Replaced by MRF5S19060NR1/NBR1. There are no form, fit or function changes with
this part replacement. N suffix added to part number to indicate transition to lead-free
terminations.
Document Number: MRF5S19060M
Rev. 5, 5/2006
MRF5S19060MR1
RF Power Field Effect Transistors
N- Channel Enhancement -Mode Lateral MOSFETs
Designed for broadband commercial and industrial applications with
frequencies from 1930 to 1990 MHz. The high gain and broadband
performance of these devices make them ideal for large-signal, commonsource amplifier applications in 28 Volt base station equipment.
• Typical 2-carrier N-CDMA Performance: V
P
= 12 Watts Avg., Full Frequency Band. IS-95 (Pilot, Sync, Paging,
out
Traffic Codes 8 Through 13) Channel Bandwidth = 1.2288 MHz. PAR =
9.8 dB @ 0.01% Probability on CCDF.
Power Gain — 14 dB
• Capable of Handling 5:1 VSWR, @ 28 Vdc, 1990 MHz, 12 Watts Avg.
Output Power
• Characterized with Series Equivalent Large - Signal Impedance Parameters
• Internally Matched for Ease of Use
• Integrated ESD Protection
• 200°C Capable Plastic Package
RMATI
• In Tape and Reel. R1 Suffix = 500 Units per 44 mm, 13 inch Reel.
= 28 Volts, IDQ = 750 mA,
DD
MRF5S19060MBR1
1990 MHz, 12 W AVG., 28 V
2 x N-CDMA
LATERAL N - CHANNEL
RF POWER MOSFETs
CASE 1486-03, STYLE 1
TO-270 WB - 4
PLASTIC
MRF5S19060MR1
CASE 1484-04, STYLE 1
TO-272 WB - 4
PLASTIC
MRF5S19060MBR1
Table 1. Maximum Ratings
HIVE INF
Drain-Source VoltageV
Gate-Source VoltageV
Total Device Dissipation @ TC = 25°C
Derate above 25°C
AR
Storage Temperature RangeT
Operating Junction TemperatureT
Table 2. Thermal Characteristics
Thermal Resistance, Junction to Case
Case Temperature 75°C, 12 W CW
1. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes - AN1955.
NOTE - CAUTION - MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and
packaging MOS devices should be observed.
Freescale Semiconductor, Inc., 2006. All rights reserved.
RF Device DataFreescale Semiconductor
RatingSymbolValueUnit
DSS
GS
P
D
stg
J
CharacteristicSymbolValue
R
θ
JC
MRF5S19060MR1 MRF5S19060MBR1
-0.5, +65Vdc
-0.5, +15Vdc
218.8
1.25
- 65 to +175°C
200°C
0.80
W
W/°C
ARCHIVE INFORMATION
(1)
Unit
°C/W
1
C
O
O
Table 3. ESD Protection Characteristics
Test MethodologyClass
Human Body Model (per JESD22-A114)1C (Minimum)
Machine Model (per EIA/JESD22 - A115)C (Minimum)
Charge Device Model (per JESD22-C101)IV (Minimum)
Table 4. Moisture Sensitivity Level
Test MethodologyRatingPackage Peak TemperatureUnit
Z10.250″ x 0.083″ Microstrip
Z2*0.500″ x 0.083″ Microstrip
Z3*0.500″ x 0.083″ Microstrip
Z4*0.515″ x 0.083″ Microstrip
Z50.480″ x 1.000″ Microstrip
Z61.140″ x 0.080″ Microstrip
Z70.600″ x 1.000″ Microstrip
C9
Z7Z8Z9Z10
DUT
C10C11
Z12
++
C13C14C15
Z8*0.420″ x 0.083″ Microstrip
Z9*0.975″ x 0.083″ Microstrip
Z100.250″ x 0.083″ Microstrip
Z110.700″ x 0.080″ Microstrip
Z120.700″ x 0.080″ Microstrip
PCBTaconic TLX8 -0300, 0.030″, εr = 2.55
* Variable for tuning
RF
OUTPUT
C12
Figure 1. MRF5S19060MR1/MBR1 Test Circuit Schematic
Table 6. MRF5S19060MR1/MBR1 Test Circuit Component Designations and Values
HIVE INF
C11 µF, 35 V Tantalum CapacitorTAJB105K35AVX
C210 pF 100B Chip Capacitor100B10R0CWATC
C3, C7, C12, C136.8 pF 100B Chip Capacitors100B6R8CWAT C
C4, C5, C14, C1510 µF, 35 V Tantalum CapacitorsTAJD106K035AVX
AR
C6220 µF, 63 V Electrolytic Capacitor, Radial13668221Philips
C80.8 pF 100B Chip Capacitor100B0R8BWATC
C91.5 pF 100B Chip Capacitor100B1R5BWATC
C101.0 pF 100B Chip Capacitor100B1R0BWATC
C110.2 pF 100B Chip Capacitor100B0R2BWATC
R1, R2
R3
PartDescriptionPart NumberManufacturer
10 kW, 1/4 W Chip Resistors (1206)
10 W, 1/4 W Chip Resistors (1206)
ARCHIVE INFORMATION
MRF5S19060MR1 MRF5S19060MBR1
4
RF Device Data
Freescale Semiconductor
C
O
O
V
GG
R1
R2
C1 C2
C3
C4 C5
V
DD
N
RMATI
R3
C7C8C9
Freescale has begun the transition of marking Printed Circuit Boards (PCBs) with the Freescale Semiconductor
signature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will have
no impact on form, fit or function of the current product.
Figure 2. MRF5S19060MR1/MBR1 Test Circuit Component Layout
CUT OUT AREA
C14C15
C13
MRF5S19060M
Rev 0
C10C11C12
C6
HIVE INF
AR
RF Device Data
Freescale Semiconductor
ARCHIVE INFORMATION
MRF5S19060MR1 MRF5S19060MBR1
5
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