Designed for W--CDMA base station applications with frequencies from 2110
to 2170 MHz. Suitable for TDMA, CDMA and multicarrier amplifier applicati o ns . To be us ed in C l as s A B fo r P CN -- PCS / ce l lu l ar r a di o a nd W L L
applications.
• Characterized with Series Equivalent Large--Signal Impedance Parameters
• Internally Matched for Ease of Use
• Qualified Up to a Maximum of 32 VDDOperation
• Integrated ESD Protection
• Lower Thermal Resistance Package
• Low Gold Plating Thickness on Leads, 40
• RoHS Compliant
• In Tape and Reel. R3 Suffix = 250 Units per 56 mm, 13 inch Reel.
µ″ Nominal.
Document Number: MRF5S21090H
Rev. 3, 10/2008
MRF5S21090HR3
MRF5S21090HSR3
2110--2170 MHz, 19 W AVG., 28 V
2 x W -- CDMA
LATERAL N--CHANNEL
RF POWER MOSFETs
CASE 465 -- 06, STYLE 1
NI--780
MRF5S21090HR3
CASE 465A--06, STYLE 1
Table 1. Maximum Ratings
RatingSymbolValueUnit
Drain--Source VoltageV
LIFETIMEBUY
Gate--Source VoltageV
Total Device Dissipation @ TC= 25°C
Derate above 25°C
Storage Temperature RangeT
Case Operating TemperatureT
Operating Junction TemperatureT
Table 2. Thermal Characteristics
CharacteristicSymbolValue
Thermal Resistance, Junction to Case
Case Temperature 80°C, 90 W CW
Case Temperature 76°C, 19 W CW
1. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF
calculators by product.
2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes -- AN1955.
R
DSS
GS
P
stg
θ
D
C
J
JC
NI--780S
MRF5S21090HSR3
--0.5, +65Vdc
--0.5, +15Vdc
269
1.5
--65 to +150°C
150°C
200°C
(1,2)
0.65
0.69
W
W/°C
Unit
°C/W
LAST ORDER 3 OCT 08LAST SHIP 14 MAY 09
Freescale Semiconductor, Inc., 2008. All rights reserved.
RFDeviceDataFreescaleSemiconductor
MRF5S21090HR3MRF5S21090HSR3
1
Table 3. ESD Protection Characteristics
Test ConditionsClass
Human Body Model1 (Minimum)
Machine ModelM3 (Minimum)
Charge Device ModelC7 (Minimum)
Table 4. Electrical Characteristics
CharacteristicSymbolMinTypMaxUnit
Off Characteristics
Zero Gate Voltage Drain Leakage Current
(VDS= 65 Vdc, VGS= 0 Vdc)
Zero Gate Voltage Drain Leakage Current
(VDS= 28 Vdc, VGS= 0 Vdc)
Gate--Source Leakage Current
(VGS= 5 Vdc, VDS= 0 Vdc)
On Characteristics (DC)
Gate Threshold Voltage
(VDS= 10 Vdc, ID= 200 µAdc)
Gate Quiescent Voltage
(VDS= 28 Vdc, ID= 850 mAdc)
Drain--Source On--Voltage
(VGS= 10 Vdc, ID= 2 Adc)
Forward Transconductance
(VDS= 10 Vdc, ID= 2 Adc)
Dynamic Characteristics
Reverse Transfer Capacitance
(VDS= 28 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS= 0 Vdc)
Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD= 28 Vdc, IDQ= 850 mA, P
2--carrier W--CDMA, 3.84 MHz Channel Bandwidth Carriers. ACPR measured in 3.84 MHz Channel Bandwidth @ ±5 MHz Offset. IM3
measured in 3.84 MHz Bandwidth @ ±10 MHz Offset. PAR = 8.5 dB @ 0.01% Probability on CCDF.
Power GainG
Drain Efficiencyη
Intermodulation DistortionIM3—--37.5--35dBc
Adjacent Channel Power RatioACPR—--40.5--38dBc
LIFETIMEBUY
Input Return LossIRL—--15--9dB
1. Part is internally matched both on input and output.
(1)
(TC= 25°C unless otherwise noted)
I
I
I
V
GS(th)
V
GS(Q)
V
DS(on)
C
DSS
DSS
GSS
g
fs
rss
ps
D
——10µAdc
——1µAdc
——1µAdc
2.52.93.5Vdc
—3.9—Vdc
—0.25—Vdc
—5—S
—1.7—pF
= 19 W Avg., f = 2112.5 MHz,
out
12.514.5—dB
2426—%
MRF5S21090HR3 MRF5S21090HSR3
2
LAST ORDER 3 OCT 08LAST SHIP 14 MAY 09
RF Device Data
Freescale Semiconductor
V
BIAS
R1
R2
C4
R3
C5
C3
C10
R4
W1
V
SUPPLY
+
C12C11
C13C8C7
RF
INPUT
C6
Z4
Z1Z2Z3Z6Z7
C1
C14
Z5
Z11.0856″ x 0.080″ Microstrip
Z20.130″ x 0.080″ Microstrip
Z30.230″ x 0.080″ Microstrip
Z40.347″ x 0.208″ Microstrip
Z50.090″ x 0.208″ Microstrip
Z60.650″ x 0.176″ Taper
Z70.623″ x 0.610″ Microstrip
Z80.044″ x 0.881″ Microstrip
Z90.044″ x 0.869″ Microstrip
Z101.076″ x 0.446″ Microstrip
Z110.320″ x 0.393″ Microstrip
C9
Z9
DUT
Z8
Z11 Z12Z16Z17Z19Z21
Z10
Z120.609″ x 0.220″ Microstrip
Z130.290″ x 0.106″ Microstrip
Z140.290″ x 0.106″ Microstrip
Z150.080″ x 0.025″ Microstrip
Z161.080″ x 0.160″ Microstrip
Z170.180″ x 0.080″ Microstrip
Z180.260″ x 0.147″ Microstrip
Z190.500″ x 0.080″ Microstrip
Z200.199″ x 0.147″ Microstrip
Z210.365″ x 0.080″ Microstrip
PCBArlon GX0300--55--22, 0.03″, εr= 2.55
Z13
Z14
Z15
C2
Z18Z20
C15
Figure 1. MRF5S21090HR3(HSR3) Test Circuit Schematic
Table 5. MRF5S21090HR3(HSR3) Test Circuit Component Designations and Values
PartDescriptionPart NumberManufacturer
C19.1 pF Chip CapacitorATC100B9R1CT500XTATC
C28.2 pF Chip CapacitorATC100B8R2CT500XTATC
C32.0 pF Chip CapacitorATC100B2R0BT500XTATC
C4, C120.1 µF Chip CapacitorsCDR33BX104AKYSKemet
LIFETIMEBUY
C55.6 pF Chip CapacitorATC100B5R6CT500XTATC
C65.1 pF Chip CapacitorATC100B5R1CT500XTATC
C77.5 pF Chip CapacitorATC100B7R5JT500XTATC
C81.2 pF Chip CapacitorATC100B1R2BT500XTATC
C9, C100.56 µF Chip Capacitors700A561MT150XTATC
C111000 pF Chip CapacitorATC100B102JT500XTATC
C13470 µF, 35 V Electrolytic CapacitorEKME630ELL471MK25SNippon Chemi--Con
Frees cale has b egu n th e tra nsit ion of ma rki ng Pr int e d Circu it Bo ard s (PC Bs) with the Free scal e Se mico ndu ctor
signature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will have
no impact on form, fit or function of the current product.
Figure 2. MRF5S21090HR3(HSR3) Test Circuit Component Layout
C2
C15
MRF5S21090
Rev 5
LIFETIMEBUY
MRF5S21090HR3 MRF5S21090HSR3
4
LAST ORDER 3 OCT 08LAST SHIP 14 MAY 09
RF Device Data
Freescale Semiconductor
TYPICAL CHARACTERISTICS
15
G
ps
14
13
η
12
IRL
11
10
9
, POWER GAIN (dB)
8
ps
IM3
G
7
6
ACPR
5
VDD= 28 Vdc, P
2--Carrier W--CDMA, 10 MHz Carrier Spacing
D
3.84 MHz Channel Bandwidth, PAR = 8.5 dB
@ 0.01% Probability (CCDF)
VDD= 28 Vdc, P
Two--Tone Measurements
(f1 + f2)/2 = Center Frequency of 2140 MHz
1
TWO--TONE SPACING (MHz)
= 90 W (PEP), IDQ= 850 mA
out
versus Tone Spacing
57
55
53
P1dB = 50.47 dBm (111.4 W)
51
49
, OUTPUT POWER (dBm)
out
P
47
45
10
30
P3dB = 51.17 dBm (130.9 W)
VDD= 28 Vdc, IDQ= 850 mA
Pulsed CW, 8 µsec(on), 1 msec(off)
f = 2140 MHz
3234363840
Pin, INPUT POWER (dBm)
Figure 7. Pulse CW Output Power versus
Ideal
Actual
42
LAST ORDER 3 OCT 08LAST SHIP 14 MAY 09
Input Power
MRF5S21090HR3 MRF5S21090HSR3
5
TYPICAL CHARACTERISTICS
--1
5
4
0
η
,
D
R
A
I
N
E
F
F
I
C
I
E
N
C
Y
(
%
)
,
G
,
P
O
W
E
R
G
A
I
N
(
d
B
)
1
0
9
.
0
VDD= 28 Vdc, IDQ= 850 mA, f1 = 2135 MHz,
35
f2 = 2145 MHz, 2 x W--CDMA, 10 MHz
@ 3.84 MHz Bandwidth, PAR = 8.5 dB
30
@ 0.01% Probability (CCDF)
25
ps
20
15
10
D
G
ps
IM3
5
0--55
110
P
, POWER (WATTS) W--CDMA
out
η
D
ACPR
Figure 8. 2--Carrier W-- CDMA ACPR, IM3,
Power Gain and Drain Efficiency
versus Output Power
W--CDMA TEST SIGNAL
--20
--25
--30
--35
--40
--45
--50
)
2
8
10
7
10
IM3 (dBc), ACPR (dBc)
MTTF FACTOR (HOURS x AMPS
6
10
100
120140160180200
TJ, JUNCTION TEMPERATURE (°C)
This above graph displays calculated MTTF in hours x ampere
drain current. Life tests at elevated temperatures have correlated to
better than ±10% of the theoretical prediction for metal failure. Divide
MTTF factor by I
2
for MTTF in a particular application.
D
Figure 9. MTTF Factor versus Junction Temperature
220
2
100
10
1
0.1
0.01
W--CDMA. ACPR Measured in 3.84 MHz Channel
Bandwidth @ ±5 MHz Offset. IM3 Measured in
LIFETIMEBUY
.001
3.84 MHz Bandwidth @ ±10 MHz Offset. PAR =
8.5 dB @ 0.01% Probability on CCDF
0001
0
2468
PEAK--TO--AVERAGE (dB)
Figure 10. CCDF W--CDMA 3GPP, Test Model 1,
64 DPCH, 67% Clipping, Single Carrier Test Signal
--20
--30
--40
--50
--60
--70
(dB)
--80
--90
--100
--IM3 in
3.84 MHz BW
--110
--120
10
3.84 MHz
Channel BW
--ACPR in
3.84 MHz BW
f, FREQUENCY (MHz)
+ACPR in
3.84 MHz BW
+IM3 in
3.84 MHz BW
20515100--5--10--15--20--2525
Figure 11. 2-Carrier W-CDMA Spectrum
LAST ORDER 3 OCT 08LAST SHIP 14 MAY 09
MRF5S21090HR3 MRF5S21090HSR3
RF Device Data
6
Freescale Semiconductor
f = 2200 MHz
Z
load
f = 2200 MHz
f = 2100 MHz
Z
source
Zo= 10 Ω
f = 2100 MHz
LIFETIMEBUY
VDD= 28 Vdc, IDQ= 850 mA, P
f
MHz
2100
2120
2160
22001.8 -- j1.63.0 -- j4.0
Z
= Test circuit impedance as measured from
source
Z
= Test circuit impedance as measured
load
Input
Matching
Network
Z
source
Ω
3.4 -- j5.1
3.2 -- j5.4
3.0 -- j4.4
gate to ground.
from drain to ground.
Device
Under
Test
Z
source
out
Z
= 19 W Avg.
Z
load
Ω
2.4 -- j2.0
2.2 -- j2.1
2.1 -- j1.9
load
Output
Matching
Network
LAST ORDER 3 OCT 08LAST SHIP 14 MAY 09
RF Device Data
Freescale Semiconductor
Figure 12. Series Equivalent Source and Load Impedance
MRF5S21090HR3 MRF5S21090HSR3
7
PACKAGE DIMENSIONS
B
B
(FLANGE)
bbbB
H
E
AA
G
D
M
T
(FLANGE)
Q
1
2
M
A
2X
3
K
M
(INSULATOR)
M
M
bbbB
T
(LID)
N
M
cccB
T
M
bbbB
M
A
M
A
M
A
T
M
M
M
M
cccB
aaaB
A
T
M
A
T
(LID)
R
M
(INSULATOR)
S
M
M
M
C
SEATING
T
PLANE
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M--1994.
2. CONTROLLING DIMENSION: INCH.
3. DELETED
4. DIMENSION H IS MEASURED 0.030 (0.762) AWAY
FROM PACKAGE BODY.
DIM MINMAXMINMAX
A1.335 1.34533.91 34.16
B0.380 0.3909.659.91
C0.125 0.1703.184.32
D0.495 0.50512.57 12.83
E0.035 0.0450.891.14
F0.003 0.0060.080.15
G1.100 BSC27.94 BSC
H 0.057 0.0671.451.70
K 0.170 0.2104.325.33
M 0.774 0.786 19.66 19.96
N 0.772 0.788 19.60 20.00
Q.118.1383.003.51
R 0.365 0.3759.279.53
Refer to the following documents to aid your design process.
Application Notes
• AN1955: Thermal Measurement Methodology of RF Power Amplifiers
Engineering Bulletins
• EB212: Using Data Sheet Impedances for RF LDMOS Devices
REVISION HISTORY
The following table summarizes revisions to this document.
RevisionDateDescription
3Oct. 2008• Modified data sheet to reflect RF Test Reduction described in Product and Process Change Notification
number, PCN12779, p. 1, 2
• Updated Part Numbers in Table 5, Component Designations and Values, to RoHS compliant part
numbers, p. 3
• Added Product Documentation and Revision History, p. 9
RF Device Data
Freescale Semiconductor
MRF5S21090HR3 MRF5S21090HSR3
9
How to Reach Us:
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All other product or service names are the property of their respective owners.
Freescale Semiconductor, Inc. 2008. All rights reserved.
MRF5S21090HR3MRF5S21090HSR3
Document Number: MRF5S21090H
Rev. 3, 10/2008
10
RFDeviceData
FreescaleSemiconductor
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