Freescale MRF5S9100MR1, MRF5S9100MBR1 Technical Data

C
O
O
Freescale Semiconductor
Technical Data
Replaced by MRF5S9100NR1/NBR1. There are no form, fit or function changes with this part replacement. N suffix added to part number to indicate transition to lead-free terminations.
RF Power Field Effect Transistors
N- Channel Enhancement -Mode Lateral MOSFETs
Designed for broadband commercial and industrial applications with frequencies up to 1000 MHz. The high gain and broadband performance of these devices make them ideal for large- signal, common-source amplifier applications in 26 volt base station equipment.
Typical Single-Carrier N-CDMA Performance @ 880 MHz, V
I
= 950 mA, P
DQ
Traffic Codes 8 Through 13) Channel Bandwidth = 1.2288 MHz. PAR =
9.8 dB @ 0.01% Probability on CCDF. Power Gain — 19.5 dB
N
Drain Efficiency — 28% ACPR @ 750 kHz Offset — - 46.8 dBc @ 30 kHz Bandwidth
Capable of Handling 10:1 VSWR, @ 26 Vdc, 880 MHz, 100 Watts CW Output Power
Characterized with Series Equivalent Large - Signal Impedance Parameters
Internally Matched for Ease of Use
Qualified Up to a Maximum of 32 V
Integrated ESD Protection
200°C Capable Plastic Package
RMATI
In Tape and Reel. R1 Suffix = 500 Units per 44 mm, 13 inch Reel.
= 20 Watts Avg., IS - 95 CDMA (Pilot, Sync, Paging,
out
Operation
DD
= 26 Volts,
DD
Document Number: MRF5S9100
Rev. 4, 5/2006
MRF5S9100MR1
MRF5S9100MBR1
880 MHz, 20 W AVG., 26 V
SINGLE N-CDMA
LATERAL N - CHANNEL
RF POWER MOSFETs
CASE 1486-03, STYLE 1
TO-270 WB - 4
PLASTIC
MRF5S9100MR1
CASE 1484-04, STYLE 1
MRF5S9100MBR1
Table 1. Maximum Ratings
Rating Symbol Value Unit
Drain-Source Voltage V
HIVE INF
Gate-Source Voltage V
Total Device Dissipation @ TC = 25°C
Derate above 25°C
Storage Temperature Range T
AR
Operating Junction Temperature T
Table 2. Thermal Characteristics
Characteristic Symbol Value
Thermal Resistance, Junction to Case
Case Temperature 80°C, 20 W CW
1. MTTF calculator available at http://www.freescale.com/rf. Select Tools/Software/Application Software/Calculators to access the MTTF calculators by product.
2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955.
R
DSS
GS
P
stg
θ
D
J
JC
- 0.5, +68 Vdc
- 0.5, +15 Vdc
336
1.92
- 65 to +150 °C
200 °C
(1,2)
0.52
TO-272 WB - 4
PLASTIC
W
W/°C
ARCHIVE INFORMATION
Unit
°C/W
NOTE - CAUTION - MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and packaging MOS devices should be observed.
Freescale Semiconductor, Inc., 2006. All rights reserved.
RF Device Data Freescale Semiconductor
MRF5S9100MR1 MRF5S9100MBR1
1
C
O
O
Table 3. ESD Protection Characteristics
Test Conditions Class
Human Body Model (per JESD22-A114) 1C (Minimum)
Machine Model (per EIA/JESD22 - A115) A (Minimum)
Charge Device Model (per JESD22-C101) IV (Minimum)
Table 4. Moisture Sensitivity Level
Test Methodology Rating Package Peak Temperature Unit
Per JESD 22-A113, IPC/JEDEC J - STD - 020 3 260 °C
Table 5. Electrical Characteristics (T
Characteristic Symbol Min Typ Max Unit
Off Characteristics
Zero Gate Voltage Drain Leakage Current
(VDS = 68 Vdc, VGS = 0 Vdc)
N
Zero Gate Voltage Drain Leakage Current
(VDS = 26 Vdc, VGS = 0 Vdc)
Gate-Source Leakage Current
(VGS = 5 Vdc, VDS = 0 Vdc)
On Characteristics
Gate Threshold Voltage
(VDS = 10 Vdc, ID = 400 µA)
Gate Quiescent Voltage
(VDS = 26 Vdc, ID = 950 mAdc)
RMATI
Drain-Source On- Voltage
(VGS = 10 Vdc, ID = 2.0 Adc)
Forward Transconductance
(VDS = 10 Vdc, ID = 6 Adc)
Dynamic Characteristics
Output Capacitance
(VDS = 26 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Reverse Transfer Capacitance
(VDS = 26 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD = 26 Vdc, IDQ = 950 mA, P Single-Carrier N- CDMA, 1.2288 MHz Channel Bandwidth Carrier. ACPR measured in 30 kHz Bandwidth @ ±750 kHz Offset. PAR = 9.8 dB
HIVE INF
@ 0.01% Probability on CCDF
Power Gain G
Drain Efficiency η
Adjacent Channel Power Ratio ACPR - 46.8 -45 dBc
AR
Input Return Loss IRL -19 -9 dB
1. Part is internally input matched.
(1)
= 25°C unless otherwise noted)
C
I
I
I
V
GS(th)
V
GS(Q)
V
DS(on)
C
C
DSS
DSS
GSS
g
fs
oss
rss
ps
D
10 µAdc
1 µAdc
1 µAdc
2 2.8 3.5 Vdc
3.7 Vdc
0.21 0.3 Vdc
7 S
70 pF
2.2 pF
= 20 W Avg. N-CDMA, f = 880 MHz,
out
18 19.5 dB
26 28 %
ARCHIVE INFORMATION
MRF5S9100MR1 MRF5S9100MBR1
2
RF Device Data
Freescale Semiconductor
C
O
O
V
BIAS
++
C22 C21
B1
+
C18C19C20
L1
L2
C17 C16 C15
+
V
SUPPLY
++
C13C14
RF
INPUT
Z1 Z2
C1
N
Z1, Z15 0.200 x 0.080 Microstrip Z2 0.105 x 0.080 Microstrip Z3 0.954 x 0.080 Microstrip Z4 0.115 x 0.220 Microstrip Z5 0.375 x 0.220 Microstrip Z6, Z11 0.200 x 0.220 x 0.620 Taper Z7 0.152 x 0.620 Microstrip
RMATI
Table 6. MRF5S9100MR1(MBR1) Test Circuit Component Designations and Values
Part Description Part Number Manufacturer
B1 Ferrite Bead, Surface Mount 2743019447 Fair-Rite
C1, C12, C18 18 pF Chip Capacitors 100B180JP 500X ATC
C2 0.6- 4.5 pF Variable Capacitor, Gigatrim 27271SL Johanson Dielectrics
C3, C11 0.8-8.0 pF Variable Capacitors, Gigatrim 27291SL Johanson Dielectrics
C4 6.2 pF Chip Capacitor 100B6R2JP 500X ATC
C5, C6 12 pF Chip Capacitors 100B120JP 500X ATC
C7, C8 11 pF Chip Capacitors 100B110JP 500X ATC
HIVE INF
C9, C10 5.1 pF Chip Capacitors 100B5R1JP 500X AT C
C13
C14, C15
C16, C17, C19
C20, C21
AR
C22
L1 7.15 nH Inductor 1606-7 CoilCraft
L2 22 nH Inductor B07T-5 CoilCraft
Z4 Z7
Z3
C3C2
Figure 1. MRF5S9100MR1(MBR1) Test Circuit Schematic
470 mF, 63 V Electrolytic Capacitor
22 mF, 50 V Tantalum Capacitors
0.56 mF, 50 V Chip Capacitors
47 mF, 16 V Tantalum Capacitors
100 mF, 50 V Electrolytic Capacitor
Z5
C4
Z6
C5
DUT
Z8
Z8 0.163 x 0.620 Microstrip Z9 0.238 x 0.620 Microstrip Z10 0.077 x 0.620 Microstrip Z12 0.381 x 0.220 Microstrip Z13 0.114 x 0.220 Microstrip Z14 1.052 x 0.080 Microstrip PCB Arlon GX0300, 0.030″, εr = 2.55
C8C6
Z11
Z12
Z10
Z9
C7
NACZF471M63V Nippon
T491X226K035AS Kemet
C1825C564J5GAC Kemet
T491D4T6K016AS Kemet
515D107M050BB6A Multicomp
C10
C9
Z13
Z14
C12
C11
RF
OUTPUT
Z15
ARCHIVE INFORMATION
RF Device Data Freescale Semiconductor
MRF5S9100MR1 MRF5S9100MBR1
3
C
O
O
C21 C20
C15 C14
N
RMATI
V
GG
CUT OUT AREA
WB2
C16C19
C8C6
L2
C7
C17
C10
C9
C11
C22
B1
C18
C1
C4
C2
Freescale has begun the transition of marking Printed Circuit Boards (PCBs) with the Freescale Semiconductor signature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will have no impact on form, fit or function of the current product.
WB1
L1
C5C3
C13
MRF9100M Rev 2
V
DD
C12
HIVE INF
AR
Figure 2. MRF5S9100MR1(MBR1) Test Circuit Component Layout
ARCHIVE INFORMATION
MRF5S9100MR1 MRF5S9100MBR1
4
RF Device Data
Freescale Semiconductor
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