General Semiconductor 1N759A, 1N758A, 1N757A, 1N756A, 1N755A Datasheet

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SYMBOL VALUE UNIT
Zener Current (see Table “Characteristics”) Power Dissipation at TL= 75°C P
tot
500
(1)
Maximum Junction Temperature T
j
175 °C
Storage Temperature Range T
S
– 65 to +175 °C
NOTES:
(1) TLis measured 3/8” from body.
FEATURES
Silicon Planar Power Zener DiodesStandard Zener voltage tolerance is ±5% for
“A” suffix. Other tolerances are available upon request.
MECHANICAL DATA
Case: DO-35 Glass Case Weight: approx. 0.13 g
MAXIMUM RATINGS
Ratings at 25°C ambient temperature unless otherwise specified.
1N746 THRU 1N759
ZENER DIODES
1/6/98
SYMBOL MIN. TYP. MAX. UNIT
Thermal Resistance
R
thJA
300
(1)
°C/W
Junction to Ambient Air Forward Voltage
V
F
1.5 Volts
at IF= 200 mA
NOTES:
(1) Valid provided that leads at a distance of 3/8” from case are kept at ambient temperature.
NEW PRODUCT NEW PRODUCT NEW PRODUCT
min. 1.083 (27.5)
min. 1.083 (27.5)
max. .150 (3.8)
max.
Cathode
.020 (0.52)
Mark
max.
.079 (2.0)
DO-35
Dimensions are in inches and (millimeters)
1N746 THRU 1N759
ELECTRICAL CHARACTERISTICS
Ratings at 25°C ambient temperature unless otherwise specified.
Type
Number
Nominal
Zener Voltage
VZ@ I
ZT
(3)
(Volts)
Test
Current
I
ZT
(mA)
Maximum Zener Impedance
ZZT@ I
ZT
(1)
()
Maximum
Regulator Current
I
ZM
(2)
(mA)
Maximum Reverse Leakage Current
TA= 25°C
IR@ VR= 1V
(µA)
TA= 150°C
IR@ VR= 1V
(µA)
1N746A 3.3 20 28 110 10 30 1N747A 3.6 20 24 100 10 30 1N748A 3.9 20 23 95 10 30 1N749A 4.3 20 22 85 2 30 1N750A 4.7 20 19 75 2 30 1N751A 5.1 20 17 70 1 20 1N752A 5.6 20 11 65 1 20 1N753A 6.2 20 7 60 0.1 20 1N754A 6.8 20 5 55 0.1 20 1N755A 7.5 20 6 50 0.1 20 1N756A 8.2 20 8 45 0.1 20 1N757A 9.1 20 10 40 0.1 20 1N758A 10 20 17 35 0.1 20 1N759A 12 20 30 30 0.1 20
NOTES:
(1) The Zener Impedance is derived from the 1 KHZAC voltage which results when an AC current having an RMS value equal to 10% of the Zener current (IZT) is
superimposed on I
ZT
. Zener Impedance is measured at two points to insure a sharp knee on the breakdown curve and to eliminate unstable units. (2) Valid provided that leads at a distance of 3/8” from case are kept at ambient temperature. (3) Measured with device junction in thermal equilibrium.
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