Hioki IM7580A-1, IM7580A-2, IM7581-01, IM7581-02, IM7583-01 Instruction Manual

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IM7580A-1

HIOKI IM7585A981-05

IM7580A IM7581

IM7583 IM7585

IM7587

IM7580A-2

IM7581-01

IM7581-02

IM7583-01

IM7583-02

IM7585-01

IM7585-02

IM7587-01

IM7587-02

Instruction Manual

IMPEDANCE ANALYZER

Apr. 2020 Revised edition 5 IM7585A981-05 20-04H

HIOKI IM7585A981-05

Introduction ................................................ 1

Verifying Package Contents ..................... 1

Options (Sold Separately) ......................... 2

Safety Information ..................................... 2

Operating Precautions .............................. 5

1 Overview 9

1.1 Overview and Features .................... 9

1.2 Names and Functions of Parts ......11

1.3 Screen Operations ......................... 14

2 Measurement

Preparations 17

2.1 Connecting the Test Head ............. 17

2.2 Pre-Operation Inspection .............. 19

2.3 Connecting the Power Cord .......... 20

2.4 Connecting a Measurement

Cable/Fixture .................................. 21

2.5 Connecting an Interface ................ 22

2.6 Turning the Power ON and OFF .... 24

2.7 Select the Measurement Mode ...... 25

3 LCR Function 27

3.1 LCR Function .................................. 27

3.1.1 Flowchart ..................................................... 27

3.1.2 Screen map ................................................. 28

3.1.3 Measurement screen ................................... 30

3.1.4 Status and error display of this instrument .... 31

3.2 Setting Basic Settings of

Measurement Conditions .............. 32

3.2.1 Setting Display Parameters .......................... 32

3.2.2 Starting Measurement at Any Arbitrary

Timing (Trigger) ...........................................33

3.2.3 Setting the Delay Time from Trigger to

Measurement Start (Trigger Delay) .............. 34

3.2.4 Applying the Signal to the Sample during Measurement Only

(Trigger Synchronous Output) ...................... 35

3.2.5 Setting the Measurement Frequency ........... 37

3.2.6 Setting the Measurement Signal Level ......... 38

3.2.7 Setting the Measurement Speed ..................40

3.2.8 Display with Average Values (Average) ........ 41

3.3 Judging Measurement Results ..... 43

3.3.1 Setting the Judgment Mode ......................... 44

3.3.2 Judging with Upper and Lower Limit

Values (Comparator Judgment Mode) .......... 46

3.3.3 Classifying Measurement Results

(BIN Judgment) ............................................ 53

4 Analyzer Function 59

4.1 Analyzer Function .......................... 59

4.1.1 Flowchart ..................................................... 60

4.1.2 Screen map ................................................. 62

4.1.3 Measurement screen ................................... 64

4.1.4 Types of graph .............................................65

4.1.5 Status and error display of this instrument ....66

4.2 Setting Basic Settings of

Measurement .................................. 67

4.2.1 Setting the Measurement Parameters .......... 67

4.2.2 Starting Measurement at Any Arbitrary

Timing (Trigger) ...........................................68

4.2.3 Setting the Delay Time from Trigger to

Measurement Start (Trigger Delay) .............. 69

4.2.4 Applying the Signal to the Sample during Measurement Only

(Trigger Synchronous Output) ...................... 70

4.2.5 Setting the Sweep Parameter ...................... 72

4.3 Sweep measurement ..................... 73

4.3.1 Setting the Sweep Method ........................... 74

4.3.2 Setting the Sweep Range ............................76

4.3.3 Normal Sweep ............................................. 81

4.3.4 Segment Sweep and Segment Interval

Sweep ......................................................... 84

4.4 Set Measurement Conditions for

Sweep Points .................................. 87

4.4.1 Setting the Measurement Signal Frequency . 87

4.4.2 Setting the Measurement Signal Level ......... 88

4.4.3 Setting the Measurement Speed ..................90

4.4.4 Displaying Average Values (Average) .......... 90

4.4.5 Setting the Delay Time for Each Sweep

Point (Point Delay) ....................................... 91

4.5 Setting the Graph Display Method 92

4.5.1 Setting the Horizontal Axis ........................... 92

4.5.2 Setting the Vertical Axis ...............................95

4.5.3 ConguringtheX-YDisplayVerticalAxis

Reversal Setting ..........................................98

4.5.4 SettingtheX-YDisplayScaleWidth ............ 99

4.5.5 Setting Grid Display ................................... 100

4.5.6 Setting Overlay .......................................... 101

4.6 Setting the Cursor ........................ 102

4.6.1 Selecting the Cursor to Display in the

Screen ....................................................... 102

4.6.2 Setting Cursor Move .................................. 103

4.7 Performing Measurement Value

Search ........................................... 104

4.7.1 Setting the Search Target Parameter ......... 104

4.7.2 Setting the Search Type .............................105

4.7.3 Using the Automatic Search Function ......... 106

4.7.4 Executing Search....................................... 107

4.8 Judging Measurement Results

(Comparator Function) ................ 108

4.8.1 Setting the Judgment Mode ....................... 108

Appx. Index

IM7585A981-05

Contents

HIOKI IM7585A981-05

4.8.2 Setting the Parameter to be Judged

(Spot Judgment Excluded) ..........................110

4.8.3 Setting the Judgment Area to Display in the Measurement Screen

(Spot Judgment Excluded) .......................... 111

4.8.4 Area Judgment ...........................................112

4.8.5 PeakJudgment ...........................................116

4.8.6 Spot Judgment .......................................... 120

4.9 Equivalent Circuit Analysis

Function ........................................ 125

4.9.1 Equivalent Circuit Analysis Function ........... 125

4.9.2 ConguringBasicSettingsforAnalysis ...... 126

4.9.3 Performing Equivalent Circuit Analysis ....... 133

4.9.4 Simulating Frequency Characteristics ........ 136

4.9.5 Settings to Judge Analysis Results ............. 138

5 Calibration and

Compensation 141

5.1 Calibration and Compensation

Function Overview ....................... 141

5.2 Calibration .................................... 145

5.2.1 Setting Calibration Conditions and

Executing Calibration [CAL] .......................145

5.3 Error Compensation .................... 154

5.3.1 Setting the Electric Length Compensation

[LENGTH] .................................................. 154

5.3.2 Setting Compensation Conditions and

Executing Compensation [COMPEN] ......... 155

5.4 Calculating Values (Scaling) ....... 160

5.5 Troubleshooting of

Compensation .............................. 162

6 Continuous

Measurement Function 163

6.1 Continuous Measurement

Function ........................................ 163

6.1.1 Operationow ........................................... 164

6.1.2 Measurement screen ................................. 165

6.2 ConguringContinuous

Measurement Basic Settings ...... 166

6.3 Executing and Stopping

Continuous Measurement ........... 167

6.4 Checking Continuous

Measurement Results .................. 168

6.5 Cancels the Measurement if an

Error is Detected .......................... 169

7 Application function 171

7.1 Checking Contact Defects and the Contact State

(Contact Check Function) ........... 171

7.1.1 Setting the DC Measurement ..................... 171

7.1.2 Setting the Judgment ................................. 174

7.1.3 DetectingOPENduring2-terminal

Measurement (Hi Z Reject Function) .......... 176

7.1.4 Monitoring the Detection Level

(Detection Level Monitoring Function) ........ 177

7.2 Other Functions ........................... 179

7.2.1 Set the number of display digits ................. 179

7.2.2 Setting Absolute Value Display (LCR only) . 180

7.2.3 Setting the Communication Measurement

Data Type .................................................. 181

7.3 Common Functions

(LCR Mode, ANALYZER Mode) .... 182

7.3.1 Saving Measurement Results

(Memory Function) ..................................... 182

7.3.2 Setting the Screen Display ......................... 184

7.3.3 Setting the Beep Sound ............................. 188

7.3.4 DisplaytheWarm-upMessage .................. 189

7.3.5 Disabling Key Operation

(Key-lockFunction) .................................... 190

7.3.6 Setting the Communication Measurement

Data Type .................................................. 194

7.3.7 Initializing the Instrument (System Reset) ... 196

8 External Control 199

8.1 External Input/Output Connector

and Signals ................................... 199

8.2 Timing Chart ................................. 209

8.2.1 LCR mode ................................................. 209

8.2.2 ANALYZERMode .......................................211

8.2.3 CONTINUOUS measurement mode .......... 213

8.3 Internal Circuit .............................. 215

8.4 External Control Q&A .................. 218

8.5 Measurement Using a Computer 218

8.6 External Control I/O Settings ...... 219

8.6.1 Enabling Trigger Input During

Measurement (Trigger Enabled) ................. 219

8.6.2 Setting Valid Edge of Trigger Input

(Trigger Edge) ............................................ 220

8.6.3 Setting Reset of Judgment Results

(Judgment Result Signal Reset) ................. 221

8.6.4 Setting the EOM Output Method

(EOM mode) .............................................. 222

8.6.5 Setting Delay Time from Judgment Results Output until Output of EOM

(LOW)(JUDGE-EOM) ............................... 224

8.6.6 SetaDelayforINDEXSignalOutput

(INDEXDelay) ........................................... 225

Contents

HIOKI IM7585A981-05

9 Saving and Loading

Panel Information 227

9.1 Saving Measurement Conditions

(Panel Save Function) .................. 228

Loading Measurement Conditions

9.2

(Panel Load Function) ................. 231

9.3 Changing a Panel Name .............. 232

9.4 Deleting a Panel ........................... 233

10 Setting the SYSTEM 235

10.1 Setting the Interface ..................... 235

Checking the Instrument Version

10.2

10.3 Self Checks (Self Diagnosis) ....... 237

10.3.1 Panel Test .................................................. 237

10.3.2 Panel Compensation .................................. 238

10.3.3 Screen Display Test ................................... 239

10.3.4 ROM/RAM Test .........................................240

10.3.5 I/O Test ...................................................... 241

10.4 Setting the Date and Time ........... 242

. 236

11.7.5 CheckingtheContentsofFiles .................. 274

12 Specications 275

12.1 GeneralSpecications ................ 275

12.2 MeasurementSpecications ....... 276

12.3 Functionalspecication .............. 285

12.4 InterfaceSpecications ............... 291

12.5 Measurement Accuracy ............... 292

12.5.1 Example: Calculation of Accuracy .............. 292

12.5.2 Measurable Range .................................... 299

13 Maintenance and

Service 301

13.1 Inspection, Repair and Cleaning 301

13.2 Disposal ........................................ 303

13.3 Troubleshooting ........................... 305

13.4 Error Display ................................. 310

Appendix A1

11 Using USB Flash Drive 243

11.1 Overview ....................................... 243

11.2 Inserting and Removing USB

Flash Drive .................................... 245

11.3 Screen Display When Using USB 246

11.4 Saving Data to USB Flash Drive . 247

11.4.1 Saving Measurement Result as Text .......... 247

11.4.2 Saving Measurement Screen

(Screen Copy) ........................................... 258

11.4.3 Setting Save Folder ................................... 260

11.4.4 Saving Memory Data ................................. 262

11.5 Saving Instrument Settings to

USB Flash Drive ........................... 263

11.5.1 Saving Instrument Settings ........................ 263

11.5.2 Saving All Settings of Instrument

(ALL SAVE Function) ................................. 264

11.6 Loading Binary Data from USB

Flash Drive .................................... 265

11.6.1 Loading Measurement Data

(ANALYZERFunction) ............................... 265

11.6.2 Loading Instrument Settings ....................... 266

11.6.3 Loading All Settings (ALL LOAD Function) .268

11.7 Editing Data Saved in USB

Flash Drive .................................... 269

11.7.1 Formatting a USB Flash Drive .................... 269

11.7.2 Creating a Folder in USB Flash Drive ......... 270

11.7.3 Changing Folder Name or File Name in

USB Flash Drive ........................................ 271

11.7.4 Deleting a File or Folder in USB Flash

Drive .......................................................... 273

Appx. 1

Appx. 2

Appx. 3 Series Equivalent Circuit

Appx. 4 Selecting the Equivalent

Appx. 5 Maintenance of Coaxial

Appx. 6 Rack Mounting .........................A7

Appx. 7 Dimensional Diagram ............A15

Measurement Parameters and Calculation Formula Countermeasures to Prevent Entry of External Noise

Countermeasures to prevent entry of

noise from the power supply line ............... A3

Countermeasures to prevent entry noise

from the measurement cables ................... A3

Mode and Parallel

Equivalent Circuit Mode .......... A4

Circuit Model ............................ A5

Connector ................................. A6

Plate dimension ......................................... A8

Installation procedure .............................. A12

..........A1

Index Ind.1

Appx. Index

iii

Contents

HIOKI IM7585A981-05

Measurement Process

HIOKI IM7585A981-05

Read “Operating Precautions” (p. 5) before installing and connecting this instrument. Refer to “Appx. 6 Rack Mounting” (p. A7) for rack mounting.

Install the instrument (p. 5)

Connect the test head (p. 17)

Connect the power cord (p. 20)

Connect measurement cables, optional Hioki probes, or test xture (p. 21)

Connect external interfaces (as required) (p. 235)

Inspect all the connections (p. 19)

Turn ON the power supply (p. 24)

Perform calibration / compensation (p. 141)

Set measurement conditions

Connect to the test sample

Make measurements

Turn OFF the power supply (p. 24)

After using the instrument, remove the test sample and turn OFF the power supply.

Calibration/compensation execution timing

• Before measurements

• After the length of measurement cable is changed

• After the type of measurement sample is changed

• After the xture is changed

HIOKI IM7585A981-05

Introduction

HIOKI IM7585A981-05

Introduction

Thank you for purchasing the HIOKI IM7580A, IM7581, IM7583, IM7585, IM7587 Impedance Analyzer.

To obtain maximum performance from the instrument, please read this manual rst, and keep it handy for

future reference. The screen display has been explained using Model IM7585 as an example.

Model Information

Model Measurement frequency Cable length

Rear (Example: IM7585)

IM7580A-1

1 MHz to 300 MHz

IM7580A-2 2 m

IM7581-01

100 kHz to 300 MHz

IM7581-02 2 m

IM7583-01

1 MHz to 600 MHz

IM7583-02 2 m

IM7585-01

1 MHz to 1.3 GHz

IM7585-02 2 m

IM7587-01

1 MHz to 1.3 GHz

IM7587-02 2 m

1 m

Verifying Package Contents

• When you receive the instrument, inspect it carefully to ensure that no damage occurred during shipping. In particular, check the accessories, panel switches, and connectors. If damage is evident, or if it fails to

operate according to the specications, contact your authorized Hioki distributor or reseller.

• Store the packaging in which the instrument was delivered, as you will need it when transporting the instrument.

Conrm that the following items have been provided:

IM7580A, IM7581, IM7583, IM7585, IM7587 Impedance Analyzer ×1

• Test head ×1

• Measurement cable ×1 (IM7580A-1: 1 m, IM7580A-2: 2 m, IM7581-01: 1 m, IM7581-02: 2 m, IM7583-01: 1 m, IM7583-02: 2 m, IM7585-01: 1 m, IM7585-02: 2 m, IM7587-01: 1 m, IM7587-02: 2 m)

IM7580A, IM7581 IM7583, IM7585, IM7587

Instruction Manual ×1 Power cord ×1

Impedance Analyzer Application Disc ×1

(Communications user manual [PDF], communications commands manual, USB driver, sample application, and initial settings table)

• The latest version can be downloaded from our website.

Appx. Ind.

Options (Sold Separately)

HIOKI IM7585A981-05

Options (Sold Separately)

Contact your authorized Hioki distributor or reseller when ordering. The options are subject to change. Visit our website for updated information.

Test xtures

IM9200 Test Fixture Stand

IM9201 SMD Test Fixture (for SMDs)

IM9202 Test Fixture (for through-hole components and SMDs)

IM9906 Adapter (3.5mm/7mm)

IM9905 Calibration Kit

Interfaces

Z3000 GP-IB Interface

Z3001 RS-232C Interface

Connection cables

9151-02 GP-IB Connector Cable (2 m)

9637 RS-232C Cable (9pin-9pin/1.8m)

Safety Information

This instrument is designed to conform to IEC 61010 Safety Standards, and has been thoroughly tested for safety prior to shipment. However, using the instrument in a way not described in this manual may negate the provided safety features. Before using the instrument, be certain to carefully read the following safety notes.

DANGER

Mishandling during use could result in injury or death, as well as damage to the instrument. Be certain that you understand the instructions and precautions in the manual before use.

WARNING

With regard to the electricity supply, there are risks of electric shock, heat

generation, re, and arc discharge due to short circuits. If persons unfamiliar

with electricity measuring instrument are to use the instrument, another person familiar with such instruments must supervise operations.

Notation

HIOKI IM7585A981-05

In this manual, the risk seriousness and the hazard levels are classied as follows.

Safety Information

DANGER

WARNING

CAUTION

IMPORTANT

Symbols on the instrument

Indicates an imminently hazardous situation that will result in death or serious injury to the operator.

Indicates a potentially hazardous situation that may result in death or serious injury to the operator.

Indicates a potentially hazardous situation that may result in minor or moderate injury to the operator or damage to the instrument or malfunction.

Indicates information related to the operation of the instrument or maintenance tasks with which the operators must be fully familiar.

Indicates a high voltage hazard. If a particular safety check is not performed or the instrument is mishandled, this may give rise to a hazardous situation; the operator may receive an electric shock, may get burnt or may even be fatally injured.

Indicates prohibited actions.

Indicates the action which must be performed.

Additional information is presented below.

Indicates cautions and hazards. When the symbol is printed on the instrument, refer to a corresponding topic in the Instruction Manual.

Indicates AC (Alternating Current).

Indicates the ON side of the power switch.

Indicates the OFF side of the power switch.

Symbols for standards

Indicates the Waste Electrical and Electronic Equipment Directive (WEEE Directive) in EU member states.

Indicates that the product conforms to regulations set out by the EU Directive.

Appx. Ind.

Safety Information

HIOKI IM7585A981-05

Accuracy

We dene measurement tolerances in terms of f.s. (full scale), rdg. (reading) and dgt. (digit) values,

with the following meanings:

(maximum display value or scale length)

f.s.

The maximum displayable value or scale length. This is usually the name of the currently selected range.

rdg.

dgt.

(reading or displayed value) The value currently being measured and indicated on the measuring instrument.

(resolution) The smallest displayable unit on a digital measuring instrument, i.e., the input value that

causes the digital display to show a “1” as the least-signicant digit.

Measurement categories

To ensure safe operation of measurement instruments, IEC 61010 establishes safety standards for various electrical environments, categorized as CAT II to CAT IV, and called measurement categories.

DANGER

• Using a measuring instrument in an environment designated with a higher-

numbered category than that for which the instrument is rated could result in a severe accident, and must be carefully avoided.

• Using a measuring instrument without categories in an environment designated

with the CAT II to CAT IV category could result in a severe accident, and must be carefully avoided.

CAT II: When directly measuring the electrical outlet receptacles of primary electrical circuits

in equipment connected to an AC electrical outlet by a power cord (portable tools, household appliances, etc.).

CAT III: When measuring the primary electrical circuits of heavy equipment (xed installations)

connected directly to the distribution panel, and feeders from the distribution panel to outlets.

CAT IV: When measuring the circuit from the service drop to the service entrance, and to the

power meter and primary overcurrent protection device (distribution panel).

Service entrance

Service drop

CAT IV

Power meter

Distribution panel

Internal wiring

CAT III

Fixed installations

CAT II

Outlet

Operating Precautions

HIOKI IM7585A981-05

Operating Precautions

Follow these precautions to ensure safe operation and to obtain the full benets of the various functions.

WARNING

If the measurement cable or the instrument is damaged, there is a risk of electric shock. Perform the following inspection before using the instrument:

• Before using the instrument, make sure that the insulation on the measurement

cables are undamaged and that no bare conductors are improperly exposed. If

the instrument is damaged, contact your authorized Hioki distributor or reseller.

• Before using the instrument for the rst time, verify that it operates normally

to ensure that no damage occurred during storage or shipping. If you nd any

damage, contact your authorized Hioki distributor or reseller.

CAUTION

Avoid using an uninterruptible power supply (UPS) or DC/AC inverter with rectangular wave or pseudo-sine-wave output to power the instrument. Doing so may damage the instrument.

Instrument installation

For details on the operating temperature and humidity, refer to the specications (p. 275).

Installing the instrument in inappropriate locations may cause a malfunction of instrument or may give rise to an accident. Avoid the following locations.

• Exposed to direct sunlight or high temperature

• Exposed to corrosive or combustible gases

• Exposed to a strong electromagnetic eld or electrostatic charge

• Near induction heating systems (such as high-frequency induction heating

systems and IH cooking equipment)

• Susceptible to vibration

• Exposed to water, oil, chemicals, or solvents

• Exposed to high humidity or condensation

• Exposed to high quantities of dust particles

Installation method

Example: IM7585

50 mm or more

WARNING

To prevent overheating, be sure to leave the specied

clearances around the instrument.

• Install the instrument with the bottom facing down.

• Vents must not be obstructed.

• A distance of 50 mm or more must be maintained between the rear and the surroundings.

Appx. Ind.

Operating Precautions

HIOKI IM7585A981-05

Warranty

Hioki disclaims responsibility for any direct or indirect damages that may occur if this instrument has been combined with other devices by a systems integrator prior to sale or during resale. Please note.

Handling the instrument

DANGER

• To avoid electric shock, do not remove the instrument’s case. The internal

components of the instrument carry high voltages and may become very hot during operation.

• Do not allow the instrument to get wet, and do not take measurements with wet

hands. This may cause an electric shock.

CAUTION

• If the instrument exhibits abnormal operation or display during use, review the information given in “13.3 Troubleshooting” (p. 305) and “13.4 Error Display” (p. 310) before contacting your authorized Hioki distributor or reseller. Do not connect charged capacitors, input voltage or current to the measuring terminals. The instrument will get damaged.

• To avoid damage to the instrument, protect it from physical shock when transporting and handling. Be especially careful to avoid physical shock from dropping.

• This instrument is not designed to be entirely water- or dust-proof. Do not use it in an especially dusty environment, nor where it might be splashed with liquid. This may cause damage.

• Do not use excessive force on the touch panel, and do not use hard or sharp objects that could damage the touch screen.

• Do not apply heavy downward pressure with the stand extended. The stand could be damaged.

• To avoid damage to the instrument, do not short-circuit the terminal/output terminal and do not input voltage to the terminal/output terminal.

• After use, always turn OFF the power.

IMPORTANT

This instrument may cause interference if used in residential areas. Such use must be avoided unless the user takes special measures to reduce electromagnetic emissions to prevent interference to the reception of radio and television broadcasts.

Before turning ON the power

• Before turning the instrument on, make sure the supply voltage matches that indicated on its power connector. Connection to an improper supply voltage may damage the instrument and present an electrical hazard. Be careful to avoid connecting the supply voltage improperly. Doing so may damage the instrument’s internal circuitry. To avoid electrical accidents and to maintain the

safety specications of this instrument, connect the power cord provided only

to an outlet.

WARNING

Handling of cords and xtures

HIOKI IM7585A981-05

Use only the designated power cord with this instrument. Using other power cords may

cause re.

Operating Precautions

WARNING

• To avoid damaging the power cord, grasp the plug, not the cord, when unplugging it

• To avoid breaking the cables or probes, do not bend or pull them.

• Bare conductors may get exposed if the insulation melts. Keep the cables well away

• Keep in mind that, in some cases, conductors to be measured may be hot.

• Use only the specied measurement cables. Using a non-specied measurement cable

may result in incorrect measurements due to poor connection or other reasons.

• Read the instruction manual supplied with the product to be used before using a xture.

CD precautions

• Exercise care to keep the recorded side of discs free of dirt and scratches. When writing

text on a disc’s label, use a pen or marker with a soft tip.

• Keep discs inside a protective case and do not expose to direct sunlight, high

temperature, or high humidity.

• Hioki is not liable for any issues your computer system experiences in the course of

using this disc.

CAUTION

from the power outlet.

from heat sources.

Before connecting to the EXT I/O terminals

WARNING

To avoid electric shock or damage to the equipment, always observe the following precautions when connecting to the EXT I/O connector.

• Always turn OFF the power to the instrument and to any devices to be

connected before making connections.

• Be careful to avoid exceeding the ratings of EXT I/O connector (p. 216).

• During operation, a wire becoming dislocated and contacting another

conductive object can be a serious hazard. Use screws to secure the EXT I/O connectors.

• Ensure that devices and systems to be connected to the EXT I/O terminals are

properly isolated.

• The ISO_5V pin of the EXT I/O connector is a 5V power output. Do not apply

external power to this pin.

Appx. Ind.

Operating Precautions

HIOKI IM7585A981-05

USB ash drives

• Hioki cannot recover or analyze data from damaged or faulty storage media. We cannot compensate for such data loss, irrespective of the contents or cause for the failure or damage. We recommend you to make a backup of all important data in a computer or other devices.

• Avoid inserting the USB ash drive with the wrong orientation. This can damage the

USB ash drive or instrument.

• When a USB ash drive is being accessed, the color of the USB icon changes from blue to red. Do not turn off the power of the instrument while the USB ash drive is being accessed. Also, do not remove the USB ash drive from the instrument while it is being accessed. This may result in the loss of data stored in the USB ash drive.

• Do not transport the instrument while a USB ash drive is connected. Damage could result.

• Some USB ash drive are susceptible to static electricity. Exercise care when using

such products because static electricity could damage the USB ash drive or cause

malfunction of the instrument.

• With some USB ash drives, the instrument may not start up if power is turned on

while the USB ash drive is inserted. In such a case, turn the power on rst, and then insert the USB ash drive. We recommend that various operations such as copy and save be carried out with the USB ash drive before using it for actual measurements.

CAUTION

USB ash drives have a limited usable lifetime. Data reading and writing will fail after long-term use. Replace the USB ash drive in this case.

Input modules (optional)

Always turn both devices OFF when connecting and disconnecting an interface connector. This may cause an electric shock.

• To connect or disconnect optional interfaces, hold the metal part. Touching the PCB with bare hands could damage the instrument due to static electricity. (Antistatic wrist strap is recommended when disconnecting the interface.)

• To avoid equipment failure, do not disconnect the communications cable while communications arein progress.

• Use a common ground for both the instrument and the computer. Using different ground circuits will resultin a potential difference between the instrument’s ground and the computer’sground. If the communications cable is connectedwhile such a potential difference exists, it may result inequipment malfunction or failure.

• Before connecting or disconnecting any communications cable, always turn off the instrument and the computer. Failure to do so could result in equipmentmalfunction or damage.

• After connecting the communications cable, tightenthe screws on the connector securely. Failure to secure theconnector could result in equipment malfunction or damage.

WARNING

CAUTION

HIOKI IM7585A981-05

Overview

1.1 Overview and Features

The HIOKI IM7580A, IM7581, IM7583, IM7585, IM7587 Impedance Analyzer is an impedance measuring instrument that has achieved high speed and high accuracy. The IM7585 combines the functionality of two devices: an impedance analyzer that can perform measurement while sweeping the measurement frequency and signal level, and an LCR meter that can simultaneously display up to four parameters under a single set of measurement conditions. A wide range of measurement conditions can be set, and the instrument can be used for a wide range of applications such as measurement of high frequency inductors.

Model Measurement frequency Signal level

Wide range of

measurement

conditions

IM7580A-1

IM7580A-2

IM7581-01

IM7581-02

IM7583-01

IM7583-02

IM7585-01

IM7585-02

1 MHz to 300 MHz

100 kHz to 300 MHz

1 MHz to 600 MHz

1 MHz to 1.3 GHz

-40.0 dBm to +7.0 dBm

-40.0 dBm to +1.0 dBm

Overview

IM7587-01

IM7587-02

Fast measurement The measurement speed is 0.6 ms (typical value) at the fastest.

The measurement frequency and sweep function of measurement level

Graph display

Equivalent circuit

analysis

CONTINUOUS

measurement mode

measures and displays the frequency characteristics and level characteristics as a graph on the color LCD display of the instrument. A Cole-Cole plot and admittance pie graph can also be easily displayed.

It provides ve types of equivalent circuit models for circuit element

components.

It is capable of continuous measurements using measurement conditions stored in the instrument memory. This function enables making pass/fail judgments with different measurement conditions. (Example: Performs C-D measurement with 1 MHz and Ls measurement with 100 MHz in succession.)

1 MHz to 3 GHz

Various interfaces are

supported

It supports EXT I/O (handler interface), which is the most suitable for production lines, USB, GP-IB, RS-232C, and LAN. * GP-IB and RS-232C are optional.

Overview and Features

HIOKI IM7585A981-05

Comparator function

• LCR mode: (p. 46) It is capable of making pass/fail judgements by determining whether measurement values qualify as higher, within a range, or lower (hereafter referred to as HI, IN, and LO, respectively) regarding four parameters.

• ANALYZER mode: (p. 108) It is capable of making pass/fail judgments for sweep measurement results.

BIN function

LCR mode can divide the rank up to 10 classications based on the

measurement values.

1.2 Names and Functions of Parts

HIOKI IM7585A981-05

Front panel of the instrument

Names and Functions of Parts

Example: IM7585

Coaxial connectors (p. 17)

• CONTROL

• RF OUT

• PORT 1

• PORT 2

IM7580A and IM7581 only

Connector for USB

ash drive (p. 243)

Connect a USB ash

drive storage device.

Coaxial connectors (p. 17)

• RF OUT

• PORT 1

• PORT 2

LCD display

This is a touch panel display. Press the keys displayed on the screen to operate the instrument.

HOME button

• Returns to the measurement screen.

• Use this button for the full reset operation (p. 309).

Start button (p. 24)

(The main power switch is located at the rear.)

Lamp status Instrument status

Green

Red

The start button turns the state from inactive to active. Accurate measurement requires at least 60 minutes of warm-up.

Measurement lamp

Lamp status Instrument status

Green During measurement

Red

Power supply ON

Active

Power supply OFF

Inactive

Full reset under

preparation

Overview

Bottom panel of the instrument

Example: IM7585

This instrument can be rack mounted. Refer to “Appx. 6 Rack Mounting” (p. A7).

Parts removed from this instrument should be stored in a safe place to enable future reuse.

Names and Functions of Parts

HIOKI IM7585A981-05

Rear of the instrument

Example: IM7585

Vents (p. 5)

Install so that the vents are not covered.

Main power switch

(p. 24)

Power inlet (p. 20)

Connect the supplied power cord.

(p. 6)

Serial number and model name

The 9-digit serial number indicates the year (rst two digits) and the

month of manufacture (next two digits). Do not remove this sticker as the number is important.

Communication interface (option) (p. 235)

Optional interfaces can be installed. Refer to the Communication Instruction Manual (Impedance Analyzer Application Disc).

• Model Z3000 GP-IB Interface

• Model Z3001 RS-232C Interface

MAC address

EXT I/O Connector (p. 199)

(p. 7)

USB cable connector

Refer to the Communication Instruction Manual (Impedance Analyzer Application Disc).

LAN connector

Refer to the Communication Instruction Manual (Impedance Analyzer Application Disc).

IM7580A, IM7581

In Models IM7580A and IM7581, the following are the differences with Model IM7585.

• The position and shape of vents

• The position of the MAC address

• The position of the serial number and model name

Right side panel of the instrument

Handle

Used for carrying the instrument.

Example: IM7585

When setting up the stands

Open till the end without stopping in between. Ensure that both stands are straight.

When closing the stands

Close till the end without stopping in between.

Stands

Enables the instrument to be tilted.

Side of the test head

HIOKI IM7585A981-05

IM7580A, IM7581

IM7583, IM7585, IM7587

Meauring terminal

(p. 6)

Measuring terminal

(p. 6)

Coaxial connectors

RF OUT

PORT1

PORT2

Coaxial connectors

Names and Functions of Parts

Overview

CONTROL

RF OUT

PORT1

PORT2

Bottom of the test head

IM7580A, IM7581

2×M4

Effective Depth 5

Threaded holes for xing the IM9200 Test Fixture Stand

These holes can also be used when xing a test head to an automated machine.

The depth of the threaded holes is 5 mm.

IM7583, IM7585, IM7587

Do not use screws of length exceeding M4 × 5 mm. Doing so may damage the device.

Screen Operations

HIOKI IM7585A981-05

1.3 Screen Operations

This instrument allows you to use a touch panel to set and change all measurement conditions. Gently touch the key on the screen to select the item or numerical value set for that key. In this manual, gently touching the screen is referred to as “press”.

CAUTION

Do not use excessive force on the touch panel, and do not use hard or sharp objects that could damage the touch screen.

Example: Setting the measurement frequency in LCR mode

On LCR mode

screen, press

[SETUP] of the

menu key.

Press the [BASIC] tab.

Press [FREQ].

[DIGIT] (input with /), or [10-KEY] (input with the

numeric keypad).

Set the measurement

frequency with the numeric keypad.

Press any unit key to

conrm the setting.

Press [EXIT] to close

the setting screen.

/,

Example: Moving the window

HIOKI IM7585A981-05

Screen Operations

You can move the window by moving the top of the window (green bar) while pressing it.

Overview

Screen Operations

HIOKI IM7585A981-05

Read “Operating Precautions” (p. 5) before installing and connecting this instrument. Refer to “Rack Mounting” (p. A7) for rack mounting.

Measurement Preparations

2.1 Connecting the Test Head

Connect the test head. Refer to “5 Calibration and Compensation” (p. 141).

CAUTION

• If the instrument and the connectors of the test head are not correctly connected, the instrument may get damaged or accurate measurements may not be possible.

• Tighten the connector with a torque of 0.56 Nm (recommended value). Tightening the connector with a torque other than the recommended value may damage the instrument or accurate measurements may not be possible.

Measurement Preparations

IMPORTANT

• Check that there are no problems with the connector before connecting the cable. If

there is a problem with the connector, you cannot perform accurate measurement due to large measurement errors. Refer to “Appx. 5 Maintenance of Coaxial Connector” (p. A6).

• The instrument, test head and measuring cables have been adjusted as a set before

shipment. Connect the test head having the same serial number as the instrument with the measuring cables supplied.

Example: IM7585

Rear of the instrument Rear of the test head

Serial No.

Connecting the Test Head

HIOKI IM7585A981-05

Check that the power switch of the instrument is turned off.

Connect CONTROL, RF OUT, PORT1, and PORT2 of the instrument to CONTROL, RF OUT, PORT1, and PORT2 of the test head with the supplied measurement cable.

Example: IM7585

0.56 Nm

(recommended value)

If the specied torque is applied to the

torque wrench, it will rotate to the position

shown in the gure.

Do not rotate the cable when connecting the SMA connector of the cable to the instrument and the test head. If the cable is rotated while connecting the connector, the core wires of the connector or cable may get damaged. Rotate the nut of the connector and connect.

Pre-Operation Inspection

HIOKI IM7585A981-05

2.2 Pre-Operation Inspection

Be sure to read “Operating Precautions” (p. 5) before use.

Before using the instrument for the rst time, verify that it operates normally to ensure that no

damage occurred during storage or shipping.

If you nd any damage, contact your authorized Hioki distributor or reseller.

Inspection of accessories and options

Inspection item Solution

Is the power cord insulation torn, or is any metal exposed?

Is the insulation on the measurement cable torn, or is any metal exposed?

Do not use the instrument if it is found to be damaged, as it can result in electric shocks or short-circuit accidents.

Contact your authorized Hioki distributor or reseller.

If there is any damage, measurement values may not be stable and measurement errors may occur. We recommend using a new cable without any damage.

Instrument inspection

Inspection item Solution

Is the instrument damaged? If the instrument is damaged, request repairs.

Does the splash screen appear (Model no., version no.) when the power is turned on?

Screen when the power is turned on

(Example: IM7585)

If the splash screen does not appear, the power cord may be damaged, or the instrument may be damaged internally. Request repairs.

Measurement Preparations

Is there an error displayed instead of the splash screen?

Error display screen

If there is an error displayed, the instrument may be damaged internally. Request repairs. Refer to “Troubleshooting” (p. 305) and “Error Display” (p. 310).

Example: An interface board that cannot be used is installed (LAN board).

Connecting the Power Cord

HIOKI IM7585A981-05

2.3 Connecting the Power Cord

Please read “Before turning ON the power” (p. 6) and “Handling of cords and xtures” (p. 7) before connecting the measurement cable or xture.

Connect the power cord to the power inlet on the instrument, and plug into an outlet.

Turn OFF the main power switch before disconnecting the power cord.

Check that the main power switch of the instrument is turned off.

Connect a power cord that is compatible with the line voltage to the power inlet on the instrument (100 V to 240 V AC).

Rear (Example: IM7585)

Plug the other end of the power cord into an outlet.

Connecting a Measurement Cable/Fixture

HIOKI IM7585A981-05

2.4 Connecting a Measurement Cable/Fixture

Please read “Before turning ON the power” (p. 6) and “Handling of cords and xtures” (p. 7) before connecting the measurement cable or xture.

Connect the measurement cables, or optional Hioki test xture to the measurement terminals.

Refer to “Options (Sold Separately)” (p. 2) for options.

Refer to the Instruction Manual of the xture for the operating details.

Note the following items when extending the distance between the test sample and measuring terminals.

• Use 50 Ω coaxial cable for the measurement cable.

• Make the length of the cable as short as possible.

• Perform open/short/load calibration using the connecting terminal of the test sample.

Use the specied probes and xtures. When you make your own probe, it may not satisfy the specications of this instrument.

Refer to “Options (Sold Separately)” (p. 2).

You will need:

• Test head × 1

• Model IM9200 Test Fixture Stand × 1

• Model IM9906 Adapter × 1

• 3.5 mm Connector torque wrench × 1 (This is not provided with the device.)

Metal ttings

Test head

Pull the metal ttings to the model IM9200 Test

Fixture Stand side.

Place the test head on the stand and tighten the knob.

Measurement Preparations

Model IM9906

Measuring terminal

Notch

3.5 mm connector

Model IM9200

nut

Place the notch of the model IM9906 Adapter parallel

to the metal ttings, then install onto the measurement

terminal of the test head.

At this time it is stopped temporarily. Position the notch of the

model IM9906 Adapter where the metal ttings can slide.

Fix the notch of model IM9906 adapter by sliding the

metal ttings.

Tighten the nut of the 3.5 mm connector by using a

torque wrench.

Recommended torque: 0.9 N·m Tightening the nut until the handle of the wrench bends slightly is

sufcient. Do not over tighten.

Connecting an Interface

HIOKI IM7585A981-05

2.5 Connecting an Interface

Rear (Example: IM7585)

To prevent instrument damage or electric shock, use only the screws (M3 × 6 mm) shipped with the instrument for installing the interface.

If you have lost any screws or nd that any screws are damaged, please contact

your Hioki distributor for a replacement.

• Please read “Input modules (optional)” (p. 8) before connecting the Interface.

• Read the Instruction Manual of the optional interface before installing or replacing an optional interface or to use the instrument after removing the interface.

• You can check the information of the interface installed in the instrument on the screen. Refer to “Setting the Interface” (p. 235) and “Checking the Instrument Version” (p. 236).

WARNING

CAUTION

To connect or disconnect optional interfaces, hold the metal part. Touching the PCB with bare hands could damage the instrument due to static electricity. (An antistatic wrist strap is recommended when disconnecting the interface.)

You will need: A Phillips head screwdriver (No. 2)

HIOKI IM7585A981-05

Connecting an Interface

Installing the interface

Unplug the power cord of the instrument

from the wall outlet. Disconnect the connection cords.

Rear

(M3 × 6 mm)

Use a Philips screwdriver

to remove the two xing

screws and detach the blank panel.

Pay attention to the

orientation of the

(M3 × 6 mm)

Secure the interface in place by

tightening the two xing screws

with a Phillips head screwdriver.

interface and insert it

rmly into place.

Attaching the blank panel

Unplug the power cord of the instrument

from the wall outlet. Disconnect the connection cords.

Rear

Attach the blank panel

and secure it in place by

tightening the two xing

screws with a Phillips head screwdriver.

Attach the blank panel to use the instrument after removing the interface. Measuring without the blank panel will prevent the instrument from performing to its

specications.

Measurement Preparations

Removing the interface

Unplug the power cord from the wall outlet and perform the above procedure in reverse order to remove the interface.

Turning the Power ON and OFF

HIOKI IM7585A981-05

2.6 Turning the Power ON and OFF

Connect the probe and test xture before turning the main power on.

Rear (Example: IM7585)

Power switch (main power)

Turning the main power ON

Turn the main power switch ON ( | ).

The start button on the front will light up in green.

(Lights up in green)

Front (Example: IM7585)

Start button

Turning to the inactive state

Press the start button on the front for approximately 1 second in the main power ON state.

The color of the start button on the front changes to red in the inactive state.

(Lights up in red)

• If the main power switch is turned OFF when the instrument is in the inactive state, the instrument will start up in the inactive state the next time the main power switch is turned ON.

• To measure to the degree of accuracy

mentioned in the specications, allow a warm-

up time of 60 minutes or more after cancellation of the inactive state.

Turning the main power OFF

Turn the main power switch OFF( ).

The start button on the front will turn off.

(Turns off)

• If the power supply is interrupted by a power failure, etc, the instrument will return to the measurement mode used before the power failure.

• The instrument settings will be retained even if the main power switch is turned OFF. (This is backup function.)

Canceling the inactive state

To measure to the degree of accuracy mentioned

in the specications, allow a warm-up time of 60

minutes or more after cancellation of the inactive state.

Press the start button on the front when the instrument is in the inactive state.

The start button on the front will light up in green.

(Lights up in green)

What is inactive state?

The state in which the power supply of the instrument is turned OFF. (Only the circuit to turn ON the lamp of the start button is active.)

If the instrument is not used for a long duration, the internal battery must be charged. The required charging time is at least 3 hours (recommended, 24 hours) after connecting the power supply and turning ON the power of the instrument.

2.7 Select the Measurement Mode

HIOKI IM7585A981-05

Select any one of the following 3 measurement modes.

Press [MODE].

Select the measurement mode.

Press [EXIT].

Select the Measurement Mode

Measurement Preparations

[LCR]: LCR function

The LCR function allows you to measure the passive elements of capacitors and coils with a single measurement condition.

This is suitable to make pass/fail judgments and classication on

production lines.

• Comparator function: Makes pass/fail judgments by determining whether measurement values qualify as HI, IN, or LO.

• BIN function: Divides ranks up to 10 classications based on the measurement values.

[ANALYZER]: Analyzer function

The analyzer function allows you to measure component and material

characteristics while sweeping the measurement frequency and signal level. This function provides equivalent circuit analysis based on the results of frequency characteristics. A pass/fail judgment based on a resonant frequency is available on

production lines of piezoelectric or similar elements.

• Area judgment: Judges whether the measurement values of the sweep points are within the judgment area.

• Peak Judgment: Judges whether the peak value of the sweep result is within the judgment area.

• Equivalent circuit analysis: Equivalent circuit models analysis for circuit element components.

[CONTINUOUS]: Continuous measurement function

The continuous measurement function allows you to perform a series of measurements with different conditions.

For example, Consecutive Ls measurement with 1 MHz of and Z measurement with 100 MHz and its pass/fail judgment can be made. LCR mode and ANALYZER mode measurement conditions can be

combined.

Up to 46 measurements (30 for LCR mode and 16 for ANALYZER mode)

can be performed continuously.

HIOKI IM7585A981-05

START

END

HIOKI IM7585A981-05

LCR Function

3.1 LCR Function

The LCR function allows you to measure the impedance, phase angle, and other items by applying a signal of any frequency or level (RMS value) to the element you want to measure. This function is suitable for evaluating the passive elements such as capacitors and coils. It allows you to perform measurement while checking the measurement conditions on the measurement screen. When the power is turned on again, the measurement screen will be displayed in accordance with the measurement mode used before the power was turned off.

• Conditions set by the LCR function are not incorporated in the analyzer function.

• When a measurement value is outside the guaranteed accuracy range, REF VAL is displayed in the error display area. Check the guaranteed accuracy range. Consider measurement values outside the guaranteed accuracy range as values for reference. Refer to “Measurement range” (p. 277).

3.1.1 Flowchart

LCR Function

Set MODE to LCR

Necessary settings

Measurement parameter

settings

Basic measurement

settings

(FREQ,LEVEL,

SPEED,AVG,DELAY,

SYNC,TRIG)

Calibration/

Compensation

Contact check

settings

User-dened settings

Judgment settings

Common settings

Measurement

LCR Function

HIOKI IM7585A981-05

3.1.2 Screen map

Measurement mode setting screen (p. 25)

System settings screen (p. 235)

Trigger (p. 68)

Advanced settings screen (p. 33)

Compensation settings screen

(p. 141)

[CAL] Calibration p. 145

[Rdc LIMIT] DC measurement limit value

[LENGTH]

[COMPEN] Compensation p. 155

[Rdc LIMIT] DC measurement limit value

[SCALE] Scaling p. 160

Electrical length compensation

p. 152

p. 154

p. 159

Select an interface. (p. 235)

The version of the instrument can be veried. (p. 236)

Save settings screen

(p. 247)

[SETUP] Sets [SAVE] p. 247

[SAVE] Saves setting conditions p. 247

[LOAD] Reads setting conditions p. 265

[FORMAT] Formats USB ash drive

[DELETE]

[FOLDER]

[RENANE]

[SELECT]

[BACK]

Deletes les p. 273

Creates folders p. 270

Changes le names p. 271

Selects les p. 265

Displays the previous screen

p. 269

Self-checks (self-diagnosis) are enabled. (p. 237) The date and time can be set for the

instrument. (p. 242)

Advanced

HIOKI IM7585A981-05

settings screen

(p. 37)

LCR Function

[FREQ] Measurement frequency p. 37

[LEVEL] Measurement signal level p. 38

[SPEED] Measurement speed p. 40

[AVG] Average p. 41

[DELAY] Trigger delay p. 34

[SYNC] Trigger synchronous output p. 35

[TRIG] Trigger p. 33

[TIMING] Contact check timing p. 171

[AC OUT] AC signal superimposition p. 173

[DC WAIT] Wait time prior to DC measurement p. 172

[WAVE] Number of DC

[AC WAIT] Wait time prior to AC measurement p. 172

[LIMIT] Judgment of DC measurement value p. 174

[ERR ABORT] Quit function in case of judgment error p. 174

[JDG EXEC] Judgment for reference values p. 174

[Hi Z] Hi Z reject function p. 176

[LEV CHECK] Monitoring function for detection level p. 177

[JUDGE] Judgment p. 44

[DIGIT]

[PARA ABS] Display of absolute value p. 180

[COM MEAS]

Number of display digits for each parameter

Setting for communication command

:MEASURE?

“

samples

”

p. 173

p. 179

p. 181

LCR Function

[IO JUDGE] I/O output of judgment results p. 221

[IO TRIG] I/O trigger p. 219 [IO EOM] EOM output method p. 222

[MEMORY] Saving measurement results p. 262

[DISP] LCD display p. 184

[BEEP KEY] Beep sound p. 188

[COM FORM] Communication measurement data type p. 194

[KEYLOCK] Key lock p. 190 [WARM UP] Warm-up notication function p. 189

[PANEL] Panel loading and saving p. 227 [RESET]

Initializing p. 196

LCR Function

HIOKI IM7585A981-05

3.1.3 Measurement screen

Switches information to be displayed on the measurement screen.

Sets measurement parameters. (p. 32)

Displays the measurement value.

Sets the upper and lower limits. (p. 46)

The judgment result is displayed. (p. 46)

[SET]

[COMP]

[BIN1] to

[BIN10]

Displays information regarding LCR measurement

Displays information on comparator measurement judgment standards.

Displays information on BIN judgment standards.

Switches the display items among measurement conditions, upper and lower limits of comparator judgment or BIN judgment, and others.

Displays measurement conditions, upper and lower limits of comparator judgment or BIN judgment, or others.

The setting window is displayed by pressing any measurement condition area when measurement conditions are displayed.

Monitor values are displayed.

Magnies the screen.

If [ZOOM OFF] is pressed,

the screen returns to the

normal display.

Rdc values are displayed.

Saves the measurement data. (p. 263)

Sets the upper and lower limit values of the DC resistance. (p. 174)

The upper and lower limit values of DC resistance are displayed.

Inputs the trigger of an external trigger. (p. 33)

3.1.4 Status and error display of this instrument

HIOKI IM7585A981-05

1 2 3 4

LCR Function

Displays the current measurement mode.

LCR function

Analyzer function

Continuous measurement function

Displays error messages.

Outside guaranteed accuracy

Hi Z reject error

Error in detection level

Displays information saved in the internal

memory.

Number of memories saved in the internal memory

8765

Displays the state of calibration or

compensation.

AC measurement

Calibration disabled

Calibration

Calibration enabled

Compensation

DC measurement

Calibration

Compensation

disabled

Compensation enabled

Calibration disabled

Calibration enabled

Compensation disabled

Compensation enabled

LCR Function

When the instrument memory becomes full

Displays the type of interface that is currently connected.

RS-232C

GP-IB

USB

LAN

Displays the connection status of the USB

ash drive.

(Blue)

(Red)

Displays the communication state.

Displays the date and time set for the instrument.

USB ash drive is

connected

USB ash drive is being

accessed

During communication control

Local

Setting Basic Settings of Measurement Conditions

HIOKI IM7585A981-05

3.2 Setting Basic Settings of Measurement Conditions

3.2.1 Setting Display Parameters

You can select up to 4 types from the 14 types of measurement parameters to display at any arbitrary location. The phase angle θ is shown in reference to impedance Z. When performing measurements using admittance Y as the reference, the sign of the phase angle θ of impedance Z will be reversed.

Refer to “Appx. 1 Measurement Parameters and Calculation Formula” (p. A1). Refer to “Appx. 3 Series Equivalent Circuit Mode and Parallel Equivalent Circuit Mode” (p. A4).

To display phase angles relative to admittance Y, use the scaling settings to multiply the impedance phase angle θ by -1. Refer to “5.4 Calculating Values (Scaling)” (p. 160)

Parameter Contents

[Z] Impedance (

[Y] Admittance (S)

[θ]

[Rs] Effective resistance = ESR (

[Rp] Effective resistance (

[Cs] Static capacitance (F) (series

[Cp] Static capacitance (F) (parallel

[D] Loss coefcient = tan

Impedance phase angle (°)

equivalent circuit)

equivalent circuit mode)

)

) (series

) (parallel

Parameter Contents

[G] Conductance (S)

[X] Reactance (

[Ls] Inductance (H) (series equivalent

circuit)

[Lp] Inductance (H) (parallel equivalent

circuit mode)

[Q] Q factor

[B] Susceptance (S)

[OFF] No display

Press the parameter key that you want to set.

)

Select parameters.

Press [EXIT].

Setting Basic Settings of Measurement Conditions

HIOKI IM7585A981-05

3.2.2 Starting Measurement at Any Arbitrary Timing (Trigger)

Starts measurement at an arbitrary timing. A trigger is the function that controls the measurement

start timing with specic signals. The following items are the two types of trigger that can be set for

the instrument.

Internal trigger

External trigger

Measurement is repeated automatically. (Trigger signals are automatically generated internally.)

Measurements are triggered by an external signal. The trigger is controlled by the EXT I/O, interface, or manual setting ([TRIG]).

Press [SETUP].

Press the [BASIC] tab.

Press [TRIG].

Select the trigger type.

[INT] Internal trigger

[EXT] External trigger

LCR Function

Press [EXIT] to close the advanced settings

screen.

When EXT is selected

The following items are the three types of input method for a trigger.

Press [TRIG] on the screen to manually input a trigger.

Measurement is performed once.

If measurement takes a long time, [TRIG] may be displayed as [STOP]. In this case, measurement can be suspended by pressing [STOP].

Input via EXT I/O.

Measurement is performed once, each time a negative logic pulse signal is applied. Refer to “8.1 External Input/Output Connector and Signals” (p. 199).

Input from interface.

Measurement is performed once when Refer to Communication Commands included on Impedance Analyzer Application Disc.

*TRG

is transmitted.

Setting Basic Settings of Measurement Conditions

HIOKI IM7585A981-05

3.2.3 Setting the Delay Time from Trigger to Measurement Start (Trigger Delay)

The delay time period from input of the trigger signal to measurement (delay time) can be set. With this function, it is possible to ensure that measurement is started after the connection condition

of the object to be tested and the test probe (xture) has stabilized.

Refer to “8.1 External Input/Output Connector and Signals” (p. 199).

Trigger delay: OFF Trigger delay: ON

TRIG

EOM

INDEX

Signal

Measurement Calculation

Even when the trigger delay is being used, the LED for indicating that measurement is in progress is lit.

TRIG

EOM

INDEX

Signal

Press [SETUP].

Measurement Calculation

Trigger delay

Press the [BASIC] tab.

Press [DELAY].

The numeric keypad can be used for input.

Set the delay time with / or the numeric

keypad.

(With the numeric keypad, press [SET].)

Settable range 0.00000 s to 9.99999 s

Resolution 10 µs

[C]

Press [EXIT] to close the trigger delay setting

screen.

Press [EXIT] to close the advanced settings

screen.

The delay time becomes 0 s and this function is disabled.

Setting Basic Settings of Measurement Conditions

HIOKI IM7585A981-05

3.2.4 Applying the Signal to the Sample during Measurement Only (Trigger Synchronous Output)

This function outputs the measurement signal after the trigger input and applies the signal only to the sample during measurement. You can also set a delay time to ensure that data is acquired after the sample stabilizes. This reduces the generation of heat in the sample and decreases electrode wear. Output of INDEX signals for switching to the next sample can be delayed till after the measurement signal is completely OFF (0 V) after measurement has been completed (INDEX delay).

Trigger synchronous output: OFF Trigger synchronous output: ON

TRIG

EOM

INDEX

Signal

Measurement Calculation

TRIG

EOM

INDEX

Signal

Synchronous

signal wait

Press [SETUP].

Press the [BASIC] tab.

Press [SYNC].

LCR Function

INDEX delay

Measurement Calculation

4 5

Press [SYNC].

Select

output.

[OFF] Disables the trigger synchronous output.

[ON] Enables the trigger synchronous output.

Go to the next page.

[OFF] or [ON]

for the trigger synchronous

Setting Basic Settings of Measurement Conditions

HIOKI IM7585A981-05

Wait time

INDEX time

Use / to set the wait time (time to stabilize)

from the time a measurement signal has been output by applying a trigger to the start of the measurement.

(With the numeric keypad, press [SET].)

Settable range 0.00000 s to 9.99999 s

The numeric keypad can be used for input.

• When the trigger synchronous output function is set to [ON], the measurement time increases due to the addition of a wait time between output of the measurement signal and data acquisition. Refer to “(3) Measurement Time” (p. 283).

• If a measurement condition is changed when the trigger synchronous output function is set to [ON], a measurement signal of the set level may be output momentarily.

• The measurement signal is output when the trigger signal is input and stops after measurement ends.

• In CONTINUOUS measurement mode, the measurement condition is set as the setting of the initial pulse after measurement of the last panel is completed. If the trigger synchronous function is set to [ON] for the initial panel, the measurement signal stops.

[C]

Set the INDEX delay time.

(With the numeric keypad, press [SET].)

Settable range 0.00000 s to 0.10000 s

Press [EXIT] to close the trigger synchronous output setting screen.

Press [EXIT] to close the advanced settings screen.

Sets to the default value. (The time is set to 0.001 s.)

Trigger delay: ON Trigger synchronous output: ON

TRIG

EOM

INDEX

Signal

Trigger delay Synchronous signal wait INDEX delay

Measurement Calculation

Setting Basic Settings of Measurement Conditions

HIOKI IM7585A981-05

3.2.5 Setting the Measurement Frequency

Sets the frequency of the signal applied to the test sample. The measurement value of the measurement frequency level may change according to the sample tested.

Press [SETUP].

Press the [BASIC] tab.

Press [FREQ].

LCR Function

When setting with / (each digit)

The input method can be switched between [DIGIT] and [10-KEY].

To set the frequency with the numeric keypad

Set the frequency with / or the numeric

keypad.

Settable range:

IM7580A 1.0000 MHz to 300.00 MHz

IM7581 100.00 kHz to 300.00 MHz

IM7583 1.0 MHz to 600.0 MHz

IM7585 1.0 MHz to 1.3000 GHz

IM7587 1.0 MHz to 3.0000 GHz

When setting with / (each digit)

Holding down / changes the value continuously.

[×10] Sets the measurement frequency to 10×.

[/10] Sets the measurement frequency to

1/10×.

To set the frequency with the numeric keypad

Changing the unit: G (giga)/M (mega)/k (kilo)

[C] Repeats the input.

• The unit keys are enabled if a numerical value is input.

• The frequency is set on when any unit key is pressed

• If the setting exceeds the maximum frequency: The maximum frequency will be set automatically.

• If the setting is below the minimum frequency: The minimum frequency will be set automatically.

Press [EXIT] to close the measurement frequency

setting screen.

Press [EXIT] to close the advanced settings

screen.

Setting Basic Settings of Measurement Conditions

HIOKI IM7585A981-05

3.2.6 Setting the Measurement Signal Level

Sets the measurement signal level. The value of the measurement signal level may change based on the sample tested. This instrument can set the test signal applied to the object to be tested using the following three methods.

Power (P) mode

Voltage (V) mode

Current (I) mode

• The setting resolution of the signal level is always 0.1 dB irrespective of the setting signal mode. When the level is set in the voltage or current mode, the input values are automatically converted to the setting value with a resolution of 0.1 dB.

• The measurement accuracy varies according to the measurement signal level. Refer to “Measurement range” (p. 277).

Sets the measurement signal level with the power (dBm) at the DUT port 50

Sets the measurement signal level with the voltage (V) when the DUT port is open. (value of dBm converted into V)

Sets the measurement signal level with the current (A) when the DUT port is in a short circuit state. (value of dBm converted into I)

terminal.

Press [SETUP].

4 5

Press the [BASIC] tab.

Press [LEVEL].

Press [P/V/I].

Select the signal setting mode.

[POWER] Sets with power (dBm).

[V] Sets with voltage (V).

[I] Sets with current (A).

Go to the next page.

Setting Basic Settings of Measurement Conditions

HIOKI IM7585A981-05

The numeric keypad can be used for input.

Set the voltage or current with

keypad.

Measurement signal mode

Power (P) mode IM7580A,

Voltage (V) mode IM7580A,

Current (I) mode IM7580A,

(With the numeric pad, press [dBm].)

Model Settable range

IM7581

IM7583, IM7585, IM7587

IM7581

IM7583, IM7585, IM7587

IM7581

IM7583, IM7585, IM7587

[C]

Repeats the input.

or the numeric

/

-40.0 dBm to +7.0 dBm (Resolution: 0.1 dB)

-40.0 dBm to +1.0 dBm (Resolution: 0.1 dB)

4 mV to 1001 mV

4 mV to 502 mV

0.09 mA to 20.02 mA

0.09 mA to 10.04 mA

LCR Function

Press [EXIT] to close the measurement signal level

setting screen.

Press [EXIT] to close the advanced settings

screen.

When a measurement value is outside the guaranteed accuracy range, REF VAL is displayed in the error display area. Check the guaranteed accuracy range and change the measurement conditions or consider the measurement values as values for reference. Refer to “Measurement range” (p. 277).

Relationship between the setting values of the measurement signal mode

The relations between the power mode value and the voltage mode value and between the power mode value and the current mode value are expressed by the following formulas:

VW= × ×2 50( )Ω

DBM

= × ÷×

210 1000 50

IW= × ÷2 50( )Ω

DBM

= × ÷÷

210 1000 50

Ω

()

Ω

()

DBM

Voltage

Current

Power (dBm) settings value

Setting Basic Settings of Measurement Conditions

HIOKI IM7585A981-05

3.2.7 Setting the Measurement Speed

Changes the measurement time. Setting the measurement speed to [FAST] enables high speed measurement. Setting to [SLOW2] enables measurement with high accuracy.

• Perform calibration and compensation again if there is a change in the measurement speed. Refer to “5 Calibration and Compensation” (p. 141).

• The measurement time varies with the measurement conditions. Refer to “(3) Measurement Time” (p. 283).

Press [SETUP].

Press the [BASIC] tab.

Press [SPEED].

Select the measurement speed.

[FAST] Performs high-speed measurement.

[MED] Performs normal-speed measurement.

[SLOW] Increases measurement accuracy.

[SLOW2] Measurement accuracy is better than

SLOW.

Press [EXIT] to close the measurement speed

setting screen.

Press [EXIT] to close the advanced settings

screen.

Setting Basic Settings of Measurement Conditions

HIOKI IM7585A981-05

3.2.8 Display with Average Values (Average)

The measurement values can be averaged using the averaging function. The variations in the displayed measurement values can be reduced with this function.

The measurement values are always the moving average from

Internal trigger

present to before the number of times of averaging. (When the sample to be tested is changed, it takes time for the values to stabilize and the results are reliable.)

External trigger

It is the arithmetic mean of the number of times of averaging from the trigger input.

When averaging is executed 4 times, the number of measurements, measurement output points, and measurement value calculation method during output are as follows.

Moving average

Measurement points

M1 M2 M3 M4 M5 M6

Measurement output values

Time

M1+M2

M1+M2+M3

M7 M8 M9 M10

M4+M5+M6+M74M5+M6+M7+M84M6+M7+M8+M94M7+M8+M9+M10

M1+M2+M3+M44M2+M3+M4+M54M3+M4+M5+M6

LCR Function

Arithmetic mean

Measurement points

M1 M2 M3 M4 M5 M6 M7 M8 M9

M5+M6+M7+M8

Measurement output values

Time

M1+M2+M3+M4

M10

Setting Basic Settings of Measurement Conditions

HIOKI IM7585A981-05

Press [SETUP].

Press the [BASIC] tab.

Press [AVG].

/ to enter the averaging number of times.

Use



Settable range 1 to 256 times

[C] Setting is turned OFF.

Press [EXIT] to close the average setting screen.

Press [EXIT] to close the advanced settings

screen.

Judging Measurement Results

HIOKI IM7585A981-05

3.3 Judging Measurement Results

The judgment results are displayed after the measurement results are compared to an arbitrarily set reference. This function is useful for processes such as shipping inspection. This includes the comparator function to make pass/fail judgments (HI/IN/LO) of measurement values with one judgment standard, and the BIN function to classify (rank) measurement values based on several judgment standards (up to 10).

L_COMP.png

LCR Function

One of the following 3 judgment methods can be used.

Setting the upper and lower limit values (ABS) (p. 48)

Upper limit

Lower limit

Percent (%) setting (p. 49)

Upper limit value [%]

Reference value

Lower limit value [%]

Setting the upper limit and lower limit values for the measurement parameters. The measurement values display the measurement parameter values without any changes.

Enter reference values and set the difference between the upper limit and the reference value, and between the lower limit and the reference value as a ratio (percentage) relative to the reference value. The measurement values display the measurement parameter values without any changes.

Deviation percent (∆%)*2 setting (p. 51)

Upper limit value

[∆%]

Reference value

Lower limit value

[∆%]

The measurement values display the deviations (∆%) from the

reference value.

*1 The following formula is used to calculate the comparison upper limit value and comparison lower limit

value. (For the comparison lower limit value, if a value that is lower compared to the reference value is set, a minus (-) sign is required for the percentage setting value.)

Percentage setting value

Upper limit comparison value (Lower limit comparison value) = reference value + |reference value| ×

100

Judging Measurement Results

HIOKI IM7585A981-05

*2 The ∆% value is calculated using the following formula:

measurement value - reference value

∆% = × 100

| reference value|

3.3.1 Setting the Judgment Mode

Judgment results can be checked by acquiring the results of beep sounds, screen display, I/O output, and communication commands.

Press [SETUP].

Press the [ADVANCED] tab.

Press [JUDGE].

5 6

7 8

Select the judgment mode.

[OFF] Disables the comparator and BIN function.

[COMP] Enables comparator judgment. (p. 46)

[BIN] Enables BIN judgment. (p. 53)

When a measurement value is outside the

guaranteed accuracy range, set the method to judge the measurement value.

Judges the measurement value even when

[DO]

[NOT]

Sets the beep sounds for judgment results.

[OFF] Beeps are disabled.

the measurement values are outside the guaranteed accuracy range.

Outputs an error for HI judgment when a measurement value is outside the guaranteed accuracy range.

[IN] Beeps if all the judgment results are IN.

[NG]

Set the beep tone with /.

Settable range 0 to 14

Beeps even if one of the judgment results is LO or HI.

Judging Measurement Results

HIOKI IM7585A981-05

Set the beep volume with /.

Settable range 1 to 3

Press [EXIT] to close the judgment settings

screen.

Press [EXIT] to close the advanced settings

screen.

LCR Function

Judging Measurement Results

HIOKI IM7585A981-05

3.3.2 Judging with Upper and Lower Limit Values (Comparator Judgment Mode)

This mode judges if the measurement results are within the specied range.

The comparator judgment allows you to do the following things.

• Preset a judgment reference with a reference value or upper and lower limit values, and display the judgment result as HI (higher than the upper limit value), IN (within the range set for the upper and lower limit values), or LO (lower than the lower limit value).

• Output the judgment results to an external device (via the EXT I/O connector).

• Judges up to four parameters with different settings.

• Beeps to notify judgment results. Refer to “3.3.1 Setting the Judgment Mode” (p. 44).

Measurement value > upper limit

Upper limit value ≥ measurement value ≥

lower limit value

Comparator judgment order

Judgment

order

• When the measurement value is MEAS ERR

4 In case of other than 1, 2 or 3 IN

• Outside the guaranteed accuracy range (Judgment for a value outside the guaranteed accuracy range is [NOT])

When judging if the measurement value is higher than the lower limit value, and the judgment is Fail.

When judging if the measurement value is lower than the upper limit value, and the judgment is Fail.

Measurement value < lower limit

If reference standards have not been set

- - -

Condition Judgment display

• If measurement values are outside the guaranteed accuracy range (REF VAL), judgment is performed in order of judgment when the setting of [JUDGE EXEC] is [DO]. If [NOT], judgment is not performed and HI judgment is returned.

• If you interchange the upper limit and lower limit values an error message will not be displayed because the upper and lower limit values are not compared.

Judging Measurement Results

HIOKI IM7585A981-05

• A comparator judgment can be used even if only the upper or lower limit value has been set.

When only an upper limit value

has been set

Upper limit value

When only a lower limit value

has been set

Lower limit value

LCR Function

Judging Measurement Results

HIOKI IM7585A981-05

Upper and lower limit values mode

This mode performs judgment with the upper and lower limits (ABS) that have been set.

Press [LMT].

Press [MODE].

Press [ABS].

Press [HI].

Changing the unit:

a/ f/ p/ n/ µ/ m/ None/ k/ M/ G

Set the upper limit value with the numeric pad and

press [SET].

Settable range -9.99999 G to 9.99999 G

[-] Enters a minus (-) sign.

] Increases the prex of the unit.

[×10

/103]

[

[OFF] No value is set.

[C] Repeats the input.

[CANCEL] Cancels the setting.

Press

[LO]

Set the lower limit value with the numeric pad and press [SET].

Settable range -9.99999 G to 9.99999 G

Press [EXIT] to close the setting screen.

Decreases the prex of the unit.

Judging Measurement Results

HIOKI IM7585A981-05

Percent mode

Each of the differences between the upper limit and the reference value and between the lower limit and the reference value is set as a ratio (percentage) relative to the reference value, and the measurement values are judged whether they are within the range of the upper and lower limit values.

The set reference value and upper and lower limit values are common for percentage mode and deviation percentage mode.

Press [LMT].

Changing the unit: a/ f/ p/ n/ µ/ m/ None/ k/ M/ G

Press [MODE].

Press [%].

Press [REF].

Set the reference value with the numeric pad and

press [SET].

Settable range -9.99999 G to 9.99999 G

[-] Enters a minus (-) sign.

] Increases the prex of the unit.

[×10

/103]

[

[OFF] No value is set.

[C] Repeats the input.

[CANCEL] Cancels the setting.

Decreases the prex of the unit.

LCR Function

Press [HI].

Upper limit comparison value (Lower limit comparison value)

Set the upper limit value with the numeric pad and

press [SET].

Sets the upper limit value as a percentage relative to the reference value.

Settable range -999.999 % to +999.999 %

The actual internal operation consists of calculating the comparison upper-limit value using the formula given below, and comparing it to the measurement value to enable a decision to be made.

= reference value + |reference value| ×

Go to the next page.

Percentage setting value

100

Judging Measurement Results

HIOKI IM7585A981-05

Press [LO].

Lower limit comparison value = reference value + |reference value|

Set the lower limit value with the numeric pad and

press [SET].

Set the lower limit value as a percentage relative to the reference value.

Settable range -999.999% to 999.999%

The actual internal operation calculates the lower limit comparison value with the following formula, and when a value lower than the reference value is set, the minus (-) sign is required for the percentage setting value.

Press [EXIT] to close the setting screen.

Percentage setting value

100

Judging Measurement Results

HIOKI IM7585A981-05

∆% mode

In the deviation percentage mode, the measurement values display the deviations (∆%) from the

reference value.

The ∆% value is calculated using the following formula:

measurement value - reference value

∆% =

The set reference value and upper and lower limit values are common for percentage mode and deviation percentage mode.

|reference value|

× 100

Press [LMT].

LCR Function

Press [MODE].

Press [∆%].

Judging Measurement Results

HIOKI IM7585A981-05

Press [REF].

Changing the unit: a/ f/ p/ n/ µ/ m/ None/ k/ M/ G

Set the reference value with the numeric pad and

press [SET].

Settable range -9.99999 G to 9.99999 G

[-] Enters a minus (-) sign.

] Increases the prex of the unit.

[×10

/103]

[

[OFF] No value is set.

[C] Repeats the input.

[CANCEL] Cancels the setting.

Press [HI].

Set the upper limit value with the numeric pad and

press [SET].

Settable range -999.999% to 999.999%

Press [LO].

Set the lower limit value with the numeric pad and

press [SET].

Decreases the prex of the unit.

Settable range -999.999% to 999.999%

Press [EXIT] to close the setting screen.

Judging Measurement Results

HIOKI IM7585A981-05

3.3.3 Classifying Measurement Results (BIN Judgment)

Set the upper and lower limit values for 4 parameters and display up to 10 classications of

judgment results. You can also output the judgment results to an external device. Select the BIN judgment mode before setting the judgment conditions (p. 44).

In case of BIN judgment

BIN

When BIN is not set

- - -

OUT

When not matching any BIN

BIN judgment order: Starts with the judgment of the rst parameter for BIN1 and proceeds in order to BIN10, as described below. The instrument will display the rst BIN number for which the

measurement value is judged to be within the set judgment standard. If none of the BIN judgments are within the set judgment standard, [OUT] will be displayed.

Judgment BIN number

BIN1

BIN2

BIN3

BIN10

First parameter

Judgment

OUT

Judgment

OUT

Judgment BIN3Judgment Judgment Judgment

Judgment

OUT

Second parameter

IN IN IN IN

OUT

IN IN IN IN

OUT

IN IN IN IN

OUT OUT

Third parameter Fourth parameter

OUT

LCR Function

BIN judgment results

BIN1Judgment Judgment Judgment

BIN2Judgment Judgment Judgment

BIN10Judgment Judgment Judgment

OUT

BIN1 BIN2 BIN3 BIN4 BIN5 BIN10

The measurement elements can be ranked by setting a series of judgment standards from severe to lenient as shown in the following diagram.

• For more information about HI/IN/LO judgment procedures, refer to p. 46.

• Set the upper/lower limit values to [OFF] for BIN numbers not requiring BIN judgments.

• BIN judgment can be used even if only the

Judgment

upper or lower limit value has been set. (See

the following gure.)

When only an upper

limit value has been set

When only a lower limit

value has been set

standard range

Upper limit value

Lower limit value

Judging Measurement Results

HIOKI IM7585A981-05

Upper and lower limit values mode

This mode performs judgment with the set upper and lower limits (ABS).

Press [LMT].

Press [Z].

The key display differs depending on the measurement parameter.

Press [MODE].

Press [ABS].

Press [EXIT] to return to the BIN setting screen.

Display the BIN number to be set with / or by

scrolling.

Press the part corresponding to HI of the rst

parameter.

Use the numeric keypad to set the upper limit

value of the rst parameter and press [SET].

Settable range -9.99999 G to 9.99999 G

[-] Enters a minus (-) sign.

] Increases the prex of the unit.

[×10

/103]

[

[OFF] No value is set.

[C] Repeats the input.

[CANCEL] Cancels the setting.

Press the part corresponding to LO of the rst

parameter.

Use the numeric keypad to set the lower limit

value and press [SET].

Decreases the prex of the unit.

Changing the unit: a/ f/ p/ n/ µ/ m/ None/ k/ M/ G

Settable range -9.99999 G to 9.99999 G

The screen returns to the state in step 4.

Set the upper and lower limit values of the second

to fourth parameters, and press [SET].

Press [EXIT] to close the setting screen.

Judging Measurement Results

HIOKI IM7585A981-05

Percent mode

Press [LMT].

Press [Z].

The key display differs depending on the measurement parameter.

Press [MODE].

Press [%].

The key display differs depending on the measurement parameter.

LCR Function

Press [EXIT].

Press [REF].

Set the reference value with the numeric pad and

press [SET].

Settable range -9.99999 G to 9.99999 G

[-] Enters a minus (-) sign.

] Increases the prex of the unit.

[×10

/103]

[

[OFF] No value is set.

[C] Repeats the input.

[CANCEL] Cancels the setting.

Press [EXIT].

Display the BIN number to be set with / or by

scrolling.

Press the part corresponding to HI of the rst

parameter.

Decreases the prex of the unit.

Go to the next page.

Judging Measurement Results

HIOKI IM7585A981-05

Use the numeric keypad to set the upper limit

value of the rst parameter and press [SET].

Settable range -999.999% to 999.999%

Press the part corresponding to LO of the rst

parameter.

Use the numeric keypad to set the lower limit

value and press [SET].

Settable range -999.999% to 999.999%

The screen returns to the state in step 7.

Set the upper and lower limit values of the second

to fourth parameters, and press [SET].

Press [EXIT] to close the setting screen.

Judging Measurement Results

HIOKI IM7585A981-05

∆% mode

The set reference value and upper and lower limit values are common for percentage mode and deviation percentage mode.

Press [LMT].

Press [Z].

The key display differs depending on the measurement parameter.

Press [MODE].

LCR Function

Press [∆%].

The key display differs depending on the measurement parameter.

Press [EXIT].

Press [REF].

Set the reference value with the numeric pad and

press [SET].

Settable range -9.99999 G to 9.99999 G

[-] Enters a minus (-) sign.

] Increases the prex of the unit.

[×10

/103]

[

[OFF] No value is set.

[C] Repeats the input.

[CANCEL] Cancels the setting.

Decreases the prex of the unit.

Press [EXIT].

Go to the next page.

Judging Measurement Results

HIOKI IM7585A981-05

Display the BIN number to be set with / or by

scrolling.

Press the part corresponding to HI of the rst

parameter.

Use the numeric keypad to set the upper limit

value of the rst parameter and press [SET].

Settable range -999.999% to 999.999%

Press the part corresponding to LO of the rst

parameter.

Use the numeric keypad to set the lower limit

value and press [SET].

Settable range -999.999% to 999.999%

The screen returns to the state in step 7.

Set the upper and lower limit values of the second

to fourth parameters, and press [SET].

Press [EXIT] to close the setting screen.

HIOKI IM7585A981-05

Analyzer Function

4.1 Analyzer Function

The analyzer function allows you to perform measurement while sweeping the measurement frequency and signal level. The measurement results can be displayed as a graph or numerical value. This function is used for measuring frequency characteristics and level characteristics.

You can check the measurement result of each sweep point.

Analyzer Function

Displays the measurement results in a graph. Use this function for measuring frequency characteristics and level characteristics.

• Conditions set by the analyzer function are not transferred to the LCR function.

• When the power is turned on again, the display will be in accordance with the measurement mode used before the power was turned off.

Analyzer Function

HIOKI IM7585A981-05

4.1.1 Flowchart

ANALYZER measurement

START

Set the MODE to ANALYZER

Measurement parameter settings

Sweep parameter settings

Other basic settings

(DELAY, SYNC, TRIG)

Settings of sweep points

Necessary settings

Calibration/Compensation

Graph display settings

Contact check settings

Judgment settings

Equivalent analysis circuit settings

Common Settings

Measurement

Read measurement value with CURSOR

User-dened settings

Read measurement value with SEARCH

END

Judgment settings

JUDGE ?

AREA PEAK

SEGMENT ?

HIOKI IM7585A981-05

Analyzer Function

Judgment settings

Settings of JUDGE

Select target parameters

Settings of AREA Settings of PEAK area SPOT setting

Settings sweep points

OFF

AREA SPOT

JUDGE ?

PEAK

END

Settings of sweep points

Settings of SEGMENT

SEGMENT ?

Analyzer Function

Interval

QUICK EDIT

Sweep range number, sweep count,

basic measurement settings

Measurement settings for each point

Sweep range of segment, sweep

count, basic settings

END

Interval, basic measurement settings

Analyzer Function

HIOKI IM7585A981-05

4.1.2 Screen map

Measurement mode setting screen (p. 25)

System settings screen (p. 235)

Trigger (p. 68)

Advanced settings screen (p. 67)

Compensation settings screen

(p. 141)

[CAL] Calibration p. 145

[Rdc LIMIT]

[LENGTH]

[COMPEN] Compensation p. 155

[Rdc LIMIT] DC measurement limit value

[SCALE] Scaling p. 160

DC measurement limit value

Electrical length compensation

p. 152

p. 154

p. 159

Select an interface.

The version of the instrument can be veried. (p. 236)

(p. 235)

Save settings screen

(p. 247)

[SETUP] Sets [SAVE] p. 247

[SAVE]

[LOAD] Reads setting conditions p. 265

[FORMAT]

[DELETE]

[FOLDER]

[RENANE]

[SELECT]

[BACK]

Saves the setting conditions

Formats USB ash drive p. 269

Deletes les p. 273

Creates folders p. 270

Changes le names p. 271

Selects les p. 265

Displays the previous screen

p. 247

Self-checks (self-diagnosis) are enabled. (p. 237) The date and time can be set for the

instrument. (p. 242)

Advanced

HIOKI IM7585A981-05

settings screen (p. 67)

Analyzer Function

[PARA] Parameter p. 67

[SOURCE] Sweep Parameter p. 72

[DELAY] Trigger delay p. 69

[SYNC] Trigger synchronous output p. 70

[TRIG] Trigger p. 68

[TIMING]

[Hi Z] Hi Z reject function p. 176

[LEV CHECK]

Settings of sweep points (p. 74)

Contact check (DC measurement)

Monitoring function for detection level

p. 171

p. 177

Search function setting (p. 108)

Equivalent analysis circuit setting (p. 125)

[DIGIT]

[COM MEAS]

[IO JUDGE] I/O output of judgment result p. 221

[IO TRIG] I/O trigger p. 219

[IO EOM] EOM output method p. 222

[MEMORY] Saving measurement results p. 262

[DISP] LCD display p. 184

[BEEP KEY] Beep sound p. 188

[COM FORM]

[KEYLOCK] Key lock p. 190

[WARM UP] Warm-up notication function p. 189

[PANEL] Panel loading and saving p. 227

[RESET] Initializing p. 196

Number of display digits for each parameter

Setting for communication command “

Communication measurement data type

:MEASURE?

”

p. 179

p. 181

p. 194

Analyzer Function

HIOKI IM7585A981-05

4.1.3 Measurement screen

Displays the measurement value at the cursor position.

Executes a search. (p. 104)Sets the cursor. (p. 102)

Moves the cursor.

Moves the cursor to

[]

the left by ten points.

Moves the cursor to

[]

the left by one point.

Moves the cursor to

[]

the right by one point.

Moves the cursor to the right by ten

[]

points.

Indicates the maximum and minimum values of the vertical axis of the graph.

Displays the Rdc value. (p. 171)

[DISP] Selects the type of graph to display. (p. 65)

[GRAPH] Sets scaling of the graph, etc. (p. 92)

[CIRCUIT] Performs equivalent circuit analysis. (p. 126)

[SCALE] Performs auto-scaling for the vertical axis.

[SAVE]

[TRIG]

Saves the measurement data or screen.

This is displayed when a USB ash drive is connected.

Starts measurement. This is displayed when the setting of trigger is [SEQ] or [STEP].

4.1.4 Types of graph

Sweep graph

All of the rst through fourth

parameters

Sweep graph 1 First parameter

Sweep graph 2

Second parameter

Sweep graph 3

Third parameter

Sweep graph 4

Fourth parameter

XY graph

X axis: rst parameter

Y axis: second parameter

XY graph 1

X axis: rst parameter

Y axis: second parameter

XY graph 2

X axis: third parameter

Y axis: fourth parameter

Sweep graph 1

First, and second parameters

Sweep graph 2

Third, and fourth parameters

XY graph 1

X axis: rst parameter

Y axis: second parameter

XY graph 2 X axis: third parameter Y axis: fourth parameter

HIOKI IM7585A981-05

[DISP] on the measurement screen allows you to select the displayed graph.

[1 GRAPH] [4 GRAPHs]

Overall comparator judgment result

[1 X-Y] [2 X-Ys]

Analyzer Function

Overall comparator judgment result

[MULTI] [SPOT]

Overall comparator judgment result

Analyzer Function

[NUMERIC] [PEAK] (p. 116)

Overall comparator judgment result

Analyzer Function

HIOKI IM7585A981-05

4.1.5 Status and error display of this instrument

1 2 3 4

8765

Displays the current measurement mode.

LCR function

Analyzer function

Continuous measurement function

Displays error messages.

Outside guaranteed accuracy

Hi Z reject error

Error in detection level

Displays information saved in the internal

memory.

Number of memories saved in the internal memory

When the instrument memory becomes full

Displays the state of calibration/

compensation.

AC measurement

Calibration disabled

Calibration

Calibration enabled

Compensation

DC measurement

Calibration

Compensation

Displays the connection status of the USB

ash drive.

disabled

Compensation enabled

Calibration disabled

Calibration enabled

Compensation disabled

Compensation enabled

Displays the type of interface that is

currently connected.

RS-232C

GP-IB

USB

LAN

(Blue)

(Red)

Displays the communication state.

Displays the date and time set for the instrument.

USB ash drive is

connected

USB ash drive is being

accessed

During communication control

Local

Setting Basic Settings of Measurement

First parameter

Second parameter

Fourth parameter

Third parameter

HIOKI IM7585A981-05

4.2 Setting Basic Settings of Measurement

4.2.1 Setting the Measurement Parameters

Select measurement display parameters.

ANALYZER mode allows four types of parameter measurements; rst to fourth parameters.

To display phase angles relative to admittance Y, use the scaling settings to multiply the impedance phase angle θ by -1. Refer to “5.4 Calculating Values (Scaling)” (p. 160)

Parameter Contents

[Z] Impedance (

[Y] Admittance (S)

[θ]

[Rs] Effective resistance = ESR (

[Rp] Effective resistance (

[Cs] Static capacitance (F) (series

[Cp] Static capacitance (F) (parallel

[D] Loss coefcient = tan

Impedance phase angle (°)

equivalent circuit)

equivalent circuit mode)

)

) (series

) (parallel

Parameter Contents

[G] Conductance (S)

[X] Reactance (

[Ls] Inductance (H) (series equivalent

circuit)

[Lp] Inductance (H) (parallel equivalent

circuit mode)

[Q] Q factor

[B] Susceptance (S)

[V] monitor voltage (V)

[I] monitor current (A)

[OFF] No display

Press [SETUP].

Press the [SWEEP] tab.

)

Analyzer Function

Press [PARA].

Press the parameter key that you want to set.

Set [PARA1] to [Rs] (effective resistance in series equivalent circuit mode = ESR [

]) and [PARA2] to [X] (reactance [Ω]).

[COLE-COLE]

[GB-CURVE]

Press [EXIT] to close the setting screen.

Reverse the Y-axis. Set X-Y display autoscaling to [SAME]. Also [PARA3] and [PARA4] can be set.

Set [PARA1] to [G] (conductance [S]) and [PARA2] to [B] (susceptance [S]). Set X-Y display auto-scaling to [SAME]. Also [PARA3] and [PARA4] can be set.

Setting Basic Settings of Measurement

HIOKI IM7585A981-05

4.2.2 Starting Measurement at Any Arbitrary Timing (Trigger)

Sets the triggers. The following items are the three types of trigger that can be set for the instrument. Refer to Step 4 for details on each trigger.

• Sequential sweep

• Repeat sweep

• Step sweep

The trigger setting that is set here differs from the trigger setting of LCR mode. (It does not impact the trigger setting of LCR mode.)

Press [SETUP].

Press the [SWEEP] tab.

Press [TRIG].

Select the trigger type.

Performs a sequential sweep.

[SEQ]

[REPEAT]

[STEP]

Press [EXIT] to close the setting screen.

When an external trigger is input, sweep measurement is performed only once.

Performs repeated sweeps. Performs repeated sweeps with an internal trigger.

Performs a step sweep. When an external trigger is input, measurement is performed at the current measurement point and then the process moves to the next measurement point.

When trigger is set to [SEQ] or [STEP]

• [TRIG] is displayed on the measurement screen.

• Each time you press [TRIG], a sequential sweep or step sweep is performed.

Setting Basic Settings of Measurement

HIOKI IM7585A981-05

4.2.3 Setting the Delay Time from Trigger to Measurement Start (Trigger Delay)

Set the delay time from when a trigger is input until measurement starts.

Trigger delay: OFF Trigger delay: ON

――― ―

TRIG

―――

EOM

―― ―― ―

INDEX

Signal

External trigger

Measurement Calculation

Measurement of sweep point 1

Measurement of sweep point 2

――― ―

TRIG

―――

EOM

―― ―― ―

INDEX

Signal

Press [SETUP].

Trigger delay

Measurement of sweep point 3

Measurement Calculation

: Trigger delay : Point delay

Measurement of the last sweep point

Measurement complete

Analyzer Function

The numeric keypad can be used for input.

Press the [SWEEP] tab.

Press [DELAY].

Set the delay time with / or with the numeric

keypad.

(With the numeric keypad, press [SET].)

Settable range 0.00000 s to 9.99999 s with resolution 10

[C]

Press [EXIT] to close the setting screen.

• Disables this function.

• The set time is set to 0 s.

When a trigger delay is set, the LED for indicating that measurement is in progress is lit from the time a trigger is input until the measurement ends.

Setting Basic Settings of Measurement

HIOKI IM7585A981-05

4.2.4 Applying the Signal to the Sample during Measurement Only (Trigger Synchronous Output)

This function enables the measurement signal to be output for only the initial sweep point after measurement is triggered, so that the signal is applied to the sample during measurement only. You can also set a delay time to ensure that data is acquired after the sample stabilizes. This reduces the generation of heat in the sample and decreases electrode wear.

Trigger synchronous output: OFF Trigger synchronous output: ON

――― ―

TRIG

―――

EOM

―― ―― ―

INDEX

――― ―

TRIG

―――

EOM

―― ―― ―

INDEX

Signal

4 5

Measurement Calculation

Signal

Synchronous signal wait

Press [SETUP].

Press the [SWEEP] tab.

Press [SYNC].

INDEX delay

Measurement Calculation

Select

output.

[OFF] Disables the trigger synchronous output.

[ON] Enables the trigger synchronous output.

Go to the next page.

[OFF] or [ON]

for the trigger synchronous

HIOKI IM7585A981-05

Wait time

Setting Basic Settings of Measurement

Use / or the numeric keypad to set the

wait time (time to stabilize) from the time a measurement signal has been output by applying a trigger to the start of the next measurement.

(With the numeric keypad, press [SET].)

INDEX time

The numeric keypad can be used for input.

• When the trigger synchronous output function is set to [ON], the measurement time will increase due to the incorporation of a wait time between output of the measurement signal and data acquisition. Refer to “(3) Measurement Time” (p. 283).

• When the trigger synchronous output function is set to [ON], the set level may be output momentarily if a measurement condition is changed.

• The measurement signal is output when the trigger signal is input and stops after measurement ends.

• In CONTINUOUS measurement mode, the initial pulse is set after measurement of the last panel ends. If the trigger synchronous function is set to [ON] for the initial panel, the measurement signal stops.

Settable range 0.00000 s to 9.99999 s

[C]

Set the INDEX delay time.

(With the numeric keypad, press [SET].)

Settable range 0.00000 s to 0.10000 s

Press [EXIT] to close the trigger synchronous

output setting screen.

Press [EXIT] to close the setting screen.

Sets to the default value. (The time is set to 0.001 s.)

Analyzer Function

Setting Basic Settings of Measurement

HIOKI IM7585A981-05

4.2.5 Setting the Sweep Parameter

Select sweep parameters. There are four types of parameters that can be set: frequency, measurement signal level (power [P], voltage [V], and current [A]).

CAUTION

Do not switch between P, V, and I while the test sample is still connected to the measurement terminals as this may damage the test sample.

• When the sweep parameter is changed, the comparator setting and sweep points are initialized. Compensation is also disabled. Perform calibration and compensation once again.

• When performing equivalent circuit analysis, set the sweep parameter to the frequency sweep. (p. 125)

Press [SETUP].

Press the [SWEEP] tab.

Press [SOURCE].

Select the sweep parameter.

[FREQ] Performs the frequency sweep.

[POWER]

[V]

[I]

Press [EXIT] to close the setting screen.

Performs measurement signal level (power [P]) sweep.

Performs measurement signal level (voltage [V]) sweep.

Performs measurement signal level (current [A]) sweep.

4.3 Sweep measurement

HIOKI IM7585A981-05

Sets the sweep range and sweep points, and performs sweep measurement.

Types of sweep range

Sweep measurement

START-STOP

Sets the start value and end value of the sweep. Each sweep point is automatically calculated from the number of sweep points.

Start value End value

Number of sweep points

CENTER-SPAN

Sets the center value of the sweep range and the sweep width. Each sweep point is automatically calculated from the number of sweep points.

Center value

Sweep width

START-STEP

Sets the start value of the sweep and the step width of sweep points. Each sweep point is automatically calculated from the number of sweep points.

Start value

Step width

INTVL MEAS

Fixes the sweep parameter and performs measurement at a set time interval.

Time interval

Time

Number of sweep points

Analyzer Function

Sweep measurement

HIOKI IM7585A981-05

4.3.1 Setting the Sweep Method

Select the sweep method.

Normal sweep

Normal interval sweep

(p. 81)

Segment sweep

Segment interval sweep

(p. 84)

What is a segment?

A segment refers to one block for which individual settings such as the sweep range, number of sweep points, and measurement signal level can be set.

Sets the sweep range and number of sweep points, and performs measurement.

(It is also possible to x the sweep parameter and perform “interval

measurement”, which is measurement at a set time intervals.)

Divides the sweep range into ranges called “segments” and performs sweep measurement. (The sweep range, sweep points, and measurement conditions can

be set for each segment. In addition, it is also possible to x the

sweep parameter and perform “interval measurement”, which is measurement at a set time interval.)

Press [SETUP].

Press the [LIST] tab.

Press [SEGMENT].

Select the method of sweep.

[OFF] Normal sweep (normal interval sweep)

(p. 81)

[SEG ON] Segment sweep (p. 84)

[SEG INTVL] Segment interval sweep (p. 84)

Press [EXIT] to close the setting screen.

Setting example for normal sweep and segment sweep

HIOKI IM7585A981-05

Sweep measurement

Sweep setting

items

Sweep parameter Frequency Frequency Frequency Frequency

IM7580A,

Sweep

range

Number of sweep

Setting method for

IM7581

IM7583, IM7585, IM7587

points

sweep points

Measurement

signal type

Measurement

signal level

Average 5 times 10 times 3 times OFF

Measurement

speed

Point delay 0.0005 s 0.0005 s 0.0010 s 0.0000 s

Normal sweep Segment sweep

Segment Segment 1 Segment 2 Segment 3

1.0000 MHz to

300.00 MHz

1.0 MHz to

1.0000 GHz

801 points 201 points 201 points 399 points

Log Log Log Linear

POWER POWER POWER POWER

0.0 dBm 0.0 dBm 1.0 dBm -1.0 dBm

FAST FAST MEDIUM SLOW

1.0000 MHz to

5.0000 MHz

1.0 MHz to 10.0 MHz

10.000 MHz to

50.000 MHz

20.0 MHz to

100.0 MHz

50.000 MHz to

300.00 MHz

100.0 MHz to

1.0000 GHz

Analyzer Function

Normal sweep

Segment sweep

Normal sweep range

Segment 1 Segment 2 Segment 3

Sweep measurement

HIOKI IM7585A981-05

4.3.2 Setting the Sweep Range

Set the sweep range.

• If the sweep parameter is V or I, [CENTER-SPAN] and [START-STEP] cannot be set.

• For segment sweep, only [START-STOP] and [INTVL MEAS] can be set.

• The sweep range settings differ depending on the sweep parameter ([SOURCE]) settings (p. 77).

Example: For normal sweep, set [START-STOP] in the frequency sweep (with [SOURCE] set to

[FREQ]).

Press [SETUP].

4 5

* Each common numeric keypad

Changing the unit: G (giga)/M (mega)/k (kilo)

Press the [LIST] tab.

Press [QUICK EDIT].

Select [START-STOP].

Refer to “Types of sweep range” (p. 73).

(1) Press [START].

(2) Use the numeric keypad* to set the start

value of sweep and press [Hz].

(3) Press [STOP].

(4) Use the numeric keypad* to set the end

value of sweep and press [Hz].

[C] Repeats the input.

[CANCEL] Cancels the setting.

Press [NUM] to set the sweep points.

Press [LOG] to set log calculation for sweep

points.

Press [SET] to conrm the setting.

Sweep range list

HIOKI IM7585A981-05

Sweep measurement

Setting

of sweep

parameters

([SOURCE])

Frequency

[FREQ]

Sweep range

setting

[START-STOP]

Contents of

setting

Start value of sweep

[START]

End value of sweep

[STOP]

Number of sweep points

[NUM]

[LINEAR]

Settable range

IM7580A, IM7581 IM7583, IM7585, IM7587

IM7580A:

1.0000 MHz to 300.00 MHz

M7581:

100.00 kHz to 300.00 MHz

IM7580A:

1.0000 MHz to 300.00 MHz

IM7581:

100.00 kHz to 300.00 MHz

1 to 801

The sweep points are calculated linearly from the setting values of [START], [STOP], and [NUM].

IM7583:

1.0 MHz to 600.0 MHz

IM7585:

1.0 MHz to 1.3000 GHz

IM7587:

1.0 MHz to 3.0000 GHz

IM7583:

1.0 MHz to 600.0 MHz

IM7585:

1.0 MHz to 1.3000 GHz

IM7587:

1.0 MHz to 3.0000 GHz

Analyzer Function

[CENTER-SPAN]

[LOG]

Center value of sweep range

[CENTER]

Sweep width

[SPAN]

Number of sweep points

[NUM]

The sweep points are calculated logarithmically from the setting values of [START], [STOP], and [NUM].

IM7580A:

1.0000 MHz to 300.00 MHz

IM7581:

100.00 kHz to 300.00 MHz

* The setting range of [SPAN] varies according to the frequency to be set.

IM7580A: 0 Hz to 300.00 MHz

IM7581: 0 Hz to 300.00 MHz

* The setting range varies based on the value set in

[CENTER].

1 to 801

IM7583:

1.0 MHz to 600.0 MHz

IM7585:

1.0 MHz to 1.3000 GHz

IM7587:

1.0MHz to 3.0000GHz

IM7583: 0 Hz to 600.0 MHz

IM7585: 0 Hz to 1.3000 GHz

IM7587: 0 MHz to 3.0000 GHz

Sweep measurement

HIOKI IM7585A981-05

Setting

of sweep

parameters

([SOURCE])

Frequency

[FREQ]

Sweep range

setting

[START-STEP]

Contents of

setting

Start value of sweep

[START]

Step width of sweep point

[STEP]

Number of sweep points

[NUM]

Settable range

IM7580A, IM7581 IM7583, IM7585, IM7587

IM7580A:

1.0000 MHz to 300.00 MHz

IM7581:

100.00 kHz to 300.00 MHz

IM7580A: 0 Hz to 300.00 MHz

IM7581: 0 Hz to 300.00 MHz

* The setting range varies based on the value set in

[START] and [NUM].

1 to 801

IM7583:

1.0 MHz to 600.0 MHz

IM7585:

1.0 MHz to 1.3000 GHz

IM7587:

1.0 MHz to 3.0000 GHz

IM7583: 0 Hz to 600.0 MHz

IM7585: 0 Hz to 1.3000 GHz

IM7587: 0 MHz to 3.0000 GHz

Frequency

[FREQ]

[INTVL MEAS]

Start value of sweep

[POINT]

Measurement time interval

[INTERVAL]

Number of measurements

[NUM]

IM7580A:

1.0000 MHz to 300.00 MHz

IM7581:

100.00 kHz to 300.00 MHz

0.00000 s to 1000.00 s

1 to 801

IM7583:

1.0 MHz to 600.0 MHz

IM7585:

1.0 MHz to 1.3000 GHz

IM7587:

1.0 MHz to 3.0000 GHz

Sweep measurement

HIOKI IM7585A981-05

Setting

of sweep

parameters

([SOURCE])

Power

[POWER]

Sweep range

setting

[START-STOP]

[CENTER-SPAN]

Contents of

setting

Start value of sweep

[START]

End value of sweep

[STOP]

Number of sweep points

[NUM]

Center value of sweep range

[CENTER]

Sweep width

[SPAN]

Number of sweep points

[NUM]

Start value of sweep

[START]

Settable range

IM7580A, IM7581 IM7583, IM7585, IM7587

-40.0 dBm to +7.0 dBm -40.0 dBm to +1.0 dBm

1 to 801

* The setting method for sweep points is xed to

[LINEAR].

-40.0 dBm to +7.0 dBm -40.0 dBm to +1.0 dBm

0.0 dB to 1.0 dB * The setting range varies based on the value set in

[CENTER].

1 to 801

-40.0 dBm to +7.0 dBm -40.0 dBm to +1.0 dBm

Analyzer Function

[START-STEP]

[INTVL MEAS]

Step width of sweep point

[STEP]

Number of sweep points

[NUM]

Start value of sweep

[POINT]

Measurement time interval

[INTERVAL]

Number of measurements

[NUM]

0.1 dB to 1.0 dB * The setting range varies based on the value set in

[START] and [NUM].

1 to 801

-40.0 dBm to +7.0 dBm -40.0 dBm to +1.0 dBm

0.00000 s to 1000.00 s

1 to 801

Sweep measurement

HIOKI IM7585A981-05

Setting

of sweep

parameters

([SOURCE])

Voltage [V]

Current [I]

Sweep range

setting

[START-STOP]

[INTVL MEAS]

Contents of

setting

Start value of sweep

[START]

End value of sweep

[STOP]

Number of sweep points

[NUM]

Start value of sweep

[POINT]

Measurement time interval

[INTERVAL]

Number of measurements

[NUM]

Start value of sweep

[START]

Settable range

IM7580A, IM7581 IM7583, IM7585, IM7587

4 mV to 1001 mV 4 mV to 502 mV

1 to 801

* The setting method for sweep points is xed to

[LINEAR].

4 mV to 1001 mV 4 mV to 502 mV

0.00000 s to 1000.00 s

1 to 801 * The measurement interval for INTERVAL measurement

is reected in the point delay time.

0.09 mA to 20.02 mA 0.09 mA to 10.04 mA

[START-STOP]

[INTVL MEAS]

End value of sweep

[STOP]

Number of sweep points

[NUM]

Start value of sweep

[POINT]

Measurement time interval

[INTERVAL]

Number of measurements

[NUM]

0.09 mA to 20.02 mA 0.09 mA to 10.04 mA

1 to 801

* The setting method for sweep points is xed to

[LINEAR].

0.09 mA to 20.02 mA 0.09 mA to 10.04 mA

0.00000 s to 1000.00 s

1 to 801

4.3.3 Normal Sweep

HIOKI IM7585A981-05

Batch setting for normal sweep

Press [SETUP].

Sweep measurement

Press the [LIST] tab.

Press [QUICK EDIT].

Setting the sweep range.

Refer to “4.3.2 Setting the Sweep Range” (p. 76).

Batch setting for measurement conditions.

Refer to “4.4 Set Measurement Conditions for Sweep Points” (p. 87).

Analyzer Function

Press [SET] to conrm the setting.

Sweep measurement

HIOKI IM7585A981-05

Adding sweep points

Press [SETUP].

Press the [LIST] tab.

Move the cursor to the point to be added in the list

of sweep points with / or by scrolling.

To add a sweep points on the next point in the selected row.

Press [ADD].

Set the measurement conditions for the sweep

points added.

Refer to “4.4 Set Measurement Conditions for Sweep Points” (p. 87).

• [POINT] and [POINT DELAY] cannot be set for interval measurements.

Press [SET] to conrm the setting.

Deleting sweep points

Press [SETUP].

Press the [LIST] tab.

Move the cursor to the point to be deleted in the

list of sweep points with / or by scrolling.

Press [DELETE].

Editing sweep points

HIOKI IM7585A981-05

Press [SETUP].

Sweep measurement

Press the [LIST] tab.

Move the cursor to the point to be edited with /

or by scrolling.

Press [EDIT].

Set the measurement conditions for the sweep

points to be edited.

Refer to “4.4 Set Measurement Conditions for Sweep Points” (p. 87).

• The setting range ([POINT]) of the sweep parameter is a value between the selected row and the next row.

• [POINT] and [POINT DELAY] cannot be set for interval measurements.

Press [SET] to conrm the setting.

Analyzer Function

Sweep measurement

HIOKI IM7585A981-05

4.3.4 Segment Sweep and Segment Interval Sweep

Adding segments

Press [SETUP].

Deleting segments

Press the [LIST] tab.

Move the cursor to the point to be added with /

or by scrolling.

Add a segment on the next point in the selected row.

Press [ADD].

A segment is added with the default value.

Press [SETUP].

Press the [LIST] tab.

Move the cursor to the point to be deleted with

or by scrolling.

/

Press [DELETE].

Editing segments

HIOKI IM7585A981-05

Press [SETUP].

Sweep measurement

Press the [LIST] tab.

Move the cursor to the point to be edited with /

or by scrolling.

Press [EDIT].

Setting the sweep range.

Refer to “4.3.2 Setting the Sweep Range” (p. 76).

The setting of sweep range is xed to [START-STOP]

in segment sweep, and [INTVL MEAS] in segment interval sweep.

Analyzer Function

Batch setting for measurement conditions.

Refer to “4.4 Set Measurement Conditions for Sweep Points” (p. 87).

Press [SET] to conrm the setting.

Sweep measurement

HIOKI IM7585A981-05

Checking the set sweep points

Press [SETUP].

Press the [LIST] tab.

Press [VIEW POINT].

The set sweep points can be checked.

Set Measurement Conditions for Sweep Points

HIOKI IM7585A981-05

4.4 Set Measurement Conditions for Sweep Points

Sets the measurement conditions for sweep points.

Setting is possible from the setting and editing of sweep points. Refer to “4.3.3 Normal Sweep” (p. 81) and “4.3.4 Segment Sweep and Segment Interval Sweep” (p. 84).

4.4.1 Setting the Measurement Signal Frequency

Sets the measurement signal frequency.

When setting with / (each digit)

The input method can be switched between [DIGIT] and [10-KEY].

To set the frequency with the numeric keypad

Changing the unit: G (giga)/M (mega)/k (kilo)

Set the frequency with / or the numeric

keypad.

Settable range:

IM7580A 1.0000 MHz to 300.00 MHz

IM7581 100.00 kHz to 300.00 MHz

IM7583 1.0 MHz to 600.0 MHz

IM7585 1.0 MHz to 1.3000 GHz

IM7587 1.0 MHz to 3.0000 GHz

When setting with / (each digit)

Holding down / changes the value continuously.

[×10] Sets the measurement frequency to 10×.

[/10] Sets the measurement frequency to

1/10×.

To set the frequency with the numeric keypad

[C] Repeats the input.

• The unit keys are enabled if a numerical value is input.

• The frequency is set on when any unit key is pressed.

• If the setting exceeds the maximum frequency: The maximum frequency will be set automatically.

• If the setting is below the minimum frequency: The minimum frequency will be set automatically.

Press [EXIT] to close the measurement frequency

setting screen.

Analyzer Function

Press [EXIT] to close the advanced settings

screen.

Set Measurement Conditions for Sweep Points

HIOKI IM7585A981-05

4.4.2 Setting the Measurement Signal Level

The value of the test signal level may change based on the sample tested.

CAUTION

Do not switch between P, V, or I while the test sample is still connected to the measurement terminals as this may damage the test sample.

The following items are the three types of measurement signal levels that can be applied to the object under test with this instrument.

Power (P) mode

Voltage (V) mode

Current (I) mode

• The setting resolution of the signal level is always 0.1 dB regardless of setting signal mode. When the level is set in the voltage or current mode, input values are automatically converted to the setting value with a resolution of 0.1 dB.

• The measurement accuracy varies according to the measurement signal level. Refer to “Measurement range” (p. 277).

• For details on calculation, refer to “Relationship between the setting values of the measurement signal mode” (p. 39).

• The measurement signal mode is common for all points.

• When the sweep parameter is POWER/ V/ I, the measurement signal mode cannot be changed.

Sets with the power (dBm) at the DUT port 50 Ω terminal.

Sets with the voltage (V) when the DUT port is open. (value of dBm converted into V)

Sets with current (A) when the DUT port is in a short circuit state. (value of dBm converted into I)

Set Measurement Conditions for Sweep Points

HIOKI IM7585A981-05

1 2

The numeric keypad can be used for input.

Press [P/V/I].

Select the signal setting mode.

[POWER] Sets with power (dBm).

[V] Sets with voltage (V).

[I] Sets with current (A).

Set the voltage or current with / or the numeric

keypad. (With the numeric pad, press [dBm].)

Measurement signal mode

Power (P) mode IM7580A,

Voltage (V) mode

Model Settable range

-40.0 dBm to +7.0 dBm

IM7581

IM7583, IM7585, IM7587

IM7580A, IM7581

IM7583, IM7585, IM7587

(Resolution: 0.1 dB)

-40.0 dBm to +1.0 dBm (Resolution: 0.1 dB)

4 mV to 1001 mV

4 mV to 502 mV

Analyzer Function

Current (I) mode IM7580A,

IM7581

IM7583, IM7585, IM7587

[C] Repeats the input.

Press [EXIT] to close the measurement signal level

setting screen.

Press [EXIT] to close the advanced settings

screen.

When a measurement value is outside the guaranteed accuracy range, REF VAL is displayed in the error display area. In this case, the measurement signal level is considered to be low. Check the guaranteed accuracy range and change the measurement conditions or consider the measurement values as values for reference. Refer to “Measurement range” (p. 277).

0.09 mA to 20.02 mA

0.09 mA to 10.04 mA

Set Measurement Conditions for Sweep Points

HIOKI IM7585A981-05

4.4.3 Setting the Measurement Speed

Changes the measurement time. When the measurement speed is set to [SLOW] or [SLOW2], the measurement accuracy improves.

• Perform calibration or compensation again if there is a change in the measurement speed. Refer to “5 Calibration and Compensation” (p. 141).

• Measurement time varies with the measurement conditions. Refer to “(3) Measurement Time” (p. 283).

Select the measurement speed.

[FAST] Performs high-speed measurement.

[MED] Performs normal-speed measurement.

[SLOW] Increases measurement accuracy.

[SLOW2] Measurement accuracy is better than

SLOW.

Press [EXIT] to close the measurement speed setting screen.

Press [EXIT] to close the advanced settings screen.

4.4.4 Displaying Average Values (Average)

The measurement values can be averaged using the averaging function. The variations in the displayed measurement values can be reduced with this function.

• The measurement values are averaged by arithmetic averaging during analyzer measurement irrespective of the trigger setting (p. 41).

• When averaging is enabled, the maximum, minimum, and peak values (local maximum and local minimum values) during the search function operation use the averaged values.

Use / to enter the averaging number of times.

Settable range 1 to 256 times

[C] Setting is turned OFF.

Press [EXIT] to close the average setting screen.

Press [EXIT] to close the advanced settings

screen.

Set Measurement Conditions for Sweep Points

HIOKI IM7585A981-05

4.4.5 Setting the Delay Time for Each Sweep Point (Point Delay)

Sets the delay time for each sweep point in the point delay setting.

In sweep measurement, some measurement samples may require time for the measurement value to stabilize due to a transient response. For such cases, set a point delay time. Refer to “3.2.3 Setting the Delay Time from Trigger to Measurement Start (Trigger Delay)” (p. 34).

For sequential sweep

External trigger

Measurement of sweep point 1

Measurement of sweep point 2

Measurement of sweep point 3

For repeat sweep

Internal Trigger

Measurement of sweep point 1

Measurement of sweep point 2

Returns to the measurement of sweep point 1.

Measurement of sweep point 3

For step sweep

External trigger External trigger External trigger

Measurement of sweep point 1

Measurement of sweep point 2

Measurement completeMeasurement complete

Measurement of sweep point 3

Trigger delay

Point delay

Measurement of the last sweep point

Measurement complete

Measurement of the last sweep point

Measurement completeMeasurement complete

Analyzer Function

The numeric keypad can be used for input.

Use / to enter the delay time.

(With the numeric keypad, press [SET].)

Settable range 0.00000 s to 9.99999 s

[C] Sets to the default value. (0.00000 s)

Press [EXIT] to close the setting screen.

Press [EXIT] to close the advanced settings

screen.

Setting the Graph Display Method

HIOKI IM7585A981-05

4.5 Setting the Graph Display Method

4.5.1 Setting the Horizontal Axis

Horizontal axis scale setting

Press [GRAPH].

How to check the set horizontal axis scale?

If the horizontal axis display scale is changed, the horizontal axis scale of the graph display screen

changes as shown in the gures below.

When the horizontal axis scale is set to linear ([LINEAR])

Press [SCALE].

Select the drawing type.

[LINEAR] Sets the horizontal axis to linear (linear axis).

[LOG] Sets the horizontal axis to log (logarithmic

axis).

Press [EXIT] to close the setting screen.

When the horizontal axis scale is set to log ([LOG])

Hioki IM7580A-1, IM7580A-2, IM7581-01, IM7581-02, IM7583-01 Instruction Manual

Specifications and Main Features

Frequently Asked Questions

User Manual

Contents

Measurement Process

Introduction

Verifying Package Contents

Options (Sold Separately)

Safety Information

Operating Precautions

Overview

1.1 Overview and Features

1.2 Names and Functions of Parts

1.3 Screen Operations

Measurement Preparations

2.1 Connecting the Test Head

2.2 Pre-Operation Inspection

2.3 Connecting the Power Cord

2.4 Connecting a Measurement Cable/Fixture

2.5 Connecting an Interface

2.6 Turning the Power ON and OFF

2.7 Select the Measurement Mode

LCR Function

3.1 LCR Function

3.1.1 Flowchart

3.1.2 Screen map

3.1.3 Measurement screen

3.1.4 Status and error display of this instrument

3.2 Setting Basic Settings of Measurement Conditions

3.2.1 Setting Display Parameters

3.2.2 Starting Measurement at Any Arbitrary Timing (Trigger)

3.2.3 Setting the Delay Time from Trigger to Measurement Start (Trigger Delay)

3.2.4 Applying the Signal to the Sample during Measurement Only (Trigger Synchronous Output)

3.2.5 Setting the Measurement Frequency

3.2.6 Setting the Measurement Signal Level

3.2.7 Setting the Measurement Speed

3.2.8 Display with Average Values (Average)

3.3 Judging Measurement Results

3.3.1 Setting the Judgment Mode

3.3.2 Judging with Upper and Lower Limit Values (Comparator Judgment Mode)

3.3.3 Classifying Measurement Results (BIN Judgment)

Analyzer Function

4.1 Analyzer Function

4.1.1 Flowchart

4.1.2 Screen map

4.1.3 Measurement screen

4.1.4 Types of graph

4.1.5 Status and error display of this instrument

4.2 Setting Basic Settings of Measurement

4.2.1 Setting the Measurement Parameters

4.2.2 Starting Measurement at Any Arbitrary Timing (Trigger)

4.2.3 Setting the Delay Time from Trigger to Measurement Start (Trigger Delay)

4.2.4 Applying the Signal to the Sample during Measurement Only (Trigger Synchronous Output)

4.2.5 Setting the Sweep Parameter

4.3 Sweep measurement

4.3.1 Setting the Sweep Method

4.3.2 Setting the Sweep Range

4.3.3 Normal Sweep

4.3.4 Segment Sweep and Segment Interval Sweep

4.4 Set Measurement Conditions for Sweep Points

4.4.1 Setting the Measurement Signal Frequency

4.4.2 Setting the Measurement Signal Level

4.4.3 Setting the Measurement Speed

4.4.4 Displaying Average Values (Average)

4.4.5 Setting the Delay Time for Each Sweep Point (Point Delay)

4.5 Setting the Graph Display Method

4.5.1 Setting the Horizontal Axis