Designed for WLL/MMDS/BWA or UMTS driver applications with frequencies
from 1.8 to 3.6 GHz. Device is unmatched and is suitable for use in Class AB
linear base station applications.
Output Power — 300 mWatt
Power Gain — 11.5 dB
Efficiency — 25%
• 3 Watts P1dB @ 3.55 GHz
N
• Excellent Phase Linearity and Group Delay Characteristics
• High Gain, High Efficiency and High Linearity
• N Suffix Indicates Lead- Free Terminations. RoHS Compliant.
• In Tape and Reel. T1 Suffix = 1000 Units per 12 mm, 7 inch Reel.
3.5 GHz, 3 W, 12 V
POWER FET
GaAs PHEMT
CASE 466-03, STYLE 1
PLD-1.5
PLASTIC
RMATI
Table 1. Maximum Ratings
RatingSymbolValueUnit
Drain-Source VoltageV
Total Device Dissipation @ TC = 25°C
Derate above 25°C
Gate- Source VoltageV
RF Input PowerP
HIVE INF
Storage Temperature RangeT
Channel Temperature
Operating Case Temperature RangeT
Table 2. Thermal Characteristics
AR
Thermal Resistance, Junction to CaseClass ABR
Table 3. Moisture Sensitivity Level
Per JESD 22-A113, IPC/JEDEC J-STD - 0201260°C
1. For reliable operation, the operating channel temperature should not exceed 150°C.
2. Simulated.
(1)
CharacteristicSymbolValueUnit
Test MethodologyRatingPackage Peak TemperatureUnit
DSS
P
GS
stg
T
ch
θ
D
in
C
JC
15Vdc
(2)
8.1
(2)
0.05
-5Vdc
29dBm
-65 to +150°C
175°C
-20 to +85°C
(2)
18.5
W
W/°C
ARCHIVE INFORMATION
°C/W
Freescale Semiconductor, Inc., 2006, 2008. All rights reserved.
RF Device DataFreescale Semiconductor
MRFG35003NT1
1
C
O
O
Table 4. Electrical Characteristics
CharacteristicSymbolMinTypMaxUnit
Saturated Drain Current
(V
= 3.5 Vdc, VGS = 0 Vdc)
DS
Off State Leakage Current
(VGS = - 0.4 Vdc, VDS = 0 Vdc)
Off State Drain Current
(VDS = 12 Vdc, VGS = -2.5 Vdc)
Off State Current
(VDS = 28.5 Vdc, VGS = -2.5 Vdc)
Gate- Source Cut - off Voltage
(VDS = 3.5 Vdc, IDS = 6.5 mA)
Quiescent Gate Voltage
(VDS = 12 Vdc, ID = 55 mA)
Power Gain
N
(VDD = 12 Vdc, IDQ = 55 mA, f = 3.55 GHz)
Output Power, 1 dB Compression Point
(VDD = 12 Vdc, IDQ = 55 mA, f = 3.55 GHz)
Drain Efficiency
(VDD = 12 Vdc, IDQ = 55 mA, P
f = 3.55 GHz)
Adjacent Channel Power Ratio
(VDD = 12 Vdc, P
f = 3.55 GHz, W- CDMA, 8.5 P/A @ 0.01% Probability,
RMATI
64 CH, 3.84 MCPS)
= 0.30 W Avg., IDQ = 55 mA,
out
(TC = 25°C unless otherwise noted)
= 0.30 W Avg.,
out
I
DSS
I
GSS
I
DSO
I
DSX
V
GS(th)
V
GS(Q)
G
ps
P
1dB
h
D
ACPR—-42-40dBc
—1.3—Adc
—< 1.0100µAdc
——450µAdc
—< 1.07mAdc
-1.2-0.9- 0.7Vdc
-1.2-0.9- 0.7Vdc
1011.5—dB
—3—W
2325—%
HIVE INF
AR
MRFG35003NT1
2
ARCHIVE INFORMATION
RF Device Data
Freescale Semiconductor
C
O
O
V
GS
N
C10
C9C8C7C6C5C4
RF
INPUT
Z1Z2Z3Z4Z10 Z11Z12 Z13Z14Z16Z17Z18
C1C20
C13C14C15C16C17C18C19
R1
C2 C3C11 C12
Z5Z15
C21C22C24
Z9Z8Z6 Z7
C23
C26
C25C27C28
V
RF
OUTPUT
DD
Z1, Z180.125″ x 0.044″ Microstrip
Z20.409″ x 0.044″ Microstrip
Z30.326″ x 0.288″ Microstrip
Z40.333″ x 0.572″ Microstrip
Z5, Z150.527″ x 0.015″ Microstrip
RMATI
Table 5. 3.5 GHz Test Circuit Component Designations and Values
PartDescriptionPart NumberManufacturer
C1, C207.5 pF Chip Capacitors100A7R5JP150XAT C
C2, C3, C11, C123.9 pF Chip Capacitors (0805)08051J3R9BBTAV X
C4, C1310 pF Chip Capacitors100A100JP500XATC
C5, C14100 pF Chip Capacitors100A101JP500XATC
HIVE INF
C6, C15100 pF Chip Capacitors100B101JP500XATC
C7, C161000 pF Chip Capacitors100B102JP500XATC
C8, C173.9 µF Chip CapacitorsATC
C9, C180.1 µF Chip CapacitorsATC
C10, C1922 µF, 35 V Tantalum Surface Mount CapacitorsATC
Z6, Z8, Z10 0.050″ x 0.025″ Microstrip
Z7, Z90.097″ x 0.025″ Microstrip
Figure 1. 3.5 GHz Test Circuit Schematic
100 W Chip Resistor
Z110.082″ x 0.372″ Microstrip
Z120.169″ x 0.471″ Microstrip
Z130.196″ x 0.093″ Microstrip
Z140.313″ x 0.338″ Microstrip
Z160.200″ x 0.065″ Microstrip
Z170.472″ x 0.044″ Microstrip
PCBRogers 4350, 0.020″, εr = 3.5
ARCHIVE INFORMATION
Newark
RF Device Data
Freescale Semiconductor
MRFG35003NT1
3
C
O
O
C10
C9
C8C7
C2
R1
C6
C5
C4
C3
C15
C14
C13
C11
C16
C12
C17
C18
C19
N
C1
RMATI
HIVE INF
Freescale has begun the transition of marking Printed Circuit Boards (PCBs) with the Freescale Semiconductor
signature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will have
no impact on form, fit or function of the current product.
C21
C28
C22
C27
C23
C24
C25
C26
MRFG35003M
Rev 1
C20
AR
MRFG35003NT1
4
Figure 2. 3.5 GHz Test Circuit Component Layout
ARCHIVE INFORMATION
RF Device Data
Freescale Semiconductor
C
O
O
TYPICAL CHARACTERISTICS
N
RMATI
0
−10−10
−20−20
VDS = 12 Vdc, IDQ = 50 mA
f = 3.55 GHz, 8.5 P/A 3GPP W−CDMA
−30−30
ΓS = 0.813é−106.27_, ΓL = 0.734é−142.65_
−40−40
INPUT RETURN LOSS (dB)IRL,
−50−50
−60
0.01
P
, OUTPUT POWER (WATTS)
out
Figure 3. W- CDMA ACPR and Input Return
Loss versus Output Power
18
VDS = 12 Vdc, IDQ = 50 mA
f = 3.55 GHz, 8.5 P/A 3GPP W−CDMA
1640
ΓS = 0.813é−106.27_, ΓL = 0.734é−142.65_
1435
1230
0.1
IRL
ACPR
PAE
G
T
0
ACPR (dBc)
−60
1
45
HIVE INF
NOTE: All data is referenced to package lead interface. ΓS and Γ
All data is generated from load pull, not from the test circuit shown.
AR
1025
820
, TRANSDUCER GAIN (dB)
T
615
G
410
2
0.01
P
, OUTPUT POWER (WATTS)
out
Figure 4. Transducer Gain and Power Added
Efficiency versus Output Power
0.1
are the impedances presented to the DUT.
L
PAE, POWER ADDED EFFICIENCY (%)
5
1
ARCHIVE INFORMATION
RF Device Data
Freescale Semiconductor
MRFG35003NT1
5
C
O
O
Table 6. Class AB Common Source S- Parameters at V
f
S
11
GHz
0.500.879-160.588.64488.220.0386.940.520-161.47
0.550.879-163.337.92485.880.0395.420.520-163.29
0.600.877-166.037.31783.570.0393.800.520-165.21
0.650.876-168.546.81181.290.0392.370.520-167.01
0.700.877-170.646.38079.130.0390.940.521-168.58
0.750.875-172.685.98877.060.039-0.410.520- 170.13
0.800.877-174.565.65375.000.040-1.670.520- 171.60
0.850.876-176.255.31072.830.040-2.810.520- 172.89
0.900.874-177.905.05871.000.040-4.010.519- 174.37
0.950.875-179.544.82569.080.040-5.150.520- 175.84
1.000.876179.004.60867.270.040-6.310.520-177.05
1.050.875177.534.41165.380.040-7.280.519-178.37
N
1.100.874176.044.22463.510.040-8.430.520-179.67
1.150.875174.554.05661.690.040-9.470.521179.15
1.200.874173.133.89459.880.040- 10.470.520177.91
1.250.873171.633.74358.010.040-11.780.521176.52
1.300.876170.203.60956.260.040- 12.790.522175.56
1.350.871168.973.47954.570.040- 13.720.520174.80
1.400.878167.173.35552.760.040- 14.650.526173.34
1.450.876165.983.23751.140.040- 15.480.526172.88
RMATI
1.500.874162.453.11849.250.040- 16.800.528174.64
1.550.874161.173.02447.670.040- 17.760.529173.65
1.600.874160.092.92946.140.040- 18.510.530172.88
1.650.876159.002.84844.540.040- 19.270.530172.31
1.700.878157.852.76742.990.039- 20.030.531171.29
1.750.878156.842.69041.320.039- 20.890.533170.58
1.800.878155.942.62539.820.039- 21.530.533170.03
1.850.880154.932.55738.210.039- 22.220.533168.95
1.900.879154.052.49236.740.039- 23.010.536168.19
1.950.879153.242.43435.280.039- 23.740.535167.63
HIVE INF
2.000.881152.322.37933.680.039- 24.550.535166.68
2.050.881151.562.32532.270.040- 25.320.538165.91
2.100.880150.852.27930.900.040- 25.970.539165.46
2.150.881149.962.23629.410.040- 26.760.537164.56
2.200.881149.272.19127.930.040- 27.750.539163.66
AR
2.250.880148.612.15126.530.040- 28.560.541163.24
2.300.880147.742.12124.990.040- 29.320.539162.46
2.350.881146.912.08423.540.040- 29.950.539161.41
2.400.879146.122.05122.120.040- 30.720.540160.97
2.450.877145.072.02320.460.040- 31.440.539160.26
2.500.876144.071.99218.930.040- 32.360.539159.16
2.550.876143.151.97117.380.040- 32.950.541158.56
2.600.873142.101.94815.950.041- 33.580.538157.90
2.650.872140.881.92414.310.041- 34.410.538156.83
2.700.872139.831.90112.690.041- 35.220.538156.16
2.750.867138.601.88211.190.042- 36.040.537155.70
2.800.868137.261.8649.400.042- 37.160.535154.59
|S11|∠φ|S21|∠φ|S12|∠φ|S22|∠φ
= 12 Vdc, IDQ = 50 mA
DS
S
21
S
12
S
22
ARCHIVE INFORMATION
MRFG35003NT1
6
RF Device Data
Freescale Semiconductor
C
O
O
f
Table 6. Class AB Common Source S- Parameters at VDS = 12 Vdc, IDQ = 50 mA (continued)
The following table summarizes revisions to this document.
RevisionDateDescription
5Jan. 2008• Listed replacement part, p. 1
• Added Revision History, p. 9
N
RMATI
HIVE INF
AR
ARCHIVE INFORMATION
RF Device Data
Freescale Semiconductor
MRFG35003NT1
9
C
O
O
How to Reach Us:
Home Page:
www.freescale.com
Web Support:
http://www.freescale.com/support
N
USA/Europe or Locations Not Listed:
Freescale Semiconductor, Inc.
Technical Information Center, EL516
2100 East Elliot Road
Tempe, Arizona 85284
+1-800 - 521 - 6274 or +1 - 480 -768-2130
www.freescale.com/support
Freescale Semiconductor Japan Ltd.
Headquarters
ARCO Tower 15F
1-8 - 1, Shimo - Meguro, Meguro - ku,
Tokyo 153-0064
Japan
0120 191014 or +81 3 5437 9125
HIVE INF
support.japan@freescale.com
Asia/Pacific:
Freescale Semiconductor Hong Kong Ltd.
Technical Information Center
2 Dai King Street
Tai Po Industrial Estate
AR
Tai Po, N.T., Hong Kong
+800 2666 8080
support.asia@freescale.com
For Literature Requests Only:
Freescale Semiconductor Literature Distribution Center
P.O. Box 5405
Denver, Colorado 80217
1-800 - 441 - 2447 or 303 - 675 -2140
Fax: 303-675 - 2150
LDCForFreescaleSemiconductor@hibbertgroup.com
Information in this document is provided solely to enable system and software
implementers to use Freescale Semiconductor products. There are no express or
implied copyright licenses granted hereunder to design or fabricate any integrated
circuits or integrated circuits based on the information in this document.
Freescale Semiconductor reserves the right to make changes without further notice to
any products herein. Freescale Semiconductor makes no warranty, representation or
guarantee regarding the suitability of its products for any particular purpose, nor does
Freescale Semiconductor assume any liability arising out of the application or use of
any product or circuit, and specifically disclaims any and all liability, including without
limitation consequential or incidental damages. “Typical” parameters that may be
provided in Freescale Semiconductor data sheets and/or specifications can and do
vary in different applications and actual performance may vary over time. All operating
parameters, including “Typicals”, must be validated for each customer application by
customer’s technical experts. Freescale Semiconductor does not convey any license
under its patent rights nor the rights of others. Freescale Semiconductor products are
not designed, intended, or authorized for use as components in systems intended for
surgical implant into the body, or other applications intended to support or sustain life,
or for any other application in which the failure of the Freescale Semiconductor product
could create a situation where personal injury or death may occur. Should Buyer
purchase or use Freescale Semiconductor products for any such unintended or
unauthorized application, Buyer shall indemnify and hold Freescale Semiconductor
and its officers, employees, subsidiaries, affiliates, and distributors harmless against all
claims, costs, damages, and expenses, and reasonable attorney fees arising out of,
directly or indirectly, any claim of personal injury or death associated with such
unintended or unauthorized use, even if such claim alleges that Freescale
Semiconductor was negligent regarding the design or manufacture of the part.
Freescalet and the Freescale logo are trademarks of Freescale Semiconductor, Inc.
All other product or service names are the property of their respective owners.
Freescale Semiconductor, Inc. 2006, 2008. All rights reserved.
ARCHIVE INFORMATION
MRFG35003NT1
Document Number: MRFG35003N
Rev. 5, 1/2008
10
RoHS-compliant and/or Pb -free versions of Freescale products have the functionality and electrical
characteristics of their non-RoHS- compliant and/or non-Pb -free counterparts. For further
information, see http://www.freescale.com or contact your Freescale sales representative.
For information on Freescale’s Environmental Products program, go to http://www.freescale.com/epp.
RF Device Data
Freescale Semiconductor
Loading...
+ hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.