
CD4071BC • CD4081BC
Quad 2-Input OR Buffered B Series Gate •
Quad 2-Input AND Buffered B Series Gate
CD4071BC • CD4081BC Quad 2-Input OR Buffered B Series Gate • Quad 2-Input AND Buffered B Series Gate
October 1987
Revised January 1999
General Description
The CD4071BC and CD4081BC quad gates are monolithic
complementary MOS (CMOS) integrated circuits constructed with N- and P-ch annel enhancement mode transistors. They have equal source and sink current
capabilities and conform to standard B series output drive.
The devices also have buffered outputs which improve
transfer characteristics by providing very high gain.
All inputs protected a gainst stati c discharg e with dio des to
and VSS.
V
DD
Features
■ Low power TTL compatibility:
Fan out of 2 driving 74L or 1 driving 74LS
■ 5V–10V–15V parametric ratings
■ Symmetrical output characteristics
■ Maximum input leakage 1 µA at 15V over full
temperature range
Ordering Code:
Order Number Package Number Package Description
CD4071BCM M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150” Narrow
CD4071BCN N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide
CD4081BCM M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150” Narrow
CD4081BCN N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide
Devices are also available in Tape and Reel. Specify by appending the suffix letter “X ” t o t he ordering code.
Connection Diagrams
Pin Assignments for DIP and SOIC
CD4071B
CD4081B
Top View
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Top Vi ew

Schematic Diagrams
CD4071B
CD4071BC • CD4081BC
CD4081B
1
/4 of device shown
J = A + B
Logical “1” = HIGH
Logical “0” = LOW
*All inputs protected by sta ndard CMOS protect ion circuit.
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1
/4 of device shown
J = A • B
Logical “1” = HIGH
Logical “0” = LOW
All inputs protected by st andard CMOS protec t ion circuit.

Absolute Maximum Ratings(Note 1)
(Note 2)
Voltage at Any Pin −0.5V to VDD +0.5V
Power Dissipation (P
)
D
Dual-In-Line 700 mW
Small Outline 500 mW
Range −0.5 VDC to +18 V
V
DD
Storage Temperature (TS) −65°C to +150°C
Lead Temperature (T
)
L
(Soldering, 10 seconds ) 260°C
DC Electrical Characteristics (Note 2)
CD4071BC/CD4081BC
Symbol Parameter Conditions
I
Quiescent Device VDD = 5V 1 0.004 1 7.5 µA
DD
Current VDD = 10V 2 0.005 2 15 µA
V
LOW Level VDD = 5V 0.05 0 0.05 0.05 V
OL
Output Voltage VDD = 10V |IO| < 1 µA 0.05 0 0.05 0.05 V
V
HIGH Level VDD = 5V 4.95 4.95 5 4.95 V
OH
Output Voltage VDD = 10V |IO| < 1 µA 9.95 9.95 10 9.95 V
V
LOW Level VDD = 5V, VO = 0.5V 1.5 2 1.5 1.5 V
IL
Input Voltage VDD = 10V, VO = 1.0V 3.0 4 3.0 3.0 V
V
HIGH Level VDD = 5V, VO = 4.5V 3.5 3.5 3 3.5 V
IH
Input Voltage VDD = 10V, VO = 9.0V 7.0 7.0 6 7.0 V
I
LOW Level Output VDD = 5V, VO = 0.4V 0.52 0.44 0.88 0.36 mA
OL
Current VDD = 10V, VO = 0.5V 1.3 1.1 2.25 0.9 mA
(Note 3) VDD = 15V, VO = 1.5V 3.6 3.0 8. 8 2.4 mA
I
HIGH Level Output VDD = 5V, VO = 4.6V −0.52 −0.44 −0.88 −0.36 mA
OH
Current VDD = 10V, VO = 9.5V −1.3 −1.1 −2.25 −0.9 mA
(Note 3) VDD = 15V, VO = 13.5V −3.6 −3.0 −8.8 −2.4 mA
I
Input Current VDD = 15V, VIN = 0V −0.30 −10−5−0.30 −1.0 µA
IN
Note 3: IOH and IOL are tested one output at a ti m e.
VDD = 15V 4 0.006 4 30 µA
VDD = 15V 0.05 0 0.05 0.05 V
VDD = 15V 14.95 14.95 15 14.95 V
VDD = 15V, VO = 1.5V 4.0 6 4.0 4.0 V
VDD = 15V, VO = 13.5V 11.0 11.0 9 11.0 V
VDD = 15V, VIN = 15V 0.30 10−50.30 1.0 µA
Recommended Operating
Conditions
Operating Range (V
Operating Temperature Range (TA)
CD4071BC, CD4081BC −40°C to +85°C
Note 1: “Absolute Maximum Rat ings” are tho se values beyond which the
safety of the device cannot be guaranteed. E x c ept for “ Operating Tempera-
DC
ture Range” they are not mea nt to imply that the devices sh ould be operated at these limits. The table of “Electrical Characteristics” provides
conditions for actual device o peration.
Note 2: All voltages measured with res pect t o V
fied.
−40°C +25°C +85°C
Min Max Min Typ Max Min Max
)3 V
DD
unless otherwise s peci-
SS
DC
to 15 V
CD4071BC • CD4081BC
DC
Units
AC Electrical Characteristics (Note 4)
CD4071BC TA = 25°C, Input tr; tf = 20 ns, CL = 50 pF, RL = 200 kΩ, Typical temperature coefficient is 0.3%/°C
Symbol Parameter Conditions Typ Max Units
t
PHL
t
PLH
t
, t
THL
TLH
C
IN
C
PD
Note 4: AC Parameters are guaranteed by DC correlated testing.
Propagation Delay Time, VDD = 5V 100 250 ns
HIGH-to-LOW Lev el VDD = 10V 40 100 ns
VDD = 15V 3070ns
Propagation Delay Time, VDD = 5V 90 250 ns
LOW-to-HIGH Le vel VDD = 10V 40 100 ns
VDD = 15V 3070ns
Transition Time VDD = 5V 90 200 ns
VDD = 10V 50 100 ns
VDD = 15V 4080ns
Average Input Capacitance Any Input 5 7.5 pF
Power Dissipation Capacity Any Gate 18 pF
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AC Electrical Charac teristics (Note 5)
CD4081BC TA = 25°C, Input tr; tf = 20 ns, CL = 50 pF, RL = 200 kΩ, Typical temperature coefficient is 0.3%/°C
Symbol Parameter Conditions Typ Max Units
t
PHL
t
PLH
t
, t
THL
TLH
CD4071BC • CD4081BC
C
IN
C
PD
Note 5: AC Parameters are guara nt eed by DC correlated test ing.
Propagation Delay Time, VDD = 5V 100 250 ns
HIGH-to-LOW Level VDD = 10V 40 100 ns
VDD = 15V 30 70 ns
Propagation Delay Time, VDD = 5V 120 250 ns
LOW-to-HIGH Level VDD = 10V 50 100 ns
VDD = 15V 35 70 ns
Transition Time VDD = 5V 90 200 ns
VDD = 10V 50 100 ns
VDD = 15V 40 80 ns
Average Input Capacitance Any Input 5 7.5 pF
Power Dissipation Capacity Any Gate 18 pF
Typical Performance Characteristics
Typical Transfer
Characteristics
Typical Transfer
Characteristics
Typical Transfer
Characteristics
Typical Transfer
Characteristics
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Physical Dimensions in ches (millimeters) unless otherwise noted
CD4071BC • CD4081BC
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150” Narrow
Package Number M14A
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Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
CD4071BC • CD4081BC Quad 2-Input OR Buffered B Series Gate • Quad 2-Input AND Buffered B Series Gate
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or system s a re devices or syste ms
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant injur y to the
user.
Package Number N14A
2. A critical comp onent in any com ponent of a l ife support
device or system whose failure to perform can be reasonably expected to cause the failure of the life suppor t
device or system, or to affect its safety or effectiveness.
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Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.