Hioki RM3542-50, RM3542A, RM3542-51 Instruction Manual

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Table of Contents

Contents

Task-Oriented Reference...............................1

Measurement Flow......................................... 3

Introduction.....................................................4

Verifying Package Contents...........................4

Safety Information .......................................... 6

Operating Precautions....................................8

Chapter 1 Overview 11

1.1 Product Overview and Features ........11

 Block Diagram ..........................................14

1.2 Names and Functions of the Parts ..... 15

1.3 Screen Organization ..........................17

Chapter 2 Measurement Preparations 21

2.1 Connecting the Power Cord............... 22

2.2 Connecting Measurement Probes and

Test Fixtures ...................................... 23

 Making Your Own Measurement Probes ..24

2.3 Turning the Power On and Off ........... 25

Chapter 3 Measurement Settings (Basic Measurements) 27

3.1 Pre-Operation Inspection ................... 27

3.2 Measuring Object Types .................... 28

3.3 Setting the Measurement Speed .......29

3.4 Setting Measurement Start Conditions

(Trigger Source) .................................31

3.5 Selecting the Measurement Range .... 32

3.6 Zero Adjustment ................................. 34

3.7 Judging Measurement Values

(Comparator Function) .......................36

 Enabling and Disabling the

Comparator Function ................................37

 Decide According to Reference Value and

Tolerance (REF% Mode) ..........................37

 Decide According to Upper/Lower Thresholds

(ABS Mode) ............................................. 39

3.8 Confirming Faulty Measurements ......40

Chapter 4 Customizing Measurement Settings 43

4.1 Making Range-Specific Measurement

Settings ..............................................43

4.2 Setting Pre-Measurement Delay ........44

4.3 Compensating Measured Values

(Scaling Function) .............................46

4.4 Setting the Measurement Integration

Time Option ........................................48

4.5 Checking for Poor or Improper Contact

(Contact Check Function) ...................50

4.6 Improving Probe Contact

(Contact Improver Function) ...............52

4.7 Detecting Measurement Voltage Faults

(Voltage Level Monitor Function) .......55

4.8 Applying Current Only When Measuring

(Current Mode Setting) .......................56

4.9 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)

............................................................57

4.10 Comparing the Measurement Settings of Two Instruments

(Settings Monitor Function) ................59

4.11 Retrying Measurement After a Fault

(Retry Function) .................................62

4.12 Limiting Measurement Voltage

(Applied Voltage Limiter Function) .....64

4.13 Maintaining Measurement Precision

(Self-Calibration Function) ..................65

4.14 Compensating for Thermal EMF Offset (Offset Voltage Compensation - OVC) 65

Chapter 5 System Settings 67

5.1 Disabling and Enabling Key Operations

............................................................67

 Disabling Key Operations

(Key-Lock Function) ................................. 67

RM3542D962-01

Table of Contents

 Re-Enabling Key Operations

(Key-Lock Cancel) ................................... 68

5.2 Setting the Comparator Judgment and

Key Beepers ......................................69

 Enabling or Disabling the Key Beeper ..... 69

 Setting the Comparator Judgment Beeper 70

5.3 Power Line Frequency Manual Setting

............................................................71

5.4 Setting the Clock ................................72

5.5 Adjusting Screen Contrast ..................73

5.6 Adjusting the Backlight .......................74

5.7 Initializing (Reset) ...............................75

 Default Settings ........................................ 76

Chapter 6 Storing and Exporting Data 79

6.1 Storing Data at Specified Timing

(Data Memory Function) .....................80

6.2 Store as soon as Measurement is Stable

(Auto-Memory Function) .....................81

6.3 Performing Statistical Calculations on

Measurement Values .........................84

 Using Statistical Calculations ................... 85

 Confirming, Printing, and Erasing Statistical

Calculation Results .................................. 86

6.4 Auto-Exporting Measurement Values (at End of Measurement)

(Data Output Function) .......................87

Chapter 7 Printing 89

7.1 Connecting the Printer ........................89

 Connecting the Printer to the Instrument . 90

7.2 Setting the Instrument ........................91

7.3 Printing ...............................................93

 Printing Measurement Values and

Comparator Judgments ........................... 93

 Printing Statistical Calculation Results .... 93

Chapter 8 External Control 95

8.1 Ext. I/O Connectors and Signals ........95

 Connector Type and Signal Pinouts ........ 96

 Signal Descriptions .................................. 97

8.2 Timing Chart .......................................99

8.3 Internal Circuitry ............................... 102

 Electrical Specifications ......................... 103

 Connection Examples ............................ 104

8.4 Ext. I/O Settings ............................... 105

 Setting the End-of-Measurement Signal

Output (EOM

Signal Setting) .................. 105

 Setting the Trigger Signal (TRIG) Logic . 106

8.5 Q&A Regarding External Control ..... 107

8.6 Supplied Connector Assembly ......... 108

Chapter 9 Communications (RS-232C/ GP-IB Interface) 109

9.1 Overview and Features of Interfaces 109

9.2 Specifications ................................... 110

9.3 Connecting ....................................... 111

 Using the RS-232C Interface ................. 111

 Using the GP-IB Interface

(RM3542-51 only) ................................. 112

9.4 Configuring the Communications Protocol

.......................................................... 113

 Configuring RS-232C Interface

Communications Protocol ...................... 113

 Configuring the GP-IB Interface

Communication Protocol (RM3542-51 only)

............................................................... 114

 Set the Measurement Value Transmission

format (common for RS-232C and GP-IB)

................................................................ 115

9.5 Communication Methods ................. 116

 To Cancel the Remote Status

(Enter the Local Status) ......................... 116

 Message Format .................................... 117

 Output Queue and Input Buffer .............. 120

 Status Byte Register .............................. 121

 Event Registers ...................................... 123

 Initialization Items ................................... 126

 Command Execution Time ..................... 127

 Errors During Communications .............. 127

9.6 Message List .................................... 128

 Shared Commands ................................ 128

 Device-Specific Commands ................... 130

9.7 Message Reference ......................... 134

 Message Reference Interpretation ......... 134

 Shared Commands ................................ 135

 Device-Specific Commands ................... 139

9.8 Data exporting methods ................... 163

9.9 Sample Programs ............................ 165

 Using Visual Basic 5.0 or 6.0 ................. 165

 Create with Visual Basic 2005 ................175

 Sample Programs (Visual Basic 2005) ...177

9.10 Device Compliance Documents....... 179

Chapter 10 Specifications 181

Chapter 11 Maintenance and Service 195

11.1 Troubleshooting ...............................195

 Inspection and Repair .............................195

11.2 Cleaning ...........................................196

11.3 Error Displays and Solutions ............ 197

11.4 Disposing of the Instrument ............. 199

 Removing the Lithium Battery .................199

iii

Table of Contents

Appendix A 1

Appendix 1 Four-Terminal (Voltage-Drop)

Method......................................A 1

Appendix 2 Effect of Thermal emf ...............A 2

Appendix 3 Unstable Measurement Values.A 3

Appendix 4 Rack Mounting ..........................A 8

Appendix 5 Dimensional diagram ..............A 10

Appendix 6 Calibration...............................A 11

Appendix 7 Adjustment..............................A 13

Appendix 8 Table of Comparison Commands

ADEX AX-162D / for this instrument

................................................A 14

Appendix 9 Zero Adjustment .....................A 16

Index Index 1

Appendix

Index

Table of Contents

Task-Oriented Reference

Setting the Measurement Speed (p. 29)

Task-Oriented Reference

To minimize measurement error

To judge measurement results

To correct faulty measurements

To enhance the reliability of inspection

Setting the measurement speed integration time option (p. 48)

Zero Adjustment (p. 34)

Judging Measurement Values (Comparator Function) (p. 36)

Comparing the Measurement Settings of Two Instruments (Settings Monitor Function) (p. 59)

Confirming Faulty Measurements (p. 40)

Improving Probe Contact (Contact Improver Function) (p. 52)

Checking for Poor or Improper Contact (Contact Check Function) (p.

50)

Detecting Measurement Voltage Faults (Voltage Level Monitor Function) (p. 55)

Test for Short-Circuited Probe (Probe Short-Circuit Detection Function) (p. 57)

To inspect the 03015 mm or 0201 mm (Imperial 008004) size components

To automatically store measurement values

To print measurement results

To measure by connecting with PLC (Control equipment)

(PLC: Programmable Logic Controller)

To connect to a computer

Comparing the Measurement Settings of Two Instruments (Settings Monitor Function) (p. 59)

Limiting Measurement Voltage (Applied Voltage Limiter Function) (p. 64)

Store as soon as Measurement is Stable (Auto-Memory Function) (p. 81)

Printing (p. 89)

External Control (p. 95)

Communications (RS-232C/ GP-IB Interface) (p. 109)

Task-Oriented Reference

To enable auto-exporting measurement values to the computer

(Available only with RS-232C interface)

To check operation

Auto-Exporting Measurement Values (at End of Measurement) (Data Output Function) (p. 87)

Setting Measurement Start Conditions (Trigger Source) (p. 31) Internal trigger [INT]

Calibration (p. A11)

Measurement Flow

Communicating with the computer (p. 109)

Printing (p. 89)

External control (p. 95)

EXT.I/O

RS-232C

GP- IB

Comparing Two Instruments (p. 59)

SET MONITOR

Connecting the Power Cord (p. 22)

Turning Power On (p. 25)

Connecting (p. 21)

Installing (p. 8)

Connecting Measurement Probes (p. 23)

Setting measuring conditions

(as needed)

Confirm the screen configuration (p. 17)

Confirm the initial setup (p. 76)

• Basic Settings(p. 27)

• Configure settings for your

specific conditions (p. 43)

•

System-related settings (p. 67)

When changing settings

Change basic settings such as measurement speed

Change detailed settings (measurement conditions and system-related settings)

Setting judgment criteria

(p. 36)

Transmitting data (p. 87) Printing (p. 89)

Computer communications

(p. 109)

External Control (p. 95)

Enable statistical

calculation (p. 84)

Instrument interface settings must be configured before printing, using communications or external control.

Turning Power Off (p. 25)

Be sure to read the "Operating Precautions" (p. 8) before use.

Installing, Connecting and Turning On

Measurement Flow

Settings of RM3542A

Calculation, Printing, Communication, and External Control Settings

When Finished

When you receive the instrument, inspect it carefully to ensure that no damage occurred during shipping. In particular, check the accessories, panel switches, and connectors. If damage is evident, or if it fails to operate according to the specifications, contact your authorized Hioki distributor or reseller.

Confirm that these contents are provided.

 This instrument ....................... 1

Accessories

 Instruction Manual (This document) ........... 1

 Operation Guide ......................................... 1

 Power Cord (p. 22)

 EXT.I/O Male Connector (p. 108)

Introduction

Thank you for purchasing the Hioki Model RM3542A (RM3542-50/RM3542-51) Resistance Meter. To obtain maximum performance from the instrument, please read this manual first, and keep it handy for future reference.

Model RM3542-51 includes the GP-IB interface.

Registered trademarks

• Windows and Visual Basic are either registered trademarks of Microsoft Corporation in the United States and other countries.

• Teflon is a registered trademark of E. I. du Pont de Nemours and Company.

Verifying Package Contents

Inspection

Content confirmation

Options

Measurement Probes and Fixtures (connect to measurement jacks)

 Model 9140-10 4-terminal Probe

 Model 9262 Test Fixture

 Model 9263 SMD Test Fixture

 Model IM9100 SMD Test Fixture

Alligator-clip-type measurement probes. These general-purpose dual-electrode clips fit a wide range of conductor thicknesses. Measurable terminal diameter:

0.3 mm to 5 mm

This fixture is for measuring lead components. Measurable sample dimension:

Lead diameter:

φ0.3 mm to φ2 mm

Lead pitch: 5 mm or more

(less than 20 mΩ residual resistance after zero adjustment)

This fixture is for measuring chip components. Measurable sample dimension:

Sample width: 1 mm to 10 mm

(less than 20 mΩ residual resistance after zero adjustment)

This fixture is for measuring ultra-small SMD components. Measurable sample dimension:

JIS(EIA): Approx. L mm x W mm 0402 (01005): 0.4 mm x 0.2 mm 0603 (0201): 0.6 mm x 0.3 mm 1005 (0402): 1.0 mm x 0.5 mm

(less than 100 mΩ residual resistance after zero adjustment)

Interface Cables

 Model 9637 RS-232C Cable

(9-pin to 9-pin/crossover cable/1.8 m)

 Model 9638 RS-232C Cable

(9-pin to 25-pin/crossover cable/1.8 m)

 Model 9151-02 GP-IB Connector

Cable (2 m)

Contact your authorized Hioki distributor or reseller for details.

Verifying Package Contents

Precautions during shipping

During shipment of the instrument, handle it carefully so that it is not damaged due to a vibration or shock.

Safety Information

This instrument is designed to conform to IEC 61010 Safety Standards, and has been thoroughly tested for safety prior to shipment. However, using the instrument in a way not described in this manual may negate the provided safety features. Before using the instrument, be certain to carefully read the following safety notes:

If persons unfamiliar with electricity measuring instrument are to use the instrument, another person familiar with such instruments must supervise operations.

Mishandling during use could damage to the instrument. Be certain that you understand the instructions and precautions in the manual before use.

Marks on This Instrument

Indicates cautions and hazards. When the symbol is printed on the instrument, refer to a corresponding topic in the Instruction Manual.

Indicates AC (Alternating Current).

Alarm Symbols

In this document, the risk seriousness and the hazard levels are classified as follows.

Indicates an imminently hazardous situation that will result in death or serious injury to the operator.

Indicates a potentially hazardous situation that may result in death or serious injury to the operator.

Indicates a potentially hazardous situation that may result in minor or moderate injury to the operator or damage to the instrument or malfunction.

Indicates advisory items related to performance or correct operation of the instrument.

Symbols for Various Standards

This symbol indicates that the product conforms to regulations set out by the EC Directive.

This symbol indicates laws and regulations regarding the disposal of electrical and electronic appliances in the Member States of EU (WEEE directive).

Other Symbols

Indicates the prohibited action.

Safety Information

(p. )

[ ]

SET

(Bold characters)

Unless otherwise specified, Windows represents Windows 95, 98, Me, Windows NT4.0, Windows 2000, Windows XP, or Windows Vista.

Click: Press and quickly release the left button of the mouse. Double click: Quickly click the left button of the mouse twice.

Indicates the location of reference information.

Indicates that descriptive information is provided below.

Square brackets indicate instrument display labels (such as setting item names).

Bold characters within the text indicate operating key labels.

Accuracy

We define measurement tolerances in terms of f.s. (full scale), rdg. (reading) and dgt. (digit) values, with the following meanings:

f.s. (maximum display value)

The maximum displayable value. This is usually the name of the currently selected range.

rdg. (reading or displayed value)

The value currently being measured and indicated on the measuring instrument.

dgt. (resolution)

The smallest displayable unit on a digital measuring instrument, i.e. a "1" as the least-significant digit.

Measurement categories

To ensure safe operation of measuring instruments, IEC 61010 establishes safety standards for various electrical environments, categorized as CAT II to CAT IV, and called measurement categories.

• Using a measuring instrument in an environment designated with a higher-num-

bered category than that for which the instrument is rated could result in a severe accident, and must be carefully avoided.

• Never use a measuring instrument that lacks category labeling in a CAT II to CAT IV

measurement environment. Doing so could result in a serious accident.

When directly measuring the electrical outlet receptacles of the primary electrical circuits

CAT II:

CAT III:

CAT IV:

in equipment connected to an AC electrical outlet by a power cord (portable tools, household appliances, etc.)

When measuring the primary electrical circuits of heavy equipment (fixed installations) connected directly to the distribution panel, and feeders from the distribution panel to outlets

When measuring the circuit from the service drop to the service entrance, and to the power meter and primary overcurrent protection device (distribution panel)

The instrument can be used with the stand (p. 16) in the upright position. It can also be rack-mounted (p. A8).

50 mm or more

10 mm or more

Rear Panel

50 mm or more

Unplugging the power cord kills power to the instrument. Be sure to provide enough unobstructed space to unplug the power cord immediately in an emergency.

Operating Precautions

Follow these precautions to ensure safe operation and to obtain the full benefits of the various functions.

Preliminary Checks

Before using the instrument for the first time, verify that it operates normally to ensure that no damage occurred during storage or shipping. If you find any damage, contact your authorized Hioki distributor or reseller.

Instrument Installation

Installing the instrument in inappropriate locations may cause a malfunction of instrument or may give rise to an accident. Avoid the following locations:

• Exposed to direct sunlight or high temperature

• Exposed to corrosive or combustible gases

• Exposed to a strong electromagnetic field or electrostatic charge

• Near induction heating systems (such as high-frequency induction heating systems

and IH cooking equipment)

• Susceptible to vibration

• Exposed to water, oil, chemicals, or solvents

• Exposed to high humidity or condensation

• Exposed to high quantities of dust particles

Installing

• To prevent overheating, be sure to leave the specified clearances around the instrument.

• Install the instrument with the bottom facing down.

Do not place the instrument on an unstable table or an inclined place. Dropping or knocking down the instrument can cause injury or damage to the instrument.

Handling the Instrument

To avoid damage to the instrument, protect it from physical shock when transporting and handling. Be especially careful to avoid physical shock from dropping.

This instrument may cause interference if used in residential areas. Such use must be avoided unless the user takes special measures to reduce electromagnetic emissions to prevent interference to the reception of radio and television broadcasts.

Handling the Fixture

Before using a test fixture, read the instructions provided with it.

Before Turning Power On

• Before turning the instrument on, make sure the supply voltage matches the voltage

indicated on its power connector. Connection to an improper supply voltage may damage the instrument and present an electrical hazard.

• To avoid electrical accidents and to maintain the safety specifications of this instru-

ment, connect the power cord provided only to an outlet.

Operating Precautions

Avoid using an uninterruptible power supply (UPS) or DC/AC inverter with rectangular wave or pseudo-sine-wave output to power the instrument. Doing so may damage the instrument.

Before Connecting EXT. I/O Connector

To avoid electric shock or damage to the equipment, always observe the following precautions when connecting to the EXT. I/O connectors:

• Always turn off the power to the instrument and to any devices to be connected

before making connections.

• During operation, a wire becoming dislocated and contacting another conductive

object can be serious hazard. Use screws to secure the EXT. I/O connectors.

To avoid damage to the instrument, always observe the following precautions when connecting to the EXT. I/O connector.

• Do not apply voltage or current to the EXT. I/O terminals that exceeds their ratings

(p. 103).

• Ensure that devices and systems to be connected to the EXT. I/O terminals are

properly isolated.

• When driving relays, be sure to install diodes to absorb counter-electromotive

force.

• The IISO_5 V pin of the EXT. I/O connector is a 5 V power output. Do not apply exter-

nal power to this pin. Be careful not to short-circuit ISO_5 V to ISO_COM.

• The IISO_12 V pin of the EXT. I/O connector is a 12 V power output. Do not apply

external power to this pin. Be careful not to short-circuit ISO_12 V to ISO_COM.

See "Connector Type and Signal Pinouts" (p. 96).

Operating Precautions

Before Connecting to the RS-232C Connector or SET MONITOR Connector

• Use a common ground for both the instrument and connected device. Using different ground circuits will result in a potential difference between the instrument's ground and the connected device. If the communications cable is connected while such a potential difference exists, it may result in equipment malfunction or failure.

• Before connecting or disconnecting any the communications cable, always turn off the instrument and the connected device. Failure to do so could result in equipment malfunction or damage.

• After connecting the communications cable, tighten the screws on the connector securely. Failure to secure the connector could result in equipment malfunction or damage.

Before Measuring

To avoid electrical hazards and damage to the instrument, do not apply voltage exceeding the rated maximum to the EXT. I/O connectors.

• Do not apply any voltage to the measurement jacks. Doing so may damage the unit.

• Never attempt to measure at a point where voltage is present. In particular, do not measure a transformer or motor immediately after a temperature increase test or withstandvoltage test, as the instrument could be damaged by induced voltage or residual charge.

• Battery internal resistance cannot be measured with this instrument. It will sustain damage. To measure the battery internal resistance, we recommend the Hioki 3554, 3555, BT3562, BT3563 and 3561 Battery HiTesters.

• To obtain the guaranteed measurement accuracy, allow at least 30 minutes warm-up.

• The instrument internally retains all settings (but not measurement values), such as measurement range and comparator settings. However, measurement settings made through the RS-232C or GP-IB interface are not memorized.

• In the 100

occur due to the influence of thermo electromotive force.

• The DC resistance of a power transformer cannot be measured. When measuring objects with a large L, such as choke coils and other inductors, measurement values may be unstable. In such cases, contact your authorized Hioki distributor or reseller.

• Carefully insulate all H cannot be performed and an error will occur if the core and shield wires touch.

Ω or higher ranges (LOW POWER: OFF setting), a measurement error may

, H

, L

CUR

POT

and L

wiring. Proper 4-terminal measurements

CUR

1.1 Product Overview and Features

This instrument employs the 4-terminal method to quickly and accurately measure the DC resistance of components, such as resistors and ferrite beads.

It includes advanced contact-check, comparator, and data output functions. The intuitive user interface and high noise immunity are ideal for use with taping machines and separators.

Resistance Measurement

The factory defaults (initial settings) are optimized for chip-component resistance measurements. It can also measure devices that are otherwise difficult to measure with a high current, such as ferrite bead and small multilayer inductors (low-power resistance measurement) (p. 28). It is also suitable for measuring imperial 008004 sized components with small rated voltage (Applied Voltage Limit Function) (p. 64)

Interface Communications

Connect the instrument to a controller via the RS-232C or GP-IB interface to control this instrument or acquire the measurement data (p. 109)

Send the measurement value and calculation results to the printer.

Use a commercially available printer with a serial interface to print the measurement values and calculation results. (p. 89)

Save and Output the Measurement Values

Measurement values can be stored in the internal memory (p. 79). Statistical calculations can be performed on the stored data, which can be transferred to a computer in batch form (however, stored data cannot be confirmed internally).

Judge the Measurement Values

Measurement values are compared with a pre-specified reference value or range, and the result is outputted externally and indicated by the COMP indicators (comparator function) (p. 36)

Connect a PLC or I/O Board

By connecting to the EXT. I/O connector, it is possible to control the instrument from a PLC. In addition to the comparator results, various measurement anomaly signals can be outputted. (p. 95)

Upper limit

Lower limit

When using two instruments, a difference in settings disables measurement and causes a warning notification (Setting Monitor Function) (p. 59).

Optional Hioki probes and fixtures are available to connect to the measurement jacks (BNC jacks (p. 5)). Alternatively, commercially available cables, such as the 1.5D2 V coax, can be used (p. 24)

Overview Chapter 1

1.1 Product Overview and Features

Ultra Fast and Accurate Measurements Increase Productivity

The factory default settings are optimized for chip-component resistance measurements. Enhanced contactto-measurement and contact check-to-determination, within 1 ms. When using the low-power resistance measurement and the 100 mΩ to 10 Ω ranges, the offset-voltage compensation (OVC) function minimizes the effects of thermal emf (p. 65). Because measurement results are judged as pass/fail with a 10 ppm resolution, it is ideal for high-speed Class B resistor testing.

High-Speed Data Output and Ample Memory

The Data Output function transfers measured data at 5 ms/sample, even via RS-232C. Up to 30,000 measurements can be stored, and all data can be exported at the end of measuring each reel. This function is ideal for system setup, debugging and process management.

Multiple Interfaces

EXT. I/O is a noise proofed structure isolated from the measurement and control circuits (p. 95). All data can be acquired in real time using the built-in

38.4-kbps high-speed RS-232C interface. Connect the commercially available printer with a serial interface to print the measurement values and statistical calculation results (p. 89) The GP-IB interface can also be used for Model RM3542-51 (specified when shipping (p. 109)).

Low-Power Function (p. 28)

For ranges from 1000 mΩ to 1000 Ω, the low-power resistance measurement is provided to minimize the measurement current. Safely measure devices that are otherwise difficult to measure with high current, such as ferrite-bead and multilayer inductors.

Clearly Visible Display and Intuitive Operation

The high-contrast LCD provides clear visibility, helping to avoid setting mistakes. The optimum range is selected automatically when comparator thresholds are entered.

The Auto Memory Function Is Convenient for Sampling Tests(p. 81)

The auto memory function is convenient for sampling tests after screen-printing. When the measurement values become stable, the measurement value is automatically acquired and statistical calculations are performed at the same time. The beeper gives a notification when the specified number of values are stored. Selecting [PRINT] (screen display) prints the measurement values and statistical calculation results(p.

93).

Fixtures for Component Measurements (p. 5)

The BNC-type measurement jacks exhibit good noise immunity. Ready availability and easy assembly ensure a smooth system setup. Various test fixtures are available for Hioki LCR HiTesters.

Features

1.1 Product Overview and Features

Reliable Contact Checks (p. 50)

Contact checking (that was previously performed before and after measuring) is now performed during measurement, so probe bounce and contact resistance fluctuations can be detected. Contact checking time can be shortened, improving tact times.

Features

Measurement Circuit Strongly Immune to Contact Resistance Fluctuations

The effects of contact resistance fluctuations are reduced even when scattering occurs near the end of probe life. Such effects are minimized by the fast response of the measurement circuit.

Contact Improvement Function (Contact Improver) (p. 52)

The Contact Improver function improves bad contacts between probes and test samples. Contacts errors are reduced by penetrating oxidation and impurities between probes and samples. Reducing contact errors can increase productivity and quality. The intensity of the contact improver function can be adjusted according to probe type.

Reject Faulty Data - Voltage Level Monitor Function (p. 55)

When the contact resistance of the H

CUR

and L

CUR

leads fluctuates, the measurement current changes momentarily. Such momentary changes are not detectable by typical contact checking. The Voltage Level Monitor Function indicates a contact error if the detection voltage changes significantly. It can enhance the reliability of the measurement value.

Minimize Human Error and Risk

- Settings Monitor Function (p. 59)

If the settings are found to be different after comparing the setting conditions of two instruments, an alarm is sounded to prohibit the TRIG input. Helps to prevent human errors by avoiding setting mistakes.

Reliable Four-Terminal Measurement Probe Short-Circuit Detection Function (p.

57)

If a conductive foreign object is present between the POT and CUR probe tips, the reliable four-terminal measurements cannot be maintained. When not measuring, resistance between the POT and CUR probe tips is measured and short-circuit probe anomalies are detected.

Strong Electrical Noise Immunity

The specified measurement accuracy is achieved even with a ±1.5 kV mixed pulse noise. The floating measurement section design is highly impervious to electrical noise, minimizing the effect on measurement values even when turning large-induction motors on and off. The free-range power supply input (90 to 264 V) is essentially unaffected by voltage fluctuations, so stable measurements are possible even under poor power conditions.

DUT

Foreign Object

POT

CUR

DUT electrode

Previously

RM3542A

Contact Condition

Contact Check

Measuring

Probe Bounce

Contact Condition

Detection Voltage

Error

Good Contact

Poor Contact

An error occurs because the detection voltage changes significantly.

Good Contact

ERROR

Measurement

Contact Check

Contact Condition

Contact Improvement Function (Contact Improver)

Contact Improvement

Measuring

Contact Check

ONON

1.1 Product Overview and Features

Block Diagram

• A constant current (determined by the measurement range) is applied between the H

voltage is measured between the H voltage (B) by the constant current flow (A). (

POT

and L

terminals. The resistance value is obtained by dividing the measured

POT

A, B)

CUR

and L

terminals while

CUR

• The effects of a large offset voltage, such as from thermal emf, are reduced by reversing the current and measuring

twice in positive and negative directions (A). (A)

• The constant current source (A) and voltmeter (B) circuit designs are largely unaffected by contact resistance. (A, B)

• Faulty measurement values caused by unstable or chattering contact conditions can be eliminated by monitoring (C)

the detection voltage (B) waveform (voltage level monitor function). (B, C)

• The voltmeter is provided with sufficient time for integration (the default setting is 0.3 ms) to achieve stable measure-

ments. (The integration time can be reduced to 0.1 ms to support higher speeds.) (B)

• Before measuring, the Contact Improver circuit (D) optimizes the contact when the probes touch the DUT. (D)

• Also, performing contact checking (E) before measuring can detect short circuits between the CUR and POT terminals

caused by a clogged probe tip (probe short-circuit detection function). (

• When measurement starts, the contact check circuit (E) and constant current monitor (F) are activated to monitor for

faulty conditions while measuring. (

E, F)

• The dual CPU (C and G) design provides ultra-high-speed measurements and a fast system response. (C, G)

• Protection from electrical noise is provided by the isolation between the Measurement and Control blocks (H). (H)

• The 90 V to 264 V wide range switching power supply (I) can provide stable measurements even in poor power quality

environments. (I)

Display Screen

Monochrome graphical LCD There are three screen types: Measurement, Basic Settings and Detailed Settings. Screen Configurations (p. 17)

F1 - F4 key

(F Key: General)

Selects the corresponding item on the right side of the display.

Judging the Measurement Values (p. 36)(Comparator Function)

Set a reference value and range for judging the measurements, which can be confirmed by the COMP indicators.

Select this to judge the measurement values relative to a reference value and tolerance (%).The REF% setting display appears.

Press this button to judge the measurement values relative to the setting range (absolute value).The ABS setting display appears.

Setting

POWER Button

Turns the instrument on and off. (p. 25)

• Off: power is off

(When power is not supplied)

• Red light: power is off

(when power is supplied)

• Green light: power on

Turning the Power

On and Off

Entering numerical values

Enter a numerical value.

(these are called the numeric keys)

Switches the sign of a numerical value.

Selects the unit of measure.

Sets the tolerance values.

Deletes the value in the selected field.

Accepts the displayed comparator threshold values.

Aborts comparator setting and returns to the previous display.

Selecting the setting contents

(we call these "F keys")

Selects the corresponding item on the right side of the display.

Cursor keys Move among the displayed setting items. The cursor location is indicated by reverse characters.

Measurement jacks

Connect measurement probes and fixtures (p. 23).

• H

CUR

jack: Current source terminal

• H

POT

jack: High voltage detection

terminal

• L

POT

jack: Low voltage detection

terminal

• L

CUR

jack: Current detection termi-

nal

• GUARD jack: Shield terminal

(for the measurement of GND)

See "Before Measuring" (p. 10)

Connecting Probes

COMP indicator

Displays Comparator Results (p. 36).

Hi The measurement

value is above the upper limit.

IN Pass (meets crite-

ria)

Lo The measurement

value is below the lower limit.

Viewing the

Comparator

Results

Viewing the

Measurement Values

and Settings

Buzzer beeps.

1.2 Names and Functions of the Parts

Front Panel

Serial Number

Shows the serial number.Do not remove this label, as it is required for product support.

Connect the supplied power cord (p. 22).

See "Before Turning Power On" (p. 9)

Connecting the Power Cord

RS-232C Connector

The RS-232C interface can be used to connect to a PLC or computer (p. 109). It is also used to connect to a commercially available printer with a serial interface for printing (p.

89).

RS-232C Communications

Printer Output

GP-IB Connector (RM3542-51 only)

The GP-IB interface can be used to connect to a computer (p. 109).

GP-IB Communications

SET MONITOR Connector

Connect another instrument to compare the settings of two units (p. 59).

See "Before Connecting to the RS-232C Con-

nector or SET MONITOR Connector" (p. 10)

Compare Two Instruments

EXT. I/O Connector

Connect to a PLC or I/O board to control the measurement start time, and to acquire the comparator results (p. 95).

See "Before Connecting EXT. I/O Connector" (p. 9), "Before Measuring" (p. 10)

External Control

Bottom Panel

Stand

When using the stand

Extend the stand until it clicks into place. Make sure to extend both legs of the stand.

Collapsing the stand

Fold in the stand until it clicks into place.

This instrument can be rack mounted.

See: Rack Mounting (p. A8)

Please retain the parts removed from this instrument to be used again.

1.2 Names and Functions of the Parts

Rear Panel

Detailed Settings Screen (p. 19)

Measurement Settings screens [MEAS SETTINGS]

Data Memory Setting screen[DATA SETTINGS]

System screens[SYSTEM]

Normal display (measurement screen) (p. 18)

Basic Settings screen (p. 18)

Returns to previous screen.

Indicates a Continued Screen.

Returns to previous screen.

1.3 Screen Organization

The instrument has three general display screen types: Measurement, Basic Settings and Detailed Settings. See "11.3 Error Displays and Solutions" "Error Displays and Solutions" (p. 197) for error displays.

The screen examples in this manual are reversed (black on white) for the best visibility on the printed page. However, the instrument screens can actually be displayed only with white characters on a black background.

Normal display (measurement screen)

This screen normally appears while measuring. View currently measurement values and measurement conditions. Some parts of the display depend on the comparator mode and other settings.

Measurement value

Settings Menu (corresponding to the F keys)

Displayed contents depend on the current function settings.

Parentheses ( ) indicate the corresponding F key.

MENU (F1) Displays the Basic Settings screen. PRINT (F2) Printing (p. 91)

Appears only when the interface is set for the printer.

STAT (F3) Statistical calculation results (p. 84)

Appears only when statistical calculation is enabled

NUMBER (F4) Sets the Auto-Memory number (p. 81).

Appears only when the auto-memory function is enabled Displays the memory number, the number of passed and failed products, in the lower left of the screen.

UNDO (F3) Deletes the previously stored measure-

ment and calculation result (executes only once) (p. 86) Appears only when the calculation result screen is displayed.

ALLCLR (F4) Clears all memory and calculations (p.

86). Appears only when calculation results are displayed.

LOCAL (F1) Cancels the remote status (p. 116). UNLOCK (F1) Cancels the key-lock status (Hold for

one second) (p. 68).

Criteria Setting Values (p. 36)

Displayed contents depend on the selected comparator mode. (Ex.: REF% mode)

To display the Basic Settings screen

Measurement Conditions

Shows current setting contents. Displayed contents depend on the current settings.

INT/ EXT Trigger source type (p. 31) Ω Measurement ranges (p. 32) FAST/ MED/ SLOW Measurement Speed (p. 29) 0ADJ/

OFF (no display)

Appears only when the zero-adjustment is enabled (p. 34).

OVC/

OFF (no display)

(OVC: offset voltage compensation) Appears only when the offset voltage compensation is enabled (p. 65).

LP/

OFF (no display)

Appears only when the low-power resistance measurement function is enabled (p. 28).

S/ OFF (no display) Appears when scaling function is

enabled (p. 46)

NUM Appears only when numeric input is

enabled.

RMT Remote status(p. 116) M.LOCK Disables all operations except the

comparator settings (p. 67).

F. LOC K Disables all operations including

the comparator settings (p. 67)

Basic Settings screen

Make basic measurement condition settings on this screen.

Measurement speed and range can be changed while viewing the measurement values (when the Trigger source is set to the internal trigger [INT]).

TRG

Changing the trigger source (start control method) (p. 31).

When selecting [TRG: EXT], [MANU] appears by pressing the F4 key (Measures manually once).

RANGE Change the range (p. 32). SPEED Change the measurement speed (p. 29). 0ADJ Zero-adjustment function ON/OFF (p. 34) COMP Comparator function ON/OFF(p. 36) LOCK Key-lock function ON/OFF (p. 67)

Measurement condition settings

Move with cursor keys.

Measurement condition setting conditions

Return to previous screen

To the Measurement Settings screen [MEAS SETTINGS] To the Data Memory Setting screen [DATA SETTINGS] To the System screen [SYSTEM]

MISC To display the Detailed Settings screen.

1.3 Screen Organization

Measurement Settings screens [MEAS SETTINGS]

Set instrument system-related settings on this screen.

SET MONITOR Two units measurement condition comparison

ON/OFF(p. 59)

PROBE CHECK Probe short-circuit detection function ON/OFF

(p. 57)

RETRY Retry function setting (p. 62)

VOLT LIMIT Sets voltage limit function to ON/OFF (p. 64)

TRIG EDGE (EXT. I/O) Set the trigger rising/falling edge

(p. 106)

EOM (EXT. I/O) EOM (end-of-measurement signal)

output setting (p. 105)

INTERFACE Communications interface settings(p. 113)

PRINT MODE Set printing method (p. 91)

LOW POWER Low-power resistance component

measurement ON/OFF(p. 28)

JUDGE BEEP Comparator beeper settings (p. 70)

KEY BEEP Key beeper ON/OFF (p. 69)

CLOCK (Y-M-D) Internal clock settings (p. 72)

LINE FREQ Power source frequency settings (p. 71)

CONTRAST Adjust screen contrast (p. 73)

BACKLIGHT Adjust screen backlight (p. 74)

RESET Initializing (p. 75)

ADJUST Instrument Adjustment (p. A13)

System screens [SYSTEM]

Shows detailed settings for measurements. Use when adjusting the measurement speed, stability and measurement fault detection functions.

DELAY1 Adjust the delay between the probing and

trigger input (p. 44).

DELAY2 Adjust the target electrical response (p. 44).

SCALING

(A*R+B)

Compensate the measured value using scaling function (p. 46)

INT(FAST/ MED/ SLOW)

Make fine adjustment to the integration time (p. 48).

CONT CHECK Contact check threshold setting (p. 50)

CONT IMP Contact improver function setting (p. 52)

VOLT MONITOR Voltage level monitor function setting (p. 55)

CURRENT MODE

Current mode setting (p. 56)

Data Memory Setting screen (Save, analysis, output) [DATA SETTINGS]

These are settings for memory and statistical calculation functions.

AUTO MEMORY Auto-memory function ON/OFF (p. 81)

STATISTICS Statistical calculation ON/OFF (p. 84)

DATA OUT Auto-export the measurement values

(communication) ON/OFF (p. 87)

Detailed Settings

1.3 Screen Organization

Installing this instrument (p. 8)

Rear Panel

Front Panel

Connecting Measurement Probes (p. 23)

Turning Power On (p. 25)

Connect to the test sample.

After measurements are completed,

turn the power off. (p. 25)

Connect the external interface

(as needed)

• Using the printer (p. 89)

• Using RS-232C or GP-IB interface (p. 109)

• Connecting to the PLC or I/O Board (p. 95)

• Automatically comparing the settings of two instruments (Settings Monitor function) (p. 59)

Setting the Instrument (p. 27)

Connecting the Power Cord (p. 22)

Measurement Preparations Chapter 2

Be sure to read the "Operating Precautions" (p.8) before installing and connecting this instrument. See "Appendix 4 Rack Mounting" (p. A8) for rack mounting.

Rear Panel

1 Confirm that the supply voltage matches the instrument,

and connect the power cord to the power inlet on the instrument.

2 Connect the plug of the power cord to the outlet.

The POWER button on the front panel lights up in red.

In event of a power outage, operation resumes with the same settings when power is restored (breaker reset, etc.).

Power inlet

2.1 Connecting the Power Cord

• Before turning the instrument on, make sure the supply voltage matches the voltage

indicated on its power connector. Connection to an improper supply voltage may damage the instrument and present an electrical hazard.

• To avoid electrical accidents and to maintain the safety specifications of this instru-

ment, connect the power cord only to a 3-contact (two-conductor + ground) outlet.

• Before using the instrument, make sure that the insulation on the power cord is

undamaged and that no bare conductors are exposed. Any damage can cause electric shock, contact your dealer or Hioki representative.

To avoid damaging the power cord, grasp the plug, not the cord, when unplugging it from the power outlet.

2.2 Connecting Measurement Probes and Test Fixtures

Example of defeated guard measurement

Connecting measurement probes

Connecting a fixture

Connect it directly to the measurement jacks with the label side facing up, and fix it with the levers on the left and right sides.

Connect the red plugs to the H

CUR

and H

POT

jacks, and

the black plugs to the L

CUR

and L

POT

jacks.

Black plugs

Red plugs

Measurement jack connector guide

Lock

Cable BNC connector groove

Align the slots in the BNC plug with the guide pins on the jack on the instrument, then push and twist the plug clockwise until it locks. Disconnecting BNC connectors Push the BNC plug, twist it counterclock-wise, and pull it out.

Making and extending your own probes (p. 24)

2.2 Connecting Measurement Probes and Test Fixtures

Connect your measurement probes, optional Hioki probes, or test fixtures to the measurement jacks. Refer to "Options" (p.5) for details of the Hioki option. See the instructions provided with the fixture for operating details.

• Do not apply any voltage to the measurement jacks. Doing so may damage the unit.

• When disconnecting the BNC connector, be sure to release the lock before pulling off the connector. Forcibly pulling the connector without releasing the lock, or pulling on the cable, can damage the connector.

• We recommend using optional Hioki fixtures.

• Use the GUARD jack only for the HighResistance Measurements shield, and avoid more than a 10 mA current flow. This jack is not for guarding the network resistance measurements.

Connection Methods

Wiring Diagram

Before Wiring

• Twist the H

POT

and L

POT

wires, and the H

CUR

and L

CUR

wires together. If not twisted together, measurement values may be unstable and errors may occur when measuring with low-power resistance, or low resistance values.

• See the block diagram (p. 14) for the internal circuit details.

• Probes and measuring objects should be shielded at BNC or GUARD jack potential.

• Measurement probe length: keep it within 2 m (with a conductor resistance of 500 mΩ/m or less).

Long cables are more susceptible to noise, and the measurement values may be unstable.

• Extensions should maintain the four-terminal structure. If the wiring is converted to a two-terminal structure in wiring, the correct measurement may not be possible due to the effects of the wiring and contact resistance.

• Cables and measuring objects should be shielded.

• After extending the measurement probes, verify that the operation and accuracy conform to the "Measurement Specifications" (p.192).

• When cutting off the ends of the optional measurement probes, make sure that the H

CUR

, H

POT

, and L

CUR

shield wires and core wires do not come into contact. Such contact will made accu-

rate measurement impossible.

When Extending the Measurement Probes

Observe the following when extending the measurement probes.

2.2 Connecting Measurement Probes and Test Fixtures

Making Your Own Measurement Probes

Recommended measurement probe specifications

Conductor resistance 500 mΩ/m or less

Capacitance 150 pF/m or less

Cable dielectric material

Connector insulating material

Length 2 m or less

Example: JIS standard 3C-2V, 1.5D-2V MIL standard RG-58A/U *. Teflon is a registered trademark of E. I. du Pont de Nemours and Company.

Polyethylene (PE), Teflon* (TFE), Polyethylene foam (PEF) Insulation resistance 10 GΩ or more

Te fl o n* (TFE), Polybutylene terephthalate (PBT) Insulation resistance10 GΩ or more

2.3 Turning the Power On and Off

Press the POWER button (it lights up in green).

Self-test

Indicates an error (p. 197).

After Power-On

A self-test (instrument diagnostic routine) is performed. During the self-test, the following information is displayed while the hardware is verified.

Error

No Errors

Normal display (measurement screen)

The following information is displayed during selftesting:

• Manufacturer and model name

• Firmware versions (main, and measurement)

• Communication setting

• Power Line Frequency Setting

2.3 Turning the Power On and Off

Turning Power On

When the power is turned on, the same setting as when the power was last turned off appears (backup function).

Turning Power Off

When powered up for the first time, the default settings appear.

See: "Default Settings" (p.76)

Before Starting Measurement

To obtain precise measurements, provide about 30 minutes for warm-up after turning the power on. Measurement settings are recalled from when the power was last turned off (settings backup). However, measurement settings made through the RS-232C or GP-IB interfaces are not retained, although they can be stored using the

:SYSTem:BACKup command (p. 149).

Press the POWER button (it lights up in red, power OFF).

Disconnect the power cord from the power inlet to extinguish the POWER button light. When the power is turned on again, operation resumes with the same settings as when last turned off.

If a power outage (e.g., breaker trip) occurs when the instrument is turned on, it will automatically turn on again when the power is restored without pressing the POWER button.

2.3 Turning the Power On and Off

Do not use the instrument if damage is found, as electric shock or short-circuit accidents could result. Contact your dealer or Hioki representative.

Metal Exposed

Is the power cord insulation torn, or is any metal exposed?

No Metal Exposed

Peripheral Device Inspection

Is the insulation on a measurement probe torn, or is any metal exposed?

Metal Exposed

If there is any damage, measurement values may be unstable and measurement errors may occur. Replace the cable with an undamaged one.

No Metal Exposed

If damage is evident, request repairs.

Yes

Is damage to the instrument evident?

Instrument Inspection

When turning power on

Does the self-test screen appear (model name, version no.) (p. 25)?

Not displayed

The power cord may be damaged, or the instrument may be damaged internally. Request repairs.

Does the Measurement screen appear after self-test?

Displayed

The instrument may be damaged internally. Request repairs.

See: "11.1 Troubleshooting" (p. 195)

"11.3 Error Displays and Solutions" (p. 197)

An error is displayed (Err)

Displayed

Inspection complete

Please read the "Operating Precautions" (p. 8) before use.

3.1 Pre-Operation Inspection

Measurement Settings (Basic Measurements)

Chapter 3

Refer to "Measurement Flow" (p. 3) for an outline of the measurement process from preparation to end-of-measurement.

3.1 Pre-Operation Inspection

Measurement range: 0.0000 mΩ (100 mΩ range) to

120.0000 MΩ (16 ranges)

Normal Resistance Measurement

General-purpose resistors

Measurement range: 0.000 mΩ (1000 mΩ range) to

1200.000 Ω (6 ranges)

Low-power resistance measurement

Hard-to-measure components such as ferrite bead or layered inductors, or other elements sensitive to measurement current

LP appears at the top of the screen.

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Normal Resistance Measurement (default) Low-power resistance measurement

Returns to the setting screen.

Saves setting and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

3.2 Measuring Object Types

The instrument provides two measurement methods: resistance measurement, and low-power resistance measurement. Select the appropriate measurement method for the type of component to be measured. For general-purpose resistor measurements, use the factory defaults. The power applied to the measuring object = Resistance Value x (Measurement Current)

See: "(6) The Sample Becomes Warm" (p. A6)

(Example)If the resistance to be measured is 100 Ω

( Measurement Current) (Measurement Method) 10 mA 100x0.01 1 mA 100x0.001

= 10 mW Normal Resistance Measurement, 100 Ω Range

= 100 µW Low-Power Resistance Measurement, 100 Ω Range

Ranges 1000 Ω range or higher (LOW POWER: OFF) cannot be used for inductor measurements.

Open the Basic Settings screen.

Open the System screen.

Select the low-power mode, as needed.

Return to the Measurement screen.

The Basic Settings screen appears.

Selection

Refers to table below

(default)

Press the up/down cursor keys to change the setting.

3.3 Setting the Measurement Speed

The measurement speed can be set to FAST, MED (MEDIUM), or SLOW. A slower measurement speed provides greater measurement precision. A faster measurement speed results in greater susceptibility to environmental noise. Ensure that measurement probes and the sample are sufficiently shielded.

Open the Basic Settings screen.

Select the measurement speed.

Return to the Measurement screen.

3.3 Setting the Measurement Speed

Relationship Between Measurement Range and Speed

(factory defaults)

Measurement range

100 m

1000 m

3 Ω

10 Ω

100 Ω

300 Ω

1000 Ω

10 kΩ

30 kΩ

100 kΩ

300 kΩ

1000 kΩ

3 MΩ

10 MΩ

30 MΩ

100 MΩ

LOW POWER: OFF LOW POWER: ON

FAST MED SLOW FAST MED SLOW

3.8 ms 13 ms

2.0 ms 6.4 ms

1.6 ms 6.0 ms

0.9 ms 3.6 ms

1.0 ms 3.6 ms

0.9 ms 3.6 ms

1.3 ms 3.8 ms

2.5 ms 6.0 ms

5.3 ms

5.8 ms

26 ms 22 ms

23 ms 20 ms

46 ms 39 ms

43 ms 36 ms

41 ms 35 ms

41 ms 34 ms

21 ms 17 ms

21 ms 18 ms

23 ms 20 ms

86 ms 72 ms

‑ ‑ ‑

2.3 ms 12 ms

1.7 ms 6.1 ms

3.2 ms 7.6 ms

7.2 ms 12 ms

‑ ‑ ‑

42 ms 35 ms

41 ms 34 ms

43 ms 36 ms

47 ms 40 ms

Integration time can be optionally set for each range (p. 48).

Upper value: 50 Hz power line fre-

quency

Lower value: 60 Hz power line fre-

quency

Tolerance ±10%±0.2 ms

3.4 Setting Measurement Start Conditions (Trigger Source)

• When internal triggering is selected, the EXT. I/O TRIG signal and the ∗TRG command are ignored

(except for memory storage and statistical calculations).

• To measure samples such as inductors that require time to settle, adjust delay time (DELAY2). Start with a long delay, and gradually shorten it while watching for the measurement value to settle.

See: "4.2 Setting Pre-Measurement Delay" (p. 44)

• When external triggering [EXT] is enabled, the Auto-Memory function is forcibly disabled (OFF).

Trigger signals are automatically generated internally for continuous measurement.

Measure with internal [INT] triggering

To measure automatically

Measurements are triggered by an external signal. Manual measurement triggering is also available.

• Apply a trigger signal at the EXT. I/O connector (p. 95)

• Send the ∗TRG command by communications interface

(p. 138)

• Press F4 [MANU] (only appears when EXT is selected)

Measure with external [EXT] triggering

To measure at specific times

To retain measurement values

The Basic Settings screen appears.

Selection

Internal trigger

External trigger (default)

Press F3 [EXT] to display the F4 [MANU] indicator. Press to trigger a measurement manually.

Press the up/down cursor keys to change the setting.

3.4 Setting Measurement Start Conditions (Trigger Source)

Measurements can be started in two ways.

Open the Basic Settings screen.

Select internal [INT] or external [EXT] trigger.

Return to the Measurement screen.

Continuous measurement (:INITIATE:CONTINUOUS ON) is the normal trigger state when operating from the front panel. Selecting the internal [INT] trigger source activates continuous triggering ("free-run"). When external [EXT] triggering is selected, each external trigger event initiates one measurement. Continuous measurement can be disabled by sending the RS-232C or GP-IB. When continuous measurement is disabled, trigger acceptance is controlled only by the host (computer or PLC).

See: Refer to "Trigger" (p. 152) and "9.8 Data exporting methods" (p. 163) for trigger commands.

:INITIATE:CONTINUOUS OFF command via

3.5 Selecting the Measurement Range

The measurement range can be set as follows. When the threshold values of the comparator are set with the panel keys, the measurement range is selected automatically according to the settings (reference values or upper/lower thresholds, refer to the following table). When the comparator settings are made by remote control commands, the measurement range is not affected.

Changing the Range

If the resistance value of the measuring object is very small compared to the measurement range, the measurement error increases.

Ranges 1000 Ω range or higher (LOW POWER: OFF) cannot be used for inductor measurements.

Auto-Range (when making comparator settings)

LOW POWER: OFF (p. 28)

VOLTAGE LIMIT: OFF (p. 64)

Reference value (REF%)

and

upper limit (ABS) ranges

0.00 m

100.1 mΩ to 1000.9 mΩ 1000 mΩ 100.1 mΩ to 1000.9 mΩ 1000 mΩ 0.0 mΩ to 1000.9 mΩ 1000 mΩ

1.001 MΩ to 3.009 MΩ 3 MΩ 0.501 MΩ to 1.509 MΩ 3 MΩ − −

3.010 MΩ to 10.009 MΩ 10 MΩ 1.510 MΩ to 5.009 MΩ 10 MΩ − −

10.01 MΩ to 30.09 MΩ 30 MΩ 5.01 MΩ to 15.09 MΩ 30 MΩ − −

30.10 MΩ to 120.00 MΩ 100 MΩ 15.10 MΩ to 120.00 MΩ 100 MΩ − −

Ω to 100.09 mΩ 100 mΩ 0.00 mΩ to 100.09 mΩ 100 mΩ − −

1.001 Ω to 3.009 Ω 3 Ω 1.001 Ω to 3.009 Ω 3 Ω 1.001 Ω to 3.009 Ω 3 Ω

3.010 Ω to 10.009 Ω 10 Ω 3.010 Ω to 10.009 Ω 10 Ω 3.010 Ω to 10.009 Ω 10 Ω

10.01 Ω to 100.09 Ω 100 Ω 10.01 Ω to 100.09 Ω 100 Ω 10.01 Ω to 100.09 Ω 100 Ω 100 .1 Ω to 300.9 Ω 300 Ω 100.1 Ω to 300.9 Ω 300 Ω 100.1 Ω to 300.9 Ω 300 Ω

301.0 Ω to 1000.9 Ω 1000 Ω 301.0 Ω to 1000.9 Ω 1000 Ω 301.0 Ω to 1200.0 Ω 1 000 Ω

1.001 kΩ to 10.009 kΩ 10 kΩ 1.001 kΩ to 5.009 kΩ 10 kΩ − − 10 .01 kΩ to 30.09 kΩ 30 kΩ 5.01 kΩ to 15.09 kΩ 30 kΩ − −

30.10 kΩ to 100.09 kΩ 100 kΩ 15.10 kΩ to 50.09 kΩ 100 kΩ − −

100.1 kΩ to 300.9 kΩ 300 kΩ 50.1 kΩ to 150.9 kΩ 300 kΩ − −

301.0 kΩ to 1000.9 kΩ 1000 kΩ 151.0 kΩ to 500.9 kΩ 1000 kΩ − −

Selected

range

LOW POWER: OFF (p. 28)

VOLTAGE LIMIT: ON (p. 64)

Reference value (REF%)

and

upper limit (ABS) ranges

Selected

range

LOW POWER: ON (p. 28)

Reference value (REF%)

and

upper limit (ABS) ranges

Selected

range

Manual Range Selection

The Basic Settings screen appears.

Selection

Press the up/down cursor keys to change the setting.

Increments the range.

Decrements the range.

Open the Basic Settings screen.

Select the range.

Selectable ranges depend on the low-power resistance setting (p. 28).

• When low-power resistance measurement is set to OFF: 100 mΩ, 1000 mΩ, 3 Ω, 10 Ω, 100 Ω, 300 Ω, 1000

Ω, 10 kΩ, 30 kΩ, 100 kΩ, 300 kΩ, 1000 kΩ, 3 MΩ, 10 MΩ, 30 MΩ, 100 MΩ (default)

• When low-power resistance measurement is set to ON: 1000 mΩ, 3 Ω, 10 Ω, 100 Ω, 300 Ω, 1000 Ω

Return to the Measurement screen.

3.5 Selecting the Measurement Range

The Basic Settings screen appears.

Selection

Internal trigger

Press the up/down cursor keys to change the setting.

Selection

Disables zero adjustment (cancel). Executes zero adjustment.

3.6 Zero Adjustment

When four-terminal measurement (Kelvin connection) is not practical such as when measuring very small samples, the additional inherent resistance of the two-terminal wiring should be canceled out. The zero-adjustment function can cancel out up to 10

Before Zero Adjustment

• The guaranteed accuracy of the instrument applies to four-terminal connections without zero adjustment.When using four-terminal connections, do not execute zero adjustment. Executing zero adjustment with incorrect wiring may amplify measurement error. However, zero adjustment may be needed even with four-terminal measurements if they are affected by a large offset voltage, such as due to thermal emf (LOW POWER: OFF, in 100 Ω to 100 MΩ range).

• Execute zero adjustment when the ambient temperature has changed, or when a probe is replaced.

Execute zero adjustment after the warm-up period following power on.

Ω additional resistance.

4 5

Open the Basic Settings screen.

Select the internal [INT] trigger mode.

Short the probes together.

Confirm that the measurement value does not exceed 10 Ω. If no measurement value is displayed, increment the measurement range (p. 32).

Select whether to enable or disable zero adjustment.

After confirming that the measurement value does not exceed 10 Ω, execute zero adjustment.

Return to the Measurement screen.

When Zero Adjustment Fails

If zero adjustment fails, the following error message appears.

3.6 Zero Adjustment

Before attempting zero adjustment again, confirm the following:

• When measuring with the 10 Ω range, confirm that the displayed value does not exceed 10 Ω.

• Confirm that the probe connections are correct.

Measurement value>upper limit

Upper limit≥Measurement value≥ Lower limit

Measurement value<lower limit

Select the REF% (relative values) judgment

Decide whether a

measurement value is within

specified tolerance limits

relative to a specified reference

value (p. 37)

Select the ABS (absolute values) judgment

Decide whether a measurement

value is between specified upper and lower threshold

values (absolute values) (p. 39)

12.000 kΩ... reference value

+0.080%...... positive tolerance

-0.080% ...... negative tolerance

example

100.00 mΩ. upper threshold

80.00 mΩ... lower threshold

example

Hi IN IN Lo

Positive tolerance [%]

Reference value [O]

Negative tolerance [%]

Upper threshold [Ω]

Lower threshold [

]

3.7 Judging Measurement Values (Comparator Function)

Comparator results can be output to an external device (via EXT. I/O connector) when the comparator reference/tolerance or upper/lower threshold values have been set.

See: "Chapter 8 External Control" (p. 95)

Comparator results are also indicated by the COMP Hi/IN/Lo panel lamps, and by audible beeper (disabled by default).

See: "Setting the Comparator Judgment Beeper" (p. 70)

The comparator judment mode can be set as one of the following:

Before Using the Comparator Function

• When the measurement value is out of the selected measurement range, comparator judgment indicators appear as follows. In the event of a measurement fault, no judgment is made.

See:"3.8 Confirming Faulty Measurements" (p. 40)

Out-of-Range Display

• If power is turned off during comparator setting, changes to settings are lost as they revert to their previous values. To accept the settings, press the ENTER key.

• When setting comparator criteria, the appropriate range is selected automatically. Refer to "Auto-Range (when making comparator settings)" (p. 32) for range settings.

Comparator judgment indicators

(COMP indicator LEDs)

+OvrRng

-OvrRng Lo

3.7 Judging Measurement Values (Comparator Function)

The Basic Settings screen appears.

Selection

Disables the function. Enables the function.

Press the up/down cursor keys to change the setting.

(When the function is disabled)

Comparator judgments are indicated only when the function is enabled.

Relative value =

Reference

value

Measurement

value

- 1

× 100 [%]

Setting range:

-9.999% to +9.999% (When 10% or less)

-99.99% to +99.99% (When more than 10%)

Reference value

Positive tolerance (upper judgment threshold)

Negative tolerance (lower judgment threshold)

Enabling and Disabling the Comparator Function

The comparator function is enabled by default. When the function is disabled, comparator settings are ignored.

Open the Basic Settings screen.

Enable or disable the comparator function.

Return to the Measurement screen.

Decide According to Reference Value and Tolerance (REF% Mode)

Example: Set a reference value of 10.5 Ω with +4.5% and -4.5% judgment tolerances.

To abort the setting process, press . Settings are abandoned and the display returns to the previous screen.

Open the relative tolerance setting screen.

Selection

To Reset Numerical Values

Deletes entered digits. This key is enabled only when entering numerical values.

To change the value after selecting the units, use the cursor keys to select the item to change, then enter the new value with the numer-

1_ 10_ 10._ 10.5_ 10.50

(Example: 10.5

Selection

To Reset Numerical Values

Deletes entered digits. This key is enabled only when entering numerical values.

To change the value after selecting the units, use the cursor keys to select the item to change, then enter the new value with the numeric keys.

To Set a Negative Value

Press this key to change the sign, as needed.

+4_ +4._ +4.5_ +4.500%

(Example: 4.5%)

Selection

• Internal calculations are performed on floating-point values, and judgments round up any fraction of the

least-significant digit.

• Displayed values of the reference and tolerances are rounded according to the selected range. Internal

calculations use data not rounded off, so judgments are based on the entered (setting) values.

• An error message appears if you press ENTER with the positive tolerance < the negative tolerance.

See:"11.3 Error Displays and Solutions" (p. 197) (ERR:001)

3.7 Judging Measurement Values (Comparator Function)

Set the reference value.

Pressing an inoperative key during setting sounds a low-pitch beep (when the key beeper is enabled).

Press the units key to accept the setting and move the cursor to the upper threshold.

Set the positive tolerance.

Press the % key to accept the setting and move the cursor to the negative tolerance value. The negative tolerance is initially set to the same absolute value as the positive tolerance (change as needed).

Set the negative tolerance in the same way (as needed)

Accept the settings and return to the Measurement screen.

Upper threshold Lower threshold

1_ 15_ 150_ 150.0 mΩ

(Example: 150

Selection

To Reset Numerical Values

Deletes entered digits. This key is enabled only when entering numerical values.

To change the value after selecting the units, use the cursor keys to select the item to change, then enter the new value with the numeric keys.

Selection

(Example: 50

5_ 50_ 50.0 mΩ

• Internal calculations are performed on floating-point values, and judgments round up any fraction of the

least-significant digit.

• Displayed values of the reference and tolerances are rounded according to the selected range. Internal

calculations use data not rounded off, so judgments are based on the entered (setting) values.

• An error message appears if you press ENTER with the positive tolerance < the negative tolerance.

See:"11.3 Error Displays and Solutions" (p. 197) (ERR:001)

3.7 Judging Measurement Values (Comparator Function)

Decide According to Upper/Lower Thresholds (ABS Mode)

Setting example: Upper threshold 150 mΩ, lower threshold 50 mΩ

To abort the setting process, press . Settings are abandoned and the display returns to the previous screen.

Open the absolute value threshold setting screen.

Set the positive tolerance.

Pressing an inoperative key during setting sounds a low-pitch beep (when the key beeper is enabled). Error message is not displayed.

Press the units key to accept the setting and move the cursor to the lower threshold value.

Set the negative tolerance in the same way.

Press the units key to accept the setting and move the cursor to the upper threshold.

Accept the settings and return to the Measurement screen.

Appears when the measurement value is outside of the measurement or display range. Check for a broken sample component. The comparator result is Hi when +OvrRng is displayed, and Lo when -OvrRng is displayed. No external measurement fault signal (ERR

) is output.

Measurement out of range

The resistance between the H

POT

and H

CUR

probe contacts, and between the L

POT

and L

CUR

probe contacts, are measured and compared with specified contact fault values. An error message appears when the measurement value reaches or exceeds the specified contact fault values. If this error persists, probe wear or cable failure may be the cause. If the error is not cleared by shorting the tips of a known-good measurement probe, the instrument requires repair.

Contact Check Fault

This method monitors the stability of the voltage between H

POT

and L

POT

probe contacts. An error message appears when voltage instability is detected due to chattering of the probe contacts. If this error is displayed frequently, the probes may be degraded due to wear. C.E. Volt may also be displayed when external noise is strong.

Voltage Monitor fault

See: "Out-of-Range Detection Function" (p. 41)

See: "4.5 Checking for Poor or Improper Contact

(Contact Check Function)" (p. 50)

See: "4.7 Detecting Measurement Voltage Faults

(Voltage Level Monitor Function)" (p. 55)

This display appears after changing measurement settings and before the next measurement is performed.

- - - - - - -

Display Examples: Display Measurement State and Appearance with Open-Circuit Probe

Display Measurement State

Current Monitor Results

Normal (PASS) Fault (FAIL)

Contact Check Results

Voltage Level Monitor Results

Normal

(PASS)

Display: Measurement Value COMP indicator: According to the measurement value

Display: +OvrRng/ -OvrRng COMP indicator: Hi/ Lo (when connection to the measuring object is broken)

Fault

(FAIL)

Display: C.E. Hi/ C.E. Lo/ C.E. Volt COMP indicator: No judgment EXT.I/O: ERR signal output

+OvrRng

-OvrRng

C.E. Hi C.E. Lo

C.E. Volt

Display

This method monitors the regulated measurement current for normal flow through the measuring object. An error is detected mainly when a measurement fault occurs due to an open measuring object or poor contact between the H

CUR

and L

CUR

probes.

The error display depends on the contact check and voltage level monitor states (refer to the table below).

Current Monitor Fault

See: "Current Monitor Function" (p. 41)

The measurement fault display differs according to detection order and settings.

3.8 Confirming Faulty Measurements

When a measurement is not performed correctly, a measurement fault indicator appears and a measurement fault signal is output at the ERR detection).

The instrument detects measurement faults by the following four methods.

pin of the EXT. I/O connector (except for out-of-range

Measurement Fault Detection Order

NoNoNoNoNo

Measurement Fault Detection Display EXT.I/O

3.8 Confirming Faulty Measurements

Probe short-circuit

Hi Wiring Contact Error

Lo Wiring Contact Error

Voltage Level Monitor Error

Constant-Current Error

Below Lower Limit

Above Upper Limit

No Measurement Data

Yes

ERR: 021

C.E. Hi

C.E. Lo

C.E. Volt

+OvrRng

-OvrRng

+OvrRng

- - - - - - - -

PRB_SHORT output, ERR output

ERR output, CE_HI output

ERR output, CE_LO output

ERR output

HI output

LO output

HI output

Measurement fault detection proceeds in the order shown at the left, ending with display of the first detected error.

Corresponding measurement fault signals are also output at the EXT. I/O connector.

Out-of-Range Detection Function

Examples of Out-of-Range Faults

Out-of-Range Detection Measurement Example

The measurement value is outside of the measurement range.

The relative tolerance (%) display of the measurement value exceeds the display range (999.999%).

The zero-adjusted value is outside of the display range.

While measuring, input voltage exceed the A/D converter input range.

10 kΩ range is used to measure 13 kΩ.

Measuring 500 Ω (+2400%) with a reference value of 20 Ω

1 In the 1 Ω range with 0.5 Ω zero-adjustment in effect, measuring 0.1 Ω provides a zero-adjusted value of -0.4 Ω, which is outside of the display range.

Measuring a large resistance value in an electrically noisy environment

Current Monitor Function

The instrument supplies constant measurement current through the measuring object via the H probes. A current monitor fault occurs if constant current cannot be attained. If the contact check and voltage level monitor results are normal, the out-of-range and comparator result displays indicate "Hi".

Example of Current Monitor Fault

• Broken DUT (open work)

•H

CUR

or L

probe contact fault

CUR

cable break

CUR

and L

CUR

3.8 Confirming Faulty Measurements

4.1 Making Range-Specific Measurement Settings

The Basic Settings screen appears.

The Measurement Settings Screen appears. [MEAS SETTINGS]

Selection

Selects the range to use.

Customizing Measurement Settings Chapter 4

(set as needed)

Change measurement settings as appropriate for your application. Refer to "Detailed Settings Screen" (p. 19) for the available settings.

4.1 Making Range-Specific Measurement Settings

The setting affects only the selected range (except for the DELAY1 setting).

Open the Basic Settings screen.

Open the Measurement Settings Screen.

Select the range to change the setting.

Set the items as needed.

The DELAY1 setting is common to all ranges. The default setting is 0 ms (corresponding to trigger signal input at the same time as probe contacts become stable). Setting DELAY1 affects measurements in all ranges.

Set DELAY1

Adjust this setting to allow for probe contact mechanical stabilization.

Set DELAY2 to the time needed for stabilization after measurement current is applied, such as may be required for inductive components. The setting affects only the selected range. The default setting is 0 ms (corresponding to resistance measurement of non-inductive components).

Set DELAY2

Adjust this setting to allow for stabilization of the measurement sample.

DELAY1 and DELAY2 Timing Chart

* Internal delay is provided to suit purely resistive (non-reactive) measuring objects,

and is different for each measurement range.

Acquisition

Stable Contact

Internal

Probe Contact

Condition

Start

TRIG

Measurement

Current

Acquisition of

Measurement

value

End of

Measurement

EOM

4.2 Setting Pre-Measurement Delay

This setting specifies the delay between trigger signal input and the start of measurement. Adjust this setting to delay measurement until the measurement value has time to stabilize, so that even if the sample is connected after triggering, measurement starts only after the specified delay. The delay can be set by two methods, as follows.

The Basic Settings screen appears.

The Measurement Settings Screen appears. [MEAS SETTINGS]

Selection

Setting range: 0.0 ms (default) to 100.0 ms

[DELAY1] is common to all ranges, while [DELAY2] can be set for each range independently (p. 43).

Numerci keypad

Returns to the setting screen.

Saves and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

4.2 Setting Pre-Measurement Delay

Estimated Delay time

Set the delay so that inductance does not affect measurements. To fine tune the delay, begin with a longer delay than necessary, then gradually shorten it while watching the measurement value.

Open the Basic Settings screen.

Open the Measurement Settings Screen.

Set [DELAY1] or [DELAY2].

Return to the Measurement screen.

The Basic Settings screen appears.

The Measurement Settings Screen appears. [MEAS SETTINGS]

Selection

Disables the function(default) (go to step 6) Enables the function

4.3 Compensating Measured Values (Scaling Function)

When measuring the resistance of current sensing resistors, there may be a discrepancy between the resistance value at the time of mounting on the board being used and the resistance value obtained when measuring the component alone (due to the effects of the probing location and other factors). The scaling function corrects the measured resistance value obtained from the component alone to yield the resistance value during actual use. Scaling is performed by mean of the following equations:

= A × R + B

R : Measured value before compensation R

Resistance value after compensation

A : Compensation coefficient setting range: B : Offset resistance setting range

: ±0.0000 mΩ to ±99.9999 MΩ (default: 0.0000 mΩ)

0.50000 to 2.00000 (default:: 1.00000)

• Scaling calculation will be performed on a measured value after zero-adjustment. Consequently, measure value may not be equal to zero after zero-adjustment.

• Changing the comparator settings automatically sets the scaling function to OFF.

Open the Basic Settings screen.

Open the Measurement Settings Screen.

Enable or disable the scaling function.

Set the compensation coefficient.

Selection

Setting range: 0.50000 to 2.00000 (default: 1.00000)

Numeric keys

Selection

Setting range: ±0.0000 mΩ to ±99.9999 MΩ (default: +0.0000 mΩ)

Numeric keys

Returns to the setting screen.

Saves and return to previous screen.

Discards setting and return to previous

screen.

The confirmation screen

Set the offset.

4.3 Compensating Measured Values (Scaling Function)

Return to the Measurement screen.

The Basic Settings screen appears.

The Measurement Settings Screen appears. [MEAS SETTINGS] (The settings for the current measurement range are displayed.)

Selection

4.4 Setting the Measurement Integration Time Option

The integration time can be optionally set for each range by selecting FAST, MED, or SLOW measurement speed. Integration time can be set in ms or PLC

units.

* PLC = Power Line Cycle, where one PLC is the time equivalent to one period of the power line waveform.

At 50 Hz, one PLC = 1/50 PLC setting units are useful where measurements may be affected by power line noise (high- or low-resistance measurements)

Default setting

LOW POWER

Range

100 mΩ

1000 mΩ

3 Ω

10 Ω

100 Ω

300 Ω

1000 Ω

10 kΩ 0.3 ms 3.0 ms 1 PLC OFF − − − −

30 kΩ 0.3 ms 3.0 ms 1 PLC OFF 100 kΩ 0.5 ms 3.0 ms 1 PLC OFF 300 kΩ 0.5 ms 3.0 ms 1 PLC OFF

1000 kΩ 1.5 ms 5.0 ms 1 PLC OFF - - - -

3 MΩ 1.5 ms 5.0 ms 1 PLC OFF - - - 10 MΩ 2.5 ms 1 PLC 1 PLC OFF - - - 30 MΩ 2.5 ms 1 PLC 1 PLC OFF - - - -

100 MΩ 1 PLC 2 PLC 4 PLC OFF - - - -

*1. Low-power resistance measurement (p. 28) *2. Two measurements are made within the above integration time.

Integration time

FAST MED SLOW FAST MED SLOW

0.5 ms 5.0 ms 1 PLC

0.3 ms 2.5 ms 1 PLC

0.3 ms 3.0 ms 1 PLC OFF 0.3 ms 2.5 ms 1 PLC

of a second, and at 60 Hz, one PLC = 1/60th of a second.

: OFF LOW POWER*1: ON

OVC

Integration time

− − − −

0.5 ms 5.0 ms 1 PLC

− − − −

OVC

Open the Basic Settings screen.

Open the Measurement Settings Screen.

Select the integration setting units.

Selection

Sets in units of time. Sets in units of power line cycles.

The setting is specific to the selected range (p. 43).

Selection

Setting range:

• When setting in ms units:

0.1 ms to 100.0 ms

• When setting power-line-cycle units:

1 to 6 PLC (60 Hz), 1 to 5 PLC (50 Hz)

Returns to the setting screen.

Saves and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

Select the integration time.

4.4 Setting the Measurement Integration Time Option

Return to the Measurement screen.

• The instruments accuracy specifications are applicable only with the default integration times.

Investigate your measurement requirements carefully before changing the integration time.

• When the effects of power line noise can be ignored, the integration time can be set longer than the default to reduce

scattering of measurement values. On the other hand, if the integration time is too short, scattering increases. For high-or low-resistance and low-power resistance measurements that are easily affected by power line noise, we suggest setting according to the power line period (PLC units).

The Basic Settings screen appears.

The Measurement Settings Screen appears. [MEAS SETTINGS]

Selection

Disables the function (go to step 5). Enables the function (default).

The setting is specific to the selected range (p. 43)

Selection

50 Ω, 100 Ω, 150 Ω, 200 Ω (default), 300 Ω, 400 Ω, 500 Ω

A contact fault occurs when a measured value exceeds the threshold setting.

4.5 Checking for Poor or Improper Contact (Contact Check Function)

This function detects poor contact between the probes and measuring object, and broken measurement probes. The instrument continually monitors the resistance between the H L

and L

CUR

When the resistance is outside of the specified value, a contact check fault occurs and the C.E. Hi or C.E. Lo error message appears. No comparator judgment is applied to the measurement value. When these error messages appear, check the probe contacts, and check for broken measurement probes. (If the error is not cleared by shorting the tips of a known-good measurement probe, the instrument requires repair.)

probes from the start of integration (including response time) and while measuring.

POT

CUR

and H

probes and the

POT

• During low-resistance measurement, poor contact of the H range measurement.

• When contact checking is disabled, measurement values may be displayed even when a probe is not contacting the measuring object.

Open the Basic Settings screen.

Open the Measurement Settings Screen.

Enable or disable the function.

CUR

or L

probe may be detected as an out-of-

CUR

Select the contact check fault threshold resistance.

4.5 Checking for Poor or Improper Contact (Contact Check Function)

Returns to the setting screen.

Saves and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

Return to the Measurement screen.

Measurement

Start

TRIG

Contact

Improver

current

Probe

Contact

Condition

Measuring

Internal

delay *

Stable Contact

Measurement

Start TRIG

Contact

Improver

current

Probe

Contact

Condition

Measuring

Internal

delay *

Stable Contact

4.6 Improving Probe Contact (Contact Improver Function)

Probe contacts can be improved by applying current from the POT to the CUR probes before measuring.

The Contact Improver function applies voltage to the sample. Be careful when measuring samples with characteristics that may be affected.

The current used for the Contact Improver functions can be selected as follows. 17 mA, 25 mA, 35 mA (default), 50 mA Higher current provides more effective contact improvement, but at the cost of faster probe deterioration. Contact Improver current can be set to be disabled (OFF), enabled (ON), or PULSE. The PULSE setting applies the contact improvement current for approx. 100 µs to 300 µs immediately before measurement. The PULSE setting is useful to decrease Joule heating of the DUT based on contact improvement current if the measuring object is susceptible to change in characteristics.

100 mΩ range to 100 kΩ range 300 kΩ range to 100 MΩ range

DUT current

DUT voltage 20 V max. 15 V max.

2 mA max. 60 mA max.

*. It takes several microseconds for the DUT current to reach the steady-state value. Until the steady-state

value is reached, a transient current that is approximately equal to the contact improvement current setting (default setting: 35 mA) will flow.

Setting Timing chart (Contact Improver Function)

OFF

*Internal delay is different for each range.

Setting Timing chart (Contact Improver Function)

Measurement

Start

TRIG

Contact

Improver

current

Probe

Contact

Condition

Measuring

Internal

delay *

Stable Contact

Approx.

100

μs

Measurement

Start

TRIG

Contact

Improver

current

Probe

Contact

Condition

Measuring

Internal

delay *

Stable Contact

Approx.

300

μs

The Basic Settings screen appears.

The Measurement Settings Screen appears. [MEAS SETTINGS]

Selection

PULSE

When both applied voltage limiter and low-power resistance measurement function are disabled.

PULSE

When the applied voltage limit function or low-power resistance measurement function is enabled.

4.6 Improving Probe Contact (Contact Improver Function)

*Internal delay is different for each range.

For ranges between 300 kΩ and 100 MΩ, the [PULSE] setting is enabled by default. Before measuring in the ranges from 300 kΩ to 100 MΩ with the Contact Improver function set to [ON], verify that measurements are not biased.

Open the Basic Settings screen.

Open the Measurement Settings Screen.

Selection

Disables probe contact improvement (go to step 4).

Enables probe contact improvement. Contacts improvement current is ap-

plied immediately before measuring only.

The setting is specific to the selected range (p. 43)

Selection

17 mA, 25 mA, 35 mA (default), 50 mA

Returns to the setting screen.

Saves and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

4.6 Improving Probe Contact (Contact Improver Function)

Set the Contact Improver current timing to disabled (OFF), enabled (ON), or PULSE.

(When selecting ON or PULSE)

Set the current limit value.

Return to the Measurement screen.

The Basic Settings screen appears.

The Measurement Settings Screen appears. [MEAS SETTINGS]

Selection

Disables the function (default) (go to step 5).

Enables the function. Disables the function of all ranges

(go to step 5).

The setting is specific to the selected range (p. 43)

Selection

LOOSE

NORMAL

SEVERE

*. Default setting: 10LOOSE is the default for the 0 MΩ

range, and NORMAL for ranges other than 100 MΩ.

Returns to the setting screen.

Saves and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

4.7 Detecting Measurement Voltage Faults (Voltage Level Monitor Function)

When a measurement voltage fault occurs due to probe chattering, the C.E. Volt error message appears on the measurement screen and an appear when external noise is strong.

Check the following if errors occur frequently:

• Check for probe deterioration.

• Provide additional noise suppression."Appendix 3 Unstable Measurement Values" (p. A3)

• Set the voltage level monitor to Loose, or OFF (disable).

Open the Basic Settings screen.

ERR signal is output. The C.E. Volt error may also

Open the Measurement Settings Screen.

Enable or disable the function.

Select the voltage level monitor threshold.

Return to the Measurement screen.

The Basic Settings screen appears.

The Measurement Settings Screen appears. [MEAS SETTINGS]

Selection

Measurement current is applied while awaiting trigger.

Measurement current is applied only while measuring (default).

The setting is specific to the selected range (p. 43)

Returns to the setting screen.

Saves and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

4.8 Applying Current Only When Measuring (Current Mode Setting)

When the Contact Improver function is set to Pulse or disabled (CONT IMP: PULSE or OFF) and measurement current is set for pulse output, open-circuit voltage when not measuring does not exceed 20 mV.

See: "4.6 Improving Probe Contact (Contact Improver Function)" (p. 52)

When the Contact Improver function is enabled (CONT IMP: PULSE or ON setting), the current mode setting is ignored even if set to continuous (CURRENT MODE: CONT setting). (The Contact Improver function forces pulse operation with measurement current applied only during measurement.)

Open the Basic Settings screen.

Open the Measurement Settings Screen.

Select whether to apply current when not measuring.

To apply measurement current continuously (CONT setting) even when waiting for a trigger, confirm that the Contact Improver function is disabled (CONT IMP: OFF, (p. 52)).

Return to the Measurement screen.

4.9 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)

DUT

Foreign Object

POT

CUR

DUT

electrode

Timing chart (Probe Short-circuit Detection)

Probe short-circuit

PRB_SHORT

Comparator

,IN,Lo

End of

measurement

EOM

Measurement

Start

TRIG

Measurement

status

Transport

Measurement stage

DUT1 contact

DUT2 contactTransport

Probe short-circuit

Transport

DUT1

measurement

DUT2

measurement

Short-circuit detection

Detection timing setting

Available

Short-circuit

No judgment

4.9 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)

Four-terminal measurements are not possible when a conductive foreign object is present between the POT and CUR probe tips. To detect short-circuited probes, this function measures the resistance between the CUR and POT terminals after a specific time (initially 5 ms) following the end of measurement. Probe short-circuit detection is disabled by default.

When a probe short-circuit is detected, an error message appears on

the measurement screen, and the

output. (

ERR:021 Probe short error)

PRB_SHORT and ERR signals are

Short-circuit detection can also be controlled by asserting the active-low PRB_CHECK of the EXT. I/O signal.

Asserting the PRB_CHECK

end of measurement (p. 95).

About Probe Short-Circuit Detection

• If probes are connected to the measuring object during probe short-circuit detection, it is determined as probe short circuit. Ensure that the probes have sufficient time to separate from the measuring object.

• Probe short-circuit detection occurs within about 1 ms.

• The threshold for probe short-circuit detection is fixed at 500 Ω, so if the resistance between CUR and POT probes is larger, detection is not possible.

signal while measuring causes short-circuit detection to be performed after the

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Probe short-circuit detection is not used (default) (go to step 5).

Probe short-circuit detection is used.

Selection

Setting range: 1 to 100 ms, 5 ms (default)

Short-circuit detection is delayed for the specified time following the end of measurement.

Returns to the setting screen.

Saves and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

4.9 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)

• Even while the probe short-circuit detection function is set to be disabled, short-circuit detection is performed when the

EXT. I/O PRB_CHECK

• When the internal trigger [TRG: INT] source is selected, short-circuit detection is not performed after the end of mea-

surement. However, short-circuit detection can still be executed by asserting the PRB_CHECK signal is executed.

Enables/Disables Probe Short-Circuit Detection Function

signal is asserted.

Open the Basic Settings screen.

Open the System screen.

Enable or disable the function.

Set the probe short-circuit detection timing.

Return to the Measurement screen.

Automatic Comparison

1st Stage

2nd Stage

Transport Direction

ABCDE

The SET MONITOR connectors are identical to RS-232C connectors. Be careful to avoid connecting the wrong connectors.

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

The setting is not monitored (default) (go to step 7). The setting is monitored.

4.10 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)

This function automatically compares the settings of two instruments to determine whether they are the same. Only comparator settings and measurement speed are compared. When the settings differ, an alarm notification is displayed and subsequent.

TRIG signal input is prevented from starting measure-

ment.

When the settings of two instruments match, TRIG input is accepted and measurement starts. However, if the range defined by the upper and lower thresholds of the second stage is broader than that of the first stage, measurement still starts despite the different threshold settings.

Connect the SET MONITOR connectors of the two instruments using a Hioki 9637 RS-

232C cable.

Open the Basic Settings screen.

Open the System screen.

Enable or disable the function. Enable the function on both instruments.

Selection

Selects this instrument as the 1st stage. Selects this instrument as the 2nd stage.

Enter the difference in tolerance (%) to be allowed at the 2nd stage from the tolerance range set for the 1st stage. Setting range: 0.000 to 9.999%

Example: If the 1st stage is set to measure 12 Ω ±0.800%, and the 2nd is to measure 12 Ω ±1.000%, the tolerance will be 0.300%

Selection

Selects this instrument as the 1st stage. Selects this instrument as the 2nd stage.

Returns to the setting screen.

Saves and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

1st stage

2nd stage

UPP [%]

REF% setting ABS setting

REF [

Ω]

LOW [%]

Tolerance range [%]

UPP [Ω]

LOW [

Ω]

2nd upper limit - 1st upper

1st upper limit

Tolerance range [%] > 2nd upper limit [%] - 1st upper limit [%]

Tolerance range [%] >

1st lower limit - 2nd lower

1st lower limit

Tolerance range [%]

(upper limit)

(lower limit)

Permissible tolerance is calculated using floating-point values, so the setting must be at least 0.001% larger than the difference between 2

and 1st stage ranges.

Set the upper and lower comparator thresholds according to the following conditions:

1st stage upper threshold < 2nd stage upper threshold 1st stage lower threshold > 2

stage lower threshold

Tolerance range [%] >

(upper limit)

(lower limit)

1st stage

2nd stage

× 100

4.10 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)

Select the instrument to serve as the 1st stage, and set its tolerance range.

Set the instrument to serve as the 2nd stage.

Return to the Measurement screen.

Tolerance Range Setting Conditions

1st Stage

TRIG Input Accepted

TRIG Input Inhibited

TRIG

Input Accepted

When changing the reference value

Change the reference value to match the 1st stage

The error message appears when the settings do not match.

2nd Stage

1st Stage

2nd Stage

1st Stage

2nd Stage

SET MONITOR: ON 1st 0.300% (on the SET MONITOR: ON 2nd (on the System screen)

When an error is displayed

ERR:003 Setting monitor error. (COMP) Comparator settings do not match. Please check.

ERR:004 Setting monitor error. (SPEED) Measurement speed settings do not match. Please check.

4.10 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)

Practical Example

Retry

Chatter

Probe Contact Condition Start

TRIG

Contact Improver

Measurement

Current Contact Check

End of Measurement

EOM

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Retries disabled (go to step 5). Retries enabled (default).

4.11 Retrying Measurement After a Fault (Retry Function)

The Retry function enables measurement to be automatically retried when a measurement fault occurs due to probe chatter.

During Retry, all measurement operations including Contact Improvement and DELAY2 (but excluding DELAY1) are restarted. If a measurement fault persists after the specified continuous retry interval (e.g., if the measured object is not connected), retrying is aborted and the EOM output. When Retry is enabled, the maximum time to end-ofmeasurement occurs when recovering from a measurement fault immediately before the retry interval expires, which approaches the sum of the retry interval setting plus normal measurement time. Decreasing test throughput may indicate probe maintenance is required.

signal is

Open the Basic Settings screen.

Open the System screen.

Enable or disable the function.

Set a continuous retry interval.

Selection

Setting range: 1 to 50 ms (default: 2 ms)

Returns to the setting screen.

Saves and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

Return to the Measurement screen.

4.11 Retrying Measurement After a Fault (Retry Function)

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Applied voltage is not limited(default). Applied voltage is limited.

Selection

Returns to the setting screen.

Saves and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

4.12 Limiting Measurement Voltage (Applied Voltage Limiter Function)

Applied voltage used for measurements can be limited to 5 V or lower. When [ON] is selected, an adequate measurement range in which the "measured current

ence value or

selected.

upper comparator threshold" (voltage) does not exceed 5 V will be automatically

× refer-

Open the Basic Settings screen.

Open the System screen.

Enable or disable the function.

Return to the Measurement screen.

The instrument will display OvrRng (over range) when measuring a sample with applied voltage of 5 V or greater.

RPRN–

-----------------------

4.13 Maintaining Measurement Precision (Self-Calibration Function)

To maintain measurement precision, the instrument self-calibrates every ten minutes to compensate for internal circuit offset voltage and gain drift. This function cannot be disabled.

During self-calibration, the subsequent measurement is delayed for about 6 PLC + 10 ms (PLC = Power Line Cycles) for internal circuit compensation.

Self-Calibration Timing Supplied power 50 Hz: 130 ms, 60 Hz: 110 ms

• When the timing of self-calibration overlaps with a measurement, self-calibration is postponed until the end of measurement.

• When a trigger signal (measurement start signal) is applied during self-calibration, the start of the triggered measurement is postponed until self-calibration is finished.

• Self-calibration executes automatically after changing comparator or measurement speed settings.

• During self-calibration, measurement current and the Contact Improver current are inhibited.

4.14 Compensating for Thermal EMF Offset (Offset Voltage Compensation - OVC)

This function automatically compensates for offset voltage resulting from thermal emf or internal instrument bias. (OVC: Offset Voltage Compensation)

See: "Appendix 2 Effect of Thermal emf" (p. A2)

The following value is known to be a true resistance value from RP (>0), the value measured with current flowing in the positive direction, and R negative direction.

Offset voltage compensation is automatically enabled in the following conditions, and cannot be modified or disabled:

• When a range from 100 mΩ to 10 Ω is selected.

• Low Power Resistance Measurement (LOW POWER ON)

When the test object is inductive, some delay [DELAY2] is required (p. 44) to allow adequate current flow before starting measurement.

(<0), the value measured with current flowing in the

4.14 Compensating for Thermal EMF Offset (Offset Voltage Compensation - OVC)

5.1 Disabling and Enabling Key Operations

Key operations other than comparator settings (REF%, ABS, units and numeric keys) and F1 [UNLOCK] keys are disabled. To disable key operations: [M.LOCK] is displayed when returning to the [MENU] measurement screen.

Disabling All Except Comparator Settings

Only comparator settings are enabled.

All key operations except F1 [UNLOCK] are disabled. To disable key operations: [F.LOCK] is displayed when returning to the [FULL]

measurement screen.

Disabling All Key Operations Including Comparator

Key operations to change settings are disabled.

(although key-lock can be canceled)

Asserting (Low) the EXT. I/O KEY_LOCK signal disables all panel keys, including F1 [UNLOCK] and F1 [LOCAL] (disables remote control) (p. 95).

To disable the key-lock function and re-enable the keys, de-assert (High) the KEY_LOCK

signal.

Disabling All Panel Keys

All key operations are disabled.

The Basic Settings screen appears.

Selection

Key operations enabled (default).

Disables all except key-lock cancel.

Disables all except key-lock cancel and comparator setting change.

[UNLOCK] is displayed only

when key-lock is enabled by front panel key operations.

System Settings Chapter 5

5.1 Disabling and Enabling Key Operations

Disabling Key Operations (Key-Lock Function)

Activate the key-lock function to disable the instrument's front panel key operations. Three key-lock levels are available to suit specific purposes.

Open the Basic Settings screen.

Enable or disable key operations.

Return to the Measurement screen.

5.1 Disabling and Enabling Key Operations

Re-Enabling Key Operations (Key-Lock Cancel)

Key-lock can be canceled only when [UNLOCK] is displayed.

Press and hold F1 [UNLOCK] for one second.

If key operations are disabled by the keys.

KEY_LOCK signal, de-assert (High) the signal to unlock the

5.2 Setting the Comparator Judgment and Key Beepers

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Disables the beeper. Enables the beeper (default).

Returns to the setting screen.

Saves setting and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

5.2 Setting the Comparator Judgment and Key

Beepers

Enabling or Disabling the Key Beeper

The key beeper sound can be enabled and disabled. The key beeper is enabled (ON) by default.

Open the Basic Settings screen.

Open the System screen.

Select whether to enable or disable the key beeper.

Return to the Measurement screen.

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Disables the beeper (default) (go to step 5). Enables the beeper.

Selection

IN (beep when within range) HI/LO (beep when out of range) LOW (beep when below lower threshold) HIGH (beep when above upper threshold)

Returns to the setting screen.

Saves setting and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

5.2 Setting the Comparator Judgment and Key Beepers

Setting the Comparator Judgment Beeper

The comparator judgment beeper can be enabled and disabled. The judgment beeper is disabled (OFF) by default.

Open the Basic Settings screen.

Open the System screen.

Select whether to enable or disable the judgment beeper.

Select the judgment beep conditions.

Return to the Measurement screen.

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Automatically detect local line frequency (default).

When the line frequency is 50 Hz. When the line frequency is 60 Hz.

Returns to the setting screen.

Saves setting and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

5.3 Power Line Frequency Manual Setting

For proper electrical noise suppression, the instrument needs to be set to match the power line frequency. With the default setting (AUTO), the instrument attempts to automatically detect the line frequency, but manual setting is also available. Unless the line frequency is set correctly, measurement values may be unstable. An error message appears if line noise is high enough to prevent correct frequency detection (ERR:041 (p. 197)). In that case, set the instrument's line frequency manually.

When the [AUTO] setting is selected, the line frequency is automatically set to 50 or 60 Hz when the instrument is turned on or reset.

However, automatic detection is not available when the line frequency changes after turning power on or resetting.

If the actual line frequency deviates from 50 or 60 Hz, it is set to one of the closest frequencies.

Examples: If the actual line frequency is 50.8 Hz, select the 50 Hz setting.

If the actual line frequency is 59.3 Hz, select the 60 Hz setting.

Open the Basic Settings screen.

Open the System screen.

Select the line frequency to be used.

Return to the Measurement screen.

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Enter the last two digits of the year, and the month, day, hour, minutes and seconds in that order. (The cursor will move automatically.)

Clock settings cannot be canceled.

5.4 Setting the Clock

To record and print the correct time when using statistical calculations (p. 84), the clock needs to be set correctly. The time of printing is also output when printing statistical calculation results.

Open the Basic Settings screen.

Open the System screen.

Set the date and time.

Return to the Measurement screen.

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

0~100%, 5% step 50% (default)

Returns to the setting screen.

Saves setting and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

5.5 Adjusting Screen Contrast

The screen may become hard to see when ambient temperature changes. In this case, adjust the contrast.

Open the Basic Settings screen.

Open the System screen.

Adjust the contrast.

Return to the Measurement screen.

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

0~100%, 5% step 80% (default)

Returns to the setting screen.

Saves setting and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

5.6 Adjusting the Backlight

Adjust backlight brightness to suit ambient illumination.

• When external triggering [TRG: EXT] is selected, backlight brightness is automatically reduced after nonoperation for one minute.

• Be aware that the display may be hard to see when brightness is set too low (near 0%).

Open the Basic Settings screen.

Open the System screen.

Adjust the backlight.

Return to the Measurement screen.

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Returns all settings to their factory defaults.

Cancels the operation.

Executes.

5.7 Initializing (Reset)

The instrument can be reset by following three methods.

• System reset from the System screen: Returns all settings (except the clock) to factory defaults.

• Turn the instrument on while simultaneously holding the REF% and ABS keys: Returns all settings (except the clock) to factory defaults.

• Reset by remote control command: returns all settings (except communication and clock settings) to their factory defaults.

∗

RST command (non-backup) (p. 135)

:SYSTem:RESet command (p. 151)

This procedure describes system reset from the System screen.

Open the Basic Settings screen.

Open the System screen.

Select RESET.

Select whether to cancel or proceed to execute system reset.

The Measurement screen is displayed when system reset finishes.

5.7 Initializing (Reset)

Default Settings

Display Setting value Default value Settings

MISC

MEAS

DATA

TRG

RANGE

SPEED SLOW/ MED/ FAST

0ADJ OFF/ ON

COMP OFF/ ON

LOCK OFF/ FULL / MENU

MISC MEAS/ DATA/ SYSTEM (Miscellaneous settings)

DELAY1 0 to 100 ms (all ranges)

DELAY2 0 to 100 ms

SCALING

INT (FAST)

INT (MED)

INT (SLOW)

CONT CHECK

CONT IMP

VOLT MONITOR

CURRENT MODE CONT/ PULSE

AUTO MEMORY OFF/ ON

STATISTICS OFF/ ON

DATA OUT OFF/ ON

INT/ EXT/ MANU

↑/ ↓ [When low-power resistance measurement is set to OFF] 100 mΩ/ 1000 mΩ/ 3 Ω/ 10 Ω/ 100 Ω/ 300 Ω/ 1000 Ω/ 10 kΩ/ 30 kΩ/ 100 kΩ/ 300 kΩ/ 1000 kΩ/ 3 MΩ/ 10 MΩ/ 30 MΩ/ 100 MΩ (default) [When low-power resistance measurement is set to ON] 1000 mΩ/ 3 Ω/ 10 Ω/ 100 Ω/ 300 Ω/ 1000 Ω

OFF/ON Coefficient A Offset B

0.1 ms to 100 ms 1PLC to 6PLC (60 Hz) 1PLC to 5PLC (50 Hz)

OFF/ ON 50 Ω/ 100 Ω/ 150 Ω/ 200 Ω/ 300 Ω/

400 Ω/ 500 Ω

OFF/ ON/ PULSE 17 mA/ 25 mA/ 35 mA/ 50 mA

OFF/ ON/ ALLOFF

LOOSE/ NORMAL/ SEVERE

EXT

100 MΩ

FAST

OFF

0 ms

OFF A:1 B:0

Depends on measurement range

ON, 200 Ω

ON, 35 mA (ranges from 100 mΩ to 100 kΩ) PULSE, 35 mA (ranges from 300 kΩ to 100 MΩ)

ON, NORMAL (LOOSE when 100 MΩ range)

PULSE

OFF

Trigger setting function (p. 31)

Range switching function (p. 32)

Measurement speed (p. 29)

Zero adjustment function (p. 34)

Comparator function (p. 36)

Key-Lock function (p. 67)

Probe delay setting (p. 44)

DUT response setting (p. 44)

Scaling function (p. 46)

Integration time (p. 48)

Contact check (p. 50)

Contact Improvement (p. 52)

Voltage Monitor Function (p. 55)

Current mode setting function (p. 56)

Auto-Memory function (p. 81)

Statistical calculation function (p. 84)

Data output function (p. 87)

5.7 Initializing (Reset)

Display Setting value

SYSTEM

SET MONITOR

PROBE CHECK OFF/ ON, 0 to 100 ms

RETRY OFF/ ON, 1 to 50 ms

VOLT LIMIT OFF/ ON

TRIG EDGE OFF EDGE/ ON EDGE

EOM

INTERFACE GP-IB/ RS232C/ PRINT

PRINT MODE

LOW POWER OFF/ ON

JUDGE BEEP

KEY BEEP OFF/ ON

CLOCK Clock setting (p. 72)

LINE FREQ AUTO/ 50 Hz/ 60 Hz

CONTRAST 0 ~100

BACK LIGHT 0 ~100

RESET -

ADJUST -

OFF/ ON, 1st/ 2nd, 0.000% to 9.999%

PULSE/ HOLD 1 to 100 ms

NORMAL/ SAMPLE, 1 to 100, ALL/ IN, 1/L/ 3/L

OFF/ ON OFF/ IN/ HI/LO/ LOW/ HIGH

Default value Settings

OFF, 1st, 0.000%

OFF, 5 ms

ON, 2 ms

OFF

ON EDGE

PULSE, 5 ms

RS232C, 9600bps GP-IB, ADR01, LF

NORMAL, 100, ALL, 3/L

OFF

OFF, HI/LO

AUTO

Settings Monitor function (p. 59)

Probe short-circuit detection function (p. 57)

Retry function (p. 62)

Applied Voltage Limiter Function (p. 64)

Start Logic Setting (p. 106)

End-of-measurement pulse width (p. 105)

Interface setting (p. 113)

Set printing method (p. 91)

Low-Power Resistance Measurement (p. 28)

Comparator judgment beeper (p. 70)

Key beeper (p. 69)

Line frequency (detection) setting (p. 71)

Screen contrast adjustment (p. 73)

Screen backlight adjustment (p. 74)

Reset (p. 75)

Adjustment screen (p. A13)

5.7 Initializing (Reset)

Stores up to 30,000 measurement data using the EXT. I/O TRIG signal or by pressing the F4 [MANU] key on the Basic Settings screen.

Data Memory Function (p. 80)

Store measurement values at specified timing.

This is convenient for batch exporting data to a controller while switching reels.

Measurement values are automatically stored as they become stable. When the specified number of data points (up to 99) is acquired, the beeper sounds and auto-storing halts.

Auto-Memory Function (p. 81)

Store data after measurement value has stabilized.

This is convenient for sample inspection after printing (vapor deposition) resistors on a board.

Minimizes transfer time by eliminating the need for transmit requests from the remote controller. (RS-232C interface only)

Data Output Function (p. 87)

Automatically output (export) measurements at the end of measurement.

Stored measurement data are lost when the instrument is turned off.

Therefore, be sure to print out or export important data to a PC.

Storing and Exporting Data Chapter 6

Measurement values can be stored or automatically exported, according to application. Stored data can be output to a printer, RS-232C or GP-IB. Also, statistical calculations can be applied to internally stored data.

6.1 Storing Data at Specified Timing (Data Memory Function)

Measurement values are stored in the instrument's internal memory at the following timings (up to 30,000 points).

• All measurements performed by external (EXT) triggering

• When a trigger is applied during internally (INT) triggered measurement

The following three storage methods are available:

• Stores when an EXT. I/O TRIG

• Stores when a ∗

• Stores when the F4 [MANU] key on the [MENU] - [TRG] setting screen is pressed.

• This function can only be enabled by remote control. The data memory function should be enabled by remote command beforehand. This setting is not available on the front panel.

• Stored memory data cannot be viewed on the instrument's screen. Use remote control commands to export stored data.

TRG command is received (p. 138)

signal is received (p. 95)

Data Memory Function Operating Procedure

Moreover, stored data is automatically erased at the following timings:

• When the memory function setting (including auto-mem-

• When the range is changed (p. 32)

• When changing comparator settings (p. 36)

Enable data memory mode.

Send this remote command to enable the data memory function:

:MEMory:MODE MEMory (p. 156)

Store measurement values.

Execute external trigger measurement, or apply a trigger during internally triggered measurement.

Export the stored data.

Send this remote command to export the measurement values stored in the instrument:

:MEMory:DATA? (p. 157)

Clear measurement data from instrument memory.

Send this remote command to erase the data from instrument memory:

:MEMory:CLEar (p. 156)

• When printing the statistical calculations (p. 93)

ory) is changed (p. 156)

• When the measuring object is changed (p. 28)

• Upon system reset (p. 75)

Printing (p. 93)

Prepare the printer (p. 89). Enable Auto-Memory and set

the number of values to store.

Setting judgment criteria. (p. 36)

Measure

Beeper notifies when the specified number of values are stored.

The Basic Settings screen appears.

6.2 Store as soon as Measurement is Stable (Auto-Memory Function)

This function automatically stores the measurement value each time the probes contact the sample with internal triggering. When the specified number of values have been acquired, auto-storage operation stops. Statistical calculations are applied to the stored data, with results output to the screen or printer (RS-232C).

See: "6.3 Performing Statistical Calculations on Measurement Values" (p. 84)

"Chapter 7 Printing" (p. 89)

Data storage and printing can be automatically controlled by the Auto-Memory function.

The Auto-Memory function is disabled by default. Enable the Auto-Memory function before setting the number of values to store. Enabling the Auto-Memory function affects other functions as follows:

• Statistical calculation is forcibly turned on.

• The voltage level monitor function is forcibly turned off (the setting itself is not set to OFF, but the function is disabled).

• The trigger source setting is forcibly turned to internal [TRG: INT].

When the trigger source is set to external [TRG: EXT], the Auto-Memory function is forcibly disabled.

Deleting Stored Data

Stored data is automatically erased at the following timings:

• When the memory function setting (including data-mem-

ory) is changed (p. 156)

• When the range is changed (p. 32)

• When changing comparator settings (p. 36)

• When the power is turned off

• When printing (p. 93)

• When the measuring object is changed (p. 28)

• Upon system reset (p. 75)

• Upon setting the auto-memory number of values to store

(p. 82)

Enabling the Auto-Memory Function

Open the Basic Settings screen.

The Data Settings screen appears. [DATA SETTINGS]

Selection

Auto-Memory function is not used (default). Auto-Memory function is used.

Returns to the setting screen.

Saves setting and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

When the function is enabled

Displays the Auto-Memory setting screen.

COUNT (IN judgment) (Hi/Lo judgment)

Setting range: 1 to 99

To Reset Numerical Values

Deletes entered digits. This key is enabled only when entering numerical values.

(Example: 20 values are set to be stored.)

6.2 Store as soon as Measurement is Stable (Auto-Memory Function)

Open the Data Memory Settings screen.

Enable or disable the function.

Return to the Measurement screen.

Setting the Number of Values to Store

Open the Auto-Memory Settings screen.

Enter the number of values to store.

To abort the setting process, press . Settings are abandoned and the display returns to the previous screen.

Accept the settings and return to the Measurement screen.

6.2 Store as soon as Measurement is Stable (Auto-Memory Function)

Acquiring Measurement Values Automatically

Momentarily disconnect (open-circuit) the probes.

Connect the probes to the measuring object.

When the measurement is stable, the value is automatically stored and the count is incremented. When the count reaches the specified number of values, a long beep sounds, and subsequent measurements are not stored. The (one) last acquired value can be deleted. (Undo function (p. 86)).



16−

−

LoHi

−

−+−−

xLoHiLoHi

CpK

6.3 Performing Statistical Calculations on Measurement Values

Statistical calculations can be performed and results displayed for up to 30,000 measurement values. Printing is also available (p. 93).

Calculation types: average, maximum and minimum values, population standard deviation, sample standard deviation, and process compatibility indices

Maximum

Minimum

Mean

Population standard deviation

Standard deviation of sample

Process capability index* (variation)

Process capability index* (bias)

• When only one valid data sample exists, standard deviation of sample and process capability indices are not displayed.

• When σ

• The upper limit of Cp and CpK is 99.99. If Cp and CpK>are 99.99, the value 99.99 is displayed.

• Negative values of CpK are considered as CpK = 0.

• If statistical calculation is turned off and then back on without first clearing the calculation results, calculation resumes from the point when it was turned off.

• Measurement speed is reduced when statistical calculation is enabled.

• When Auto-Memory is enabled (ON), statistical calculation is forcibly enabled (ON).

• When statistical calculation is disabled (OFF), Auto-Memory is forcibly disabled (OFF).

= 0, Cp and Cpk are 99.99.

n-1

= MAX (x1, ....., xn)

max

= MIN (x1, ....., xn)

min

In these formulas, n represents the number of valid data samples.

Hi and Lo are the upper and lower thresholds of the comparator.

* The process capability index represents the quality

achievement capability created by a process, which is the "Quality variation and width bias possessed by the process". Generally, depending on the values of Cp and CpK, process capability is evaluated as follows:

Process capability

Cp, CpK > 1.33 ........................... Ideal

1.33 ≥ Cp, CpK > 1.00 ................ Adequate

1.00 ≥ Cp, CpK ........................... Inadequate

Deleting Statistical Calculation Results

Stored data is automatically erased at the following timings:

•

When the memory function setting (including data-memory) is changed (p. 156)

• When the range is changed (p. 32)

• When changing comparator settings (p. 36)

• When printing the statistical calculations (p. 93)

• When the measuring object is changed (p. 28)

• Upon system reset (p. 75)

• Upon setting the auto-memory number of values to store

(p. 82)

The Basic Settings screen appears.

The Data Settings screen appears. [DATA SETTINGS]

Selection

Disables statistical calculation (default). Enables statistical calculation.

Returns to the setting screen.

Saves setting and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

When statistical calculation is enabled, F3 [STAT] appears on the Measurement screen. Confirm calculation results (p. 86)

6.3 Performing Statistical Calculations on Measurement Values

Using Statistical Calculations

When statistical calculation is set to ON and an EXT. I/O trigger signal is applied, operation will be performed as follows depending on the trigger source setting:

• With external [EXT] triggering: One measurement is performed and subject to statistical calculation.

• With internal [INT] triggering: The next measurement value after the trigger signal is subjected to statistical calculation.

Operation is the same in the following cases:

(Key Operations) (Remote Control)

• When the F4 [MANU] key on the [MENU] - [TRG] selection screen is pressed.

• When the F2 [PRINT] key on the Measurement screen is pressed (with internal triggering and Auto-Memory disabled. Appears only when the interface is set for the printer.).

• When acquiring measurement values with the Auto-Memory function (p. 81).

• ∗When a

received.

• When an EXT. I/O PRINT on the Measurement screen (with internal triggering and Auto-Memory disabled).

TRG remote control command is

signal is applied

Open the Basic Settings screen.

Open the Data Memory Settings screen.

Enable or disable the function.

Return to the Measurement screen.

Calculation Results screen is displayed (only if statistical calculation is enabled).

Num

Total data count Va l Number of valid measurement values (error-free data) (Valid)

Ave

Mean

Population standard deviation

Max

Maximum

Sn1

Standard deviation of sample

Min

Minimum

Process capability index (variation)

Cpk

Process capability index (bias)

Output to the printer. "Example Printouts (PRINT MODE: NORMAL)" (p. 94)

Statistical calculation results and stored data are erased when printing finishes.

Erases the last measurement and calculation result (executes only once).

Erases all measurement values and statisti-

cal calculation results.

After selecting, a confirmation screen appears.

6.3 Performing Statistical Calculations on Measurement Values

Confirming, Printing, and Erasing Statistical Calculation Results

Statistical calculation results are displayed on the screen. Printing is available using commercially available printers having a serial interface. Statistical calculation results are automatically erased after printing. Before printing, select the [PRINT] interface setting.

See: "7.2 Setting the Instrument" (p. 91)

The number of valid samples can be confirmed on the Statistical Calculation Results screen.

• When the number of valid samples (Val) is zero, calculation results are not displayed.

• When only one valid data sample exists, no standard deviation or process capability indices are displayed.

Display the Calculation Results screen.

To print

To print, select the printer as the interface setting on the System screen (p. 91).

To erase

The Basic Settings screen appears. The Data Settings screen appears.

[DATA SETTINGS]

Selection

Disables auto-exporting (default). Enables auto-exporting.

Returns to the setting screen.

Saves setting and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

6.4 Auto-Exporting Measurement Values (at End of Measurement) (Data Output Function)

At the end of measurement, the measurement value is exported to a computer via RS-232C.

See: "Chapter 9 Communications (RS-232C/ GP-IB Interface)" (p. 109)

• Set the interface to [RS232C] beforehand. This function is not applicable to the GP-IB Interface.

See: "9.4 Configuring the Communications Protocol" (p. 113)

• When internal [TRG: INT] triggering is selected, data is exported only when a TRIG signal is applied.

• Executing a :READ? query command exports duplicate measurement values.

• Even when using other queries, ensure that the query response and auto-exporting of measured values do not overlap.

• The data format for measurement values can be selected as ASCII (default) or BINARY. Transfer time is minimized when BINARY is selected.

See: ":SYSTem:FORMat <ASCii/ BINary>" (p. 150)

Open the Basic Settings screen.

Open the Data Memory Settings screen.

Enable or disable the function.

Return to the Measurement screen.

6.4 Auto-Exporting Measurement Values (at End of Measurement) (Data Output Function)

7.1 Connecting the Printer

Printing (p. 93)

• Measurement values and comparator judgments

• Statistical calculation results

Connecting the printer to the instrument

Setting the Instrument (p. 91)

Make printer settings

Printing Chapter 7

7.1 Connecting the Printer

Before connecting the printer

Because electric shock and instrument damage hazards are present, always follow the steps below when connecting the printer.

• Always turn off the instrument and the printer before connecting.

• A serious hazard can occur if a wire becomes dislocated and contacts another con-

ductor during operation. Make certain connections are secure.

• As much as possible, avoid printing in hot and humid environments. Otherwise, printer life may be severely shortened.

• Use only compatible recording paper in the printer. Using non-specified paper may not only result in faulty printing, but printing may become impossible.

• The recording paper may jam if it move at angle relative to the roller.

Compatible printer

The requirements for a printer to be connected to the instrument are as follows. Confirm compatibility and make the appropriate settings on the printer before connecting it to the instrument.

See: "7.2 Setting the Instrument" (p. 91)

• Interface ................................ RS-232C

• Characters per line ................ At least 45

• Communication speed........... 9600 bps

• Data bits ................................ 8

• Parity ..................................... none

• Stop bits................................. 1

• Flow control ........................... none

1 Confirm that the instrument and the printer

are turned off.

2 Connect the AC adapter to the printer, and

insert the power plug into an outlet.

3 Connect the RS-232C cable to the RS-232C

connectors on the instrument and printer.

4 Turn the instrument and printer on.

Printer (Example)

AC adapter

RS-232C Cable

25 ....................... 14

Printer's (25-pin) connector (Example)

RM3542A (9-pin) Connector

Pin No.

Signal

name

Circuit Name

2 TxD

Transmitting data

3 RxD

Receiving data

7 GND

Signal ground or common return

4 RTS

Request to Send

5 CTS

Clear to Send

Circuit Name

Signal

name

Pin No.

Receiving data

RxD 2

Transmitting data

TxD 3

Signal ground or common return

GND 5

6 7 8 9

1 2 3 4 5

Connector Pinouts

13 ....................... 1

7.1 Connecting the Printer

Connecting the Printer to the Instrument

Connection Methods

7.2 Setting the Instrument

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Using the printer.

Normal printing method (default) (go to step 8). Sampling type

Selection

Setting range: 1 to 999 (default: 100)

Numeric keypad

Prints all independent of comparator judgment (default). Prints only if the comparator judgment is

Selection

Open the Basic Settings screen.

Open the System screen.

7.2 Setting the Instrument

Select print as the interface type.

Select the printing method.

Select the number of samples.

Select the printing conditions.

Prints one data set per line (default). Prints three data sets per line.

Selection

Returns to the setting screen.

Saves setting and return to previous screen.

Discards setting and return to previous screen.

The confirmation screen appears.

7.2 Setting the Instrument

Select the number of data sets per line.

Return to the Measurement screen.

(When statistical calculation is enabled)

7.3 Printing

Before Printing

Verify that the instrument and printer settings (p. 91) are correct.

Printing Measurement Values and Comparator Judgments

Printing by key operation

Press the PRINT key to print the measurement value currently displayed on the Measurement screen.

Printing by external control

Measurement values and comparator judgments can be printed when the PRINT signal (the instrument's EXT. I/O connector) is set to Low (ON) (shorted with ISO_GND

* ISO_GND is one of the pins of the instrument's EXT. I/O connector.

When statistical calculation is enabled [STATISTICS: ON] and triggering source is set to internal triggering [TRG: INT], statistical calculations are performed and measurement values are printed. When external [TRG: EXT] triggering is selected, only measurement values are printed. Use the TRIG calculations with external triggering.

signal to perform statistical

Printing Statistical Calculation Results

Statistical calculation results can be printed when auto-memory or statistical calculation is enabled [ON]. To print, select PRINT on the screen or set the PRINT nector) to Low (ON) (shorted with ISO_GND

To enable auto-memory:

See: "6.2 Store as soon as Measurement is Stable (Auto-Memory Function)" (p. 81)

To enable statistical calculation:

See: "6.3 Performing Statistical Calculations on Measurement Values" (p. 84)

signal (the instrument's EXT. I/O con-

If no valid data exists, only the data set is printed. When only one valid data set exists, standard deviation of sample and process capability index cannot be printed.

Resistance measurements

1 0.8725mOhm Lo

2 0.484mOhm Lo 3 10.99998 Ohm IN 4 -10.0026 Ohm Lo 27 9.9986 Ohm Hi 28 9.996 Ohm Hi 29 0.01003kOhm Hi 30 0.00012MOhm Hi

Measurement fault values

1 OvrRng Hi

2 -OvrRng Lo 3 C.E.Hi - 4 C.E.Lo - 5 C.E.Volt - 6 -------- --

Auto-memory data and statistical calculation results

Date(Y-M-D): 09-02-01 Time: 06:18:00 Ref: 1000.000 Ohm Upp: +1.000% Low: -1.500% 1 999.885 Ohm -0.011% IN 2 1001.885 Ohm +0.189% IN 3 1002.394 Ohm +0.239% IN 4 1002.892 Ohm +0.289% IN 5 1012.894 Ohm +1.289% Hi 6 1000.897 Ohm +0.090% IN 7 998.902 Ohm -0.110% IN 8 994.888 Ohm -0.511% IN 9 1000.391 Ohm +0.039% IN 10 979.892 Ohm -2.011% Lo Hi: 1 IN: 8 Lo: 1 OR: 0 Number: 10 Valid: 10 Max 1012.894 Ohm +1.289% ( 5) Min 979.892 Ohm -2.011% ( 10) Avg 999.492 Ohm -0.051% Sn 7.83568 Ohm Sn-1 8.25953 Ohm Cp 0.50 CpK 0.42

Resistance measurement values

*********** HIOKI RM3542A *********** Date(Y-M-D): 3/1/2016 Time: 1:45:50 PM Ref: 10.00000 Ohm Upp: +10.00% Low: -10.00%

-91.2750/Lo-95.1600/Lo +9.9998/IN

200.0260/Lo

Measurement error values

*********** HIOKI RM3542A *********** Date(Y-M-D): 3/1/2016 Time: 1:45:50 PM Ref: 10.00000 Ohm Upp: +10.0000% Low: -

10.0000%

999.9999%/Hi999.9999%/Lo MEAS.ERR/- MEAS.ERR/-- MEAS.ERR/-- MEAS.ERR/--

Auto-memory data and statistical calculation results

Date: 09-02-01 Time: 06:18:00 Ref: 1000.000 Ohm Upp: +1.000% Low: -1.500%

-0.011%/IN +0.189%/IN +0.239%/IN +0.289%/IN +1.289%/IN +0.090%/IN

-0.110%/IN -0.511%/IN +0.039%/IN

-2.011%/Lo Hi: 1 IN: 8 Lo: 1 OR: 0 Number: 10 Valid: 10 Max 1012.894 Ohm +1.289% ( 5) Min 979.892 Ohm -2.011% ( 10) Avg 999.492 Ohm -0.051% Sn 7.83568 Ohm Sn-1 8.25953 Ohm Cp 0.50 CpK 0.42

7.3 Printing

Example Printouts (PRINT MODE: NORMAL)

Example Printouts (PRINT MODE: SAMPL)

• The "Valid" statistical calculation result indicates the number (count) of data samples not subject to errors such as mea-

surement faults.

• Among the comparator judgment result counts (Hi, IN, Lo, and OR), "OR" indicates the number (count) of out-of-range

measurements.

Hioki RM3542-50, RM3542A, RM3542-51 Instruction Manual

Specifications and Main Features

Frequently Asked Questions

User Manual

Task-Oriented Reference

Measurement Flow

Introduction

Verifying Package Contents

Safety Information

Operating Precautions

1.1 Product Overview and Features

Overview Chapter 1

Block Diagram

1.2 Names and Functions of the Parts

1.3 Screen Organization

Measurement Preparations Chapter 2

2.1 Connecting the Power Cord

2.2 Connecting Measurement Probes and Test Fixtures

Making Your Own Measurement Probes

2.3 Turning the Power On and Off

3.1 Pre-Operation Inspection

Measurement Settings (Basic Measurements)

3.2 Measuring Object Types

3.3 Setting the Measurement Speed

3.4 Setting Measurement Start Conditions (Trigger Source)

3.5 Selecting the Measurement Range

3.6 Zero Adjustment

3.7 Judging Measurement Values (Comparator Function)

Enabling and Disabling the Comparator Function

Decide According to Reference Value and Tolerance (REF% Mode)

Decide According to Upper/Lower Thresholds (ABS Mode)

3.8 Confirming Faulty Measurements

4.1 Making Range-Specific Measurement Settings

Customizing Measurement Settings Chapter 4

4.2 Setting Pre-Measurement Delay

4.3 Compensating Measured Values (Scaling Function)

4.4 Setting the Measurement Integration Time Option

4.5 Checking for Poor or Improper Contact (Contact Check Function)

4.6 Improving Probe Contact (Contact Improver Function)

4.7 Detecting Measurement Voltage Faults (Voltage Level Monitor Function)

4.8 Applying Current Only When Measuring (Current Mode Setting)

4.9 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)

4.10 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)

4.11 Retrying Measurement After a Fault (Retry Function)

4.12 Limiting Measurement Voltage (Applied Voltage Limiter Function)

4.13 Maintaining Measurement Precision (Self-Calibration Function)

4.14 Compensating for Thermal EMF Offset (Offset Voltage Compensation - OVC)

5.1 Disabling and Enabling Key Operations

System Settings Chapter 5

Disabling Key Operations (Key-Lock Function)

Re-Enabling Key Operations (Key-Lock Cancel)

5.2 Setting the Comparator Judgment and Key Beepers

Enabling or Disabling the Key Beeper

Setting the Comparator Judgment Beeper

5.3 Power Line Frequency Manual Setting

5.4 Setting the Clock

5.5 Adjusting Screen Contrast

5.6 Adjusting the Backlight

5.7 Initializing (Reset)

Default Settings

Storing and Exporting Data Chapter 6

6.1 Storing Data at Specified Timing (Data Memory Function)

6.2 Store as soon as Measurement is Stable (Auto-Memory Function)

6.3 Performing Statistical Calculations on Measurement Values

Using Statistical Calculations

Confirming, Printing, and Erasing Statistical Calculation Results

6.4 Auto-Exporting Measurement Values (at End of Measurement) (Data Output Function)

7.1 Connecting the Printer

Printing Chapter 7

Connecting the Printer to the Instrument

7.2 Setting the Instrument

7.3 Printing

Printing Measurement Values and Comparator Judgments

Printing Statistical Calculation Results