Freescale MRF5S21090HR3, MRF5S21090HSR3 Technical Data

Freescale Semiconductor
Technical Data
RF Power Field Effect Transistors
N--Channel Enhancement--Mode Lateral MOSFETs
Designed for W--CDMA base station applications with frequencies from 2110 to 2170 MHz. Suitable for TDMA, CDMA and multicarrier amplifier applica­ti o ns . To be us ed in C l as s A B fo r P CN -- PCS / ce l lu l ar r a di o a nd W L L applications.
Typical 2--carrier W--CDMA Performance: VDD= 28 Volts, IDQ= 850 mA,
P
= 19 Watts Avg., f = 2112.5 MHz, Channel Bandwidth = 3.84 MHz,
out
PAR = 8.5 dB @ 0.01% Probability on CCDF.
Power Gain — 14.5 dB Drain Efficiency — 26% IM3 @ 10 MHz Offset — --37.5 dBc in 3.84 MHz Channel Bandwidth ACPR @ 5 MHz Offset — --40.5 dBc in 3.84 MHz Channel Bandwidth
Capable of Handling 10:1 VSWR, @ 28 Vdc, 2140 MHz, 90 Watts CW
Output Power
Features
Characterized with Series Equivalent Large--Signal Impedance Parameters
Internally Matched for Ease of Use
Qualified Up to a Maximum of 32 VDDOperation
Integrated ESD Protection
Lower Thermal Resistance Package
Low Gold Plating Thickness on Leads, 40
RoHS Compliant
In Tape and Reel. R3 Suffix = 250 Units per 56 mm, 13 inch Reel.
µ″ Nominal.
Document Number: MRF5S21090H
Rev. 3, 10/2008
MRF5S21090HR3
MRF5S21090HSR3
2110--2170 MHz, 19 W AVG., 28 V
2 x W -- CDMA
LATERAL N--CHANNEL
RF POWER MOSFETs
CASE 465 -- 06, STYLE 1
NI--780
MRF5S21090HR3
CASE 465A--06, STYLE 1
Table 1. Maximum Ratings
Rating Symbol Value Unit
Drain--Source Voltage V
LIFETIME BUY
Gate--Source Voltage V
Total Device Dissipation @ TC= 25°C
Derate above 25°C
Storage Temperature Range T
Case Operating Temperature T
Operating Junction Temperature T
Table 2. Thermal Characteristics
Characteristic Symbol Value
Thermal Resistance, Junction to Case
Case Temperature 80°C, 90 W CW Case Temperature 76°C, 19 W CW
1. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF calculators by product.
2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes -- AN1955.
R
DSS
GS
P
stg
θ
D
C
J
JC
NI--780S
MRF5S21090HSR3
--0.5, +65 Vdc
--0.5, +15 Vdc
269
1.5
--65 to +150 °C
150 °C
200 °C
(1,2)
0.65
0.69
W
W/°C
Unit
°C/W
LAST ORDER 3 OCT 08 LAST SHIP 14 MAY 09
Freescale Semiconductor, Inc., 2008. All rights reserved.
RF Device Data Freescale Semiconductor
MRF5S21090HR3 MRF5S21090HSR3
1
Table 3. ESD Protection Characteristics
Test Conditions Class
Human Body Model 1 (Minimum)
Machine Model M3 (Minimum)
Charge Device Model C7 (Minimum)
Table 4. Electrical Characteristics
Characteristic Symbol Min Typ Max Unit
Off Characteristics
Zero Gate Voltage Drain Leakage Current
(VDS= 65 Vdc, VGS= 0 Vdc)
Zero Gate Voltage Drain Leakage Current
(VDS= 28 Vdc, VGS= 0 Vdc)
Gate--Source Leakage Current
(VGS= 5 Vdc, VDS= 0 Vdc)
On Characteristics (DC)
Gate Threshold Voltage
(VDS= 10 Vdc, ID= 200 µAdc)
Gate Quiescent Voltage
(VDS= 28 Vdc, ID= 850 mAdc)
Drain--Source On--Voltage
(VGS= 10 Vdc, ID= 2 Adc)
Forward Transconductance
(VDS= 10 Vdc, ID= 2 Adc)
Dynamic Characteristics
Reverse Transfer Capacitance
(VDS= 28 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS= 0 Vdc)
Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD= 28 Vdc, IDQ= 850 mA, P 2--carrier W--CDMA, 3.84 MHz Channel Bandwidth Carriers. ACPR measured in 3.84 MHz Channel Bandwidth @ ±5 MHz Offset. IM3 measured in 3.84 MHz Bandwidth @ ±10 MHz Offset. PAR = 8.5 dB @ 0.01% Probability on CCDF.
Power Gain G
Drain Efficiency η
Intermodulation Distortion IM3 --37.5 --35 dBc
Adjacent Channel Power Ratio ACPR --40.5 --38 dBc
LIFETIME BUY
Input Return Loss IRL --15 --9 dB
1. Part is internally matched both on input and output.
(1)
(TC= 25°C unless otherwise noted)
I
I
I
V
GS(th)
V
GS(Q)
V
DS(on)
C
DSS
DSS
GSS
g
fs
rss
ps
D
10 µAdc
1 µAdc
1 µAdc
2.5 2.9 3.5 Vdc
3.9 Vdc
0.25 Vdc
5 S
1.7 pF
= 19 W Avg., f = 2112.5 MHz,
out
12.5 14.5 dB
24 26 %
MRF5S21090HR3 MRF5S21090HSR3
2
LAST ORDER 3 OCT 08 LAST SHIP 14 MAY 09
RF Device Data
Freescale Semiconductor
V
BIAS
R1
R2
C4
R3
C5
C3
C10
R4
W1
V
SUPPLY
+
C12C11
C13C8C7
RF
INPUT
C6
Z4
Z1 Z2 Z3 Z6 Z7
C1
C14
Z5
Z1 1.0856x 0.080Microstrip Z2 0.130x 0.080Microstrip Z3 0.230x 0.080Microstrip Z4 0.347x 0.208Microstrip Z5 0.090x 0.208Microstrip Z6 0.650x 0.176Taper Z7 0.623x 0.610Microstrip Z8 0.044x 0.881Microstrip Z9 0.044x 0.869Microstrip Z10 1.076x 0.446Microstrip Z11 0.320x 0.393Microstrip
C9
Z9
DUT
Z8
Z11 Z12 Z16 Z17 Z19 Z21
Z10
Z12 0.609x 0.220Microstrip Z13 0.290x 0.106Microstrip Z14 0.290x 0.106Microstrip Z15 0.080x 0.025Microstrip Z16 1.080x 0.160Microstrip Z17 0.180x 0.080Microstrip Z18 0.260x 0.147Microstrip Z19 0.500x 0.080Microstrip Z20 0.199x 0.147Microstrip Z21 0.365x 0.080Microstrip PCB Arlon GX0300--55--22, 0.03, εr= 2.55
Z13
Z14
Z15
C2
Z18 Z20
C15
Figure 1. MRF5S21090HR3(HSR3) Test Circuit Schematic
Table 5. MRF5S21090HR3(HSR3) Test Circuit Component Designations and Values
Part Description Part Number Manufacturer
C1 9.1 pF Chip Capacitor ATC100B9R1CT500XT ATC
C2 8.2 pF Chip Capacitor ATC100B8R2CT500XT ATC
C3 2.0 pF Chip Capacitor ATC100B2R0BT500XT ATC
C4, C12 0.1 µF Chip Capacitors CDR33BX104AKYS Kemet
LIFETIME BUY
C5 5.6 pF Chip Capacitor ATC100B5R6CT500XT ATC
C6 5.1 pF Chip Capacitor ATC100B5R1CT500XT ATC
C7 7.5 pF Chip Capacitor ATC100B7R5JT500XT ATC
C8 1.2 pF Chip Capacitor ATC100B1R2BT500XT ATC
C9, C10 0.56 µF Chip Capacitors 700A561MT150XT ATC
C11 1000 pF Chip Capacitor ATC100B102JT500XT ATC
C13 470 µF, 35 V Electrolytic Capacitor EKME630ELL471MK25S Nippon Chemi--Con
C14, C15 0.4 – 2.5 Variable Capacitors, Gigatrim 27281SL Johanson
R1
R2
R3, R4
W1 Wire Strap
1 k, 1/4 W Chip Resistor
560 k, 1/4 W Chip Resistor
12 , 1/4 W Chip Resistors
CRCW12061001FKEA Vishay
CRCW12065600FKEA Vishay
CRCW120612R0FKEA Vishay
RF
OUTPUT
RF Device Data Freescale Semiconductor
LAST ORDER 3 OCT 08 LAST SHIP 14 MAY 09
MRF5S21090HR3 MRF5S21090HSR3
3
W1
C13
V
DD
C3C4C5
C10
R2
R1
R3
V
GG
C9
C6
C7 C8
C11
R4
C12
C1
C14
CUT OUT AREA
Frees cale has b egu n th e tra nsit ion of ma rki ng Pr int e d Circu it Bo ard s (PC Bs) with the Free scal e Se mico ndu ctor signature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will have no impact on form, fit or function of the current product.
Figure 2. MRF5S21090HR3(HSR3) Test Circuit Component Layout
C2
C15
MRF5S21090 Rev 5
LIFETIME BUY
MRF5S21090HR3 MRF5S21090HSR3
4
LAST ORDER 3 OCT 08 LAST SHIP 14 MAY 09
RF Device Data
Freescale Semiconductor
TYPICAL CHARACTERISTICS
15
G
ps
14
13
η
12
IRL
11
10
9
, POWER GAIN (dB)
8
ps
IM3
G
7
6
ACPR
5
VDD= 28 Vdc, P 2--Carrier W--CDMA, 10 MHz Carrier Spacing
D
3.84 MHz Channel Bandwidth, PAR = 8.5 dB @ 0.01% Probability (CCDF)
f, FREQUENCY (MHz)
= 19 W (Avg.), IDQ= 850 mA
out
40
35
30
, DRAIN
D
25
η
20
--20
--25
--30
--35
--40
--45
2200218021602140212021002080
EFFICIENCY (%)
--10
--15
--20
--25
--30
IM3 (dBc), ACPR (dBc)
INPUT RETURN LOSS (dB)IRL,
--35
Figure 3. 2--Carrier W-- CDMA Broadband Performance
17
VDD= 28 Vdc f1 = 2135 MHz, f2 = 2145 MHz
IDQ= 1200 mA
16
1000 mA
15
850 mA
14
650 mA
, POWER GAIN (dB)
ps
G
13
450 mA
12
Two--Tone Measurement, 10 MHz Tone Spacing
1
P
, OUTPUT POWER (WATTS) PEP
out
10
100
Figure 4. Two--Tone Power Gain versus
Output Power
--15 VDD= 28 Vdc
f1 = 2135 MHz, f2 = 2145 MHz
--20 Two--Tone Measurement, 10 MHz Tone Spacing
--25
--30
--35
IMD,THIRD ORDER
--40
--45
INTERMODULATION DISTORTION (dBc)
--50
650 mA
1
P
IDQ= 450 mA
1200 mA
10
, OUTPUT POWER (WATTS) PEP
out
1000 mA
850 mA
100
Figure 5. 3rd Order Intermodulation Distortion
versus Output Power
LIFETIME BUY
--20
--25 3rd Order
--30
--35
5th Order
--40
--45 7th Order
--50
INTERMODULATION DISTORTION (dBc)IMD,
--55
--60
0.1
Figure 6. Intermodulation Distortion Products
RF Device Data Freescale Semiconductor
VDD= 28 Vdc, P Two--Tone Measurements (f1 + f2)/2 = Center Frequency of 2140 MHz
1
TWO--TONE SPACING (MHz)
= 90 W (PEP), IDQ= 850 mA
out
versus Tone Spacing
57
55
53
P1dB = 50.47 dBm (111.4 W)
51
49
, OUTPUT POWER (dBm)
out
P
47
45
10
30
P3dB = 51.17 dBm (130.9 W)
VDD= 28 Vdc, IDQ= 850 mA Pulsed CW, 8 µsec(on), 1 msec(off) f = 2140 MHz
32 34 36 38 40
Pin, INPUT POWER (dBm)
Figure 7. Pulse CW Output Power versus
Ideal
Actual
42
LAST ORDER 3 OCT 08 LAST SHIP 14 MAY 09
Input Power
MRF5S21090HR3 MRF5S21090HSR3
5
TYPICAL CHARACTERISTICS
--1
5
4
0
η
,
D
R
A
I
N
E
F
F
I
C
I
E
N
C
Y
(
%
)
,
G
,
P
O
W
E
R
G
A
I
N
(
d
B
)
1
0
9
.
0
VDD= 28 Vdc, IDQ= 850 mA, f1 = 2135 MHz,
35
f2 = 2145 MHz, 2 x W--CDMA, 10 MHz @ 3.84 MHz Bandwidth, PAR = 8.5 dB
30
@ 0.01% Probability (CCDF)
25
ps
20
15
10
D
G
ps
IM3
5
0 --55
1 10
P
, POWER (WATTS) W--CDMA
out
η
D
ACPR
Figure 8. 2--Carrier W-- CDMA ACPR, IM3,
Power Gain and Drain Efficiency
versus Output Power
W--CDMA TEST SIGNAL
--20
--25
--30
--35
--40
--45
--50
)
2
8
10
7
10
IM3 (dBc), ACPR (dBc)
MTTF FACTOR (HOURS x AMPS
6
10
100
120 140 160 180 200
TJ, JUNCTION TEMPERATURE (°C)
This above graph displays calculated MTTF in hours x ampere drain current. Life tests at elevated temperatures have correlated to better than ±10% of the theoretical prediction for metal failure. Divide MTTF factor by I
2
for MTTF in a particular application.
D
Figure 9. MTTF Factor versus Junction Temperature
220
2
100
10
1
0.1
0.01 W--CDMA. ACPR Measured in 3.84 MHz Channel
Bandwidth @ ±5 MHz Offset. IM3 Measured in
LIFETIME BUY
.001
3.84 MHz Bandwidth @ ±10 MHz Offset. PAR =
8.5 dB @ 0.01% Probability on CCDF
0001
0
2 4 6 8
PEAK--TO--AVERAGE (dB)
Figure 10. CCDF W--CDMA 3GPP, Test Model 1,
64 DPCH, 67% Clipping, Single Carrier Test Signal
--20
--30
--40
--50
--60
--70
(dB)
--80
--90
--100
--IM3 in
3.84 MHz BW
--110
--120
10
3.84 MHz Channel BW
--ACPR in
3.84 MHz BW
f, FREQUENCY (MHz)
+ACPR in
3.84 MHz BW
+IM3 in
3.84 MHz BW
205 15100--5--10--15--20--25 25
Figure 11. 2-Carrier W-CDMA Spectrum
LAST ORDER 3 OCT 08 LAST SHIP 14 MAY 09
MRF5S21090HR3 MRF5S21090HSR3
RF Device Data
6
Freescale Semiconductor
f = 2200 MHz
Z
load
f = 2200 MHz
f = 2100 MHz
Z
source
Zo= 10
f = 2100 MHz
LIFETIME BUY
VDD= 28 Vdc, IDQ= 850 mA, P
f
MHz
2100
2120
2160
2200 1.8 -- j1.63.0 -- j4.0
Z
= Test circuit impedance as measured from
source
Z
= Test circuit impedance as measured
load
Input Matching Network
Z
source
3.4 -- j5.1
3.2 -- j5.4
3.0 -- j4.4
gate to ground.
from drain to ground.
Device Under Test
Z
source
out
Z
= 19 W Avg.
Z
load
2.4 -- j2.0
2.2 -- j2.1
2.1 -- j1.9
load
Output Matching Network
LAST ORDER 3 OCT 08 LAST SHIP 14 MAY 09
RF Device Data Freescale Semiconductor
Figure 12. Series Equivalent Source and Load Impedance
MRF5S21090HR3 MRF5S21090HSR3
7
PACKAGE DIMENSIONS
B
B
(FLANGE)
bbb B
H
E
A A
G
D
M
T
(FLANGE)
Q
1
2
M
A
2X
3
K
M
(INSULATOR)
M
M
bbb B
T
(LID)
N
M
ccc B
T
M
bbb B
M
A
M
A
M
A
T
M
M
M
M
ccc B
aaa B
A
T
M
A
T
(LID)
R
M
(INSULATOR)
S
M
M
M
C
SEATING
T
PLANE
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M--1994.
2. CONTROLLING DIMENSION: INCH.
3. DELETED
4. DIMENSION H IS MEASURED 0.030 (0.762) AWAY FROM PACKAGE BODY.
DIM MIN MAX MIN MAX
A 1.335 1.345 33.91 34.16 B 0.380 0.390 9.65 9.91 C 0.125 0.170 3.18 4.32 D 0.495 0.505 12.57 12.83 E 0.035 0.045 0.89 1.14 F 0.003 0.006 0.08 0.15 G 1.100 BSC 27.94 BSC H 0.057 0.067 1.45 1.70 K 0.170 0.210 4.32 5.33 M 0.774 0.786 19.66 19.96 N 0.772 0.788 19.60 20.00 Q .118 .138 3.00 3.51 R 0.365 0.375 9.27 9.53
S 0.365 0.375 9.27 9.52 aaa 0.005 REF 0.127 REF bbb 0.010 REF 0.254 REF ccc 0.015 REF 0.381 REF
F
STYLE 1:
PIN 1. DRAIN
2. GATE
3. SOURCE
MILLIMETERSINCHES
CASE 465--06
ISSUE G
NI--780
MRF5S21090HR3
U
4X
(FLANGE)
B
B
(FLANGE)
H
A
M
bbb B
E
(FLANGE)
NOTES:
Z
4X
1
2X
2
(LID)
K
D
M
A
T
M
(LID)
N
M
ccc B
(INSULATOR)
M
M
bbb B
C
3
(LID)
M
A
T
A
T
M
M
M
M
ccc B
M
aaa B
R
M
(INSULATOR)
S
M
M
M
A
T
A
T
F
SEATING
T
A
PLANE
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M--1994.
2. CONTROLLING DIMENSION: INCH.
3. DELETED
4. DIMENSION H IS MEASURED 0.030 (0.762) AWAY FROM PACKAGE BODY.
DIM MIN MAX MIN MAX
A 0.805 0.815 20.45 20.70 B 0.380 0.390 9.65 9.91 C 0.125 0.170 3.18 4.32 D 0.495 0.505 12.57 12.83
E 0.035 0.045 0.89 1.14
F 0.003 0.006 0.08 0.15 H 0.057 0.067 1.45 1.70 K 0.170 0.210 4.32 5.33 M 0.774 0.786 19.61 20.02 N 0.772 0.788 19.61 20.02 R 0.365 0.375 9.27 9.53
S 0.365 0.375 9.27 9.52 U ------ 0.040 ------ 1.02
Z ------ 0.030 ------ 0.76
aaa 0.005 REF 0.127 REF
bbb 0.010 REF 0.254 REF
ccc 0.015 REF 0.381 REF
STYLE 1:
PIN 1. DRAIN
2. GATE
5. SOURCE
MILLIMETERSINCHES
CASE 465A--06
ISSUE H NI--780S
MRF5S21090HSR3
MRF5S21090HR3 MRF5S21090HSR3
8
RF Device Data
Freescale Semiconductor
PRODUCT DOCUMENTATION
Refer to the following documents to aid your design process.
Application Notes
AN1955: Thermal Measurement Methodology of RF Power Amplifiers
Engineering Bulletins
EB212: Using Data Sheet Impedances for RF LDMOS Devices
REVISION HISTORY
The following table summarizes revisions to this document.
Revision Date Description
3 Oct. 2008 Modified data sheet to reflect RF Test Reduction described in Product and Process Change Notification
number, PCN12779, p. 1, 2
Updated Part Numbers in Table 5, Component Designations and Values, to RoHS compliant part numbers, p. 3
Added Product Documentation and Revision History, p. 9
RF Device Data Freescale Semiconductor
MRF5S21090HR3 MRF5S21090HSR3
9
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MRF5S21090HR3 MRF5S21090HSR3
Document Number: MRF5S21090H Rev. 3, 10/2008
10
RF Device Data
Freescale Semiconductor
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