Designed for N- CDMA, GSM and GSM EDGE base station applications
with frequencies from 865 to 960 MHz. Suitable for multicarrier amplifier
applications.
Codes 8 Through 13) Channel Bandwidth = 1.2288 MHz. PAR = 9.8 dB @
0.01% Probability on CCDF.
Power Gain — 19.2 dB
Drain Efficiency — 30.5%
ACPR @ 750 kHz Offset — - 47.6 dBc in 30 kHz Bandwidth
• Capable of Handling 10:1 VSWR, @ 32 Vdc, 880 MHz, 3 dB Overdrive,
Designed for Enhanced Ruggedness
Features
• Characterized with Series Equivalent Large - Signal Impedance Parameters
• Internally Matched for Ease of Use
• Qualified Up to a Maximum of 32 V
Operation
DD
• Integrated ESD Protection
• RoHS Compliant
• In Tape and Reel. R3 Suffix = 250 Units per 56 mm, 13 inch Reel.
MRFE6S9130HR3
MRFE6S9130HSR3
880 MHz, 27 W AVG., 28 V
SINGLE N- CDMA
LATERAL N - CHANNEL
RF POWER MOSFETs
CASE 465-06, STYLE 1
NI- 780
MRFE6S9130HR3
CASE 465A-06, STYLE 1
NI- 780S
MRFE6S9130HSR3
Table 1. Maximum Ratings
RatingSymbolValueUnit
Drain-Source VoltageV
Gate- Source VoltageV
Storage Temperature RangeT
Case Operating TemperatureT
Operating Junction Temperature
(1,2)
DSS
GS
stg
C
T
J
-0.5, +66Vdc
-0.5, +12Vdc
- 65 to +150°C
150°C
225°C
Table 2. Thermal Characteristics
CharacteristicSymbolValue
Thermal Resistance, Junction to Case
Case Temperature 80°C, 130 W CW
Case Temperature 75°C, 27 W CW
1. Continuous use at maximum temperature will affect MTTF.
2. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access
MTTF calculators by product.
3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes - AN1955.
R
θ
JC
(2,3)
0.45
0.51
Unit
°C/W
Freescale Semiconductor, Inc., 2007, 2008. All rights reserved.
RF Device DataFreescale Semiconductor
MRFE6S9130HR3 MRFE6S9130HSR3
1
Table 3. ESD Protection Characteristics
Test MethodologyClass
Human Body Model (per JESD22- A114)1A (Minimum)
Machine Model (per EIA/JESD22-A115)A (Minimum)
Charge Device Model (per JESD22-C101)IV (Minimum)
Table 4. Electrical Characteristics (T
CharacteristicSymbolMinTypMaxUnit
Off Characteristics
Zero Gate Voltage Drain Leakage Current
(VDS = 66 Vdc, VGS = 0 Vdc)
Zero Gate Voltage Drain Leakage Current
(VDS = 28 Vdc, VGS = 0 Vdc)
Gate- Source Leakage Current
(VGS = 5 Vdc, VDS = 0 Vdc)
On Characteristics
Gate Threshold Voltage
(VDS = 10 Vdc, ID = 400 µAdc)
Gate Quiescent Voltage
(VDD = 28 Vdc, ID = 950 mAdc, Measured in Functional Test)
Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ = 950 mA, P
Single- Carrier N - CDMA, 1.2288 MHz Channel Bandwidth Carrier. ACPR measured in 30 kHz Channel Bandwidth @ ±750 kHz Offset.
PAR = 9.8 dB @ 0.01% Probability on CCDF.
Power GainG
Drain Efficiencyη
Adjacent Channel Power RatioACPR—- 47.6-46dBc
Input Return LossIRL—-29-9dB
1. Part internally input matched.
(1)
= 25°C unless otherwise noted)
C
I
I
I
V
GS(th)
V
GS(Q)
V
DS(on)
C
C
DSS
DSS
GSS
rss
oss
ps
D
——10µAdc
——1µAdc
——10µAdc
12.13Vdc
22.94Vdc
—0.220.5Vdc
—1.6—pF
—66—pF
= 27 W Avg. N-CDMA, f = 880 MHz,
out
1819.221dB
2930.5—%
MRFE6S9130HR3 MRFE6S9130HSR3
2
RF Device Data
Freescale Semiconductor
RF
INPUT
V
BIAS
V
SUPPLY
B1B2
+
C6C7
Z1
Z2Z3Z4Z5Z6
C1
C2
C3
L1
C4
C5
Z8
DUT
Z7
C8
Z9
Z10
C9
L2
Z11 Z12Z13Z14 Z15Z16Z17
C10C11C12
C14
C15
C16
C17
C18
C13
++++
C19
RF
OUTPUT
Z10.383″ x 0.080″ Microstrip
Z21.250″ x 0.080″ Microstrip
Z30.190″ x 0.220″ Microstrip
Z40.127″ x 0.220″ Microstrip
Z50.173″ x 0.220″ Microstrip
Z6, Z110.200″ x 0.220″ x 0.620″ Taper
Z70.220″ x 0.630″ Microstrip
Z80.077″ x 0.630″ Microstrip
Z90.146″ x 0.630″ Microstrip
Z100.152″ x 0.630″ Microstrip
Z120.184″ x 0.220″ Microstrip
Z130.261″ x 0.220″ Microstrip
Z140.045″ x 0.220″ Microstrip
Z150.755″ x 0.080″ Microstrip
Z160.496″ x 0.080″ Microstrip
Z170.384″ x 0.080″ Microstrip
PCBArlon CuClad 250GX-0300 - 55 - 22,
0.030″, εr = 2.55
Figure 1. MRFE6S9130HR3(SR3) Test Circuit Schematic
Table 5. MRFE6S9130HR3(SR3) Test Circuit Component Designations and Values