IM9110
SMD TEST FIXTURE
Instruction Manual
Aug. 2018 Revised edition 1
IM9110A961-01 18-08H
EN
Introduction
Thank you for purchasing the Hioki IM9110 SMD Test Fixture.
To obtain maximum performance from the device, please read
this manual rst, and keep it handy for future reference.
Verifying Package Contents
When you receive the device, inspect it carefully to ensure
that no damage occurred during shipping. In particular, check
the connectors. If damage is evident, or if it fails to operate
according to the specications, contact your authorized Hioki
distributor or reseller.
Please remove the seal which holds the control lever before
using the device for the rst time.
Precautions during shipment
•
Store the packaging in which the device was delivered, as
you will need it when transporting the device.
• To avoid damage to the device, use the original packing
materials in which it was shipped, and be sure to pack in a
double carton. Damage occurring during transportation is
not covered by the warranty.
• When sending the device for repair, be sure to include a
description of the problem.
Repair
If you are unable to make measurement even after cleaning
the measurement location with the supplied cleaning brush,
contact your authorized Hioki distributor or reseller.
Consumable parts
The short compensation jig is a consumable part and
can be purchased. If it is lost or if it is unable to perform
compensation due to deformation, please contact your
authorized Hioki distributor or reseller.
Disposal
Handle and dispose of the device in accordance with local
regulations.
Safety Notes
Before using the device, be certain to carefully read the
following safety notes:
CAUTION
• Mishandling during use could damage to the device.
Be certain that you understand the instructions and
precautions in the manual before use.
• If persons unfamiliar with electricity measuring device
are to use the device, another person familiar with
such devices must supervise operations.
Notations
In this manual, the risk seriousness and the hazard levels are
classied as follows.
Indicates a potentially hazardous situation
WARNING
CAUTION
that may result in death or serious injury to the
operator.
Indicates a potentially hazardous situation
that may result in minor or moderate injury
to the operator or damage to the device or
malfunction.
Indicates prohibited actions.
Indicates the action which must be performed.
Symbols for standards
Indicates that the product conforms to
regulations set out by the EC Directive.
Indicates the Waste Electrical and Electronic
Equipment Directive (WEEE Directive) in EU
member states.
Operating Precautions
Follow these precautions to ensure safe operation and to
obtain the full benets of the various functions.
WARNING
Installing the device in inappropriate locations may
cause a malfunction of device or may give rise to an
accident. Avoid the following locations:
• Exposed to direct sunlight or high temperature
• Exposed to corrosive or combustible gases
• Exposed to a strong electromagnetic eld or
electrostatic charge
• Near induction heating systems (such as high-
frequency induction heating systems and IH
cooking equipment)
• Susceptible to vibration
• Exposed to water, oil, chemicals, or solvents
• Exposed to high humidity or condensation
• Exposed to high quantities of dust particles
• Do not use the device beyond its rated and
specication ranges. Doing so may damage the
device or cause it to become hot, resulting in
electric shock.
• Customers are not allowed to modify,
disassemble, or repair the device.
Doing so may cause re, electric shock, or injury.
• To avoid electric shock when using the IM9110
with the 9268 or 9268-10 DC Bias Voltage Unit,
never touch the measurement terminals while a
DC voltage (DC vias) is being input.
CAUTION
To avoid damage to the device, protect it from physical
shock when transporting and handling. Be especially
careful to avoid physical shock from dropping.
Overview
The IM9110 SMD Test Fixture is a test xture for SMD
components that connects directly to the measurement
terminal (UNKNOWN terminal) on a Hioki LCR meter or Hioki
C meter. It allows you to perform measurement of 0201 chip
size component (L/W/T = 0.25 mm × 0.125 mm × 0.125 mm
with side contact. Since this device comes equipped with a
micrometer, the distance between two measurement probes
can be easily set.
）
Specications
Connectable
instruments
Supported models 3506-10, 3511-50, 3522-50, 3532-50,
Operating environment
Operating temperature
and humidity
Storage temperature
and humidity
Dimensions Approx. 99W × 42H × 73D mm /3.90”W
Mass Approx. 270 g (9.5 oz.)
Product
period
Connection to
measuring instrument
Instrument
connectors
Contact with DUT
(sample)
Measurable DUT
(sample) size
Maximum input
voltage
Maximum input
current
Usable frequency range
Residual parameter
values
values at 1 MHz
measurement
frequency)
Contact pressure
applied to DUT
(sample)
Distance setting
between two
measurement probes
Accessories • Instruction manual × 1
warranty
(reference
Auto balancing bridge type Hioki LCR
meters or Hioki C meters
IM3523, IM3533, IM3533-01, IM3536,
IM3570, IM3590 (as of August, 2018)
For updated information, contact your
authorized Hioki distributor or reseller.
Indoors, altitude up to 2000 m
0°C to 40°C (32°F to 104°F), 80% RH or
less (no condensation)
-10°C to 55°C (14°F to 131°F), 80% RH
or less (no condensation)
× 1.65”H × 2.87”D (Exclusing protruding
parts such as the control lever, lock lever,
and micrometer)
3 years
This warranty does not apply to
measurement probes, holder (at the
measurement location), and movable
parts.
4-terminal pair design
BNC (connector spacing: 22 mm)
Side contact, 2-terminal design
0.25 ±20% × 0.125 ±10% × 0.125 ±10%
mm (JIS: 0201)
±42 V peak (AC+DC)
0.15 A rms (±0.15 A DC)
DC to 1 MHz
Capacitance: C < 35 fF
(when the distance between two
measurement probes is set to 0.25 mm)
Inductance: L < 120 nH
(2-terminal design using a short
compensation jig)
Resistance: R < 800 m
(2-terminal design using a short
compensation jig)
The L and R values stated are when the
contact pressure is 0.1 N
0.1 mm push)
0.14 N (14.3 gf) or less
0.09 N (9.2 gf) + 0.01 N (1 gf) /0.1 mm
(The value varies with the micrometer’s
setting.)
With a 0.01 mm increment micrometer
• Short compensation jig × 5 (packed in a
translucent container)
• Cleaning brush × 1
(6562 ft.)
Ω
(10.2 gf) (with
Part Names
4 4 4 4
1
To perform open compensation using a DUT
Connecting to the Instrument
Inspection Before Use
Before using the device, verify that it operates normally to ensure
that no damage occurred during storage or shipping. If you nd any
damage, contact your authorized Hioki distributor or reseller.
CAUTION
2
5
3
6
To prevent damage to the BNC connector, be sure to release
the locking mechanism, grip the head of the connector, and
pull it out.
Align the device's BNC connectors with the instrument's
1
BNC connectors and insert them.
Performing Short and Open
Compensations
To reduce measurement error, perform compensations in the
following order: short compensation and open compensation. The
compensation method varies with the instrument to which the device
is to be connected. See the manual that came with the instrument.
It is necessary that the short compensation value is less than the
resistance value specied in the “Residual parameter values” of the
specications. Have the device repaired if the short compensation
value is particularly large even if the measurement location is
cleaned regularly. (See “Cleaning” about how to clean the device.)
Short Compensation
You will need: A short compensation jig
Move the control lever to the OPEN position.
1
Place the DUT.
2
(For the detailed procedure, see Steps 3 & 4 of “Performing
Measurement”.)
Move the control lever to the CLOSE (MEASURE) position.
3
Turn the micrometer’s knob until you nd the position
4
right before the mesurement probes come into contact
with the DUT.
Move the control lever to the OPEN position and remove
5
the DUT.
Move the control lever to the CLOSE (MEASURE)
6
position and perform open compensation.
Control lever
1
Micrometer (The smallest increment of the scale = 0.01 mm,
2
one full turn = 0.5 mm)
Enclosure
3
BNC connectors (with lock levers) for signal connections
4
Measurement location
5
Holder
6
Enlarged view of the measurement location
9
10
8 711
Measurement probe
7
(xed side)
Measurement probe
8
(movable side)
Open and close cover（linked with the control lever)
9
Temporary placing table
10
Guide groove
11
Cleaning
Line up
Lock the device in place with the lock lever.
2
Lock lever
Operating Micrometer
When the control lever is in the CLOSE (MEASURE) position, the
distance between the two measurement probes can be set using
the micrometer. Connect the device to the instrument rst and then,
by turning the micrometer’s knob, nd the position where the circuit
state between the two measurement probes is switched between
an open-circuit state (non-conductng state) and a short-circuit state
(conducting state).
Move the control lever to the OPEN position.
1
Place the short compensation jig.
2
(For the detailed procedure, see Steps 3 & 4 of "Performing
Measurement".)
Move the control lever to the CLOSE (MEASURE) position.
3
Turn the micrometer’s knob until you nd the position
4
where the circuit state between the two measurement
probes is switched between an open and a short state.
Turn the micrometer’s knob ten increments (0.1 mm)
5
counterclockwise from that position and perform short
compensation.
After short compensation is complete, move the control
6
lever to the OPEN position and remove the short
compensation jig by reversing the steps used to secure
it in place.
To perform short compensation without using a
short compensation jig (when it is lost or broken)
If the short compensation jig is not used, measured values may
(
vary signicantly due to the effects of contact resistance.)
Move the control lever to the CLOSE (MEASURE) position.
1
Turn the micrometer’s knob until you nd the position
2
where the circuit state between the two measurement
probes is switched between an open and a short state.
Turn the micrometer’s knob ten increments (0.1 mm)
3
counterclockwise from that position and perform short
compensation.
Open Compensation
Performing Measurment
You will need: A pair of tweezers m
suring the D
Move the control lever to the OPEN position.
1
Turn the micrometer’s knob ten increments (0.1 mm)*
2
counterclockwise from the position where the open
compensation was performed.
*The reference value. The optimal value varies with the test DUT.
1, 5
Place the DUT on the temporary placing table using a
3
pair of tweezers.
Move the DUT to the guide groove.
4
2
Measurement location
Clean the measurement location regularly with the cleaning brush
provided with the instrument. Move the control lever to the OPEN
position and gently move the brush back and forth several times.
Cleaning area
Other areas of the device
To clean the device, wipe it gently with a soft cloth moistened with
water or mild detergent.
Turning the knob in clockwise
direction
Turning the knob in
counterclockwise direction
The distance between the two
probes will become larger
The distance between the two
probes will become smaller
Clockwise
Counterclockwise
To perform open compensation without using a DUT
Move the control lever to the CLOSE (MEASURE)
1
position.
Turn the micrometer’s knob until you nd the position
2
where the circuit state between the two measurement
probes is switched between an open and a short state.
Turn the micrometer’s knob one-half turn (0.25 mm)
3
clockwise from that position and perform open
compensation.
4
3
Move the control lever to the CLOSE (MEASURE) position.
5
Perform measurement with the instrument.
6
After measurement is complete, move the control lever
7
to the OPEN position and remove the DUT by reversing
the steps used to secure it in place.
To make a continuous measurement, repeat Steps 3 through 7.
Guide groove
Temporary placing table
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