HAMAMATSU R8486, R8487 Datasheet

PHOTOMULTIPLIER TUBES
PRELIMINARY DATA
FEB. 2001
R8486, R8487
For Vacuum Ultraviolet Light Detection
Cs-Te (R8486), Cs-I (R8487) Photocathode, MgF
28 mm (1-1/8 Inch) Diameter, 9-stage, Side-on Type
FEATURES
Sensitivity in the Vacuum Ultraviolet Region
R8486.............................................................115 to 320 nm
R8487.............................................................115 to 195 nm
High Quantum Efficiency (at 121.6 nm)
High Anode Sensitivity
R8486 (at 254 nm)................................5.2 × 10
R8487 (at 121.6 nm).............................1.0 × 10
5
A/W (Typ.)
5
A/W (Typ.)
2 Window,
APPLICATIONS
Emission Spectroscopy, etc.
GENERAL
Parameter R8486 Unit
Spectral Response Wavelength of Maximum Response Photocathode Material Window Material Minimum Effective Area
Structure
Dynode
Direct Interelectrode Capacitances Base Weight Suitable Socket for Base (option)
Number of Stage Material Anode to Dynode No.9 Anode to All Other Electrodes
R8487
115 to 320
200
Cs-Te
115 to 195
2
MgF
130
Cs-I
8 × 12
Circular-cage
9
Sb-Cs
Approx. 4 Approx. 6
11-pin base JEDEC No. B11-88
45
E678-11A
nm nm
— —
mm
— — —
pF pF
g
Figure 1: Typical Spectral Response
TPMSB0199EA
100
10
1
QUANTUM EFFICIENCY
R8486
R8487
QUANTUM EFFICIENCY (%)
0.1
PHOTOCATHODE RADIANT SENSITIVITY (mA/W)
0.01 100
200
PMSF0093
CATHODE RADIANT SENSITIVITY
300
WAVELENGTH (nm)
Subject to local technical requirements and regulat ions, availability of products included in this promotional material may var y. P lease consult with our sales office. Information furnished by HAMA M ATSU is believed to be reliable. However, n o responsibility is assumed for possible inaccuracies or omissions. Specifications are
subject to change without notice. No patent rights are granted to any of the circuits described herein.
2001 Hamamatsu Photonics K.K.
©
PHOTOMULTIPLIER TUBES R8486, R8487
MAXIMUM RATINGS (Absolute Maximum Values)
Parameter
Supply Voltage Between Anode and Cathode Between Anode and Last Dynode Between Successive Dynodes Between First Dynode and Cathode
A
Average Anode Current Ambient Temperature
CHARACTERISTICS (at 25 °C)
Parameter R8487R8486 Unit
Cathode Sensitivity Quantum Efficiency at 121 nm at 254 nm Anode Sensitivity Radiant at 121 nm at 254 nm Gain Anode Dark Current (After 30 minute storage in darkness) ENI (Equivalent Noise Input) D at 121 nm at 254 nm Time Response Anode Pulse Rise Time Electron Transit Time Transit Time Spread
B
E
F
G
Rating Unit
1250
250 250 250
0.1
-30 to +50
C
V dc V dc V dc V dc V dc
°C
22.5
25.0
5.2 × 10
1.0 × 10
1.0 —
1.09 × 10
2.2 22
1.2
5 7
-16
26.0 —
1.0 × 10 —
3.9 × 10
0.1
1.12 × 10 —
2.2 22
1.2
5
6
-16
% %
A/W A/W
nA
W W
ns ns ns
NOTES
A: Averaged over any interval of 30 seconds maximum. B: Measured with the same light source as Note B and with the voltage
distribution ratio shown in Table 1 below.
Table 1: Voltage Distribution Ratio
Electrode Distribution
Ratio Supply Voltage=1000 V dc K: Cathode Dy: Dynode P: Anode
C: Measured with the same supply voltage and voltage distribution ratio
as Note E after removal of light.
D: ENI is an indication of the photon-limited signal-to-noise ratio. It refers
to the amount of light in watts to produce a signal-to-noise ratio of uni­ty in the output of a photomultiplier tube.
ENI =
where q =
    
K Dy1 Dy2 Dy3 Dy4 Dy5 Dy6 Dy7 Dy8 Dy9 P
1111111111
2q·ldb·G·∆f
s
Electronic charge (1.60 × 10 Anode dark current(after 30 minutes storage) in amperes.
ldb =
Gain.
G =
Bandwidth of the system in hertz. 1 hertz is used.
f =
Anode radiant sensitivity in amperes per watt at the
S =
-19
coulomb).
wavelength of peak response.
E: The rise time is the time for the output pulse to rise from 10 % to 90 %
of the peak amplitude when the entire photocathode is illuminated by a delta function light pulse.
F: The electron transit time is the interval between the arrival of delta func-
tion light pulse at the entrance window of the tube and the time when the anode output reaches the peak amplitude. In measurement, the whole photocathode is illuminated.
G: Also called transit time jitter. This is the fluctuation in electron transit
time between individual pulses in the signal photoelectron mode, and may be defined as the FWHM of the frequency distribution of electron transit times.
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