GSI TECHNOLOGY GS8322Z18B-250I, GS8322Z18B-225I, GS8322Z18B-200I, GS8322Z18B-166I, GS8322Z18B-150I Service Manual

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查询GS8322Z18E-133供应商
GS8322Z18(B/E)/GS8322Z36(B/E)/GS8322Z72(C)
119, 165 & 209 BGA
36Mb Pipelined and Flow Through
Synchronous NBT SRAM
Features
• NBT (No Bus Turn Around) functionality allows zero wait Read-Write-Read bus utilization; fully pin-compatible with both pipelined and flow through NtRAM™, NoBL™ and ZBT™ SRAMs
• 2.5 V or 3.3 V +10%/–10% core power supply
• 2.5 V or 3.3 V I/O supply
• User-configurable Pipeline and Flow Through mode
• ZQ mode pin for user-selectable high
• IEEE 1149.1 JTAG-compatible Boundary Scan
• LBO
pin for Linear or Interleave Burst mode
• Pin-compatible with 2Mb, 4Mb, 8Mb, and 16Mb devices
• Byte write operation (9-bit Bytes)
• 3 chip enable signals for easy depth expansion
• ZZ Pin for automatic power-down
• JEDEC-standard 119-, 165- or 209-Bump BGA package
/low output drive
Functional Description
The GS8322Z18/36/72 is a 36Mbit Synchronous Static SRAM. GSI's NBT SRAMs, like ZBT, NtRAM, NoBL or other pipelined read/double late write or flow through read/ single late write SRAMs, allow utilization of all available bus bandwidth by eliminating the need to insert deselect cycles when the device is switched from read to write cycles.
250 MHz–133 MHz 2.5
V or 3.3 V V
DD
2.5 V or 3.3 V I/O
Because it is a synchronous device, address, data inputs, and read/write control inputs are captured on the rising edge of the input clock. Burst order control (LBO rail for proper operation. Asynchronous inputs include the Sleep mode enable (ZZ) and Output Enable. Output Enable can be used to override the synchronous control of the output drivers and turn the RAM's output drivers off at any time. Write cycles are internally self-timed and initiated by the rising edge of the clock input. This feature eliminates complex off­chip write pulse generation required by asynchronous SRAMs and simplifies input signal timing.
The GS8322Z18/36/72 may be configured by the user to operate in Pipeline or Flow Through mode. Operating as a pipelined synchronous device, in addition to the rising-edge­triggered registers that capture input signals, the device incorporates a rising edge triggered output register. For read cycles, pipelined SRAM output data is temporarily stored by the edge-triggered output register during the access cycle and then released to the output drivers at the next rising edge of clock.
The GS8322Z18/36/72 is implemented with GSI's high performance CMOS technology and is available in a JEDEC­standard 119-bump, 165-bump or 209-bump BGA package.
) must be tied to a power
Parameter Synopsis
-250 -225 -200 -166 -150 -133 Unit
t
(x18/x36)
KQ
(x72)
t
KQ
Pipeline
3-1-1-1
Flow
Through
2-1-1-1
Rev: 11/1/04 1/38 © 2002, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
tCycle
Curr
(x18)
Curr (x36) Curr (x72)
t
KQ
tCycle
Curr
(x18)
Curr (x36) Curr (x72)
2.5
3.0
4.0
285 350 440
6.5
6.5
205 235 315
2.7
3.0
4.4
265 320 410
7.0
7.0
195 225 295
3.0
3.0
5.0
245 295 370
7.5
7.5
185 210 265
3.5
3.5
6.0
220 260 320
8.0
8.0
175 200 255
3.8
3.8
6.7
210 240 300
8.5
8.5
165 190 240
4.0
4.0
7.5
185
mA
215
mA
265
mA
8.5
8.5nsns
155
mA
175
mA
230
mA
ns ns ns
GS8322Z18(B/E)/GS8322Z36(B/E)/GS8322Z72(C)
GS8322Z72C Pad Out—209-Bump BGA—Top View (Package C)
1234567891011
ADQ
BDQ
CDQ
DDQG DQG
E DQP
FDQ
GDQ
HDQ
JDQ
G DQG AE2AADVAE3ADQB DQB A
G DQG BC BG NC W ABBBF DQB DQB B
G DQG BH BD NC E1 NC BE BA DQB DQB C
G DQPC
C DQC
C DQC
C DQC
C DQC
V
V
V
V
DDQ
V
DDQ
V
DDQ
SS
SS
SS
NC NC G NC NC
V
DDQ
V
SS
V
DDQ
V
SS
V
DDQ
KNCNCCKNC
LDQ
MDQ
H DQH
H DQH
V
DDQ
V
SS
V
DDQ
V
SS
V
SS
V
DD
V
SS
V
DD
V
SS
V
DD
V
SS
V
DD
V
SS
V
DD
ZQ
MCH
MCL
MCH
CKE
FT
MCL
V
DD
V
SS
V
DD
V
SS
V
DD
V
SS
V
DD
V
SS
V
V
V
DDQ
V
DDQ
V
DDQ
SS
SS
V
V
V
DDQ
V
DDQ
V
DDQ
SS
SS
NC NC NC NC K
V
DDQ
V
SS
V
DDQ
V
SS
DQB DQB D
DQPF DQPB E
DQF DQF F
DQF DQF G
DQF DQF H
DQF DQF J
DQA DQA L
DQA DQA M
NDQ
PDQ
R DQP
TDQ
UDQ
VDQ
WDQ
H DQH
H DQH
D DQPH
D DQD
D DQD NC A NC A A A NC DQE DQE U
D DQD AAAA1AAADQE DQE V
D DQD TMS TDI A A0 A TDO TCK DQE DQE W
V
V
DDQ
V
DDQ
V
SS
SS
V
DDQ
V
SS
V
DDQ
NC NC LBO NC NC
11 x 19 Bump BGA—14 x 22 mm
V
DD
V
SS
V
DD
MCH
ZZ
V
DD
V
DD
V
SS
V
DD
2
Body—1 mm Bump Pitch
V
V
DDQ
V
DDQ
SS
V
V
DDQ
V
DDQ
V
SS
SS
DQA DQA N
DQA DQA P
DQPA DQPE R
DQE DQE T
Rev: 1.04 11/2004 2/38 © 2002, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8322Z18(B/E)/GS8322Z36(B/E)/GS8322Z72(C)
GS8322Z72 209-Bump BGA Pin Description
Symbol Type Description
A0, A1 I Address field LSBs and Address Counter Preset Inputs
An I Address Inputs
DQ
A
DQB DQC DQD DQE DQF DQG DQH
I/O Data Input and Output pins
A, BB
B
B
C,BD
B
E, BF, BG,BH
I Byte Write Enable for DQA, DQB I/Os; active low
I Byte Write Enable for DQC, DQD I/Os; active low
I Byte Write Enable for DQE, DQF, DQG, DQH I/Os; active low
NC No Connect
CK I Clock Input Signal; active high
E
1
E
3
E
2
G
ADV
ZZ
FT
LBO
MCH
MCH
MCL
W
I Chip Enable; active low
I Chip Enable; active low
I Chip Enable; active high
I Output Enable; active low
I Burst address counter advance enable
I Sleep Mode control; active high
I Flow Through or Pipeline mode; active low
I Linear Burst Order mode; active low
I Must Connect High
I Must Connect High
Must Connect Low
I Write Enable; active low
FLXDrive Output Impedance Control
ZQ
I
Low = Low Impedance [High Drive], High = High Impedance [Low Drive]
CKE
I Clock Enable; active low
Rev: 1.04 11/2004 3/38 © 2002, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8322Z18(B/E)/GS8322Z36(B/E)/GS8322Z72(C)
GS8322Z72 209-Bump BGA Pin Description
Symbol Type Description
TMS
TDI
TDO
TCK
V
DD
V
SS
V
DDQ
I Scan Test Mode Select
I Scan Test Data In
O Scan Test Data Out
I Scan Test Clock
I Core power supply
I I/O and Core Ground
I Output driver power supply
Rev: 1.04 11/2004 4/38 © 2002, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8322Z18(B/E)/GS8322Z36(B/E)/GS8322Z72(C)
GS8322Z36B Pad Out—119-Bump BGA—Top View (Package B)
1234567
A
V
DDQ
AAAAA
BNCE2AADVAE3
CNCA A
DDQCDQPC
EDQCDQC
F
V
DDQ
DQC
V
SS
V
SS
V
SS
V
DD
ZQ
E1
G
AANCC
V
SS
V
SS
V
SS
DQPB DQB D
DQB DQB E
DQB
V
DDQ
NC B
V
DDQ
GDQCDQCBC ABBDQB DQB G
HDQCDQC
J
V
DDQ
V
DD
KDQDDQD
V
NC
V
SS
SS
LDQDDQDBD
M
V
DDQ
DQD
V
SS
W
V
DD
CK
NC BA DQA DQA L
CKE
V
NC
V
V
SS
SS
SS
DQB DQB H
V
DD
V
DDQ
DQA DQA K
DQA
V
DDQ
A
F
J
M
NDQDDQD
PDQDDQPD
V
SS
V
SS
RNCALBO
A1
A0
V
DD
V
SS
V
SS
DQA DQA N
DQPA DQA P
FT ANCR
TNCNCAAAAZZT
U
V
DDQ
TMS TDI TCK TDO NC
7 x 17 Bump BGA—14 x 22 mm
2
Body—1.27 mm Bump Pitch
V
DDQ
U
Rev: 1.04 11/2004 5/38 © 2002, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8322Z18(B/E)/GS8322Z36(B/E)/GS8322Z72(C)
GS8322Z18B Pad Out—119-Bump BGA—Top View (Package B)
1234567
A
V
DDQ
AAAAA
BNCE2AADVAE3
CNCA A
DDQBNC
ENCDQB
F
V
DDQ
NC
V
SS
V
SS
V
SS
GNCDQBBB
HDQBNC
J
V
DDQ
V
DD
KNCDQB
V
NC
V
SS
SS
L DQB NC NC NC BA
M
V
DDQ
DQB
V
SS
V
ZQ
DD
E1
G
AANCC
V
SS
V
SS
V
SS
DQPA NC D
NC DQA E
DQA
ANCNCDQAG
V
NC
V
SS
SS
DQA NC H
V
DD
NC DQA K
V
CK
W
DD
DQA NC L
CKE
V
SS
NC
V
DDQ
NC B
V
DDQ
V
DDQ
V
DDQ
A
F
J
M
NDQBNC
PNCDQPB
V
SS
V
SS
RNCALBO
A1
A0
V
DD
V
SS
V
SS
DQA NC N
NC DQA P
FT ANCR
TNCAAAAAZZT
U
V
DDQ
TMS TDI TCK TDO NC
7 x 17 Bump BGA—14 x 22 mm
2
Body—1.27 mm Bump Pitch
V
DDQ
U
Rev: 1.04 11/2004 6/38 © 2002, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8322Z18(B/E)/GS8322Z36(B/E)/GS8322Z72(C)
GS8322Z18/36 119-Bump BGA Pin Description
Symbol Type Description
A0, A1 I Address field LSBs and Address Counter Preset Inputs
An I Address Inputs
DQ
A
DQB DQC DQD
A, BB, BC, BD I Byte Write Enable for DQA, DQB, DQC, DQD I/Os; active low
B
NC No Connect
CK I Clock Input Signal; active high
I/O Data Input and Output pins
CKE
W
E
1 I Chip Enable; active low
E
3 I Chip Enable; active low
E
2 I Chip Enable; active high
G
I Clock Enable; active low
I Write Enable; active low
I Output Enable; active low
ADV I Burst address counter advance enable
ZZ I Sleep mode control; active high
FT
LBO
ZQ I
TMS
TDI
TDO
TCK
V
DD
V
SS
V
DDQ
I Flow Through or Pipeline mode; active low
I Linear Burst Order mode; active low
FLXDrive Output Impedance Control
Low = Low Impedance [High Drive], High = High Impedance [Low Drive])
I Scan Test Mode Select
I Scan Test Data In
O Scan Test Data Out
I Scan Test Clock
I Core power supply
I I/O and Core Ground
I Output driver power supply
BPR1999.05.18
Rev: 1.04 11/2004 7/38 © 2002, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8322Z18(B/E)/GS8322Z36(B/E)/GS8322Z72(C)
165 Bump BGA—x18 Common I/O—Top View (Package E)
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ANC
BNC
CNCNC
DNC
ENC
FNC
GNC
HFT
J
K
L
DQB NC V
DQB NC V
DQB NC V
AE1BB NC E3 CKE ADV A A AA
AE2NCBACK W G A ANC B
V
DQB V
DQB V
DQB V
DQB V
MCH NC V
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
V
SS
V
DD
V
DD
V
DD
V
DD
DD
V
DD
V
DD
V
DD
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
V
V
V
V
V
V
V
V
SS
DD
DD
DD
DD
DD
DD
DD
DD
V
V
V
V
V
DDQ
DDQ
DDQ
DDQ
DDQ
NC DQPA C
NC DQA D
NC DQA E
NC DQA F
NC DQA G
NC ZQ ZZ H
V
V
V
DDQ
DDQ
DDQ
DQA NC J
DQA NC K
DQA NC L
M
N
DQB NC V
DQPB NC V
PNCNC
RLBO
A A ATMSA0 TCK A A A AR
11 x 15 Bump BGA—15 mm x 17 mm Body—1.0 mm Bump Pitch
DDQ
DDQ
V
DD
V
SS
V
SS
V
SS
V
SS
NC NC NC V
V
DD
SS
V
V
DDQ
DDQ
DQA NC M
NC NC N
A ATDIA1 TDO A A ANC P
Rev: 1.04 11/2004 8/38 © 2002, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8322Z18(B/E)/GS8322Z36(B/E)/GS8322Z72(C)
165 Bump BGA—x36 Common I/O—Top View (Package E)
1234567891011
ANC
BNC
C
D
E
F
G
H FT
K
L
DQPC NC V
DQC DQC V
DQC DQC V
DQC DQC V
DQC DQC V
MCH NC V
J
DQD DQD V
DQD DQD V
DQD DQD V
AE1BC BB E3 CKE ADV A A NC A
AE2BDBA CK W G A ANC B
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
V
SS
V
DD
V
DD
V
DD
V
DD
DD
V
DD
V
DD
V
DD
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
V
V
V
V
V
V
V
V
SS
DD
DD
DD
DD
DD
DD
DD
DD
V
V
V
V
V
DDQ
DDQ
DDQ
DDQ
DDQ
NC DQPB C
DQB DQB D
DQB DQB E
DQB DQB F
DQB DQB G
NC ZQ ZZ H
V
V
V
DDQ
DDQ
DDQ
DQA DQA J
DQA DQA K
DQA DQA L
M
N
DQD DQD V
DQPD NC V
PNCNC
RLBO
A A ATMSA0 TCK A A A AR
11 x 15 Bump BGA—15 mm x 17 mm Body—1.0 mm Bump Pitch
DDQ
DDQ
V
DD
V
SS
V
SS
V
SS
V
SS
NC NC NC V
V
DD
SS
V
V
DDQ
DDQ
DQA DQA M
NC DQPA N
A ATDIA1 TDO A A ANC P
Rev: 1.04 11/2004 9/38 © 2002, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8322Z18(B/E)/GS8322Z36(B/E)/GS8322Z72(C)
GS8322Z18/36E 165-Bump BGA Pin Description
Symbol Type Description
A0, A1 I Address field LSBs and Address Counter Preset Inputs
An I Address Inputs
A
18 I Address Input
DQ
A
DQB DQC DQD
B
A, BB, BC, BD I Byte Write Enable for DQA, DQB, DQC, DQD I/Os; active low
NC No Connect
CK I Clock Input Signal; active high
CKE
W
E
1 I Chip Enable; active low
E
3 I Chip Enable; active low
E
2 I Chip Enable; active high
I/O Data Input and Output pins
I Clock Enable; active low
I Write Enable; active low
FT
G
I Flow Through / Pipeline Mode Control
I Output Enable; active low
ADV I Burst address counter advance enable; active high
ZQ I
Low = Low Impedance [High Drive], High = High Impedance [Low Drive])
FLXDrive Output Impedance Control
ZZ I Sleep mode control; active high
LBO
TMS
TDI
TDO
TCK
MCH
V
DD
V
SS
V
DDQ
I Linear Burst Order mode; active low
I Scan Test Mode Select
I Scan Test Data In
O Scan Test Data Out
I Scan Test Clock
Must Connect High
I Core power supply
I I/O and Core Ground
I Output driver power supply
Rev: 1.04 11/2004 10/38 © 2002, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8322Z18(B/E)/GS8322Z36(B/E)/GS8322Z72(C)
Functional Details
Clocking
Deassertion of the Clock Enable (CKE suspend RAM operations. Failure to observe Clock Enable set-up or hold requirements will result in erratic operation.
Pipeline Mode Read and Write Operations
All inputs (with the exception of Output Enable, Linear Burst Order and Sleep) are synchronized to rising clock edges. Single cycle read and write operations must be initiated with the Advance/Load activation is accomplished by asserting all three of the Chip Enable inputs (E inputs will deactivate the device.
) input blocks the Clock input from reaching the RAM's internal circuits. It may be used to
pin (ADV) held low, in order to load the new address. Device
1, E2, and E3). Deassertion of any one of the Enable
Function W
BA BB BC BD
Read H X X X X
Write Byte “a” L L H H H
Write Byte “b” L H L H H
Write Byte “c” L H H L H
Write Byte “d” L H H H L
Write all Bytes L L L L L
Write Abort/NOP L H H H H
Read operation is initiated when the following conditions are satisfied at the rising edge of clock: CKE chip enables (E
1, E2, and E3) are active, the write enable input signals W is deasserted high, and ADV is asserted low. The address
is asserted low, all three
presented to the address inputs is latched into the address register and presented to the memory core and control logic. The control logic determines that a read access is in progress and allows the requested data to propagate to the input of the output register. At the next rising edge of clock the read data is allowed to propagate through the output register and onto the output pins.
Write operation occurs when the RAM is selected, CKE is active, and the Write input is sampled low at the rising edge of clock. The Byte Write Enable inputs (B
A, BB, BC, and BD) determine which bytes will be written. All or none may be activated. A write
cycle with no Byte Write inputs active is a no-op cycle. The pipelined NBT SRAM provides double late write functionality, matching the write command versus data pipeline length (2 cycles) to the read command versus data pipeline length (2 cycles). At the first rising edge of clock, Enable, Write, Byte Write(s), and Address are registered. The Data In associated with that address is required at the third rising edge of clock.
Flow Through Mode Read and Write Operations
Operation of the RAM in Flow Through mode is very similar to operations in Pipeline mode. Activation of a Read Cycle and the use of the Burst Address Counter is identical. In Flow Through mode the device may begin driving out new data immediately after new address are clocked into the RAM, rather than holding new data until the following (second) clock edge. Therefore, in Flow Through mode the read pipeline is one cycle shorter than in Pipeline mode.
Write operations are initiated in the same way, but differ in that the write pipeline is one cycle shorter as well, preserving the ability to turn the bus from reads to writes without inserting any dead cycles. While the pipelined NBT RAMs implement a double late write protocol in Flow Through mode a single late write protocol mode is observed. Therefore, in Flow Through mode, address and control are registered on the first rising edge of clock and data in is required at the data input pins at the second rising edge of clock.
Rev: 1.04 11/2004 11/38 © 2002, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Synchronous Truth Table
GS8322Z18(B/E)/GS8322Z36(B/E)/GS8322Z72(C)
Operation Type Address CK CKE
Read Cycle, Begin Burst R External L-H L L H X L H L L L Q
Read Cycle, Continue Burst B Next L-H L H X X X X X L L Q 1,10
NOP/Read, Begin Burst R External L-H L L H X L H L H L High-Z 2
Dummy Read, Continue Burst B Next L-H L H X X X X X H L High-Z 1,2,10
Write Cycle, Begin Burst W External L-H L L L L L H L X L D 3
Write Cycle, Continue Burst B Next L-H L H X L X X X X L D 1,3,10
Write Abort, Continue Burst B Next L-H L H X H X X X X L High-Z 1,2,3,10
Deselect Cycle, Power Down D None L-H L L X X H X X X L High-Z
Deselect Cycle, Power Down D None L-H L L X X X X H X L High-Z
Deselect Cycle, Power Down D None L-H L L X X X L X X L High-Z
Deselect Cycle D None L-H L L L H L H L X L High-Z
Deselect Cycle, Continue D None L-H L H X X X X X X L High-Z 1
Sleep Mode None X X X X X X X X X H High-Z
Clock Edge Ignore, Stall Current L-H H X X X X X X X L - 4
ADV W Bx E1 E2 E3 G ZZ DQ Notes
1
Notes:
1. Continue Burst cycles, whether read or write, use the same control inputs. A Deselect continue cycle can only be entered into if a Dese­lect cycle is executed first.
2. Dummy Read and Write abort can be considered NOPs because the SRAM performs no operation. A Write abort occurs when the W pin is sampled low but no Byte Write pins are active so no write operation is performed.
3. G
can be wired low to minimize the number of control signals provided to the SRAM. Output drivers will automatically turn off during
write cycles.
4. If CKE
5. X = Don’t Care; H = Logic High; L = Logic Low; Bx
6. All inputs, except G
7. Wait states can be inserted by setting CKE
8. This device contains circuitry that ensures all outputs are in High Z during power-up.
9. A 2-bit burst counter is incorporated.
10. The address counter is incriminated for all Burst continue cycles.
High occurs during a pipelined read cycle, the DQ bus will remain active (Low Z). If CKE High occurs during a write cycle, the bus
will remain in High Z.
= High = All Byte Write signals are high; Bx = Low = One or more Byte/Write
signals are Low
and ZZ must meet setup and hold times of rising clock edge.
high.
Rev: 1.04 11/2004 12/38 © 2002, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
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