Designed for WLL/MMDS/BWA or UMTS driver applications. Characterized
from 500 to 5000 MHz. Device is unmatched and is suitable for use in Class AB
Customer Premise Equipment (CPE) applications.
• Typical Single- Carrier W-CDMA Performance: V
130 mA, P
PAR = 8.5 dB @ 0.01% Probability on CCDF.
Power Gain — 10 dB
Efficiency — 25%
ACPR @ 5 MHz Offset — -43 dBc in 3.84 MHz Channel Bandwidth
• 9 Watts P1dB @ 3550 MHz, CW
• Excellent Phase Linearity and Group Delay Characteristics
• High Gain, High Efficiency and High Linearity
• RoHS Compliant
• In Tape and Reel. T1 Suffix = 1000 Units per 12 mm, 7 inch Reel.
= 12 Volts, IDQ =
DD
Document Number: MRFG35010AN
Rev. 2, 6/2009
MRFG35010ANT1
3.5 GHz, 9 W, 12 V
POWER FET
GaAs PHEMT
CASE 466-03, STYLE 1
PLD-1.5
PLASTIC
Table 1. Maximum Ratings
RatingSymbolValueUnit
Drain-Source VoltageV
Gate-Source VoltageV
RF Input PowerP
Storage Temperature RangeT
Channel Temperature
(1)
DSS
GS
stg
T
ch
in
15Vdc
-5Vdc
33dBm
-65 to +150°C
175°C
Table 2. Thermal Characteristics
CharacteristicSymbolValue
Thermal Resistance, Junction to Case
Case Temperature 77°C, 1 W CW
R
θ
JC
(2)
6.5°C/W
Table 3. ESD Protection Characteristics
Test MethodologyClass
Human Body Model (per JESD22-A114)2 (Minimum)
Machine Model (per EIA/JESD22-A115)A (Minimum)
Charge Device Model (per JESD22-C101)IV (Minimum)
Table 4. Moisture Sensitivity Level
Test MethodologyRatingPackage Peak TemperatureUnit
Per JESD22-A113, IPC/JEDEC J- STD-0203260°C
1. For reliable operation, the operating channel temperature should not exceed 150°C.
2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf
Select Documentation/Application Notes - AN1955.
.
Unit
Freescale Semiconductor, Inc., 2006, 2008- 2009. All rights reserved.
RF Device DataFreescale Semiconductor
MRFG35010ANT1
1
Table 5. Electrical Characteristics
Characteristic
Saturated Drain Current
(V
= 3.5 Vdc, VGS = 0 Vdc)
DS
Off State Leakage Current
= - 0.4 Vdc, VDS = 0 Vdc)
(V
GS
Off State Drain Current
(V
= 12 Vdc, VGS = - 2.2 Vdc)
DS
Off State Current
(V
= 28.5 Vdc, VGS = - 2.5 Vdc)
DS
Gate-Source Cut - off Voltage
(V
= 3.5 Vdc, IDS = 15 mA)
DS
Quiescent Gate Voltage
(V
= 12 Vdc, IDQ = 180 mA)
DS
Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD = 12 Vdc, IDQ = 130 mA, P
(TA = 25°C unless otherwise noted)
SymbolMinTypMaxUnit
I
DSS
I
GSS
I
DSO
I
DSX
V
GS(th)
V
GS(Q)
—2.9—Adc
—< 1100µAdc
—0.11mAdc
—215mAdc
-1.2-1.0- 0.7Vdc
-1.2- 0.95- 0.7Vdc
= 1 W Avg., f = 3550 MHz, Single- Carrier
out
W- CDMA, 3.84 MHz Channel Bandwidth Carrier. ACPR measured in 3.84 MHz Channel Bandwidth @ ±5 MHz Offset.
PAR = 8.5 dB @ 0.01% Probability on CCDF.
Power Gain
Drain Efficiency
G
ps
h
D
910—dB
2325—%
Adjacent Channel Power RatioACPR—-43-40dBc
Typical RF Performance (In Freescale Test Fixture, 50 οhm system) V
Output Power, 1 dB Compression Point, CW
= 12 Vdc, IDQ = 130 mA, f = 3550 MHz
DD
P
1dB
—9—W
MRFG35010ANT1
2
RF Device Data
Freescale Semiconductor
V
BIAS
C11
C10C9C8C7C6C5C18C17C16C15C14C13C12
C4
C19
V
SUPPLY
Z9
RF
INPUT
Z1Z2Z3Z5Z6Z7Z10 Z11Z13Z14Z17
C1
Z4
C3
C2
Z10.045″ x 0.689″ Microstrip
Z20.045″ x 0.089″ Microstrip
Z30.020″ x 0.360″ Microstrip
Z40.045″ x 0.029″ Microstrip
Z50.045″ x 0.061″ Microstrip
Z60.045″ x 0.055″ Microstrip
Z70.300″ x 0.125″ Microstrip
Z8, Z100.146″ x 0.070″ Microstrip
Z90.025″ x 0.485″ Microstrip
R1
Z8
Z12
Z15Z16
C22C21
Z110.400″ x 0.215″ Microstrip
Z120.025″ x 0.497″ Microstrip
Z130.025″ x 0.271″ Microstrip
Z140.025″ x 0.363″ Microstrip
Z150.025″ x 0.041″ Microstrip
Z160.045″ x 0.050″ Microstrip
Z170.045″ x 0.467″ Microstrip
PCBRogers 4350, 0.020″, ε
= 3.5
r
C20
Figure 1. 3.5 GHz Test Circuit Schematic
Table 6. 3.5 GHz Test Circuit Component Designations and Values
PartDescriptionPart NumberManufacturer
C1, C21, C220.5 pF Chip Capacitors08051J0R5BBTAVX
C20.2 pF Chip Capacitor06035J0R2BBTAVX
C30.5 pF Chip Capacitor06035J0R5BBTAVX
C4, C19, C206.8 pF Chip Capacitors08051J6R8BBTAVX
C5, C1810 pF Chip Capacitors100A100JP150XTAT C
C6, C17100 pF Chip Capacitors100A101JP150XTAT C
C7, C16100 pF Chip Capacitors100B101JP500XTAT C
C8, C151000 pF Chip Capacitors100B102JP50XTATC
C9, C140.1 µF Chip CapacitorsCDR33BX104AKWSKemet
C10, C1339K pF Chip Capacitors200B393KP50XTATC
C11, C1210 µF, 50 V Chip CapacitorsGRM55DR61H106KA88BMurata
R150 Ω Chip ResistorP51ETR-NDNewark
RF
OUTPUT
RF Device Data
Freescale Semiconductor
MRFG35010ANT1
3
C11
C10C9
C14 C13
C12
C1
C4
C6
C5
C2
C8
C7
C3
C15
C16
C17
C18
C19
R1
C20
C22C21
MRFG35010XX, Rev. 5
MRFG35010ANT1
4
Figure 2. 3.5 GHz Test Circuit Component Layout
RF Device Data
Freescale Semiconductor
TYPICAL CHARACTERISTICS
12
10
VDS = 12 Vdc, IDQ = 130 mA, f = 3550 MHz
8
Single−Carrier W−CDMA
3.84 MHz Channel Bandwidth
= 0.875 ∠ −131.0_
Γ
S
6
Γ
= 0.849 ∠ −145.8_
L
, TRANSDUCER GAIN (dB)
T
G
4
η
D
2
10
15
20253035
P
, OUTPUT POWER (dBm)
out
Figure 3. Single- Carrier W -CDMA Power Gain
and Drain Efficiency versus Output Power
−10
VDS = 12 Vdc, IDQ = 130 mA, f = 3550 MHz
Single−Carrier W−CDMA, 3.84 MHz Channel Bandwidth
Γ
−20
−30
= 0.875 ∠ −131.0_, ΓL = 0.849 ∠ −145.8_
S
IRL
50
40
G
T
30
20
, DRAIN EFFICIENCY (%)
D
10
η
0
40
−10
−15
−20
−40
−50
−60
ACPR, ADJACENT CHANNEL POWER RATIO (dBc)
15
ACPR
20
253035
P
, OUTPUT POWER (dBm)
out
Figure 4. Single- Carrier W -CDMA ACPR and
Input Return Loss versus Output Power
NOTE: All data is referenced to package lead interface. ΓS and Γ
All data is generated from load pull, not from the test circuit shown.
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Freescale Semiconductor, Inc. 2006, 2008- 2009. All rights reserved.
MRFG35010ANT1
Document Number: MRFG35010AN
Rev. 2, 6/2009
12
RF Device Data
Freescale Semiconductor
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