Hioki RM3542, RM3542-01 Instruction Manual

Download

Page 1

Instruction Manual

RM3542

RM3542-01

RESISTANCE HiTESTER

September 2013 Revised edition 3 RM3542A981-03 13-09H

Page 2

Page 3

Contents

Task-Oriented Reference...............................1

Measurement Flow.........................................2

Introduction.....................................................3

Verifying Package Contents...........................3

Safety Information..........................................5

Operating Precautions....................................7

Chapter 1 Overview 11

1.1 Product Overview and Features ........11

 Block Diagram ..........................................14

1.2 Names and Functions of Parts ...........15

1.3 Screen Organization ..........................17

Chapter 2 Measurement Preparations 21

2.1 Connecting the Power Cord............... 22

2.2 Connecting Measurement Cables and

Test Fixtures ......................................23

 Making Your Own Measurement Cables ..24

2.3 Turning the Power On and Off ...........25

Chapter 3 Measurement Settings (Basic Measurements)

3.1 Pre-Operation Inspection ...................27

3.2 Measurement Object Types ...............28

3.3 Setting the Measurement Speed .......29

3.4 Setting Measurement Start Conditions

(Trigger Source) .................................30

3.5 Selecting the Measurement Range ....31

3.6 Zero Adjustment .................................32

3.7 Judging Measured Values

(Comparator Function) .......................34

 Enabling and Disabling the Comparator

Function .................................... ................35

 Decide According to Reference Value and

Tolerance (REF% Mode) ..........................35

 Decide According to Upper/Lower Thresholds

(ABS Mode) ............................................. 37

3.8 Confirming Faulty Measurements ......38

Chapter 4 Customizing Measurement Settings 41

4.1 Making Range-Specific Measurement Settings 41

4.2 Setting Pre-Measurement Delay ........42

4.3 Setting the Measurement Integration Time Option 44

4.4 Checking for Poor or Improper Contact

(Contact Check Function) ...................46

4.5 Improving Probe Contact

(Contact Improver Function) ...............47

4.6 Detecting Measurement Voltage Faults

(Voltage Level Monitor Function) .......49

4.7 Applying Current Only When Measuring

(Current Mode Setting) .......................50

4.8 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)

............................................................51

4.9 Comparing the Measurement Settings of Two Instruments

(Settings Monitor Function)................ 53

4.10 Retrying Measurement After a Fault

(Retry Function) ..................................56

4.11 Maintaining Measurement Precision

(Self-Calibration) ................................57

4.12 Compensating for Thermal EMF Offset (Offset Voltage Compensation - OVC) 57

Chapter 5 System Settings 59

5.1 Disabling and Enabling Key Operations 59

 Disabling Key Operations

(Key-Lock Function) ................................. 59

 Re-Enabling Key Operations

(Key-Lock Cancel) ................................... 60

5.2 Setting the Comparator Decision and

Key Beepers .......................................61

 Enabling or Disabling the Key Beeper ..... 61

2 3 4

Page 4

Contents

 Setting the Comparator Decision (“JUDGE”)

Beeper ..................................................... 62

5.3 Power Line Frequency Manual Setting 63

5.4 Setting the Clock ................................64

5.5 Adjusting Screen Contrast ..................65

5.6 Adjusting the Backlight .......................66

5.7 Initializing (Reset) ...............................67

 Default Settings ........................................ 68

Chapter 6 Storing and Exporting Data 69

6.1 Storing Data at Specific Times

(Data Memory Function) .....................70

6.2 Store as soon as Measurement is

Stable (Auto-Memory Function) ........71

6.3 Performing Statistical Calculations on

Measured Values ...............................74

 Using Statistical Calculations ................... 75

 Confirming, Printing, and Erasing

Calculation Results .................................. 76

6.4 Auto-Exporting Measured Values (at End of Measurement)

(Data Output Function) .......................77

Chapter 7 Printing 79

7.1 Connecting the Printer ........................79

 Connecting the Printer to the Instrument . 80

7.2 Instrument Settings ............................81

7.3 Printing ...............................................82

 Printing Measured Values and

Comparator Decisions 82

 Printing Statistical Calculation Results ..... 82

Chapter 8 External Control 85

8.1 External Input/Output Connector

and Signals......................................... 85

 Connector Type and Signal Pinouts ........ 86

 Signal Descriptions .................................. 87

8.2 Timing Chart .......................................88

8.3 Internal Circuitry .................................90

 Electrical Specifications ........................... 91

 Connection Examples ............................ .. 92

8.4 External I/O Settings .......................... 93

 Setting End-of-Measurement Signal Output

Signal Setting) ...............................93

(EOM

 Setting the Trigger (TRIG) Signal Logic ... 94

8.5 External Control Q&A ........................ 95

8.6 Supplied Connector Assembly ...........96

Chapter 9 Communications (RS-232C/ GP-IB Interface) 97

9.1 Overview and Features ......................97

9.2 Specifications .....................................98

9.3 Connecting .........................................99

 Using the RS-232C Interface ................... 99

 Using the GP-IB Interface

(RM3542-01 only) ........ ... ... ... .... ... ... ... ... . 100

9.4 Configuring the Communications

Protocol ............................................101

 Configuring RS-232C Interface

Communications ....................................101

 Configuring GP-IB Interface Communications

(RM3542-01 only) 102

 Select the Measurement Data Transmission

Format (both RS-232C and GP-IB) 103

9.5 Communication Methods .................104

 To cancel the Remote state

(enter the local state) .............................104

 Message Format .................................... 105

 Output Queue and Input Buffer .............. 108

 Status Byte Register ..............................109

 Event Registers ...................................... 111

 Initialization Items ...................................114

 Command Execution Time ..................... 115

 Errors During Communications .............. 115

9.6 Message List ....................................116

 Standard Commands ............................. 116

 Device-Specific Commands ...................117

9.7 Message Reference .........................122

 Message Reference Interpretation ......... 122

 Standard Commands ............................. 123

 Device-Specific Commands ...................127

9.8 Data Exporting Methods ..................148

9.9 Sample Programs ............................150

 Using Visual Basic 5.0 or 6.0 ................. 150

 Creation Procedure (Visual Basic 2005) 160  Sample Programs (Visual Basic 2005) .. 162

9.10 Device Compliance Statement ........ 164

Page 5

Chapter 10Specifications 167

Chapter 11 Maintenance and Service 179

11.1 Troubleshooting ...............................179

 Inspection and Repair .............................179

11.2 Cleaning ........................................... 180

11.3 Error Displays and Remedies ..........181

11.4 Disposing of the Instrument .............183

 Removing the Lithium Battery .................183

iii

Contents

Appendix A 1

Appendix 1Four-Terminal (Voltage-Drop)

Method......................................A 1

Appendix 2Effect of Thermal emf ...............A 2

Appendix 3Unstable Measurement Values.A 3

Appendix 4Rack Mounting..........................A 8

Appendix 5Dimensional Diagram .............A 10

Appendix 6Calibration...............................A 11

Appendix 7Adjustment Procedure ............A 13

Appendix 8Table of Commands Compatible

with the ADEX AX-162D.........A 14

Appendix 9Zero Adjustment .....................A 16

Index Index 1

6 7 8 9 10 11 12

Appendix

Index

Page 6

Contents

Page 7

Task-Oriented Reference

Setting the measurement speed (p. 29)

Task-Oriented Reference

To minimize measurement error

To judge measurement results

To correct faulty measurements

To automatically store measured values

Setting the measurement speed integration time option (p. 44)

Zero-adjustment (p. 32)

Judge measured values (comparator function) (p. 34) Compare the measurement settings of two instruments

(Settings Monitor function) (p. 53)

Confirm faulty measurement (p. 38)

Improve probe contact (Contact Improver function) (p. 47) Test for short-circuited probe (probe short-circuit detection

function) (p. 51) Compare the measurement settings of two instruments

(Settings Monitor function) (p. 53)

Store as soon as measurement is stable (Auto Memory function) (p. 71)

To print measurement results Printing (p. 79)

To measure by PLC connection

(PLC: Programmable Logic Controller)

To connect to a computer Communications (RS-232C/GP-IB interface) (p. 97)

To automatically send measurement data to a computer

(RS-232C interface only)

To check operation

External control (p. 85)

Communications (RS-232C/GP-IB interface) (p. 97)

Export measurement values automatically (when finished measuring) (p. 77)

Setting Measurement Start Conditions (Trigger Source) (p. 30) Internal trigger (INT)

Calibration (p. A11)

Page 8

Computer communications (p. 97)

Printing (p. 79)

External control (p. 85)

EXT I/O

RS-232C

GP-IB

Compare the settings of two instruments (p. 53)

SET MONITOR

Connecting the Power Cord (p. 22)

Turn the power on (p. 25)

Connect (p. 21)

Install (p. 7)

Connect the measurement cables (p. 23)

Set measurement

conditions (as needed)

Confirm the screen confi guration (p. 17)

Confirm the initial setup (p. 68)

• Basic Settings (p. 27)

• Configure settings for your

specific conditions (p. 41)

• System-related settings

(p. 59)

When changing settings

Change basic settings such as measurement speed

Change to detailed settings (measurement conditions and system-related)

Set decision criteria

(p. 34)

Data transmission (p. 77) Printing (p. 79)

Computer communications

(p. 97)

External control (p. 85)

Statistical calculations

(p. 74)

Instrument interface settings must be configured before printing or using communications or remote control.

Turn the power off (p. 25)

Measurement Flow

Be sure to read the "Operating Precautions " (p. 7) b efore us e.

Installing, Connecting and Turning On

Settings

Calculation, Printing, Communication, and External Control Settings

When Finished

Page 9

Introduction

When you receive the instrument, inspect it carefully to ensure that no damage occurred during shipping. In particular, check the accessories, panel switches, and connectors. If damage is evident, or if it fails to operate according to the specifications, contact your dealer or Hioki representative.

Confirm that these contents are provide d.

 Model RM3542 or

RM3542-01 (with GP-IB included)...............1

 Power Cord (2-line + ground)(p. 22)  EXT I/O Male Connector (p. 96)

 Instruction Manual (This document)............ 1

 Operation Guide.......................................... 1

Thank you for purchasing the HIOKI Model RM3542/ RM3542-01 Resistance HiTester. To obtain maximum performance from the instrument, please read this manual first, and keep it handy for future reference.

Model RM3542-01 is the same as the RM3542, but with GP-IB included.

Registered trademarks

Windows and Visual Basic are registered trademark of Microsoft Corporation in the United States and/or other countries.

Verifying Package Contents

Inspection

Introduction

Content confirmation

Page 10

Measurement Probes and Fixtures

(connect to measurement jacks)

 Model 9140 4-terminal Probe

 Model 9262 Test Fixture

 Model 9263 SMD Test Fixture

Alligator-clip-type measurement probes. These general-purpose dual-electrode clips fit a wide range of conductor thicknesses.

This fixture is for measuring lead components. (less than 10 m residual resistance after zero adjustment)

This fixture is for measuring chip components. (less than 10 m residual resistance after zero adjustment)

Interface Cables

 Model 9637 RS-232C Cable

(9-pin to 9-pin/ crossover cable)

 Model 9638 RS-232C Cable

(9-pin to 25-pin/ crossover cable)

 Model 9151-02 GP-IB Connector Cable (2m)

Verifying Package Contents

Options

Contact your dealer or Hioki representative for details.

Page 11

Safety Information

This instrument is designed to comply with IEC 61010 Safety S t andards , and has b een thoroughly tested for safety prior to shipment. However, mishandling during use could result in injury or death, as well as damage to the instrument. Using the instrument in a way not described in this manual may negate the provided safety features. Be certain that you understand the instructions and precautions in the manual before use. We disclaim any responsibility for accidents or injuries not resulting directly from instrument defects.

This manual contains information and warnings essential for safe operation of the instrument and for maintaining it in safe operating condition. Before using it, be sure to carefully read the following safety precautions.

Safety Symbols

In the manual, the symbol indicates particularly important information that the user should read before using the instrument.

The symbol printed on the instrument indicates that the user should refer to a corresponding topic in the manual (marked with the symbol) before usi ng the relevant function.

Indicates AC (Alternating Current).

The following symbols in this manual indicate the relative importance of cautions and warnings.

Indicates that incorrect operation presents a significant hazard th at could result in serious injury or death to the user.

Indicates that incorrect operation presents a possibility of injury to the user or dama ge to the instrument.

Indicates advisory items related to performance or correct operation of the instru ment.

Symbols for Various Standards

This symbol indicates that the product conforms to regulations set out by the EC Directive.

WEEE marking: This symbol indicates that the electrical and electronic appliance is put on the EU market after August 13, 2005, and producers of the Member States are required to display it on the appliance under Article 11.2 of Directive 2002/96/EC (WEEE).

Page 12

Safety Information

Other Symbols

Indicates the prohibited action.

(p. )

[ ] SET

(Bold characters)

Unless otherwise specified, “Windows” represents Windows 95, 98, Me, Widows NT4.0, Windows 2000, Windows XP, or Windows Vista.

Click: Press and quickly release the left button of the mouse. Double click: Quickly click the left button of the mouse twice.

Indicates the location of reference information. Indicates that descriptive information is provided below. Square brackets indicate instrument display labels (such as setting item names).

Bold characters within the text indicate operating key labels.

Accuracy

We define measurement tolera nces in terms of f.s. (full scale), rdg. (reading) and dgt. (digit) values, with the following meanings.

f.s. (maximum display value)

The maximum displayable value. This is usually the name of the currently selected range.

rdg. (reading or displayed value)

The value currently being measured and indicated on the measuring instrument.

dgt. (resolution)

The smallest displayable unit on a digital measuring instrument, i.e., the input value that causes the digital display to show a “1” as the least-significant digit.

Page 13

Operating Precautions

The instrument can be used with the stand (p. 16). It can also be rack-mounted. (p. A8).

50 mm or more

10 mm or more

Rear

50 mm or more

Unplugging the power cord kills power to the instrument. Be sure to provide enough unobstructed space to unplug the power cord immediately in an emergency.

Follow these precautions to ensure safe operation and to obtain the full benefits of the various functions.

Preliminary Checks

• Before using the instrument for the first time, verify that it operates normally to ensure that no damage occurred during storage or shipping. If you find any damage, contact your dealer or Hioki representative.

• Before using the instrument make sure that the insulation on the powe r co rd is unda mag ed and that no bare conductors are improp erly exposed. Using the instru ment in such conditions could cause an electric shock, so contact your dealer or Hioki representative for repair.

• Before using the instrument, make sure that the insulation on the measurement cables is undamaged and that no bare metal is improperly exposed. If there is any damage, measured values may be unstable and measurement errors may occur.

Operating Precautions

Instrument Installation

Storage temperature and humidity: -10°C to 50°C at 80% RH or less (non-condensating) Operating temperature and humidity: 0 to 40°C at 80% RH or less (non-condensating)

Avoid the following locations that could cause an accident or damage to the instrument.

Installation Precautions

Exposed to direct sunlight Exposed to high temperature

Exposed to liquids Exposed to high humidity or condensation

Exposed to high levels of particulate dust

Subject to vibration

In the presence of corrosive or explosive gases

Exposed to strong electromagnetic fields Near electromagnetic radiators

Near induction heating systems (e.g., high-frequency induction heating systems and IH cooking utensils)

• The instrument should be operated only with the bottom downwards.

• Do not place the instrument on an unstable or slanted surfa ce.

Page 14

Operating Precautions

Handling the Instrument

• Do not allow the instrument to get wet, and do not take measurements with wet

hands. This may cause an electric shock.

• Do not attempt to modify, disassemble or repair the instrument; as fire, electric

shock and injury could result.

To avoid damag e to the instrument, protect it from physical shock when transporting and handling. Be especially careful to avoid physical shock from dropping.

This instrument may cause interference if used in residential areas. Such use must be avoided unless the user takes special measures to redu ce electromagnetic emissions to p revent interference to the reception of radio and television broadcasts.

Handling the Cords and Probes

• Avoid stepping on or pinching cables, which could damage the cable insulation.

• To avoid breaking the cables, do not bend or pull them.

• To avoid damaging the power cord, grasp the plug, not the cord, when unplugging it from the power outlet.

• When disconnecting the BNC connector, be sure to release the lock before pulling off the connector. Forcibly pulling the connector without releasing the lock, or pulling on the cable, can damage the connector (p. 23).

• Use only the specified connection cables. Using a non-specified cable may result in incorrect measurements due to poor connection or other reasons.

• Before using a test fixture, read the instructions provided with it.

Before Turning Power On

Before turning the instrument on, make sure the supply voltage matches that indicated on its power connecto r. Connection to an improper supply voltage may damag e the instrument and present an electrical hazard.

Page 15

Before Connecting EXT I/O

To avoid electric shock or damage to the equipment, always observe the following precautions when connecting to the EXT I/O connector.

• Always turn off the power to the instrument and to any devices to be connected

before making connections.

• Be careful to avoid exceeding the ratings of external terminals (p. 91).

• During operation, a wire becoming dislocated and contacting another conductive

object can be serious hazard. Make sure that connections are secure and use screws to secure the external connectors.

• Properly insulate any devices and mechanisms to be connected to the EXT I/O con-

nector.

• The ISO_5V pin of the EXT I/O connector is a 5V power output. Do not apply ext ernal

power to this pin.

Operating Precautions

Before Measuring

• Do not apply any voltage to the measurement jacks. Doing so could damage the instrument.

• Never attempt to measure at a point wher e voltage is pr esent. In particular, do not measure a transformer or motor immediately after a temperature increase test or withstand-voltage test, as the instrument could be damaged by induced voltage or residual charge.

• Battery internal resistance cannot be measured with this instrument. It will sustain damage. To measur e battery internal resistance, we recommend the HIO KI 3554, 3555, BT3562, BT3563, and 3561 Battery HiTesters.

• To obtain the guaranteed measurement accuracy, allow at least 30 minutes warm-up.

• The instrument internally retains all settings (but not measured values), such as measurement range and comparator settings. However, measurement settings made through the RS-232C or GP-IB interface are not memorized.

• In the 100 and higher ranges (LOW POWER set to OFF), thermal emf can cause measurement errors.

• The DC resistance of a power transformer cannot be measured. When measuring objects with a large L, such as choke coils and other inductors, measured values may be unst able. In such cases, contact your dealer or Hioki rep r esentative.

• Carefully insulate all H cannot be performed and an error will occur if core and shield wires touch.

CUR

, H

POT

, L

POT

, and L

wiring. Proper 4-terminal measurements

CUR

Page 16

Operating Precautions

Page 17

1.1 Product Overview and Features

The Hioki RM3542 Resistance HiTester employs the 4-terminal method to quickly and accurately measure the DC resistance of components such as resistors and ferrite beads. It includes advanced contact-check, comparator, and data output functions. The intuitive user interface and high noise immunity are ideal for use with taping machines and separators.

Resistance Measurement

The factory defaults (initial settings) are optimized for chip-component resistance measurements. The RM3542 can also measure devices that are otherwise difficult to measure with high current, such as ferrite-bead and small multilayer inductors (low-power resistance measurement, p. 28).

Interface Communications

Connect the instrument to a controller via the RS-232C or GP-IB interface to control measurement data acquisition (p. 97).

Send Measurement Data and Calculation Results to a Printer

Use a commercially available printer with a serial interface to print measured values and calculation results (p. 79).

Save and Output Measured Values

Measured values can be stored in internal memory (p. 69) Statistical calculations can be performed on the stored data, which can be transferred to a computer in batch form (however, stored data cannot be confirmed internally).

Judge Measured Values

Measured values are compared with a pre-specified referenc e value or thresholds, and the result is output externally and indicated by the COMP indicators (comparator function, p. 34).

Connect a PLC or I/O Board

To control from a PLC, connect to the EXT I/O connector. In addition to comparator results, various measurement anomaly signals can be output (p. 85).

Upper limit

Lower limit

Compare Two Instrument’s Setting Conditions

When measuring with two interconnected instruments, settings are compared, and an alarm is output and measurement is inhibited if the settings differ (Settings Monitor function, p. 53).

Optional Hioki probes and fixtures are available to connect to the measurement jacks (BNC jacks, p. 4). Alternatively, commercially available cables such as 1.5D-2V coax can be used (p. 24).

Overview Chapter 1

1.1 Product Overview and Features

Page 18

Ultra Fast and Accurate Measurements Increase Productivity

The factory default settings are optimized for chipcomponent resistance measurements. Enhanced contact-to-measurement and contact-check-to-decision times are only 1 ms. The offset-voltage compensation (OVC) function minimizes the effects of thermal emf when using low-power resistance measurement and the 100 m

 to 10  ranges (p. 57). Measurement

results are judged pass/fail with 10 ppm resolution, ideal for high-speed Class B resistor testing.

High-Speed Dat a Output and Ample Memory

The Data Output function transfers measured data at 5 ms/sample, even via RS-232C. Up to 30,000 measurements can be stored, and all data can be exported at the end of measuring each reel. This function is ideal for system setup, debugging and process management.

Multiple Interfaces

EXT I/O is isolated from the measurement and control circuits to provide noise immunity (p. 85). All data can be acquired in real time using the built-in

38.4-kbps high-speed RS-232C interface. Connect the commercially available printer with a serial interface to print measured values and statistical calculation results (p. 79). The GP-IB interface is available for Model RM3542-01 (specified when ordering, p. 97).

Low-Power Function (p. 28)

For ranges from 1000 m to 1000 , low-power resistance measurement is provided to minimize measurement current. Safely measure devices that are otherwise difficult to measure with high current, such as ferrite-bead and multilayer inductors.

Clearly Visible Display and Intuitive Operation

High-contrast LCD provides clear visibility, helping avoid setting mistakes. The optimum range is selected automatically when comparator thresholds are entered.

Auto Memory Function Convenient for Sampling Tests (p. 71)

The auto memory function is convenient for sampling tests after screen-printing. Measured values are automatically acquired as soon as they stabilize, and statistical calculations proceed until the specified quantity is obtained, upon which an alert notification (alarm) occurs. Selecting [PRINT] (screen display) prints measured values and statistical calculation results (p. 82).

Fixtures for Component Measurements (p. 4)

The BNC-type measurement jacks exhibit good noise immunity. Ready availability and easy assembly ensure smooth system setup. Various test fixtures are available for Hioki LCR HiTesters.

Features

1.1 Product Overview and Features

Page 19

Reliable Contact Checkin g (p. 46)

Contact checking (that was previously performed before and after measuring) is now performed during measurement, so probe bounce and contact resistance fluctuations can be detected. Contact checking time can be shortened, improving tact times.

Features

Measurement Circuit Strongly Immune to Contact Resistance Fluctuations

The effects of contact resistance fluctuations are reduced even when scattering occurs near the end of probe life. Such effects are minimized by the fast response of the measurement circuit.

Contact Improver Function (p. 47)

The Contact Improver function improves bad contacts between probes and test samples. Contacts errors are reduced by penetrating oxidation and impurities between probes and samples. Reducing contact errors can increase productivity and quality. The intensity of the contact improver function can be adjusted according to probe type.

Reject Faulty Data – Voltage Level Monitor Function (p. 49)

When the contact resistance of the H

CUR

and L

CUR

leads fluctuates, the measurement current changes momentarily. Such momentary changes are not detectable by typical contact checking. The Voltage Level Monitor function detects a contact error if the detection voltage changes significantly, which can increase the reliability of measured values.

Minimize Human Error and Risk – the Settings Monitor Function (p. 53)

If the settings of two instruments are different, triggering is inhibited and an alarm notification is generated to avoid setting mistakes due to human error.

Reliable Four-Terminal Measurement – Probe Short-Circuit Detection Function (p. 51)

Four-terminal measurements are inhibited when a conductive foreign object is present between the POT and CUR probe tips. Short-circuit probe anomalies are detected by checking the resistance between these tips when not measuring.

Strong Electrical Noise Immunity

The specified measurement accuracy is achieved even with ±1.5 kV mixed pulse noise. The floating measurement section design is highly impervious to electrical noise, minimizing the effect on measured values even when turning large-induction motors on and off. The free-range power supply input (90 to 264 V) is practically unaffected by voltage fluctuations, so stable measurements are possible even in under poor power conditions.

Previously

Model RM3542

Contact Condition

Contact Check

Measuring

Probe Bounce

Contact Condition

Detection Voltage

Error

Good Contact

Poor Contact

Excessive detection voltage fluctuation error

Good Contact

ERROR

Measurement Status

Contact Check

Contact Condition Contact Improver

Function

Contact Improvement

Measuring

Checking

ONON

DUT

Foreign object

POT

CUR

DUT electrode

1.1 Product Overview and Features

Page 20

1.1 Product Overview and Features

Block Diagram

• Constant current (determined by the measurement range) is applied between the H

age is measured between the H voltage (B) by the constant current flow (A).

POT

and L

terminals. The resistance value is obtained by dividing the measured

POT

CUR

and L

terminals while volt-

CUR

• The effects of large offset voltage such as from thermal emf are reduced by current flowing in the positive and negative

directions (A).

• The constant current source (A) and voltmeter (B) circuit designs are largely unaffected by contact resistance.

• Faulty measurement values caused by unstable or chattering contact conditions can be eliminated by monitoring (C)

the detection voltage (B) waveform (Volta ge Le ve l Mo ni to r fu nction).

• Stable measurements are ensured by providing sufficient integration time (the default setting is 0.3 ms). (The integra-

tion time can be reduced to 0.1 ms to support even higher speed (B).)

• Before measuring, the Contact Improver circuit (D) optimizes contact when the probes touch the DUT.

• By also performing contact checking (E), short circuits between CUR and POT terminals caused by a clogged probe tip

can be detected (probe short-circuit detection function).

• When measurement starts, the contact check circuit (E) and constant current monitor (F) are activated to monitor for

fault conditions while measuring. The dual-CPU (C and G) design provides ultra-high-speed measurements and fast system response.

• Immunity from electrical noise is provided by isolation between the Measurement and Control blocks (H).

• The auto-ranging 100-to-240 V switching power supply (I) can provide stable measurements even in poor power quality

environments.

Page 21

Display Screen

Monochrome graphical LCD There are three general screen types: Measurement, Basic Settings and Detailed Settings.

Screen Configurations (p. 17)

F1 to F4ÉLÅ[

(FÉLÅ[: ëçèÃ)

âÊñþâEë§Ç…ï\é¶ÇŠÇÍÇÈçÄ ñÇšëIëšÇµÇ‹Ç²ÅB

Judging measured values (p. 34)

(Comparator function) Set a reference value and range for judging measurements, which can be confirmed by the COMP indicators.

Select this to judge measured values relative to a reference value and tolerance (%). The REF% setting display appears.

Press to judge measured values relative to upper/lower thresholds. The ABS setting display appears.

Setting

POWER Button

Turns the instrument on and off (p. 25).

• Unlit: power off

(when no power supplied)

• Red light: power off

(while power is supplied)

• Green light: power on

Power On/Off

Entering numerical values

Enter a numerical value. (we call these the “tenkeys”)

Switches the sign of a numerical value.

Selects the unit of measure. Sets the tolerance values.

Deletes the value in the selected field.

Accepts the displayed comparator threshold values.

Aborts comparator setting and returns to the previous display.

Measurement Terminals

Connect measurement cables or a fixture (p. 23).

• H

CUR

jack: Current source terminal

• H

POT

jack: Detected voltage high

terminal

• L

POT

jack: Detected voltage low ter-

minal

• L

CUR

jack: Measurement current

detected terminal

• GUARD jack: Shield (measurement

ground) terminal

Connecting Probes

COMP indicator LEDs

Indicate the decision result of the measured value (p. 34).

Hi Measured value is

above upper limit

IN Pass (meets crite-

ria)

Lo Measured value is

below lower limit

Viewing

Comparator

Results

Viewing Measured

Values and Settings

Audible Alarm (beeper)

Selecting the setting contents

(“the F keys”) F1 to F4 keys Selects the corresponding item on the right side of the display.

Cursor keys Move among the displayed setting items. The cursor location is indicated by reverse characters.

1.2 Names and Functions of Parts

1.2 Names and Functions of Part s

Front Panel

Page 22

Manufacturer's Serial Number

Shows the serial number. Do not remove this label, as it is required for product support.

Connect the supplied power cord (p. 22).

Connecting the Power Cord

RS-232C Connector

The RS-232C interface can be used to connect to a PLC or computer (p. 97). It is also used by the commercially available printer with a serial interface (p. 79).

RS-232C Communications

Printer Output

GP-IB Connector (RM3542-01 only)

The GP-IB interface can be used to connect to a computer (p. 97).

GP-IB Communications

SET MONITOR Connector

Connect another RM3542 here to compare instrument settings (p. 53).

Compare Two Instruments’

Settings

EXT I/O Connector

Connect to a PLC or I/O board to control measurement start, and to acquire comparator results (p. 85).

External Control

Bottom Panel

Stand

When using the stand

Extend the stand until it clicks into place. Make sure to extend both legs of the stand.

Collapsing the stand

Fold in the stand until it clicks into place.

This instrument can be rack mounted.

See: "Appendix 4 Rack Mounting" (p. A8)

Parts removed from this instrument should be stored in a safe place to enable future reuse.

Do not apply heavy downward pressure with the stand extended. The stand could be damaged.

1.2 Names and Functions of Parts

Rear Panel

Page 23

Detailed Settings Screens (p. 19)

Measurement Settings Screens [MEAS SETTINGS]

Data Settings Screens [DATA SETTINGS]

System Screens [SYSTEM]

Measurement Screen (p. 18)

Basic Settings Screen (p. 18)

Return to Previous Screen

Indicates a Continued Screen

Return to Previous Screen

1.3 Screen Organization

The instrument has three general display screen types: Measurement, Basic Settings and Detailed Settings. Refer to "11.3 Error Displays and Re medies" (p. 181) for error displays.

The screen examples in this guide appear reversed (black on white) for best visibility on the printed page. However, the instrument screens can actually be displayed only as white characters on black background.

Page 24

Measurement Screen

This screen normally appears while measuring. View currently measured values and measurement conditions. Some parts of the display depend on the comparator mode and other settings.

Measured Value

Settings Menu (corresponding to F keys)

Displayed contents depend on the curre nt function settings. Parentheses ( ) indicate the corresponding F-key

MENU (F1) Displays the Basic Settings screen PRINT (F2) Print (p. 81)

Appears only when the interface is set for the printer

ST AT (F3) Statistical calculation results (p. 74)

Appears only when statistical calculation is enabled

NUMBER (F4) Set Auto-Memory number (quantity)

(p. 71) Displays the number of stored data

items and the number of passed and failed products at the lower left.

UNDO (F3) Deletes the previously stored mea-

surement and calculation result (only one can be deleted) (p. 76) Appears only when calculation results are displayed

ALLCLR (F4) Clears all memory and calculation

(p. 76) Appears only when calculation results are displayed

LOCAL (F1) Enables local controll (p. 104) UNLOCK (F1) Cancels the key-lock state (hold 1s)

(p. 60)

Criteria Setting Values (p. 34) Displayed contents depend on the selected comparator mode. (Ex.: REF% mode)

To display the Basic Settings screen

Measurement Conditions

Shows current setting contents. Displayed contents depend on the current settings.

INT/ EXT Trigger source type (p. 30)  Measurement range (p. 31) FAST/ MED/ SLOW Measurement speed (p. 29) 0ADJ/

OFF (not shown)

Appears only when zero-adjust is enabled (p. 32)

OVC/

OFF (not shown)

(OVC: Offset Voltage Compensation) Appears only when OVC is enabled (p. 57)

LP/

OFF (not shown)

Appears only when the Low- Power Resistance function is enabled (p. 28)

NUM Appears only when tenkey input is

enabled

RMT Remote control (p. 104) M.LOCK Disables all operations except

comparator settings (p. 59)

F.LOCK Disables all operations including

comparator settings (p. 59)

Basic Settings Screen

Make basic measurement condition settings on this screen. Measurement speed and range can be changed while viewing measured values. (Trigger source: INT)

TRG

Change trigger source (measurement start control method) (p. 30) When EXT triggering is enabled, [MANU] ap-

pears beside the F4 key (press to trigger measurement manually).

RANGE Change range (p. 31) SPEED Change measurement speed (p. 29) 0ADJ Turn zero-adjust on/off (p. 32) COMP Turn comparator on/off (p. 34) LOCK Enable/disable key lock (p. 59)

Select measurement condition settings Move with cursor keys.

Measurement condition setting selections

Return to previous screen

To display the [MEAS SETTINGS] screen To display the [DATA SETTINGS] screen To display the [SYSTEM] screen

MISC To display the Detailed Settings screen

1.3 Screen Organization

Page 25

Measurement Settings Screen [MEAS SETTINGS]

Set instrument system-related settings on this screen.

SET MONITOR Turn two-instrument setting comparison

on/off (p. 53)

PROBE CHECK Turn probe short-circuit detection on/off

(p. 51)

RETRY Retry function setting (p. 56) TRIG EDGE (External I/O) Set trigger rising/falling

edge (p. 94)

EOM (External I/O) Set EOM

(end-of-mea-

surement) signal (p. 93)

INTERFACE Communications interface settings

(p. 101)

LOW POWER Low-power resistance component mea-

surement on/off (p. 28)

JUDGE BEEP Comparator beeper settings (p. 62) KEY BEEP Key beeper on/off (p. 61) CLOCK (Y-M-D) Set internal clock (p. 64) LINE FREQ Set power source frequency (p. 63) CONTRAST Adjust screen contrast (p. 65) BACKLIGHT Adjust screen backlight (p. 66) RESET Initialize (p. 67) ADJUST Instrument Adjustment (p. A13)

System Screen [SYSTEM]

Shows detailed settings for measurements. Adjust the measurement speed, stability and measurement fault detection functions.

DELAY1 Adjust the delay from probing to trigger

input (p. 42)

DELAY2 Adjust measurement object electrical re-

sponse (p. 42)

INT (FAST/ MED/ SLOW)

Make fine adjustment to integration time (p. 44)

CONT CHECK Contact check threshold setting (p. 46) CONT IMP Contact Improver function setting (p. 47) VOL T MONITOR Voltage level monitor function setting

(p. 49)

CURRENT MODE Current mode setting (p. 50)

Data Settings Screen (Save, Analysis, and Output) [DATA SETTINGS]

These are settings for memory and statistical calculation functions.

AUTO MEMORY Turn Auto-Memory on/off (p. 71) STATISTICS Statistical calculation on/off (p. 74) DATA OUT Automatically output measured values

(communications) (p. 77)

Detailed Settings Screens

1.3 Screen Organization

Page 26

1.3 Screen Organization

Page 27

Install this instrument (p. 7)

Rear PaneFront Panel

Connect measurement cables (p. 23)

Turn the power on (p. 25)

Connect to the test sample When finished measuring, turn the

power off (p. 25).

Connect the external interface

(as needed)

• Using the printer (p. 79)

• Using the RS-232C or GP-IB interface (p. 97)

• Connecting to a PLC or I/O board (p. 85)

• Automatically comparing the settings of two instruments (Settings Monitor function) (p. 53)

Connect the power cord (p. 22)

2 3

Make instrument settings (p. 27)

Measurement

Preparations Chapter 2

Be sure to read the "Operating Precautions" (p.7) before installing and connecting this instrument. Refer to "Appendix 4 Rack Mounting" (p. A8) for rack mounting.

Page 28

Rear Panel

1 Confirm that the mains supply voltage matches the

instrument, and connect the power cord to the power inlet on the instrument.

2 Plug the power cord into the mains outlet.

The POWER button on the front panel lights red. In event of a power outage, operation resumes with the same

settings when power is restored (breaker reset, etc.).

Power inlet

2.1 Connecting the Power Cord

• Before turning the instrument on, make sure the supply voltage matches that indi-

cated on its power connector. Connection to an improper supply voltage may damage the instrument and present an electrical hazard.

• To avoid electrical accidents and to maintain the safety specifications of this instru-

ment, connect the power cord only to a 3-contact (two-conductor + ground) outlet.

• Before using the instrument, make sure that the insulation on the power cord is

undamaged and that no bare conductors are improperly exposed. Any damage could cause electric shock, so cont act your dealer or Hioki representative.

To avoid damaging the power cord, grasp the plug, not the cord, when unplugging it from the power outlet.

Page 29

2.2 Connecting Measurement Cables and Test Fixtures

Example of defeated guard measurement

Connecting measurement cables

Connecting a fixture

Connect directly to the measurement jacks with the label side up, and affix with the levers on the left and right.

Connect the red plugs to the H

CUR

and H

POT

jacks, and the

black plugs to the L

CUR

and

POT

jacks.

Black plugs

Red plugs

BNC Jack Guide Pins (on the instrument)

Lock

BNC plug slots

Align the slots in the BNC plug with the guide pins on the jack on the instrument, then push and twist the plug clockwise until it locks. Disconnecting BNC connectors Push the BNC plug, twist it counterclockwise, and pull it out.

Making your own probes and extenders (p. 24)

Connection Methods

2.2 Connecting Measurement Cables and Test Fixtures

Connect your measurement cables, optional Hioki probes or test fixture to the measurement jacks. Refer to "Options" (p.4) for details. See the instructions provided with the fixture for operating details.

• Do not apply a voltage to the measurement terminals. Doing so may damage the unit.

• We recommend using optional Hioki fixtures.

• Use the GUARD jack only for Faraday shield, and avoid more than 10 mA current flow. This jack is not for guarding network resistance measurements.

Page 30

Wiring Diagram

Before Wiring

• Twist together the H

POT

and L

POT

wires, and the H

CUR

and L

CUR

wires. If not twisted together, measured values may be unstable and errors occur whe n measuring with low-power resistan ce, or low resistance values.

• Refer to the block diagram (p. 14) for internal circuit details.

• Probes and measurement objects should be shielded at BNC or GUARD jack potential.

• Measurement cable length should not exceed 2 m (with conductor resistance 500 m/m or less). Long cables are more susceptible to noise, and measured values may be unstable.

• Extensions should maintain the four-terminal structure. If con verted to a two-te rminal circuit in the wiring, correct measurement may not be possible due to the effects of wiring and contact resistance.

• Cables and measurement objects should be shielded.

• After extending measurement cables, confirm operation and accuracy ("Measurement Specifications" (p.176)).

• If cutting the ends off of optional measurement cables, make sure that the shield does not touch the center conductor of the H

CUR

, H

POT

, L

POT

and L

CUR

cables. Correct measurem ent is n ot pos -

sible with a shorted cable.

Extending Measurement Cables

Observe the following when extending measurement cables:

2.2 Connecting Measurement Cables and Test Fixtures

Making Your Own Measurement Cables

Recommended Measurement Cable Specifications

Conductor resistance Capacitance 150 pF/m or less

Cable dielectric material Polyethylene (PE), Teflon* (TFE), polyethylene foam (PEF)

Connector insulating material Teflon* (TFE ), polybutylene terephtalate (PBT)

Length 2 m or less

500 m

/m or less

Insulation resistance at least 10 G



Example: JIS standard 3C-2V, 1.5D-2V MIL standard RG-58A/U * Teflon is a registered trademark of E. I. du Pont de Nemours and Company.

Page 31

2.3 Turning the Power On and Off

Press the POWER button (it lights green).

Self-test

Indicates an error (p. 181).

After Power-On

A self-test (instrument diagnostic routine) is performed. During the self-test, the following information is displayed while the hardware is verified.

Error

No Errors

Normal display (measurement screen)

The following information is displayed during self-testing:

• Manufacturer and model name

• Firmware versions (main, and measurement)

• Communication setting

• Line frequency setting

2.3 Turning the Power On and Off

Turning Power On

When the power is turned on, the same setting as when the power was last turned off

Turning Power Off

appears (backup function). When powered up for the first time, the default settings appear.

See: "Default Settings" (p.68)

Before Starting Measurement

To obtain precise measurements, provide about 30 minutes warm-up after turning power on. Measurement settings are recalled from when the power was previously turned off (settings backup). However, measurement settings made through the RS-232C or GP-IB interface are not retained, although they can be stored using the

Press the POWER button (it lights red when the inst rument is off). Disconnect the power cord from the outlet to extinguish the POWER button light. When power is turned on again, operation resumes with the same settings as when last turned off.

If a power outage (e.g., breaker trip) occurs when the instrument is on, it will automatically turn on again when power is restored (without pressing the POWER button).

:SYSTem:BACKup command (p. 135).

Page 32

2.3 Turning the Power On and Off

Page 33

Do not use the instrument if damage is found, as electric shock or short-circuit accidents could result. Contact your dealer or Hioki representative.

Metal Exposed

Is the power cord insulation torn, or is any metal exposed?

Before using the instrument for the first time, verify that it operates normally to ensure that no damage occurred during storage or shipping. If you find any damage, contact your dealer or Hioki representative.

Peripheral Device Inspection

Is the insulation on a measurement cable torn, or is any metal exposed?

No Metal Exposed

If there is any damage, measured values may be unstable and measurement errors may occur. Replace the cable with an undamaged one.

Metal Exposed

No Metal Exposed

If damage is evident, request repairs.

Yes

Is damage to the instrument evident?

Instrument Inspection

When turning power on

Does the self-test screen appear (model no., version no.)? (p. 25)

The power cord may be damaged, or the instrument may be damaged internally. Request repairs.

Does the Measurement screen appear after self-test?

Yes

The instrument may be damaged internally. Request repairs.

See: "11.1 Troubleshooting" (p. 179)

"11.3 Error Displays and Remedies" (p. 181)

An error indication occurs (ERR)

Yes

Inspection complete

Please read the "Operating Precautions" (p. 7) before use.

3.1 Pre-Operation Inspection

Measurement Settings (Basic Measurements)

Chapter 3

See "Measurement Flow" (p. 2) for an outline of the measurement process from preparation to endof-measurement.

3.1 Pre-Operation Inspection

Page 34

Measurement range: 0.0000 m(100 m range) to

120.0000 M (10 ranges)

Normal Resistance Measurement

General-purpose resistors

Measurement range: 0.000 m (1000m range) to

1200.000  (4 ranges)

Low-Power Resistance Measurement

Hard-to-measure components such as ferrite bead or layered inductors, or other elements sensitive to measurement current

LP appears at the top of the screen.

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Normal resistance measurement (default) Low-power resistance measurement

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

The confirmation screen appears.

3.2 Measurement Object Types

The instrument provides two measurement methods: resistance measurement, and low-power resistance measurement. Select the appropriate measurement method for the type o f compo nent to be measured. For general-purpose resistor measurements, use the factory defaults. The power applied to the DUT = Resistance Value

See: "(6) DUT Becomes Warm" (p. A6)

(Example)If the resistance to be measured is 100 

(Measurement Current) (Measurement Method) 10 mA 100 1 mA 100

× 0.01 × 0.001

= 10 mW Normal Resistance Measurement, 100 Range

= 100 W Low-Power Resistance Measurement, 100 Range

× (Measurement Current)

The 1000  and higher ranges (with LOW POWER: OFF) are not usable for inductor measurements.

Open the Basic Settings screen.

Open the System screen.

Select the low-power mode, as needed.

Return to the Measurement screen.

Page 35

The Basic Settings screen appears.

Selection

See table below (default)

Press the up/down cursor keys to change the setting.

3.3 Setting the Measurement Speed

The measurement speed can be set to FAST, MED (medium), or SLOW. A slower measurement speed provides greater measurement precision, and a faster measurement speed results in greater susceptibility to environmental noise. Ensure that measurement cables and the sample are sufficiently shielded.

Open the Basic Settings screen.

Select the measurement speed.

Return to the Measurement screen.

Relationship Between Measurement Range and Speed

(factory defaults)

Measure-

ment Range

100m 3.8 ms 13 ms

1000m 2.0 ms 6.4 ms

10

100

1000

10k

100k

1000k

10M

100M

LOW POWER: OFF LOW POWER: ON

FAST MED SLOW FAST MED SLOW

1.6 ms 6.0 ms

0.9 ms 3.6 ms

1.0 ms 3.6 ms

1.3 ms 3.8 ms

2.5 ms 6.0 ms

5.3 ms 26 ms

22 ms

23 ms 20 ms

46 ms 39 ms

43 ms 36 ms

41 ms 35 ms

41 ms 34 ms

21 ms 17 ms

21 ms 18 ms

23 ms 20 ms

86 ms 72 ms

  

2.5 ms 12 ms

1.7 ms 6.1 ms

7.2 ms 12 ms

  

Integration time can be optionally set for each range (p. 44).

42 ms 35 ms

41 ms 34 ms

47 ms 40 ms

Upper value: for 50-Hz power line frequency

Lower value: for 60-Hz power line frequency

Tolerance:

±10%±0.2 ms

Page 36

Trigger signals are automatically generated internally for continuous measurement.

Measure with internal (INT) triggering

To measure automatically

Measurements are triggered by an external signal. Manual measurement triggering is also available.

• Apply a trigger signal at the EXT I/O connector (p. 85)

• Send the TRG command by communications interface (p. 126)

• Press F4 [MANU] (only appears when EXT is selected)

Measure with external (EXT) triggering

To measure at specific times To retain measured values

• When internal triggering is enabled, the EXT I/O TRIG signal and the “TRG” command are ignored (except for memory storage and statistical calculations).

• To measure samples such as inductors that require time to settle, adjust delay time DELAY2. Start with a long delay, and gradually shorten it while watching for the measured value to settle.

See: "4.2 Setting Pre-Measurement Delay" (p. 42)

• When external triggering is enabled, the Auto-Memory function is disabled by force.

The Basic Settings screen appears.

Selection

Internal trigger External trigger

(default)

Press F3 [EXT] to display the F4 [MANU] indicator. Press to trigger a measurement manually.

Press the up/down cursor keys to change the setting.

3.4 Setting Measurement Start Conditions (Trigger Source)

Measurements can be started in two ways.

Open the Basic Settings screen.

Select internal (INT) or external (EXT) triggering.

Return to the Measurement screen.

Continuous measurement (:INITIATE:CONTINUOUS ON) is the n ormal trigger state when operatin g from the front panel. Selecting the internal (INT) trigger source activates continuous triggering ("free-run"). When external (EXT) triggering is selected, each external trigger event initiates one measure ment. Continuous measurement can be disabled by sending the IB. When continuous measurement is disabled, trigger acceptance is controlled only by the host (computer or PLC).

See: for trigger command: "Triggering" (p. 138), "9.8 Data Exporting Methods" (p. 148)

:INITIATE:CONTINUOUS OFF command via RS-232C or GP-

Page 37

The Basic Settings screen appears.

Selection

Press the up/down cursor keys to change the setting.

Increments the range

Decrements the range

3.5 Selecting the Measurement Range

The measurement range can be set as follows. When making comparator settings with the panel keys, the measurement range is selected automatically according to the settings (reference/tolerance or upper/lower thresholds, see the following table). When the comparator settin gs are made by remote control commands, the measurement range is unaffected.

Changing the Range

Measurement error is larger when measuring values nearer the bottom of a measurement range.

The 1000  and higher ranges (with LOW POWER: OFF) are not usable for inductor measurements.

Auto-Ranging (when making comparator settings)

Low Power OFF (p. 28) Low Power ON (p. 28)

Reference (REF%) and Upper/Lower Threshold (ABS) Ranges

0 to 100.09 m 100 m 

100.1 to 1000.9 m 1000 m 0 to 1000.9 m 1000 m

1.001 to 10.009  10  1.001 to 10.009  10 

10.01 to 100.09  100  10.01 to 100.09  100 

100.1 to 1000.9  1000  100.1 to 1200.0  1000 

1.001 to 10.009 k 10 k

10.01 to 100.09 k 100 k

100.1 to 1000.9 k 1000 k

1.001 to 10.009 M 10 M

10.01 to 120.00 M 100 M

Selected Range

Reference (REF%) and Upper/Lower Threshold (ABS) Ranges

Selected Range

Manual Range Selection

Open the Basic Settings screen.

Select the range.

Selectable ranges depend on the low-power resistance setting (p. 28).

• When low-power resistance measurement is disabled (OFF)

100m, 1000m, 10, 100, 1000, 10k, 100k, 1000k, 10M, 100M(default)

• When low-power resistance measurement is enabled (ON)

1000m, 10, 100, 1000

Return to the Measurement screen.

Page 38

The Basic Settings screen appears.

Selection

Internal trigger

Press the up/down cursor keys to change the setting.

Selection

Disable zero adjustment (cancel) Execute zero adjustment

3.6 Zero Adjustment

When four-terminal measurement (Kelvin connection) is impractical such as when measuring very small samples, the additional inherent resistance of the two-terminal wiring should be canceled out. The zero-adjustment function can cancel out up to 10  additional resistance.

Before Zero Adjustment

• The guaranteed accuracy of the instrument applies to four-terminal connections without zero adjustment. When using four-terminal connections, do not execute zero adjustment. Executing zero adjustment with incorrect wiring may amplify measurement error. However, zero adjustment may be needed even with fourterminal measurements if they are affected by a large offset voltage, such as due to thermal emf (LOW POWER OFF, in 100  to 100 M ranges).

• Execute zero adjustment when the ambient temperature has changed, or when a probe is replaced.

Execute zero adjustment after the warm-up period following power on.

Open the Basic Settings screen.

Select the internal (INT) trigger mode.

Short the probes together.

Confirm that the measured value does not exceed 10 .

If no measured value is displayed, increment the measurement range (p. 31).

Select whether to enable or disable zero adjustment.

After confirming that the measured value does not exceed 10 , execute zero adjustment.

Return to the Measurement screen.

Page 39

Zero Adjustment Faults

If zero adjustment fails, the following error message appears.

3.6 Zero Adjustment

Before attempting zero adjustment again, confirm the following:

• With the 10  range selected, confirm that the displayed value does not exceed 10 .

• Confirm that the probe connections are correct.

Page 40

Measured value is above upper limit

Pass (meets criteria)

Measured value is below lower limit

Select the REF% (relative values) decision mode

Decide whether a measured value is within specified tolerance limits relative to a specified reference value (p. 35)

Select the ABS (absolute values) decision mode

Decide whether a measured value is between specified upper and lower threshold values (absolute values) (p. 37)

12.000 k ..... reference value

+0.080%........ positive tolerance

-0.080%......... negative tolerance

example

100.00 m .... upper threshold

80.00 m ...... lower threshold

example

Hi IN IN Lo

Hi IN

Positive tolerance [%]

Reference value [

]

Negative tolerance [%]

Upper threshold [

]

Lower threshold [

]

3.7 Judging Measured Values (Comparator Function)

Comparator results are available as external output (at the EXT I/O connector) when the comparator reference/tolerance or upper/lower threshold values have been set.

See: "Chapter 8 External Co ntrol" (p. 85)

Comparator results are also indicated by the COMP Hi/IN/Lo panel lamps, and by audible beeper (disabled by default).

See: "Setting the Comparator Decision (“JUDGE”) Beeper" (p. 62)

The comparator decision mode can be set as one of the following:

Before Using the Comparator Function

• When the measured value is out of the selected measurement range, comparator decision indicators appear as follows. In the event of a measurement fault, no decision is made.

See:"3.8 Confirming Faulty Measurements" (p. 38)

Out-of-Range Display Comparator Decision Indicator

• If power is turned off during comp arator setting, changes to settings are lost as they revert to their previous values. To accept the settings, press the ENTER key.

• When setting comparator criteria, the appropriate range is selected automatically. Refer to "Auto-Ranging (when making comparator settings)" (p. 31) for range settings.

+OvrRng Hi

-OvrRng Lo

Page 41

3.7 Judging Measured Values (Comparator Function)

The Basic Settings screen appears.

Selection

Disable the function Enable the function

Press the up/down cursor keys to change the setting.

(When the function is disabled) Comparator decisions are indicated only when the function is enabled .

Relative Value = (tolerance)

Reference

Value

Measured

Value

- 1

X 100 [%]

Setting range:

-9.999% to +9.999% (When 10% or less)

-99.99% to +99.99% (When more than 10%)

Reference value Positive tolerance (upper decision threshold) Negative tolerance (lower decision threshold)

Enabling and Disabling the Comparator Function

The comparator function is enabled by default. When the function is disabled, comparator settings are ignored.

Open the Basic Settings screen.

Enable or disable the comparator function.

Return to the Measurement screen.

Decide According to Reference Value and Tolerance (REF% Mode)

Example: Set a reference value of 10.5

To abort the setting process, press . Settings are abandoned and the display returns to the previous screen.

 with ±4.5% decision tolerance.

Open the relative tolerance setting screen.

Page 42

Selection

To Reset Numerical Values

Deletes entered digits. This key is enabled only when entering numerical values.

To change the value after selecting the units, use the cursor keys to select the item to change, then enter the new value with the tenkeys.

1_ 10_ 10._ 10.5_ 10.50



(Example: 10.5)

Selection

To Reset Numerical Values

Deletes entered digits. This key is enabled only when entering numerical values.

To change the value after selecting the units, use the cursor keys to select the item to change, then enter the new value with the tenkeys.

To Set a Negative Value

Press this key to change the sign, as needed.

+4_ +4._ +4.5_ +4.500%

(Example: 4.5%)

Selection

• Internal calculations are performed on floating-point values, and decisions round up any fraction of the

least-significant digit.

• Displayed values of the reference and tolerances are rounded according to the selected range. Internal

calculations use unrounded data, so decisions are based on the entered (setting) values.

• An error message appears if you press ENTER with the positive tolerance set lower than the negative

tolerance.

See: "11.3 Error Displays and Remedies" (p. 181) (ERR:001)

3.7 Judging Measured Values (Comparator Function)

Set the reference value.

Pressing an inoperative key during setting sounds a low-pitch beep (when the key beeper is enabled).

Press the units key to accept the setting and move the cursor to the positive tolerance.

Set the positive tolerance.

Press the % key to accept the setting and move the cursor to the negative tolerance value. The negative tolerance is initially set to the same amplitude as the positive tolerance (change as needed).

Set the negative tolerance in the same way (as needed).

Accept the settings and return to the Measurement screen.

Page 43

Upper threshold Lower threshold

1_ 15_ 150_ 150.0m

(Example: 150 m)

Selection

To Reset Numerical Values

Deletes entered digits. This key is enabled only when entering numerical values.

To change the value after selecting the units, use the cursor keys to select the item to change, then enter the new value with the tenkeys.

Selection

(Example: 50 m)

5_ 50_ 50.0m

• Internal calculations are performed on floating-point values, and decisions round up any fraction of the

least-significant digit.

• Displayed values of the reference and tolerances are rounded according to the selected range. Internal

calculations use unrounded data, so decisions are based on the entered (setting) values.

• An error message appears if you press ENTER with the positive tolerance set lower than the negative

tolerance.

See: "11.3 Error Displays and Remedies" (p. 181) (ERR:001)

3.7 Judging Measured Values (Comparator Function)

Decide According to Upper/Lower Thresholds (ABS Mode)

Setting example: Upper threshold 150 m, lower threshold 50 m

To abort the setting process, press . Settings are abandoned and the display returns to the previous screen.

Open the absolute value threshold setting screen.

Set the positive tolerance.

Pressing an inoperative key during setting sounds a low-pitch beep (when the key beeper is enabled). No error message is displayed.

Press the units key to accept the setting and move the cursor to the lower threshold value.

Set the negative tolerance in the same way.

Press the units key to accept the setting and move the cursor to the upper threshold.

Accept the settings and return to the Measurement screen.

Page 44

Appears when the measured value is outside of the measurement or display range. Check for a broken sample component. The comparator result is Hi when +OvrRng is displayed, and Lo when -OvrRng is displayed. No external measurement fault signal (ERR

) is output.

Out-of-Range

The resistance between the H

POT

and H

CUR

probe contacts, and between the L

POT

and L

CUR

probe contacts, are measured and compared with specified contact fault values. An error message appears when the measured value reaches or exceeds the specified contact fault values. If this error persists, probe wear or cable failure may be the cause. If the error is not cleared by shorting the tips of a known-good measurement cable, the instrument requires repair.

Contact Check Fault

This method monitors the stability of the voltage between H

POT

and L

POT

probe contacts. An error message appears when voltage instability is detected due to chattering of the probe contacts. If this error persists, the probes may be degraded due to wear. C.E. Volt may also be displayed when external noise is strong.

Voltage Level Monitor Fault

See: "Out-of-Range Detection Function" (p. 39)

See: "4.4 Checking for Poor or Improper Contact

(Contact Check Function)" (p. 46)

See: "4.6 Detecting Measurement Voltage Faults

(Voltage Level Monitor Function)" (p. 49)

This display appears after changing measurement settings and before the next measurement is performed.

- - - - - - -

Display Examples: Display Measurement State and Appearance with Open-Circuit Probe

Display Measurement State

Current Monitor Results Normal (PASS) Fault (FAIL)

Contact Check Results Voltage Level Monitor

Results

Normal (PASS)

Display: Measured Value COMP indicator: According to the measured value

Display: +OvrRng/ -OvrRng COMP indicator: Hi/ Lo (when connection to the measurement object is broken)

Fault

(FAIL)

Display: C.E. Hi/ C.E. Lo/ C.E. Volt COMP indicator: No decision EXT I/O: ERR

signal output

Display: C.E. Hi/ C.E. Lo/ C.E. Volt COMP indicator: No decision EXT I/O: ERR signal output

+OvrRng

-OvrRng

C.E. Hi C.E. Lo

C.E. Volt

Display

This method monitors the regulated measurement current for normal flow through the DUT. An error is detected mainly when a measurement fault occurs due to an open-circuit DUT or between the H

CUR

and

CUR

probe's poor contacts.

The error display depends on the contact check and voltage level monitor states (see the table below).

Current Monitor Fault

See: "Current Monito r Function" (p. 39)

The measurement fault display differs according to detection order

and settings.

3.8 Confirming Faulty Measurements

When a measurement is not performed correctly, a measurement fault indicator appears and a measurement fault signal is output at the ERR detection). The instrument detects measurement faults by the following four methods.

pin of the EXT I/O connector (except for out-of-range

Page 45

3.8 Confirming Faulty Measurements

NoNoNoNoNo

Measurement Fault Detection Order

Measurement Fault Detection Display EXT I/O signal

Probe Short Circuit

Hi Wiring Contact Error

Lo Wiring Contact Error

Voltage Level Monitor Error

Constant-Current Error

Below Lower Limit

Above Upper Limit

No Measurement Data

Yes

ERR: 021

C.E. Hi

C.E. Lo

C.E. Volt

+OvrRng

-OvrRng

+OvrRng

- - - - - - - -

PRB_SHORT output, ERR output

ERR output, CE_HI output

ERR output,

output

CE_LO

ERR output

HI output

LO output

HI output

Measurement fault detection proceeds in the order shown at the left, ending with display of the first detected error.

Corresponding measurement fault signals are also output at the EXT I/O connector.

Out-of-Range Detection Function

Examples of Out-of-Range Faults

Out-of-Range Detection Measurement Example The measured value is outside of the

measurement range. The relative tolerance (%) display of

the measured value exceeds the display range (999.999%).

The zero-adjusted value is outside of the display range.

While measuring, input voltage exceed the A/D converter input range.

Attempting to measure 13 k with the 10 k range selected

Measuring 500  (+2400%) with a reference value of 20 

In the 1  range with 0.5  zero-adjustment in effect, measuring 0.1  provides a zero-adjusted value of -0.4 , which is outside of the display range.

Measuring a large resistance value in an electrically noisy environment

Current Monitor Function

The instrument supplies constant measurement current through the DUT via the H current monitor fault occurs if constant current cannot be attained. If the contact check and voltage level monitor results are normal, the out-of-range and comparator result displays indicate “Hi”.

Example of Current Monitor Fault

• Broken DUT (open work)

•H

CUR CUR

or L or L

probe contact fault

CUR

cable break

CUR

and L

probes. A

CUR

Page 46

3.8 Confirming Faulty Measurements

Page 47

4.1 Making Range-Specific Measurement Settings

The Basic Settings screen appears.

The Measurement Settings Screen appears. [MEAS SETTINGS]

Selection

Customizing Measurement

Settings Chapter 4

(set as needed)

Change measurement settings as appropriate for your application. Refer to "Detailed Settings Screens" (p. 19) for the available settings.

4.1 Making Range-Specific Measurement Settings

These settings can be made for each range (except for the DELAY1 setting).

Open the Basic Settings screen.

Open the Measurement Settings Screen.

Select the range to use.

Set the items as needed.

Page 48

The DELAY1 setting is common to all ranges. The default setting is 0 ms (corresponding to trigger signal input at the same time as probe contacts become stable). Setting DELAY1 affects measurements in all ranges.

Set DELAY1

Adjust this setting to allow for probe contact mechanical stabilization.

Set DELAY2 to the time needed for stabilization after measurement current is applied, such as may be required for inductive components. The setting affects only the selected range. The default setting is 0 ms (corresponding to resistance measurement of non-inductive components).

Set DELAY2

Adjust this setting to allow for stabilization of the measurement sample.

DELAY1 and DELAY2 Timing Chart

* Internal delay is provided to suit purely resistive (non-reactive) DUTs,

and is different for each measurement range.

Acquisition

Stable Contact

Internal

Delay*

Probe Contact Condition

Start TRIG

Measurement Current

Acquisition of Measured Value

End of Measurement Signal EOM

4.2 Setting Pre-Measurement Delay

This setting specifies the delay between trigger signal input and the start of measurement. Adjust this setting to delay measurement until the measured value has time to st abilize, so that even if the sample is connected after triggering, measurement starts only after the specified delay. The delay can be set by two methods, as follows.

Page 49

The Basic Settings screen appears.

The Measurement Settings Screen appears. [MEAS SETTINGS]

Selection

Setting range: 0.0 ms (default) to 100.0 ms

DELAY1 is common to all ranges, while DELAY2 can be set for each range independently (p. 41).

Tenkeys

Selection

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

4.2 Setting Pre-Measurement Delay

Determining the Delay Time

Set the delay so that inductance does not affect measurements. To fine tune the delay, begin with a longer delay than necessary, then gradually shorten it while watching the

measured value.

Open the Basic Settings screen.

Open the Measurement Settings Screen.

Set DELAY1 or DELAY2.

Return to the Measurement screen.

Page 50

The Basic Settings screen appears.

The Measurement Settings Screen appears. [MEAS SETTINGS] (The settings for the current measurement range are displayed.)

Selection

4.3 Setting the Measurement Integration Time Option

The integration time can be optionally set for each range by selecting FAST, MED, or SLOW measurement speed. Integration time can be set in ms or PLC* units.

* PLC = Power Line Cycle, where one PLC is the period of the power line waveform. At 50 Hz, one PLC = 1/50th of a sec-

ond, and at 60 Hz, one PLC = 1/60th of a second. PLC setting units are useful where measurements may be affected by power line noise (high- or low-resistance measurements)

Default Settings

LOW POWER: OFF (p. 28) *1 LOW POWER: ON (p. 28) *1

Range

100m 1000m 0.3 ms 2.5 ms 1PLC

10 0.3 ms 2.5 ms 1PLC 100 0.3 ms 3.0 ms 1PLC OFF 0.3 ms 2.5 ms 1PLC 1000 0.3 ms 3.0 ms 1PLC OFF 0.3 ms 2.5 ms 1PLC 10k 0.3 ms 3.0 ms 1PLC OFF 100k 0.5 ms 3.0 ms 1PLC OFF 1000k 1.5 ms 5.0 ms 1PLC OFF 10M 2.5 ms 1PLC 1PLC OFF 100M 1PLC 2PLC 4PLC OFF

Integration Time [INT]

FAST MED SLOW FAST MED SLOW

0.5 ms 5.0 ms 1PLC ON

OVC

ON ON

*2 *2 *2

Integration Time [INT]

   

0.5 ms 5.0 ms 1PLC

                   

OVC

ON ON ON ON

*2 *2 *2 *2

*1. Low Power = Low-Power Resistance Measurement (p. 28) *2. Two measurements are made within the above integration times.

Open the Basic Settings screen.

Open the Measurement Settings Screen.

Page 51

Select the integration setting units.

Selection

Set in units of time Set in units of power line cycles

The setting is specific to the selected range (p. 41)

Selection

Setting range:

• When setting in ms units: 0.1ms to 100.0ms

• When setting power-line-cycle units: 1 to 6PLC (60 Hz),

1 to 5PLC (50 Hz)

2 3

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

Select the integration time.

4.3 Setting the Measurement Integration Time Option

Return to the Measurement screen.

• The instruments accuracy specifications are applicable only with the default integration times. Investigate your measurement requirements carefully before changing the integration time.

• When the ef fects of power line noise can be ignored, the integration time can be set longer than the default to reduce scattering of measured values. On the other hand, if the inte gr ation time is too short, scattering increases. For high-or low-resista nce and low-po wer resistance measurements that are easily affected by power line noise, we suggest setting according to the power line period (PLC units).

Page 52

The Basic Settings screen appears.

The Measurement Settings Screen appears. [MEAS SETTINGS]

Selection

Disables the function (go to step 5) Enables the function (default)

The setting is specific to the selected range (p. 41)

Selection

50, 100, 150, 200 (default), 300, 400, 500 A contact fault occurs when a measured value exceeds the threshold setting.

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

4.4 Checking for Poor or Improper Contact (Contact Check Function)

This function detects poor contact between the probes and DUT, and broken measurement cables. The instrument continually monitors the resistance between the H

and L

CUR

When the resistance is outside of the specified value, a contact check fault occurs and the C.E. Hi or C.E. Lo error message appears. No comp arator decision is applied to the me asured value. When these error messages appear, check the probe contacts, and check for broken measurement cables. If the error is not cleared by shorting the tips of a known-good measurement cable, the instrument requires repair.

probes from the start of integration (including response time) and while measuring.

POT

CUR

and H

probes and the

POT

• During low-resistance measurement, poor contact of the H range measurement.

• When contact checking is disabled, measured values may be displayed even when a probe is not contacting the DUT.

Open the Basic Settings screen.

Open the Measurement Settings Screen.

Enable the Contact Check function.

CUR

or L

probe may be detected as an out-of-

CUR

Select the contact check fault threshold resistance.

Return to the Measurement screen.

Page 53

OFF setting

ON setting

PULSE setting

* Internal delay is different for

each range.

Measurement

Measuring

Start

TRIG

Internal delay *

Internal

delay *

Approx.

100

s

Measuring

Start

TRIG

Start

TRIG

Measurement

Contact Improver current: Off

Contact Improver current: On

Contact Improver current: Pulse

Probe Contact

Condition

Probe Contact

Condition

Probe Contact

Condition

Stable Contact

Timing Chart (Contact Improver Function)

DELAY 2

DELAY 1

DELAY 2

DELAY 1

DELAY 2DELAY 1

4.5 Improving Probe Contact (Contact Improver Function)

Probe contacts can be improved by applying current from the POT to the CUR probes before measuring.

The Contact Improver function applies voltage to the sample. Be careful when measuring samples with characteristics that may be affected.

The current used for the Contact Improver functions can be selected as follows. 17 mA, 25 mA, 35 mA (default), 50 mA Higher current provides more effect ive contact improvement, but at the cost of faster probe deterioration. Contact Improver current can be set to be disabled (OFF), enabled (ON), or PULSE. The PULSE setting applies the contact improvement current for about 100 µs immediately before meas urement. The PULSE setting is usefull to decrease Joule heating if the DUT is susceptible to its current.

100 m-range to 100 k-range 1 M to 100 M-range

DUT current * 2mA max. 60 mA max. DUT voltage 20 V max. 15 V max.

*:It takes several microseconds for the DUT current to reach the steady-state value. Until the steady-state

value is reached, a transient current that is approximately equal to the contact improvement current setting (default setting: 35 mA) will flow.

*1 Steady state value.

A rush current of approximately 100 mA flows for 100µs, when a probe came in contact with DUT.

Page 54

The Basic Settings screen appears.

The Measurement Settings Screen appears. [MEAS SETTINGS]

Selection

Disable probe contact improvement (go to step 4).

Enable probe contact improvement. Apply contact improvement current for

about 100

µs immediately before mea-

surement.

The setting is specific to the selected range(p. 41)

Selection

17mA, 25mA, 35mA (default), 50mA

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

4.5 Improving Probe Contact (Contact Improver Function)

For ranges between 1000 k and 100 M, the [PULSE] setting is enabled by default. Before measuring in the ranges from 1000 k to 100 M with the Contact Improver function set to [ON], verify that measurements are not biased.

Open the Basic Settings screen.

Open the Measurement Settings Screen.

Set the Contact Improver current timing to disabled (OFF), enabled (ON), or PULSE.

(When selecting ON or PULSE) Set the current limit value.

Return to the Measurement screen.

Page 55

The Basic Settings screen appears.

The Measurement Settings Screen appears. [MEAS SETTINGS]

Selection

Disables the function (go to step 5) Enables the function (default)

The setting is specific to the selected range (p. 41)

Selection

Loose * Normal* Severe

*. Default setting: Loose is

the default for the 100 M



range, and Normal for all other ranges.

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

4.6 Detecting Measurement Voltage Faults (Voltage Level Monitor Function)

When a measurement voltage fault occurs due to probe chattering, the C.E. Volt error message appears on the measurement screen and an The C.E. Volt error may also appear when external noise is strong.

Check the following if errors occur frequently:

• Check for probe deterioration.

• Provide additional noise suppression. "Appendix 3 Unstable Measurement Values" (p. A3)

• Set the voltage level monitor to Loose, or OFF (disable).

Open the Basic Settings screen.

ERR signal is output.

Open the Measurement Settings Screen.

Enable or disable the function.

(When enabled (ON selected))

Select the voltage level monitor threshold.

Return to the Measurement screen.

Page 56

The Basic Settings screen appears.

The Measurement Settings Screen appears. [MEAS SETTINGS]

Selection

Measurement current is applied while awaiting trigger.

Measurement current is applied only while measuring (default).

The setting is specific to the selected range (p. 41)

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

4.7 Applying Current Only When Measuring (Current Mode Setting)

When the Contact Improver function is set to Pulse or disabled (CONT IMP: PULSE or OFF) and measurement current is set for pulse output, open-circuit voltage when not measuring does not exceed 20 mV.

See: "4.5 Improving Probe Contact (Contact Improver Function)" (p. 47)

When the Contact Improver function is enabled (CONT IMP: PULSE or ON setting), the current mode setting is ignored even if set to contin u ous (CURRENT MODE: CONT setting). The Contact Improver function forces pulse operation with measurement current applied only during measurement.

Open the Basic Settings screen.

Open the Measurement Settings Screen.

Select whether to apply current when not measuring.

To apply measurement current continuously (CONT setting) even when waiting for a trigger, confirm that the Contact Improver function is disabled (CONT IMP: OFF, (p. 47)).

Return to the Measurement screen.

Page 57

4.8 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)

Foreign Object

POT

CUR

DUT Electrode

DUT

Timin g Chart (Probe Short-Circuit Detection)

Probe short-circuit

PRB_SHORT

Comparator

Hi, IN, Lo

End of Measurement

EOM

Measurement

Start

TRIG

Contact

Transport

Measurement stage

Available

Short-Circuit Detection

Transport

DUT1 contact

DUT2 contactTransport

Probe short-circuit

DUT1

measurement

DUT2

measurement

Short-Circuit

No Decision

Detection timing setting

4.8 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)

Four-terminal measurements are not possible when a conductive foreign object is present between the POT and CUR probe tips. To detect short-circuited probes, this function measures the resistance between the CUR and POT terminals after a specific time (initially 5 ms) following the end of measurement. Probe short-circuit detection is disabled by default.

When a probe short-circuit is detected, an error message appears on the measurement screen, and the output. (

Short-circuit detection can also be controlled by asserting the active-low PRB_CHECK EXT I/O signal. Asserting the PRB_CHECK end of measurement (p. 85).

ERR:021 Probe short error)

signal while measuring causes short-circuit detection to be performed after the

PRB_SHORT and ERR signals are

About Probe Short-Circuit Detection

• If probes are connected to the DUT durin g probe shor t-circuit detection, the sho rt circuit is detected. Ensure that the probes have sufficient time to separate from the measurement object.

• Probe short-circuit detection occurs within about 1 ms.

• The threshold for probe short-circuit dete ctio n is fixed at 500 , so if the resistance between CUR and POT probes is larger, detection is not possible.

• Even while the probe short-circuit detection function is set to be disabled, short-circuit detection is performed when the

EXT I/O PRB_CHECK signal is asserted.

• When the internal trigger [TRG: INT] source is selected, short-circuit detection is not performed after the end of mea-

surement. However, short-circuit detection can still be executed by asserting the PRB_CHECK

signal.

Page 58

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Disables the function (default) (go to step 5)

Enables the function

Selection

Setting range: 1 to 100 ms, 5 ms (default)

Short-circuit detection is delayed for the specified time following the end of measurement.

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

4.8 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)

Probe Short-Circuit Detection Enable/Disable

Open the Basic Settings screen.

Open the System screen.

Enable or disable the function.

(When enabled (ON selected))

Set the probe detection timing.

Return to the Measurement screen.

Page 59

4.9 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)

1st Stage

2nd Stage

Transport Direction

ABCDE

Automatic Comparison

The SET MONITOR connectors are identical to RS-232C connectors. Be careful to avoid connecting the wrong connectors.

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Disables the function (default) Enables the function

4.9 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)

This function automatically compares the settings of two instruments to determine whether they are the same. Only those measurement settings affecting the comparator and speed are compared. When the settings differ, an alarm notification appears and subsequent nal input is prevented from starting measurement.

When the settings of two instruments match, TRIG input is accepted and measurement starts. However, if the range defined by the upper and lower thresholds of the second stage is broader than that of t he f irst st age, me asur ement still starts despite the different threshold settings.

TRIG sig-

Connect the two instruments’ SET MONITOR connectors together using a Hioki 9637

RS-232C cable.

Open the Basic Settings screen.

Open the System screen.

Enable the function on both instruments.

Page 60

Selection

Selects this instrument as the 1st stage Selects this instrument as the 2nd stage

Enter the difference in tolerance (%) to be allowed at the 2nd stage from the tolerance range set for the 1st stage. Setting range: 0.000 to 9.999%

Example: If the 1st stage is set to measure 12

 ±0.800%, and the 2nd is to measure

 ±1.000%, enter the difference in toler-

ance of 0.300%.

Selection

Selects this instrument as the 1st stage Selects this instrument as the 2nd stage

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

1st stage

2nd stage

UPP [%]

REF% setting ABS setting

REF [

]

LOW [%]

Tolerance range [%]

UPP []

LOW [

]

2nd upper limit - 1st upper limit

1st upper limit

Tolerance range [%] > 2nd upper limit [%] - 1st upper limit [%]

Tolerance range[%]

1st lower limit - 2nd lower limit

1st lower limit

(upper limit)

(

lower limit)

Permissible tolerance is calculated using floating-point values, so the setting must be at least 0.001% la rger than the difference between 2

and 1st stage ranges. Set the upper and lower comparator thresholds according to the following conditions: 1

stage upper threshold < 2nd stage upper threshold

stage lower threshold > 2nd stage lower threshold

(upper limit)

(

lower limit)

1st stage

2nd stage

Tolerance range [%]

Tolerance range[%]

x 100

4.9 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)

Select the instrument to serve as the 1st stage, and set its tolerance range.

Set the instrument to serve as the 2nd stage (another RM3542).

Return to the Measurement screen.

Tolerance Range Setting Conditions

Page 61

4.9 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)

1st Stage

TRIG Input Accepted

TRIG Input Inhibited

TRIG

Input Accepted

When changing the reference value

Change the reference value to match the 1

stage

The error message appears when the settings do not match.

2nd Stage

1st Stage

2nd Stage

1st Stage

2nd Stage

SET MONITOR: ON 1st 0.300%

(on the System screen)

SET MONITOR: ON 2nd

(on the System screen)

When an error is displayed

ERR:003 Setting monitor error. (COMP)

Comparator settings do not match. Please check.

ERR:004 Setting monitor error. (SPEED)

Measurement speed settings do not match. Please check.

Practical Example

Page 62

Retry

Chatter

Probe Contact Condition

Start TRIG

Contact Improver

Measurement Current

Contact Check

End of Measurement EOM

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Retry disabled (go to step 5) Retry enabled (default)

Selection

Setting range: 1 to 50 ms (default: 50 ms)

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

4.10 Retrying Measurement After a Fault (Retry Function)

The Retry function causes measurement to be automatically retried when a measurement fault occurs due to probe chatter.

During Retry, all measurement operations including Contact Improvement and DELAY2 (but excluding DELAY1) are restarted. If a measurement fault persists after the specified continuous retry interval (e.g., if the DUT is not connected), retrying is aborted and the Retry is enabled, the maximum time to end-of-measurement occurs when recovering from a measurement fault immediately before the retry interval expires, which approaches the sum of the retry interval setting plus normal measurement time. Decreasing test throughput may indicate probe maintenance is required.

EOM signal is output. When

Open the Basic Settings screen.

Open the System screen.

Select whether to enable or disable Retry.

(When enabled (ON selected))

Set the continuous retry interval.

Return to the Measurement screen.

Page 63

RpRN–

----------------------

4.11 Maintaining Measurement Precision (Self-Calibration)

To maintain measurement precision, the instrument self-calibrates every ten minutes to compensate for internal circuit offset voltage and gain drift. This function cannot be disabled. During self-calibration, the subsequent measurement is delayed for about 6PLC + 10 ms (PLC = Power Line Cycles) for internal circuit compensation .

Self-Calibration Timing Within 130 ms at 50 Hz, or 110 ms at 60 Hz

• When the timing of self-calibration overlaps with a measurement, self-calibration is postponed until the end of measurement.

• When a trigger signal is applied during self-calibr ation, th e start of the triggered measurement is postponed until self-calibration is finished.

• Self-calibration executes automatically after changing comparator or measurement speed settings.

• During self-calibration, measureme nt curr en t an d th e Con tact Impr ov er curr e nt ar e inh ib ite d.

4.12 Compensating for Thermal EMF Offset (Offset Voltage Compensation - OVC)

This function automatically compensates for offset voltage resulting from thermal emf or internal instrument bias. (OVC: Offset Voltage Compensation)

See: "Appendix 2 Effect of Thermal emf" (p. A2)

The following value is known to be a true resistance value from RP (>0), the value measured with current flowing in the positive direction, and R negative direction.

(<0), the value measured with current flowing in the

Offset voltage compensation is automatically enabled in the following conditions, and cannot be modified or disabled:

• When a range from 100 m to 10  is selected.

• When low-power resistance measurement is enabled (LOW POWER: ON).

When the test object is inductive, some delay (DELAY2) is required (p. 42) to allow adequate current flow before starting measurement.

Page 64

4.12 Compensating for Thermal EMF Offset (Offset Voltage Compensation - OVC)

Page 65

5.1 Disabling and Enabling Key Operations

Key operations other than comparator settings (REF%, ABS, units and tenkeys) and F1 [UNLOCK] keys are disabled. To disable key operations: select [MENU] [M.LOCK] is displayed when returning to the measurement screen.

Disabling All Except Comparator Settings

Only comparator settings are enabled.

All key operations except F1 [UNLOCK] are disabled. To disable key operations: select [FULL] [F.LOCK] is displayed when returning to the measurement screen.

Disabling All Key Operations Including Comparator Settings

Key operations to change settings are disabled (although keylock can be canceled).

Asserting (Low) the EXT I/O KEY_LOCK signal disables all panel keys, including F1 [UNLOCK] and F1 [LOCAL] (disables remote control) (p. 85). To disable the key-lock function and re-enable the keys, de-assert (High) the KEY_LOCK

signal.

Disabling All Panel Keys

All key operations are disabled.

The Basic Settings screen appears.

Selection

Key operations enabled (default) Disable all except key-lock cancel Disable all except key-lock cancel and

comparator setting change

[UNLOCK] is displayed only when key-lock is enabled by front panel key operations.

System Settings Chapter 5

5.1 Disabling and Enabling Key Operations

Disabling Key Operations (Key-Lock Function)

Activate the key-lock function to disable the instrument’s front panel key operations. Three key-lock levels are available to suit specific purposes.

Open the Basic Settings screen.

Enable or disable key operations.

Return to the Measurement screen.

Page 66

5.1 Disabling and Enabling Key Operations

Re-Enabling Key Operations (Key-Lock Cancel)

Key-lock can be canceled only when [UNLOCK] is displayed.

Press and hold F1 [UNLOCK] for one second.

If key operations are disabled by the KEY_LOCK keys.

signal, de-assert (High) the signal to unlock the

Page 67

5.2 Setting the Comparator Decision and Key Beepers

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Disables the beeper Enables the beeper (default)

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

5.2 Setting the Comparator Decision and Key Beepers

Enabling or Disabling the Key Beeper

The key beeper sound can be enabled and disabled. The key beeper is enabled (ON) by default.

Open the Basic Settings screen.

Open the System screen.

Select whether to enable or disable the key beeper.

Return to the Measurement screen.

Page 68

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Disables the beeper (default) Enables the beeper

Selection

IN (beep when within range) HI/LO (beep when out of range) LOW (beep when below lower threshold) HIGH (beep when above upper threshold)

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

5.2 Setting the Comparator Decision and Key Beepers

Setting the Comparator Decision (“JUDGE”) Beeper

The comparator decision beeper can be enabled and disabled. The decision beeper is disabled (OFF) by default.

Open the Basic Settings screen.

Open the System screen.

Select whether to enable or disable the decision beeper.

(When enabled (ON selected))

Select the decision beep conditions.

Return to the Measurement screen.

Page 69

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Automatically detect local line frequency (default)

When the line frequency is 50 Hz When the line frequency is 60 Hz

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

5.3 Power Line Frequency Manual Setting

For proper electrical noise suppression, the instrument needs to be set to match the power line frequency. With the default setting (AUTO), the instrument attempts to automatically detect the line frequency, but manual setting is also available. Unless the line frequency is set correctly, measured values may be unstable. An error message appears if line noise is high enough to prevent correct frequency detection (ERR:041(p. 181)). In that case, set the instrument’s line frequency manually.

When the AUTO setting is selected, the line frequency is automatically set to 50 or 60 Hz when the instrument is turned on or reset.

However, automatic detection is not available when the line frequency changes after turning power on or resetting.

If the actual line frequency deviates from 50 or 60 Hz, select the closest frequency.

Examples: If the actual line frequency is 50.8 Hz, select the 50 Hz setting. If the actual line frequency is 59.3 Hz, select the 60 Hz setting.

Open the Basic Settings screen.

Open the System screen.

Select the line frequency being used.

Return to the Measurement screen.

Page 70

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Enter the last two digits of the year, and the month, day, hour, minutes and seconds in that order (the cursor moves automatically). Enter two digits for all values (e.g., 09).

Clock settings cannot be canceled.

5.4 Setting the Clock

To record and print the correct time when using statistical calculations (p. 74), the clock needs to be set correctly. The time of printing is also output when printing statistical calculation results.

Open the Basic Settings screen.

Open the System screen.

Set the date and time.

Return to the Measurement screen.

Page 71

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

0 to 100%, 5% step (default: 50%)

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

5.5 Adjusting Screen Contrast

The screen may become hard to see when ambient temperature changes. In this case, adjust the contrast.

Open the Basic Settings screen.

Open the System screen.

Adjust the contrast.

Return to the Measurement screen.

Page 72

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

0 to 100%, 5% step, (default: 80%)

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

5.6 Adjusting the Backlight

Adjust backlight brightness to suit ambient illumination.

• When external (EXT) triggering is selected, backlight brightness is automatically reduced after non-operation for one minute.

• Be aware that the display may be hard to see when brightness is set too low (near 0%).

Open the Basic Settings screen.

Open the System screen.

Adjust the backlight.

Return to the Measurement screen.

Page 73

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Returns all settings to their factory defaults

Cancel the operation

Execute

5.7 Initializing (Reset)

The instrument can be reset by three methods.

• System reset from the System screen: Returns all settings (except the clock) to factory defaults.

• Turn the instrument on while simultaneously holding the REF% and ABS keys: Returns all settings (except the clock) to factory defaults.

• Reset by remote control command: returns all settings (except communication and clock settings) to their factory defaults.



RST command (non-backup, (p. 123))

:SYSTem:RESet command (p. 137)

This procedure describes system reset from the System screen.

Open the Basic Settings screen.

Open the System screen.

Select RESET.

Select whether to cancel or proceed to execute system reset.

The Measurement screen is displayed when system reset finishes.

Page 74

5.7 Initializing (Reset)

Default Settings

Display Setting value Default Settings Setting Description

INT/ EXT/ MANU EXT Trigger source selection (p. 30) / 

[Low Power: Off] 100m/ 1000m/ 10/ 100/ 1000/ 10k/ 100k/ 1000k/ 10M/ 100M [Low Power: On] 1000m/ 10/ 100/ 1000

SLOW/ MED/ FAST FAST Measurement speed (p. 29) OFF/ ON OFF Zero adjustment (p. 32) OFF/ ON ON Comparator function(p. 34) OFF/ FULL / MENU OFF Key-Lock function (p. 59) MEAS/ DATA/ SYSTEM (Miscellaneous settings)

0 to 100 ms (all ranges) 0 ms Probe delay setting (p. 42) 0 to 100 ms 0 ms DUT response setting (p. 42)

0.1 ms to 100 ms 1PLC to 6PLC (60 Hz) 1PLC to 5PLC (50 Hz)

OFF/ ON 50 / 100 / 150 / 200 / 300

/ 400 / 500 

OFF/ ON/ PULSE 17 mA/ 25 mA/ 35 mA/ 50 mA

OFF/ ON LOOSE/ NORMAL/ SEVERE

CONT/ PULSE PULSE Current mode setting (p. 50)

OFF/ ON OFF Auto-Memory function (p. 71)

OFF/ ON OFF OFF/ ON OFF Data output function (p. 77)

OFF/ ON, 1st/ 2nd, 0.000% to 9.999%

OFF/ ON, 0 to 100 ms OFF, 5 ms Probe short-circuit detection (p. 51) OFF/ ON, 1 to 50 ms ON, 50 ms Retry function (p. 56)

OFF EDGE/ ON EDGE ON EDGE Start Logic Setting (p. 94) PULSE/ HOLD

1 to 100 ms GP-IB/ RS232C/ PRINT

OFF/ ON OFF OFF/ ON

IN/ HI/LO/ LOW/ HIGH OFF/ ON ON Key beeper (p. 59)

AUTO/ 50 Hz/ 60 Hz AUTO Line frequency (detection) (p. 63) 0 to 100 50 Screen contrast adjustment (p. 65) 0 to 100 80 Screen backlight adjustment (p. 66)

- - Reset (p. 67)

- - Calibration (p. A13)

100 M Range selection (p. 31)

Depends on measurement range Integration time (p. 44)

ON, 200  Contact-check (p. 46)

ON, 35 mA (range from 100 m to 100 k) PULSE, 35 mA (range from1000 k to 100 M)

ON, NORMAL (LOOSE when 100 Range)

OFF, 1st, 0.000% Settings Monitor function (p. 53)

PULSE, 5 ms RS232C, 9600bps

GP-IB, ADR01, LF

OFF, HI/LO Comparator decision beeper (p. 61)

Contact Improvement (p. 47)

Voltage level monitor (p. 49)

Statistical calculation function (p. 74)

End-of-measurement pulse width (p. 93)

Interface setting (p. 101) Low-Power Resistance Measure-

ment (p. 28)

Clock setting (p. 64)

MISC

MEAS

DATA

SYSTEM

TRG

RANGE

SPEED 0ADJ COMP LOCK MISC

DELAY1 DELAY2 INT (FAST) INT (MED) INT (SLOW)

CONT CHECK

CONT IMP

VOLT MONITOR

CURRENT MODE

AUTO MEMORY

STATISTICS DATA OUT SET MONITOR PROBE

CHECK RETRY TRIG EDGE

EOM INTERFACE LOW POWER JUDGE BEEP

KEY BEEP CLOCK LINE FREQ CONTRAST BACK LIGHT RESET ADJUST

Page 75

Store up to 30,000 measured values using the EXT I/O TRIG signal or by pressing F4 [MANU] on the Basic Settings screen.

Data Memory Function (p. 70)

Store measured values at specific times.

This is convenient for batch exporting data to a controller while switching reels.

Measured values are automatically stored as they become stable. When the specified number of data points (up to 99) is acquired, the beeper sounds and auto-storing halts.

Auto-Memory Function (p. 71)

Store data after measured value has stabilized.

This is convenient for sample inspection after printing (vapor deposition) resistors on a board.

Minimizes transfer time by eliminating the need for transmit requests from the remote controller. (RS-232C interface only)

Data Output Function (p. 77)

Automatically output (export) measurements at the end of measurement.

Stored measurements are lost when the instrument is turned off.

Therefore, be sure to print out or export important data to a PC.

Storing and

Exporting Data Chapter 6

Measured values can be stored or automatically exported, according to application. Stored data can be output to a printer, RS-232C or GP-IB. Also, statistical calculations can be applied to internally stored data.

Page 76

6.1 Storing Data at Specific Times (Data Memory Function)

Measured values are stored in the instrument’s internal memory according to the following timings. (up to 30,000 points)

• Every time a measurement is performed by external (EXT) triggering

• When a trigger is applied during internally (INT) triggered measurement

The following three storage methods are available:

• Store upon receiving an EXT I/O TRIG

• Store upon receiving a 

• Store by pressing the F4 [MANU] key on the [MENU] – [TRG] setting screen.

• This function can only be enabled by remote control. The data memory function should be enabled by remote control beforehand. This setting is not available from the front panel.

• Stored memory dat a cannot be viewed on the instrument’ s scr een. Use remote control commands to export stored data.

TRG command (p. 126)

signal (p. 85)

Data Memory Function Operating Procedure

Enable data memory mode.

Send this remote command to enable the data memory function:

:MEMory:MODE MEMory (p. 142)

Store measured values.

Execute external trigger measurement, or apply a trigger during internally triggered measurement.

Export the stored data.

Send this remote command to export the measured values stored in the instrument:

:MEMory:DATA? (p. 143)

Clear measurement data from instrument memory.

Send this remote command to erase the data from instrument memory:

:MEMory:CLEar (p. 142)

Stored data is automatically erased at the following times:

• when the memory function setting (including auto-mem-

ory) is changed (p. 142)

• when the range is changed (p. 31)

• when changing comparator settings (p. 34)

• when printing the statistical calculations (p. 82)

• when the DUT is changed (p. 28)

• upon system reset (p. 67)

Page 77

Printing (p. 82)

Prepare the printer (p. 79). Enable Auto-Memory and set

the number of values to store.

Set decision criteria (p. 34).

Measure

Beeper notifies when the specified number of values is stored.

6.2 Store as soon as Measurement is Stable (Auto-Memory Function)

This function automatically stores the value measured each time the probes cont act the sample with internal triggering. When the specified number of values has been acquired, auto-storage operation stops. St atistical calculations are applied to the stored dat a, with result s output to the screen or printer (RS232C).

See: "6.3 Performing Statistical Calculations on Measured Values" (p. 74)

"Chapter 7 Printing" (p. 79)

Data storage and printing can be automatically controlled by the Auto-Memory function.

The Auto-Memory function is disabled by default. Enable the Auto-Memory function before settin g the nu m ber of valu es to stor e.

Enabling the Auto-Memory function affects other functions as follows:

• Statistical calculation is forced on.

• The voltage level monitor function is forced off (although the setting itself is not set to OFF, the function is actually disabled).

• The trigger source setting is forced to internal (INT).

When the trigger source is set to external (EXT), the Auto-Memory function is disabled by force.

Deleting Stored Data

Stored data is automatically erased at the following times:

• when the memory function setting (including auto-mem-

ory) is changed (p. 142)

• when the range is changed (p. 31)

• when changing comparator settings (p. 34)

• when the power is turned off

• when printing the statistical calculations (p. 82)

• when the DUT is changed (p. 28)

• upon system reset (p. 67)

• upon setting the auto-memory number of values to store

(p. 73)

Page 78

The Basic Settings screen appears.

The Data Settings screen appears. [DATA SETTINGS]

Selection

Disable the function (default) Enable the function

The confirmation screen appears.

When the function is enabled

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

6.2 Store as soon as Measurement is Stable (Auto-Memory Function)

Enabling the Auto-Memory Function

Open the Basic Settings screen.

Open the Data Memory Settings screen.

Enable the function.

Return to the Measurement screen.

Page 79

6.2 Store as soon as Measurement is Stable (Auto-Memory Function)

Displays the Auto-Memory setting screen

Total Count Pass Count (IN) Fail Count (Hi/Lo)

Setting range: 1 to 99

To Reset Numerical Values

Deletes entered digits. This key is enabled only when entering numerical values.

(Example: 20 values set to be stored)

Setting the Number of Values to Store

Open the Auto-Memory Settings screen.

Enter the number of values to store.

To abort the setting process, press . Settings are abandoned and the display returns to the previous screen.

Accept the settings and return to the Measurement screen.

Acquiring Measured Values Automatically

Momentarily disconnect (open-circuit) the probes.

Connect the probes to the DUT.

When the measurement is stable, the value is automatically stored and the count is incremented. When the count reaches the specified number of values, a long beep sounds, and subsequent measurements are not stored. The (one) last acquired value can be deleted (Undo function (p. 76)).

Page 80







x2nx2–



---------------------------- -



n1–

x2nx2–



n1–

---------------------------- -

16





LoHi









xLoHiLoHi

CpK



6.3 Performing Statistical Calculations on Measured Values

Statistical calculations can be performed on up to 30,000 measured values, with results displayed. Printing is also available (p. 82).

Calculation types: average, maximum and minimum values, population standard deviation, sample standard deviation, process compatibility indices

Maximum value Minimum value

Average

Population standard deviation

Standard deviation of sample

Process capability index (dispersion) *

Process capability index (bias)*

• When only one valid data sample exists, standard deviation of sample and process capability indices are not displayed.

• When 

• The upper limit of Cp and CpK is 99.99. If Cp or CpK exceeds 99.99, the value 99.99 is displayed

• Negative values of CpK are handled as CpK = 0.

• If statistical calculation is turned off and then back on without first clearing calculation results, calculation resumes from the point when it was turned off.

• Measurement speed is restricted when statistical calculation is enabled.

• When Auto-Memory is enabled (ON), statistical calculation is enabled (ON) by force.

• When statistical calculation is disabled (OFF), Auto-Memory is disabled (OFF) by force.

= 0, Cp and CpK are 99.99.

n-1

Xmax = MAX (x1, ....., xn)

Xmin = MIN (x1, ....., xn)

In these formulas, n represents the number of valid data samples.

Hi and Lo are the upper and lower thresholds of the comparator.

*. The process capability indices represent the quality

achievement capability created by a process, which is the breadth of the dispersion and bias of the process' quality. Generally, depending on the values of Cp and CpK, process capability is evaluated as follows:

Cp, CpK>1.33......... Process capability is ideal

Cp, CpK>1.00 Process capability is adequate

1.33

Cp, CpK.........Process capability is inade-

1.00 quate

Deleting Statistical Calculation Results

Stored data is automatically erased at the following times:

•

when the memory function setting (including data-memory) is changed (p. 142)

• when the range is changed (p. 31)

• when changing comparator settings (p. 34)

• when printing the statistical calculations (p. 82)

• when the DUT is changed (p. 28)

• upon system reset (p. 67)

• upon setting the auto-memory number of values to store

(p. 73)

Page 81

The Basic Settings screen appears.

The Data Settings screen appears. [DATA SETTINGS]

Selection

Disable statistical calculation (default) Enable statistical calculation

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

When statistical calculation is enabled, F3 [STAT] appears on the Measurement screen. Confirm calculation results (p. 76)

6.3 Performing Statistical Calculations on Measured Values

Using Statistical Calculations

When statistical calculation is enabled and an EXT I/O trigger signal is applied, operation is as follows depending on the trigger source setting:

• With external (EXT) triggering: One measurement is performed and subjected to statistical calculation.

• With internal (INT) triggering: The next measured value after the trigger signal is subjected to st atistical calculation.

Operation is the same in the following cases:

(Key Operations) (Remote Control)

• when pressing the F4 [MANU] key on the [MENU] [TRG] selection screen

• when pressing the F2 [PRINT] key on the Measurement screen (with internal triggering and Auto-Memory disabled. Appears only when the interface is set for the printer.)

• when acquiring measured values by the Auto-Memory function (p. 71)

• when a TRG remote contro l command is received

• when an EXT I/O print signal is applied on the Measurement screen (with internal triggering and Auto-Memory disabled)

Open the Basic Settings screen.

Open the Data Memory Settings screen.

Enable or disable statistical calculation.

Return to the Measurement screen.

Page 82

Displays the Calculation Results screen (if statistical calculation is enabled).

Num

Total data count

Val

Number of valid measured values (error-free data)

Ave

Mean

Population standard deviation

Max

Maximum

Sn1

Standard deviation of sample

Min

Minimum

Process capability index (dispersion)

Cpk

Process capability index (bias)

Output to the printer. "Example Printouts" (p. 83)

Statistical calculation results and stored data are erased when printing finishes.

Erases the last measurement and calculation result (executes only once).

Erases all measured values and statistical calculation results.

After selecting, a confirmation screen appears.

6.3 Performing Statistical Calculations on Measured Values

Confirming, Printing, and Erasing Calculation Results

Statistical calculation results are displayed on the screen. Printing is also available with the commercially available printer with a serial interface. Calculation results are automatically erased after printing. Before printing, select the [PRINT] interface setting.

See: "7.2 Instrument Settings" (p. 81)

The number of valid samples can be confirmed on the Calculation Results screen.

• When the number of valid samples is zero, no calculation results are displayed.

• When only one valid data sample exists, no standard deviation or process capability indices are displayed.

Display the Calculation Results screen.

To print

To print, select the printer as the interface setting on the System screen (p. 81)

To erase

Page 83

The Basic Settings screen appears.

The Data Settings screen appears. [DATA SETTINGS]

Selection

Disable auto-exporting (default) Enable auto-exporting

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

6.4 Auto-Exporting Measured Values (at End of Measurement) (Data Output Function)

At the end of measurement, the measured value is exported to a computer via RS-232C.

See: "Chapter 9 Commu nications (RS-232C/ GP-IB Interface)" (p. 97)

• Set the interface to [RS232C] beforehand. This function is not applicable to the GP-IB Interface.

See:"9.4 Configuring the Communications Protocol" (p. 101)

• When internal (INT) triggering is selected, data is exported only when a TRIG signal is applied.

• Executing a

• For other queries, be careful to avoid overlapping query response timing with auto-exp orting mea sured va lues.

• The data format for measured values can be selected as ASCII (default) or BINARY. Transfer time is minimized when BINARY is selected.

See:":SYSTem:FORMat <ASCii/ BINary>" (p. 137)

:READ? query command exports duplicate measured values.

Open the Basic Settings screen.

Open the Data Memory Settings screen.

Enable or disable auto-exporting (DATA OUT)

Return to the Measurement screen.

Page 84

6.4 Auto-Exporting Measured Values (at End of Measurement) (Data Output Function)

Page 85

7.1 Connecting the Printer

Printing (p. 82)

• Measurement values and comparator decisions

• Statistical calculation results

Connecting the printer to the instrument

Make instrument settings (p. 81)

Make printer settings

Printing Chapter 7

7.1 Connecting the Printer

Before connecting the printer

Because electric shock and instrument damage hazards are present, always follow the steps below when connecting the printer.

• Always turn off the instrument and the printer before connecting.

• A serious hazard can occur if a wire becomes dislocated and contacts another con-

ductor during operation. Make certain connec tions are secure.

• As much as possible, avoid printing in h ot and humid environ ments. O therwis e, prin ter life may be severely shortened.

• Use only compa tible recording p ap er in the printer. Using non-specified paper may not only result in faulty printing, but printing may become impossible.

• If the recording paper is skewed on the roller, paper jams may result.

Compatible printer

The requirements for a printer to be connected to the instrument are as follows. Confirm compatibility and make the appropriate settings on the printer before connecting it to the instrument.

See: "7.2 Instrument Settings" (p. 81)

• Interface .... ... ... .... ... ... ... .... ... .. RS-232C

• Characters per line................ At least 45

• Communication speed........... 9600 bps

• Data bits................................ 8

• Parity..................................... none

• Stop bits................................. 1

• Flow control........................... none

Page 86

1 Confirm that the instrument and the printer

are turned off.

2 Connect the AC adapter to the printer, and

insert the power plug into an outlet.

3 Connect the RS-232C cable to the RS-232C

connectors on the instrument and printer.

4 Turn the instrument and printer on.

Printer (Example)

AC adapter

RS-232C Cable

25 ....................... 14

9670 Printer (25-pin) Connector (Example)

RM3542 (9-pin) Connector

Signal Name

Function

2 TxD

Transmit Data

3 RxD

Receive Data

7 GND

Signal or Common Ground

4 RTS

Request to Send

5 CTS

Clear to Send

Function

Signal Name

Receive Data

RxD 2

Transmit Data

TxD 3

Signal or Common Ground

GND 5

6 7 8 9

1 2 3 4 5

Connector Pinouts

13 ....................... 1

7.1 Connecting the Printer

Connecting the Printer to the Instrument

Connection Methods

Page 87

7.2 Instrument Settings

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

To use the printer

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

Open the Basic Settings screen.

Open the System screen.

7.2 Instrument Settings

Select PRINT as the interface type.

Return to the Measurement screen.

Page 88

(When statistical calculation is enabled)

7.3 Printing

Before Printing

Verify that the instrument and printer settings (p. 81) are correct.

Printing Measured Values and Comparator Decisions

Printing by key operation

Press the PRINT key to print the measured value currently displayed on the Measurement screen.

Printing by external control

Measured values and comparator decisions print when the (active-low) PRINT signal (EXT I/O connector) is connected to ISO_GND.

* ISO_GND is a pin in the instrument’s EXT I/O connector.

When statistical calculation is enabled [STATISTIC: ON] and internal triggering [TRG: INT] is selected, statistical calculations are performed and measured values are printed. When external (EXT) triggering is selected, o nly measured values are printed. Use the TRIG

signal to perform statistical calculations with external triggering.

Printing Statistical Calculation Results

Statistical calculation results can be printed when auto-memory or statistical calculation is enabled (ON). To print, select PRINT on the screen or connect the (active-low) PRINT connector to ISO_GND.

To enable auto-memory:

See: "6.2 Store as soon as Measurement is Stable (Auto-Memory Function)" (p. 71)

To enable statistical calculation :

See: "6.3 Performing Statistical Calculations on Measured Values" (p. 74)

signal on the EXT I/O

If no valid data exists, only the data count is printed. When only one valid data sample exists, standar d deviation of sample and process capability indices cannot be printed.

Page 89

Example Printouts

Resistance measurements

1 0.8725mOhm Lo 2 0.484mOhm Lo 3 10.99998 Ohm IN 4 -10.0026 Ohm Lo 27 9.9986 Ohm Hi 28 9.996 Ohm Hi 29 0.01003kOhm Hi 30 0.00012MOhm Hi

Measurement fault values

1 OvrRng Hi 2 -OvrRng Lo 3 C.E.Hi - 4 C.E.Lo - 5 C.E.Volt - 6 -------- --

• The “Valid” st atistical calculation result indicates the number (count)

of data samples not subject to errors such as measurement faults.

• Among the comparator decision result counts (Hi, IN, Lo, and OR),

“OR” indicates the number (count) of out-of-range measurements.

Auto-memory data and statistical calculation results

Date: 09-02-01 Time: 06:18:00 Ref: 1000.000 Ohm Upp: +1.000% Low: -1.500% 1 999.885 Ohm -0.011% IN 2 1001.885 Ohm +0.189% IN 3 1002.394 Ohm +0.239% IN 4 1002.892 Ohm +0.289% IN 5 1012.894 Ohm +1.289% Hi 6 1000.897 Ohm +0.090% IN 7 998.902 Ohm -0.110% IN 8 994.888 Ohm -0.511% IN 9 1000.391 Ohm +0.039% IN 10 979.892 Ohm -2.011% Lo Hi: 1 IN: 8 Lo: 1 OR: 0 Number: 10 Valid: 10 Max 1012.894 Ohm +1.289% ( 5) Min 979.892 Ohm -2.011% ( 10) Avg 999.492 Ohm -0.051% Sn 7.83568 Ohm Sn-1 8.25953 Ohm Cp 0.50 CpK 0.42

7.3 Printing

Page 90

7.3 Printing

Page 91

Signal input/output

Connect the instrument’s EXT I/O connector to the signal output or input device.

Make instrument settings (p. 93)

8.1 External Input/Output Connector and Signals

External Control Chapter 8

The EXT I/O connector on the rear of the instrument supports external control by providing outp ut of the end-of-measurement and comparator decision signals, and accepting input of measurement trigger and key-lock signals. All signals are isolated by optocouplers (inputs and outputs share a common signal ground).

Confirm input and output ratings, understand the safety precautions for connecting a control system, and use accordingly.

8.1 External Input/Output Connector and Signals

To avoid electric shock or damage to the equipment, always observe the following precautions when connecting to the EXT I/O terminals.

• Always turn off the power to the instrument and to any devices to be connected

before making connections.

• During operation, a wire becoming dislocated and contacting another conductive

object can be serious hazard. Make sure that connections are secure and use screws to secure the external connectors.

• Ensure that devices and syste ms to be connected to the EXT I/O ter minals ar e prop-

erly isolated.

To avoid damage to the instrument, observe the following cautions:

• Do not apply voltage or current to the EXT I/O terminals that exceeds their ratings.

• When driving relays, be sure to install diodes to absorb counter-electromotive force.

Be careful not to short-circuit ISO_5V to ISO_COM.

•

See: "Connector Type and Signal Pinouts" (p. 86)

Page 92

EXT I/O Connector (Instrument Side)

Connector: (Instrument Side)

37-pin D-sub female with #4-40 screws

Mating Connectors:

DC-37P-ULR (solder type) / DCSP-JB37PR (pressure weld type) Japan Aviation Electronics Industry Ltd.

TRIG

(Reserved)

KEY_LOCK

(Reserved)

0ADJ

HOLD

ISO_5V

ISO_COM

ERR

CE_HI

(Reserved)

CAL

(Reserved)

PRB_CHECK

(Reserved)

ISO_COM

EOM

INDEX

PRB_SHORT

CE_LO

(Reserved)

12345678910111213141516171819

202122232425262728293031323334353637

8.1 External Input/Output Connector and Signals

Connector Type and Signal Pinouts

Pos: positive, Neg: negative,: not applicable

Signal name I/O Function Logic Pin Signal name I/O Function Logic

1TRIG

(Reserved)

2 3

KEY_LOCK

(Reserved)

0ADJ

HOLD

ISO_5V

ISO_COM

ERR

CE_HI

(Reserved)

External trigger



Key-Lock Neg Level



Execute zero-ad-

just Enable external

triggering Isolated 5 V power



output Isolated common



signal ground Measurement fault Neg Level

OUT

HI comparator

OUT

decision LO comparator

OUT

decision Probe (HI side)

OUT

contact error



Pos/

Neg



Neg Edge

Neg Level



Neg Level



Edge



     

20 (Reserved) 21

CAL

(Reserved)

23 24

PRB_CHECK

(Reserved)

ISO_COM

EOM

INDEX

PRB_SHORT

CE_LO

(Reserved)

35 36 37

(Reserved) (Reserved)

Reserved pins are not connected inside the instrument. Do not connect to reserved pins.





Execute self-calibra-

tion









Execute probe short-

circuit detection





Print measured val-

ue Isolated common

signal ground End of measurement Neg Edge

OUT

Analog measure-

OUT

ment finished IN comparator

OUT

decision Probe short-circuit

OUT

error Probe (LO side)

OUT

contact error











  

 



Neg Edge

 

Neg Edge



Neg Edge



Neg Edge

Neg Level

    

•The 0ADJ signal should be asserted (Low) for at least 10 ms.

• The connector shell is conductively connected to the metal instrument chassis and the protective earth pin of the power plug. Be aware that it is not isolated from ground.

Page 93

Signal Descriptions

Input Signals

When external triggering (EXT) is enabled, one measuremen t is performed at the fall ing (ON) or rising (OFF) edge of the TRIG selected on the Settings screen (default: falling (ON) edge). When internal triggering (INT) is enabled, external triggering is disabled. Also, when the Set-

TRIG

tings Monitor function is enabled and an error occurs, triggering is disabled (p. 53). The TRIG

• Stores statistical calculation data (when statistical calculation is enabled)

• Stores measured data to internal memory (when the data memory function is enabled)

(also operates with internal triggering)

8.1 External Input/Output Connector and Signals

signal. Falling (ON) or rising (OFF) edge trigg ering can be

(p. 94)

signal performs the following operations in addition external triggering:

0ADJ

PRINT Asserting the PRINT signal prints the current measurement value.

CAL

HOLD

PRB_CHECK

KEY_LOCK

Asserting the 0ADJ signal executes zero adjustment once. To avoid malfunction, this signal should be asserted (Low) for at least 10 ms.

Asserting the CAL signal executes self calibration. The time required for self calibration is as follows: Approximately 130 ms (with 60-Hz line frequency setting), or 110 ms (with 50-Hz setting) If asserted during measurement, executes after the end of measurement.

Holding the HOLD signal low enables external triggering. When the HOLD signal is high, the settings made on the Settings screen or by commands are re-enabled.

Asserting the PRB_CHECK signal executes probe short-circuit adjustment one time. If asserted during measurement, executes after the specified time from the end of measurement.

While the KEY_LOCK signal is held low, all front panel keys (except POWER button) are disabled (key unlock and remote control cancellation operations are also disabled).

Output Signals

This signal indicates that a measurement fault has occurred (except out-of-range detection). It

ERR

CE_HI

is updated simultaneously with the EOM signal. At this time, comparator decision outputs are all de-asserted (high).

This signal indicates that a contact check error has occurred between H tacts. It is updated simultaneously with the EOM

puts are all de-asserted (high).

signal. At this time, comparator decision out-

CUR

and H

POT

(p. 32)

(p. 82)

(p. 57)

(p. 51)

(p. 59)

(p. 38)

con-

(p. 46)

CE_LO

PRB_SHORT

INDEX

EOM

HI, IN, LO

This signal indicates that a contact check error has occurred between L tacts. It is updated simultaneously with the EOM

puts are all de-asserted (high). This signal indicates that a foreign object is shorting the POT and C UR contacts in a four-ter-

minal probe tip. At this time, comparator decision outputs are all de-asserted (high). This signal indicates that A/D conversion in the measurement circuit is finished.

When the asserted (low) state occurs, the measurement sample can be removed. This signal indicates the end of a measurement. At this time, the states of the comparator deci-

sion outputs and ERR These are the comparator decision output signals.

, CE_HI, CE_LO, and PRB_SHORT are all determined.

signal. At this time, comparator decision out-

CUR

and L

POT

con-

(p. 46)

(p. 51)

(p. 93)

• Input signals are ignored when the following are displayed: Basic, Detailed, and Comparator Settings screens; Statistical Calculation Results screen (except for the print signal); and error messages (except Setting Monitor errors).

• EXT I/O input and output signals are not usable while changing measurement settings.

Page 94

Contact check

Measurement

currents

Contact Improver

Checking

Measurement

processing

Available

End of Measurement

8.2 Timing Chart

Each signal level indicates a corresponding voltage level.

•The

EOM signal is operational when the trigger source setting is EXT and the EOM output setting is Pulse.

• A self-calibration measurement (approximately 130 ms) is automatically performed every 10 minutes (between measurements).

TRIG signal input is accepted during that ti me, but the correspond ing measure-

ment is delayed until self-calibration is finished.

• Do not apply a

TRIG signal while measuring using external triggering (the signal is ignored).

• When changing settings such as measurement range, allow about 150 ms proc essin g time befor e applying

TRIG signal.

•The

• Output of comparator decisions and error signals are determ ined before the

• With internal (INT) triggering, the

INDEX and EOM signals are de-asserted simultaneously.

EOM signal is asserted.

EOM signal is fixed High (OFF). Also, comparator decisions and error sig-

nals are not de-asserted (OFF) when measurement starts.

EOM operation when the EOM

EOM signal is asserted (ON) at the end of measurement.

The

EOM signal continues to be asserted until measurement starts again with the next TRIG signal input.

The

See: "Setting End-of-Measurement Signal Output (EOM Signal Setting)" (p. 93)

Output setting is Hold

The EOM

signal is de-asserted when the next measurement is started by the next TRIG signal.

Page 95

Output Signal State at Power-On

All signals are low (asserted active-low) when power is turned on. All output signals become high (de-asserted active-low) when ch anging from the initial screen to the Measurement screen.

Operation is shown when the trigger source is set to external triggering (EXT).

Instrument State

Power-On

Initial Screen Measurement Screen

8.2 Timing Chart

Timing Chart Interval Descriptions

Inter-

Description Duration Remarks

val

Trigger Pulse

Asserted (ON) Trigger Pulse

De-asserted (OFF)

t2 Delay 1 0 to 100 ms Setting-dependent t3 Delay 2 0 to 100 ms

t4 Measurement time 0.1 to 100 ms t5 Calculation time 0.1 ms Calculation time is longer when memory storage is enabled.

t6 EOM pulse width 1 to 100 ms Setting-dependent

Internal Delay

Resistance Measurement (LOW POWER OFF)

Range Internal Delay [ms] Range Internal Delay [ms] 100m 1.4 1000m 0.8 1000m 0.7 10 0.8 10 0.5 100 0.6 100 0.5 1000 3.3 1000 0.5 10k 0.5 100k 0.7 1000k 0.8 10M 2.6 100M 5.3

0.1 ms or more Falling (ON)-/rising (OFF)-edge selectable

0.1 ms or more

Setting-dependent (When the Contact Improver function is set to Pulse, 0.1 ms is added.)

OVC OFF: Integration Time + Internal Delay (see following table) OVC ON: (Integration Time + Internal Delay)

Low Power Resistance Measurement (LOW POWER ON)

Total processing time before and after integration measurements

× 2 + Delay2

Page 96

Input Circuit

Output Circuit

PLC, etc. (Controller)

Internally Isolated Common Signal Ground

Do not apply external power

Common

Output

PLC, etc. (Controller)

Input

Common Internally Isolated Common Signal Ground

Zener Voltage 30 V

Internally Isolated 5 V

8.3 Internal Circuitry

Page 97

Electrical Specifications

8.3 Internal Circuitry

Input Signals

Output Signals

Internally Isolated Power Output

Input type Optocoupler-isolated, non-voltage contact inputs

(source input, active-low) Input asserted (ON) voltage 1 V or less Input de-asserted (OFF) voltage Open or 5 to 30 V Input asserted (ON) current 3 mA/ch Maximum applied voltage 30 V

Output type Optocoupler-isolated npn open-collector outputs

(current sink, active-low) Maximum load voltage 30 V Maximum output current 50 mA/ch Residual voltage 1 V (10 mA), 1.5 V (50 mA)

Output Voltage 4.5 to 5.0 V Maximum output current 100 mA External power input none

Page 98

Input Circuit Connection Examples

Output Circuit Connection Examples

Input

Output

Common

Input

Common

Output

Input

Common

Input

Common

Active-Low Logic Output

Wired OR

Relay Connections

LED Connection

PLC Output (Source Output) Connections

PLC Output (Sink Output) Connections

Relay Connections

Switch Connections

PLC Input (Sink Input) Connections

PLC Input (Source Input) Connections

Active-Low Logic Output

8.3 Internal Circuitry

Connection Examples

Page 99

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

The specified pulse is output after endof-measurement (default).

The EOM signal remains asserted after end-of-measurement (to step 5).

Setting range: 1 ms to 100 ms (default: 5 ms)

2 3

Selection

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

8.4 External I/O Settings

These settings affect the logic of the end-of-measurement and trigger signals.

Setting End-of-Measurement Signal Output (EOM Signal Setting)

The selected EOM output level is retained until the next trigger input, or for the specified pulse width.

Open the Basic Settings screen.

Open the System screen.

Select the EOM signal output type.

(When PULSE is selected)

Select the pulse width.

Return to the Measurement screen.

Page 100

The Basic Settings screen appears.

The System screen appears. [SYSTEM]

Selection

Measurement starts at the rising (OFF) edge of the (active-low) signal.

Measurement starts at the falling (ON) edge of the (active-low) signal. (default)

The confirmation screen appears.

Return to the setting screen. Save setting and return to

previous screen. Discard setting and return to

previous screen.

8.4 External I/O Settings

Setting the Trigger (TRIG) Signal Logic

Select whether triggering occurs on the falling (ON) or rising (OFF) edge.

Open the Basic Settings screen.

Open the System screen.

Select the triggering logic edge.

Return to the Measurement screen.

Hioki RM3542, RM3542-01 Instruction Manual

Specifications and Main Features

Frequently Asked Questions

User Manual

Task-Oriented Reference

Measurement Flow

Introduction

Verifying Package Contents

Safety Information

Operating Precautions

1.1 Product Overview and Features

Block Diagram

1.2 Names and Functions of Parts

1.3 Screen Organization

2.1 Connecting the Power Cord

2.2 Connecting Measurement Cables and Test Fixtures

Making Your Own Measurement Cables

2.3 Turning the Power On and Off

3.1 Pre-Operation Inspection

3.2 Measurement Object Types

3.3 Setting the Measurement Speed

3.4 Setting Measurement Start Conditions (Trigger Source)

3.5 Selecting the Measurement Range

3.6 Zero Adjustment

3.7 Judging Measured Values (Comparator Function)

Enabling and Disabling the Comparator Function

Decide According to Reference Value and Tolerance (REF% Mode)

Decide According to Upper/Lower Thresholds (ABS Mode)

3.8 Confirming Faulty Measurements

4.1 Making Range-Specific Measurement Settings

4.2 Setting Pre-Measurement Delay

4.3 Setting the Measurement Integration Time Option

4.4 Checking for Poor or Improper Contact (Contact Check Function)

4.5 Improving Probe Contact (Contact Improver Function)

4.6 Detecting Measurement Voltage Faults (Voltage Level Monitor Function)

4.7 Applying Current Only When Measuring (Current Mode Setting)

4.8 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)

4.9 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)

4.10 Retrying Measurement After a Fault (Retry Function)

4.11 Maintaining Measurement Precision (Self-Calibration)

4.12 Compensating for Thermal EMF Offset (Offset Voltage Compensation - OVC)

5.1 Disabling and Enabling Key Operations

Disabling Key Operations (Key-Lock Function)

Re-Enabling Key Operations (Key-Lock Cancel)

5.2 Setting the Comparator Decision and Key Beepers

Enabling or Disabling the Key Beeper

Setting the Comparator Decision (“JUDGE”) Beeper

5.3 Power Line Frequency Manual Setting

5.4 Setting the Clock

5.5 Adjusting Screen Contrast

5.6 Adjusting the Backlight

5.7 Initializing (Reset)

Default Settings

6.1 Storing Data at Specific Times (Data Memory Function)

6.2 Store as soon as Measurement is Stable (Auto-Memory Function)

6.3 Performing Statistical Calculations on Measured Values

Using Statistical Calculations

Confirming, Printing, and Erasing Calculation Results

6.4 Auto-Exporting Measured Values (at End of Measurement) (Data Output Function)

7.1 Connecting the Printer

Connecting the Printer to the Instrument

7.2 Instrument Settings

7.3 Printing

Printing Measured Values and Comparator Decisions

Printing Statistical Calculation Results

8.1 External Input/Output Connector and Signals

Connector Type and Signal Pinouts

Signal Descriptions

8.2 Timing Chart

8.3 Internal Circuitry

Electrical Specifications

Connection Examples

8.4 External I/O Settings

Setting End-of-Measurement Signal Output (EOM Signal Setting)

Setting the Trigger (TRIG) Signal Logic