Freescale MRFE6S9130HR3, MRFE6S9130HSR3 Technical Data

Freescale Semiconductor
Technical Data
RF Power Field Effect Transistors
N-Channel Enhancement - Mode Lateral MOSFETs
Document Number: MRFE6S9130H
Rev. 1, 12/2008
Designed for N- CDMA, GSM and GSM EDGE base station applications with frequencies from 865 to 960 MHz. Suitable for multicarrier amplifier applications.
Typical Single-Carrier N -CDMA Performance: VDD = 28 Volts, IDQ = 950 mA,
P
= 27 Watts Avg., f = 880 MHz, IS- 95 CDMA (Pilot, Sync, Paging, Traffic
out
Codes 8 Through 13) Channel Bandwidth = 1.2288 MHz. PAR = 9.8 dB @
0.01% Probability on CCDF. Power Gain — 19.2 dB Drain Efficiency — 30.5% ACPR @ 750 kHz Offset — - 47.6 dBc in 30 kHz Bandwidth
Capable of Handling 10:1 VSWR, @ 32 Vdc, 880 MHz, 3 dB Overdrive, Designed for Enhanced Ruggedness
Features
Characterized with Series Equivalent Large - Signal Impedance Parameters
Internally Matched for Ease of Use
Qualified Up to a Maximum of 32 V
Operation
DD
Integrated ESD Protection
RoHS Compliant
In Tape and Reel. R3 Suffix = 250 Units per 56 mm, 13 inch Reel.
MRFE6S9130HR3
MRFE6S9130HSR3
880 MHz, 27 W AVG., 28 V
SINGLE N- CDMA
LATERAL N - CHANNEL
RF POWER MOSFETs
CASE 465-06, STYLE 1
NI- 780
MRFE6S9130HR3
CASE 465A-06, STYLE 1
NI- 780S
MRFE6S9130HSR3
Table 1. Maximum Ratings
Rating Symbol Value Unit
Drain-Source Voltage V
Gate- Source Voltage V
Storage Temperature Range T
Case Operating Temperature T
Operating Junction Temperature
(1,2)
DSS
GS
stg
C
T
J
-0.5, +66 Vdc
-0.5, +12 Vdc
- 65 to +150 °C
150 °C
225 °C
Table 2. Thermal Characteristics
Characteristic Symbol Value
Thermal Resistance, Junction to Case
Case Temperature 80°C, 130 W CW Case Temperature 75°C, 27 W CW
1. Continuous use at maximum temperature will affect MTTF.
2. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF calculators by product.
3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955.
R
θ
JC
(2,3)
0.45
0.51
Unit
°C/W
Freescale Semiconductor, Inc., 2007, 2008. All rights reserved.
RF Device Data Freescale Semiconductor
MRFE6S9130HR3 MRFE6S9130HSR3
1
Table 3. ESD Protection Characteristics
Test Methodology Class
Human Body Model (per JESD22- A114) 1A (Minimum)
Machine Model (per EIA/JESD22-A115) A (Minimum)
Charge Device Model (per JESD22-C101) IV (Minimum)
Table 4. Electrical Characteristics (T
Characteristic Symbol Min Typ Max Unit
Off Characteristics
Zero Gate Voltage Drain Leakage Current
(VDS = 66 Vdc, VGS = 0 Vdc)
Zero Gate Voltage Drain Leakage Current
(VDS = 28 Vdc, VGS = 0 Vdc)
Gate- Source Leakage Current
(VGS = 5 Vdc, VDS = 0 Vdc)
On Characteristics
Gate Threshold Voltage
(VDS = 10 Vdc, ID = 400 µAdc)
Gate Quiescent Voltage
(VDD = 28 Vdc, ID = 950 mAdc, Measured in Functional Test)
Drain-Source On - Voltage
(VGS = 10 Vdc, ID = 2.74 Adc)
Dynamic Characteristics
Reverse Transfer Capacitance
(VDS = 28 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Output Capacitance
(VDS = 28 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ = 950 mA, P Single- Carrier N - CDMA, 1.2288 MHz Channel Bandwidth Carrier. ACPR measured in 30 kHz Channel Bandwidth @ ±750 kHz Offset. PAR = 9.8 dB @ 0.01% Probability on CCDF.
Power Gain G
Drain Efficiency η
Adjacent Channel Power Ratio ACPR - 47.6 -46 dBc
Input Return Loss IRL -29 -9 dB
1. Part internally input matched.
(1)
= 25°C unless otherwise noted)
C
I
I
I
V
GS(th)
V
GS(Q)
V
DS(on)
C
C
DSS
DSS
GSS
rss
oss
ps
D
10 µAdc
1 µAdc
10 µAdc
1 2.1 3 Vdc
2 2.9 4 Vdc
0.22 0.5 Vdc
1.6 pF
66 pF
= 27 W Avg. N-CDMA, f = 880 MHz,
out
18 19.2 21 dB
29 30.5 %
MRFE6S9130HR3 MRFE6S9130HSR3
2
RF Device Data
Freescale Semiconductor
RF
INPUT
V
BIAS
V
SUPPLY
B1B2
+
C6C7
Z1
Z2 Z3 Z4 Z5 Z6
C1
C2
C3
L1
C4
C5
Z8
DUT
Z7
C8
Z9
Z10
C9
L2
Z11 Z12 Z13 Z14 Z15 Z16 Z17
C10 C11 C12
C14
C15
C16
C17
C18
C13
++++
C19
RF
OUTPUT
Z1 0.383 x 0.080 Microstrip Z2 1.250 x 0.080 Microstrip Z3 0.190 x 0.220 Microstrip Z4 0.127 x 0.220 Microstrip Z5 0.173 x 0.220 Microstrip Z6, Z11 0.200 x 0.220 x 0.620 Taper
Z7 0.220 x 0.630 Microstrip Z8 0.077 x 0.630 Microstrip Z9 0.146 x 0.630 Microstrip Z10 0.152 x 0.630 Microstrip Z12 0.184 x 0.220 Microstrip Z13 0.261 x 0.220 Microstrip
Z14 0.045 x 0.220 Microstrip Z15 0.755 x 0.080 Microstrip Z16 0.496 x 0.080 Microstrip Z17 0.384 x 0.080 Microstrip PCB Arlon CuClad 250GX-0300 - 55 - 22,
0.030, εr = 2.55
Figure 1. MRFE6S9130HR3(SR3) Test Circuit Schematic
Table 5. MRFE6S9130HR3(SR3) Test Circuit Component Designations and Values
Part Description Part Number Manufacturer
B1, B2 Ferrite Beads, Short 2743019447 Fair Rite
C1, C13, C14 47 pF Chip Capacitors ATC100B470JT500XT ATC
C2 8.2 pF Chip Capacitor ATC100B8R2BT500XT ATC
C3, C11 0.8- 8.0 pF Variable Capacitors, Gigatrim 27291SL Johanson
C4, C5 12 pF Chip Capacitors ATC100B120JT500XT ATC
C6 20 K pF Chip Capacitor ATC200B203KT50XT ATC
C7, C16, C17, C18 10 µF, 35 V Tantalum Chip Capacitors T491D106K035AT Kemet
C8, C9 10 pF Chip Capacitors ATC100B7R5JT500XT ATC
C10 11 pF Chip Capacitor ATC100B110JT500XT ATC
C12 0.6- 4.5 pF Variable Capacitor, Gigatrim 27271SL Johanson
C15 0.56 µF, 50 V Chip Capacitor C1825C564J5GAC Kemet
C19 470 µF, 63 V Electrolytic Capacitor ESME630ELL471MK25S United Chemi-Con
L1, L2 12.5 nH Inductors A04T- 5 Coilcraft
RF Device Data Freescale Semiconductor
MRFE6S9130HR3 MRFE6S9130HSR3
3
C19
C1
C7
B2
C2
B1
L1
C3
C6
900 MHz
Rev 02
C4 C8
C5 C9
CUT OUT AREA
C10
C16 C17 C18
C15
C11
C14
C12
C13
L2
Figure 2. MRFE6S9130HR3(SR3) Test Circuit Component Layout
MRFE6S9130HR3 MRFE6S9130HSR3
4
RF Device Data
Freescale Semiconductor
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