GENNUM CORPORATION
522 - 41- 04
3
GS9035A
AC ELECTRICAL CHARACTERISTICS
VCC = 5.0V, VEE = 0V, TA = 25°C unless otherwise stated, RLF = 1.8K, C
LF1
= 15nF, C
LF2
= 3.3pF
PARAMETER CONDITION MIN
TYPICAL
1
MAX UNITS NOTES
TEST
LEVEL
Serial Data Rate SDI 143 - 540 Mb/s 1
Intrinsic Jitter
Psuedorandom (2
23
- 1)
270Mb/s - 185 See Figure 6 ps p-p 2 4
540Mb/s - 164
Intrinsic Jitter
Pathological
(SDI checkfield)
270Mb/s - 462 See Figure 7 ps p-p 2 1
360Mb/s - 308
540Mb/s - 260
Input Jitter Tolerance 270Mb/s 0.40 0.56 - UI p-p 3 1
540Mb/s 0.35 0.43 -
Lock Time Synchronous
Switch
t
SWITCH
< 0.5µs, 270Mb/s - 1 - µs 4 7
0.5µs < t
SWITCH
< 10ms - 1 - ms
t
SWITCH
> 10ms - 4 - ms
Lock Time
Asynchronous Switch
Loop Bandwidth = 6MHz at 540 Mb/s - 10 - ms 5 7
Carrier Loss Time R
LOCK
= 10k, C
LOAD
=5pF 0.5 1 2 µs 6 7
SDO to SCO
Synchronization
-200 0 200 ps 7
SDO, SCO Output Signal
Swing
75Ω DC load 600 800 1000 mV p-p 1
SDO, SCO Rise and Fall
Times
20% - 80% 200 300 400 ps 7
NOTES
1. TYPICAL - measured on EB-RD35A board, T
A
= 25°C.
2. Characterized 6 sigma rms.
3. IJT measured with sinusoidal modulation beyond Loop Bandwidth (at 6.5MHz).
4. Synchronous switching refers to switching the input data from one source to another source which is at the same data rate (ie: line 10
switching for component NTSC).
5. Asynchronous switching refers to switching the input data from one source to another source which is at a different data rate.
6. Carrier Loss Time refers to the response of the SDO output from valid re-clocked input data to mute mode when the input signal is
removed.
TEST LEVEL
1. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges.
2. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges using correlated
test.
3. Production test at room temperature and nominal supply voltage.
4. QA sample test.
5. Calculated result based on Level 1,2, or 3.
6. Not tested. Guaranteed by design simulations.
7. Not tested. Based on characterization of nominal parts.
8. Not tested. Based on existing design/characterization data of similar product.