• Byte write (BW) and/or global write (GW) operation.
• Common data inputs and data outputs.
• Clock Control, registered, address, data, and control.
• Internal Self-Timed Write cycle.
• Automatic power-down for portable applications.
• JEDEC standard 100-lead TQFP or 119 Bump BGA package.
-180-166-150-100
Pipeline
3-1-1-1
Flow Through
2-1-1-1
tCycle
tKQ
IDD
tKQ
tCycle
IDD
5.5ns
3.2ns
330mA
8ns
10ns
190mA
6.0ns
3.5ns
310mA
8.5ns
10ns
190mA
6.6ns
3.8ns
275mA
10ns
10ns
190mA
10ns
4.5ns
190mA
12ns
15ns
140mA
Functional Description
Applications
The GS84018/32/36 is a 4,718,592 bit (4,194,304 bit for x32 version)
high performance synchronous SRAM with a 2 bit burst address
counter. Although of a type originally developed for Level 2 Cache
applications supporting high performance CPU’s, the device now
finds application in synchronous SRAM applications ranging from
DSP main store to networking chip set support. The GS84018/32/36
is available in a JEDEC standard 100-lead TQFP or 119 Bump BGA
package.
Controls
Addresses, data I/O’s, chip enables (E1, E2, E3), address burst control
inputs (ADSP, ADSC, ADV) and write control inputs (Bx, BW, GW) are
synchronous and are controlled by a positive edge triggered clock
input (CK). Output enable (G) and power down control (ZZ) are
asynchronous inputs. Burst cycles can be initiated with either ADSP
or ADSC inputs. In Burst mode, subsequent burst addresses are
generated internally and are controlled by ADV. The burst address
counter may be configured to count in either linear or interleave order
with the Linear Burst Order (LBO) input. The Burst function need not
180Mhz - 100Mhz
3.3V VDD
3.3V & 2.5V I/O
be used. New addresses can be loaded on every cycle with no
degradation of chip performance.
Flow Through / Pipeline Reads
The function of the Data Output register can be controlled by the user
via the FT mode pin/bump (pin 14 in the TQFP and bump 5R in the
BGA, ) . Holding the FT mode pin/bump low places the RAM in Flow
through mode, causing output data to bypass the Data Output
Register. Holding FT high places the RAM in Pipelined Mode,
activating the rising edge triggered Data Output Register.
SCD Pipelined Reads
The GS84018/32/36 is an SCD (Single Cycle Deselect) pipelined
synchronous SRAM. DCD (Dual Cycle Deselect) versions are also
available.SCD SRAMs pipeline deselect commands one stage less
than read commands. SCD RAMs begin turning off their outputs
immediately after the deselect command has been captured in the
input registers.
Byte Write and Global Write
Byte write operation is performed by using byte write enable (BW)
input combined with one or more individual byte write signals (Bx). In
addition, Global Write (GW) is available for writing all bytes at one
time, regardless of the Byte Write control inputs.
Sleep Mode
Low power (Sleep mode) is attained through the assertion (High) of
the ZZ signal, or by stopping the clock (CK). Memory data is retained
during Sleep mode.
Core and Interface Voltages
The GS84018/32/36 operates on a 3.3V power supply and all inputs/
outputs are 3.3V and 2.5V compatible. Separate output power (VDDQ)
pins are used to de-couple output noise from the internal circuit.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS84018/32/36T/B-180/166/150/100
Linear Burst Sequence
I
Mode Pin Functions
Mode NamePin NameStateFunction
Burst Order ControlLBO
Output Register ControlFT
Power Down ControlZZ
Note:
There are pull up devices on LBO and FT pins and a pull down device on the ZZ pin, so those input pins can be unconnected and the chip will
operate in the default states as specified in the above tables.
Burst Counter Sequences
A[1:0]A[1:0]A[1:0]A[1:0]
1st address00011011
2nd address01101100
3rd address10110001
4th address11000110
Note: The burst counter wraps to initial state on the 5th clock.
LLinear Burst
H or NCInterleaved Burst
LFlow Through
H or NCPipeline
L or NCActive
H
Standby, IDD = I
nterleaved Burst Sequence
1st address00011011
2nd address01001110
3rd address10110001
4th address11100100
Note: The burst counter wraps to initial state on the 5th clock.
SB
A[1:0]A[1:0]A[1:0]A[1:0]
Byte Write Truth Table
FunctionGWBWBABBBCBDNotes
ReadHHXXXX1
ReadHLHHHH1
Write byte AHLLHHH2, 3
Write byte BHLHLHH2, 3
Write byte CHLHHLH2, 3, 4
Write byte DHLHHHL2, 3, 4
Write all bytesHLLLLL2, 3, 4
Write all bytesLXXXXX
Note:
1.All byte outputs are active in read cycles regardless of the state of Byte Write Enable inputs.
2.Byte Write Enable inputs BA, BB, BC and/or BD may be used in any combination with BW to write single or multiple bytes.
3.All byte I/O’s remain High-Z during all write operations regardless of the state of Byte Write Enable inputs.
4.Bytes “C” and “D” are only available on the x32 and x36 versions.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS84018/32/36T/B-180/166/150/100
Synchronous Truth Table
State
OperationAddress Used
Deselect Cycle, Power DownNoneXHXXLXXHigh-Z
Deselect Cycle, Power DownNoneXLFLXXXHigh-Z
Deselect Cycle, Power DownNoneXLFHLXXHigh-Z
Read Cycle, Begin BurstExternalRLTLXXXQ
Read Cycle, Begin BurstExternalRLTHLXFQ
Write Cycle, Begin BurstExternalWLTHLXTD
Read Cycle, Continue BurstNextCRXXHHLFQ
Read Cycle, Continue BurstNextCRHXXHLFQ
Write Cycle, Continue BurstNextCWXXHHLTD
Write Cycle, Continue BurstNextCWHXXHLTD
Read Cycle, Suspend BurstCurrentXXHHHFQ
Read Cycle, Suspend BurstCurrentHXXHHFQ
Write Cycle, Suspend BurstCurrentXXHHHTD
Write Cycle, Suspend BurstCurrentHXXHHTD
Note:
1.X = Don’t Care, H = High, L = Low.
2.E = T (True) if E2 = 1 and E3 = 0; E = F (False) if E2 = 0 or E3 = 1.
3.W = T (True) and F (False) is defined in the Byte Write Truth Table preceding.
4.G is an asynchronous input. G can be driven high at any time to disable active output drivers. G low can only enable active drivers (shown
as “Q” in the Truth Table above).
5.All input combinations shown above are tested and supported. Input combinations shown in gray boxes need not be used to accomplish
basic synchronous or synchronous burst operations and may be avoided for simplicity.
6.Tying ADSP high and ADSC low allows simple non-burst synchronous operations. See BOLD items above.
7.Tying ADSP high and ADV low while using ADSC to load new addresses allows simple burst operations. See ITALIC items above.
1.The diagram shows only supported (tested) synchronous state transitions. The diagram presumes G is tied Low.
2.The upper portion of the diagram assumes active use of only the Enable (E1, E2, E3) and Write (BA, BB, BC, BD, BW and GW) control inputs
and that ADSP is tied high and ADSC is tied low.
3.The upper and lower portions of the diagram together assume active use of only the Enable, Write and ADSC control inputs and assumes
ADSP is tied high and ADV is tied low.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Simplified State Diagram with G
GS84018/32/36T/B-180/166/150/100
X
Deselect
WR
W
X
X
First Write
W
Burst Write
CWCR
R
CR
R
CR
W
CW
W
CW
R
First Read
R
Burst Read
X
CRCW
X
Notes:
1.The diagram shows supported (tested) synchronous state transitions plus supported transitions that depend upon the use of G.
2.Use of “Dummy Reads” (Read Cycles with G High) may be used to make the transition from Read cycles to Write cycles without passing
through a Deselect cycle. Dummy Read cycles increment the address counter just like normal Read cycles.
3.Transitions shown in grey tone assume G has been pulsed high long enough to turn the RAM’s drivers off and for incoming data to meet
Data Input Set Up Time.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Absolute Maximum Ratings
(All voltages reference to V
SS
)
SymbolDescriptionValueUnit
GS84018/32/36T/B-180/166/150/100
V
T
T
V
DDQ
V
V
V
I
I
OUT
P
STG
BIAS
DD
CK
I/O
IN
IN
D
Voltage on VDD Pins-0.5 to 4.6V
Voltage in V
Pins-0.5 to V
DDQ
DD
V
Voltage on Clock Input Pin-0.5 to 6V
Voltage on I/O Pins-0.5 to V
Voltage on Other Input Pins-0.5 to V
+0.5 (≤ 4.6 V max.)V
DDQ
+0.5 (≤ 4.6 V max.)V
DD
Input Current on Any Pin+/- 20mA
Output Current on Any I/O Pin+/- 20mA
Package Power Dissipation 1.5W
Storage Temperature-55 to 125
Temperature Under Bias-55 to 125
o
o
C
C
Note:
Permanent damage to the device may occur if the Absolute Maximum Ratings are exceeded. Operation should be restricted to Recommended
Operating Conditions. Exposure to conditions exceeding the Absolute Maximum Ratings, for an extended period of time, may affect reliability of
this component.
Recommended Operating Conditions
ParameterSymbolMin.Typ.Max.UnitNotes
V
V
DDQ
V
V
T
T
DD
3.1353.33.6V
2.3752.5
IH
IL
A
A
1.7---
-0.3---0.8V2
02570°C3
-402585°C3
V
DD
VDD+0.3
V1
V2
Supply Voltage
I/O Supply Voltage
Input High Voltage
Input Low Voltage
Ambient Temperature (Commercial Range Versions)
Ambient Temperature (Industrial Range Versions)
Note:
1.Unless otherwise noted, all performance specifications quoted are evaluated for worst case at both 2.75V ≤ VDDQ ≤ 2.375V (i.e. 2.5V I/O)
and 3.6V ≤ VDDQ ≤ 3.135V (i.e. 3.3V I/O) and quoted at whichever condition is worst case.
2.This device features input buffers compatible with both 3.3V and 2.5V I/O drivers.
3.Most speed grades and configurations of this device are offered in both Commercial and Industrial Temperature ranges. The part number of
Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifications quoted are evaluated
for worst case in the temperature range marked on the device.
4.Input Under/overshoot voltage must be -2V > Vi < VDD+2V with a pulse width not to exceed 20% tKC.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS84018/32/36T/B-180/166/150/100
Undershoot Measurement and TimingOvershoot Measurement and Timing
V
IH
VDD+-2.0V
V
SS
50%
20% tKC
50%
VSS-2.0V
20% tKC
V
DD
V
IL
Capacitance
(TA=25oC, f=1MHZ, VDD=3.3V)
ParameterSymbolTest conditionsTyp.Max.Unit
Control Input Capacitance
Input Capacitance
Output Capacitance
Note: This parameter is sample tested.
C
C
C
OUT
I
IN
VDD=3.3V
VIN=0V
V
=0V
OUT
34pF
45pF
67pF
Package Thermal Characteristics
RatingLayer BoardSymbolTQFP MaxBGA MaxUnitNotes
Junction to Ambient (at 200 lfm)single
Junction to Ambient (at 200 lfm)four
Junction to Case (TOP)
Notes:
Notes:
1.Junction temperature is a function of SRAM power dissipation, package thermal resistance, mounting board temperature, ambient. Temperature air flow, board density, and PCB thermal resistance.
2.SCMI G-38-87.
3.Average thermal resistance between die and top surface, MIL SPEC-883, Method 1012.1.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
AC Electrical Characteristics
GS84018/32/36T/B-180/166/150/100
Pipeline
Flow-
Thru
ParameterSymbol
-180-166-150-100
MinMaxMinMaxMinMaxMinMax
Clock Cycle TimetKC5.5---6.0---6.7---10---ns
Clock to Output ValidtKQ---3.2---3.5---3.8---4.5ns
Clock to Output InvalidtKQX1.5---1.5---1.5---1.5---ns
Clock to Output in Low-Z
Clock Cycle TimetKC10.0---10.0---10.0---15.0---ns
Clock to Output ValidtKQ---8.0---8.5---10.0---12.0ns
Clock to Output InvalidtKQX3.0---3.0---3.0---3.0---ns
Clock to Output in Low-Z
Clock HIGH TimetKH1.3---1.3---1.5---2---ns
Clock LOW TimetKL1.5---1.5---1.7---2.2---ns
Clock to Output in High-Z
G to Output ValidtOE---3.2---3.5---3.8---5ns
G to output in Low-Z
G to output in High-Z
Setup timetS1.5---1.5---1.5---2.0---ns
Hold timetH0.5---0.5---0.5---0.5---ns
ZZ setup time
ZZ hold time
ZZ recoverytZZR20---20---20---20---ns
tLZ
tLZ
tHZ
tOLZ
tOHZ
tZZS
tZZH
1
1
1
1.5---1.5---1.5---1.5---ns
3.0---3.0---3.0---3.0---ns
1.5 3.21.53.51.5 3.81.55ns
1
1
2
2
0---0---0---0---ns
---3.2---3.5---3.8---5ns
5---5---5---5---ns
1---1---1---1---ns
Unit
Notes:
1.These parameters are sampled and are not 100% tested
2.ZZ is an asynchronous signal. However, In order to be recognized on any given clock cycle, ZZ must meet the specified setup and hold
times as specified above.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS84018/32/36T/B-180/166/150/100
Sleep Mode Timing Diagram
~
CK
ADSP
ADSC
ZZ
tS
tH
tKC
tKH
tKL
tZZS
~
~
~
~
~
~
~
~
~
~
~
Snooze
tZZH
tZZR
Application Tips
Single and Dual Cycle Deselect
SCD devices force the use of “dummy read cycles” (read cycles that are launched normally but that are ended with the output drivers inactive) in
a fully synchronous environment. Dummy read cycles waste performance but their use usually assures there will be no bus contention in
transitions from reads to writes or between banks of RAMs. DCD SRAMs do not waste bandwidth on dummy cycles and are logically simpler to
manage in a multiple bank application (wait states need not be inserted at bank address boundary crossings) but greater care must be exercised
to avoid excessive bus contention.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS84018/32/36T/B-180/166/150/100
Ordering Information for GSI Synchronous Burst RAMS
2
Org
Part Number
1
TypePackage
(Mhz/
ns)
256K x 18GS84018T-180Pipeline/Flow ThroughTQFP180/8C
256K x 18GS84018T-166Pipeline/Flow ThroughTQFP166/8.5C
256K x 18GS84018T-150Pipeline/Flow ThroughTQFP150/10C
256K x 18GS84018T-100Pipeline/Flow ThroughTQFP100/12C
128K x 32GS84032T-180Pipeline/Flow ThroughTQFP180/8C
128K x 32GS84032T-166Pipeline/Flow ThroughTQFP166/8.5C
128K x 32GS84032T-150Pipeline/Flow ThroughTQFP150/10C
128K x 32GS84032T-100Pipeline/Flow ThroughTQFP100/12C
128K x 36GS84036T-180Pipeline/Flow ThroughTQFP180/8C
128K x 36GS84036T-166Pipeline/Flow ThroughTQFP166/8.5C
128K x 36GS84036T-150Pipeline/Flow ThroughTQFP150/10C
128K x 36GS84036T-100Pipeline/Flow ThroughTQFP100/12C
256K x 18GS84018T-180IPipeline/Flow ThroughTQFP180/8INot Available
256K x 18GS84018T-166IPipeline/Flow ThroughTQFP166/8.5I
256K x 18GS84018T-150IPipeline/Flow ThroughTQFP150/10I
256K x 18GS84018T-100IPipeline/Flow ThroughTQFP100/12I
128K x 32GS84032T-180IPipeline/Flow ThroughTQFP180/8INot Available
128K x 32GS84032T-166IPipeline/Flow ThroughTQFP166/8.5I
128K x 32GS84032T-150IPipeline/Flow ThroughTQFP150/10I
128K x 32GS84032T-100IPipeline/Flow ThroughTQFP100/12I
128K x 36GS84036T-180IPipeline/Flow ThroughTQFP180/8INot Available
128K x 36GS84036T-166IPipeline/Flow ThroughTQFP166/8.5I
128K x 36GS84036T-150IPipeline/Flow ThroughTQFP150/10I
128K x 36GS84036T-100IPipeline/Flow ThroughTQFP100/12I
256K x 18GS84018B-180Pipeline/Flow ThroughBGA180/8C
256K x 18GS84018B-166Pipeline/Flow ThroughBGA166/8.5C
256K x 18GS84018B-150Pipeline/Flow ThroughBGA150/10C
256K x 18GS84018B-100Pipeline/Flow ThroughBGA100/12C
128K x 32GS84032B-180Pipeline/Flow ThroughBGA180/8C
Notes:
1.Customers requiring delivery in Tape and Reel should add the character “T” to the end of the part number. Example: GS84032T-7.5T.
2.The speed column indicates the cycle frequency (Mhz) of the device in Pipelined mode and the latency (ns) in Flow Through mode.
Each device is Pipeline / Flow through mode selectable by the user.
3.TA = C = Commercial Temperature Range. TA = I = Industrial Temperature Range.
4. GSI offers other versions this type of device in many different configurations and with a variety of different features, only some of which
are covered in this data sheet. See the GSI Technology web site for a complete listing of current offerings.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS84018/32/36T/B-180/166/150/100
2
Org
Part Number
1
TypePackage
(Mhz/
ns)
128K x 32GS84032B-166Pipeline/Flow ThroughBGA166/8.5C
128K x 32GS84032B-150Pipeline/Flow ThroughBGA150/10C
128K x 32GS84032B-100Pipeline/Flow ThroughBGA100/12C
128K x 36GS84036B-180Pipeline/Flow ThroughBGA180/8C
128K x 36GS84036B-166Pipeline/Flow ThroughBGA166/8.5C
128K x 36GS84036B-150Pipeline/Flow ThroughBGA150/10C
128K x 36GS84036B-100Pipeline/Flow ThroughBGA100/12C
256K x 18GS84018B-180IPipeline/Flow ThroughBGA180/8INot Available
256K x 18GS84018B-166IPipeline/Flow ThroughBGA166/8.5I
256K x 18GS84018B-150IPipeline/Flow ThroughBGA150/10I
256K x 18GS84018B-100IPipeline/Flow ThroughBGA100/12I
128K x 32GS84032B-180IPipeline/Flow ThroughBGA180/8INot Available
128K x 32GS84032B-166IPipeline/Flow ThroughBGA166/8.5I
128K x 32GS84032B-150IPipeline/Flow ThroughBGA150/10I
128K x 32GS84032B-100IPipeline/Flow ThroughBGA100/12I
128K x 36GS84036B-180IPipeline/Flow ThroughBGA180/8INot Available
128K x 36GS84036B-166IPipeline/Flow ThroughBGA166/8.5I
128K x 36GS84036B-150IPipeline/Flow ThroughBGA150/10I
128K x 36GS84036B-100IPipeline/Flow ThroughBGA100/12I
Notes:
1.Customers requiring delivery in Tape and Reel should add the character “T” to the end of the part number. Example: GS84032T-7.5T.
2.The speed column indicates the cycle frequency (Mhz) of the device in Pipelined mode and the latency (ns) in Flow Through mode.
Each device is Pipeline / Flow through mode selectable by the user.
3.TA = C = Commercial Temperature Range. TA = I = Industrial Temperature Range.
4. GSI offers other versions this type of device in many different configurations and with a variety of different features, only some of which
are covered in this data sheet. See the GSI Technology web site for a complete listing of current offerings.