• Byte Write (BW) and/or Global Write (GW) operation
• Common data inputs and data outputs
• Clock Control, registered, address, data, and control
• Internal self-timed write cycle
• Automatic power-down for portable applications
• 100-lead TQFP package
-11-11.5-100-80-66
Pipeline
3-1-1-1
Flow
Through
2-1-1-1
tCycle
t
KQ
I
DD
t
KQ
tCycle
I
DD
10 ns
4.0 ns
225 mA
11 ns
15 ns
180 mA
10 ns
4.0 ns
225 mA
11.5 ns
15 ns
180 mA
8Mb Sync Burst SRAMs
10 ns
4.0 ns
225 mA
12 ns
15 ns
180 mA
12.5 ns
4.5 ns
200 mA
14 ns
15 ns
175 mA
15 ns
5.0 ns
185 mA
18 ns
20 ns
165 mA
Functional Description
Applications
The GS880E18/32/36T is a 9,437,184-bit (8,388,608-bit for
x32 version) high performance synchronous SRAM with a 2bit burst address counter. Although of a type originally
developed for Level 2 Cache applications supporting high
performance CPUs, the device now finds application in
synchronous SRAM applications, ranging from DSP main
store to networking chip set support.
Controls
Addresses, data I/Os, chip enables (E1, E2, E3), address burst
control inputs (ADSP, ADSC, ADV) and write control inputs
(Bx, BW, GW) are synchronous and are controlled by a
positive-edge-triggered clock input (CK). Output enable (G)
and power down control (ZZ) are asynchronous inputs. Burst
cycles can be initiated with either ADSP or ADSC inputs. In
Burst mode, subsequent burst addresses are generated
internally and are controlled by ADV. The burst address
counter may be configured to count in either linear or
100 MHz–66 MHz
3.3 V V
DD
3.3 V and 2.5 V I/O
interleave order with the Linear Burst Order (LBO) input. The
Burst function need not be used. New addresses can be loaded
on every cycle with no degradation of chip performance.
Flow Through / Pipeline Reads
The function of the Data Output register can be controlled by
the user via the FT mode pin (Pin 14). Holding the FT mode
pin low places the RAM in Flow Through mode, causing
output data to bypass the Data Output Register. Holding FT
high places the RAM in Pipeline mode, activating the risingedge-triggered Data Output Register.
DCD Pipelined Reads
The GS880E18/32/36T is a DCD (Dual Cycle Deselect)
pipelined synchronous SRAM. SCD (Single Cycle Deselect)
versions are also available. DCD SRAMs pipeline disable
commands to the same degree as read commands. DCD RAMs
hold the deselect command for one full cycle and then begin
turning off their outputs just after the second rising edge of
clock.
Byte Write and Global Write
Byte write operation is performed by using Byte Write enable
(BW) input combined with one or more individual byte write
signals (Bx). In addition, Global Write (GW) is available for
writing all bytes at one time, regardless of the byte write
control inputs.
Sleep Mode
Low power (Sleep mode) is attained through the assertion
(high) of the ZZ signal, or by stopping the clock (CK).
Memory data is retained during Sleep mode.
Core and Interface Voltages
The GS880E18/32/36T operates on a 3.3 V power supply, and
all inputs/outputs are 3.3 V- and 2.5 V-compatible. Separate
output power (V
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Preliminary
Linear Burst Sequence
I
GS880E18/32/36T-11/11.5/100/80/66
Mode Pin Functions
Mode NamePin NameStateFunction
Burst Order ControlLBO
Output Register ControlFT
Power Down ControlZZ
Note:
There are pull-up devices on the LBO and FT pins and a pull down device on the ZZ pin, so those input pins can be unconnected and the chip will
operate in the default states as specified in the above table.
Burst Counter Sequences
LLinear Burst
H or NCInterleaved Burst
LFlow Through
H or NCPipeline
L or NCActive
H
Standby, IDD = I
nterleaved Burst Sequence
SB
A[1:0] A[1:0] A[1:0] A[1:0]
1st address00011011
2nd address01101100
3rd address10110001
4th address11000110
Note: The burst counter wraps to initial state on the 5th clock.
1st address00011011
2nd address01001110
3rd address10110001
4th address11100100
Note: The burst counter wraps to initial state on the 5th clock.
2.For x36 Version, E = T (True) if E2 = 1 and E3 = 0; E = F (False) if E2 = 0 or E3 = 1.
3.W = T (True) and F (False) is defined in the Byte Write Truth Table preceding.
4.G is an asynchronous input. G can be driven high at any time to disable active output drivers. G low can only enable active drivers (shown
as “Q” in the Truth Table above).
5.All input combinations shown above are tested and supported. Input combinations shown in gray boxes need not be used to accomplish
basic synchronous or synchronous burst operations and may be avoided for simplicity.
6.Tying ADSP high and ADSC low allows simple non-burst synchronous operations. See BOLD items above.
7.Tying ADSP high and ADV low while using ADSC to load new addresses allows simple burst operations. See ITALIC items above.
1.The diagram shows only supported (tested) synchronous state transitions. The diagram presumes G is tied low.
2.The upper portion of the diagram assumes active use of only the Enable (E1, E2, and E3) and Write (BA, BB, BC, BD, BW, and GW) control
inputs, and that ADSP is tied high and ADSC is tied low.
3.The upper and lower portions of the diagram together assume active use of only the Enable, Write, and ADSC control inputs, and
assumes ADSP is tied high and ADV is tied low.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Simplified State Diagram with G
Preliminary
GS880E18/32/36T-11/11.5/100/80/66
X
Deselect
WR
W
X
First Write
W
X
Burst Write
CWCR
R
CR
R
CR
W
CW
W
CW
R
First Read
R
Burst Read
X
CRCW
X
Notes:
1.The diagram shows supported (tested) synchronous state transitions plus supported transitions that depend upon the use of G.
2.Use of “Dummy Reads” (Read Cycles with G High) may be used to make the transition from Read cycles to Write cycles without passing
through a Deselect cycle. Dummy Read cycles increment the address counter just like normal Read cycles.
3.Transitions shown in grey tone assume G has been pulsed high long enough to turn the RAM’s drivers off and for incoming data to meet
Data Input Set Up Time.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Preliminary
GS880E18/32/36T-11/11.5/100/80/66
Absolute Maximum Ratings
(All voltages reference to VSS)
SymbolDescriptionValueUnit
V
DD
V
DDQ
V
CK
V
I/O
V
IN
I
IN
I
OUT
P
D
T
STG
T
BIAS
Note:
Permanent damage to the device may occur if the Absolute Maximum Ratings are exceeded. Operation should be restricted to Recommended
Operating Conditions. Exposure to conditions exceeding the Absolute Maximum Ratings, for an extended
period of time, may affect reliability of this component.
Voltage on VDD Pins
Voltage in V
Pins–0.5 to V
DDQ
–0.5 to 4.6V
DD
V
Voltage on Clock Input Pin–0.5 to 6V
Voltage on I/O Pins
Voltage on Other Input Pins
–0.5 to V
–0.5 to V
+0.5 (≤ 4.6 V max.)
DDQ
+0.5 (≤ 4.6 V max.)
DD
V
V
Input Current on Any Pin+/–20mA
Output Current on Any I/O Pin+/–20mA
Package Power Dissipation 1.5W
Storage Temperature–55 to 125
Temperature Under Bias–55 to 125
o
o
C
C
Recommended Operating Conditions
ParameterSymbolMin.Typ.Max.UnitNotes
Supply Voltage
I/O Supply Voltage
Input High Voltage
Input Low Voltage
Ambient Temperature (Commercial Range Versions)
Ambient Temperature (Industrial Range Versions)
Notes:
1.Unless otherwise noted, all performance specifications quoted are evaluated for worst case at both 2.75 V ≤ V
(i.e., 2.5 V I/O) and 3.6 V ≤ V
≤ 3.135 V (i.e., 3.3 V I/O), and quoted at whichever condition is worst case.
DDQ
2.This device features input buffers compatible with both 3.3 V and 2.5 V I/O drivers.
3.Most speed grades and configurations of this device are offered in both Commercial and Industrial Temperature ranges. The part number of
Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifications quoted are evaluated
for worst case in the temperature range marked on the device.
4.Input Under/overshoot voltage must be –2 V > Vi < V
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS880E18/32/36T-11/11.5/100/80/66
Undershoot Measurement and TimingOvershoot Measurement and Timing
V
IH
VDD + 2.0 V
V
SS
50%
20% tKC
Preliminary
50%
VSS – 2.0 V
20% tKC
V
DD
V
IL
Capacitance
(TA = 25oC, f = 1 MHZ, V
DD
= 3.3 V)
ParameterSymbolTest conditionsTyp.Max.Unit
Input Capacitance
Input/Output Capacitance
Note: These parameters are sample tested.
C
IN
C
I/O
V
V
IN
OUT
= 0 V
= 0 V
45pF
67pF
Package Thermal Characteristics
RatingLayer BoardSymbolMaxUnitNotes
Junction to Ambient (at 200 lfm)single
Junction to Ambient (at 200 lfm)four
Junction to Case (TOP)—
Notes:
1.Junction temperature is a function of SRAM power dissipation, package thermal resistance, mounting board temperature, ambient. Temperature air flow, board density, and PCB thermal resistance.
2.SCMI G-38-87
3.Average thermal resistance between die and top surface, MIL SPEC-883, Method 1012.1
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
AC Electrical Characteristics
Preliminary
GS880E18/32/36T-11/11.5/100/80/66
Pipeline
Flow-
Thru
ParameterSymbol
-11-11.5-100-80-66
MinMaxMinMaxMinMaxMinMaxMinMax
Clock Cycle TimetKC10—10—10—12.5—15—ns
Clock to Output ValidtKQ—4.0—4.0—4.0—4.5—5ns
Clock to Output InvalidtKQX1.5—1.5—1.5—1.5—1.5—ns
Clock to Output in Low-Z
tLZ
1
1.5—1.5—1.5—1.5—1.5—ns
Clock Cycle TimetKC15.0—15.0—15.0—15.0—20—ns
Clock to Output ValidtKQ—11.0—11.5—12.0—14.0—18ns
Clock to Output InvalidtKQX3.0—3.0—3.0—3.0—3.0—ns
Clock to Output in Low-Z
tLZ
1
3.0—3.0—3.0—3.0—3.0—ns
Clock HIGH TimetKH1.7—1.7—2—2—2.3—ns
Clock LOW TimetKL2—2—2.2—2.2—2.5—ns
Clock to Output in High-Z
tHZ
1
1.5 4.01.5 4.21.54.51.54.51.54.8ns
G to Output ValidtOE—4.0—4.2—4.5—4.5—4.8ns
G to output in Low-Z
G to output in High-Z
tOLZ
tOHZ
1
1
0—0—0—0—0—ns
—4.0—4.2—4.5—4.5—4.8ns
Setup timetS1.5—2.0—2.0—2.0—2.0—ns
Hold timetH0.5—0.5—0.5—0.5—0.5—ns
ZZ setup time
ZZ hold time
tZZS
tZZH
2
2
5—5—5—5—5—ns
1—1—1—1—1—ns
ZZ recoverytZZR20—20—20—20—20—ns
Unit
Notes:
1.These parameters are sampled and are not 100% tested.
2.ZZ is an asynchronous signal. However, in order to be recognized on any given clock cycle, ZZ must meet the specified setup and hold
times as specified above.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
tH
D1AQ2A
Q2BQ2c
Q2D
Sleep Mode Timing Diagram
CK
tH
tS
ADSP
ADSC
ZZ
Application Tips
tKC
tKH
tKL
tZZS
~
~
~
~
~
~
~
~
~
~
~
~
Snooze
tZZH
Preliminary
GS880E18/32/36T-11/11.5/100/80/66
tZZR
Single and Dual Cycle Deselect
SCD devices force the use of “dummy read cycles” (read cycles that are launched normally but that are ended with the output
drivers inactive) in a fully synchronous environment. Dummy read cycles waste performance but their use usually assures there
will be no bus contention in transitions from reads to writes or between banks of RAMs. DCD SRAMs do not waste bandwidth on
dummy cycles and are logically simpler to manage in a multiple bank application (wait states need not be inserted at bank address
boundary crossings) but greater care must be exercised to avoid excessive bus contention.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Preliminary
GS880E18/32/36T-11/11.5/100/80/66
Ordering Information for GSI Synchronous Burst RAMs
2
Org
514K x 18GS880E18T-11DCD Pipeline/Flow ThroughTQFP100/11C
514K x 18GS880E18T-11.5DCD Pipeline/Flow ThroughTQFP100/11.5C
514K x 18GS880E18T-100DCD Pipeline/Flow ThroughTQFP100/12C
514K x 18GS880E18T-80DCD Pipeline/Flow ThroughTQFP80/14C
514K x 18GS880E18T-66DCD Pipeline/Flow ThroughTQFP66/18C
256K x 32GS880E32T-11DCD Pipeline/Flow ThroughTQFP100/11C
256K x 32GS880E32T-11.5DCD Pipeline/Flow ThroughTQFP100/11.5C
256K x 32GS880E32T-100DCD Pipeline/Flow ThroughTQFP100/12C
256K x 32GS880E32T-80DCD Pipeline/Flow ThroughTQFP80/14C
256K x 32GS880E32T-66DCD Pipeline/Flow ThroughTQFP66/18C
256K x 36GS880E36T-11DCD Pipeline/Flow ThroughTQFP100/11C
256K x 36GS880E36T-11.5DCD Pipeline/Flow ThroughTQFP100/11.5C
256K x 36GS880E36T-100DCD Pipeline/Flow ThroughTQFP100/12C
256K x 36GS880E36T-80DCD Pipeline/Flow ThroughTQFP80/14C
256K x 36GS880E36T-66DCD Pipeline/Flow ThroughTQFP66/18C
514K x 18GS880E18T-11IDCD Pipeline/Flow ThroughTQFP100/11I
514K x 18GS880E18T-11.5IDCD Pipeline/Flow ThroughTQFP100/11.5I
514K x 18GS880E18T-100IDCD Pipeline/Flow ThroughTQFP100/12I
514K x 18GS880E18T-80IDCD Pipeline/Flow ThroughTQFP80/14I
514K x 18GS880E18T-66IDCD Pipeline/Flow ThroughTQFP66/18I
256K x 32GS880E32T-11IDCD Pipeline/Flow ThroughTQFP100/11I
256K x 32GS880E32T-11.5IDCD Pipeline/Flow ThroughTQFP100/11.5I
256K x 32GS880E32T-100IDCD Pipeline/Flow ThroughTQFP100/12I
256K x 32GS880E32T-80IDCD Pipeline/Flow ThroughTQFP80/14I
256K x 32GS880E32T-66IDCD Pipeline/Flow ThroughTQFP66/18I
256K x 36GS880E36T-11IDCD Pipeline/Flow ThroughTQFP100/11I
256K x 36GS880E36T-11.5IDCD Pipeline/Flow ThroughTQFP100/11.5I
256K x 36GS880E36T-100IDCD Pipeline/Flow ThroughTQFP100/12I
256K x 36GS880E36T-80IDCD Pipeline/Flow ThroughTQFP80/14I
256K x 36GS880E36T-66IDCD Pipeline/Flow ThroughTQFP66/18I
Notes:
1.Customers requiring delivery in Tape and Reel should add the character “T” to the end of the part number. Example: GS880E18TT.
2.The speed column indicates the cycle frequency (MHz) of the device in Pipeline mode and the latency (ns) in Flow Through mode. Each
device is Pipeline/Flow Through mode-selectable by the user.
3.TA = C = Commercial Temperature Range. TA = I = Industrial Temperature Range.
4. GSI offers other versions this type of device in many different configurations and with a variety of different features, only some of which
are covered in this data sheet. See the GSI Technology web site (www.gsitechnology.com) for a complete listing of current offerings.