Improper Contact
(Contact Check Function)
This function detects poor contact between the probes and DUT, and broken measurement cables.
The instrument continually monitors the resistance between the H
and L
L
CUR
When the resistance is outside of the specified value, a contact check fault occurs and the C.E. Hi
or C.E. Lo error message appears. No comparator decision is applied to the measured value . When
these error messages appear, check the probe contacts, and check for broken measurement
cables. If the error is not cleared by shorting the tips of a known-good measurement cable, the
instrument requires repair.
• During low-resist ance measure ment, poor co ntact of the H
range measurement.
• When contact checking is disabled, measured values may be displayed even when a probe is not contacting the DUT.
probes from the start of integration (including response time) and while measuring.
POT
or L
CUR
CUR
and H
CUR
probe may be detected as an out-of-
probes and the
POT
4
Open the Basic Settings screen.
1
Open the Measurement Settings Screen.
2
Enable the Contact Check function.
3
Select the contact check fault threshold resistance.
Probe contacts can be improved by applying current from the POT to the CUR probes before measuring.
The Contact Improver function applies voltage to the sample. Be careful when measuring
samples with characteristics that may be affected.
The current used for the Contact Improver functions can be selected as follows.
17 mA, 25 mA, 35 mA (default), 50 mA
Higher current provides more effective contact improvement, but at the cost of faster probe deterioration.
Contact Improver current can be set to be disabled (OFF), enabled (ON), or PULSE.
The PULSE setting applies the contact improvement current for about 100 µs immediately before measurement. The PULSE setting is useful to decrease Joule heating if the DUT is susceptible to its current.
DUT currentSteady-state current: 2 mA max. *
DUT voltage15 V max.
*:It takes several microseconds for the DUT current to reach the steady-state value. Until the steady-state
value is reached, a transient current that is approximately equal to the contact improvement current setting
(default setting: 35 mA) will flow.
The Measurement Settings Screen
appears.
[MEAS SETTINGS]
1
Selection
2
Selection
1
2
Disables the function (go to step 5)
Enables the function (default)
The setting is specific to the selected range (p. 41)
Selection
1
2
Loose
Normal (default)
Severe
The confirmation screen appears.
Return to the setting screen.
Save setting and return to
previous screen.
Discard setting and return to
previous screen.
4.8 Detecting Measurement Voltage Faults (Voltage Level Monitor Function)
4.8Detecting Measurement Voltage Faults
(Voltage Level Monitor Function)
When a measurement voltage fault occurs due to probe chattering, the C.E. Volt error message
appears on the measurement screen and an
The C.E. Volt error may also appear when external noise is strong.
The Measurement Settings Screen
appears.
[MEAS SETTINGS]
1
Selection
2
Selection
1
2
Measurement current is applied while
awaiting trigger.
Measurement current is applied only
while measuring (default).
The setting is specific to the selected range (p. 41)
The confirmation screen appears.
Return to the setting screen.
Save setting and return to
previous screen.
Discard setting and return to
previous screen.
4.9 Applying Current Only When Measuring (Current Mode Setting)
4.9Applying Current Only When Measuring
(Current Mode Setting)
When the Contact Improver function is set to Pulse or disabled (CONT IMP: PULSE or OFF) and
measurement current is set for pulse output, open-circuit voltage when not measuring does not
exceed 20 mV.
When the Contact Improver fu nctio n is enab led (CONT IMP: PULSE or ON setting), the current mode setting
is ignored even if set to continuous (CURRENT MODE: CONT setting). The Contact Improver function forces
pulse operation with measurement current applied only during measurement.
Open the Basic Settings screen.
1
4
Open the Measurement Settings Screen.
2
Select whether to apply current when not measuring.
3
To apply measurement current continuously (CONT setting) even when waiting for a trigger, confirm that
the Contact Improver function is disabled (CONT IMP: OFF, (p. 50)).
4.10 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)
4.10 Test for Short-Circuited Probe
(Probe Short-Circuit Detection Function)
Four-terminal measurements are not possible when a conductive foreign object is present between the POT and CUR probe tips. To
detect short-circuited probes, this function measures the resistance
between the CUR and POT terminals after a specific time (initially 5
ms) following the end of measurement. Probe short-circuit detection
is disabled by default.
When a probe short-circuit is detected, an error message appears on
the measurement screen, and the
output. (
Short-circuit detection can also be controlled by asserting the active-low PRB_CHECK EXT I/O signal.
Asserting the PRB_CHECK
end of measurement (p. 89).
ERR:021 Probe short error)
signal while measuring causes short-circuit detection to be performed after the
PRB_SHORT and ERR signals are
About Probe Short-Circuit Detection
• If probes are connected to the DUT during probe short-circuit detectio n, the short circuit is detected. Ensure
that the probes have sufficient time to separate from the measurement object.
• Probe short-circuit detection occurs within about 1 ms.
• The threshold for probe short-circuit detection is fixed at 500 , so if the resistance b etween CUR and POT
probes is larger, detection is not possible.
•
Even while the probe short-circuit detection function is set to be disabled, short-circuit detection is performed when the
EXT I/O PRB_CHECK signal is asserted.
• When the internal trigger [TRG: INT] source is selected, short-circuit detection is not performed after the end of mea-
• If probe short-circuit detection coincides with the timing of self-calibration processing, short-circuit detection will not be
surement. However, short-circuit detection can still be executed by asserting the PRB_CHECK signal.
performed. Short-circuit detection using the PRB_CHECK
completes.
www.GlobalTestSupply.com
signal will be performed after self-calibration processing
4.10 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)
The Basic Settings screen appears.
The System screen appears.
[SYSTEM]
1
Selection
2
Selection
1
2
Disables the function (default)
(go to step 5)
Enables the function
Selection
1
2
Setting range: 1 to 100 ms, 5 ms (default)
Short-circuit detection is delayed for the specified time following the end of measurement.
3
The confirmation screen appears.
Return to the setting screen.
Save setting and return to
The SET MONITOR connectors are identical
to RS-232C connectors. Be careful to avoid
connecting the wrong connectors.
The Basic Settings screen appears.
The System screen appears.
[SYSTEM]
1
Selection
2
Selection
1
2
Disables the function (default)
Enables the function
4.11 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)
4.11Comparing the Measurement Settings of
Two Instruments
(Settings Monitor Function)
This function automatically compares the settings of two
instruments to determine whether they are the same.
Only those measurement settings affecting the comparator and speed are compared. When the settings differ,
an alarm notification appears and subsequent
nal input is prevented from starting measurement.
When the settings of two instruments match, TRIG input is
accepted and measurement starts. However, if the range
defined by the upper and lower thresholds of the second
stage is broader than that of the first stage, measurement still
starts despite the different threshold settings.
TRIG sig-
Connect the two instruments’ SET MONITOR connectors together using a Hioki 9637
4.12 Retrying Measurement After a Fault (Retry Function)
Retry
Chatter
Probe Contact
Condition
Start
TRIG
Contact
Improver
Measurement
Current
Contact Check
End of Measurement
EOM
The Basic Settings screen appears.
The System screen appears.
[SYSTEM]
1
Selection
2
Selection
1
2
Retry disabled (go to step 5)
Retry enabled (default)
Selection
1
2
Setting range: 1 to 50 ms (default: 50 ms)
3
The confirmation screen appears.
Return to the setting screen.
Save setting and return to
previous screen.
Discard setting and return to
previous screen.
4.12 Retrying Measurement After a Fault
(Retry Function)
The Retry function causes measurement to be
automatically retried when a measurement fault
occurs due to probe chatter.
During Retry, all measurement operations including Contact Improvement and DELAY2 (but excluding DELAY1)
are restarted.
If a measurement fault persists after the specified continuous retry interval (e.g., if the DUT is not connected),
retrying is aborted and the
Retry is enabled, the maximum time to end-of-measurement occurs when recovering from a measurement fault
immediately before the retry interval expires, which
approaches the sum of the retry interval setting plus normal measurement time. Decreasing test throughput may
indicate probe maintenance is required.
Internal self-calibration is performed automatically once
every 10 minutes.
Self-calibration is performed at the user's desired timing using the external control CAL input signal or a communications command. Using this setting prevents self-calibration
from being performed automatically at unexpected times.
To maintain measurement precision, the instrument self-calibrates to compensate for internal circuit
offset voltage and gain drift. This function cannot be disabled.
You can select between two self-calibration function execution methods.
During self-calibration, the subsequent measurement is delayed for about 6PLC + 10 ms (PLC = Power Line
Cycles) for internal circuit compensation.
Self-Calibration Timing
Within 130 ms at 50 Hz, or 110 ms at 60 Hz
4.14 Compensating for Thermal EMF Offset (Offset Voltage Compensation - OVC)
• When the timing of self-calibration overlaps with a measurement, self-calibration is postponed until the end
of measurement.
• When a trigger signal is applied during self-calibr ation, th e start of the triggered measurement is postponed
until self-calibration is finished.
• Self-calibration executes automatically after changing comparator or measurement speed settings.
• During self-calibration, measureme nt curr en t an d th e Con tact Impr ov er curr e nt ar e inh ib ite d.
• When configuring manually, be sure to perform self-calibration if the temperature of the environment in
which the instrument is operating changes by 2 degrees or more. (Accuracy cannot be guaranteed if selfcalibration is not performed.)
4.14 Compensating for Thermal EMF Offset
(Offset Voltage Compensation - OVC)
This function automatically compensates for offset voltage resulting from thermal emf or internal
instrument bias. (OVC: Offset Voltage Compensation)
See: "Appendix 2 Effect of Thermal emf" (p. A2)
The following value is known to be a true resistance value from RP (>0), the value measured with
current flowing in the positive direction, and R
negative direction.
Offset voltage compensation is automatically enabled for all ranges, and cannot be modified or disabled.
Depending on the test object, some delay (DELAY2) is required (p. 42) to allow adequate current flow before
starting measurement.
(<0), the value measured with current flowing in the
Key operations other than comparator settings (REF%, ABS, units and tenkeys)
and F1 [UNLOCK] keys are disabled.
To disable key operations: select [MENU]
[M.LOCK] is displayed when returning to the measurement screen.
Disabling All Except Comparator Settings
Only comparator
settings are enabled.
All key operations except F1 [UNLOCK] are disabled.
To disable key operations: select [FULL]
[F.LOCK] is displayed when returning to the measurement screen.
Disabling All Key Operations Including Comparator
Settings
Key operations to
change settings are
disabled (although keylock can be canceled).
Asserting (Low) the EXT I/O KEY_LOCK signal disables all panel keys, including
F1 [UNLOCK] and F1 [LOCAL] (disables remote control) (p. 89).
To disable the key-lock function and re-enable the keys, de-assert (High) the
KEY_LOCK
signal.
Disabling All Panel Keys
All key operations are
disabled.
The Basic Settings screen appears.
1
Selection
2
Key operations enabled (default)
Disable all except key-lock cancel
Disable all except key-lock cancel and
comparator setting change
[UNLOCK] is displayed only
when key-lock is enabled by
front panel key operations.
System SettingsChapter 5
5.1Disabling and Enabling Key Operations
Disabling Key Operations (Key-Lock Function)
Activate the key-lock function to disable the instrument’s front panel key operations.
Three key-lock levels are available to suit specific purposes.
Automatically detect local line frequency
(default)
When the line frequency is 50 Hz
When the line frequency is 60 Hz
The confirmation screen appears.
Return to the setting screen.
Save setting and return to
previous screen.
Discard setting and return to
previous screen.
5.3 Power Line Frequency Manual Setting
5.3Power Line Frequency Manual Setting
For proper electrical noise suppression, the instrument needs to be set to match the power line frequency. With the default setting (AUTO), the instrument attempts to automatically detect the line frequency, but manual setting is also available.
Unless the line frequency is set correctly, measured values may be unstable.
An error message appears if line noise is high enough to prevent correct frequency detection
(ERR:041(p. 185)). In that case, set the instrument’s line frequency manually.
When the AUTO setting is selected, the line frequency is automatically set to 50 or 60 Hz when the instrument
is turned on or reset.
However, automatic detection is not available when the line frequency changes after turning power on or
resetting.
If the actual line frequency deviates from 50 or 60 Hz, select the closest frequency.
Examples:
If the actual line frequency is 50.8 Hz, select the 50 Hz setting.
If the actual line frequency is 59.3 Hz, select the 60 Hz setting.
Enter the last two digits of the year, and the month, day, hour, minutes and
seconds in that order (the cursor moves automatically).
Enter two digits for all values (e.g., 09).
Clock settings cannot be canceled.
5.4 Setting the Clock
5.4Setting the Clock
To record and print the correct time when using statistical calculations (p. 78), the clock needs to be
set correctly. The time of printing is also output when printing statistical calculation results.
0 to 100 ms (all ranges)0 msProbe delay setting (p. 42)
0 to 100 ms0 msDUT response setting (p. 42)
OFF/ ON
Coefficient A
Offset B
0.1 ms to 100 ms
1PLC to 6PLC (60 Hz)
1PLC to 5PLC (50 Hz)
OFF/ ON
2 to 32 times
OFF/ ON
50 / 100 / 150 / 200 / 300
/ 400 / 500
OFF/ ON/ PULSE
17 mA/ 25 mA/ 35 mA/ 50 mA
OFF/ ON
LOOSE/ NORMAL/ SEVERE
CONT/ PULSEPULSECurrent mode setting (p. 53)
OFF/ ONOFFAuto-Memory function (p. 75)
OFF/ ONOFF
OFF/ ONOFFData output function (p. 81)
OFF/ ON,
1st/ 2nd, 0.000% to 9.999%
OFF/ ON, 0 to 100 msOFF, 5 msProbe short-circuit detection (p. 54)
OFF/ ON, 1 to 50 msON, 50 msRetry function (p. 59)
OFF EDGE/ ON EDGEON EDGEStart Logic Setting (p. 98)
PULSE/ HOLD
1 to 100 ms
GP-IB/ RS232C/ PRINT
100mA/ 1A100mA
AUTO/ MANUAUTO
OFF/ ON
IN/ HI/LO/ LOW/ HIGH
OFF/ ONONKey beeper (p. 63)
AUTO/ 50 Hz/ 60 HzAUTOLine frequency (detection) (p. 67)
0 to 10050Screen contrast adjustment (p. 69)
0 to 100 80Screen backlight adjustment (p. 70)
--Reset (p. 71)
--Calibration (p. A16)
1000 Range selection (p. 31)
OFF
A: 1
B: 0
Depends on measurement range Integration time (p. 46)
OFF, 16TimesAveraging function (p. 48)
ON, 100 Contact-check (p. 49)
ON, 35 mAContact Improvement (p. 50)
ON, NORMALVoltage level monitor (p. 52)
OFF, 1st, 0.000%Settings Monitor function (p. 56)
PULSE, 5 ms
RS232C, 9600bps
GP-IB, ADR01, LF
OFF, HI/LOComparator decision beeper (p. 65)
Scaling function (p. 44)
Statistical calculation function
(p. 78)
End-of-measurement pulse width
(p. 97)
Interface setting (p. 105)
Switching 100 m range measure-
ment currents (p. 28)
Self-calibration operation settings
(p. 60)
Clock setting (p. 68)
www.GlobalTestSupply.com
73
Store up to 30,000 measured values using the EXT I/O TRIG
signal or by pressing F4 [MANU] on the Basic Settings screen.
Data Memory Function (p. 74)
Store measured values at specific times.
This is convenient for batch exporting
data to a controller while switching
reels.
Measured values are automatically stored as they become stable.
When the specified number of data points (up to 99) is acquired,
the beeper sounds and auto-storing halts.
Auto-Memory Function (p. 75)
Store data after measured value
has stabilized.
This is convenient for sample inspection after printing (vapor deposition)
resistors on a board.
Minimizes transfer time by eliminating the need for transmit requests from the remote controller. (RS-232C interface only)
Data Output Function (p. 81)
Automatically output (export)
measurements at the end of
measurement.
Stored measurements are lost when the instrument is turned off.
Therefore, be sure to print out or export important data to a PC.
Storing and
Exporting DataChapter 6
Measured values can be stored or automatically exported, according to application. Stored data can
be output to a printer, RS-232C or GP-IB. Also, statistical calculations can be applied to internally
stored data.
The data memory and auto-memory functions cannot be enabled at the same time.
6.1 Storing Data at Specific Times (Data Memory Function)
6.1Storing Data at Specific Times
(Data Memory Function)
Measured values are stored in the instrument’s internal memory according to the following timings.
(up to 30,000 points)
• Every time a measurement is performed by external (EXT) triggering
• When a trigger is applied during internally (INT) triggered measurement
The following three storage methods are available:
• Store upon receiving an EXT I/O TRIG
• Store upon receiving a
• Store by pressing the F4 [MANU] key on the [MENU] – [TRG] setting screen.
• This function can only be enabled by remote control. The data memory function should be enabled by
remote control beforehand. This setting is not available from the front panel.
• Stored memory dat a cannot be viewed on the instrument’ s scr een. Use remote control commands to export
stored data.
TRG command (p. 130)
signal (p. 89)
Data Memory Function Operating Procedure
Enable data memory mode.
1
Send this remote command to enable the data memory function:
:MEMory:MODE MEMory (p. 146)
Store measured values.
2
Execute external trigger measurement, or apply a trigger during internally triggered measurement.
Export the stored data.
3
Send this remote command to export the measured values stored in the instrument:
:MEMory:DATA? (p. 147)
Clear measurement data from instrument memory.
4
Send this remote command to erase the data from instrument memory:
:MEMory:CLEar (p. 146)
Stored data is automatically erased at the following times:
• when the memory function setting (including auto-mem-
ory) is changed (p. 146)
• when the range is changed (p. 31)
• when changing comparator settings (p. 34)
• when the scaling setting for the current range is changed
• when printing the statistical calculations (p. 86)
• when the DUT is changed (p. 28)
• upon system reset (p. 71)
• when the instrument is turned off
75
Printing (p. 86)
Prepare the printer (p. 83).
Enable Auto-Memory and set
the number of values to store.
Set decision criteria
(p. 34).
Measure
Beeper notifies when the specified number of values is stored.
6.2 Store as soon as Measurement is Stable (Auto-Memory Function)
6.2Store as soon as Measurement is Stable
(Auto-Memory Function)
This function automatically stores the value measured each time the probes cont act the sample with
internal triggering. When the specified number of values has been acquired, auto-storage operation
stops.
St atistical calculations are applied to the stored dat a, with result s output to the screen or printer (RS232C).
See: "6.3 Performing Statistical Calculations on Measured Values" (p. 78)
"Chapter 7 Printing" (p. 83)
Data storage and printing can be automatically controlled by the Auto-Memory function.
The Auto-Memory function is disabled by default.
Enable the Auto-Memory function before settin g the nu m ber of valu es to stor e.
Enabling the Auto-Memory function affects other functions as follows:
• Statistical calculation is forced on.
• The voltage level monitor function is forced off (although the setting itself is not set to OFF, the function is
actually disabled).
• The trigger source setting is forced to internal (INT).
When the trigger source is set to external (EXT), the Auto-Memory function is disabled by force.
Deleting Stored Data
Stored data is automatically erased at the following times:
• when the memory function setting (including auto-mem-
ory) is changed (p. 146)
• when the range is changed (p. 31)
• when changing comparator settings (p. 34)
• when the instrument is turned off
• when the scaling setting for the current range is changed
(p. 44)
• when printing the statistical calculations (p. 86)
• when the DUT is changed (p. 28)
• upon system reset (p. 71)
• upon setting the auto-memory number of values to store
6.2 Store as soon as Measurement is Stable (Auto-Memory Function)
Displays the Auto-Memory setting
screen
Total Count Pass Count (IN) Fail Count (Hi/Lo)
Setting range: 1 to 99
To Reset Numerical Values
Deletes entered digits.
This key is enabled only when entering numerical values.
(Example: 20 values set to be stored)
Setting the Number of Values to Store
Open the Auto-Memory Settings screen.
1
Enter the number of values to store.
2
77
To abort the setting process, press . Settings are abandoned and the display returns to the previous screen.
Accept the settings and return to the Measurement screen.
3
Acquiring Measured Values Automatically
Momentarily disconnect (open-circuit) the probes.
1
Connect the probes to the DUT.
2
6
When the measurement is stable, the value is automatically stored and the count is incremented.
When the count reaches the specified number of values, a long beep sounds, and subsequent measurements are not stored.
The (one) last acquired value can be deleted (Undo function (p. 80)).
6.3 Performing Statistical Calculations on Measured Values
6.3Performing Statistical Calculations on
Measured Values
Statistical calculations can be performed on up to 30,000 measured values, with results displayed.
Printing is also available (p. 86).
Calculation types: average, maximum and minimum values, population standard deviation, sample
standard deviation, process compatibility indices
Maximum value
Minimum value
Average
Population standard
deviation
Standard deviation
of sample
Process capability
index (dispersion) *
Process capability
index (bias)*
• When only one valid data sample exists, standard deviation of sample and process capability indices are
not displayed.
• When
• The upper limit of Cp and CpK is 99.99. If Cp or CpK exceeds 99.99, the value 99.99 is displayed
• Negative values of CpK are handled as CpK = 0.
• If statistical calculation is turned off and then ba ck on again without first clearing calculation results, calculation resumes from the point when it was turned off.
• Measurement speed is restricted when statistical calculation is enabled.
• When Auto-Memory is enabled (ON), statistical calculation is enabled (ON) by force.
• When statistical calculation is disabled (OFF), Auto-Memory is disabled (OFF) by force.
= 0, Cp and CpK are 99.99.
n-1
Xmax = MAX (x1, ....., xn)
Xmin = MIN (x1, ....., xn)
In these formulas, n represents the number of valid
data samples.
Hi and Lo are the upper and lower thresholds of the
comparator.
*. The process capability indices represent the quality
achievement capability created by a process, which
is the breadth of the dispersion and bias of the process' quality. Generally, depending on the values of
Cp and CpK, process capability is evaluated as follows:
Cp, CpK>1.33.........Process capability is ideal
Cp, CpK>1.00 Process capability is adequate
1.33
Cp, CpK.........Process capability is inade-
1.00
quate
Deleting Statistical Calculation Results
Stored data is automatically erased at the following times:
•
when the memory function setting (including data-memory) is changed (p. 146)
• when the range is changed (p. 31)
• when changing comparator settings (p. 34)
• when the scaling setting for the current range is changed
Return to the setting screen.
Save setting and return to
previous screen.
Discard setting and return to
previous screen.
When statistical calculation is enabled, F3 [STAT] appears
on the Measurement screen.
Confirm calculation results (p. 80)
6.3 Performing Statistical Calculations on Measured Values
Using Statistical Calculations
When statistical calculation is enabled and an EXT I/O trigger signal is applied, operation is as follows depending on the trigger source setting:
• With external (EXT) triggering: One measurement is performed and subjected to statistical calculation.
• With internal (INT) triggering: The next measured value after the trigger signal is subjected to st atistical calculation.
Operation is the same in the following cases:
(Key Operations)(Remote Control)
• when pressing the F4 [MANU] key on the [MENU] [TRG] selection screen
• when pressing the F2 [PRINT] key on the Measurement
screen (with internal triggering and Auto-Memory disabled. Appears only when the interface is set for the
printer.)
• when acquiring measured values by the Auto-Memory
function (p. 75)
• when a TRG remote contro l command is
received
• when an EXT I/O print signal is applied on
the Measurement screen (with internal
triggering and Auto-Memory disabled)
Displays the Calculation Results
screen (if statistical calculation is enabled).
Num
Total data count
Val
Number of valid measured values (error-free data)
Ave
Mean
Sn
Population standard deviation
Max
Maximum
Sn1
Standard deviation of sample
Min
Minimum
Cp
Process capability index (dispersion)
Cpk
Process capability index (bias)
Output to the printer.
"Example Printouts" (p. 87)
Statistical calculation results and stored data are erased when printing finishes.
Erases the last measurement and calculation result (executes only once).
Erases all measured values and statistical
calculation results.
After selecting, a confirmation screen appears.
6.3 Performing Statistical Calculations on Measured Values
Confirming, Printing, and Erasing Calculation Results
Statistical calculation results are displayed on the screen.
Printing is also available with the commercially available printer with a serial interface. Calculation
results are automatically erased after printing. Before printing, select the [PRINT] interface setting.
See: "7.2 Instrument Settings" (p. 85)
The number of valid samples can be confirmed on the Calculation Results screen.
• When the number of valid samples is zero, no calculation results are displayed.
• When only one valid data sample exists, no standard deviation or process capability indices are displayed.
Display the Calculation Results screen.
1
To print
2
To print, select the printer as the interface setting on the System screen (p. 85)
Because electric shock and instrument damage hazards are present, always follow
the steps below when connecting the printer.
• Always turn off the instrument and the printer before connecting.
• A serious hazard can occur if a wire becomes dislocated and contacts another con-
ductor during operation. Make certain connec tions are secure.
• As much as possible, avoid printing in h ot and humid environ ments. O therwis e, prin ter life
may be severely shortened.
• Use only compa tible recording p ap er in the printer. Using non-specified paper may not only
result in faulty printing, but printing may become impossible.
• If the recording paper is skewed on the roller, paper jams may result.
Recommended printer
The requirements for a printer to be connected to the instrument are as follows.
Confirm compatibility and make the appropriate settings on the printer before connecting it to
the instrument.
Verify that the instrument and printer settings (p. 85) are correct.
Printing Measured Values and Comparator Decisions
Printing by key operation
Press the PRINT key to print the measured value currently displayed on the Measurement screen.
Printing by external control
Measured values and comparator decisions print when the (active-low) PRINT signal (EXT I/O connector) is connected to ISO_GND.
* ISO_GND is a pin in the instrument’s EXT I/O connector.
*
When statistical calculation is enabled [STATISTIC: ON] and internal triggering [TRG: INT] is selected, statistical calculations are performed and measured values are printed. When external (EXT) triggering is selected, o nly measured values
are printed. Use the TRIG
signal to perform statistical calculations with external triggering.
Printing Statistical Calculation Results
Statistical calculation results can be printed when auto-memory or statistical calculation is enabled
(ON). To print, select PRINT on the screen or connect the (active-low) PRINT
connector to ISO_GND.
To enable auto-memory:
See: "6.2 Store as soon as Measurement is Stable (Auto-Memory Function)" (p. 75)
To enable statistical calculation:
See: "6.3 Performing Statistical Calculations on Measured Values" (p. 78)
signal on the EXT I/O
If no valid data exists, only the data count is printed. When only one valid data sample exists, standar d deviation of sample and process capability indices cannot be printed.
Connect the instrument’s EXT I/O
connector to the signal output or
input device.
Make instrument settings
(p. 97)
8.1 External Input/Output Connector and Signals
External ControlChapter 8
The EXT I/O connector on the rear of the instrument supports external control by providing outp ut of
the end-of-measurement and comparator decision signals, and accepting input of measurement
trigger and key-lock signals. All signals are isolated by optocouplers (inputs and outputs share a
common signal ground).
Confirm input and output ratings, understand the safety precautions for connecting a control system, and use accordingly.
8.1External Input/Output Connector
and Signals
To avoid electric shock or damage to the equipment, always observe the following
precautions when connecting to the EXT I/O terminals.
• Always turn off the power to the instrument and to any devices to be connected
before making connections.
• Be careful to avoid exceeding the ratings of external terminals (p. 95).
• During operation, a wire becoming dislocated and contacting another conductive
object can be serious hazard. Use screws to secure the external connectors.
• Ensure that devices and syste ms to be connected to the EXT I/O ter minals ar e prop-
erly isolated.
• The ISO_5V pin of the EXT I/O connector is a 5 V power output, and the ISO_12V pin
is a 12 V power output. Do not apply external power to this pin.
To avoid damage to the instrument, observe the following cautions:
• Do not apply voltage or current to the EXT I/O terminals that exceeds their ratings.
• When driving relays, be sure to install diodes to absorb counter-electromotive force.
• Be careful not to short-circuit ISO_5V to ISO_COM.
• Be careful not to short-circuit ISO_12V to ISO_COM.
• Do not draw loads from ISO_5V and ISO_12V at the same time.
•The 0ADJ signal should be asserted (Low) for at least 10 ms.
• The connector shell is conductively connected to the metal instrument chassis and the protective earth pin
of thepower plug. Be aware thatit is not isolated from ground.
www.GlobalTestSupply.com
Signal Descriptions
Input Signals
When external triggering (EXT) is enabled, one measuremen t is performed at the fall ing (ON)
or rising (OFF) edge of the TRIG
selected on the Settings screen (default: falling (ON) edge).
When internal triggering (INT) is enabled, external triggering is disabled. Also, when the Set-
TRIG
tings Monitor function is enabled and an error occurs, triggering is disabled (p. 56).
The TRIG
• Stores statistical calculation data (when statistical calculation is enabled)
• Stores measured data to internal memory (when the data memory function is enabled)
(also operates with internal triggering)
91
8.1 External Input/Output Connector and Signals
signal. Falling (ON) or rising (OFF) edge trigg ering can be
(p. 98)
signal performs the following operations in addition external triggering:
0ADJ
PRINTAsserting the PRINT signal prints the current measurement value.
CAL
HOLD
PRB_CHECK
KEY_LOCK
Asserting the 0ADJ signal executes zero adjustment once.
To avoid malfunction, this signal should be asserted (Low) for at least 10 ms.
Asserting the CAL signal executes self calibration. The time required for self calibration is as
follows:
Approximately 130 ms (with 60-Hz line frequency setting), or 110 ms (with 50-Hz setting)
If asserted during measurement, executes after the end of measurement.
Holding the HOLD signal low enables external triggering. When the HOLD signal is high, the
settings made on the Settings screen or by commands are re-enabled.
Asserting the PRB_CHECK signal executes probe short-circuit adjustment one time. If
asserted during measurement, executes after the specified time from the end of measurement.
While the KEY_LOCK signal is held low, all front panel keys (except POWER button) are disabled (key unlock and remote control cancellation operations are also disabled).
Output Signals
This signal indicates that a measurement fault has occurred (except out-of-range detection). It
ERR
CE_HI
is updated simultaneously with the EOM signal. At this time, comparator decision outputs are
all de-asserted (high).
This signal indicates that a contact check error has occurred between H
tacts. It is updated simultaneously with the EOM
puts are all de-asserted (high).
signal. At this time, comparator decision out-
CUR
and H
POT
(p. 32)
(p. 86)
(p. 60)
(p. 54)
(p. 63)
8
(p. 38)
con-
(p. 49)
CE_LO
PRB_SHORT
INDEX
EOM
HI, IN, LO
This signal indicates that a contact check error has occurred between L
tacts. It is updated simultaneously with the EOM
puts are all de-asserted (high).
This signal indicates that a foreign object is shorting the POT and C UR contacts in a four-ter-
minal probe tip. At this time, comparator decision outputs are all de-asserted (high).
This signal indicates that A/D conversion in the measurement circuit is finished.
When the asserted (low) state occurs, the measurement sample can be removed.
This signal indicates the end of a measurement. At this time, the states of the comparator deci-
sion outputs and ERR
These are the comparator decision output signals.
, CE_HI, CE_LO, and PRB_SHORT are all determined.
signal. At this time, comparator decision out-
CUR
and L
POT
con-
(p. 49)
(p. 54)
(p. 97)
• Input signals are ignored when the following are displayed: Basic, Detailed, and Comparator Settings
screens; Statistical Calculation Results screen (except for the print signal); and error messages (except
Setting Monitor errors).
• EXT I/O input and output signals are not usable while changing measurement settings.
Each signal level indicates a corresponding voltage level.
•The
• A self-calibration measurement (approximately 130 ms) is automatically performed every 10 minutes
• Do not apply a
• When changing settings such as measurement range, allow about 150 ms proc essin g time befor e applying
• Input signals are ignored when the following are displayed: Basic, Detailed, and Comparator Settings
•The
• Output of comparator decisions and error signals are determ ined before the
• With internal (INT) triggering, the
• When using the internal trigger [INT], the setting for the DELAY1 (t2) time is increased by 100 ms.
EOM operation when the EOM
The
The
See: "Setting End-of-Measurement Signal Output (EOM Signal Setting)" (p. 97)
EOM signal is operational when the trigger source setting is EXT and the EOM output setting is Pulse.
(between measurements).
ment is delayed until self-calibration is finished.
TRIG signal while measuring using external triggering (the signal is ignored).
TRIG signal.
a
screens; Statistical Calculation Results screen (except for the print signal); and error messages (except
Setting Monitor errors).
INDEX and EOM signals are de-asserted simultaneously.
nals are not de-asserted (OFF) when measurement starts.
EOM signal is asserted (ON) at the end of measurement.
EOM signal continues to be asserted until measurement starts again with the next TRIG signal input.
TRIG signal input is accepted during that ti me, but the correspond ing measure-
EOM signal is asserted.
EOM signal is fixed High (OFF). Also, comparator decisions and error sig-
signal is de-assertedwhen the next measurement is startedbythe next TRIG signal.
www.GlobalTestSupply.com
93
Output Signal State at Power-On
All signals are low (asserted active-low) when power is turned on.
All output signals become high (de-asserted active-low) when ch anging from the
initial screen to the Measurement screen.
Operation is shown when the trigger source is set to external triggering (EXT).
Instrument
State
Power-On
Initial ScreenMeasurement Screen
8.2 Timing Chart
Timing Chart Interval Descriptions
Inter-
DescriptionDurationRemarks
val
Trigger Pulse
t0
Asserted (ON)
Trigger Pulse
t1
De-asserted (OFF)
t2Delay 10 to 100 ms
t3Delay 20 to 100 ms
1
t4 *
Measurement time0.1 to 100 ms
t5Calculation time0.1 msCalculation time is longer when memory storage is enabled.
t6EOM pu lse width1 to 100 msSetting-de pendent
*1: When the averaging function is on, the processing (t3 + t4) (time) is repeated the set number of times.
(source input, active-low)
Input asserted (ON) voltage1 V or less
Input de-asserted (OFF) voltageOpen or 5 to 30 V
Input asserted (ON) current3 mA/ch
Maximum applied voltage30 V
Which pins are common ground for
input and output signals?
Are the common (signal ground) pins
shared by both inputs and outputs?
How do I confirm output signals?
How do I troubleshoot input (control)
signal issues?
Are the comparator decision signals
retained during measurement (or can
they be off)?
Why would the EOM signal not be
detected?
Connect the (active low) TRIG input pin to an ISO_COM pin using a
switch or open-collector output.
The ISO_COM pins.
Both common ground pins can be shared by inputs and outputs.
Confirm voltage waveforms with an oscilloscope. To do this, the output
pins such as EOM and comparator decision outputs need to be pulled up
(through several k
For example, if triggering does not operate properly, bypass the PLC and
short the TRIG pin directly to an ISO_COM pin. Be careful to avoid power
shorts.
The state is determined at the end of measurement, and is off once at the
start of measurement.
Try using the Pulse setting for EOM output.
When the measurement time is short and EOM
time to de-assert may be too short to be detected by the PLC. When the
EOM output is set to Pulse, the signal is asserted (ON) for the specified
pulse width before turning off.
).
output is set to Hold, the
What situations cause measurement
faults to occur?
Is a connector or flat cable for connection provided?
Is direct connection to a PLC possible?
Can external I/O be used at the same
time as RS-232C or other communications?
How should external power be connected?
Can free-running measured values be
acquired using a footswitch?
An error is displayed in the following cases:
• A probe is not connected
• A contact is unstable
• A probe or measurement object is dirty or corroded
• Measurement object resistance is much higher than the measurement
range
A solder-type connector is supplied. The cable must be prepared at the
user's side.
Direct connection is supported for relay or open-collector outputs and
positive-ground optocoupler inputs. (Before connecting, confirm that voltage and current ratings will not be exceeded.)
After setting up communications, it is possible to control measurement
with the TRIG signal while acquiring measurement data via a communications interface.
The instrument's external I/O input and output signals all operate from an
internal isolated power source, so power must not be supplied from the
PLC side.
Please use the free software for acquiring measured values available for
download from our website.
Connect the Instrument
and Controller with a GP-IB
or RS-232C Interface Cable
Communications
Communications Protocol Settings
(p. 105)
Entering an address
Set the instrument to the same
communications protocol as the
controller
Select the transmission format
9.1 Overview and Features
Communications
(RS-232C/ GP-IB
Interface)Chapter 9
The symbols shown below indicate that the following instructions are specific to the RS-232C or the GP-IB
interface. Instructions without these symbols are for both the RS-232C and the GP-IB interface.
: RS-232C only/ : GP-IB only
Before Use
• Always make use of the connector screws to affix the GP-IB or RS-232C connectors.
• When issuing commands that contain data, make certain that the data is provided in the specified format.
• External command operation is undetermined when the Printer is selected as the interface type. In this
case, commands should not be sent.
9.1Overview and Features
The instrument can be controlled by GP-IB or RS-232C. Instrument settings can also be reset.
Using the RS-232C, the measurement values can be printed out by connecting the instrument to
the commercially available printer with a serial interface (p. 83).
IEEE 488.2-1987 standard (essential) commands can be used.
Applicable standard IEEE 488.1-1987
•
• Reference standard IEEE 488.2-1987
If the output queue becomes full, a query error is generated and the output queue is cleared. Therefore, clearing the output queue and query error output from the deadlocked condition
supported.
For details about the communications commands, see "Message Format" (p. 109) and "Message Reference
Interpretation" (p. 126)
*1. ANSI/IEEE Standard 488.1-1987, IEEE Standard Digital Interface for Programmable Instrumentation
*2. ANSI/IEEE Standard 488.2-1987, IEEE Standard Codes, Formats, Protocols, and Common Commands
*3.The situationin which the input bufferand the output queue becomefull, sothat processing cannot continue.
www.GlobalTestSupply.com
*1
*2
*3
as defined in IEEE 488.2 is not
9
Loading...
+ hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.