The Fujitsu 5V-Only Flash memory cards are electrically erasable and programmable memory cards capable of
storing and retrieving large amounts of data. The memory circuits are housed in a credit-card sized 68-pin
package. Internal circuit is protected by two metal panels, one at the top and the other at the bottom of the card,
that help to reduce chip damage from electrostatic discharge.
A unique feature of the Fujitsu memory cards allows the user to organize the card into either an 8-bit or a 16-bit
bus configuration. All cards are portable and operate on low power at high speed.
In accordance with the Personal Computer Memory Card Internal Association (PCMCIA) and Japan Electrical
Industry Development Association (JEID A) industry standard specifications, Flash memory cards offer additional
EEPROM memory that is used to store attribute data. The attribute memory is a Flash memory card option.
(See page 3 for description of the three available options.)
PRODUCT LINE & FEATURES
■
• Meet PCMCIA and JEIDA industry standards for 68-pin memory card
Type I : 85.6 mm × 54.0 mm × 3.3 mm
•+5 V±5% power supply program and erase
• Command control for Automated Program / Automated Erase operation
• Erase Suspend Read / Program Capability (Only Erase Suspend Read is possible for MB98A81063)
• 128 KB Sector Erase (at ×16 mode)
• Any Combination of Sectors Erase and Full Chip Erase
• Detection of completion of program/erase operation with Data
• Ready/Busy Output with R/B (Except for MB98A81063)
• Reset Function with RESET pin (Except for MB98A81063)
The data in the common and attribute memory can be read with “OE=VIL” and “WE=VIH”. The address is selected
with A
The following 1) and 2) are the descriptions for Common Memory Read and Attribute Memory Read mode.
(1) Common Memory Read
(2) Attribute Memory Read
2.Standby Mode
3.Output Disable Mode
4.Write Mode
(1) Common Memory Wr ite
(2) Attribute Memory Write
5.Command Definitions
6.Automated Program Capability
7.Automated Chip Erase Capability
to A24. And CE1 and CE2 select output mode (× 8/× 16 output mode, See “FUNCTION TRUTH TABLES”.).
0
- Two modes of Common Memory Read, reading the data in memory array and Intelligent ID are available.
The card enter each Read mode by writing “Read Memory/Reset Command” or “Intelligent ID Read Command”.
The card automatically resets to the condition of Common Memory Read mode upon initial power-up.
- The data on the attribute memory can be read with “REG
- An address on attribute memory can be selected with A
-CE1 and CE2 at “VIH” place the card in Standby mode. D0 to D15 are placed in a high-Z state independent of
the status “OE
- The outputs are disabled with OE and WE at “VIH”. D0 to D15 are placed in high-Z state.
- The card is in Write mode with “OE
- Commands can be written at the Write mode. See “5.Command Definitions”.
- Two types of the Write mode, “WE
-REG
- Attribute memory is not controlled by writing Commands. And attribute memory has the Data polling function,
- User can select the card operation by writing the specific address and data sequences into the command
- Programming operation can swich the data from “1” to “0”.
- The data is programmed on a byte-by-byte or word-by-word basis.
- The card will automatically provide adequate internally generated programming pulses and verify the
- Addresses are latched at falling edge of WE
- We can check whether a byte (word) progr amming operation is completed successfully b y sequence flug with
- Any commands written to the chip during programming operation will be ignored.
- We can execute chip erase operation by 6 bus cycle operation. Chip erase does not require the user to pre-
- The card returns to Common Memory Read mode automatically after the chip erasing is completed.
at L-level selects Attrib ute memory and “OE=VIH”, “WE and CE=VIL” place it in write mode. Two types of
the write mode, “WE
which can detect whether the attribute memory status is in programming operation. When the read operation
is executed at programming cycle, the opposite data is output from D
written data is output from D
register. If incollect address and data are written or improper sequence is done, the card is reseted to read
mode. See “COMMAND DEFINISION TABLE”.
programmed cell margine by writing four bus cycle operation. The card returns to Common Memory Read
mode automatically after the programming is completed.
rising edge of WE or CE on the command write cycle begins programming operation.
R/B
(Except for MB98A81063), Data Polling or Toggle Bit function. See “WRITE OPERATION STATUS”.
program prior to erase. Upon executing the Erase command sequence the chip automatically will program
and verify the entire memory for an all zero data pattern prior to electrical erase. The system is not required
to provide any controls or timing during these operations.
”, “WE” and “REG”.
=VIH” and “WE and CE=VIL”.
control” and “CE control” are available.
control” and “CE control” are available.
pin at the completion of programming operation.
7
or CE and data is latched at rising edge of WE or CE. The fourth
- Whether or not chip erase operation is completed successfully can be checked by sequence flug with R/B
(Except for MB98A81063), Data
- Any commands written to the chip during programming operation will be ignored.
8.Automated Sector Erase Capability
- We can execute the erase operation on any sectors by 6 bus cycle operation.
- A time-out of 50 µs (typ.) from the rising edge of the last Sector Erase command will initiate the Sector Erase
command(s) for other sector than the sector that sector erase command have been valid.
- Multiple sectors in a chip can be erased concurrently . This sequence is followed with writes of 30H to addresses
in other sectors desired to be concurrently erased. The time between writes 30H must be less than 50 µs,
otherwise that command will not be accepted. Any command other than Sector Erase or Erase Suspend during
this time-out period will reset the chip to Read mode. The automated sector erase begins after the 50 µs (typ.)
time out from the rising edge of WE
window is still open can be monitored with D
- Sector Erase does not require the user to pre-program prior to erase. The chip automatically programs “0” to
all memory locations in the sector(s) prior to electrical erase. The system is not required to provide any controls
or timing during these operations.
- The card returns to Common Memory Read mode automatically after the sector erasing is completed.
- Whether or not sector erase operation is completed successfully can be checked by sequence flug with R/B
Data Polling or Toggle Bit function. The sequence flug must be read from the address of the sector inv olv ed in
erase operation. See “WRITE OPERATION STATUS”.
9.Erase Suspend
- Erase Suspend command allows the user to interrupt the sector erase operation and then do data reads or
program from or to a non-busy sector in the chip which has the sector(s) suspended erase (only data read is
possible for MB98A81063). This command is applicab le only during the sector erase oper ation (including the
sector erase time-out period after the sector erase commands 30H) and will be ignored if written during the
chip erase or programming operation. Writing this command during the time-out will result in immediate
termination of the time-out period. The addresses are “don’t cares” in wrinting the Erase Suspend or Resume
commands in the chip.
- When the Erase Suspend command is written during a Sector Erase operation, the chip will enter the Erase
Suspend Read mode. User can read the data from other sectors than those in suspention. The read operation
from sectors in suspention results D
non-busy sectors by writing program commands for MB98A81183 and MB98A8xx7x.
- A read from a sector being erase suspended may result in invalid data.
10. Intelligent Identifier (ID) Read Mode
- Each common memory can execute an Intelligent Identifier oper ation, initiated by writing Intelligent ID command
(90H). Following the command write, a read cycle from address 00H retrieves the manufacture code, and a
read cycle from address 01H returns the device code as follows. To terminate the operation, it is necessary
to write Read/Reset command.
Part NumberMaker CodeDevice Code
MB98A8106304 h / 0404 hA4 h / A4A4 h
MB98A8118304 h / 0404 hD5 h / D5D5 h
MB98A81273/81373/1473/8157304 h / 0404 h3D h / 3D3D h
Polling or Toggle Bit function. See “WRITE OPERATION STATUS”.
pulse for the last Sector Erase command pulse. Whether the sector er ase
and D11.
3
toggling for MB98A81183 and MB98A8xx7x. User can program to
2/D10
,
11. Hardware Reset (not applied for MB98A81063)
- The Card may be reset by driving the RESET pin to VIH. The RESET pin must be kept High (VIH) for at least
500 ns. Any operation in progress will be terminated and the card will be reset to the read mode 20 µs after
the RESET pin is driven High. If a hardware reset occurs during a program operation, the data at that particular
location will be indeterminate.
- When the RESET pin is high and the internal reset is complete, the Card goes to standby mode and cannot
be accessed. Also, note that all the data output pins are High-Z for the duration of the RESET pulse. Once
the RESET pin is taken low, the Card requires 500 ns of wake up time until outputs are valid for read access.
- If hardware reset occurs during a erase operation, there is a possibility that the erasing sector(s) cannot be
used after this.
- The card has WP (Write Protect) switch for write lockout.
- T o a void initiation of a write cycle during V
than 3.2 V (typically 3.7 V). If V
CC
< V
circuits are disabled. Under this condition the device will reset to the read mode. Subsequent writes will be
ignored until the V
level is greater than V
CC
logically correct to prevent unintentional writes when V
-If V
would be less than V
CC
operation will not resume ev en if V
during program/erase operation, the operation will stop. And after that, the
LKO
returns recommended voltage level. Theref ore, prog ram command must
CC
be written again because the data on the address interrupted program operation is invalid. And regarding
interrupting erase operation, there is possibility that the erasing sector(s) cannot be used.
- Noise pulses of less than 5 ns (typical) on OE
FUNCTION TRUTH TABLE
■
MAIN MEMORY FUNCTION*1
power-up and power-do wn, a write cycle is locked out f or VCC less
CC
, the command register is disabled and all internal program/erase
LKO
It is the users responsibility to ensure that the control pins are
LKO.
is above 3.2 V.
CC
, CE or WE will not initiate a write cycle.
ModeRESET*3 REG
CE2CE1A0OEWE
WP
*2
Data Input/Output
D8 to D
D0 to D
15
WP SW
7
Hardware Reset HXXXXXXXHigh-Z
Standby
Read (×8 No.1)
Read (×8 No.1)H
Read (×8 No.2)
Read (×16)LD
Write (×8 No.1)
Output DisableHHigh-ZP
L
Write (×8 No.1)
Output DisableH
Write (×8 No.2)
Output DisableHHigh-ZP
Write (×16)
XHHXXXXHigh-Z
OUT
D
(Even Byte)
OUT
D
(Odd Byte)
High-Z
OUT
D
(Even Byte)
HL
H
L
L
LHX
X
L
L
High-Z
OUT
D
(Odd Byte)
H
HL
L
H
High-Z
D
(Odd Byte)
HL
IN
H
L
L
X
D
(Odd Byte)
LD
High-Z
IN
P or NP
IN
IN
L
Output DisableHHigh-ZP
NP
NP
P
NP
NP
Output DisableXXXXHHXHigh-ZP or NP
Notes:
*1:H =V
, L = VIL, X = Either VIL or VIH, WP SW = Write Protect Switch, P = Protect, NP = Non Protect
IH
*2:L-level is output when WPSW = NP. H-level is output when WPSW = P.
*3:Not available for MB98A81063.
CA: Chip Address.(address in chip selected by A
SA: Sector Address(address in 64 KB selected by A
PA:Program Address(address to be programmed)
RA: Read Address(address to be read)
IA:Intelligent ID read address (Manufacture Code 0000H, Device Code 0002H)
PD: Programming data
RD: Read data
ID:Intelligent Identifier (ID) Code
CCMA1, CCMA2:Command adddress for chip erase
SCMA1, SCMA2:Command address for sector erase
PCMA1, PCMA2:Command address for program
RCMA1, RCMA2:Command address for Read/Reset
ICMA1, ICMA2:Command address for intelligent ID read
14
, A22, A23 and A24)
0
, A17, A18, A19, A20, A21, A22, A23 and A24)
0
See “Command Address Table for
8-bit Mode” in page 16.
CA: Chip Address.(address in chip selected by A
SA: Sector Address(address in 128 KB selected by A
, A23 and A24)
22
, A18, A19, A20, A21, A22, A23 and A24)
17
PA:Program Address(address to be programmed)
RA: Read Address(address to be read)
IA:Intelligent ID read address (Manufacture Code 0000H, Device Code 0001H)
PD: Programming data
RD: Read data
ID:Intelligent Identifier (ID) Code
CCMA1, CCMA2:Command address for chip erase
SCMA1, SCMA2:Command address for sector erase
PCMA1, PCMA2:Command address for program
RCMA1, RCMA2:Command address for Read/Reset
See “Command Address Table for
16-bit Mode” in page 16.
ICMA1, ICMA2:Command address for intelligent ID read
*1: Address number is not contained “A
CCMA1(CA AND 000001h) OR AAAAh(CA AND 000001h) OR AAAhCA
CCMA2(CA AND 000001h) OR 5554h(CA AND 000001h) OR 554hCA
SCMA1(SA AND 000001h) OR AAAAh(SA AND 000001h) OR AAAhCA
SCMA2(SA AND 000001h) OR 5554h(SA AND 000001h) OR 554hCA
PCMA1(PA AND 000001h) OR AAAAh(PA AND 000001h) OR AAAhCA
PCMA2(PA AND 000001h) OR 5554h(PA AND 000001h) OR 554hCA
RCMA1(RA AND 000001h) OR AAAAh(RA AND 000001h) OR AAAhCA
RCMA2(RA AND 000001h) OR 5554h(RA AND 000001h) OR 554hCA
ICMA1(IA AND 000001h) OR AAAAh(IA AND 000001h) OR AAAhCA
ICMA1(IA AND 000001h) OR 5554h(IA AND 000001h) OR 554hCA
(1): Erase Suspended Sector (2): Non-Erase Suspended Sector
*1. Performing successive read operations from the erase-suspended sector will cause D
*2. Performing successive read operations from any address will cause D
, D14 to toggle.
6
, D10 to toggle.
2
*3. Reading the byte address being programmed while in the erase-suspend program mode will indicate logic
“1” at the D
, D10 bit. However, successive reads from the erase-suspended sector will cause D2, D10 to
2
toggle.
*4. Not applied for MB98A81063.
D7, D15 (Data Polling)
The card features Data Polling as a method to indicate to the host that the Program/Erase Operation are in
progress or completed. During the program operation an attempt to read the program address will produce the
compliment of the data last written to D
program address will produce the true data last written to D
read the erase address will produce a “0” at the D
attempt to read the device will produce a “1” at the D
For Chip Erase, the Data
Polling is v alid after the rising edge of the sixth WE pulse in the six write pulse sequence.
. Upon completion of the program operation, an attempt to read the
7/D15
. During the erase operation, an attempt to
7/D15
output. Upon completion of the erase operation an
7/D15
output.
7/D15
For sector erase, the Data Polling is valid after the last rising edge of the sector erase WE pulse. Even if the
device has completed the operation and D
still invalid. The valid data on D
to D7/D8 to D15 will be read on the successive read attempts.
0
has a valid data, the data outputs on D0 to D6/D8 to D14 may be
7/D15
The Data Polling feature is only active during the programming operation, erase operation, sector erase timeout, Erase Suspend Read mode and Erase Suspend Program mode.
D6, D14 (Toggle Bit l)
The card also features the “Toggle Bit” as a method to indicate to the host system that the Program/Erase
Operation are in progress or completed.
During an Program or Erase cycle, successive attempts to read (OE
result in D
toggling between one and zero . Once the Program or Erase cycle is completed, D6/D14 will stop
6/D14
toggling and valid data will be read on the next successive attempts. During programming, the Toggle Bit is
valid after the rising edge of the fourth WE
Bit is valid after the rising edge of the sixth WE
pulse in the four write pulse sequence. For chip erase, the Toggle
pulse in the six write pulse sequence. For sector erase, the
Toggle Bit is valid after the last rising edge of the sector erase WE
the sector time out.
Either CE
D5/D13 will indicate if the program or erase time has e xceeded the specified limits (internal pulse count). Under
these conditions D
cycle was not successfully completed. Data
If this failure condition occurs during sector erase operation, it specifies that a particular sector is bad and it
may not be reused, howe ver , other sectors are still functional and may be used for the program or erase oper ation.
The chip must be reset to use other sectors. Write the Reset command sequence to the chip, and then
execute Program or Erase command sequence. This allows the system to continue to use the other active
sectors in the chip.
If this failure condition occurs during the chip erase operation, it specifies that the entire chip is bad or
combination of sectors are bad.
If this failure condition occurs during the byte programming oper ation, it specifies that the entire sector containing
that byte is bad and this sector may not be reused, (other sectors are still functional and can be reused).
The D
failure condition ma y also appear if a user tries to program a non b lank location without er asing. In
5/D13
this case the card locks out and never completes the card operation. Hence, the system never reads a valid
data on D
bit and D6/D14 never stops toggling. Once the card has e xceeded timing limits , the D5/D13 bit will
7/D15
indicate a “1”. Please note that this is not a device failure condition since the device was incorrectly used.
will produce a “1”. This is a failure condition which indicates that the program or erase
5/D13
Polling is the only operating function of the card under this condition.
D3, D11 (Sector Erase Timer)
After the completion of the initial sector erase command sequence the sector erase time-out will begin. D3/D11
will remain low until the time-out is complete. Data
Polling and Toggle Bit are valid after the initial sector er ase
command sequence.
If Data
Polling or the Toggle Bit indicates the card has been written with a valid erase command, D3/D11 may
be used to determine if the sector erase timer window is still open. If D
is high (“1”) the internally controlled
3/D11
erase cycle has begun; attempts to write subsequent commands to the card will be ignored until the erase
operation is completed as indicated by Data
Polling or Toggle Bit. If D3/D11 is low (“0”), the card will accept
additional sector erase commands. To insure the command has been accepted, the system software should
check the status of D
prior to and following each subsequent sector erase command. If D3/D11 were high
3/D11
on the second status check, the command may not have been accepted.
Refer to Table : Hardware Sequence Flags.
D2, D10 (Toggle Bit ll, not applied for MB98A81063)
This Toggle bit, along with D6, can be used to determine whether the card is in the Erase operation or in Erase
Suspend.
Successive reads from the erasing sector will cause D
erase-suspended-read mode, successive reads from the er ase-suspended sector will cause D
to toggle during the Erase operation. If the card is in the
2
to toggle. When
2
the card is in the erase-suspended-program mode, successive reads from the byte address of the non-erase
suspended sector will indicate a logic ‘1‘ at the D
D
is different from D2 in that D6 toggles only when the standard Program or Erase, or Erase Suspend Prog ram
6
bit.
2
operation is in progress.
R/B (Ready/Busy, not applied for MB98A81063)
The card provides a R/B output pin as a way to indicate to the system that the program or erase operation are
either in progress or has been completed. If the output is low, the card is busy with either a program or erase
operation. If the card is placed in an Erase Suspend mode, the R/B
output will be high.
During programming, the R/B pin is driven low after the rising edge of the fourth WE pulse. During an erase
operation, the R/B
pin is driven low after the rising edge of the sixth WE pulse. The R/B pin will indicate a busy
Semiconductor devices can be permanently damaged by application of stress (voltage, current,
–0.5 to +6.0V
–0.5 to VCC +0.5V
–0.5 to VCC +0.5V
0 to +60°C
–30 to +70°C
temperature, etc.) in excess of absolute maximum ratings. Do not exceed these ratings.
RECOMMENDED OPERATING CONDITIONS
■
(Referenced to VSS)
ParameterSymbolMin.Typ.Max.Unit
V
Supply VoltageV
CC
CC
GroundGND—0—V
Ambient TemperatureT
WARNING:
The recommended operating conditions are required in order to ensure the normal operation of the
A
semiconductor device. All of the device’s electrical characteristics are warranted when the device is
operated within these ranges.
Always use semiconductor devices within their recommended operating conditions ranges Operation
outside these ranges may adversely affect reliability and could result in device failure.
No warranty is made with respect to uses, operating conditions, or combinations not represented on
the data sheet. Users considering application outside the listed conditions are advised to contact their
FUJITSU representatives beforehand.
4.755.05.25V
0—55°C
CAPACITANCE
■
ParameterSymbolMin.Max.Unit
Input Capacitance *1C
I/O Capacitance *2C
IN
I/O
Notes:
*1 This value does not apply to CE
1, CE2, WE, REG and RESET.
*2 This value does not apply to CD1, CD2, BVD1 and BVD2.
Input Leakage Current *1V
Output Leakage Current *2 V
= VCC max., VIN = 0 V or V
CC
= VCC max., VIN = 0 V or V
CC
V
= VCC max.
CC
CE1, CE2 = V
CC VIN
= 0 V or V
CC
CC
CC
Standby Current
= VCC max., CE1, CE2 = V
V
Active Read Current
CC
VIN = VIL or V
V
= VCC max., CE1, CE2 = V
CC
Cycle = 200 ns, I
IH
= 0 mA
OUT
IH
IL
Program CurrentProgram in progress (× 16 mode)I
Erase CurrentErase in progress (× 16 mode)I
Input Low Voltage—V
Input High Voltage—V
Output Low VoltageI
Output High Voltage *3I
= 3.2 mA, VCC = VCC min.V
OL
= 2.0 mA, VCC = VCC min.V
OH
Common Memory
Low V
Lock-out Voltage
CC
V
Attribute Memory—3.8—V
I
I
I
I
I
SB1
SB2
CC1
CC2
CC3
LI
LO
IH
OL
OH
LKO
Value
Unit
Min.Typ.Max.
—±1.0±20µA
—±1.0±20µA
—0.51.7mA
—4.08.0mA
—100160mA
——120mA
——120mA
IL
–0.3—0.8V
2.4—VCC+0.3V
——0.4V
3.8——V
3.23.74.2V
Notes:
*1 This value does not apply to CE
1, CE2, WE and REG.
*2 This value does not apply to BVD1, BVD2, CD1 and CD2.
*3 This value does not apply to BVD1 and BVD2.
Read Cycle TimetRC150—ns
Card Enable Access TimetCE—150ns
Address Access TimetACC—150ns
Output Enable Access TimetOE—75ns
Card Enable to Output in Low-Z*2tCLZ5—ns
Card Disable to Output in High-Z*2tCHZ—60ns
Output Enable to Output in Low-Z*2tOLZ5—ns
Output Disable to Output in High-Z*2tOHZ—60ns
Output Hold from Address, CE
, or OE Change *3tOH5—ns
Ready Time from RESETtRDY—20ms
Notes:
*1 Rise/Fall time < 5 ns.
*2 Transition is measured at the point of ±500 mV from steady state voltage. This parameter is specified using
Load ll in Fig. 11.
*3 This parameter is specified from the rising edge of OE
Write Cycle TimetWC150——ns
Address Setup TimetAS20——ns
Address Hold TimetAH20——ns
Data Setup TimetDS50——ns
Data Hold TimetDH20——ns
Read Recovery Time (WE
control)tGHWL10——ns
Read Recovery Time (CE
Output Enable Hold TimetOEH10——ns
Card Enable Setup TimetCS20——ns
Card Enable Hold TimetCH0——ns
Write Enable Pulse WidthtWP80——ns
Write Enable Setup TimetWS0——ns
Write Enable Hold TimetWH0——ns
Card Enable Pulse Width tCP100——ns
Duration of Byte Program Operation
Read Cycle TimetRRC250—ns
Address Access TimetRAA—250ns
Card Enable Access TimetRCE—250ns
Output Enable Access TimetROE—125ns
Output Hold from Address ChangetROH5—ns
Card Enable to Output Low-Z *2tRCLZ5—ns
Output Enable to Output Low-Z *2tROLZ5—ns
Card Enable to Output High-Z *2tRCHZ—60ns
Output Enable to Output High-Z *2*3tROHZ—60ns
Notes:
*1 Rise/Fall time < 5 ns.
*2 Transition is measured at the point of ±500 mV from steady state voltage. This parameter is specified using
Load ll in Fig. 3.
*3 This parameter is specified from the rising edge of OE
, CE1 or CE2, whichever occurs first.
ATTRIBUTE MEMORY PROGRAM CYCLE
ParameterSymbolMin.Max.Unit
Address Setup TimetRAS20—ns
Card Enable Setup TimetRCS0—ns
Output Enable Setup TimetOES20—ns
Write Pulse WidthtRWP1001000ns
Address Hold TimetRAH50—ns
Data Setup TimetRDS50—ns
Data Hold TimetRDH20—ns
Card Enable Hold TimetRCH0—ns
Output Enable Hold TimetROEH20—ns
Program TimetRWR—1ms
*1 VA = PA for Programming Cycle, VA = SA for Sector Erase, VA = CA for Chip Erase.
*2 See “FUNCTION TRUTH TABLE”.
*3 Program/Erase operation is finished.
*4 PD, 10H (1010H) or 30H (3030H)
CD1 and CD2 are to detect whether or not the card has been
correctly inserted. (See Fig. 12.)
When the memory card has been correctly inserted, CD1 and
CD2
are detected by the system. CD1, CD2 are tied to ground
on the card side as shown in Fig. 12.
(A)
(B)
To Top / Lineup / Index
CC
V
CD1
CC
V
CD2
1.2 WP: Write Protect Pins
This pin monitors the position of the Write Protect
switch. As shown in Fig. 13, the Flash memory card
has a Write Protect switch at the top of the card
To write to the card, the switch must be turned to the
“Non Protect” position and the WE
time, L-level is output on the WP pin.
T o prev ent writing to the card, the switch must be turned
to the ”Protect” position. At that time, H-lev el is output
on the WP pin.
0000 h01 h
0002 h03 h
0004 h53 h
0006 h0D h1D h0E h1E h3E h7E h
0008 hFF h
000A h15 h
000C h1C h
000E h04 h
0010 h01 h
0012 h46 h
0014 h55 h
0016 h4A h
0018 h49 h
001A h54 h
001C h53 h
001E h55 h
0020 h00 h
0022 h4D h
0024 h42 h
0026 h39 h
0028 h38 h
002A h41 h
002C h38 h
002E h30 h
0030 h30 h
46
0032 h36 h38 h37 h
0034 h33 h
0036 h73 h
0038 h65 h
003A h72 h
003C h69 h
0000 h01 hCommon memory device information tuple
0002 h03 hLink to next tuple
0004 h53 hFlash memory with 150 ns access time
0006 h7E h32MB device size
0008 hFF hEnd of list
000A h15 hLevel 1 version/product - information tuple
000C h1C hLink to next tuple
000E h04 h
0010 h01 h
0012 h46 h
0014 h55 h
0016 h4A h
0018 h49 h
001A h54 h
001C h53 h
001E h55 h
0020 h00 h
0022 h4D h
0024 h42 h
0026 h39 h
0028 h38 h
002A h41 h
002C h38 h
002E h30 h
0030 h30 h
Conformed to JEIDA Ver.4.2/PCMCIA 2.1
Product/Maker Information for “FUJITSU MB98A80070 series”
0032 h37 h
0034 h33 h
0036 h73 h
0038 h65 h
003A h72 h
003C h69 h
003E h65 h
0040 h73 h
0042 h00 h
0044 hFF hEnd of list
0046 h17 hAttribute memory device information tuple
0048 h03 hLink to next tuple
004A h41 hEEPROM with 250 ns access time
004C h01 h2 KB device size
004E hFF hEnd of list
0050 h18 hJEDEC device ID tuple for common memory
0052 h03 hLink to next tuple
0054 h04 hManufacture ID
To Top / Lineup / Index
0056 h3D hDevice ID
0058 hFF hEnd of list
005A h1E hDevice geometry information for common memory device tuple
005C h07 hLink to next tuple
005E h02 hSystem bus width is 2 Bytes
0060 h11 hErase block size is 64 KBytes
0062 h01 hRead block size is 1 Byte
0064 h01 hProgram block size is 1 Byte
0066 h01 hNo special partitioning requirements
0068 h01 hNon interleaved
006A hFF hEnd of list
006C h10 hChecksum tuple
006E h06 hLink to next tuple
0070 hCA h
0072 hFF h
0074 h3C h
0076 h00 h
FUJITSU LIMITED
Corporate Global Business Support Division
Electronic Devices
KAWASAKI PLANT, 4-1-1, Kamikodanaka
Nakahara-ku, Kawasaki-shi
Kanagawa 211-8588, Japan
Tel: 81(44) 754-3763
Fax: 81(44) 754-3329
To Top / Lineup / Index
All Rights Reserved.
The contents of this document are subject to change without
notice. Customers are advised to consult with FUJITSU sales
representatives before ordering.
http://www.fujitsu.co.jp/
North and South America
FUJITSU MICROELECTRONICS, INC.
Semiconductor Division
3545 North First Street
San Jose, CA 95134-1804, USA
Tel: (408) 922-9000
Fax: (408) 922-9179
FUJITSU MICROELECTRONICS ASIA PTE LTD
#05-08, 151 Lorong Chuan
New Tech Park
Singapore 556741
Tel: (65) 281-0770
Fax: (65) 281-0220
http://www.fmap.com.sg/
The information and circuit diagrams in this document are
presented as examples of semiconductor device applications,
and are not intended to be incorporated in devices for actual use.
Also, FUJITSU is unable to assume responsibility for
infringement of any patent rights or other rights of third parties
arising from the use of this information or circuit diagrams.
FUJITSU semiconductor devices are intended for use in
standard applications (computers, office automation and other
office equipment, industrial, communications, and measurement
equipment, personal or household devices, etc.).
CAUTION:
Customers considering the use of our products in special
applications where failure or abnormal operation may directly
affect human lives or cause physical injury or property damage,
or where extremely high levels of reliability are demanded (such
as aerospace systems, atomic energy controls, sea floor
repeaters, vehicle operating controls, medical devices for life
support, etc.) are requested to consult with FUJITSU sales
representatives before such use. The company will not be
responsible for damages arising from such use without prior
approval.
Any semiconductor devices have an inhereut chance of
failure. You must protect against injury, damage or loss from
such failures by incorporating safety design measures into your
facility and equipment such as redundancy, fire protection, and
prevention of over-current levels and other abnormal operating
conditions.
If any products described in this document represent goods or
technologies subject to certain restrictions on export under the
Foreign Exchange and Foreign Trade Law of Japan, the prior
authorization by Japanese government will be required for
export of those products from Japan.
F9811
FUJITSU LIMITED Printed in Japan
51
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