
EMPEN T116 Sensor SPECIFICATION
Product Name:TF1-DIGITIZER;ASIC,11.6”,F110G4,EMP
Getac P/N: 412888700007
EMPEN P/N : 20160002
Firmware Version : 18

Battery free Electro-magnetic
0.01mm / 2560 LPI (see Note 5)
±0.4mm (see Note 1, 2, 3 and 5)
1-point max (see Note 1 and 5)
Up to 50° from vertical (see Note 5)
4 to 14mm above the Sensor Film (see Note 1 and 5)
133 PPS ( Pen hover at sensor center )
1024 levels (see Note 4 and 5)
1. Product Specifications
1.1 General Specifications
Note 1: The EM Sensor Board and Stylus at ordinary temperature.
Note 2: The pen held vertically at 0mm high from sensor film.
Note 3: See Picture1, the accuracy guaranteed region is 15mm or more inside region
from the active area edge.
Note 4: Pressure range is 20g≦200 levels and 650g≦1023 levels
Note 5: This function must be used with Getac TF1-DIGITIZER PEN unit
Picture1

TLSC3590ET88
Controller Board
1.2 Dimensional Outline of PCBA and Sensor Film
1.3 Electrical Specifications
1.3.1 Circuit Diagram
Signal Assignment

Current Consumption
Pen in touch
Current Consumption
Pen@10cm
Current Consumption
Standby mode
Keep standby
mode 40 min
will entry low
scan mode
1.3.2 Test Conditions
Ambient Temperature : 25+/- 5 ℃
Ambient Humidity : 65 +/- 16% ( RH)
Supply Voltage : VDD 5V

30℃/95%~61℃/95%,
12 hours for 30℃/95%,
12 hours for 61℃/95%,
one cycle is 24 hours ,
test time is 10days
MIL-STD-810G- 507.5
Humidity Procedure – II
Aggravated
1. All functions must be
normally
2. No oxidation on
screws.
3. No visual abnormal.
4. There shall not be any
cosmetic damage
5. T/S cannot allow the
abnormal status like
peel off, bubble .
High Temperature Test
(Operating)
MIL-STD-810G-501.5
Procedure II Operation
High Temperature Test
(Non-Operating)
33℃~71℃ ,10days
12 hours for 31℃,
12 hours for 71℃
one cycle is 24 hours,
test time is 10days
MIL-STD-810G-501.5
Procedure I
Low Temperature Test
(Operating)
MIL-STD-810G-502.5
Procedure II
Low Temperature Test
(Non-Operating)
MIL-STD-810G-502.5
Procedure I
-41℃~71℃ duration
1h, 3cycle ,total:6h
MIL-STD-810G-503.5
Procedure-I-C
Multi-cycle shock.
2. Reliability Test